Radiant energy inventions 10/09

20090242734 - Current detection circuit, photoreceiver using the same, light emission control device, and electronic device using the same: A first transistor may be provided on a current path of a photo transistor. The bias current path may include a bias switch and a first bias resistor connected in series and is provided in parallel with a main current path including the phototransistor. A second transistor may configure a... Agent: Cantor Colburn, LLP

20090242738 - Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor: An imager having a switching circuit that couples pixel columns to different sample and hold circuits to reduce the noticeability of column-wise fixed pattern noise. A controller randomly couples a pixel column to a sample and hold circuit, therefore fixed pattern noise emanating from a particular sample and hold circuit... Agent: Dickstein Shapiro LLP

20090242739 - Semiconductor imaging device having a plurality of pixels arranged in a matrix-like pattern: In an arrangement with four PDs (PD1 to PD4) aligned along the column direction sharing the signal voltage reading unit, respective elements are disposed in the order of: PD/FD1 and TG-Tr1, 2/PD2/SF-Tr and SL-Tr/PD3/FD2 and TG-Tr3, 4/PD4/RS-Tr.... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20090242740 - Solid state imaging device, method of driving solid state imaging device, and image pickup apparatus: A solid-state imaging device which includes a pixel unit, a plurality of pixels in the pixel unit which are two dimensionally arranged in rows and columns and each include a photoelectric conversion element and a reset element, a driver unit which sequentially applies selective scanning to each respective row of... Agent: Sonnenschein Nath & Rosenthal LLP

20090242735 - Solid-state image pickup device and mask manufacturing method: A solid-state image pickup device includes: a light receiving region where photoelectric conversion elements are two-dimensionally arranged; and a microlens layer which has microlenses that introduce incident light into the photoelectric conversion elements. The microlens layer has a plurality of regions each having different microlens pitches. At least one region... Agent: Greenblum & Bernstein, P.L.C

20090242737 - Solid-state imaging device: A solid-state imaging device includes a light receiving section (LRS) comprising pixels. The LRS is divided into division regions; a charge transferring section (CTS) transferring charges accumulated in the LRS; an accumulation control electrode provided between the LRS and the CTS transfers charge accumulated in the LRS to the CTS... Agent: Young & Thompson

20090242736 - Solid-state imaging device and manufacturing method thereof and electronic apparatus and manufacturing method thereof: A solid-state imaging device is provided. The solid-state imaging device includes a substrate having a light sensing part for each of pixels; and one or more rod members made of a light transmissive material above the light sensing part for each of the pixels.... Agent: Robert J. Depke Lewis T. Steadman

20090242741 - Solid-state image capturing apparatus, manufacturing method for the solid-state image capturing apparatus, and electronic information device: A solid-state image capturing apparatus is provided, where each of the pixels comprises a pixel light receiving section for converting incident light into a signal charge by photoelectric conversion, a charge storing section for storing the signal charge and generating a signal voltage in accordance with the stored signal charge,... Agent: Edwards Angell Palmer & Dodge LLP

20090242742 - Optical encoder: An optical encoder includes a scale which is installed on one member of which, displacement is detected, and a detecting head which is installed on the other member which moves relatively with respect to the one member, and is disposed facing the scale. A predetermined optical pattern in a direction... Agent: Scully Scott Murphy & Presser, PC

20090242743 - Guided coherent atom source and atomic interferometer: A guided coherent atom source (1) includes elements for generating neutral atoms in a gaseous state (2), elements for cooling the atoms gas (3), elements for generating a magnetic field (4), including an electro-magnetic micro-chip (6) deposited on a surface (18) of a substrate (14), and capable of condensing the... Agent: Young & Thompson

20090242744 - Arrangement for producing electromagnetic radiation and method for operating said arrangement: A method for operating an assembly configured to produce electromagnetic radiation, especially X-ray radiation or extreme ultraviolet radiation. Particles, especially electrons, are guided onto a target by way of an adjustable focusing device. The particles produce electromagnetic radiation in the target. At least one object, especially a calibration object, is... Agent: Lerner Greenberg Stemer LLP

20090242745 - Method for detecting of geotectonic signals triggered by a geotectonic event: For the detection of geotectonic signals triggered by a geotectonic event, an infrasonic wave accompanying the geotectonic event and being generated at the ground and temperature fluctuations are utilized, causing a modulation of an airglow. The modulation of the airglow is detected from the ground by means of an infrared... Agent: Collard & Roe, P.C.

