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Data Processing: Generic Control Systems Or Specific Applications > Specific Application, Apparatus Or Process > Product Assembly Or Manufacturing > Performance Monitoring > Quality Control > Defect Analysis Or Recognition Defect Analysis Or RecognitionDefect Analysis Or Recognition patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.12/14/06 - 20060282190 - Automatic defect review and classification system The invention proposes a system that interrupts a processing associated with an ADC having low priority when an ADC processing cannot catch up with ADR by an ADC alone that is not under execution but uses an ADC for an ADR having high priority. To preferentially execute ADR/ADC having high ... 12/14/06 - 20060282189 - Manufacturing control apparatus, manufacturing control method, and computer product An information storing unit stores information relating to the manufacturing of the product in each of a plurality of manufacturing processes. An information acquiring unit acquires, when a defect is detected in a current manufacturing process, information relating to the manufacturing of the product in a preceding manufacturing process from ... 12/07/06 - 20060276923 - Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes Methods, systems, and software program for validation of pharmaceutical manufacturing processes and quality assurance process are described and disclosed herein. Consequently, the methods provide a means to perform validation on an integrated level whereby the quality control unit can ensure data and product integrity and minimize cost. ... 12/07/06 - 20060276922 - Systems and methods of process control A system of process control. A measurement database stores work-in-process (WIP) measurement data. A monitor database stores tool monitor data. A design of experiment (DOE) database stores DOE data determined by a method of design of experiment, comprising tool operation data and WIP measurement data. A processor determines a compensation ... 11/30/06 - 20060271227 - Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes Methods, systems, and software program for validation of pharmaceutical manufacturing processes and quality assurance process are described and disclosed herein. Consequently, the methods provide a means to perform validation on an integrated level whereby the quality control unit can ensure data and product integrity and minimize cost. ... 11/23/06 - 20060265095 - System and method for monitoring smt apparatuses A method for monitoring surface mount technology (SMT) apparatuses includes the steps of: providing a data saving module for saving attribute data on the SMT apparatuses, the attribute data including maintenance parameters, repair parameters, and defect rate parameters; obtaining dynamic data on the SMT apparatuses in real time, the dynamic ... 11/23/06 - 20060265094 - Non-destructive inspection apparatus and non-destructive inspection system A nondestructive inspection device nondestructively inspects an internal state of an inspection target, and transmits information indicating a progress status of the inspection to the outside of an inspection site. A nondestructive inspection system which uses this nondestructive inspection device includes a network connected to the nondestructive inspection device, and ... 06/15/06 - 20060129265 - Directed defective item repair system and methods The field of the present invention is the repair of a defective item where the item is directed through the repair process by a system. In the present invention, a manufacturing execution system controls and tracks an item through a sequence of workcenters that implement a process. A route defines ... 06/01/06 - 20060116784 - System and method to analyze low yield of wafers caused by abnormal lot events The present invention provides an Intelligent Engineering Data Analysis (I-EDA) system and method to help prevent low wafer yield and prevent occurrences of abnormal events. The I-EDA has a non-conforming wafer tracing (NCWT) system that operates to correlate occurrences of abnormal events with low wafer yield. The method generally has ... 05/25/06 - 20060111804 - Multivariate control of semiconductor processes A method for detecting a fault condition of a manufacturing process involving acquiring data and developing a model based on a plurality of manufacturing related variables for a plurality of outputs of a manufacturing process. The method also involves identifying which of the manufacturing related variables have a substantial affect ... 03/30/06 - 20060069460 - Defect detection using multiple sensors and parallel processing Techniques for detecting defects on semiconductor wafers are described. The techniques involve a parallel processing system wherein a data distribution system contains data distribution nodes that are interconnected by multiple data transfer paths. This configuration allows data collected by any of the detectors to be routed to any one of ... 12/15/05 - 20050278054 - Re-certification system for a flow control apparatus A flow control apparatus adapted to load a re-certification feeding set is disclosed. The flow control apparatus comprises a sensor for sensing the loading of the re-certification feeding set to the flow control apparatus, and a software subsystem in operative association with the sensor that includes a re-certification procedure for ... 12/15/05 - 20050278053 - Semiconductor manufacturing fault detection and management system and method The present disclosure provides a semiconductor manufacturing fault detection and management system and method for monitoring at least one manufacturing entity to detect state changes. ... 12/01/05 - 20050267618 - Writing method of hardware performance information of unit in vehicle In an inspection procedure of a completed product of an automatic transmission main body at a unit factory, a control system transmits a control signal to an actuator to receive characteristic data (hardware performance information) output in response to operation of the automatic transmission main body according to the control ... 11/10/05 - 20050251278 - Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes Methods, systems, and software program for validation of pharmaceutical manufacturing processes and quality assurance process are described and disclosed herein. Consequently, the methods provide a means to perform validation on an integrated level whereby the quality control unit can ensure data and product integrity and minimize cost. ... 11/10/05 - 20050251277 - Method and system for problem case packaging A method of problem case packaging handling consists collecting manufacturing problem information from entities associated with fabrication of a semiconductor product; and distributing the manufacturing problem information into problem cases which are stored in a problem database, each problem case representing a respective manufacturing problem and being associated with manufacturing ... 09/15/05 - 20050203657 - Systems and methods enabling automated return to and/or repair of defects with a material placement machine A method generally includes electronically accessing positional data defining a defect location on a composite structure, and automatically causing a material placement machine to return to the defect location as defined by the positional data. The method can also include automatically causing the material placement machine to place or lay ... 09/08/05 - 20050197728 - Feature targeted inspection A method of inspecting a subject integrated circuit. A set of historical integrated circuits is inspected to detect defects and produce historical data. Features of the historical integrated circuits that have an occurrence of defects that is greater than a given limit are designated as high risk features, based on ... 08/25/05 - 20050187648 - Semiconductor process and yield analysis integrated real-time management method A semiconductor process and yield analysis integrated real-time management method comprises inspecting a plurality of semiconductor products with a plurality of items to generate and record a plurality of inspecting results during semiconductor process, classifying the semiconductor products as a plurality of groups with a default rule to generate and ... 08/11/05 - 20050177264 - Method of building a defect database First, a wafer with a plurality of defects generated in a first semiconductor process is provided. A defect inspection is performed to detect the defects on the wafer. Then, an automatic defect classification is performed according to a predetermined defect database having a defect classification recipe generated from a second ... 06/23/05 - 20050137736 - Fuzzy reasoning model for semiconductor process fault detection using wafer acceptance test data System and method for detecting suspicious process faults. A preferred embodiment comprises determining a strength relationship between wafer acceptance test (WAT) parameters and process steps. The strength relationships indicate the affect of a failed process step on the value of a WAT parameter. Thus, if a WAT parameter is not ... ### FreshPatents.com Support |