Radiant energy inventions 12/08

20080315068 - Detection device and electronic apparatus: A unit circuit includes a first transistor, a detection element, a second transistor, and a first capacitive element. The first transistor supplies a detection line with a detection signal corresponding to the electric potential of a gate electrode thereof. The detection element is connected to the gate electrode of the... Agent: Oliff & Berridge, PLC

20080315069 - Optical head device: An optical head device includes a light source which emits a light beam, an objective lens which condenses the light beam on the optical disk, a condensing lens which condenses reflected light from the optical disk, a liquid crystal panel disposed near a focal point of the condensing lens and... Agent: Amin, Turocy & Calvin, LLP

20080315070 - Display apparatus and brightness adjustment method thereof: A brightness adjustment method is applied to a display apparatus comprising a light source and a light sensor and includes the following steps. First, a target brightness value L1 is provided. Then, a detected value S2 of the light sensor is obtained by using the light sensor to detect brightness... Agent: Bacon & Thomas, PLLC

20080315072 - Apparatus and method for producing a representation of an object scene: An apparatus (2) and a method for producing a representation of an object scene, including a detector arrangement (12) with a plurality of detector units (20, 22) and an optical unit (4, 8) for producing the image of the object scene on the detector arrangement (12). To produce a high... Agent: Scully Scott Murphy & Presser, PC

20080315071 - Image reading apparatus and controlling method thereof: An image reading apparatus includes light sources, an image sensor, a data generating unit, and a carrier unit. The light sources are sequentially turned on for an identical period once in a single line period. The image sensor reads information from a print medium irradiated by the light sources. The... Agent: Lowe Hauptman Ham & Berner, LLP

20080315073 - Method and apparatus for setting black level in an imager using both optically black and tied pixels: An imaging pixel array includes an active area of pixels, organized into rows and columns of pixels. The array also includes a plurality of dark pixel columns adjacent to the active area of pixels such that rows of pixels in the active area of pixels extend across the plurality of... Agent: Dickstein Shapiro LLP

20080315074 - Array-type light receiving device and light collection method: An array-type light receiving device includes a first light collector, a second light collector configured to receive light collected by the first light collector, and a light receiver configured to receive light collected by the second light collector. The first light collector has a spherical shape, the second light collector... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080315075 - Method for optically detecting and identifying a threat: An optical detection apparatus includes a housing having a circumferential opening therein. A primary mirror reflects light rays to form a first set of light rays to a secondary mirror that has a generally concave shape coupled to the housing. A tertiary mirror having a generally concave shape coupled to... Agent: Ostrager Chong Flaherty & Broitman, P.C.

20080315076 - Absolute position encoder: A scale has a first incremental track with first incremental patterns including first light and dark patterns formed at equal intervals in first periods, an absolute track with absolute patterns representing absolute positions, and a second incremental track with second incremental patterns including second light and dark patterns formed at... Agent: Rankin, Hill & Clark LLP

20080315077 - Scanning unit for an optical position-measuring device: A scanning unit for an optical position-measuring device includes a semiconductor light source and at least one downstream reflector element that has a defined optical effect on the beams of rays emitted by the semiconductor light source. The optically active surface of the reflector element is arranged in subregions to... Agent: Kenyon & Kenyon LLP

20080315078 - Wavelength measuring device, light receiving unit, and wavelength measuring method: A wavelength measuring device includes: light receiving elements that receive light to be measured; a temperature controller that maintains the light receiving elements at different temperatures from one another; and a calculation unit that determines the wavelength of the light to be measured, based on outputs of the light receiving... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080315079 - Symbia head position correction: apparatus and method: A system and method provide for more accurate SPECT/CT image registration. CT data is utilized to establish a global spatial coordinate system of a common test phantom. The common test phantom is then used to obtain a set of point source nuclear images. Three-dimensional CT point source data is mapped... Agent: Siemens Corporation Intellectual Property Department

20080315080 - Electrostatic trap: An electrostatic trap such as an orbitrap is disclosed, with an electrode structure. An electrostatic trapping field of the form U′(r,φ,z) is generated to trap ions within the trap so that they undergo isochronous oscillations. The trapping field U′(r, φ,z) is the result of a perturbation W to an ideal... Agent: Thermo Finnigan LLC

20080315081 - Mass spectrometry precursor ion selection: The present invention is concerned with methods for the selection of precursor ions of a sample polypeptide for fragmentation in mass spectrometry, together with methods for determining at least one putative amino acid sequence for a sample polypeptide, apparatus and computer programs for same.... Agent: Jacobson Holman PLLC

20080315082 - Mass spectrometric analyzer: A tandem mass spectrometer comprising an ion source for ionizing a sample, an ion trap section for carrying out collision induced dissociation of the target ions thereby to produce fragment ions, a multi electrode collision section for conducting collision induced dissociation of fragment ions discharged from the ion trap section,... Agent: Mcdermott Will & Emery LLP

20080315084 - Analysis method of amino acid using mass spectrometer: A pretreatment method of samples, in which injections of samples are performed efficiently and precisely when amino acids are analyzed with a mass spectrometer, is provided. For the analysis method of samples including analyte comprising an amino acid, an amine and/or a peptide with mass spectrometry, the analyte is derivatized... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080315083 - Device and method for coupling capillary separation methods and mass spectrometry: The present invention relates to capillaries which are at least partially sheathed with metal foil and to the use thereof in the coupling of methods such as HPLC, CE (capillary electrophoresis), CEC (capillary electrochromatography) or pCEC (pressurised CEC) to MS (mass spectrometry). The sheathing according to the invention with metal... Agent: Millen, White, Zelano & Branigan, P.C.

20080315086 - Branched radio frequency multipole: Systems and methods of the invention include a branched radio frequency multipole configured to act, for example, as an ion guide. The branched radio frequency multipole comprises multiple ion channels through which ions can be alternatively directed. The branched radio frequency multipole is configured to control which of the multiple... Agent: Thermo Finnigan LLC

20080315085 - Faims cell having an offset ion inlet orifice: A FAIMS cell has an elongated inner electrode with a longitudinal axis extending along a first direction. The inner electrode has a curved outer surface that defines a circle when viewed in a cross section that is taken in a plane normal to the longitudinal axis, which itself passes through... Agent: Thermo Finnigan LLC

20080315087 - Method and apparatus for digital differential ion mobility separation: A method for differential mobility separation of ions using digital-drive based high voltage fast switching electronics. The digital waveform delivered to the spectrometer is characterized by at least two substantially rectangular pulses of different amplitude and polarity. The control circuitry allows for waveform frequency, duty cycle and pulse amplitudes to... Agent: Sughrue Mion, PLLC

20080315088 - Composite charged-particle beam system: There is provided a method of arranging, as a composite charged-particle beam system, a gas ion beam apparatus, an FIB and an SEM in order to efficiently prepare a TEM sample. The composite charged-particle beam system includes an FIB lens-barrel 1, an SEM lens-barrel 2, a gas ion beam lens-barrel... Agent: Brinks Hofer Gilson & Lione

20080315089 - Electron gun, electron beam exposure apparatus, and exposure method: An electron gun includes an electron source configured to emit electrons. The electron source includes an electron emission region configured to emit the electrons and an electron emission restrictive region configured to restrict emission of the electrons. The electron emission restrictive region is located on a side surface of the... Agent: Muramatsu & Associates Suite 310

20080315090 - Objective lens, electron beam system and method of inspecting defect: An electron beam system or a method for manufacturing a device using the electron beam system in which an electron beam can be irradiated at a high current density and a ratio of transmittance of a secondary electron beam of an image projecting optical system can be improved and which... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080315091 - Imaging and sensing based on muon tomography: Techniques, apparatus and systems for detecting particles such as muons for imaging applications. Subtraction techniques are described to enhance the processing of the muon tomography data.... Agent: Fish & Richardson, PC

20080315092 - Scanning probe microscopy inspection and modification system: A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or... Agent: Imperium Patent Works

20080315094 - Charged particle detection devices: A charged particle detector consists of a plurality independent light guide modules assembled together to form a segmented in-lens on-axis annular detector, with a center hole for allowing the primary charged particle beam to pass through. One side of the assembly facing the specimen is coated with or bonded to... Agent: Muncy, Geissler, Olds & Lowe, PLLC