20090242746 - Inelastic background correction for a pulsed-neutron instrument: A method for correcting data collected with a neutron emitting instrument, includes: obtaining characterization data for the instrument, the characterization data including inelastic background data of the instrument; and correcting the collected data according to the characterization data. A computer program product and an instrument are provided.... Agent: Cantor Colburn LLP- Baker Atlas

20090242747 - Removable ion source that does not require venting of the vacuum chamber: A method and apparatus of combining an ion volume, a lens stack, and an ion optic that similarly cooperates with a detached multipole ion guide is herein incorporated into a single sub-assembly that can be removed from a mass spectrometer instrument without venting. Such an arrangement allows an operator to... Agent: Thermo Finnigan LLC

20090242749 - Mass spectrometer: An Electrospray ionisation ion source is disclosed comprising a capillary tube (3) surrounded by a gas nebuliser tube (2). One or more wires (4) are provided within the capillary tube (3). An analyte solution is supplied to the capillary tube (3) and a nebulising gas is supplied to the gas... Agent: Waters Technologies Corporation C/o Waters Corporation

20090242748 - Monopole time-of-flight tandem mass spectrometer: A tandem mass spectrometer operable to determine properties of chemical and biochemical compounds (analytes) comprises an ion source, a monopole ion processing cell positioned to receive primary ions from the ion source and a mass analyzer positioned to receive secondary ions output from the monopole ion processing cell. The monopole... Agent: Agilent Technologies Inc.

20090242751 - Power supply regulation using a feedback circuit comprising an ac and dc component: In various aspects, ion sources, mass spectrometer systems, and a power supply circuit coupled to a feedback circuit are provided. A power supply is provided that includes at least the power supply circuit and is operable to transfer charge to a load. The feedback circuit is responsive to a DC... Agent: Rauschenbach Patent Law Group, LLC

20090242750 - Protein purification and identification: The present invention relates to a method for protein purification and identification. More closely the invention relates to a method for protein pre-fractionation and identification resulting in improved yield of identified proteins. The method for pre-fractionation of protein samples, includes the following steps: a) reducing disulphide bridges (S-S bridges) or... Agent: Ge Healthcare Bio-sciences Corp. Patent Department

20090242752 - Sample holding device and mass spectroscope and mass spectroscopic method using the sample holding device: A sample holding device used for a mass spectroscope includes a substrate on which a detection surface is formed, a measuring region formed on the detection surface of the substrate and having placed thereon at least an analyte, and a reference region formed in another region of the detection surface... Agent: Sughrue Mion, PLLC

20090242753 - Device and mass analysis of molecules using uv or visible laser beam photodissociation: The invention relates to a device for mass analysis of molecules comprising a quadripolar ion trap equipped with an inlet for injection of molecules to be analysed in ionised form and an outlet for ejection of the ions to be detected, comprising an electrode system for generating a three-dimensional quadripolar... Agent: Dennison, Schultz & Macdonald

20090242756 - Intensified neutral loss tags and use thereof in mass spectrometry: Ultrasensitive detection of a chemical substance (analyte) by mass spectrometry is achieved by employing a molecular tag that yields an intense parent ion and then an intense daughter ion in a multi-stage mass spectrometer.... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20090242755 - Low pressure electrospray ionization system and process for effective transmission of ions: Systems and methods that provide up to complete transmission of ions between coupled stages with low effective ion losses. An “interfaceless” electrospray ionization system is further described that operates an electrospray at a reduced pressure such that standard electrospray sample solutions can be directly sprayed into an electrodynamic ion funnel... Agent: Battelle Memorial Institute Attn:IPServices, K1-53

20090242754 - Microchip and sample analysis method: The present invention provides a microchip and a sample analysis method in which mass analysis of a separated sample can be performed with high sensitivity without damaging resolution of a microchip. A microchip includes a channel formed on a substrate and sample collection portions which are formed along the channel,... Agent: Mcginn Intellectual Property Law Group, PLLC

20090242757 - Charged particle beam apparatus and method adjusting axis of aperture: A charged particle beam apparatus 1 includes a charged particle source 9, an aperture 18, an object lens 12, observing means 32, an aperture driving portion 19, and a control portion 30. The control portion 30 includes spot pattern forming means 33 for forming a plurality of spot patterns on... Agent: Bruce L Adams Adam & Wilks

20090242762 - Apparatus and method for inspecting sample: Method and apparatus have a film including a first surface to hold the liquid sample thereon, a vacuum chamber for reducing the pressure of an ambient in contact with a second surface of the film, primary beam irradiation means connected with the vacuum chamber and irradiating the sample with a... Agent: The Webb Law Firm, P.C.

