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Data Processing: Measuring, Calibrating, Or Testing > Calibration Or Correction System > Position Measurement > Coordinate Positioning Coordinate PositioningCoordinate Positioning patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/23/06 - 20060265166 - Initializing position and direction of mining vehicle A method of initializing the position and direction of a mining vehicle, and a mining vehicle. An environmental model and route points are stored in a control system of the vehicle. The environment of the vehicle is scanned, and scanned points are generated based on obstacles observed. The control system ... 10/19/06 - 20060235636 - Method and device for measuring workpieces with a measuring probe on a machine tool A method for measuring workpieces with a measuring probe on a machine tool with linear axes of motion and at least one pivoting axis is provided, whereby the deviation of an actual position of a calibrating body in a pivoted position, in relation to a theoretical pivoted position which the ... 09/21/06 - 20060212248 - Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station A wafer probe station is provided with a wafer chuck, a wafer fastened on the chuck by vacuum suction, and a probe needle arrangement above the wafer to test the wafer at high frequencies by contacting selected pads on the wafer and alternately pads on a calibration substrate also fastened ... 06/22/06 - 20060136160 - System and method for generating reports of coordinate measuring machine A system for generating reports of coordinate measuring machine includes: a coordinate measuring machine (10), a system control box (11), a computer (12), a typewriter (13), and a database (14). The computer includes: a system interface module (121) providing an operating system of the coordinate measuring machine; a data processing ... 06/15/06 - 20060129342 - Method of evaluating a physical quantity representing an interaction between a wave and an obstacle The invention relates to the modelling of the interactions between an incident wave and an obstacle, in particular in the area of nondestructive testing. According to the invention, the surface of the obstacle is meshed and at least one source (Si) is allocated to each surface element (dSi). Boundary conditions ... 06/01/06 - 20060116837 - Methods and systems for providing security A security system is described which includes a base station, at least one calibration unit and at least one sensor module having at least one sensor therein. The calibration unit is configured to provide signals to the at least one sensor module. The signals contain data configured to at least ... 10/20/05 - 20050234672 - Electron beam inspection apparatus An electron beam inspection apparatus in which the order of inspection is determined to shorten the inspection time is disclosed. The order of inspection is determined by minimizing the total of the moving time and the inspection time as well as by simply optimizing the covered distance. At the time ... 10/20/05 - 20050234671 - System and process for measuring, compensating and testing numerically controlled machine tool heads and/or tables A system and a process are disclosed, that are automated and integrated with numerically controlled systems, for measuring, compensating and testing numerically controlled machine tool heads (1) and/or tables. The system comprises: at least one support base (11) equipped with a plurality of distance sensors (14); at least one device ... 07/14/05 - 20050154549 - Method of measuring the azimuth and resetting zero azimuth automatically A method of measuring the azimuth and resetting to zero azimuth automatically is disclosed. Multiple azimuths in longitudinal and latitudinal orientations are sampled by two orthogonal magnetic sensors installed in an azimuth meter, and then are output by corresponding first and second sine wave signals. These two sine wave signals ... ### FreshPatents.com Support |