20080315095 - Electron beam apparatus, a device manufacturing method using the same apparatus, a pattern evaluation method, a device manufacturing method using the same method, and a resist pattern or processed wafer evaluation method: Provided is an electron beam apparatus comprising: an electron beam emitter (32) having an electron gun (30), said electron gun (30) disposed along an optical axis (23) and operable to emit a plurality of off-axis electron beams along a direction defined by a certain angle with respect to the optical... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080315093 - Electron beam inspection method and electron beam inspection apparatus: An electron beam inspection apparatus images reflected electrons and cancels negative charging derived from electron-beam irradiation. Ultraviolet rays are irradiated and an irradiated area of ultraviolet rays is displayed as a photoelectron image. The photoelectron image and a reflected-electron image are displayed on a monitor while being superposed on each... Agent: Stanley P. Fisher Reed Smith LLP

20080315097 - Charged particle beam apparatus and specimen holder: Information of a specimen holder or information of a specimen mounted on the specimen holder is stored in a memory inside the specimen holder mounted to an electron microscope. The memory is accessed to transmit the information of the specimen holder to the electron microscope, thereby ensuring that the user... Agent: Mcdermott Will & Emery LLP

20080315096 - Portable electron microscope using micro-column: Provided is a portable electron microscope using a microcolumn. The portable electron microscope includes a microcolumn, a low vacuum pump, a high vacuum pump, an ultra-high vacuum ion pump, a first chamber for receiving and fixing the microcolumn and a sample to be measured and forming a vacuum by means... Agent: Park Law Firm

20080315098 - Photoconductive element for generation and detection of terahertz wave: A photoconductive element for generating or detecting a terahertz wave comprises a carrier generation layer for generating carriers on light irradiation, a pair of conductive electrodes provided in opposition on one face of the carrier generation layer, each containing a strip line, a pair of conductive antennas placed in opposition... Agent: Fitzpatrick Cella Harper & Scinto

20080315099 - Detector of infrared radiation having a bi-material transducer: A representative embodiment of the invention provides an infrared (IR) detector having a movable plate supported at an offset distance from a substrate by a suspension arm. In response to a temperature difference between the plate and the substrate generated by the incident IR radiation, the suspension arm deforms and... Agent: Mendelsohn & Associates, P.C.

20080315100 - Thin film multi-layered pyroelectric capacitor: Aspects described herein provide for the design and fabrication of a device with an enhanced pyroelectric response signal comprised of multi-capacitors that are connected in series. These capacitors are fabricated using multi-layers of materials such as lead zirconate titanate (PZT), BaxSr1-xTiO3 (barium strontium titanate) and Bi4Ti3O12 (bismuth titanate) films that... Agent: Ballard Spahr Andrews & Ingersoll, LLP

20080315101 - Diamond-like carbon infrared detector and associated methods: Diamond-like carbon based energy conversion devices and methods of making and using the same are disclosed. Such devices may include a surface for detection of infrared photons. Such a surface may include at least one metal cone and a diamond-like carbon layer disposed on the at least one metal cone.... Agent: Thorpe North & Western, LLP.

20080315102 - Infrared spectrometer: Method and apparatus for detecting, by absorption spectroscopy, an isotopic ratio of a sample, by passing first and second laser beams of different frequencies through the sample. Two IR absorption cells are used, a first containing a reference gas of known isotopic ratio and the second containing a sample of... Agent: Birch Stewart Kolasch & Birch

20080315103 - Fourier transform infrared spectrophotometer: Disclosed is a Fourier transform infrared spectrophotometer, which comprises: a main interferometer section including a beam splitter, a fixed mirror, a movable mirror, and a phase plate disposed between the beam splitter and the fixed mirror; a control interferometer section having a quadrature control system for calculating a position of... Agent: Sughrue Mion, PLLC

20080315104 - Color image sensing apparatus and method of processing infrared-ray signal: A color image sensing apparatus and a method of processing an infrared-ray signal are provided. The image sensing apparatus includes: a color filter array including a plurality of color filter units, each color filter unit including a red-pass filter passing red light, a green-pass filter passing green light, and a... Agent: Sherr & Vaughn, PLLC

20080315105 - Method and apparatus for correcting excess signals in an imaging system: A method and apparatus for excess signal compensation in an imaging system is described. In one particular embodiment, the invention provides for non-linear background, offset (due to time dependent dark current) and/or lag (including constant, linear and non-linear terms, due to image persistence) corrections of large area, flat panel imaging... Agent: Varian/bstz Blakely Sokoloff Taylor & Zafman LLP

20080315106 - Multiple layer detector for spectral computed tomography imaging: A radiation detector (100) includes at least first (202) and second (204) scintillators which absorb radiation and generate light at respective first (212) and second (214) wavelengths. The detector also includes at least first (206) and second (208) photodetectors. The first photodetector (206) is substantially non-responsive to light of the... Agent: Philips Intellectual Property & Standards

20080315107 - Portable system for detection and identification of gamma, neutron and x-ray radiation: A portable hand-held system for identification of a radiation source includes a portable detection unit that detects gamma radiation, X-ray radiation and neutron radiation emitted due to nuclear decay in the radiation source being inspected and provides a corresponding detection signal based on the radiation. A radioisotope analysis unit analyzes... Agent: Bardmesser Law Group, P.C.

20080315108 - Neutron detector: A neutron detector comprises a gas-filled dielectric shell, preferably a glass balloon, having opposite electrodes. An electric field is established whereby ionizing particles may be detected via ionization and current flow in the gas, using a pulse height analyzer or other conventional means. The dielectric shell preferably has low gas... Agent: Robert J. Lauf

20080315109 - Neutron detector: A neutron detector has a volume of neutron moderating material and a plurality of individual neutron sensing elements dispersed at selected locations throughout the moderator, and particularly arranged so that some of the detecting elements are closer to the surface of the moderator assembly and others are more deeply embedded.... Agent: Robert J. Lauf

20080315110 - Radiation measurement using multiple parameters: An improved radiation detection device measures a broad range of dose rate levels. According to one arrangement, the radiation detection device calculates a radiation value based on, gamma count information representing counts for different energy levels of radiation in a radiation field as well as a radiation intensity indicator value... Agent: Barry W. Chapin, Esq. Chapin Intellectual Property Law, LLC

20080315112 - Charged particle beam deflection method with separate stage tracking and stage positional error signals: The invention provides a method for patterning a resist coated substrate carried on a stage, where the patterning utilizes a charged particle beam. The method comprises the steps of: moving the stage at a nominally constant velocity in a first direction; while the stage is moving, deflecting the charged particle... Agent: Pillsbury Winthrop Shaw Pittman LLP

20080315111 - Particle therapy system: A particle therapy system is provided. The particle therapy system includes a rotatable gantry with a gantry wall that surrounds an interior. A small irradiation chamber, with an irradiation chamber wall, is located inside the interior. The irradiation chamber wall is spaced apart from the gantry wall, and a deflection... Agent: Brinks Hofer Gilson & Lione

20080315113 - Beam guidance magnet: A beam guidance magnet for deflecting a beam of electrically charged particles along a curved particle path is provided. The beam guidance magnet includes a coil system that does not include a ferromagnetic material affecting the beam guidance and has curved coils stretched out along the particle path, the coils... Agent: Brinks Hofer Gilson & Lione

20080315114 - High voltage insulator for preventing instability in an ion implanter due to triple-junction breakdown: A high voltage insulator for preventing instability in an ion implanter due to triple junction breakdown is described. In one embodiment, there is an apparatus for preventing triple junction instability in an ion implanter. In this embodiment, there is a first metal electrode and a second metal electrode. An insulator... Agent: Scott Faber, Esq. Varian Semiconductor Equipment Associates, Inc

20080315115 - Treatment of fluids with wave energy from a carbon: A method of and apparatus for treating liquids flowing in a thin film around a source of wave energy to directly exposes the liquid to the wave energy, preferably generated in whole or part by an electrical arc between carbon electrodes. In addition to the wave energy generated by the... Agent: Chalker Flores, LLP

20080315116 - Optical uv lamp-on indicator: An observable optical lamp status display system is provided for an ultraviolet irradiation lamp concealed from view. An external lamp status display panel that is within the field of view of an observer registers the operating status of each ultraviolet light irradiation lamp in an array of irradiation lamps. A... Agent: Cislo & Thomas LLP

20080315117 - Cleanable helical modules: The invention relates to cleanable spiral modules and a method for production thereof.... Agent: Norris, Mclaughlin & Marcus, P.A.

