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Data Processing: Measuring, Calibrating, Or Testing > Measurement System In A Specific Environment > Quality Evaluation > Quality Control Quality ControlQuality Control patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/23/06 - 20060265162 - Aggregated run-to-run process control for wafer yield optimization A method for processing wafers in a batch processing tool that optimizes yield by minimizing within batch wafer variation in a wafer process. In a tool having a plurality of available wafer positions for a batch process, the method is useful when less than a full batch of wafers is ... 09/28/06 - 20060217910 - Method and system for yield similarity of semiconductor devices A method and system for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of yields associated with a first yield, and obtaining a second plurality of yields associated with a second yield. ... 09/21/06 - 20060212246 - Device for signal transmission between a plurality of devices under test and a testing equipment A signal transmission device includes a set of first nodes, each of which is connected electrically to a respective one of devices under test, a second node connected electrically to a testing equipment, a set of mechanical relays, each of which interconnects the second node and a respective first node, ... 05/11/06 - 20060100804 - Method for inspecting defect and system therefor Based on a plurality of defects' position-coordinates and attribute detected by an inspecting apparatus, defects that are easily detectable by an observing apparatus are selected. With these selected defects employed as the indicator, the observing apparatus detects and observes the defects. Moreover, creating a coordinate transformation formula for representing a ... 04/13/06 - 20060080055 - Automatic quality control method for production line and apparatus therefor as well as automatic quality control program Production condition data and product quality data in a production line are monitored and stored in a production history database. When a quality deterioration event in the production line is detected while checking the product quality data, the improvement contents of the quality deterioration factor and production conditions are extracted. ... 03/30/06 - 20060069523 - Tire grip sensor and control system using the sensor A system for directly measuring tire grip conditions is provided which can measure a skidding condition with no need of applying a vibration. A tire rotation speed sensor comprising a detection gear and a magnet sensor is mounted to a rotating shaft of a tire. An output of the tire ... 03/23/06 - 20060064262 - Method and system for detecting a semiconductor manufacturing defect A method of semiconductor device defect analysis is provided. The method includes performing, by a first entity, a first defect analysis of a potential defect in a semiconductor device. The method also includes storing the first defect analysis in a potential defect database. The method further includes performing, by a ... 03/02/06 - 20060047454 - Quality control system for manufacturing industrial products In a quality control system for manufacturing industrial products, the product quality history and the manufacturing process history are collected and collated to calculate the correlation magnitude between the two histories. The candidates for the cause of quality variation hidden in the manufacturing processes are listed, and the correlation magnitude ... 12/01/05 - 20050267705 - Method and system for providing quality control on wafers running on a manufacturing line A method for providing quality control on wafers running on a manufacturing line is disclosed. The resistances on a group of manufacturing test structures within a wafer running on a wafer manufacturing line are initially measured. Then, an actual distribution value is obtained based on the result of the measured ... 11/10/05 - 20050251355 - Adaptive tachometer redline A tachometer system is provided for a motor vehicle having an engine selected from a plurality of engines having unique maximum rated engine RPMs. The system has an RPM data signal and scale correction data. A microcontroller receives the RPM data signal and said scale correction data and generates a ... ### FreshPatents.com Support |