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William K. Bucher Tektronix, Inc. patentsThe following is a sampling of recent William K. Bucher Tektronix, Inc. patent applications (USPTO Patent Application #, Patent Title) sorted by month.
January 2011 - William K. Bucher Tektronix, Inc. patents
20110018747 - Data generator providing large amounts of data of arbitrary word length
20110004745 - Method of controlling a measurement instrument
20110004818 - Method for visually confirming a relationship between an edited packet and serial data
April 2010 - William K. Bucher Tektronix, Inc. patents
20100105256 - Electrical contact assembly and method of manufacture
20100085362 - Equalization simulator with training sequence detection for an oscilloscope
July 2009 - William K. Bucher Tektronix, Inc. patents
20090167375 - Signal generation system
June 2009 - William K. Bucher Tektronix, Inc. patents
20090153159 - Probing adapter for a signal acquisition probe
April 2009 - William K. Bucher Tektronix, Inc. patents
20090086873 - Waveform signal generator with jitter or noise on a desired bit
20090086873 - Waveform signal generator with jitter or noise on a desired bit
March 2009 - William K. Bucher Tektronix, Inc. patents
20090074030 - Method of characterizing parameters and removing spectral components of a spread spectrum clock in a communications signal
April 2008 - William K. Bucher Tektronix, Inc. patents
20080079534 - Lumped resistance electrical cable
February 2008 - William K. Bucher Tektronix, Inc. patents
20080048673 - Signal analysis system and calibration method for multiple signal probes
20080048674 - Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load
20080048677 - Signal analysis system and calibration method for measuring the impedance of a device under test
20080052028 - Signal analysis system and calibration method
November 2007 - William K. Bucher Tektronix, Inc. patents
20070273361 - Input by-pass circuit for a current probe
20070273438 - Mode selection amplifier circuit usable in a signal acquisition probe
20070276622 - Calibration method and apparatus using a trigger signal synchronous with a signal under test
20070256511 - Probe holder for various thickness substrates
20070257657 - Current probing system
20070257661 - Current probing system
20070257662 - Current probe
20070257663 - Current sensing circuit for use in a current measurement probe
October 2007 - William K. Bucher Tektronix, Inc. patents
20070247927 - Data generator having stable duration from trigger arrival to data output start
July 2007 - William K. Bucher Tektronix, Inc. patents
20070164730 - Wide bandwidth attenuator input circuit for a measurement probe
20070164731 - Wide bandwidth attenuator input circuit for a measurement probe
20070159195 - Differential measurement probe having a ground clip system for the probing tips
20070154131 - Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity
June 2007 - William K. Bucher Tektronix, Inc. patents
20070143638 - Accessory device voltage management system controlled by a host
20070135946 - Command and argument description display corresponding to user actions on an electronic instrument
February 2007 - William K. Bucher Tektronix, Inc. patents
20070041512 - Calibration method and apparatus
December 2006 - William K. Bucher Tektronix, Inc. patents
20060284681 - Wide bandwidth attenuator input circuit for a measurement probe
November 2006 - William K. Bucher Tektronix, Inc. patents
20060267602 - Signal acquisition probe having a retractable double cushioned probing tip assembly
20060267603 - Signal acquisition probe having a retractable double cushioned probing tip with eos/esd protection capabilities
20060267604 - Differential measurement probe having retractable double cushioned variable spacing probing tips with eos/esd protection capabilities
20060267605 - Differential measurement probe having a ground clip system for the probing tips
20060267650 - Edge controlled fast data pattern generator
20060250530 - Signal generator display interface for instinctive operation of editing waveform parameters
20060244528 - Multi-band amplifier for test and measurement instruments
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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with William K. Bucher Tektronix, Inc. in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for William K. Bucher Tektronix, Inc. with additional patents listed. Browse our Agent directory for other possible listings.
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