20080315118 - Fluorescence measurement probe: A fluorescence measurement probe capable of stably receiving a maximum received light amount of a fluorescent light generated from a specimen onto which an excitation light is radiated. The fluorescence measurement probe is applied to a fluorescence measurement system provided with an optical system. A light source emits an excitation... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080315119 - Method of analysing a sample and apparatus therefor: A method for performing photo-modification of a biological sample, the method comprising: (a) irradiating the sample; (b) detecting one or more signals based on the irradiated sample; (c) using one or more processor means to analyze the detected signals and determine one or more irradiation parameters, and, (d) returning to... Agent: Barnes & Thornburg

20080315120 - Focusing and positioning device for a particle-optical raster microscope: The invention relates to a focusing and positioning ancillary device for a particle-optical scanning microscope, a particle-optical scanning microscope including a corresponding positioning aid, and a method for focusing and positioning an object in a particle-optical scanning microscope. The focusing and positioning ancillary device includes an illuminating device, a camera,... Agent: Walter Ottesen

20080315122 - Charged particle beam system and method for evacuation of the system: The present invention provides a charged particle beam system which can perform evacuation on an electron gun chamber or an ion-gun chamber having a non-evaporable getter pump in a short time and can maintain the ultra-high vacuum for a long time, and a technology of evacuation therefor. Provided is a... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080315123 - Optical component and method for its production: To obtain an optical component having excellent secondary optical nonlinear properties by irradiating a surface and/or inside of glass having at least one member selected from Ni, Fe, V, Cu, Cr and Mn as a heat source material for absorbing and converting a laser beam to heat, incorporated to a... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080315121 - Radiation detector, method of manufacturing a radiation detector and lithographic apparatus comprising a radiation detector: The invention relates to a radiation detector, a method of manufacturing a radiation detector and a lithographic apparatus comprising a radiation detector. The radiation detector has a radiation-sensitive surface. The radiation-sensitive surface is sensitive for radiation with a wavelength between 10-200 nm. The radiation detector has a silicon substrate, a... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20080315126 - Laser light source apparatus, exposure method, and exposure apparatus: Information on the side of the body of an exposure apparatus is effectively used on the side of the laser light source apparatus. There is provided a laser light source apparatus which supplies a laser beam to a body of an exposure apparatus which exposes a wafer, and includes a... Agent: Oliff & Berridge, PLC

20080315125 - Method and system for measuring contamination of a lithographical element: A method and system for measuring contamination of a lithographic element is disclosed. In one aspect, the method comprises providing a first lithographical element in a process chamber. The method further comprises providing a second lithographical element in the process chamber. The method further comprises covering part of the first... Agent: Knobbe Martens Olson & Bear LLP

20080315124 - Space tolerance with stitching: A method for manufacturing a stitched space in a semiconductor circuit implements a photolithographic process for printing one or more image fields on a wafer surface, each image field corresponding to a portion of a circuit or device and including a space that is to be stitched in adjacent image... Agent: Scully, Scott, Murphy & Presser, P.C.

20080315130 - Focused ion beam processing system and method: A focused ion beam (FIB) processing system includes a FIB irradiation unit that irradiates a FIB onto a pattern formed in a wafer, to form a section of the pattern, an imaging unit that images the section of the pattern, a calculation unit that calculates a pattern size based on... Agent: Sughrue Mion, PLLC

20080315129 - Ion planting while growing a iii-nitride layer: A method that includes implantation of dopants while a III-nitride body is being grown on a substrate, and an apparatus for the practice of the method.... Agent: Ostrolenk Faber Gerb & Soffen

20080315127 - Ion implanter operating in pulsed plasma mode: The present invention relates to an ion implanter IMP comprising a pulsed plasma source SPL, a substrate-carrier tray PPS, and a power supply ALT for the tray. The implanter also includes a capacitor C connected directly to ground E and connected downstream from the tray power supply ALT. The invention... Agent: Horst M. Kasper

20080315128 - Method and apparatus for flattening solid surface: A method for flattening a sample surface by irradiating the sample surface with a gas cluster ion beam, generates clusters of source gas in a cluster generating chamber, ionizes the generated clusters in an ionization chamber, accelerates the ionized cluster beam in an electric field of an accelerating electrode, selects... Agent: Gallagher & Lathrop, A Professional Corporation

20080315131 - Method and device for characterising a structure by wavelength effect in a photoacoustic system: The invention relates to a structure characterising device comprising means which are used for generating a first pump radiation and a second probe radiation and for transmitting different wavelength radiation, means for producing a time offset between said first pump and second probe radiation on the structure by means of... Agent: Harness, Dickey & Pierce, P.L.C

20080315132 - Flat uv light source: A flat UV light source has a tight packing of UV light-emitting diodes (56) that are arranged in a matrix. These light-emitting diodes are cooled by cooling air flows (66) or by cooling water flows.... Agent: Factor & Lake, Ltd

20080315134 - Optical system for radiation in the euv-wavelength range and method for measuring a contamination status of euv-reflective elements: An optical system for radiation in the EUV wavelength range, in particular a projection exposure apparatus, having at least one vacuum vessel, including: at least one EUV-reflective optical element arranged in an optical path, and a holder which includes at least one sample element, the sample element having an optical... Agent: Sughrue Mion, PLLC

20080315133 - Uv irradiation unit: The invention relates to a UV irradiation unit comprising a housing (10), a rod-shaped lamp (12) which is arranged therein, a reflector (14) which extends along the UV-lamp (12) and which defines a lamp chamber (22) which surrounds the UV-lamp (12), in addition to a channel system (20) for guiding... Agent: Collard & Roe, P.C.

20080315135 - Optical encoder and electronic equipment: This optical encoder includes a light emitting section and a plurality of light receiving elements placed so as to be aligned in one direction in an area where a light beam from the light emitting section may reach. A moving object includes a light-ON section, a light-OFF section and an... Agent: Birch Stewart Kolasch & Birch

20080315136 - Ultraviolet microscope apparatus: A camera obtains an observation image of a sample by capturing the image of the sample on which an ultraviolet light generated by a light source device is irradiated. An image processing unit of a controlling device generates a synthesis observation image of the sample based on a plurality of... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080315137 - X-ray imaging apparatus: An exemplary X-ray imaging apparatus includes an X-ray source, a phosphor layer, an optical leveling element, an image sensor, an image processor, and a display. The optical leveling element includes a plurality of lenses formed thereon. A refractive index of the plurality of the lenses progressively increases from a center... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080308712 - Image capturing apparatus: An image capturing apparatus is provided that simultaneously captures a visible light image and an infra-red light image in which the same subject is in focus. The image capturing apparatus includes a light receiving section that receives light from a subject; a partial wavelength spectrum diaphragm section that is disposed... Agent: Sughrue Mion, PLLC

20080308714 - Microprocessor based automatically dimmable eye protection device with interruption prevention: An auto darkening eye protection device comprising a shutter assembly and a control circuit in electrical communication with the shutter assembly. The shutter assembly is adjustable between a clear state and a dark state. The control circuit comprises a microcontroller programmed to store a plurality of memory presets including at... Agent: Dunlap Codding, P.C.

20080308715 - Receiving apparatus: There may be provided a receiving apparatus including: a light receiving element which receives an optical signal and generates a current signal dependent on the optical signal; a conversion unit which converts the current signal into a voltage signal; a reference voltage generation unit which generates a reference voltage; a... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080308713 - Variable gain constant bandwidth trans-impedance amplifier for fiber optic rate sensor: A trans-impedance amplifier with gain control for a fiber optic rotation rate sensor. A variable gain amplifier having gain control based on keeping the amplifier output above a certain level. The gain control approach allows the amplifier bandwidth to remain constant. A gain control circuit includes a control device connected... Agent: Honeywell International Inc. Patent Services Ab-2b

20080308716 - Automatic photodiode biasing circuit: A biasing circuit for a photodiode. The novel biasing circuit includes a first system for setting a reference gain threshold, a second system for setting an operating gain threshold, and a third system for adjusting a bias of the photodiode until a ratio of the operating gain threshold to the... Agent: Benman, Brown & Williams

20080308717 - Camera module with window mechanical attachment: An image sensor package includes a molding having a locking feature. The package further includes a snap lid having a tab, where the tab is attached to the locking feature of the molding. To form the image sensor package, a window is placed in a pocket of the molding. The... Agent: Gunnison Mckay & Hodgson, LLP Garden West Office Plaza, Suite 220

20080308718 - Position control for scanning probe spectroscopy: A method of position control for scanning probe spectroscopy of a specimen. Probe positional error is determined by comparing images generated from a sequence of scans to identify differences between positions of at least a portion of a reference characteristic of the specimen in the images. A probe is moved... Agent: Reising, Ethington, Barnes, Kisselle, P.C.

