Radiant energy inventions 03/08

20080073484 - Optical system: In preferred forms of the invention an array of MEMS mirrors or small mirrors inside an optical system operates closed-loop. These mirrors direct external source light, or internally generated light, onto an object—and detect light reflected from it onto a detector that senses the source. Local sensors measure mirror angles... Agent: Peter I. Lippman

20080073485 - Visual inspection of optical elements: An optical imaging device for visually inspecting an optical element is described. The optical imaging device comprises an optical connector interface adapted for connecting the optical imaging device to the optical element, an imaging unit adapted for acquiring image data of the optical element's surface, and a display for visualizing... Agent: Agilent Technologies Inc.

20080073486 - Single axis illumination for multi-axis imaging system: A single-axis illumination system for a multiple-axis imaging system, particularly an array microscope. A single-axis illumination system is used to trans-illuminate an object viewed with an array of imaging elements having multiple respective axes. The numerical apertures of the imaging elements are preferably matched to the numerical aperture of the... Agent: William A. Birdwell Davis Wright Tremaine, LLP

20080073488 - Image sensor device having one or more modified dummy pixels that are usable as non-volatile memory elements: One or more dummy pixels of an image sensor device IC are modified to include programming circuitry that enables them to be used as non-volatile memory. Dummy pixels are non-imaging pixels that already exist in image sensor ICs and are addressable using the same circuitry that is used to address... Agent: Ratnerprestia

20080073487 - Multi-sensor image capture device: Described is a multi-sensor image capture device. The device comprises a first imaging sensor, a second imaging sensor and a light transfer arrangement receiving illumination reflected from an object and aiming the illumination at at least one of the first and second imaging sensors. The first imaging sensor generates first... Agent: Fay Kaplun & Marcin, LLP

20080073489 - Semiconductor apparatus and light detection method: A semiconductor apparatus includes an optical waveguide provided within a semiconductor region and above an insulating layer, and a plurality of photodetectors provided at the optical waveguide. The plurality of photodetectors includes insulated-gate field-effect transistors. The photodetectors capture data at different timings.... Agent: Sonnenschein Nath & Rosenthal LLP

20080073490 - Photodetector, electro-optical device, and electronic apparatus: A photodetector receiving object light and ambient light as incident light includes: a sensor circuit in which a sensor outputting a first current corresponding to the intensity of the incident light and a sub-sensor outputting a second current corresponding to the intensity of the ambient light are electrically connected in... Agent: Oliff & Berridge, PLC

20080073492 - Correction of the distortion of an image intensifier electron tube: The invention relates to the correction of the distortion of an image intensifier electron tube comprising an entry screen intended to receive what is called primary electromagnetic radiation and an exit screen emitting radiation dependent on the primary radiation, the entry screen including a photocathode that emits an electron beam... Agent: Lowe Hauptman & Berner, LLP

20080073491 - Anti-tamper enclosure system: An anti-tamper enclosure system comprises an optical medium; at least one photosensitive sensor configured to measure at least one characteristic of a light wave transmitted in the optical medium; at least one logic circuit coupled to the at least one photosensitive sensor, the at least one logic circuit configured to... Agent: Honeywell International Inc.

20080073493 - Origin detection method for optical encoder: An optical encoder equipped with an origin detection apparatus has a scale provided with an optical grating, a plurality of light receiving elements that is provided in association with the pitch of the optical grating and movable relative to the scale and a light source that illuminates the light receiving... Agent: Fitzpatrick Cella Harper & Scinto

20080073494 - Neutral atom trapping device: A neutral atom trapping device with a multipole-magnetic field-generating electrode is provided with a main current electrode through which main current flows, and a pair of sub-current electrodes through which sub-current flows, and which is located in parallel to and both sides of said main current electrode; a neutral atom... Agent: Osha Liang L.L.P.

