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Semiconductor Device Manufacturing: Process > Including Control Responsive To Sensed Condition > Electrical Characteristic Sensed Electrical Characteristic SensedElectrical Characteristic Sensed patent applications listed are from June 2005 to current and include Date, Patent Application Number, Patent Title, Patent Abstract summary and are linked to the corresponding patent application page.02/01/07 - 20070026543 - Method for forming misalignment inspection mark and method for manufacturing semiconductor device A method for forming a misalignment inspection mark is disclosed. The formation method includes forming a reference layer device pattern and a first mark in a reference layer and forming an overlying layer device pattern and a second mark in a layer over the reference layer, the overlying layer device ... 02/01/07 - 20070026542 - Formation of conductive templates employing indium tin oxide The present invention is directed to a method forming conductive templates that includes providing a substrate; forming a mesa on the substrate; and forming a plurality of recessions and projections on the mesa with a nadir of the recessions comprising electrically conductive material and the projections comprising electrically insulative material. ... 01/04/07 - 20070004054 - Mosfet temperature sensing A MOSFET has its gate voltage controlled to provide a constant drain current of the MOSFET, for example to limit inrush current for charging a capacitance of a power supply arrangement. A decrease in the gate voltage supplied to the MOSFET, corresponding to an increase in the junction temperature of ... 12/28/06 - 20060292708 - Circuit arrangement, redox recycling sensor, sensor assembly and a method for processing a current signal provided by a sensor electrode A circuit arrangement has a sensor electrode, a control circuit which is coupled to the sensor electrode via an input, and a current source which is coupled via a control input to a control output of the control circuit. The current source can be controlled by the control circuit. The ... 11/30/06 - 20060270069 - Method of inspecting electronic circuit A method of inspecting an electronic circuit that includes a first integrated circuit and a second integrated circuit formed on a circuit board. The first integrated circuit has a first power source, an input circuit and a signal output section, and the second integrated circuit has a second power source, ... 11/16/06 - 20060258022 - Method for the calibration of radio frequency generator output power A method, system and computer-readable medium for calibrating the radio frequency power generator in a semiconductor processing system. The output of the radio frequency power generator is routed to a dummy load. An input control of the radio frequency power generator is adjusted to produce a desired output power conversion ... 10/19/06 - 20060234399 - Meander metal line under the pad for improved device mm esd performance A method is disclosed for enhancing ESD protection of integrated circuit devices. The method entails placing a resistor between an I/O pad and an ESD protection device on a semiconductor chip so that one end of the resistor connects to pins on said I/O pad and the other end connects ... 10/05/06 - 20060223201 - Body bias compensation for aged transistors Embodiments of the invention include on-chip transistor degradation detection and compensation. In one embodiment of the invention, an integrated circuit is provided including a circuit with a body bias terminal coupled to a body of one or more transistors to receive a body bias voltage; a programmable degradation monitor to ... 09/07/06 - 20060199283 - Semiconductor device having voltage output function trim circuitry and method for same In accordance with the teachings of the present invention, a semiconductor device having voltage output function trim circuitry and a method for the same are provided. In a particular embodiment, the method includes electrically coupling to a main circuit of a semiconductor device a plurality of resistances each operable to ... 08/17/06 - 20060183255 - Capacitance probe for thin dielectric film characterization A capacitance probe for thin dielectric film characterization provides a highly sensitive capacitance measurement method and reduces the contact area needed to obtain such a measurement. Preferably, the capacitance probe is connected to a measurement system by a transmission line and comprises a center conductive tip and RLC components between ... 05/11/06 - 20060099726 - Capacitance detection type sensor and manufacturing method thereof Capacitance sensor electrodes are arranged in a form of matrix on a semiconductor substrate and coated with a cover film. These capacitance sensor electrodes are connected to a drive circuit. ESD electrodes are arranged in the vicinities of corner portions of the capacitance sensor electrodes. Each ESD electrode is composed ... 10/20/05 - 20050233478 - Structure and method for providing precision passive elements A circuit having a precision passive circuit element, such as a resistor or a capacitor, with a target value of an electrical parameter is fabricated on a substrate with a plurality of independent parallel-connected passive circuit elements. The plurality of passive circuit elements are designed to have a plurality of ... 09/01/05 - 20050191769 - System, method and apparatus for automatic control of an rf generator for maximum efficiency A method of dynamically adjusting a RF generator to an instantaneous resonant frequency of a transducer includes providing an RF input signal from an oscillator to the RF generator and measuring a supply voltage applied to the RF generator. A peak voltage in the RF generator is also measured. A ... 06/30/05 - 20050142670 - Method for determining the equivalency index of products and processes A method is disclosed wherewith a person skilled in the art of statistical quality control may use to determine whether a process or a product is statically equivalent to another of known quality, or conforms to a desired known quality. The method may also be used to determine whether multiplicities ... ### FreshPatents.com Support |