20080308719 - Shielded source detection and activity correction system: The method of analyzing the measured radiation spectra to estimate the identified nuclide activities using a designated efficiency calibration based on average expected geometry and using spectral characteristics to flag significant shielding that would otherwise skew said nuclide activities (FIG. 5). And providing an estimation of activity correction factor or... Agent: Carstens & Cahoon, LLP

20080308720 - Use of elemental pulse neutron spectroscopy measurements for indexing bitumen viscosity in the well: Elemental analysis of an earth formation is obtained using measurements from a gamma ray logging tool. From the elemental analysis, an estimate of the carbon content and the sulfur, vanadium, nickel, titanium and/or molybdenum content of the formation is determined. A table look-up is used to estimate the viscosity from... Agent: Madan, Mossman & Sriram, P.C.

20080308722 - Electrospray-assisted laser-induced acoustic desorption ionization mass spectrometer and a method for mass spectrometry: A mass spectrometer includes: an electrospray unit for forming liquid drops of an electrospray medium; a voltage supplying member disposed to allow the liquid drops to be laden with a plurality of charges for heading toward a receiving unit along a traveling path; a substrate having a sample surface for... Agent: Foley And Lardner LLP Suite 500

20080308721 - Ion transport device: A device for transporting and focusing ions in a low vacuum or atmospheric-pressure region of a mass spectrometer is constructed from a plurality of longitudinally spaced apart electrodes to which oscillatory (e.g., radio-frequency) voltages are applied. In order to create a tapered field that focuses ions to a narrow beam... Agent: Thermo Finnigan LLC

20080308723 - Method of non-targeted complex sample analysis: A method for non-targeted complex sample analysis which involves the following steps. A first step involves providing a database containing identifying data of known molecules. A second step involves introducing a complex sample containing multiple unidentified molecules into a Fourier Transform Ion Cyclotron Mass Spectrometer to obtain data regarding the... Agent: Nixon Peabody LLP - Patent Group

20080308724 - Calibration curves for time-of-flight mass spectrometers: The invention relates to determining the masses from the time-of-flight values of ions in time-of-flight mass spectrometers where the accelerating voltage for the ions is not applied permanently, but is switched on at a certain time, resulting in a temporally changing acceleration for a short time after the voltage has... Agent: O'shea, Getz & Kosakowski, P.C.

20080308726 - Method for the operation of a measurement system with a scanning probe microscope and a measurement system: The invention relates to a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to a measurement system for examining a measurement sample using a scanning probe microscope and for optically examining said sample. In the method, an optical image of... Agent: Schmeiser, Olsen & Watts

20080308725 - Semiconductor device inspection apparatus: A semiconductor device inspection apparatus having a noise subtraction function includes an electron gun, a stage for holding a sample, a main detector for detecting a signal discharged from the sample, and at least one or more sub detector for detecting noise generated from the sample or apparatus so that... Agent: Mcdermott Will & Emery LLP

20080308729 - Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former: A substrate inspection apparatus 1-1 (FIG. 1) of the present invention performs the following steps of: carrying a substrate “S” to be inspected into an inspection chamber 23-1; maintaining a vacuum in said inspection chamber; isolating said inspection chamber from a vibration; moving successively said substrate by means of a... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080308728 - Atom probes, atom probe specimens, and associated methods: The present invention relates generally to atom probes, atom probe specimens, and associated methods. For example, certain aspects are directed toward methods for analyzing a portion of a specimen that includes selecting a region of interest and moving a portion of material in a border region proximate to the region... Agent: Perkins Coie LLP Patent-sea

20080308727 - Sample preparation for micro-analysis: System and method for preparing a sample for micro-analysis, comprising: (a) sample precursor holding unit, for supporting and holding a sample precursor; (b) transporting and positioning unit, for transporting and positioning the sample precursor holding unit; (c) optical imaging unit, for optically imaging, recognizing, and identifying, target features on the... Agent: Martin D. Moynihan D/b/a Prtsi, Inc.

20080308730 - Real-time, 3d, non-linear microscope measuring system and method for application of the same: A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short... Agent: Birch Stewart Kolasch & Birch

20080308731 - Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder: A specimen holder, a specimen inspection apparatus, and a specimen inspection method permitting a specimen consisting of cultured cells to be observed or inspected. Also, a method of fabricating the holder is offered. The holder has an open specimen-holding surface. At least a part of this surface is formed by... Agent: The Webb Law Firm, P.C.

20080308732 - System and method for analyzing a thermal image using configurable markers: A graphical user interface for analyzing thermal images is provided. The interface can be used to identify the temperatures at multiple areas of interest defined on an image. The areas can be denoted by configurable markers of different predetermined shapes. In some embodiments, the interface simultaneously displays temperature statistics relating... Agent: Perkins Coie LLP Patent-sea

20080308733 - Optical gas sensor: There is disclosed a gas sensor comprising an electromagnetic radiation source, a detector which is sensitive to radiation from the source and a waveguide which comprises at least a part of an optical path from the source to the detector through a gas sample, the waveguide comprising a first waveguide... Agent: Nixon & Vanderhye, PC

20080308734 - Radiation image conversion panel, scintillator panel, and radiation image sensor: The radiation image conversion panel in accordance with the present invention has an aluminum substrate; an alumite layer formed on a surface of the aluminum substrate; a chromium layer covering the alumite layer; a metal film, provided on the chromium layer, having a radiation transparency and a light reflectivity; an... Agent: Drinker Biddle & Reath (dc)

20080308735 - Diagnosis of whiplash associated disorders (wad) by using pet with d-[methyl-11c]-deprenyl (dde): Positron Emission Tomography (PET) tracers such as D-[methyl-11C]-Deprenyl (DDE) and [11C]-GR205171 (GLD), methods for and methods of preparing biological mechanisms that identify treatment targets in connection with Whiplash-Associated Disorder (WAD) are provided. Associated kits for the evaluation of the biological mechanisms are also provided.... Agent: Ge Healthcare, Inc.

20080308736 - Radiation image conversion panel, scintillator panel, and radiation image sensor: The radiation image conversion panel in accordance with the present invention has an aluminum substrate; an alumite layer formed on a surface of the aluminum substrate; a metal film, provided on the alumite layer, having a radiation transparency and a light reflectivity; a protective film covering the metal film and... Agent: Drinker Biddle & Reath (dc)

20080308737 - Optical stabilization of a detector: The invention relates to a detector comprising a scintillator, preferably a scintillator crystal, a light detector with at least one photocathode and a photoelectrometer, preferably a photomultiplier or a hybrid photomultiplier, and a light source, preferably an LED, a laser or a laser diode. The inventive detector is characterized in... Agent: Ip Strategies

20080308739 - Radiation detecting apparatus and radiographing system: A radiation detecting apparatus includes: a sensor panel having a substrate and a photoelectric conversion element array arranged on the substrate; a scintillator layer arranged on one surface side of the sensor panel; and a light generator arranged on the sensor panel at the other side in opposition to the... Agent: Fitzpatrick Cella Harper & Scinto

20080308738 - Structure of a solid state photomultiplier: A solid-state photomultiplier (SSPM) includes an optical isolation structure therein. The SSPM includes a substrate and an epitaxial diode layer positioned on the substrate. A plurality of avalanche photodiodes (APDs) are fabricated on the epitaxial diode layer and the optical isolation structure is positioned about the plurality of APDs to... Agent: General Electric Company Global Research

20080308740 - Method of measuring the colour of printed samples containing brighteners: To measure the colour of samples printed on a substrate containing brightener, a first spectral proportion of the total spectral reflection factor of the sample is measured by illuminating the sample with light having no UV element. From this first spectral proportion, a spectral correction factor is calculated making allowance... Agent: Mccarter & English , LLP Stamford Office

20080308741 - Focused ion beam apparatus: A focused ion beam apparatus includes a plasma generator having a plasma torch therein, which lets plasma flow out while being kept inside, a differential exhaust chamber that is connected to the plasma torch via the torch orifice to cause adiabatic expansion of the plasma flowing out of the plasma... Agent: Brinks Hofer Gilson & Lione