20080073495 - Portable remote camera and radiation monitor: A hand-held portable video camera and radiation monitoring apparatus which can be deployed by a single operator in the field is disclosed. The apparatus uses a compact, extendable probe which provides real time visual monitoring via a video camera along with real time radiation detection and identification of isotopes. The... Agent: J. Bennett Mullinax, LLC

20080073497 - High throughput quadrupolar ion trap: A method and apparatus are provided for operating a linear ion trap. A linear ion trap configuration is provided that allows for increased versatility in functions compared to a conventional three-sectioned linear ion trap. In operation, the linear ion trap provides multiple segments, the segments spatially portioning an initial population... Agent: Thermo Finnigan LLC

20080073498 - High throughput quadrupolar ion trap: A method and apparatus are provided for operating a linear ion trap. A linear ion trap configuration is provided that allows for increased versatility in functions compared to a conventional three-sectioned linear ion trap. In operation, the linear ion trap provides multiple segments, the segments spatially partitioning an initial ion... Agent: Thermo Finnigan LLC

20080073501 - Method of analyzing mass analysis data and apparatus for the method: The present invention provides a method and an apparatus for analyzing mass analysis data for selecting a component similar to a target component quickly and accurately, based on MSn analysis for each unknown component in the sample. First, MSn analysis is performed for each of the components in the mixed... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080073496 - Multichannel rapid sampling of chromatographic peaks by tandem mass spectrometer: Systems and methods for optimizing the analysis of co-eluting compounds during a cycle of a tandem mass spectrometer system are provided. The tandem mass spectrometer system switches fast from analyzing one compound ion to analyzing another compound ion and from one collision cell energy to another. The fast switching allows... Agent: Agilent Technologies Inc.

20080073499 - Peak finding in low-resolution mass spectrometry by use of chromatographic integration routines: Methods for processing low resolution mass spectrometry data, including providing the low resolution mass spectrometry data as abundance versus flight time data, converting the flight time axis of the low resolution mass spectrometry data to a calibrated mass axis, and converting that to retention time-based chromatographic data. The time-based data... Agent: Agilent Technologies Inc.

20080073500 - Distinguishing isomers using mass spectrometry: This invention relates to methods of distinguishing dimethylarginine isomers. Also featured are methods and compositions for diagnosing cardiovascular disorders.... Agent: Fish & Richardson PC

20080073502 - Multiple sample sources for use with mass spectrometers, and apparatus, devices, and methods therefor: A method for introducing samples through a boundary member partially defining a chamber at an entrance point coaxial to a sampling inlet of a mass spectrometer is described. Field-free conditions can be established in at least one region of the chamber. The sample can be introduced adjacent to the sampling... Agent: Torys LLP

20080073503 - Multidimensional ion mobility spectrometry apparatus and methods: Various embodiments of a multi-dimensional ion mobility analyzer are disclosed that have more than one drift chamber and can acquire multi-dimensional ion mobility profiles of substances. The drift chambers of this device can, for example, be operated under independent operational conditions to separate charged particles based on their distinguishable chemical/physical... Agent: Ching Wu

20080073504 - Data acquisition system: In a data acquisition system of ADC system, a log amplifier is provided at the pre-stage of an A/D converter, a signal amplified by the log amplifier having a nonlinear input-output characteristic is A/D-converted, and an adding operation of data is performed while reconverting a voltage value data which is... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080073509 - High-sensitivity mass spectrometer and method: A sample is sliced obliquely with a blade provided with a metal thin film on the surface, and the slice of the sample adhering to the blade surface is subjected to mass spectrometry. As a result, the section of the sliced sample can be analyzed immediately by mass spectrometry with... Agent: Fitzpatrick Cella Harper & Scinto

20080073507 - Matrix-free maldi mass spectrometry: The invention relates to particles and monoliths for providing an ionized analyte for mass analysis by photon desorption having a size in the range of 0.5-100 μm, wherein said particles or monoliths are modified with a chemical compound capable of absorbing photons having a wave-length of at least 300 nm.... Agent: Workman Nydegger

20080073506 - Microfluidic devices and methods facilitating high-throughput, on-chip detection and separation techniques: The present invention provides a microfluidic device and method for facilitating on-chip complex sample processing and detection. In general, the device comprises at least a separation channel of a separation system, an interface, and an array of microreservoirs disposed within the same chip. The interface is configured to orthogonally transfer... Agent: Latimer, Mayberry & MatthewsIPLaw, LLP

20080073505 - Nanostructured thin films and their uses: The present invention generally discloses the use of a nanostructured non-silicon thin film (such as an alumina or aluminum thin film) on a supporting substrate which is subsequently coated with an active layer of a material such as silicon or tungsten. The base, underlying non-silicon material generates enhanced surface area... Agent: Nanosys Inc.

