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Shingo Imanishi patents

Recent patents with Shingo Imanishi listed as an inventor - additional entries may be under other spellings.


Shingo Imanishi - Related organizations: Sony Corporation patents

Microparticle measuring apparatus

02/02/17 - 20170030824 - 1.5f≦L≦2.5f  (I)
Inventors: Taichi Takeuchi, Shingo Imanishi

Microparticle measuring apparatus

10/01/15 - 20150276575 - 1.5f≦L≦2.5f  (I)
Inventors: Taichi Takeuchi, Shingo Imanishi

Data correction method in fine particle measuring device and fine particle measuring device

04/23/15 - 20150112627 - To provide a technique capable of highly accurately measure the intensity and the spectrum of fluorescence and scattered light by effectively correcting measurement error that occurs due to variation of flow positions of fine particles in a channel. A data correction method for a fine particle measurement device is provided,
Inventors: Nao Nitta, Shingo Imanishi, Taichi Takeuchi

Optical measuring device and optical measuring method

10/02/14 - 20140293273 - Disclosed herein is an optical measuring device including: a light applying section configured to apply exciting light to a sample flowing in a channel; and a scattered light detecting section configured to detect scattered light generated from the sample irradiated with the exciting light on the downstream side of the
Inventors: Shunpei Suzuki, Shingo Imanishi, Gakuji Hashimoto, Suguru Dowaki

Microchip and particulate fractional collection apparatus

06/21/12 - 20120153185 - A microchip includes a sample liquid feed channel permitting a sample liquid containing particulates to flow through, at least one pair of sheath liquid feed channels configured to merge to the sample liquid feed channel from both sides thereof for permitting a sheath liquid to flow through surrounding the sample
Inventors: Tatsumi Ito, Masaya Kakuta, Shingo Imanishi, Nao Nitta, Koji Futamura, Toru Takashimizu, Koji Ashizaki, Motohiro Furuki

Fine particle measurement apparatus and optical axis calibration method

03/01/12 - 20120050737 - Disclosed is a fine particle measurement apparatus including a light condensing unit that condenses irradiated light irradiated to a sample flow where fine particles pass through and directly propagates the light without scattering, and scattered light scattered by the fine particles to an optical receiver divided into a plurality of
Inventors: Suguru Dowaki, Shingo Imanishi, Gakuji Hashimoto, Shunpei Suzuki

Optical measuring device and optical measuring method

09/15/11 - 20110222050 - Disclosed herein is an optical measuring device including: a light applying section configured to apply exciting light to a sample flowing in a channel; and a scattered light detecting section configured to detect scattered light generated from the sample irradiated with the exciting light on the downstream side of the
Inventors: Shunpei Suzuki, Shingo Imanishi, Gakuji Hashimoto, Suguru Dowaki

Optical measuring device

04/22/10 - 20100096560 - An optical measuring device includes: a light applying section configured to apply laser light to a sample flowing in a channel; and a fluorescence detecting section configured to detect fluorescence generated from the sample irradiated with the laser light; the fluorescence detecting section including a multichannel photomultiplier tube having a
Inventors: Shingo Imanishi, Takeo Arai, Suguro Dowaki

Optical measuring device

01/28/10 - 20100020321 - An optical measuring device is provided. The optical measuring device irradiates a sample flowing in a channel with light, and detecting light emitted from the sample, wherein the light is applied while scanned at least from one side wall to another side wall of the channel in a direction of
Inventors: Motohiro Furuki, Shingo Imanishi, Masataka Shinoda

Optical measuring instrument, and wavelength calibration method and optical measuring method for light detector

12/03/09 - 20090294702 - An optical measuring instrument includes: a flow channel for allowing a specimen to be circulated therein; a first light source including a light emitting diode for emitting light to be used for optical adjustment and/or image confirmation in the flow channel; a second light source for irradiating light upon the
Inventors: Shingo Imanishi, Motohiro Furuki

Hologram substrate, method for producing same, and electronic device

09/17/09 - 20090231648 - A hologram substrate includes a hologram section arranged on a surface of the hologram substrate, the hologram section having an uneven pattern configured to form a holographic image, in which the uneven pattern is a depth-modulated pattern and has smooth boundaries between projections and depressions.
Inventors: Shingo Imanishi, Masayoshi Kanno, Motohiro Furuki, Eisuke Negishi

Method for manufacturing microlens and method for manufacturing solid-state image sensor

07/30/09 - 20090189302 - A method for manufacturing a microlens includes forming a microlens by pressing a microlens mold having a reverse shape of a microlens formed therein on a microlens-forming film formed on a substrate to transfer the reverse shape of the microlens to the microlens-forming film. The microlens mold is formed by
Inventors: Goro Fujita, Seiji Kobayashi, Kimihiro Saito, Shingo Imanishi

Fine particle measuring method, substrate for measurement, and measuring apparatus

05/07/09 - 20090116005 - A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed. The method includes: sequentially irradiating the light to at least two or more
Inventors: Motohiro Furuki, Shingo Imanishi, Masataka Shinoda, Akitoshi Suzuki, Kazushi Miyake

Optical detection method and optical detection apparatus for a fine particle

04/30/09 - 20090108214 - Disclosed herein is an optical detection method and optical detection apparatus, the apparatus including: a light irradiation section configured to irradiate a laser beam upon one of fine particles which are successively fed in a flow path; and a light detection section configured to detect fluorescent light and/or scattered light
Inventors: Masataka Shinoda, Shingo Imanishi

Optical measuring device, optical measuring apparatus and fine particle measuring apparatus using optical measuring device

04/23/09 - 20090101847 - Disclosed herein is an optical measuring device, including: a plurality of microfluidic channels extending in parallel to each other; and a scanning section configured to scan a plurality of measuring light beams in a scanning direction in which the microfluidic channels are juxtaposed to optically measure fine particles introduced into
Inventors: Motohiro Furuki, Masataka Shinoda, Shingo Imanishi


### Shingo Imanishi patent invention listings

The bibliographic references displayed about Shingo Imanishi's patents are for a recent sample of Shingo Imanishi's publicly published patent applications. The inventor/author may have additional bibliographic citations listed at the USPTO.gov. FreshPatents.com is not associated or affiliated in any way with the author/inventor or the United States Patent/Trademark Office but is providing this non-comprehensive sample listing for educational and research purposes using public bibliographic data published and disseminated from the United States Patent/Trademark Office public datafeed. This information is also available for free on the USPTO.gov website. If Shingo Imanishi filed recent patent applications under another name, spelling or location then those applications could be listed on an alternate page. If no bibliographic references are listed here, it is possible there are no recent filings or there is a technical issue with the listing--in that case, we recommend doing a search on the USPTO.gov website.

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