20080308742 - In-chamber electron detector: A secondary particle detector 302 for a charged particle beam system 300 includes a scintillator 304 and a transducer 312, such as a photomultiplier tube, positioned within a vacuum chamber 107. Unlike prior art Everhart-Thornley detectors, the photomultiplier is positioned within the vacuum chamber, which improves detection by eliminating optical... Agent: Michael O. Scheinberg

20080308743 - Charged particle beam application apparatus: An apparatus capable of improving image quality by making it possible to suck specimens of different sizes electrostatically, and uniformalizing an electric field of a specimen edge portion, while suppressing increase in prime cost is provided. Specimen holding means is an electrostatic chuck, a master flat plane part surrounding a... Agent: Mcdermott Will & Emery LLP

20080308745 - Device for optical excitation using a multiple wavelength arangement: The invention relates to a device for optical excitation, in particular luminescent excitation of biomolecules (40) in a fluid sample, comprising a multiple wavelength generator which generates at least one array of spots (60) with different wavelengths at least one defined area of the device.... Agent: Philips Intellectual Property & Standards

20080308744 - Serum albumin conjugated to fluorescent substances for imaging: Compositions and methods are disclosed for imaging tissue or a lymphatic or circulatory system, for example, in the near infrared. Dyes that emit wavelengths in the infrared or near infrared regions of the spectrum may be employed on their own, as combinations or complexed with serum albumin, or as part... Agent: Ropes & Gray LLP

20080308746 - Optical fluorescence tomography: The invention relates to an optical fluorescence tomography system of biological targets. For increasing the resolution an the penetration depth of the impact radiation, in order to result a better depth signal, the biological target is supplied with a fluorescence dye (Material), bleachable by impact radiation, wherein a controllable dynamic... Agent: Philips Intellectual Property & Standards

20080308747 - Radiation detection schemes, apparatus and methods of transmitting radiation detection information to a network: Personal radiation detection devices, methods of obtaining radiation exposure data, and networks of personal radiation devices. The detection devices may include passive devices and active devices. The passive detection devices may have the same form factor as credit cards or be included in common types of credit card form factor... Agent: Schmeiser, Olsen & Watts

20080308748 - Apparatus and method of disinfecting footwear: A footwear sterilization and disinfection apparatus and method using UV-C light to sterilize or disinfect the inside of the footwear is provided. The source of the UV-C light may be a singular or a plurality of sources and may include a solid state source, mercury vapour bulb or one or... Agent: Riches, Mckenzie & Herbert, LLP

20080308749 - Lithographic apparatus and device manufacturing method: A lithographic apparatus is disclosed having a projection system housing supporting internally one or more lens elements, and a movement damper connected to the projection system housing, the movement damper configured to damp movement of the projection system housing at an eigenfrequency of at least one of the one or... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080308750 - Method for treating a tribologically stress-resistant surface of a workpiece: Method for treating the surface of a workpiece with a tribologically stress-resistant surface, wherein the surface is honed in at least one step and pockets are subsequently introduced using laser structuring, wherein laser structuring is effected via ultrashort pulses having a pulse duration of less than 100 ps.... Agent: Dreiss, Fuhlendorf, Steimle & Becker

20080308751 - Multi-function module for an electron beam column: A multifunction module for an electron beam column comprises upper and lower electrodes, and a central ring electrode. The upper and lower electrodes have multipoles and are capable of deflecting, or correcting an aberration of, an electron beam passing through the electrodes. A voltage can be applied to the central... Agent: Janah & Associates, P.C.

20080308753 - Flexible infrared delivery apparatus and method: A flexible infrared delivery apparatus useful for endoscopic infrared coagulating of human or animal blood and tissue or for other uses employs a source of infrared radiation which is not a laser and an elongated flexible fiber optic member which transmits radiation from the source to a contact portion at... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080308752 - Uv trans-illuminator: A UV (Ultra Violet) trans-illuminator includes a UV irradiating unit composed of a plurality of CCFLs (Cold Cathode Fluorescent Lamps) or EEFLs (External Electrode Fluorescent Lamps) arranged at intervals of 1.0 cm to 3.0 cm and having a diameter of 3 mm to 8 mm so as to irradiate UV... Agent: Hoffmann & Baron, LLP

20080308754 - Multi-layered radiation protection wall and radiation protection chamber: U

20080308755 - Mechanical joint having optical interconnection: A mechanical joint having at least first and second joint elements arranged in contact with each other. A first surface of the first joint element abuts a second surface of the second joint element and is at least partially provided with at least one optically emitting module. The respective abutting... Agent: Harrington & Smith, PC

20080302947 - Focus detection device and image pick-up device: A focus detection device includes a micro lens array having a plurality of micro lenses, a light receiving element array having a plurality of light receiving elements for each micro lens and that receives light rays from a plurality of partial areas in which pupils of an imaging optical system... Agent: Oliff & Berridge, PLC

20080302948 - High power bimorph wave-front correction mirror: A laser beam correction system and related methods of use and manufacture are provided. In one example, a laser beam correction system includes a mirror having a first surface and a second surface. An actuator comprising a piezoelectric ceramic disk and a plurality of conductive electrodes on substantially opposing sides... Agent: Macpherson Kwok Chen & Heid, LLP

20080302949 - Photosensors including photodiode control electrodes and methods of operating same: A sensor includes a substrate, a floating diffusion node in the substrate, a photodiode in the substrate laterally spaced apart from the floating diffusion region and a transfer transistor coupling the photodiode and the floating diffusion region. The sensor further includes a photodiode control electrode disposed on the photodiode and... Agent: Myers Bigel Sibley & Sajovec

20080302950 - System and method for performing single photon emission computed tomography (spect) with a focal-length cone-beam collimation: A system and method are provided for obtaining data that may be used to generate images of a brain or other bodily organ. The system can include a pair of detecting arrangements and a collimating arrangement associated with each detecting arrangement. A first collimating arrangement can include a cone-beam collimating... Agent: Dorsey & Whitney LLP Intellectual Property Department

20080302951 - Reflected light detecting apparatus, reflection characteristic determining apparatus, and object detecting apparatus: A photographing section photographs a photographing object, a light-projector projects a light spot parallel to or approximately parallel to an optical axis of the photographing section onto the photographing object, and a detector detects, from an image of the photographing object photographed by the photographing section, a light spot from... Agent: Staas & Halsey LLP

20080302952 - Solid-state imaging device, color filter, camera, and method for manufacturing the color filter: There is provided a solid-state imaging device including a substrate of which surface is provided with a pixel area where a plurality of pixels arranged, each pixel including a photoelectric converting element to receive light from a subject image and perform photoelectric conversion on the received light to generate signal... Agent: Sonnenschein Nath & Rosenthal LLP

20080302953 - Photoelectric encoder: In a photoelectric encoder including a scale (14, 16, 18) for making a relative move and an image forming optical system (22, 24), adapted to detect relative displacement of the scale, a transparent protective material (40, 42) having a thickness t equal to or greater than the depth of focus... Agent: Rankin, Hill & Clark LLP

20080302954 - Apparatus and method for surface modification using charged particle beams: An apparatus and method for using high beam currents in FIB circuit edit operations, without the generation of electrostatic discharge events. An internal partial chamber is disposed over the circuit to be worked on by the FIB. The partial chamber has top and bottom apertures for allowing the ion beam... Agent: Borden Ladner Gervais LLP Anne Kinsman

20080302956 - Offset compensation scheduling algorithm for infrared imagers: A method of scheduling offset compensation for an infrared (IR) imaging system to maintain good image quality. The method includes a scheduling algorithm for automatic offset compensation. The scheduling algorithm automatically adjusts periods between offset compensations based on the measurement of drift of the focal plane array (FPA) pixel levels.... Agent: Intellectual Property Group Fredrikson & Byron, P.A.

20080302955 - Techniques for ion beam current measurement using a scanning beam current transformer: Techniques for ion beam current measurement using a scanning beam current transformer are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for ion beam current measurement using a transformer. The apparatus may comprise a measurement device positioned adjacent a wafer and an ion dose... Agent: Hunton & Williams LLP/varian Semiconductor, Equipment Associates, Inc.