20080073512 - Methods, compositions and devices for performing ionization desorption on silicon derivatives: As used above, X is H or Y, where at least at least twenty five mole percent of X is Y and Y is hydroxyl, or —O—R1, or O—SiR1, R2, R3 wherein R1, R2, and R3 are selected from the group consisting of alkyl, alkenyl, alkynyl, aromatic, amino alkyl, amino... Agent: Waters Investments Limited C/o Waters Corporation

20080073510 - Personalised mass spectrometer: A personalised mass spectrometer system is described. By fabricating analyser components on a module and including with that module an identifier for that module, it is possible to uniquely associate a user or task with one or more modules. The module is removably receivable within a housing and can be... Agent: Mcdermott, Will & Emery LLP

20080073508 - Reaction cell and mass spectrometer: An ion trap in which highly accurate isolation, ECD, and CID can be efficiently performed. A reaction cell and a mass spectrometer of the present invention include an ion-trap which has a plurality of rod electrodes and creates a multipole field, a means for generating a magnetic field in the... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080073511 - Structured copolymer supports for use in mass spectrometry: The invention relates to novel structured copolymer supports for use in spectrometry, especially sample supports for use in mass spectrometry, having improved surface properties and to an especially advantageous novel process for the production of these structured copolymer supports.... Agent: Caesar, Rivise, Bernstein, Cohen & Pokotilow, Ltd.

20080073513 - Mass spectrometer: An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080073514 - Drift tube for an ion mobility spectrometer with integrated gas channel: A drift tube for an ion mobility spectrometer is assembled from stacked tube segments and has electrodes that generate an electric drift field and are electrically contactable from the outside of the drift tube. Most of the tube segments have at least two separate apertures so that, when the segments... Agent: Law Offices Of Paul E. Kudirka

20080073515 - Switchable branched ion guide: A switchable branched ion guide is disclosed. The switchable branched ion guide includes a trunk section, first and second branch sections, a junction connecting the trunk section to the branch sections, and a movable valve member located at the junction. The valve member may be moved between a first position... Agent: Thermo Finnigan LLC

20080073516 - Resistive glass structures used to shape electric fields in analytical instruments: A reflectron lens for a time-of-flight mass spectrometer is disclosed. The reflectron lens includes a glass tube having a conductive surface along the length of the tube. The conductive surface has an electrical resistance gradient along its length. The electrical resistance gradient provides an electric field interior to the tube... Agent: Dann, Dorfman, Herrell & Skillman

20080073518 - Optical fiber probe, optical detection device, and optical detection method: An optical detection device image is disclosed that allows fast measurements using near-field light at high resolution and high efficiency but without necessity of position alignment of an optical fiber probe. The optical detection device includes an optical fiber probe having a core for propagating light with an optical probe... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080073519 - Scanning probe microscope for measuring angle and method of measuring a sample using the same: Provided are a scanning probe microscope (SPM) that prevents a distortion of an image caused by alignment errors of scanners and a method of measuring a sample using the same. The scanning probe microscope comprises a probe; a first scanner changing a position of the probe along a straight line;... Agent: Patterson & Sheridan, L.L.P.

20080073521 - Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus: An object of the present invention is to provide a standard specimen for a charged particle beam enabling highly precise measurement of sub-micron to several 10 μm in size on an image and an apparatus using the standard specimen. In order to attain the above described object, the present invention... Agent: Mcdermott Will & Emery LLP

20080073517 - Temperature adjustment in scanning beam devices: Scanning beam devices are disclosed. In one aspect, an apparatus may include a housing having a transparent portion. A scanning optical element may be enclosed within the housing. Light may be directed between the scanning optical element and the transparent portion of the housing. The device may include a temperature... Agent: Blakely Sokoloff Taylor & Zafman

20080073520 - Tip structure for scanning devices, method of its preparation and devices thereon: A tip device for a radiation scanning device is disclosed. The tip device includes a tip substrate including a material transparent to the radiation, where a portion of the substrate has a coating including a material non-transparent to the radiation. A tip is formed on the substrate, where the tip... Agent: Knobbe Martens Olson & Bear LLP

20080073522 - Method of correcting opaque defect of chrome mask, in which atomic force microscope fine working apparatus has been used: By mechanically removing a boundary portion between an opaque defect and a normal pattern in an atomic force microscope fine working apparatus having a probe harder than a worked material, or removing it in a focused ion beam fine working apparatus or an electron beam fine working apparatus, the opaque... Agent: Brinks Hofer Gilson & Lione

