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Data Processing: Measuring, Calibrating, Or Testing > Testing System > Of Circuit > Including Program Initialization (e.g., Program Loading) Or Code Selection (e.g., Program Creation) Including Program Initialization (e.g., Program Loading) Or Code Selection (e.g., Program Creation)Including Program Initialization (e.g., Program Loading) Or Code Selection (e.g., Program Creation) patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/16/06 - 20060259266 - Method for the management of commands within a communication network, corresponding control device, computer program product and storage means A method for the management of commands coming from a remote-control device in a communications network comprising a plurality of devices comprises the following steps implemented in a control device connected to a display device: the reception of a first predetermined command signal for the execution of a function to ... 10/05/06 - 20060224347 - Semiconductor device test method using an evaluation lsi An evaluation LSI includes a noise generation circuit generating a controlled amount of noise controlled from outside of the LSI, and a delay measurement circuit measuring a signal delay of a delay circuit influenced by the noise. The relationship between the amount of noise and the signal delay is determined. ... 09/28/06 - 20060217917 - Memory system having a hot-swap function A memory system includes normal memory modules serially connected, and a backup memory module, and a switch circuit for replacing a failed one of the normal memory modules by the backup memory module. The switch circuit inserts the backup memory module in the serial connection of the normal memory modules ... 09/28/06 - 20060217916 - Method for integrally checking chip and package substrate layouts for errors A method and system for integrally checking a chip layout dataset and a package substrate layout dataset for errors are disclosed. The package substrate layout dataset is converted from a first format into a second format in which the chip layout dataset is provided. The chip layout dataset of the ... 06/22/06 - 20060136164 - Multi-domain execution of tests on electronic devices A device under test is divided into multiple test domains, and test conditions for each of the multiple test domains are defined separately, so that each test domain has its own test pattern, timing data, and other test conditions. Each test domain can start and stop independently, and run at ... 06/15/06 - 20060129345 - Biometric quality control process Systems and methods configured to guide and manage laboratory analytical process control operations. A Biometric quality control (QC) process application is configured to monitor bias and imprecision for each test, characterize patient population data distributions and compare, contrast, and correlate changes in patient data distributions to any change in QC ... 04/20/06 - 20060085157 - Synchronization of multiple test instruments A test apparatus has multiple instruments that are synchronized with respect to one another so that a trigger signal may be generated in response to events occurring at different instruments. The events may correspond to events defined within a test program or events detected at a device under test. A ... 04/20/06 - 20060085156 - Method and system for predicting memory leaks from unit testing A method for predicting memory leak in a computer program. The method includes acquiring a reference to a tested unit included in the computer program for preventing static data objects from being deallocated; repeatedly executing the tested unit for more than once; tracking which objects in the tested unit are ... 04/06/06 - 20060074584 - Synchronization of multiple test instruments A test apparatus has multiple instruments that are synchronized with respect to one another so that test data generated by them arrive at the pins of a device under test at the time specified in a test program. The synchronization of the multiple instruments is carried out by introducing delays ... 03/23/06 - 20060064270 - Analyzer and computer program product An analyzer that comprises a sample measuring mechanism for measuring a sample and generating a measurement value, a memory for storing a plurality of standard values for evaluation of the measurement value, the plurality of standard values including a fixed standard value and a variable standard value, a controlller for ... 03/09/06 - 20060052965 - Event driven testing method, system and program product Under the present invention, a scenario is compartmentalized into a series of (discrete) events. Thereafter, a test case is provided that arranges the series of events into a desired order, and specifies event information and a verification decision for each event. The verification decision expresses whether verification of the corresponding ... 02/16/06 - 20060036392 - Test sequencer and method for management and execution of sequence items A test sequencer software application and method for management and execution of sequence items. The test sequencer software application includes a management module and an execution module. The management module has capabilities of obtaining multiple sequence items definitions, of obtaining configuration information, of creating multiple lists of ordered sequence items ... 01/26/06 - 20060020413 - Methods and apparatus for providing automated test equipment with a means to jump and return in a test program Sequences of instructions stored on machine-readable media cause a machine to execute one or more ordered sequences of tests and control functions in a test program, with execution of the tests causing stimuli to be applied to an electrical device under test. Upon execution of a control function that specifies ... 11/24/05 - 20050261858 - System and method for linking and loading compiled pattern data A method for linking compiled pattern data and loading the data into tester hardware includes the steps of generating a composite object that includes a shared resource, determining a local shared resource specific to a test instrument that is associated with the shared resource in the composite object, assigning a ... 11/24/05 - 20050261857 - System and method for linking and loading compiled pattern data A system and method for linking and loading compiled pattern data is described. In one embodiment, the method includes stepping through a pattern object to identify a shared resource and a compiled value or address for the shared resource and determining a reconciled value or address for the shared resource. ... 11/17/05 - 20050256662 - Test apparatus Test apparatus comprising: a connector (8) for connecting to the test apparatus (1) a system to be tested, a processor (2) for controlling the operation of the test apparatus and a user interface device (6) for presenting an interface to a user for the provision of input and output, a ... 10/20/05 - 20050234674 - Apparatus, system and/or method for converting a serial test to a parallel test Test development tools, systems and/or methods which include providing access to a pre-established serial test program having a series of test code portions; providing for evaluating the series of test code portions and determining whether any respective test code portions of said series of test code portions are independently operable ... 10/13/05 - 20050228606 - Method in an integrated circuit (ic) manufacturing process for identifying and redirecting ics mis-processed during their manufacture A method of manufacturing IC devices from semiconductor wafers includes providing the wafers and fabricating ICs on the wafers. At probe, a unique fuse ID is stored in each IC, and an electronic wafer map is electronically stored for each wafer indicating the locations of good and bad ICs on ... 10/06/05 - 20050222797 - Report format editor for circuit test A graphical user interface (GUI) of a report format editor for circuit test displays a number of user-selectable representations of circuit test data. The GUI also displays a user-modifiable ASCII report format that is formed, at least in part, of placed ones of the user-selectable representations of circuit test data. ... 09/29/05 - 20050216219 - System and method of measurement and processing of electrical variables A system and method of measurement and processing of physical variables, and in particular electrical variables, comprising: a multimeter to measure multiple electrical variables, similar to any conventional multimeter; a microcomputer capable of the numerical processing of variables, storage and communication; a conventional computer that can read magnetic or optical ... 09/01/05 - 20050192770 - Biometric quality control process Systems and methods configured to guide and manage laboratory analytical process control operations. A Biometric quality control (QC) process application is configured to monitor bias and imprecision for each test, characterize patient population data distributions and compare, contrast, and correlate changes in patient data distributions to any change in QC ... 07/14/05 - 20050154551 - Method and structure to develop a test program for semiconductor integrated circuits A method for developing a test program for a semiconductor test system is disclosed. The method includes describing a test plan file in a test program language (TPL), where the test plan file describes at least one test of the test program, describing a test class file in a system ... 06/23/05 - 20050137819 - Test automation method and tool with dynamic attributes and value sets integration A test automation tool is provided which is operable to integrate a set of dynamic attributes and values into tests to be performed on a computing environment. The test automation tool includes a job submission engine (JSE) operable to receive input regarding first attributes unchanged from a first computing environment ... 06/09/05 - 20050125186 - Biometric quality control process Systems and methods configured to guide and manage laboratory analytical process control operations. A Biometric quality control (QC) process application is configured to monitor bias and imprecision for each test, characterize patient population data distributions and compare, contrast, and correlate changes in patient data distributions to any change in QC ... ### FreshPatents.com Support |