20090242763 - Environmental cell for a particle-optical apparatus: The invention relates to an environmental cell for use in e.g. an electron microscope. The environmental cell shows an aperture (15) for passing the beam produced by the electron microscope to a sample (6) placed inside the environmental cell. The environmental cell according to the invention is characterized in that... Agent: Michael O. Scheinberg

20090242761 - Method and apparatus for charged particle beam inspection: A method, apparatus and computer readable medium for charged particle beam inspection of a sample comprising at least one sampling region and at least one skip region is disclosed. The method, apparatus and computer readable medium comprise receiving an imaging recipe which at least comprises information of the area of... Agent: Sawyer Law Group LLP

20090242760 - Method and apparatus for measuring dimension of circuit patterm formed on substrate by using scanning electron microscope: In the dimension measurement of a circuit pattern using a scanning electron microscope (SEM), in order to make it possible to automatically image desired evaluation points (EPs) on a sample, and automatically measure the circuit pattern formed at the evaluation points, according to the present invention, in the dimension measurement... Agent: Antonelli, Terry, Stout & Kraus, LLP

20090242758 - Multistage gas cascade amplifier: A novel detector for a charged particle beam system which includes multiple gas amplification stages. The stages are typically defined by conductors to which voltage are applied relative to the sample or to a previous stage. By creating cascades of secondary electrons in multiple stages, the gain can be increased... Agent: Michael O. Scheinberg

20090242759 - Slice and view with decoration: Imprecisely located defects are imaged by milling a series of slices and performing a light, preferential etch to provide a topographical interface between materials having similar secondary electron emission characteristics. The slices are sufficiently small to capture small defects, but are sufficiently large to overcome problems with redeposition.... Agent: Michael O. Scheinberg

20090242764 - Spin-torque probe microscope: A spin-torque probe microscope and methods of using the same are described. The spin-torque probe microscope includes a cantilever probe body, a magnetic tip disposed at a distal end of the cantilever probe body, an electrically conductive sample disposed proximate to the magnetic tip, an electrical circuit providing a spin-polarized... Agent: Campbell Nelson Whipps, LLC

20090242765 - Scanning electron microscope: It is facilitated in a scanning electron microscope to save the labor of executing the reproduction test, conduct basic analysis on a problem caused in execution of the automatic observation process, and confirm details resulting in the error. Upon detecting an error from an abnormality, the scanning electron microscope extracts... Agent: Antonelli, Terry, Stout & Kraus, LLP

20090242766 - Transmission electron microscope having electron spectroscope: A transmission electron microscope is capable of correcting, with high efficiency and high accuracy, an electron energy loss spectrum extracted from each of measured portions included in an electron energy loss spectral image with two axes representing the amount of an energy loss and positional information on a measured portion.... Agent: Mcdermott Will & Emery LLP

20090242767 - Radiation image capturing system, controller, program, and radiation image capturing method: A radiation image capturing system includes an image capturing apparatus for acquiring radiation image information of a subject by controlling a radiation source according to predetermined image capturing conditions, an image capturing order supply apparatus for supplying an image capturing order including the image capturing conditions, and a controller for... Agent: Sughrue Mion, PLLC

20090242768 - Thermal-type infrared solid-state imaging device and manufacturing method of the same: The thermal-type infrared solid-state imaging device comprises a infrared detector having at least a substrate provided with an integrated circuit for reading out a signal, a diaphragm for detecting a temperature change by absorbing infrared rays, and a support section for supporting the diaphragm above a surface of one side... Agent: Nec Corporation Of America

20090242769 - System and method of detecting human presence: A detector of human emitted Blackbody radiation includes a plurality of series connected thermocouples. A lens can be associated with each of the thermocouples. Incoming radiation produces a different response in each of the thermocouples in accordance with a respective angle of arrival even from a motionless radiation source.... Agent: Honeywell International Inc. Patent Services

20090242770 - Automatic and continuous quantitative analysis method and apparatus for multiple components: An automatic and continuous quantitative analysis method and apparatus capable of accurately and quickly quantifying the concentration of each component of a plurality of known components having close infrared absorption regions and similar infrared absorption curve shapes, included in a measurement sample. As a quantification wave number for each component... Agent: Rankin, Hill & Clark LLP