20080302957 - Identifying ions from mass spectral data: A method for identify isotope patterns in mass spectral data, comprising obtaining a desired mass spectral peak shape function; obtaining mass spectral data composed of actual isotope patterns to be analyzed; calculating theoretical isotope pattern from known elemental composition of at least one basic ion whose isotope pattern is representative... Agent: David Aker

20080302958 - Mass spectrometer: An ion trap mass analyser (1) is disclosed comprising a segmented rod set. Ions are trapped radially within the mass analyser by a radial pseudo-potential well. The ions are also confined axially within the ion trap by an axial electric field. The axial electric field is substantially linear across the... Agent: Waters Investments Limited C/o Waters Corporation

20080302959 - Pulsed flow modulation gas chromatography mass spectrometry with supersonic molecular beams method and apparatus: There is provided a pulsed flow modulation gas chromatograph mass spectrometer with supersonic molecular beams apparatus and method for improved sample analysis. The apparatus includes a gas chromatograph with an injector for the analysis of sample compounds, a first analytical column in the gas chromatograph, a sample storage, a gas... Agent: Lackenbach Siegel, LLP

20080302960 - Probe arrangement: A probe arrangement with a probe for local electrophysiological analysis of cells (4) such as patch-clamp techniques for use with atomic force microscopy, has a probe with a cantilever arm (2) connected to a probe holder (3). The probe has a probe tip (4) at a probing end (5) of... Agent: Fleit Gibbons Gutman Bongini & Bianco Pl

20080302962 - Charged particle beam apparatus: The invention provides a charged particle beam apparatus capable of preventing image errors in a display image and capturing a clear display image. A display image displayed on a display unit has a rectangular shape having sides that are substantially parallel to coordinate axes of a rectangular coordinate system determined... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080302964 - Method and apparatus for inspecting integrated circuit pattern: A circuit pattern inspection method and an apparatus therefor, in which the whole of a portion to be inspected of a sample to be inspected is made to be in a predetermined changed state, the portion to be inspected is irradiated with an image-forming high-density electron beam while scanning the... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080302961 - Sample relocation method in charged particle beam apparatus and charged particle beam apparatus as well as sample for transmission electron microscope: In a chamber of a charged particle beam apparatus, the sample on the sample substrate is gripped and carried to the sample holder, and there is controlled the attitude of the sample when the sample is fixed on the sample holder. There possesses a marking process applying, in the chamber,... Agent: Brinks Hofer Gilson & Lione

20080302963 - Sheet beam-type testing apparatus: An electron beam apparatus such as a sheet beam based testing apparatus has an electron-optical system for irradiating an object under testing with a primary electron beam from an electron beam source, and projecting an image of a secondary electron beam emitted by the irradiation of the primary electron beam,... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080302965 - Electron interferometer or electron microscope: In an electron beam interference system using an electron biprism, which is capable of independently controlling each of the interference fringe spacing s and the interference width W, both of which are important parameters for an interferometer and for an interferogram acquired by the interferometer, an optical system used in... Agent: Nixon & Vanderhye, PC

20080302966 - Clip-on infrared imager: A clip-on infrared imager may be coupled and decoupled to an existing night vision system to add infrared imaging to provide a fused image through at least one of the night vision system eyepieces.... Agent: Insight Technology Incorporated Attn: Peter W. Murphy

20080302967 - Tracking of moving radioactive sources: A system for detecting unsecured nuclear materials. Whereas current portal monitors rely in part on physical prominence to deter materials from entering the country, their application at intra-modal transport points may actually serve to divert the movement of nuclear materials rather than aid in interception. A flexible and low-profile system... Agent: Foley & Lardner LLP

20080302968 - Charged particle detector and detecting apparatus utilizing the same: In a charged particle detector, the vacuum barrier can be reduced in size and a multichannel configuration is possible. A charged particle detector includes a metallic frame having one or more holes formed therein, a light transmitting member fixed in each of the holes of the metallic frame, an inorganic... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080302969 - Thin-film transistor array substrate for x-ray detector and x-ray detector having the same: In a thin-film transistor (“TFT”) array substrate for an X-ray detector and an X-ray detector having the TFT array substrate, the TFT array substrate includes a gate wiring, a gate insulating layer, an active layer, a data wiring, a photodiode, an organic insulating layer and a bias wiring. The gate... Agent: Cantor Colburn, LLP

20080302970 - Radiation ray detector: A radiation ray detector includes an electrode substrate includes a transparent substrate, a plurality of thin film transistors and a plurality of collecting capacitors formed on the transparent substrate, respectively, an insulation layer formed on the transparent substrate including these thin film transistors and collecting capacitors, and a plurality of... Agent: Amin, Turocy & Calvin, LLP

20080302971 - Variable multi-stage waveform detector: A variable waveform detector may include multiple stages.... Agent: Searete LLC Clarence T. Tegreene

20080302972 - Broad energy-range ribbon ion beam collimation using a variable-gradient dipole: A method and apparatus satisfying growing demands for improving the intensity of implanting ions that impact a semiconductor wafer as it passes under an ion beam. The method and apparatus are directed to the design and combination together of novel magnetic ion-optical transport elements for implantation purposes for combating the... Agent: Nields & Lemack

20080302973 - Apparatus for monitoring an item for radioactive material on or associated with the item: Method and apparatus is provided for monitoring an item for radioactive material on or associated with the item, the apparatus including an enclosed volume, an item monitoring location, a detection location, ion detectors provided within the detection location, a mover of gas for providing a flow of gas past the... Agent: Workman Nydegger

20080302974 - Optical auto focusing system and method for electron beam inspection tool: A method and system for inspecting a semiconductor wafer. The method includes providing an illumination flux through a pattern plate and a lens to a surface of a specimen to project a pattern onto the surface of the specimen. The pattern is associated with the pattern plate. Additionally, the method... Agent: Townsend And Townsend And Crew, LLP

20080302975 - Surface plasmon enhanced fluorescence sensor: Exciting light is irradiated through a dielectric material block toward an interface between the dielectric material block and a metal film formed on one surface of the dielectric material block, such that total reflection conditions may be satisfied. An intensity of analysis fluorescence produced by an analysis fluorescent substance, which... Agent: Sughrue Mion, PLLC

20080302976 - Sensor with improved signal-to noise ratio and improved accuracy: The present invention provides a sensor and a method for detecting an optically variable molecule (9) in a sample (3). The sensor comprises an excitation radiation source (1) for irradiating the sample (4) and exciting the optically variable molecule (9), thus generating a luminescence signal (7). The sensor furthermore comprises... Agent: Philips Intellectual Property & Standards

20080302977 - Light emitting module for producing a visible light by passive ultraviolet excitation: A light emitting module for producing a visible light by passive ultraviolet excitation includes an excitation light source member and at least one layer of wavelength modulation matrix. The excitation light source member produces an ultraviolet light with a specific wavelength range. The wavelength modulation matrix adopts an organic polymer... Agent: Bacon & Thomas, PLLC

20080302978 - Method and device for detecting zones damageable by laser flow: The invention concerns a method for detecting zones damageable by laser flow including a step of measuring thermoluminescence of the surface to be treated to locate said zones at risk, followed by a step of thermal conditioning of zones thus located.... Agent: Brinks Hofer Gilson & Lione

20080302979 - Working method by focused ion beam and focused ion beam working apparatus: A working method by focused ion beam I, which performs a deposition working or an etching working to a work piece 90 by irradiating the focused ion beam to the work piece 90, wherein as a dose quantity is increased by irradiating the focused ion beam I to an edge... Agent: Bruce L. Adams Adams & Wilks

20080302980 - Extreme ultra-violet lithographic apparatus and device manufacturing method: An extreme ultra-violet lithographic apparatus for imaging a pattern onto a substrate includes a radiation system constructed and arranged to provide a beam of an extreme ultra-violet radiation, and an absorber arranged in the beam and constructed and arranged to absorb at least a portion of the radiation beam. The... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080302981 - Light-transmitting electromagnetic wave-shielding material: The present invention provides a light-transmitting electromagnetic wave-shielding material for use in displays or in-vehicle panels each having a polarizing plate or a retardation plate, wherein the light-transmitting electromagnetic wave-shielding material undergoes no generation of light interference fringes and is satisfactory in visibility even through sunglasses, goggles, glare-proof panels or... Agent: Foley And Lardner LLP Suite 500

20080302982 - Polarizer elements and systems using the same: In general, in a first aspect, the invention features an article that includes a plurality of spaced apart ridges extending along a first direction, adjacent ridges being spaced with a period of Λ or less, each ridge comprising a plurality of layers where adjacent layers have different refractive indexes at... Agent: Fish & Richardson P.C.

