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Error Detection/correction And Fault Detection/recovery > Pulse Or Data Error Handling > Memory Testing > Electrical Parameter (e.g., Threshold Voltage) Electrical Parameter (e.g., Threshold Voltage)Electrical Parameter (e.g., Threshold Voltage) patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/15/07 - 20070266279 - Semiconductor memory device to which test data is written A semiconductor memory device of this invention includes a first bank, a second bank, and a bank decoder that selects a bank to be activated from the first and second banks. When testing operations of first memory cells and second memory cells, the bank decoder simultaneously selects the first and ... 07/26/07 - 20070174746 - Tuning core voltages of processors A method, apparatus, and system are disclosed for tuning core voltages of processors. One embodiment is a method for software execution. The method includes varying core voltages of plural processors operating in lockstep to determine an operating range for each of the plural processors, and adjusting the core voltages of ... 05/31/07 - 20070124630 - Semiconductor device having adaptive power function In one embodiment, the semiconductor device includes at least one circuit element configured to generate output data. At least one control circuit is configured to adaptively control a power of the output data based on feedback from a receiving semiconductor device, which receives the output data. ... 03/01/07 - 20070050690 - Circuit and method for component communication A circuit has a supply voltage terminal for receiving a supply voltage of the circuit, wherein a trigger impulse is superimposed on the supply voltage. Further, the circuit has a signal terminal for outputting an output signal voltage of the circuit, wherein a bit of a data signal is superimposed ... 01/11/07 - 20070011512 - Semiconductor memory device and control method for the semiconductor memory device A memory cell array for memorizing data with any of 0th through fourth threshold voltages and a flag memory unit for memorizing a flag data showing a chronological sequence relationship between writing operations in which data in first and second pages are respectively written are provided. A controller shifts a ... 11/02/06 - 20060248416 - Test apparatus and test method The present invention provides a test apparatus comprising: a threshold voltage setting unit for setting threshold voltages of a logic device component connected to the signal propagation path; a test signal supply unit for supplying a test signal to the test subject device so as to operate the logic device ... 10/19/06 - 20060236165 - Managing memory health Systems, methodologies, media, and other embodiments associated with managing memory health are described. One exemplary system embodiment includes logic for detecting and correcting single bit memory errors. The example system may also include logic for selectively making unavailable a memory location associated with single bit memory errors. ... 06/08/06 - 20060123286 - Test error detection method and system According to one embodiment, a method of test error detection for a wafer having a plurality of rows of integrated circuit (IC) chips is provided. The method includes determining that a first number of IC chips that are indicated as failing a test has increased from a first row to ... 06/08/06 - 20060123285 - Dynamic threshold scaling in a communication system A computer system including an error recovery system establishes error threshold inversely proportional to the number of a like kind of system resources, such as host adapters. When a host adapter is initialized or deactivated, a software subcomponent of a processing device calculates a new threshold number and writes it ... 12/15/05 - 20050278592 - Semiconductor memory First dummy memory cells connected to a first dummy signal line have the same shape and characteristics as those of a real memory cell. The first dummy memory cells are arranged to be adjacent to outermost real memory cells. A voltage setting circuit changes the voltage of the first dummy ... 12/01/05 - 20050268186 - Semiconductor wafer with test circuit and manufacturing method A semiconductor wafer includes a wafer body, a plurality of dies spacedly and alignedly formed on the wafer body to define a scribe line as a margin formed between each two the dies, wherein at least one of the dies is formed as a tested die having a terminal pad ... ### FreshPatents.com Support |