REGISTER now for FREE 
|
FREE patent keyword monitoring and additional FREE benefits. REGISTER now for FREE
|
|
|
Data Processing: Measuring, Calibrating, Or Testing > Measurement System > Dimensional Determination > Thickness Or Width Thickness Or WidthThickness Or Width patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.07/27/06 - 20060167650 - Interconnection pattern inspection method, manufacturing method of semiconductor device and inspection apparatus A method of inspecting an interconnection pattern formed by depositing a metal onto a substrate having an interconnection pattern groove formed on a surface thereof includes: selectively measuring a thickness of a part above the substrate of a metal film formed on the substrate, the part above the substrate being ... 05/04/06 - 20060095228 - Apparatus and method for investigating semiconductor wafers In order to determine the dielectric constant of a layer deposited on a semiconductor wafer (2), the density of the layer is obtained. To obtain that density, the wafer (2) without the layer is weighed in a weighing chamber (4) in which a weighing pan (7) supports the wafer on ... 03/09/06 - 20060052979 - Method and apparatus for measuring thickness of metal layer Disclosed are a method and apparatus for measuring a thickness of a metal layer formed on a semiconductor substrate. First, second, and third light pulses are successively irradiated onto a top surface of the metal layer to generate respective first, second, and third second sonic waves in the metal layer. ... 03/09/06 - 20060052978 - Wall thickness data analyzer and method A wall thickness data analyzer is disclosed. The wall thickness data analyzer may comprise a storage device that stores a plurality of thickness data for a plurality of locations on the component, wherein one or more thickness data measured at specified times are provided for each location. The wall thickness ... 01/26/06 - 20060020418 - Nip press sensing system including a sensor strip having sensor interface electronics associated therewith and methods of operating the same According to some embodiments of the present invention, a system for determining characteristics of two rolls configured in a nip press includes a strip configured to be placed in the nip press. A plurality of sensors embedded in the strip is configured to generate signals representative of the pressure and/or ... 12/22/05 - 20050283335 - Integrated circuit and methods of measurement and preparation of measurement structure A method for measuring an integrated circuit (IC) structure by measuring an imprint of the structure, a method for preparing a test site for the above measuring, and IC so formed. The method for preparing the test site includes incrementally removing the structure from the substrate so as to reveal ... ### FreshPatents.com Support |