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Data Processing: Generic Control Systems Or Specific Applications > Specific Application, Apparatus Or Process > Product Assembly Or Manufacturing > Particular Manufactured Product Or Operation > Integrated Circuit Production Or Semiconductor Fabrication Integrated Circuit Production Or Semiconductor FabricationIntegrated Circuit Production Or Semiconductor Fabrication patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.12/07/06 - 20060276926 - Method for controlling a semiconductor processing apparatus A method for controlling a batch-type semiconductor processing apparatus is provided. The method checks whether a recipe set based on basic process information is within a recipe group stored in the semiconductor processing apparatus. The method also checks whether the quantity of wafers read through lot mapping is correlated to ... 11/23/06 - 20060265100 - Sequential pulse deposition A method for growing films on substrates using sequentially pulsed precursors and reactants, system and devices for performing the method, semiconductor devices so produced, and machine readable media containing the method. ... 11/23/06 - 20060265099 - Semiconductor production system A semiconductor production system has storage devices for storage of all kinds of information including, but not limited to, the information concerning semiconductor design and information as to semiconductor manufacture along with information relating to semiconductor inspection processes, while representing as a class an instance added with meta data indicative ... 11/23/06 - 20060265098 - System and method for real time prediction and/or inheritance of process controller settings in a semiconductor manufacturing facility The disclosed system and method relates to the prediction of processing tool control parameters, i.e. controller state, for a particular processing tool, which has little or no utilization history, i.e. is data starved or has not gone through the learning curve, for a given process, or has undergone an event ... 11/23/06 - 20060265097 - Lithography method and system with correction of overlay offset errors caused by wafer processing A method of controlling lithographic overlay offsets in the manufacture of semiconductor devices from wafers, comprising the steps of forming a lithographic pattern on a wafer layer with a lithographic tool, processing the wafer after the pattern is formed to enable fabrication of a semiconductor device, predicting overlay offset corrections ... 11/02/06 - 20060247818 - Systems and methods for metrology recipe and model generation Systems and methodologies are disclosed for generating setup information for use measuring process parameters associated with semiconductor devices. A system comprises an off-line measurement instrument to measure an unpatterned wafer and a setup information generator to generate setup information according to the unpatterned wafer measurement. The system then provides the ... 10/26/06 - 20060241803 - Substrate processing system managing apparatus information of substrate processing apparatus A substrate processing system comprises a substrate processing apparatus, an information storage server and a support computer, which are connected to a network respectively. When the substrate processing apparatus causes a failure, an alarm processing part extracts a necessary relevant log file and stores the same in a hard disk ... 10/26/06 - 20060241802 - Real-time management systems and methods for manufacturing management and yield rate analysis integration A real-time management method for manufacturing management and yield rate analysis integration. A plurality of yield rates relating to wafer products are summed and averaged for a historical yield rate. Multiple representational inline QC parameters are selected. A statistical process is implemented and, if no extreme value and collinear parameter ... 10/19/06 - 20060235563 - Method and apparatus for providing intra-tool monitoring and control An apparatus for performing intra-tool monitoring and control within a multi-step processing system. The apparatus provides a metrology station located between each of a plurality of semiconductor wafer processing tools such that measurements can be made on wafers as they are passed from one tool to another providing intra tool ... 10/12/06 - 20060229758 - Method for optimization of an order for component mounting and apparatus for optimization of an order for component mounting A plurality of patterns having the same component placement structure is included in the board, said plurality of patterns corresponding respectively to a plurality of sub-boards obtained by partitioning said board. The optimization method of an order of component mounting i) includes a step of optimizing the order of component ... 10/05/06 - 20060224269 - Exposure apparatus and parameter editing method An exposure apparatus for exposing a substrate to radiation based on parameters includes a display, an input device, and a processor configured to execute a program for editing the parameters. The processor is configured to cause, in accordance with the program, the display to display a first group of a ... 09/28/06 - 20060217830 - Semiconductor manufacturing apparatus and semiconductor device manufacturing method A semiconductor manufacturing apparatus includes a processing apparatus main body which executes a process related to manufacturing a semiconductor device, an internal apparatus controller which supplies a start signal to start a process and a stop signal to stop the process of the semiconductor device within the processing apparatus main ... 