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Vishwanath Venkataraman patents

Recent patents with Vishwanath Venkataraman listed as an inventor - additional entries may be under other spellings.


Vishwanath Venkataraman - Related organizations: Apple Inc. patents

Systems and methods for performing tester-less radio-frequency testing on wireless communications circuitry

03/10/16 - 20160072594 - Radio-frequency performance of wireless communications circuitry on an electronic device under test (DUT) may be tested without external test equipment such as signal analyzers or signal generators. A first DUT may transmit test signals to a second DUT. External attenuator circuitry interposed between the DUTs may attenuate the test signals
Inventors: Chao Yuan, Wassim El-hassan, Vishwanath Venkataraman

Radio-frequency test system with tunable test antenna circuitry

06/25/15 - 20150177277 - A test system is provided for performing radio-frequency tests on an electronic device under test (DUT) having multiple antennas. The test system may include a test unit for generating radio-frequency test signals, a test enclosure, and a test antenna fixture. The test fixture may include tunable antenna circuitry, antenna tuning
Inventors: Joshua G. Nickel, Erica J. Tong, Vishwanath Venkataraman

Methods for testing receiver sensitivity of wireless electronic devices

07/10/14 - 20140194069 - A test system may include test equipment for testing the radio-frequency performance of wireless electronic devices. The test equipment may provide radio-frequency downlink signals to a wireless electronic device under test (DUT). The test equipment may perform a power sweep by stepping down the downlink signals in signal power level
Inventors: Song Liu, Tomoki Takeya, Adil Syed, Vishwanath Venkataraman

Non-synchronized radio-frequency testing

02/28/13 - 20130049786 - A device under test (DUT) may be tested using a test station having a test host, a non-signaling tester, and a test cell. During testing, the DUT may be placed within the test cell, and the DUT may be coupled to the test host and the tester. In one suitable
Inventors: Wassim El-hassan, Vishwanath Venkataraman

Simultaneous sensitivity testing for multiple devices in radio-frequency test systems

09/13/12 - 20120231745 - A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a radiated arrangement through an
Inventors: Justin Gregg, Adil Syed, Vishwanath Venkataraman

Methods for mitigating interactions among wireless devices in a wireless test system

05/17/12 - 20120123723 - A test station may include a test host, a test unit, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during wireless testing. Radio-frequency signals may be conveyed between the test unit and the multiple DUTs using a conducted arrangement through a splitter-combiner
Inventors: Wassim El-hassan, Vishwanath Venkataraman, Justin Gregg

Simultaneous downlink testing for multiple devices in radio-frequency test systems

05/17/12 - 20120122406 - A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during production testing. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a conducted arrangement through a radio-frequency
Inventors: Justin Gregg, Adil Syed, Vishwanath Venkataraman

Methods for determining optimum power supply voltages for radio-frequency power amplifier circuitry

10/20/11 - 20110256838 - Electronic devices with wireless communications capabilities are provided. The electronic device may include storage and processing circuitry, power amplifier circuitry, power supply circuitry, etc. The storage and processing circuitry may direct the power amplifier circuitry to operate using a desired gain mode, in a particular radio channel, and at a
Inventors: David A. Donovan, Justin Gregg, Vishwanath Venkataraman

Methods for calibrating radio-frequency receivers using code division multiple access test equipment

09/29/11 - 20110237199 - Wireless test equipment may be used to perform over-the-air testing of user equipment. The user equipment may contain an antenna and a receiver. The wireless test equipment may contain a call box that performs network-level testing by sending and receiving protocol-compliant network messages. The call box may transmit a radio-frequency
Inventors: Vishwanath Venkataraman, Justin Gregg, Wassim El-hassan


### Vishwanath Venkataraman patent invention listings

The bibliographic references displayed about Vishwanath Venkataraman's patents are for a recent sample of Vishwanath Venkataraman's publicly published patent applications. The inventor/author may have additional bibliographic citations listed at the USPTO.gov. FreshPatents.com is not associated or affiliated in any way with the author/inventor or the United States Patent/Trademark Office but is providing this non-comprehensive sample listing for educational and research purposes using public bibliographic data published and disseminated from the United States Patent/Trademark Office public datafeed. This information is also available for free on the USPTO.gov website. If Vishwanath Venkataraman filed recent patent applications under another name, spelling or location then those applications could be listed on an alternate page. If no bibliographic references are listed here, it is possible there are no recent filings or there is a technical issue with the listing--in that case, we recommend doing a search on the USPTO.gov website.

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