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Data Processing: Measuring, Calibrating, Or Testing > Measurement System > Dimensional Determination > Thickness Or Width > By Radiant Energy (e.g., X-ray, Light) By Radiant Energy (e.g., X-ray, Light)By Radiant Energy (e.g., X-ray, Light) patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.06/01/06 - 20060116852 - Advanced cable metrology system The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, obtaining a digitized output waveform of the X-ray field ... 01/26/06 - 20060020419 - Iso-reflectance wavelengths A method of measuring a physical characteristic of a patterned substrate comprises determining a wavelength where a first reflectance from a patterned substrate equals a second reflectance from the patterned substrate. The first and second reflectances are generated from substrate regions having different pattern densities. A physical characteristic value that ... 08/18/05 - 20050182595 - Micropattern shape measuring system and method A test pattern formed in a scribe line area of a wafer is irradiated with a light beam to measure the width thereof; the test pattern is irradiated with an electron beam so as to measure the width thereof; an amount of change in the width of the test pattern ... 06/30/05 - 20050143950 - Apparatus and method for measuring or applying thermal expansion/shrinkage rate An object of the present invention is to measure the thermal expansion/shrinkage rate of a thin layer and to apply the results of the measurement. While a specimen is heated by a heater and held at a predetermined temperature, it is exposed to X-rays emitted from an X-ray source and ... ### FreshPatents.com Support |