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Data Processing: Measuring, Calibrating, Or Testing > Testing System Testing SystemTesting System patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/30/06 - 20060271322 - Systems and methods providing a normalized graphical user interface for testing disparate devices Systems and methods for a design and runtime environment provide canonical templates for screen components on a device under test. The screen components may include buttons, boxes, icons, menus, scroll areas or text fields. ... 11/23/06 - 20060265170 - Priority system and method for processing standardized tests Systems and methods are provided for prioritizing the processing of standardized tests. One aspect of the present subject matter relates to a method for processing completed standardized tests. In one embodiment, test-processing priority information is received, and is associated with machine-readable identifiers for standardized tests. Completed standardized tests are received, ... 11/02/06 - 20060247879 - Site loops A method for use with a test system having sites that hold devices under test (DUTs) includes executing a first site loop to iterate through the sites, where the first site loop includes an instruction to program hardware associated with at least one of the sites, and executing a second ... 11/02/06 - 20060247878 - Integrated tool for compliance testing within an enterprise content management system Methods, tools, systems and computer readable media for compliance testing instrumentation and/or software. Data from one or more analytical instruments and/or software is converted to a technology-neutral format, which is independent of instrument type, instrument model, instrument manufacturer and data type of the analytical instrument or software from which the ... 10/26/06 - 20060241885 - Test apparatus and program therefor There is provided a test apparatus having a plurality of test modules for supplying test patterns used in testing devices under test to the devices corresponding to a given timing signal, a reference clock generating section for generating a reference clock, a plurality of timing supply sections, provided corresponding to ... 10/26/06 - 20060241884 - System and method for rapid testing of intermittently operated devices Methods and systems for efficient testing of intermittently operated devices in networks. ... 10/12/06 - 20060229837 - Acoustic signature testing for electronic, electromechanical, and mechanical equipment A method for testing a unit is described where the unit includes one or more of electrical, electronic, mechanical, and electromechanical components. The described method includes applying at least one stimulus to the unit, receiving sound emissions from the unit, converting the sound emissions into one or more acoustic signatures, ... 10/05/06 - 20060224346 - Operation testing method, operation testing apparatus and computer readable information recording medium A processing apparatus is caused to execute predetermined processing operation in a predetermined processing condition; a processing load factor in the apparatus is measured for when the predetermined processing operation is carried out in the apparatus; the measured load factor is compared with a predetermined target processing load factor range; ... 06/08/06 - 20060122802 - Data processing apparatus, secured circuit, program and data processing method A data processing apparatus capable of testing whether a secure circuit is normal or not while maintaining confidentiality of the secured circuit is provided: wherein the secured circuit conducts a self-diagnostic test thereof in accordance with a self-diagnostic test start instruction signal from a CPU, and the secured circuit outputs ... 04/20/06 - 20060085154 - Apparatus, system, and method for testing an analog to digital converter An apparatus, system, and method are disclosed for testing an analog to digital converter with a known analog signal applied. A first register module stores a first digitized instance of an analog signal. A second register module stores a second digitized instance of the analog signal. A difference module calculates ... 04/06/06 - 20060074580 - Four point measurement technique for programmable impedance drivers rapidchip and asic devices A four point measurement technique for testing programmable impedance drivers such as the BZIO buffers contained in RapidChip® and ASIC devices. Specifically, two test pads are added for taking voltage measurements at additional points. By taking the additional voltage measurements and performing some calculation using Ohm's law, the error components ... 03/09/06 - 20060052963 - Noninvasive testing of a material intermediate spaced walls A sensor probe provides a pair of unique signal paths through a test material, wherein one configuration of the probe provides identical external portions of the signal paths such that a selected parameter of a measuring signal passing along at least two of the unique signal paths is measured. From ... 02/16/06 - 20060036389 - Test apparatus and test method There is provided a testing device including: a first signal comparator operable to acquire a value of an output pattern based on a result that is obtained by comparing a voltage of an output signal and a first threshold value voltage in a first strobe timing, in order to acquire ... 02/09/06 - 20060031035 - Active tester for vehicle circuit evaluation An active tester for vehicle circuit evaluation includes a signal source for generating a dynamic signal, such as an AC current, for injecting to a circuit under test. The tester includes a data storage device for storing at least one test parameter and a data processor for processing data. In ... 02/02/06 - 20060025953 - System and method for testing of electronic circuits The system and method of the present invention combine multiple tests (15) into a batch and submit the batch for processing to exercise electronic circuits, for example, a managed network (25) such as a wireless network. The system and method insure that tests (15) are timely run by utilization of ... 02/02/06 - 20060025952 - Circuit arrangement with non-volatile memory module and method of en-/decrypting data in the non-volatile memory module In order further to develop a circuit arrangement (100) for electronic data processing—having at least one non-volatile memory module (10) for storing data to be protected against unauthorized access by means of encryption or decryption;—having at least one memory module interface logic circuit (12) assigned to the memory module (10)—for ... 