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Data Processing: Measuring, Calibrating, Or Testing > Measurement System In A Specific Environment > Electrical Signal Parameter Measurement System > For Electrical Fault Detection > Fault Location Fault LocationFault Location patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.12/07/06 - 20060276979 - Method and apparatus for improving operational reliability during a loss of a phase voltage The present invention is directed to a method and apparatus for improving operational reliability during a loss of a phase voltage (LOV) in a multi-phase power system, wherein a voltage representative of the LOV phase is calculated. The representative voltage is used for computing a reference polarizing voltage suitable for ... 11/09/06 - 20060253266 - Integrated circuit test array including test module Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between an automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test the integrated circuit at a higher clock frequency than the automated testing equipment ... 10/12/06 - 20060229830 - Brown out detection circuit and method A brown out detection circuit includes a sense amplifier for sensing a current level exhibited by a flash cell. Combinatorial logic is coupled to the sense amplifier for identifying a program condition of the flash cell based on the sensed current level, including a brown out condition, in order to ... 10/12/06 - 20060229829 - Method and system for the validating fault symptoms For the purpose of validating fault symptoms appearing at driver outputs (10), a symptom validation unit (14) is provided, within a final stage (18), which undertakes a validation or a preliminary validation, as applicable, on the basis of a classification of symptoms. By assigning the item of validation data “invalid” ... 07/27/06 - 20060167639 - Error detection apparatus and method and signal extractor A modulated voltage signal modulated at a predetermined frequency f0 is supplied to an integrated circuit under test to be tested set at an arbitrary stationary point, and an observation signal containing information on power supply current flowing through the integrated circuit under test at the stationary point. Then, a ... 06/22/06 - 20060136155 - Diagnostic method for an electronic systems unit A diagnostic method for the default operation of an electronic systems unit, including components producing and using data, at least one datum of which can take a pre-determined fixed value, after occurrence of an erroneous functioning of at least one of the components of the unit. The method classifies, during ... 03/02/06 - 20060047448 - Intrusion detection system and method thereof An intrusion detection system and method utilizing a power transmission cable connected to a source of radio frequency signals. A data transmission cable is associated with the power transmission cable and is provided with a plurality of radio frequency identification chips. The power transmission cable would induce an electromagnetic field ... 02/02/06 - 20060025942 - Method and system for determining the position of a short circuit in a branched wiring system Methods, systems, and articles of manufacture consistent with the present invention provide for determining the location of a short circuit in a branched wiring system. The distance from the short circuit to an impedance measurement point is determined based on a measured impedance of the branched wiring system. The branch ... 02/02/06 - 20060025941 - Methods and systems for detecting and locating damage in a wire Methods, systems, and articles of manufacture consistent with the present invention provide for identifying and locating wire damage on a wire. Broadband impedance phase and magnitude information for the wire is obtained. Potential wire damage on the wire is identified by analyzing the wire's low-frequency impedance phase information. The location ... 09/15/05 - 20050203711 - Method and apparatus for transmission line and waveguide testing A multi-port junction is used in combination with an Inverse Fourier Transform to detect distance to fault in an RF transmission line or waveguide without the use of heterodyne down-conversion circuits. To provide an ultra-wide bandwidth frequency domain reflectometer the output ports of the multi-port junction are used to calculate ... ### FreshPatents.com Support |