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Data Processing: Measuring, Calibrating, Or Testing > Measurement System > Dimensional Determination > Contouring ContouringContouring patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/02/06 - 20060247892 - Method and apparatus for manufacturing custom orthotic footbeds that accommodate the effects of tibial torsion A method and apparatus for providing a topographical map of the bottom of a patient's rear foot with the foot in a semi-weight bearing condition and in the neutral position adjusted for the effects of tibial torsion. A foot scanner with a pivoted air cushion is adjusted to a first ... 12/29/05 - 20050288891 - Road surface state estimating system and road surface state measuring apparatus Provided is a road surface state estimating system for carrying out measuring along a plurality of measuring lines on a paved road surface, which improves the reliability of texture estimation of the road surface. A road surface state estimating system (1) includes a laser displacement meter (11) for measuring a ... 12/22/05 - 20050283334 - Method and apparatus for inspecting dovetail edgebreak contour A method and tooling for inspecting a contour of an edge of a cutout formed in a disk, each cutout fixedly receiving a turbine blade. A first device receives the disk containing the cutouts. A second device has a sensor associated with the movement of an instrument, the first device ... 09/22/05 - 20050209816 - Optical metrology optimization for repetitive structures The top-view profiles of repeating structures in a wafer are characterized and parameters to represent variations in the top-view profile of the repeating structures are selected. An optical metrology model is developed that includes the selected top-view profile parameters of the repeating structures. The optimized optical metrology model is used ... 08/11/05 - 20050177339 - Precision surface measurement A test surface of a test object is measured with respect to a reference surface to generate a first relative surface measurement, where the test surface is in a first position relative to the reference surface. The test surface is measured with respect to the reference surface to generate a ... 07/28/05 - 20050165578 - Coordinate measuring apparatus and method for measuring a workpiece A method for measuring a workpiece to be measured includes the following steps: measuring measurement points on the surface of a workpiece (7) to be measured using a measuring device; evaluating the measured measurement points in such a manner that a predetermined desired geometry of the workpiece to be measured ... ### FreshPatents.com Support |