09/21/06 - 20060212156 - Method of monitoring and/or controlling a semiconductor manufacturing apparatus and system therefor A semiconductor processing apparatus for processing a semiconductor wafer includes a plurality of sensors for monitoring a processing state, a processing result input unit, a model equation generation unit to generate a model equation for predicting a processing result, a processing result prediction unit which predicts a processing result, and ... 09/21/06 - 20060212155 - Printed wiring board design aiding apparatus, printed wiring board design aiding method, and printed wiring board design aiding program The present invention provides a printed wiring board design aiding apparatus, method, and program that can easily and inexpensively predict the displacement of a printed wiring board of complicated shape and configuration due to temperature change. The printed wiring board design aiding program makes a computer execute the steps including ... 09/14/06 - 20060206230 - Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values In a method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, it is determined whether or not a successive-decrease (or increase) tendency has occurred in a plurality of sequentially-obtained characteristic values of the products. Also, it is determined whether or not ... 09/14/06 - 20060206229 - Substrate processing system managing apparatus information of substrate processing apparatus A substrate processing system comprises a substrate processing apparatus, an information storage server and a support computer, which are connected to a network respectively. When the substrate processing apparatus causes a failure, an alarm processing part extracts a necessary relevant log file and stores the same in a hard disk ... 09/14/06 - 20060206228 - Method of processing semiconductor wafer A method of processing a semiconductor wafer is provided. The semiconductor wafer is processed with a first process. After collecting the measured data that reflects the deviation of each part within the semiconductor wafer, the semiconductor wafer is processed with a second process according to the measured data to compensate ... 09/07/06 - 20060200266 - Systems for performing parallel distributed processing for physical layout generation A system for performing parallel distributed processing thereby accelerating the generation of a physical layout is disclosed. Specifically, the system significantly reduces the execution time of a place and route stage in the design of an integrated circuit (IC). An IC design is broken to multiple tiles that are independently ... 09/07/06 - 20060200265 - Etching operation management systems and methods Systems and methods for etching operation management. A process controller acquires a line width on a processed wafer, determines a first Critical Dimension (CD) bias by subtracting the measured width from a target width, determines an adjusted target width by providing a first and a second etching duration, determines a ... 09/07/06 - 20060200264 - Assisting work management apparatus for substrate work system and assisting work management program for substrate work system An assisting-work management apparatus and an assisting-work management program that assure that a plurality of assisting works for a substrate-related-operation performing system are efficiently carried out by a plurality of workers. A responsible-worker determining portion 140 determines a responsible worker who carries out an objective work determined based on assisting-work ... 08/31/06 - 20060195218 - Iso/nested control for soft mask processing This method includes a method for etch processing that allows the bias between isolated and nested structures/features to be adjusted, correcting for a process wherein the isolated structures/features need to be smaller than the nested structures/features and wherein the nested structures/features need to be reduced relative to the isolated structures/features, ... 08/24/06 - 20060190120 - Semiconductor manufacturing apparatus, management apparatus therefor, component management apparatus therefor, and semiconductor wafer storage vessel transport apparatus A semiconductor manufacturing apparatus having a plurality of portions according to this invention includes a storage device which stores, for each portion, information representing the lapsed time of use or the product processing count till occurrence of a failure after installation of the portion, and a calculation device which receives ... 08/17/06 - 20060184266 - Method for making thin film devices intended for solar cells or silicon-on-insulator (soi) applications In one inventive aspect, a thin film device is manufactured by (a) forming a porous semiconductor layer in the form of a thin film on an original substrate, the formation being immediately followed by (b) separation of the thin film by a lift-off process from the original substrate; (c) transfer ... 08/17/06 - 20060184265 - Wafer lot split method and system A computer-implemented wafer lot split method is disclosed. A database is provided. The database is coupled to manufacturing tools in a wafer manufacturing environment. Split parameters for a wafer lot are predetermined in the database. The wafer lot is split according to the split parameters to acquire child wafer lots. ... 08/10/06 - 20060178768 - Control system for semiconductor processing apparatus A control system for a semiconductor processing apparatus comprises a control server connected to a semiconductor processing apparatus, a verification server connected to the control server, and a database connected to the verification server. The verification server evaluates input parameter values stored in the semiconductor processing apparatus against verification data ... 