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Data Processing: Measuring, Calibrating, Or Testing > Testing System > Including Program Set Up Including Program Set UpIncluding Program Set Up patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.10/05/06 - 20060224348 - Method for performing model based scanplan generation of a component under inspection A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided ... 09/21/06 - 20060212254 - Automatic test equipment operating architecture An integrated circuit testing device, such as an ATE, configured with an architecture comprising a distinct software layer and a distinct hardware layer with an interface for tester abstraction providing a communication conduit between the software layer and the hardware layer. The software layer communicates in device under test terms ... 07/20/06 - 20060161371 - Method and system for computer-assisted test construction performing specification matching during test item selection A method and system for constructing a test using a computer system that performs specification matching during the test creation process is disclosed. A test developer determines one or more test item databases from which to select test items. The test item databases are organized based on psychometric and/or content ... 04/13/06 - 20060080060 - System and method for automatic testing of output device capabilities via electronic document A system and related techniques automatically exercise the output capabilities of a printer or other output device, and return a log or record of those capabilities to the print manager of a host operating system or other destination. According to embodiments, the host, client or other machine may decide to ... 03/16/06 - 20060058976 - Method of testing components designed to perform real-time, high resource functions A method of testing an engine designed to perform a real-time DSP or communications high resource function on an embedded target platform, the method comprising the steps of: (a) developing a reference engine for the high resource function, the reference engine performing the same functionality as the engine but running ... 02/16/06 - 20060036394 - Universal and integrated wafer testing real-time monitoring software system and its open system architecture A wafer testing real-time monitoring software system and its unique open software architecture which achieves real-time monitoring of wafer test results and on-line changing of externally hooked software to satisfy customer needs without changing its main program. The software structure receives and processes binary files from different probers and converts ... 01/12/06 - 20060009944 - Network-based system for selecting or purchasing hardware products System and method for receiving purchase information for a client system, e.g., a measurement system. A configuration diagram visually representing a current configuration of the client system is displayed. Multiple product icons are displayed representing products (hardware and/or programs) available for use in the client system. User input is received ... 01/05/06 - 20060004536 - System and method for remotely configuring semiconductor functional circuits The present invention systems and methods facilitate configuration of functional components included in a remotely located integrated circuit die. In one exemplary implementation, a die functional component reconfiguration request process is engaged in wherein a system requests a reconfiguration code from a remote centralized resource. A reconfiguration code production process ... 11/24/05 - 20050261863 - Integrated circuit configuration system and method The present invention systems and methods enable configuration of functional components in integrated circuits. A present invention system and method can flexibly change the operational characteristics of functional components in an integrated circuit die based upon a variety of factors, including if the die has a defective component. An indication ... 11/17/05 - 20050256669 - Measurement system and method and computer program for processing measurement data A measurement system includes a measurement apparatus, a client computer, and a server computer. The server computer includes a setting edition unit configured to prepare/edit set contents of a recipe of the measurement apparatus from the client computer, a notification unit configured to notify the measurement apparatus of at least ... 10/20/05 - 20050234675 - Dynamic runtime modification of scpi grammar Alteration of a Standard Commands for Programmable Instrumentation (SCPI) command set for instrument control. In representative embodiments, each command of the command set includes a different combination of SCPI grammatical elements; the SCPI grammatical elements are organized hierarchically in a tree data structure; and the tree has nodes with each ... 07/14/05 - 20050154553 - Enhanced testing for compliance with universal plug and play protocols The present invention extends to methods, systems, and computer program products for enhanced Universal Plug and Play (“UPnP™”) compliance testing. A control point (e.g., a computer system) and one or more devices (e.g., printers, wireless gateways, etc.) are network connectable (or are connected) to a common network. The control point ... 06/02/05 - 20050119853 - Method and apparatus for making and using test verbs A computerized method and system for testing a function of an information-processing system. This includes providing an architecture having a set of test commands, the test commands including a set of one or more stimulation commands and a set of one or more result-testing commands, and defining a set of ... ### FreshPatents.com Support |