20080073523 - Semiconductor wafer defect inspection method and apparatus: A semiconductor wafer whose position information on defects on a surface of the semiconductor wafer is already known, is placed on a stage of an imaging apparatus. Positions in a height direction of a plurality points on the surface of the semiconductor wafer are measured. In accordance with the measured... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080073527 - Specimen observation method: It is an object of the present invention to provide a specimen observation method, an image processing device, and a charged-particle beam device which are preferable for selecting, based on an image acquired by an optical microscope, an image area that should be acquired in a charged-particle beam device the... Agent: Mcdermott Will & Emery LLP

20080073526 - Charged particle beam apparatus: A charged particle beam apparatus for obtaining information of an uneven surface or a depression/protrusion of a sample by irradiating a charged particle beam to a sample having an uneven surface or a depression/protrusion at a plurality of focal positions, measuring signal emitted from the sample, and comparing profile waveforms... Agent: Mcdermott Will & Emery LLP

20080073528 - Charged particle beam scanning method and charged particle beam apparatus: In a method of scanning a charged particle beam which can position the scan position to a proper location inside a deflectable range of the scan position of charged particle beam, the scan position of charged particle beam is deflected to a plurality of target objects inside a scan position... Agent: Mcdermott Will & Emery LLP

20080073529 - Confocal secondary electron imaging: One embodiment relates to an apparatus using electrons for inspection or metrology of a semiconductor substrate. The apparatus includes an electron source, electron lenses, scan deflectors, an objective electron lens, a collection electron lens, a pin-hole filter, de-scan deflectors, and a detector. The collection electron lens is configured to focus... Agent: Okamoto & Benedicto LLP

20080073524 - Method and apparatus for reviewing defects: A method and an apparatus for reviewing defects detected by an optical particle inspection system or an optical profile inspection system in detail by an electron microscope are provided. In order to putting defects to be reviewed in the viewing field of the electron microscope and reducing the size of... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080073525 - Spatial frequency wavefront sensor system and method: Devices systems, and methods can characterize an optical surface of an object. A wavefront sensor system focuses light energy propagating from the object to form a pattern on a detector. The system maps the pattern to an array with a transform function such as a Fourier transform. The values of... Agent: Townsend And Townsend And Crew, LLP

20080073531 - Charged particle beam system and a method for inspecting a sample: A method and system for inspecting an inspected object. The system includes: a detector adapted to detect charged particles scattered from a sample; a magnetic lens adapted to generate a magnetic field such as to direct a charge particle beam towards a sample and an first electrode positioned very close... Agent: Patent Counsel Applied Materials, Inc.

20080073533 - Inspection system and inspection method: There is a need for inspecting a heightwise variation in a sample. A holder holds a sample. A charge control unit charges the sample held by the holder. A retarding power supply applies a voltage to the sample held by the holder. An electro-optic system radiates an electron beam to... Agent: Stanley P. Fisher Reed Smith LLP

20080073530 - Method and apparatus for detecting positively charged and negatively charged ionized particles: An ion detector includes collision surfaces for converting both positively and negatively charged ions into emitted secondary electrons. Secondary electrons may be detected using an electron detector, than may, for example include an electron multiplier. Conveniently, secondary electrons (or electrons emitted by the multiplier) may be detected using an electron... Agent: Smart And Biggar

20080073532 - Observational liquid/gas environment combined with specimen chamber of electron microscope: An observational liquid/gas environment combined with a specimen chamber and two pole pieces of an electron microscope includes at least two buffer chambers, a plurality of spacers, and a gas source. The buffer chambers are formed by the spacers and the two pole pieces, located at an upper side and... Agent: Bacon & Thomas, PLLC

20080073534 - Scanning electron microscope: A scanning electron microscope capable of securing a high ion detection efficiency in spite of a short working distance and the adaptability for high resolution is disclosed. An ion detector for detecting ions is arranged nearer to an electron source than a first pressure limiting aperture for maintaining the specimen... Agent: Mcdermott Will & Emery LLP

20080073535 - Planar view sample preparation: A method and apparatus is described for orienting samples for charged particle beam operations. A sample is attached to a probe with a major surface of the sample at a non-normal angle to the probe shaft, and the probe shaft is rotated to reorient the sample. The invention is particularly... Agent: Michael O. Scheinberg

20080073536 - Gas detection method and gas detection device: A gas detection method by using a photo acoustic near infrared gas sensor with a laser source and such a gas sensor comprising at least one amplitude modulated laser source, a gas chamber for receiving the gas to be detected, a microphone attached to the gas chamber, a photo detector... Agent: Bachman & Lapointe, P.C.