07/20/06 - 20060161288 - Method for manufacturing semiconductor device A method for manufacturing a semiconductor device is provided in which it is possible to perform process control taking account of wafer information and to deal with the process control in which a recipe is change from one wafer to another. The method comprises steps of inserting a process control ... 07/13/06 - 20060155414 - Semiconductor manufacturing apparatus A semiconductor manufacturing apparatus includes: a calculation unit having at least one computer for processing semiconductor design information; a control unit for controlling radiation of an electron in accordance with a processing result of the semiconductor design information; a writing unit for radiating an electron in accordance with instructions of ... 07/13/06 - 20060155413 - Semiconductor fabricating apparatus Providing a semiconductor fabricating apparatus using a laser crystallization technique for enhancing the processing efficiency for substrate and for increasing the mobility of a semiconductor film. The semiconductor fabricating apparatus of multi-chamber system includes a film formation equipment for forming a semiconductor film, and a laser irradiation equipment. The laser ... 06/08/06 - 20060122724 - System and method for automatically generating a tooling specification using a logical operations utility that can be used to generate a photomask order A method of generating a photomask order used to manufacture photomasks using a tooling specification generating system including generating a tooling specification by creating, modifying and/or deleting components of a logical operation that is represented by the tooling specification. Information required for the logical operation may be imported from an ... 06/01/06 - 20060116785 - Method of predicting cmp removal rate for cmp process in a cmp process tool A method of predicting CMP removal rate for CMP process in a CMP process tool. The method predicts CMP removal rates for CMP processes without polishing additional control wafers. The CMP process performed by the CMP process tool can be easily transferred accordingly, such that uptime of the CMP process ... 05/18/06 - 20060106479 - Chemical-mechanical planarization controller The invention provides a model-based control approach to chemical-mechanical planarization (CMP) control. The preferred embodiment comprises mathematical models of the CMP process. These models play a critical role in obtaining superior control performance. Model-based Control Design involves the construction of a dynamic mathematical model of the system to be controlled, ... 05/11/06 - 20060100735 - Process for determining the temperature of a semiconductor wafer in a rapid heating unit The invention relates to a process for determining at least one state variable from a model of an RTP system by means of at least one measurement signal measured on the RTP system—the measurement value—which has a dependency upon the state variable to be determined, and a measurement value forecast ... 05/04/06 - 20060095153 - Wafer carrier transport management method and system thereof A system and method for wafer carrier transport management. The method acquires an identity for a first wafer carrier before receiving a move-out complete (MOC) message for a second wafer carrier, issues a move-in request (MIR) with the identity to a transport system, acquires a destination for the second wafer ... 04/27/06 - 20060089741 - Computer-implemented method and carrier medium configured to generate a set of process parameters and/or a list of potential causes of deviations for a lithography process A computer-implemented method and a carrier medium adapted to improve lithographic processes are provided. In some embodiments, the computer-implemented method and carrier medium may be used for identifying potential causes of lithography process failure or drift. In addition or alternatively, the computer-implemented method and carrier medium may be adapted to ... 04/13/06 - 20060079985 - Inline connection setting method and device and substrate processing devices and substrate processing system It at least includes a step at which a coating and developing apparatus requests an exposure apparatus, connected inline thereto, to transfer profile information which is information relating to the exposure apparatus, a step at which the coating and developing apparatus receives the profile information from the exposure apparatus, and ... 04/06/06 - 20060074510 - Network-based photomask data entry interface and instruction generator for manufacturing photomasks A computer network for generating instructions for photomask manufacturing equipment, based on photomask specification data input by a customer. A series of order entry screens are downloaded to a remote customer's computer, typically via an internet connection. The customer is prompted to enter photomask specification data, which is delivered to ... 03/23/06 - 20060064194 - Methods and systems for determining lithography overlay offsets A system for determining lithography overlay offsets is described. The system comprises a first database, a second database, and a controller. The first database stores operation records of lots processed consecutively by an exposure tool, wherein each lot corresponds to a layer of a product, and the operation records pertain ... 03/23/06 - 20060064193 - Iso/nested cascading trim control with model feedback updates This method includes a method for etch processing that allows the bias between isolated and nested structures/features to be adjusted, correcting for a process wherein the isolated structures/features need to be smaller than the nested structures/features and wherein the nested structures/features need to be reduced relative to the isolated structures/features, ... 