REGISTER now for FREE 
|
FREE patent keyword monitoring and additional FREE benefits. REGISTER now for FREE
|
|
|
Data Processing: Measuring, Calibrating, Or Testing > Testing System > Of Circuit > Including Input/output Or Test Mode Selection Means Including Input/output Or Test Mode Selection MeansIncluding Input/output Or Test Mode Selection Means patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/02/06 - 20060247885 - Scalable integrated tool for compliance testing Methods, tools, systems and computer readable media for compliance testing instrumentation and/or software. Data from one or more analytical instruments and/or software is inputted, and calculations are performed on the data to produce one or more outputs. At least one of the outputs may be compared to first and second ... 09/21/06 - 20060212252 - Test apparatus and setting method therefor A test apparatus for testing an electric device includes a plurality of signal input-output units for inputting and/or outputting test signals in response to each of a plurality of terminals included by the electric device, a channel selection memory for storing pieces of channel selection information indicating whether each of ... 07/27/06 - 20060167646 - Method and apparatus for performing testing of interconnections The present invention provides a method and apparatus configured to allow testing of interconnections between components in a system. The present invention utilizes a source of a known pattern, for example a pattern buffer, in a first component of the system and a capture buffer located in a second component ... 06/29/06 - 20060142968 - Home control system using galvanic skin response and heart rate and method thereof A home control system using galvanic skin responses and heart rate information and a method thereof. Whether a user is awake is judged using a galvanic skin response sensor, and the extent of stress of a user is determined using the user's heart rate, thereby extracting a user's emotional state ... 06/22/06 - 20060136165 - Boundary scan circuit with integrated sensor for sensing physical operating parameters An integrated circuit device has boundary scan structure coupled between a test input (TDI) and the test output (TDO). The test register structure is used to shift information from the test input to a test output. Test data is transported from the input to the output by shifting. The test ... 04/13/06 - 20060080059 - Apparatus for collecting information An apparatus, and related method, for collecting information, such as that associated with one or more variables, is described. The apparatus may include at least one processor, at least one memory, and at least one program module. The program module may be stored in the memory and may be configurable ... 03/23/06 - 20060064272 - Semiconductor device having a test circuit for testing an output circuit A method for testing an output circuit of a semiconductor device including a plurality of output circuits includes the step of turning ON p-ch and n-ch MIS transistors of a subject output circuit, turning ON and OFF one and the other, respectively, of p-ch and n-ch MIS transistors of another ... 03/23/06 - 20060064271 - Method and system of semiconductor fabrication fault analysis A system and method for semiconductor fabrication fault analysis. The storage device stores test records. The program module receives a study lot identity, acquires suspect fabrication issues corresponding to the study lot identity, acquires a number of comparative wafer lot identities processed by the same fabrication tool and fabrication recipe ... 03/02/06 - 20060047463 - Bit synchronization for high-speed serial device testing An apparatus for testing electronic devices that output high-speed serial data bit streams employs a programmable device to adjust the timing of the strobe so that the data bit stream being analyzed is strobed at or near the center of the bit. The programmable device sets a number of different ... 03/02/06 - 20060047462 - Displacement estimation system and method A displacement estimation system comprising a data acquisition system and a processing system is provided. The data acquisition system is configured to capture a first frame from a first substrate including a first pattern at a first time and capture a second frame from a second substrate including a second ... 03/02/06 - 20060047461 - Non-deterministic protocol packet testing A test apparatus implements a method for testing electronic devices that exhibit non-deterministic behavior. The test apparatus includes a high-speed buffer queue for storing data packets. The data packets arrive at one end of the queue and, as they exit at the other end, are compared against expect data packets ... 02/16/06 - 20060036393 - Method for receiving and associating conditional dependent test results Methods for collecting and displaying conditional dependent test results. At least one measurement condition is received. The received at least one measurement condition specifies the measurement environment. A result is received from at least one measurement. For each received result, each received measurement condition is associated with the received result, ... 11/24/05 - 20050261859 - Systems and methods for evaluating a test case In one embodiment, a system and a method for evaluating a test case pertain to assigning weights to at least one of system components and system events, processing the test case to determine the number of event occurrences observed when the test case was run, and computing an overall score ... 11/10/05 - 20050251359 - Method, apparatus and computer program product for high speed memory testing For testing a device under test (“DUT”) a test specification is converted in a computer system by a pin vector generator process, which includes generating test vectors. The DUT has numerous input pins and such a pin vector is for a signal to drive one such pin. The pin vectors ... 11/03/05 - 20050246128 - Liquid crystal module inspecting apparatus and liquid crystal module An inspection and adjustment of a liquid crystal module have required a number of processes, which has been inefficient. According to the present invention, OSD image data is stored in a ROM 42 of a liquid crystal module 10, and the liquid crystal module 10 can independently display a plurality ... 09/08/05 - 20050197798 - Graphical user interface and approach therefor A circuit testing and control approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths. According to an example embodiment of the present invention, graphical user interface (GUI) (240) includes stored computer-executable code that, when executed, causes a micro-computer circuit to ... 08/04/05 - 20050171719 - System and method for measuring essential power amplification functions An apparatus includes a device under test, a network analyzer, an internal amplifier, a first switch, a second switch, a third switch, a first air-line directional coupler, and a first attenuator. A method of characterization measurement includes providing a harmonics signal from the device under test to a spectrum analyzer, ... 07/14/05 - 20050154552 - Methods for delay-fault testing in field-programmable gate arrays Systems and methods for delay-fault testing field programmable gate arrays (FPGA's), applicable both for off-line manufacturing and system-level testing, as well as for on-line testing within the framework of the roving self-test area (STARs) approach are described. In one method according to the present invention, two or more paths under ... ### FreshPatents.com Support |