20090242771 - Non-invasive qualitative measurement of chemistry of blood and bodily fluids: Mid-IR spectrometer with no moving parts, which is small and compact, low power consuming, and can monitor blood sugar (glucose) and other blood and bodily fluid analytes on a continuing basis. It has many applications in the health, forensic, environmental and other areas.... Agent: Frank Hartley

20090242772 - Motor driven variable optical attenuator with ir sensor closed-loop control: Attenuators used to regulate optical signals are disclosed. According to one aspect of the present invention, an assembly including an IR source and an IR sensor is provided to sense blockage of optical signals transmitted between two collimators via a fixed common light blocker that is driven by a stepper... Agent: Silicon Valley Patent Agency

20090242773 - Positioning of photodetection events: Improved position estimation for a square photodetector having terminals at its corners is provided by first estimating an event position in a coordinate system aligned with the diagonals of the square, and then performing a coordinate rotation to provide an estimated position in a coordinate system aligned with the sides... Agent: Lumen Patent Firm

20090242774 - Radiation detector: A problem of local pin-hole defects generated in avalanche multiplication is avoided. Before an anode and a cathode are assembled as a light receiving element, a position of a pin-hole defect is specified by a vacuum container for specifying a defect position having a previously prepared field emission array for... Agent: J C Patents, Inc.

20090242776 - Image generation method and device for emission computed tomography: A first γ-ray generating in a body, caused by a PET pharmaceutical, and a second γ-ray emitted from a γ-ray source and transmitting through the body are detected with a radiation detector. The emission image information (E image information), E1, E1 and E2, at each of patient motion phases, 0,... Agent: Mattingly & Malur, P.C.

20090242775 - Radiation detection device, scintillation device and detection method, as well as multiple image-forming device: f

20090242777 - Photomultiplier tube interface device: The present invention provides a photomultiplier tube interface device (PMT), comprising a PMT module and a circuit substrate. The PMT module comprises a plurality of pins formed at a front end. A plurality of contacts are disposed on a lateral side of the circuit substrate to be electrically connected to... Agent: Wpat, PC

20090242778 - Radiation detection unit and radiographic inspection apparatus: Plural detection boards 22 are stacked and fixed. The detection board 22 has a wiring board 24, a semiconductor detection device 25 fixed on an upper surface of the wiring board 24 and configured to detect radiation, and a spacer 28 fixed on the upper surface of the wiring board... Agent: Ipusa, P.l.l.c

20090242780 - Radiological measurement system and radiological imaging system: A radiological measurement system protecting an amplifier from damage caused by a surge current, ensuring temporal continuity of measurement with a minimum dead time, and including a high voltage DC supply for applying a bias voltage to a radiation detector formed of semiconductor crystal, a controller for exercising on-off control... Agent: Mattingly & Malur, P.C.

20090242781 - X-ray detector: An X-ray detector includes: a semiconductor substrate to generate charged particles by an irradiation of an X-ray; a plurality of pixel electrodes arranged in matrix on an X-ray incident surface of the semiconductor substrate and applied with a first electric potential to detect the charged particles; and a platy electrode... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20090242779 - X-ray imaging sensor and x-ray imaging method: The invention concerns an x-ray imaging sensor and an x-ray imaging method in which, in a scintillator element (11, 21) or in an element having a corresponding functionality, x-ray quanta are converted into photons having a wavelength substantially greater than the wavelength range of the x-ray quanta. The information detected... Agent: Juan Carlos A. Marquez C/o Stites & Harbison PLLC

20090242782 - Surface diode sensor for megavoltage radiation therapy machines with reduced angular sensitivity: An improved diode sensor for calibration of megavoltage radiation machines eliminates high atomic number metallic components adjacent to a bottom surface of the diode substrate (away from the depletion region) to decrease a sensitivity of the diode sensor to incident angle of the radiation.... Agent: Boyle Fredrickson S.c.