03/23/06 - 20060064192 - Substrate working system including unit for judging propriety of working program and program for judging propriety of working program A substrate-related-operation performing system improves its operation efficiency by preventing an error in replacing, for a substrate-related-operation performing apparatus thereof, an operation performing program with another operation performing program. A circuit-component mounting system includes a plurality of component mounting apparatuses 12 that are arranged in an array and perform respective ... 03/02/06 - 20060047356 - Wafer-to-wafer control using virtual modules The invention relates to controlling a semiconductor processing system. Among other things, the invention relates to a run-to-run controller to create virtual modules to control a multi-pass process performed by a multi-chamber tool during the processing of a semiconductor wafer. ... 02/09/06 - 20060030966 - Methods and apparatus for enhancing electronic device manufacturing throughput In some aspects, a method is provided for enhancing electronic device manufacturing throughput within an electronic device manufacturing tool. The method includes the steps of (1) for the electronic device manufacturing tool, creating an electronic device manufacturing schedule based on process factors and mechanical factors associated with the manufacturing tool; ... 02/09/06 - 20060030965 - Method and apparatus for automating vlsi modifications made after routing has been performed An engineering change order (ECO) tool for automatically making changes to an IC design after the IC design has been placed, routed and verified. The ECO tool is configured to receive a directive or a list of directives and to automatically make modifications described by the directives. The ECO tool ... 02/02/06 - 20060025880 - Host control for a variety of tools in semiconductor fabs A software module for use within an integrated circuit fabrication facility sends commands to a tool according to a method that operates with any tool that satisfies SEMI standards to add or subtract steps in a process without reprogramming or recompiling. The program operates autonomously to change parameters of commands ... 01/26/06 - 20060020362 - System and program for making recipe and method for manufacturing products by using recipe A system for making a recipe for each of manufacturing tools used to manufacture products includes a merging unit merging product information for the products and process information for each of manufacturing processes used for the products to make intermediate recipe data, and a making unit making the recipe for ... 01/19/06 - 20060015206 - Formula-based run-to-run control A dual chamber apparatus including a first chamber and a second chamber which is configured to be coupled to the first chamber at an interface. Each of the first chamber and the second chamber has a transfer opening located at the interface. An insulating plate is located on one of ... 01/12/06 - 20060009872 - Optical metrology model optimization for process control To evaluate the adequacy of a profile model, one or more types of process control to be used in controlling a fabrication process are selected. Profile model parameters and acceptable ranges for the profile model parameters are selected. A first and second metrology tools are selected. Statistical metric criteria that ... 12/29/05 - 20050288815 - Semiconductor device manufacturing information service system and server used in the same A semiconductor device manufacturing information service system comprises: step control servers, etc. that collect and store manufacturing data indicating the manufacturing result and/or quality in the manufacturing steps accepted by consignee companies X to Z; a manufacturing information service server, in a manufacturing information service company W, that generates customer ... 12/29/05 - 20050288814 - System and method for fully automatic manufacturing control in a furnace area of a semiconductor foundry A computer-implemented method and system for automating control of a furnace area within a semiconductor fabrication facility are provided. In one example, the method includes processing a current batch using process equipment, removing the current batch from the process equipment, and loading a next batch into the process equipment. The ... 12/15/05 - 20050278057 - Enhanced process and profile simulator algorithms A method for enhancing a process and profile simulator algorithm predicts the surface profile that a given plasma process will create. An energetic particle is first tracked. The ion fluxes produced by the energetic particle are then recorded. A local etch rate and a local deposition rate are computed from ... 12/01/05 - 20050267622 - Synthesizing semiconductor process flow models Systems and methods of modeling a best-guess semiconductor process flow for fabricating a desired semiconductor device are provided. The best-guess process flow is modeled using an inverse modeling technique. This technique reverse engineers a desired semiconductor device to synthesize a model of a fabrication process that is likely to produce ... 12/01/05 - 20050267621 - Temperature abnormality detection method and semiconductor manufacturing apparatus A semiconductor manufacturing apparatus includes: a hot plate that heats an article to be processed; a temperature control section that controls temperature of the hot plate; a main body control section that controls the entirety of the apparatus based on a process recipe; and an elevating mechanism that elevates the ... 