| Variable sigma adjust methodology for static timing -> Monitor Keywords |
|
|
 
Variable sigma adjust methodology for static timingRelated Patent Categories: Data Processing: Design And Analysis Of Circuit Or Semiconductor Mask, Circuit Design, Testing Or Evaluating, Design Verification (e.g., Wiring Line Capacitance, Fan-out Checking, Minimum Path Width), Timing Analysis (e.g., Delay Time, Path Delay, Latch Timing)Variable sigma adjust methodology for static timing description/claimsThe Patent Description & Claims data below is from USPTO Patent Application 20070089078, Variable sigma adjust methodology for static timing. Brief Patent Description - Full Patent Description - Patent Application Claims
CROSS-REFERENCE TO RELATED APPLICATIONS [0001] This application is a division of U.S. application Ser. No. 10/710,734 filed Jul. 30, 2004, assigned to the present Assignee, and is fully incorporated herein by reference. BACKGROUND OF INVENTION [0002] 1. Field of the Invention [0003] The invention presents a method of varying the timing of an integrated circuit design by adjusting the voltage supplies to accommodate revised timing requirements. [0004] 2. Description of the Related Art [0005] To remain competitive in today's ASIC environment, design centers are becoming increasingly sensitive to Turn Around Time (TAT) that measures the time it takes to go from design concept to production hardware. A decrease in TAT correlates to an increase in design center throughput which typically translates directly to higher revenues. In addition to higher revenues, a reduction in TAT also leads to increased customer satisfaction and business opportunities. Studies have shown that difficulties in static timing closure is often a major contributor to excessive TAT. [0006] These difficulties are often the result of using timing models that reflect only the extreme process corners or variations in the manufacturing line. Process extremes are defined by both front end process variations that affect gate delay and back end process variations that affect wire delay. For timing closure, all timing requirements for the design must today be met at both the slow and fast process extremes represented by the timing models. The farther apart these process extremes become, the more difficult and resource consuming it is to meet static timing requirements. [0007] The ability to accurately reduce these process extremes from a timing model's perspective would greatly facilitate many situations that do not require timing closure at the process extremes. One example of this is timing closure for prototype hardware. In this situation, product yield would be sacrificed for the ability to get prototype hardware to the customer much sooner than would be possible if doing timing closure at the process extremes. Another example is customers that are willing to pay a premium to offset product yield loss on production hardware in order to reduce TAT or design for higher performance hardware. A third example is when the manufacturing line deliberately shifts or changes the process extremes as the result of line tailoring. [0008] Each of these examples would require the timing models to adjust to new process corners, however today that translates to a complete re-characterization of the models, a task that would take months and many resources. This disclosure proposes a new methodology that allows existing fixed process timing models to dynamically adjust to user specified process extremes for both front end and back end variations without the need to re-characterize the models. SUMMARY OF INVENTION [0009] The invention presents a method for changing static timing of an integrated circuit design. The invention first establishes a circuit design having initial timing requirements and an initial voltage supply and also establishes a relationship between gate timing variations caused by voltage supply changes and gate timing variations caused by manufacturing processing changes. Then, according to the customer's orders that change the initial timing requirements to revised timing requirements, the invention changes the initial voltage supply to a revised voltage supply to accommodate the revised timing requirements (and ACLV if desired) based on the relationship between gate timing variations caused by voltage supply changes and gate timing variations caused by manufacturing processing changes. This process of changing the initial voltage supply does not alter the circuit design. [0010] Stated differently, the invention establishes initial voltage sensitivity curves relating to the relationship between gate timing variations caused by voltage supply changes and gate timing variations caused by manufacturing processing changes in a circuit design for slow and fast process extremes. The invention also establishes an initial voltage supply at which initial process corners appear on the voltage sensitivity curves and establishes revised process corners for which initial timing requirements are to be changed into revised timing requirements. Next, the invention establishes revised voltage sensitivity curves relating to the revised process corners and changes the initial voltage supply to a revised voltage supply to accommodate the revised timing requirements based on where the revised process corners cross the revised voltage sensitivity curves. [0011] The initial timing requirements and the revised timing requirements comprise one of two extreme process corners for the circuit design consisting of either the fastest process timing allowed by the circuit design or the slowest process timing allowed by the circuit design. The revised timing requirements are used to determine whether manufactured chips are defective. The invention is useful with circuit designs that are made up of a common transistor design. [0012] These, and other, aspects and objects of the present invention will be better appreciated and understood when considered in conjunction with the following description and the accompanying drawings. It should be understood, however, that the following description, while indicating preferred embodiments of the present invention and numerous specific details thereof, is given by way of illustration and not of limitation. Many changes and modifications may be made within the scope of the present invention without departing from the spirit thereof, and the invention includes all such modifications. BRIEF DESCRIPTION OF DRAWINGS [0013] The invention will be better understood from the following detailed description with reference to the drawings, in which: [0014] FIG. 1 is a graph illustrating the voltage sensitivity of both the fast and slow timing models representing the extreme process corners of the manufacturing line; [0015] FIG. 2 is a graph illustrating the methodology for extending Delta to the customer's timing environment; [0016] FIG. 3 is a graph illustrating using voltage to bind the effects of ACLV; [0017] FIG. 4 is a flow diagram illustrating one aspect of the invention; and [0018] FIG. 5 is a schematic hardware diagram upon which the invention could operate. DETAILED DESCRIPTION [0019] The present invention and the various features and advantageous details thereof are explained more fully with reference to the nonlimiting embodiments that are illustrated in the accompanying drawings and detailed in the following description. It should be noted that the features illustrated in the drawings are not necessarily drawn to scale. Descriptions of well-known components and processing techniques are omitted so as to not unnecessarily obscure the present invention. The examples used herein are intended merely to facilitate an understanding of ways in which the invention may be practiced and to further enable those of skill in the art to practice the invention. Accordingly, the examples should not be construed as limiting the scope of the invention. Continue reading about Variable sigma adjust methodology for static timing... Full patent description for Variable sigma adjust methodology for static timing Brief Patent Description - Full Patent Description - Patent Application Claims Click on the above for other options relating to this Variable sigma adjust methodology for static timing patent application. ###  How KEYWORD MONITOR works... a FREE service from FreshPatents1. Sign up (takes 30 seconds). 2. Fill in the keywords to be monitored. 3. Each week you receive an email with patent applications related to your keywords. Start now! - Receive info on patent apps like Variable sigma adjust methodology for static timing or other areas of interest. ### Previous Patent Application: System and method for integrated circuit timing analysis Next Patent Application: Method and tool for creating a layout for an electronic circuit Industry Class: Data processing: design and analysis of circuit or semiconductor mask ### FreshPatents.com Support Thank you for viewing the Variable sigma adjust methodology for static timing patent info. IP-related news and info Results in 0.10191 seconds Other interesting Feshpatents.com categories: Medical: Surgery , Surgery(2) , Surgery(3) , Drug , Drug(2) , Prosthesis , Dentistry 174 |
 * Protect your Inventions * US Patent Office filing 
PATENT INFO |
|
