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Data Processing: Generic Control Systems Or Specific Applications > Specific Application, Apparatus Or Process > Product Assembly Or Manufacturing > Performance Monitoring > Quality Control Quality ControlQuality Control patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.11/30/06 - 20060271226 - Inspection standard setting device, inspection standard setting method and process inspection device An information processing device stores an extracted feature of each inspection item of the process inspection, and a determination result of a final inspection in a memory device, calculates a separation degree between a distribution of features of products which were determined as good products at the final inspection and ... 10/19/06 - 20060235560 - Quality control system, quality control method, and method of lot-to-lot wafer processing A quality control system has: a QC value storage unit that stores QC actual measurements of past lots, a data acquisition device that acquires the device internal information of a processing device processing an intended lot, a device internal information storage unit that stores the device internal information, a recipe ... 10/19/06 - 20060235559 - run-to-run control system and operating method of the same A run-to-run control system and a run-to-run controlling method are proposed. The tool process parameters are real-time collected during the semiconductor process is performed and are regarded as the effective factors in the process for providing an optimal operation variables to the tool for the next process run. After modeling ... 10/05/06 - 20060224267 - Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values In a method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, it is determined whether or not a successive lower or upper tendency with respect to a control center value has occurred in a plurality of sequentially-obtained characteristic values of the ... 08/31/06 - 20060195215 - Management system, management apparatus, management method, and device manufacturing method A management system including an acquisition device for acquiring actual processing results obtained by operating an industrial device with a set parameter value and another parameter value, and an estimated processing result, an inspection device for inspecting the processing result obtained with the set parameter value, and acquiring and accumulating ... 08/31/06 - 20060195214 - Process control by distinguishing a white noise component of a process variance A method, system and medium is provided for enabling improved control systems. An error, or deviation from a target result, is observed for example during manufacture of semiconductor chips. The error within standard deviation is caused by two components: a white noise component and a signal component (such as systematic ... 08/10/06 - 20060178767 - Systems and methods for inspection control Dynamic sampling systems for fabrication with inspection control are provided. In embodiments of a fabrication system comprising a processing tool, inspection tool, and a controller, the processing tool performs a fabrication process on a workpiece associated with identification information. The inspection tool performs an inspection step on the workpiece. The ... 07/27/06 - 20060167579 - Quality variation display device, quality variation display method, quality variation display program, and storage medium storing such program A quality variation display device that can surely identify periodic information about quality on a product number basis such as the occurrence of a failure for every prescribed number of products is provided. The device includes a quality data storing database that stores the measurement result of each product measured ... 06/29/06 - 20060142889 - Verification system A verification system for a batch manufacturing process comprises comparing manufacturing order information obtained from an electronic database to the label or other representative data obtained from the beginning and end of the production batch. In a preferred embodiment, an empty carton is produced at the beginning and end of ... 06/22/06 - 20060136084 - Method and system for manufacturing electronic device, electronic device, and electro-optical apparatus A system for manufacturing an electronic device having a processing unit which includes a timer that processes a plurality of lots each having a plurality of work pieces and measuring in units of lots a processing time of the work pieces constituting the respective lots, an environmental information measurement module ... 06/15/06 - 20060129264 - Method for controlling semiconductor processing apparatus Occurrence of a process abnormality in a semiconductor processing apparatus is obtained by obtaining an index of a processing size of each of wafers within an X-th lot, in which the X represents an integer, based on data obtained during processing of each of the wafers of the X-th lot, ... 05/25/06 - 20060111803 - Method and system for estimating manufacturing target bias A computer implemented method for estimating manufacturing target bias for products in manufacturing tools. The method first establishes a first data set according to manufacturing target bias history based on a correlation with tools used. The manufacturing tools comprise a first manufacturing tool and other manufacturing tools. Next, a testing ... 04/27/06 - 20060089740 - Methods of and apparatuses for controlling process profiles Presented are methods and apparatus for controlling the processing of a substrate during a process step that is sensitive to one or more process conditions. One embodiment includes a method performed with corresponding apparatus that includes a controller. One step includes constructing a perturbation model relating changes in control parameters ... 03/16/06 - 20060058904 - Method and system for concrete quality control based on the concrete's maturity A method and system for controlling and monitoring the quality of concrete based on the concrete's maturity (which is a function of its time-temperature profile, or temperature history). Five different applications or embodiments of the present invention are discussed, namely, Enhanced Maturity, Moisture-Loss Maturity, Improved Maturity, SPC Maturity, Loggers, Readers, ... 12/29/05 - 20050288812 - Quality prognostics system and method for manufacturing processes A quality prognostics system and a quality prognostics method for predicting the product quality during manufacturing processes are disclosed. The present invention utilizes the current production tool parameters sensed during the manufacturing process and several previous quality data collected from the measurement tool to predict the future product quality. The ... 12/29/05 - 20050288811 - Method of controlling the quality of industrial processes and system therefor A method for controlling the quality of industrial processes, of the type comprising the steps of: making available one or more relating to the industrial process acquiring one or more real signals, indicative of the quality of said industrial process, comparing said one or more reference signal to said one ... 11/03/05 - 20050246045 - Quality control apparatus and control method of the same, and recording medium recorded with quality control program Various items of data collected at different process steps are associated on production sites where traceability is hard to conduct. A quality control apparatus controls a manufacturing process in order to manufacture products of predetermined quality, including a data storing part which collects measurement data measured by multiple devices disposed ... 10/20/05 - 20050234581 - Infinitely variable, order specific, holistic assembly process control system Interfaces are provided which integrate mistake-proofing concepts in a way easily understandable by the operator and easily configured by a manufacturing engineer. As mistake-proofing concepts are developed tables are populated and associated with specific assembly processes. Sensors are employed to monitor parts selection and tool usage. Sensors used for tool ... 10/06/05 - 20050222703 - Infinitely variable, order specific, holistic assembly process control system Interfaces are provided which integrate mistake-proofing concepts in a way easily understandable by the operator and easily configured by a manufacturing engineer. As mistake-proofing concepts are developed tables are populated and associated with specific assembly processes. Sensors are employed to monitor parts selection and tool usage. Sensors used for tool ... 10/06/05 - 20050222702 - Infinitely variable, order specific, holistic assembly process control system Interfaces are provided which integrate mistake-proofing concepts in a way easily understandable by the operator and easily configured by a manufacturing engineer. As mistake-proofing concepts are developed tables are populated and associated with specific assembly processes. Sensors are employed to monitor parts selection and tool usage. Sensors used for tool ... 09/22/05 - 20050209724 - Infinitely variable, order specific, holistic assembly process control system Interfaces are provided which integrate mistake-proofing concepts in a way easily understandable by the operator and easily configured by a manufacturing engineer. As mistake-proofing concepts are developed tables are populated and associated with specific assembly processes. Sensors are employed to monitor parts selection and tool usage. Sensors used for tool ... 07/21/05 - 20050159835 - Device for and method of creating a model for determining relationship between process and quality A model creating device inputs process status data that are obtained in time series during a period during which each of process steps of a process is carried out and are related to status of this process, as well as inspection result data related to object articles that were processed ... 06/23/05 - 20050137735 - Virtual platform to facilitate automated production A method of automating validation in a manufacturing facility is disclosed. The method comprises defining requirements, selecting and integrating automated devices for manufacturing. A hub-box with communication links is used to integrate the automated devices. The hub-box controls and facilitates communication between automated devices. The hub-box further collects and analyzes ... ### FreshPatents.com Support |