11/24/05 - 20050261797 - Programmable radio transceiver A fully integrated, programmable mixed-signal radio transceiver comprising a radio frequency integrated circuit (RFIC) which is frequency and protocol agnostic with digital inputs and outputs, the radio transceiver being programmable and configurable for multiple radio frequency bands and standards and being capable of connecting to many networks and service providers. ... 11/24/05 - 20050261796 - System and method for improving equipment communication in semiconductor manufacturing equipment Provided is a system and method for connecting semiconductor manufacturing equipment to a host and one or more clients. In one example, the system includes an application queue, a host queue, and an equipment queue configured to hold messages received from and sent to an application agent, a host agent, ... 11/17/05 - 20050256602 - System and method for customized tape-out requests for integrated circuit manufacturing The present disclosure provides a system and method for a tape-out request. In one example, the method includes receiving initial information from a customer and loading a mask tooling template based on the initial information. A mask tooling form may be customized based on metal layer information provided by the ... 11/03/05 - 20050246051 - Method for controlling semiconductor process The present invention discloses a method of controlling a semiconductor manufacturing process system comprising a primary platform in communication with a secondary platform by transmitting recipe content from the primary platform to the secondary platform, performing a process on a wafer by the secondary platform based on the transmitted recipe ... 10/13/05 - 20050228530 - Automatic n2 purge system for 300mm full automation fab A system for manufacturing semiconductor integrated circuit (IC) devices, including an operating control system, a process intermediate station in communication with the operating control system, and a gas purge device, wherein the gas purge device is included in the process intermediate station. ... 10/13/05 - 20050228529 - Controller and method to mediate data collection from smart sensors for fab applications The present invention relates to control of and data collection from sensors associated with tools. In particular, it relates to using a controller to mediate communications among a tool, sensors associated with the tool and data users, such as a host system or distributed processors. Particular aspects of the present ... 09/22/05 - 20050209727 - Data output processor and method of manufacturing a semiconductor device A data output processor is employed when forming a conductive pattern on a layer formed with a plurality of recesses by filling the plurality of recesses with a conductive material by an electrolytic plating. The data output processor includes a parameter input receiving unit which receives a proportion of a ... 09/15/05 - 20050203658 - System and method of coinsurance wafer management A system and method of coinsurance wafer management. The system includes at least one production line and an order management unit. The production line processes a MPW shuttle including original wafers and coinsurance wafers with a common fabrication process before metal layering, processes the original wafers with different metal layering ... 09/08/05 - 20050197730 - System and method for process contamination prevention for semiconductor manufacturing Provided are a system and method for preventing contamination in a semiconductor manufacturing environment. The method includes comparing one or more attributes associated with a product, such as a substrate, with one or more attributes associated with an operation. If the comparison indicates that the product is not compatible with ... 09/01/05 - 20050192700 - Method and system for controlling a product parameter of a circuit element Methods and systems are disclosed that allow an adjustment of a product parameter, such as operating speed, of a circuit element, such as a field effect transistor, during the fabrication of the device. A manufacturing process downstream of a first controlled process is controlled by a superior control scheme in ... 09/01/05 - 20050192699 - Temperature-sensing wafer position detection system and method A temperature-sensing wafer position detection system and method which uses temperature to determine whether a wafer is properly positioned on a bake plate prior to commencement of a photolithography baking process, for example. The system includes a bake plate and a temperature-sensing apparatus which engages the bake plate and measures ... 09/01/05 - 20050192698 - Method and system for improving process control for semiconductor manufacturing operations A method and system are disclosed for configuring manufacturing tools in a semiconductor manufacturing flow. After collecting information with regard to one or more product performance features associated with a processing step performed in a process tool, one or more undesired process tool performance excursion patterns may be determined based ... 08/25/05 - 20050187649 - Method and apparatus for the monitoring and control of a semiconductor manufacturing process An Advanced Process Control (APC) system including Graphical User Interfaces (GUIs) is presented for monitoring and controlling a semiconductor manufacturing process that is performed by a semiconductor processing system. The semiconductor processing system includes a number of processing tools, a number of processing modules (chambers), and a number of sensors, ... 