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Data Processing: Measuring, Calibrating, Or Testing > Measurement System In A Specific Environment > Electrical Signal Parameter Measurement System > Waveform Analysis > Waveform-to-waveform Comparison Waveform-to-waveform ComparisonWaveform-to-waveform Comparison patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/30/06 - 20060271318 - Dual spectrum analyzer measurement system A dual spectrum analyzer measurement system reduces the effects of noise on acquired measurements, enabling power of a received input signal, and the noise of each spectrum analyzer in the dual spectrum analyzer measurement system, to be determined. ... 03/02/06 - 20060047451 - Apparatus and method for circuit diagram display, and computer product A circuit diagram display apparatus displays a plurality of logic circuit diagrams. An associating unit associates the logic circuits based on at least any one of identification information, structural information, logical equivalence information, and external designated information about the logic circuits. A display format changing unit changes a display format ... 06/16/05 - 20050131651 - Displacement based dynamic load monitor An apparatus and method for monitoring the force severity of a mechanical press without utilizing a contact force sensor. The method continually computes values of dynamic deflection for the press being monitored and utilizes these values to compute load on the press at any point in time. ... ### FreshPatents.com Support |