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Semiconductor Device Manufacturing: Process > Including Control Responsive To Sensed Condition > Electrical Characteristic Sensed > And Removal Of Defect And Removal Of DefectAnd Removal Of Defect patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.02/16/06 - 20060035392 - Application of lignin derivatives to photoelectric transducer and photoelectrochemical cell The invention regards application of lignin derivatives to a photoelectric transducer. The photoelectric transducer of the invention includes a semiconductor film as a thin film electrode, that is photosensitized by one or multiple lignin derivatives selected from the group consisting of: (a) a lignophenol derivative or a phenol derivative of ... 02/02/06 - 20060024849 - Method and system for characterizing porous materials A method and system for diagnosing the effectiveness of a treatment on a porous material. For example, the porous material can include a porous low dielectric constant material. In particular, the method can utilize FTIR spectroscopy to characterize the porosity of materials, and assess the effectiveness of sealing pores in ... 06/23/05 - 20050136559 - Quality improvement system A quality improvement system, which automatically performs engineering analysis and problem coping to improve the quality of semiconductor products. The quality improvement system is connected to a plurality of external databases, which store semiconductor product quality information acquired in a plurality of manufacturing processes, and a client server, which is ... ### FreshPatents.com Support |