08/18/05 - 20050182507 - Msec/secs protocol converter and conversion method The present invention provides a Mitsubishi SEMI Equipment Communication (MSEC)/SEMI Equipment Communication Standard (SECS) protocol converter and conversion method thereof. The MSEC/SECS protocol converter and conversion method utilize an MSEC transceiver to transmit and receive MSEC signals, an SECS transceiver to transmit and receive SECS signals, an MSEC/SECS module to ... 08/11/05 - 20050177269 - Method for dynamic sensor configuration and runtime execution Graphical User Interfaces (GUIs) are presented for configuring and setting-up dynamic sensors for monitoring tool and process performance in a semiconductor processing system. The semiconductor processing system includes a number of processing tools, a number of processing modules (chambers), and a number of sensors. The graphical display is organized so ... 08/11/05 - 20050177268 - Design system for delivering data, system for fabricating a semiconductor device, method of communicating writing data, method for fabricating a semiconductor device A design system for delivering data via a network to a plant, which fabricates a semiconductor device by direct writing, includes: a data conversion unit generating the data specified by a product name of the semiconductor device, a layer name, and a machine type of an electron beam lithography system ... 08/11/05 - 20050177267 - Tank scheduling optimization for replicated chemical in a semiconductor manufacturing wet bench The present disclosure provides a system and method for identifying a tank containing a liquid from N number of tanks in a semiconductor manufacturing facility into which a batch of semiconductor products may be processed. An incoming batch of products to be processed in a predetermined number of tanks housing ... 08/04/05 - 20050171627 - Method and apparatus for monitoring tool performance A method and system for monitoring tool performance for processing tools in a semiconductor processing system. The semiconductor processing system includes a number of processing tools, a number of processing modules, a number of sensors, and an alarm management system. A tool health control strategy is executed in which tool ... 07/28/05 - 20050165505 - Electronic component mounting system and electronic component mounting method This invention is directed to prevention of setting a component feeding unit set with other storage member than a storage member storing same type of components as components in shortage in an electronic component mounting apparatus. A component mounting apparatus sends notice information about component shortage to a control computer ... 07/14/05 - 20050154484 - Photolithographic parameter feedback system and control method thereof A photolithographic parameter feedback system is described. The photolithographic parameter feedback system includes a database containing substrate history information of a lot having at least one measurement data after exposure of a pre-layer of substrates of a predetermined lot and an exposure tool history information having at least one measurement ... 07/07/05 - 20050149222 - Thermal processing apparatus and thermal processing method In a thermal processing apparatus irradiating a substrate with light from a lamp for heating the substrate, an opening is formed in a reflector for mounting a camera unit. The camera unit images three portions of an auxiliary ring supporting the substrate, for obtaining the position of the center of ... 07/07/05 - 20050149221 - Efficient method of dynamic formulation of chamber selections for multiple chamber tools A new method to manufacture a product is achieved. The method comprises providing a control system and a process tool. The process tool comprises multiple chambers. The process tool stores a plurality of recipes. The control system comprises a database. A set of chambers and a recipe name are selected ... 06/30/05 - 20050143853 - Mass-production transfer support system and semiconductor manufacturing system A mass-production transfer support system has a mass-production transfer source managing computer for managing information generated in a trial-production process of a semiconductor device and a mass-production transfer destination managing computer for managing a mass-production process of the semiconductor device. The mass-production transfer source managing computer comprises: quality/recipe information input ... 06/30/05 - 20050143852 - Chemical-mechanical planarization controller The invention provides a model-based control approach to chemical-mechanical planarization (CMP) control. The preferred embodiment comprises mathematical models of the CMP process. These models play a critical role in obtaining superior control performance. Model-based Control Design involves the construction of a dynamic mathematical model of the system to be controlled, ... 06/23/05 - 20050137737 - Integrated circuit card system and application loading method An integrated circuit card operation management system and method are provided. In one example of the system, a collator system is provided for receiving a user request to determine whether the application program can be loaded, for acquiring a card policy from a card issue management system, and for acquiring ... 06/02/05 - 20050119778 - Coding method with dynamic positioning A coding method with dynamic positioning is used in a die pick-up process. The steps include picking up one of the dies and examining the dies for classifying the grade of the dies for deposit in their exclusive bin. In the meantime, the method classifies the excusive bin for each ... ### FreshPatents.com Support |