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11/08/07 - USPTO Class 073 |  59 views | #20070256480 | Prev - Next | About this Page  073 rss/xml feed  monitor keywords

Scanning probe microscopy tips composed of nanoparticles and methods to form same

USPTO Application #: 20070256480
Title: Scanning probe microscopy tips composed of nanoparticles and methods to form same
Abstract: A structure and method for improving the spatial resolution of a scanning probe microscope (SPM) tip, which has been coated with a layer of chemically-synthesized nanoparticles. The nanoparticles are either single-species or heterogeneous, such that the single-species nanoparticles can be either ferromagnetic, paramagnetic, superparamagnetic, antiferromagnetic, ferrimagnetic, magneto-optic, ferroelectric, piezoelectric, superconducting, semiconducting, magnetically-doped semiconducting, insulating, fluorescent, or chemically catalytic. The layer of nanoparticles is at least two nanoparticles thick, or alternatively, is a single layer of nanoparticles thick, or alternatively, is a single layer of nanoparticles thick and covers only the tip apex portion of the tip, or alternatively, only a single nanoparticle is affixed to the tip apex. Alternatively, the layer of nanoparticles is transformed into an electrically-continuous magnetic film by annealing at a high temperature. (end of abstract)



Agent: Frederick W. Gibb, Iii Gibb & Rahman, LLC - Annapolis, MD, US
Inventors: Charles T. Black, Adam E. Cohen, Christopher B. Murray, Robert L. Sandstrom
USPTO Applicaton #: 20070256480 - Class: 073105000 (USPTO)

Related Patent Categories: Measuring And Testing, Surface And Cutting Edge Testing, Roughness

Scanning probe microscopy tips composed of nanoparticles and methods to form same description/claims


The Patent Description & Claims data below is from USPTO Patent Application 20070256480, Scanning probe microscopy tips composed of nanoparticles and methods to form same.

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