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Data Processing: Measuring, Calibrating, Or Testing > Testing System > Of Circuit > Testing Multiple Circuits Testing Multiple CircuitsTesting Multiple Circuits patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/30/06 - 20060271326 - Power short circuit testing of an electronics assembly employing pre-characterized power off resistance of an electronic component thereof from a power boundary A technique for testing an electronics assembly for a power short circuit is provided. The technique includes pre-characterizing power off resistance of an electronic component(s) of a first packaging level from at least one power boundary of the electronic component(s). The characterizing of the power off resistance occurs prior to ... 11/23/06 - 20060265173 - Analyzing system, data processing apparatus, and storage medium An analyzing system, data processing apparatus, and storage medium capable of reducing the complex labor of a technician related to the setting operations of a measuring apparatus. The analysis system is provided with a plurality of measuring apparatuses that perform mutually different measurements of specimens, and a data processing apparatus ... 11/16/06 - 20060259265 - Analyzing system, data processing apparatus, and storage medium An analyzing system, data processing apparatus, and application program are provided that can display the measurement results and/or analysis results of a plurality of different types of measuring apparatuses on a user interface that is easily comprehended by the user. The data processing apparatus is capable of displaying on a ... 10/19/06 - 20060235638 - Method and an apparatus for measuring high-frequency intermodulation products Novel excitation signals are specifically designed for testing a nonlinear device-under-test such that all of the desired intermodulation products are measurable after being converted by a sampling frequency convertor. This is achieved by using excitation frequencies which are equal to an integer multiple of the sampling frequency of the sampling ... 08/31/06 - 20060195288 - Method for at speed testing of multi-clock domain chips A method of and system for testing multi clock domain devices at functional clock speed by aligning the Launching C2 clocks of the high speed and low speed domains, issuing a Cl->C2 clock in each domain, to at speed test all intra-domain paths and the low speed to high speed ... 07/13/06 - 20060155501 - Method, apparatus, system and computer program product for selection of a static evaluation method for an empirical examination of measurement series In a method, apparatus, system and computer program product for selection of a statistical evaluation method from a set of evaluation methods, the selected statistical evaluation method being optimally designed for a measurement series, three measurement series-specific determination signals are recorded in a first phase and, in a subsequent second ... 07/06/06 - 20060149493 - Method and system for calibrating a light emitting device display A method and system for calibrating a light emitting device display is provided. The display includes a plurality of pixel circuits, each having a light emitting device. The system for the calibration monitors current drawn from a row of the display array, and generates a correction parameter to correct brightness ... 06/08/06 - 20060122803 - Dynamically adaptable semiconductor parametric testing An apparatus, method, system, and signal-bearing medium may provide multiple maps, which may include multiple probing sequences to be called upon at run-time based on statistical thresholds or other selected criteria. Each map may include a series of locations on a wafer, the tests to perform at each location, and ... 04/20/06 - 20060085155 - Methods and apparatus for local outlier detection A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations. ... 03/23/06 - 20060064269 - Method and system for testing assembled mobile devices A method for arranging test stages in a production line for the assembling and testing of wireless communications devices comprises: determining a plurality of tests for testing an assembled wireless communication device; allocating each test requiring a physical actuation or mechanical dynamics for testing the assembled wireless communication device from ... 02/02/06 - 20060025956 - Semiconductor device fabrication method A semiconductor device fabrication method comprises; a first step S1 of fabricating a plurality of semiconductor chips on a plurality of semiconductor wafers, respectively; a second step S4 of making a probe test on the plural semiconductor chips respectively, which are present in a sampling region of one semiconductor wafer ... 12/15/05 - 20050278134 - Probe card and a method for detecting defects using a probe card and an additional inspection A method and system for defect localization includes: (i) receiving a test structure that includes at least one conductor that is at least partially covered by an electro-optically active material; (ii) providing an electrical signal to the conductor, so as to charge at least a portion of the conductor; and ... 09/22/05 - 20050209809 - Method for controlling a measuring apparatus A measurement system comprising modules for receiving analog measurement signals and outputting digital data and a controller for receiving and data processing of these digital data, this measurement system, wherein these modules comprise a A/D converter for converting analog measurement signals to digital data and measuring these data, an output ... 08/18/05 - 20050182588 - Test system for integrated circuits with serdes ports A system for testing an integrated circuit device under test (DUT) communicating though synchronous digital signals and through a high speed serialization/de-serialization (serdes) bus includes a serdes interface circuit for communicating with the DUT via the serdes bus and an integrated circuit (IC) tester for communicating with the DUT and ... 07/07/05 - 20050149285 - Method of and system for analyzing cells of a memory device A method of analyzing cells of a memory device is disclosed. The method generally comprises steps of establishing a plurality of fail signatures, wherein each fail signature is associated with a type of failure. Voltages according to a plurality of test patterns are applied to nodes of a cell of ... 06/09/05 - 20050125185 - Multiple level transistor abstraction for dynamic circuits A method and apparatus for improved formal equivalence checking to verify the operation of components in a VLSI integrated circuit. The present invention enhances previous techniques for dynamic circuits by generating a multi-level transistor abstraction for dynamic circuits. Two-levels of abstracted code are generated. First, an abstracted legal Verilog® is ... 06/02/05 - 20050119852 - Semiconductor test data analysis system A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data ... ### FreshPatents.com Support |