20090242783 - Non-radioactive electron capture detector for gc: Electron capture detector for use with an effluent stream from a gas chromatograph includes a non-radioactive electron source means and an adjacent ionization chamber in which electron capture take place. The detector comprises two partial chambers, of which one contains the electron source, and the other contains connections for input... Agent: Barry Choobin

20090242784 - Bright and fast neutron scintillators: A scintillating material Cs(2-z)RbzLiLn(1-x)X6:xCe3+, where X is either Br or I, Ln is Y or Gd or Lu or Sc or La, where z is greater or equal to 0 and less or equal to 2, and x is above 0.0005 useful for detecting neutrons in a sample of radiation.... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20090242786 - Aberration corrector for transmission electron microscope: To provide an aberration corrector that guarantees freedom in designing a coma-free plane transfer portion even when the mechanical configuration of the aberration corrector is already decided, and has a flexible adjustment margin regarding the corrector exterior. The aberration corrector causes an electron beam trajectory emanating from a specimen plane... Agent: Antonelli, Terry, Stout & Kraus, LLP

20090242789 - Charged particle beam irradiating apparatus: A charged particle beam irradiating apparatus includes: scanning electromagnets that scan a charged particle beam; a wobbler irradiation unit that irradiates the charged particle beam using a wobbler method; a scanning irradiation unit that irradiates the charged particle beam using a scanning method; and a control unit that controls the... Agent: Squire, Sanders & Dempsey L.L.P.

20090242787 - Charged-particle beam writing method and charged-particle beam writing apparatus: A pattern density distribution and a dose distribution calculated using the pattern density distribution are multiplied by each other to calculate an exposure distribution. A fogging electron amount distribution is calculated using the exposure distribution and a function descriptive of a fogging spread distribution. Charge amount distributions in irradiation and... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20090242788 - Electron beam writing method, fine pattern writing system, method for manufacturing uneven pattern carrying substrate, and method for manufacturing magnetic disk medium: When writing the shapes of elements of a fine pattern on a substrate by microscopically vibrating the electron beam back and forth in a radial direction of the substrate or in a direction orthogonal to the radial direction and deflecting the electron beam in a direction orthogonal to the vibration... Agent: Young & Thompson

20090242785 - Super conducting beam guidance magnet, which can rotate and has a solid-state cryogenic thermal bus: The beam guidance magnet for deflection of a beam of electrically charged particles can rotate about an axis located outside the magnet, and free of ferromagnetic material influencing the beam guidance. The beam guidance magnet contains a system of at least four curved superconducting individual coils which extend in the... Agent: Staas & Halsey LLP

20090242792 - Electron microscopy: Using, as a detector, a CCD detector having a CCD element to which a scintillator is closely fixed, a backscattered or scanning transmission image is obtained by the following method. The detector is disposed directly under an objective lens to obtain the backscattered electron image. When one point of a... Agent: Miles & Stockbridge PC

20090242790 - Ion energy analyzer and methods of manufacturing and operating: An ion energy analyzer is described for use in diagnosing the ion energy distribution (IED) of ions incident on a radio frequency (RF) biased substrate immersed in plasma. The ion energy analyzer comprises an entrance grid exposed to the plasma, an ion selection grid disposed proximate to the entrance grid,... Agent: Tokyo Electron U.s. Holdings, Inc.

20090242791 - Two-grid ion energy analyzer and methods of manufacturing and operating: An ion energy analyzer is described for use in diagnosing the ion energy distribution (IED) of ions incident on a radio frequency (RF) biased substrate immersed in plasma. The ion energy analyzer comprises an entrance grid exposed to the plasma, an electron rejection grid disposed proximate to the entrance grid,... Agent: Tokyo Electron U.s. Holdings, Inc.

20090242793 - Flexible ion source: Liner elements to protect the ion source housing and also increase the power efficiency of the ion source are disclosed. Two liner elements, preferably constructed from tungsten, are inserted into the ion source chamber, one placed against each of the two sidewalls. These inserts are electrically biased so as to... Agent: Nields, Lemack & Frame, LLC

20090242794 - Charged particle beam equipment: Charged particle beam equipment has a processing unit for calibrating dimension values of an enlarged specimen image, and means for changing the amount by which a charged particle beam is scanned. Also, a specimen stand has a mechanism for holding a specimen having a periodical structure or a specimen simultaneously... Agent: Mcdermott Will & Emery LLP

20090242795 - Cryo-charging specimen holder for electron microscope: The present invention relates to a cryo-charging specimen holder for the electron microscope, particularly to a cryo-charging specimen holder for the electron microscope to hold various biological materials. The major feature of the invention is to charge the biological specimen and freeze the specimen at low temperature. The ice around... Agent: Bacon & Thomas, PLLC

20090242796 - Specimen pre-treatment apparatus and specimen holder: In a specimen pre-treatment apparatus, a specimen support part is screwed in a hollow column casing part while facing a specimen support end toward the same direction as an open end of the hollow column casing part. A specimen holder is arranged so that the specimen support end which supports... Agent: Snell & Wilmer LLP (oc)