20080296472 - Dosage accuracy monitoring systems of implanters: An apparatus for monitoring beam currents of an implanter is provided. The apparatus includes a beam-sensing unit for sensing the beam currents; a position-determining unit for determining scan positions; and a computing unit. The computing unit is configured to perform the functions of receiving the beam currents from the beam-sensing... Agent: Slater & Matsil, L.L.P.

20080296473 - Voltage generator, analog-to-digital converter, and image sensor system: A ladder resistor circuit generates a plurality of different reference voltages. A plurality of switching circuits correspond to a plurality of taps of the ladder resistor circuit. Each of the plurality of switching circuits is connected at one end to a corresponding one of the taps and connected at the... Agent: Mcdermott Will & Emery LLP

20080296474 - Photoelectric sensor: A photoelectric sensor according to the present invention, performs a determination as to whether or not an object is present in a predetermined detection area and provides (1) a enable signal to enable operation related to a hazardous source and (2) a disable signal to disable the operation based on... Agent: Kilyk & Bowersox, P.l.l.c.

20080296475 - Vertical image sensors and methods of fabricating the same: A vertical CMOS image sensor includes a plurality of photodiodes formed vertically in a substrate to a first depth. The vertical CMOS image sensor further includes a plurality of signal processing devices formed to correspond to the plurality of photodiodes. The plurality of signal processing devices are formed to transmit... Agent: Harness, Dickey & Pierce, P.L.C

20080296476 - Pixel sensor cell for collecting elections and holes: The present invention is a pixel sensor cell and method of making the same. The pixel sensor cell approximately doubles the available signal for a given quanta of light. The device of the present invention utilizes the holes produced by impinging photons in a pixel sensor cell circuit. A pixel... Agent: Ibm Microelectronics Intellectual Property Law

20080296478 - Methods for reducing cross talk in optical sensors: Optical sensors containing reduced amounts of cross talk, as well as methods for making and using such sensors are described. The sensors contain a light absorption coating that is placed on a portion of the external surface of the optical sensor near the detector. This absorption coating reduces the amount... Agent: Kenneth E. Horton Kirton & Mcconkle

20080296477 - Optical system for inducing focus diversity: An optical system includes an optical element defining an optical axis and a focal plane and a defocus element disposed between the optical element and the focal plane. The defocus element includes at least one first lens for producing a positive defocus image of a light beam passing through the... Agent: Nasa Goddard Space Flight Center

20080296479 - Polymer x-ray window with diamond support structure: A high strength window for a radiation detection system has a plurality of ribs comprising diamond material. The plurality of ribs defines a grid having openings therein. The tops of the ribs terminate generally in a common plane and the height of the ribs is sufficiently thin to allow some... Agent: Thorpe North & Western, LLP.

20080296480 - Method and apparatus for multiple scan rate swept wavelength laser-based optical sensor interrogation system with optical path length measurement capability: The invention relates to optical sensor measurement methods that use a swept wavelength optical source to determine wavelength shift as well as to optical sensor systems that embody and employ these methods. A variable scan rate swept optical source is used to determine the optical path length from the optical... Agent: Greenlee Winner And Sullivan P C

20080296481 - Chirp measurement method, chirp measurement apparatus and their application: A chirp measurement apparatus includes a splitting section for splitting input signal light to two paths; a first dispersion medium with a total dispersion amount of +D (≠0) at a used wavelength, and a second dispersion medium with a total dispersion amount of −D (≠0) at the used wavelength; first... Agent: Dickstein Shapiro LLP

20080296482 - Method and system of optical imaging for target detection in a scattering medium: A method and system for fluorescence imaging of a target in a subject comprising a scattering medium is provided. The method comprises illuminating one or more points on a surface of the scattering medium using an illumination source, wherein the plurality of points define an illumination region, collecting emitted light... Agent: General Electric Company Global Research

20080296483 - Magneto-optical trap ion source: A system and method are disclosed for producing a source of ions, and particularly, a focused ion beam. The system and method use a magneto-optical trap (MOT) to produce a population of neutral atoms. A laser is then utilized to ionize atoms and produce a population of ions. An extraction... Agent: Rankin, Hill & Clark LLP

20080296484 - Ion implantation system and method of monitoring implant energy of an ion implantation device: An ion implantation system and method of monitoring implant energy of an ion implantation device. The ion implantation system includes an ion implantation device and a monitoring device. The ion implantation device generates a plurality of charged particles and accelerates them with an accelerating voltage for ion implantation. The monitoring... Agent: Muncy, Geissler, Olds & Lowe, PLLC

20080296485 - Method and device for mass spectrometry examination of analytes: The invention relates to a method for the mass spectrometry examination of at least one analyte, wherein an analyte to be examined is photoionized and the mass of the ions produced is determined in a mass spectrometer. The analyte to be examined is ionized at normal atmospheric ambient pressure by... Agent: Law Offices Of Paul E. Kudirka

20080296486 - Method for the determination of the position of unsaturation in a compound: A mass spectrometric method for determining the position of unsaturation in a compound is disclosed.... Agent: Sughrue Mion, PLLC

20080296488 - Imaging mass spectrometry for small molecules in two-dimensional samples: The invention relates to spatially resolved mass spectrometric measurement and visualization of the distribution of small molecules in a mass range from approximately 150 to 500 Daltons, for example drugs and their metabolites, in thin sections or other two-dimensional samples, preferably with ionization of the molecules by matrix-assisted laser desorption.... Agent: Patrick J. O'shea O'shea, Getz & Kosakowski, P.C.

20080296487 - Method and system for chemical and physical characterization of complex samples: A method and system for rapid determination of a hydrocarbon type composition, such as crude oils and fractions thereof, and s obtaining the information necessary to assess the yield of commercially valuable fuel and lube oil fractions in a single process, variations of the method and system use Gas Chromatography-FID/Mass... Agent: Arent Fox LLP

20080296489 - Atom probe evaporation processes: The present invention relates to atom probe evaporation processes. For example, certain aspects are directed toward methods for controlling an evaporation process in an atom probe that includes initiating the atom probe evaporation process and monitoring a parameter associated with material being evaporated from a specimen. The method can further... Agent: Perkins Coie LLP Patent-sea

20080296491 - Method and apparatus to detect chemical vapors: Means and method of rapid detection of a compound of interest from an air sample is shown. An air sample is collected, and concentration of the compound of interest can be increased. A portable spectrometer, which preferably is a time-of-flight spectrometer, detects the presence of any of the compound. The... Agent: Patricia A. Sweeney

20080296490 - Time of flight mass spectrometry method and apparatus: A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given... Agent: Agilent Technologies Inc.

20080296493 - Enriichment tube for sampling ions: An improved ion sampling tube designed to increase the amount of current delivered into the vacuum system of a mass spectrometer or other gas-phase ion or particle detectors or collectors. A device and method is disclosed that utilizes a tube with a high flow of ion entrained gas passing through... Agent: Edward W. Sheehan

20080296492 - Methods and apparatus for performing chromatography and mass spectroscopy with supercritical fluid samples: Embodiments of the present invention are directed to devices and methods for receiving NSC Fluids having at least one analyte from a chromatograph and directing analyte ions into the vacuum regions of a mass spectrometer. The device has a housing having at least one wall defining a chamber, sample inlet,... Agent: Waters Investments Limited C/o Waters Corporation

20080296494 - Ion trap with longitudinal permanent magnet and mass spectrometer using same: The invention concerns a vacuum magnetic ion trap comprising an assembly forming a permanent magnet including at least two magnetized structures (30, 32) in the form of hollow cylinders, one convergent radial structure, magnetized along a convergent radial direction, and one divergent radial structure, magnetized along a divergent radial direction,... Agent: Young & Thompson

20080296495 - Rf surfaces and rf ion guides: Apparatus and methods are provided for trapping, manipulation and transferring ions along RF and DC potential surfaces and through RF ion guides Potential wells are formed near RF-field generating surfaces due to the overlap of the radio-frequency (RF) fields and electrostatic fields created by static potentials applied to surrounding electrodes.... Agent: Levisohn, Berger , LLP

20080296496 - Method and apparatus of wafer surface potential regulation: An electron beam apparatus and method are presented for regulating wafer surface potential during e-beam (scanning electron microscopy SEM) inspection and review. Regulating surface potential is often critical to detect voltage contrast (VC) defects of specific type, and sometimes, its also an important factor to achieve high quality SEM images.... Agent: Sawyer Law Group LLP

