REGISTER now for FREE 
|
FREE patent keyword monitoring and additional FREE benefits. REGISTER now for FREE
|
|
|
Data Processing: Measuring, Calibrating, Or Testing > Measurement System In A Specific Environment > Quality Evaluation Quality EvaluationQuality Evaluation patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.12/07/06 - 20060276985 - Automated surface distress measurement system The present invention is an apparatus, system and method for determining surface conditions in real time including a real time digital imaging device positioned relative to capture one or more images of a surface and an image processing device that processes the one or more images to identify defects (e.g., ... 11/16/06 - 20060259258 - Quality assurance ic having clock trimmer A quality assurance integrated circuit for a print controller is provided. The IC has a memory, a system clock having a ring oscillator for generating a clock signal, clock trim circuitry for trimming the clock signal generated by the system clock and a processor. The processor is arranged to, in ... 11/02/06 - 20060247876 - Liquid crystal panel evaluation support method and computer-readable medium for the same A liquid crystal panel evaluation support method for supporting an evaluation of a color reproducing characteristic of a liquid crystal panel for displaying a color image, comprising: calculating, for all pixels of the liquid crystal panel, a color difference indicative of a difference between a color of an optional pixel ... 09/21/06 - 20060212245 - Real-time mathematical model for wafer spin defect detection and for misalignment analyses According to various embodiments, there is a method of inspecting semiconductor wafers comprising comparing a value for each wafer in a lot of wafers to a mathematical model, where the values include data about at least one feature on the wafers, and where the mathematical model comprises a threshold value ... 07/13/06 - 20060155494 - Event-quantity measuring instrument and pedometer To provide a portable event-quantity measuring instrument which makes it possible to hold event-quantity data significantly and in a form of suppressing a storage area to the minimum. A portable event-quantity measuring instrument includes an event detection unit which senses an event and outputs an event signal; event-quantity counting means ... 07/06/06 - 20060149487 - System and method for reviewing quality control of instruments performing laboratory tests in a computerized environment The present invention relates to a method and system for suspending the processing of laboratory test results in a computerized environment. One or more test results from an instrument in a healthcare laboratory are received. It is determined whether the instrument has had a quality control procedure performed within a ... 04/20/06 - 20060085152 - Ecological value transfer In respect to emissions trading, although the emission of carbon dioxide may be reduced, there arises a need for reduction of energy so used in conjunction therewith with the possibility of global recession. The present invention purports to facilitate supply of organic compounds having environmentally-friendly values by providing a support ... 04/06/06 - 20060074577 - Multi channel multiplexed inspection system and method Provided are systems and methods for multi-channel non-destructive inspection which provide high data throughput, logarithmic amplification of large dynamic range, and simplicity of supporting electronics. More specifically, provided are systems and methods for inspecting a structure that may use an interface board, two pulser boards, each coupled to 16 transmit ... 03/02/06 - 20060047453 - Quality analysis including cumulative deviation determination A device and technique for monitoring the quality of a manufacturing process, a resulting part or both includes determining a cumulative deviation of an actual process signature from an expected signature. A disclosed example includes determining a quantitative value of a difference between the signatures at each of a plurality ... 01/12/06 - 20060009935 - Knowledge-based condition survey inspection (kbcsi) framework and procedure A knowledge-based condition survey inspection (KBSCI) framework and procedure for use with an engineering management system (EMS) that tailors types of condition survey inspections (CSIs) and inspection intervals to empirically-established life cycles of component-sections. Embodiments of the invention facilitate proactive life cycle management, scheduling appropriate types of CSIs only when ... 12/22/05 - 20050283327 - Breast feeding monitoring device and method A device and method for collecting, analyzing, displaying and storing information relevant for determining the nutritional progress of a breastfed infant, including, but not limited to: time and duration of breast feedings, amount of breast milk or formula fed by bottle, time and frequency of wet and dirty diapers and ... 12/01/05 - 20050267703 - 2d and 3d display system and method for furnace tube inspection A system and method for displaying inspection data collected from a furnace is disclosed. The system comprises a storage device for storing the inspection data. The system also comprises a computer programmed to partition the inspection data at a plurality of data markers so as to correlate the inspection data ... 12/01/05 - 20050267702 - Method for developing a unified quality assessment and providing an automated fault diagnostic tool for turbine machine systems and the like A computer implemented process is provided for assessing and characterizing the degree of success or failure of an operational event of a machine system such as a fluid compressor machine or turbine machine or the like on a continuous numerical scale. The computer implemented process develops and tracks machine unit ... 11/24/05 - 20050261848 - System and method for classifying restoration of paper collectibles A method of assigning a score to a restored paper collectible based on the quantity and quality of restoration procedures is herein described. ... 11/03/05 - 20050246121 - Method for analyzing process variables A method of monitoring and assessing production processes is described that is target value based using a quality index. ... 11/03/05 - 20050246120 - Computer tomography unit with a data recording system A computed tomography unit includes a radiation detector with several detector elements, a data recording system for reading the electrical signals generated by the detector elements and the processing thereof to give raw data may be supplied via a data transmission path. The computed tomography unit further includes an analytical ... 10/06/05 - 20050222791 - Method for assisting analysis of production process, program for making computer execute that method, program product, and storage medium A method of assisting analysis of a production process assisting work for analyzing the relationship between quality factors and characteristic of a product and a program product and a recording medium for the same, comprising receiving a designation of a factor from a user at a computer, arranging images corresponding ... 06/02/05 - 20050119843 - Semiconductor production system A semiconductor production system has a semiconductor manufacturing apparatus having an exposure unit, a control unit for controlling the exposure unit and a storage device; a semiconductor inspection apparatus having an observation unit, a control unit for controlling the observation unit and a storage device; and a storage device commonly ... ### FreshPatents.com Support |