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Data Processing: Generic Control Systems Or Specific Applications > Specific Application, Apparatus Or Process > Product Assembly Or Manufacturing > Particular Manufactured Product Or Operation > Machining > Having Particular Measuring Device (e.g., Probe) Having Particular Measuring Device (e.g., Probe)Having Particular Measuring Device (e.g., Probe) patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.10/19/06 - 20060235566 - Arrangement for programming a system-independent measurement system for work pieces The invention relates to an arrangement for system-independent (off-line) programming of a measurement system for work pieces that includes a video measurement module and an evaluator. The arrangement according to the invention makes use of the evaluator of the measurement system or a similarly configured device. Instead of the video ... 03/16/06 - 20060058909 - System and method for on-machine probing A method and system for generating instructions for probing operations executable on a machine tool includes a probe module interfaced with a computer aided manufacturing program. Features selected from a digital model are utilized to determine part features for probing. The coordinates of those features are utilized to generate instructions ... 10/27/05 - 20050240302 - Method for machine tool and profilometer coordinate registration A method for registering machine tool and profilometer coordinates, wherein the machine tool defines a C-axis having a zero position, C=0, comprises loading a sacrificial workpiece into the machine tool; cutting several first features in a surface of the sacrificial workpiece and producing a linear machine tool motion across the ... ### FreshPatents.com Support |