01/19/06 - 20060015282 - System and method for testing a display device A display device testing system includes a video signal outputting apparatus (10), a remote controller (20), a back board (30) and a display device (40). The video outputting apparatus outputs video signals which contain one or more testing samples provided for testing the display device to the display device. The ... 01/19/06 - 20060015281 - Production procedure with pcb calibration A method for testing an optical disc drive control PCB using a test jig featuring a reference optical pick-up head. The method includes steps for measuring an output of the reference optical pick-up head (OPU) laser, comparison of the OPU output to the output of an optical disc drive control ... 01/12/06 - 20060009939 - Testing/adjusting method and test control apparatus for rotating disk storage devices Embodiments of the invention provide a method of testing/adjusting magnetic disk devices, in which the method allows the tests/adjustments to be conducted by solving problems due to the data sizes and characteristics of test/adjustment programs. After assembly of a magnetic disk device, setup of various parameters, magnetic disk defect registration, ... 12/22/05 - 20050283332 - Method and device for inspecting and monitoring the seal integrity of sterile packages A system for inspecting seal integrity of a sealed package including a visual inspection system and a medical packaging system having an integral peel testing device. ... 12/22/05 - 20050283331 - System for testing integrated circuits A system for testing integrated circuits by testing the change of integrated circuits under various temperatures comprises: at least one two-dimensional matrix testing module which includes a testing section having arrays for plugging integrated circuits to be tested, a heating section corresponding with the above testing section for heating integrated ... 11/24/05 - 20050261855 - Supporting calibration and diagnostics in an open architecture test system A method for integrating test modules in a modular test system includes creating component categories for integrating vendor-supplied test modules and creating a calibration and diagnostics (C&D) framework for establishing a standard interface between the vendor-supplied test modules and the modular test system, where the C&D framework comprises interface classes ... 11/24/05 - 20050261854 - Vacuum chamber with two-stage longitudinal translation for circuit board testing A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the ... 11/24/05 - 20050261853 - Method and apparatus for detecting multiple signal anomalies A test and measurement instrument includes a trigger system for controlling an acquisition system to acquire digital signal samples. The trigger system is selectively responsive to a trigger circuit for detecting a trigger event associated with an input signal, and to circuitry for detecting various sequences or combinations of anomalies. ... 11/10/05 - 20050251357 - Method, apparatus and database using a map of linked data nodes for storing test numbers In a method for assigning test numbers, current testflow context information is maintained during execution of a testflow. The information is maintained as an array of one or more context values. Upon execution of a subtest in the testflow, a map of linked data nodes is indexed using a key ... 10/27/05 - 20050240371 - Data carrier with detection means for detecting a change made of information stored with storing means In a circuit (2) comprising a first memory means (5) for modifiable storage of information (I), the information (I) being modifiable by an ambient parameter of the circuit (2), which ambient parameter acts on the first memory means (5), there is firstly provided in the first memory means (5) a ... 10/13/05 - 20050228605 - Devices and methods for testing clock and data recovery devices When used as a test data generator, CDR internal structures may be applied to generate drift conditions in the test data. For example, a finite state machine phase shifts a clock signal, over time, driving the test data generator thereby producing a drift condition on the test data. Once the ... 08/18/05 - 20050182582 - Adaptive resource monitoring and controls for a computing system The invention, in its various aspects and embodiments, is a method and apparatus for monitoring the performance of a computing system. The method comprises receiving data associated with monitoring performance of at least a portion of the computing device in accordance with a monitoring scheme; detecting a pattern in the ... 07/21/05 - 20050159912 - Methods for preparing and testing a thermal-spray coated substrate A method for fabricating and testing an article having a thermal-spray coating thereon. The method includes providing a substrate article having a surface, thermally spraying a coating material onto the surface of the substrate article, wherein a surface of contact between the coating material and the substrate article is a ... 07/14/05 - 20050154550 - Method and structure to develop a test program for semiconductor integrated circuits A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least one site controller controls at least ... 06/23/05 - 20050137818 - Detecting a defective area of an inspected apparatus Detecting a defect of an inspected apparatus having a plurality of functional blocks. A plurality of test data elements are generated according to each of the plurality of functional blocks. Test data including one or more of such test data elements stored in one or more test data areas is ... 06/09/05 - 20050125182 - Switched flight test installation with a packet type data format a fourth level (L4), or recording and analysis level. ... 06/02/05 - 20050119850 - Testing system, a computer implemented testing method and a method for manufacturing electronic devices A testing system includes a testing device configured to test product characteristics of a first sample by sampling the first sample from a population; a main storage device configured to store analysis information and testing information, the testing information includes a confidence interval tolerance of the first sample; an analysis ... ### FreshPatents.com Support |