20080296497 - Method and apparatus for specimen fabrication: A system for analyzing a semiconductor device, including: a first ion beam apparatus including: a sample stage to mount a sample substrate; a vacuum chamber in which the sample stage is placed; an ion beam irradiating optical system to irradiate the sample substrate; a specimen holder that accommodates a plurality... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080296499 - Charged particle instrument equipped with optical microscope: An optical microscope slide in a charged particle instrument such as an electron microscope or a focused ion beam instrument. Conventional microscope slides are not fit for use in an electron microscope as they are insulating and would thus charge when viewed in an electron microscope due to the impinging... Agent: Michael O. Scheinberg

20080296498 - In-situ stem sample preparation: A method for STEM sample preparation and analysis that can be used in a FIB-STEM system without a flip stage. The method allows a dual beam FIB/STEM system with a typical tilt stage having a maximum tilt of approximately 60 to be used to extract a STEM sample to from... Agent: Michael O. Scheinberg

20080296500 - Direct-view, compact short wave infra red (swir) viewer: A night vision device includes an objective lens assembly, an image detector assembly, an eyepiece lens assembly and a housing. The objective lens assembly receives low intensity light. The image detector assembly converts the low intensity light into a visible output image. The eyepiece lens assembly provides for viewing the... Agent: Department Of The Army Cecom Legal Office, Fort Belvoir

20080296501 - System and method for detecting contraband: A technique is provided for detecting whether an object of interest is being carried by a subject. The technique includes coarsely scanning the subject with an electromagnetic radiation, measuring reflective intensity of radiation reflected from the subject, and detecting the presence or absence of the object of interest based upon... Agent: General Electric Company Global Research

20080296502 - Flame detector: A first band pass filter selects and transmits light having an infrared wavelength specific to flame. A first infrared-ray receiving element receives the light from the first band pass filter. A second band pass filter selects and transmits light having an infrared wavelength which is not the infrared wavelength specific... Agent: James E. Ledbetter

20080296503 - High energy resolution scintillators having high light output: A scintillator composition includes a matrix material, where the matrix material includes an alkaline earth metal and a lanthanide halide. The scintillator composition further includes an activator ion, where the activator ion is a trivalent ion. In one embodiment, the scintillator composition includes a matrix material represented by A2LnX7, where... Agent: General Electric Company (pcpi) C/o Fletcher Yoder

20080296504 - Method and apparatus for radiation imaging: This invention relates to a method and an apparatus, primarily a radiation imaging apparatus and an array of coded aperture masks, for use in diagnostic nuclear medicine. The coded aperture masks are fitted with radiation attenuation tubes, each of which extends from each side of the mask in the direction... Agent: Nixon Peabody, LLP

20080296505 - Method of constructing time-in-flight pet images: A method of reconstructing time-of-flight (TOF) images includes obtaining a profile of a subject to be imaged in an examination region (14) of an imaging system (10), Events associated with radiation emitted from the subject are detected and converted to electronic data. Electronic data attributable to radiation events located outside... Agent: Philips Intellectual Property & Standards

20080296506 - Detector having a thin film of boron nitride (bn) such as cubic bn and method, systems and array utilizing same: A detector having a thin film of boron nitride (BN) such as cubic BN, and method, system and array utilizing same are provided. Solid-state p-i-n, deep depletion p-n and Schottky diode detector devices based on a thin film of semiconducting cubic BN are provided. Miniaturized solid-state detectors based on cubic... Agent: Brooks Kushman P.C.

20080296507 - Systems, methods and apparatus for row-correlated noise monitoring in digital x-ray systems: Systems, methods and apparatus are provided through which in some embodiments, row-correlated noise of a digital X-ray detector is monitored during idle operation of the digital X-ray detector and the magnitude of the row-correlated noise is compared to a visible threshold.... Agent: Ramirez & Smith

20080296508 - Optical magnetron for high efficiency production of optical radiation and related methods of use: An electromagnetic radiation source is disclosed that produces a single mode operation at a desired operating frequency. The electromagnetic radiation source is included in a wide variety of applications including a wireless power transmission system, a system for providing wireless/high-bandwidth communications in accordance with the present invention, a lighting system,... Agent: Renner, Otto, Boisselle & Sklar, LLP 19th Floor

20080296509 - Phase-shifting element and particle beam device having a phase-shifting element: A phase-shifting element for shifting a phase of at least a portion of a particle beam is described, as well as a particle beam device having a phase-shifting element of this type. In the phase-shifting element and the particle beam device having a phase-shifting element, components shadowing the particle beam... Agent: Muirhead And Saturnelli, LLC

20080296510 - Ion implantation system and ion implantation system: It is devised to transport plasma including charged particles made of containment target atom ions and charged particles of a polarity opposite to that of the containment target atom ions, up to an empty fullerene film on a deposition-assistance substrate by a uniform magnetic field, and to give acceleration energies... Agent: Young & Thompson

20080296511 - Apparatus for fluorescence observation: An apparatus for fluorescence observation includes an excitation filter which transmits only exciting light of an specific wavelength among illumination light, and an absorption filter which blocks the exciting light and transmits only fluorescence generated from a specimen when the exciting light is irradiated to the specimen. Here, an interval... Agent: Kenyon & Kenyon LLP

20080296513 - Integrating ultraviolet exposure detection devices: Devices or formulations incorporating photochromic agents and methods of using them are provided. The compositions are useful in connection with personal care, light and/or ultraviolet radiation detection, imaging and printing applications.... Agent: Bozicevic, Field & Francis LLP

20080296512 - Portable electronic device having appearance customizable housing: A portable electronic device (10) has a customizable housing (20) where a “skin” (22, 72) is provided, wherein the texture and/or color can be changed by a consumer. The portable electronic device (10) is positioned within an apparatus (41, 51, 61) providing a power source for supplying radiant energy such... Agent: Ingrassia Fisher & Lorenz, P.C. (mot)

20080296514 - System and method for noninvasively monitoring conditions of a subject: A method and system are presented for use in determining one or more parameters of a subject. A region of interest of the subject is irradiated with acoustic tagging radiation, which comprises at least one acoustic tagging beam. At least a portion of the region of interest is irradiated with... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080296516 - Method and apparatus for specimen fabrication: A specimen fabrication apparatus, including: an ion beam irradiating optical system to irradiate a sample placed in a chamber with an ion beam; a specimen holder to mount a specimen separated by the irradiation with the ion beam; a holder cassette to hold the specimen holder; a sample stage to... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080296515 - Charged particle beam writing apparatus and method: A charged particle beam writing apparatus includes a stage on which a target object is placed and which moves in a predetermined direction, a first column configured to irradiate a first charged particle beam on a writing region of the target object, a second column which is located at the... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080296517 - Coupling light of light emitting resonator to waveguide: A waveguide conduit is constructed and adapted to capture the light emitted by the at least one nano-resonant structure. The nano-resonant structure emits light in response to excitation by a beam of charged particles, The source of charged particles may be an ion gun, a thermionic filament, a tungsten filament,... Agent: Davidson Berquist Jackson & Gowdey LLP

20080296518 - X-ray window with grid structure: A high strength window for a radiation detection system includes a plurality of intersecting ribs defining a grid having openings therein with tops of the ribs terminate substantially in a common plane. The intersecting ribs are oriented non-perpendicularly with respect to each other and define non-rectangular openings. The window also... Agent: Thorpe North & Western, LLP.

20080296519 - Apparatus and method for absorption of incident gamma radiation and its conversion to outgoing radiation at less penetrating, lower energies and frequencies: Gamma radiation (22) is shielded by producing a region of heavy electrons (4) and receiving incident gamma radiation in such region. The heavy electrons absorb energy from the gamma radiation and re-radiate it as photons (38, 40) at a lower energy and frequency. The heavy electrons may be produced in... Agent: Cook Alex Ltd

20080296520 - Optical coupling device: In one aspect of the present invention, an optical coupling may include a supporting member which has a first surface, a second surface on the opposite side of the first surface, and an opening portion, and which is formed of an insulating material, a first wiring layer provided on the... Agent: Amin, Turocy & Calvin, LLP

20080296521 - Method and system for reducing or eliminating uncontrolled motion in a motion control system: A method and system for reducing or eliminating uncontrolled motion in a motion control system is disclosed herein. The method includes defining at least one closed motion control loop. The motion control loop comprises a plurality of feedback control loops. The method further includes detecting a faulty feedback control loop... Agent: Peter Vogel Ge Healthcare