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Data Processing: Measuring, Calibrating, Or Testing > Measurement System > Dimensional Determination Dimensional DeterminationDimensional Determination patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/16/06 - 20060259269 - Handheld surface coordinate measuring device A surface coordinate measuring device (1) includes a computing unit (8) arranged in a handheld housing (9), a positioning device (2) for positioning the coordinate measuring device at a surface point (P) on a wall surface (3), a display device (6) for displaying a measurement calculated by the computing unit ... 11/02/06 - 20060247891 - Method and apparatus for measuring dimensional changes in transparent substrates A method of measuring dimensional changes in a transparent substrate includes forming an array of reference markers on a reference plate, forming an array of substrate markers on the transparent substrate, stacking the reference plate and transparent substrate such that the reference markers and substrate markers overlap, measuring coordinates of ... 10/05/06 - 20060224354 - Multiple sensor system An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to ... 10/05/06 - 20060224353 - Multiple sensor system An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to ... 09/21/06 - 20060212261 - Method and apparatus for measuring wall thickness, ovality of tubular materials The wall thickness and ovality of a tubular are simultaneously determined. The theoretical radius of a pipe is computed from a measurement of its circumference. An ultrasonic device conventionally used to measure the wall thickness of tubulars is adapted to also measure the maximum and minimum diameters and ovality by ... 08/24/06 - 20060190214 - Method and program for fracture plane reconstruction The invention relates to a method for fracture plane reconstruction in a three-dimensional set (20) of values, comprising the steps of providing a computer with the three-dimensional set, display by the computer of a succession of plane sections (10) of the three-dimensional set, selection by the user of points of ... 08/03/06 - 20060173650 - Dimension measuring device A dimension measuring device that has improved operability when an expensive display device such as bar graph is used commonly has been disclosed, comprising plural dimension measuring sections and a display section for displaying dimension measurements generated by the plural dimension measuring sections, wherein the number of dimension measurements the ... 07/20/06 - 20060161381 - Laser system for marking tires System for identifying and marking individual automotive tires including use of a light sheet sensor enabled image processing for the identification of the tire type and the marking spot. The height profile of the raised symbols on the tire sidewall can be measured using the light sheet sensor and matched ... 07/06/06 - 20060149498 - Measurement equipment A measurement equipment has a polygonal line processing section and a computational processing section. The polygonal line processing section produces a polygonal line pattern signal based on a predetermined polygonal line pattern having a polygonal line value that varies according to a polygonal line time and a timer processing for ... 05/18/06 - 20060106567 - Displacement sensing by comparing matrices of pointwise measurements Determining a displacement of a substantially rigid item relative to a frame of reference between a first time and a second time is described. At the first time, a first set of pointwise measurements of a physical property of the item taken at a plurality of fixed locations relative to ... 04/06/06 - 20060074587 - Measuring method of circular shape, measuring method of cylindrical shape, and measuring apparatus of cylindrical shape The present invention aims at providing a measuring method of making loads of measurement few, making each measured value extremely exact, and efficiently reducing the number of measurement points, in cylindrical dimension measurement, and in particular, the measurement of a circumferential shape. In a measuring method of a shape of ... 03/16/06 - 20060058979 - Method and system for calibrating integrated metrology systems and stand-alone metrology systems that acquire wafer state data The present invention is directed to methods and systems for calibrating integrated metrology systems and stand-alone metrology systems that acquire wafer state data. In one illustrative embodiment, the method includes providing a plurality of process tools, each of the process tools comprising an integrated metrology system adapted to obtain wafer ... 03/09/06 - 20060052977 - Combined feature dimensional parameter analysis A computerized method is disclosed for determining the size and location effects of simulated or manufactured features on an object, determining the transformation of a pattern of features, determining usable feature size within a pattern of features, and determining the remaining feature tolerances. The simulated or manufactured position of a ... 12/29/05 - 20050288890 - Assembly moves using float-remaining figures One aspect is a method which determines a float remaining figure (for example, a float remaining circle) for a manufactured pattern of features. In some embodiments, the size and relative location of two or more float remaining figures, each for a different part (each part typically designed in accordance with ... 12/29/05 - 20050288889 - Method and system for assessing consumed tolerances for individual features of a pattern and accommodating errors due to such individual features One aspect is a method for evaluating feature relating tolerance compliance for an individual feature of a pattern of features, for example using a pattern construct indicative of consumed tolerance of the pattern, or a pattern construct including a maximum inscribed circle inscribed within (or a minimum circumscribing circle which ... 10/06/05 - 20050222804 - Assessment and optimization for metrology instrument Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (URMS) from a net residual error. The TMU provides an ... 09/08/05 - 20050197801 - Combined feature dimensional parameter analysis A computerized method is disclosed for determining the size and location effects of simulated or manufactured features on an object, determining the transformation of a pattern of features, determining usable feature size within a pattern of features, and determining the remaining feature tolerances. The simulated or manufactured position of a ... 08/18/05 - 20050182593 - Wafer target design and method for determining centroid of wafer target A method for determining the centroid of a wafer target. In one embodiment, the method comprises a series of steps in a stepper, starting with the step of receiving a wafer, having a target set formed therein. Next, a signal is passed over the target set and over a material ... 08/18/05 - 20050182592 - Evolution of library data sets An optical metrology includes a library, a metrology tool and a library evolution tool. The library is generated to include a series of predicted measurements. Each predicted measurement is intended to match the measurements that a metrology device would record when analyzing a corresponding physical structure. The metrology tool compares ... 07/21/05 - 20050159917 - Part length measurement technique using two or three proximity sensors A method for determining the range of a dimensional parameter of a multiplicity of members is provided. The method includes the steps of: providing at least two sensors; fixing a set constant distances (Δl) between the sensors such that the relative distances between sensors are fixed and free from adjustment; ... 06/02/05 - 20050119858 - System and method of computing and displaying property-encoded surface translator descriptors A method for computing surface descriptors for a closed surface, which are each encoded with a property of the closed surface. A triangulated model of the closed surface is provided that includes a number of triangles. A number of random points within the closed surface are selected. A set of ... ### FreshPatents.com Support |