20090242798 - 3d biplane microscopy: A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one... Agent: Nixon Peabody, LLP

20090242797 - System and method for multi-mode optical imaging: A technique is provided for multi-mode optical imaging. The technique includes directing a visible light and an excitation light multiplexed in time towards a specimen. The excitation light is configured to induce luminescence in the specimen. The technique also includes detecting visible light scattered or reflected from the specimen and... Agent: General Electric Company Global Research

20090242800 - Electron-beam dimension measuring apparatus and electron-beam dimension measuring method: An electron-beam dimension measuring apparatus includes: electron-beam irradiating means for irradiating a surface of a sample with an electron beam; a stage on which the sample is placed; a photoelectron generating electrode disposed so as to face the sample; ultraviolet light irradiating means for emitting ultraviolet light; and control means... Agent: Muramatsu & Associates

20090242802 - Flourescence detecting method and fluorescence detecting apparatus: An excitation light beam of a wavelength that excites fluorescent labels and a reference light beam having a wavelength longer than the excitation light beam are irradiated through a dielectric block toward an interface between the dielectric block and a metal film, to cause a first electric field enhancing field... Agent: Sughrue Mion, PLLC

20090242799 - Method for the detection of biologic particle contamination: Methods for detecting particles in a fluid, including determining particle size and intrinsic fluorescence of a particle, and time correlating the particle detection data with image data in the vicinity of the detector or detector inlet to identify contamination sources in clean environments are described.... Agent: Hayes Soloway P.C.

20090242801 - Method of fluorescence-microscopically imaging a structure in a sample with high three-dimensional spatial resolution: For imaging a structure in a sample with three-dimensional spatial resolution, a fluorophore is selected which is transferable by means of an optical transfer signal out of a first into a second photochromic state having specific fluorescence properties, and which displays a return rate back into the first photochromic state.... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20090242803 - Method and apparatus for measuring optical property of fluorescent sample: An optical property measuring method and an optical property measuring apparatus according to an aspect of the invention are operable to select bi-spectral characteristics relatively close to bi-spectral characteristics of a fluorescent sample, out of multiple bi-spectral characteristics stored in advance, based on a relative ratio between excitation efficiencies of... Agent: Brinks Hofer Gilson & Lione

20090242804 - Method for fluorescence analysis and fluorescence analyzer: The present invention aims at reducing background noise derived from a substance that is present in the vicinity of a target substance such as a DNA and protein and attached to the surface of a substrate without an effect on a fluorescent dye labeling the target substance. The substrate that... Agent: Mcdermott Will & Emery LLP

20090242807 - Correcting substrate for charged particle beam lithography apparatus: A correcting substrate for a charged particle beam lithography apparatus includes a substrate body using a low thermal expansion material having a thermal expansion lower than that of a silicon oxide (SiO2) material; a first conductive film arranged above the substrate; and a second conductive film selectively arranged on the... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20090242806 - Electroactive polymers for lithography: Systems and methods for lithography include actuating an electroactive polymer member to position mask and/or substrate.... Agent: Searete LLC Clarence T. Tegreene

20090242805 - Systems and methods for uniform sequential lateral solidification of thin films using high frequency lasers: Under one aspect, a method for processing a thin film includes generating a first set of shaped beamlets from a first laser beam pulse, each of the beamlets of the first set of beamlets having a length defining the y-direction, a width defining the x-direction, and a fluence that is... Agent: Wilmerhale/columbia University

20090242808 - Techniques for improved uniformity tuning in an ion implanter system: Techniques for uniformity tuning in an ion implanter system are disclosed. In one particular exemplary embodiment, the techniques may be realized as a method for ion beam uniformity tuning. The method may comprise generating an ion beam in an ion implanter system. The method may also comprise measuring a first... Agent: Hunton & Williams LLP/varian Semiconductor, Equipment Associates, Inc.

20090242809 - Radiation-shielding glass and method of manufacturing the same: Provided is a radiation-shielding glass, including a glass composition in % by mass of 10 to 35% SiO2, 55 to 80% PbO, 0 to 10% B2O3, 0 to 10% Al2O3, 0 to 10% SrO, 0 to 10% BaO, 0 to 10% Na2O, and 0 to 10% K2O, in which the... Agent: Wenderoth, Lind & Ponack, L.L.P.