20080073537 - Radiation detector: A radiation detector includes: a radiation detecting unit including a radiation sensor detecting a radiation sensitive to light, a signal amplifier, a pulse-height discriminator, and a counter; an optical pulse emitting unit configured to emit an optical pulse for confirming operational integrity of the radiation detecting unit; an emission controlling... Agent: Foley And Lardner LLP Suite 500

20080073538 - Application-driven optimization of acquisition and reconstruction of spect/pet projection data: A method for optimizing imaging dwell time during nuclear imaging. A fast pre-scan is conducted over the angular range of imaging, with equal dwell time at each position. A statistical sub-sampling is conducted over a region of interest to a desired fraction of the acquisition time. The statistical sub-sampling is... Agent: Siemens Corporation Intellectual Property Department

20080073539 - Attenuation correction for spect imaging using non-classical orbits of many small gamma cameras: Attenuation correction data is obtained from one or more transmission sources to calculate the attenuation factors of a reconstruction area of an object being imaged by a nuclear medicine apparatus, such as a SPECT gamma camera. The transmission sources are capable of swiveling the direction of the transmission to correspond... Agent: Siemens Corporation Intellectual Property Department

20080073541 - Mobile camera for organ targeted imaging: A mobile detector system for use in the detection of radiation photons. The detector system includes an exterior casing, having an internal area. The internal area has an interior periphery and an exterior periphery, at least one rail, at least one mobile camera, that is movably mounted on the at... Agent: Siemens Corporation Intellectual Property Department

20080073540 - Open limited orbiting tomographic imaging system: A radiographic three dimensional imaging apparatus capable of focusing on a center of rotation point, includes at least two gamma ray detectors, each having a radiation input face, with each detector positioned on a linear path, wherein each detector is movable along the detector's linear path, while simultaneously swiveling to... Agent: Siemens Corporation Intellectual Property Department

20080073542 - Light guide having a tapered geometrical configuration for improving light collection in a radiation detector: A radiation detector having a light guide with a plurality of light pipes is provided designed to improve light collection for reading out a larger scintillator array surface area than a photodetector assembly surface area. The light guide has a trapezoidal geometrical configuration and is symmetrical with respect to at... Agent: Siemens Corporation Intellectual Property Department

20080073543 - Compensating for truncated ct images for use as attenuation maps in emission tomography: A process for obtaining an attenuation map from a truncated transmission scan of an imaged object, by compensating for missing emission data as a result of truncation by using non-truncated emission data of the imaged object to derive “fill-in” emission data. The truncation-compensated emission data then is used to generate... Agent: Siemens Corporation Intellectual Property Department

20080073544 - Device and method for measuring the energy and position of an incident ionising particle in a detector: A radiation detection device, including a detector in semi-conductor material, a first electrode, and a second electrode. The first electrode has a form of pixels, with a first pitch, on one of the sides of the detector. The device further includes a mechanism for identifying the energy of an incident... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080073547 - Apparatus for generating a plurality of beamlets: r

20080073546 - Enhanced magnetic particle steering: The present invention relates to microfluidic systems using rotating microfluidic disc platforms comprising microchannel structures. More specifically, the present invention relates to a method and an arrangement for controlling magnetic particles in microchannel structures of a microfluidic device. The invention is based on the counterbalancing of the magnetic force and... Agent: Birch Stewart Kolasch & Birch

20080073545 - Microreactor device and microchannel cleaning method: A microreactor device includes: a microchannel; magnetic particles that are introduced into the microchannel; and a magnet that is arranged on an outside of the microchannel and exerts a magnetic force on the magnetic particles.... Agent: Oliff & Berridge, PLC

20080073548 - Method and apparatus for simultaneous detection and measurement of charged particles at one or more levels of particle flux for analysis of same: A charged particle detector and method are disclosed providing for simultaneous detection and measurement of charged particles at one or more levels of particle flux in a measurement cycle. The detector provides multiple and independently selectable levels of integration and/or gain in a fully addressable readout manner.... Agent: Battelle Memorial Institute Attn:IPServices, K1-53

20080073549 - Electron beam emitter: An electron beam emitter including a vacuum chamber having a width. An electron generator can be positioned within the vacuum chamber for generating electrons. An elongate nozzle can extend from the vacuum chamber along a longitudinal axis and have an exit window at a distal end of the nozzle. The... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20080073551 - Automated faraday sensor test system: A Faraday sensor test system includes a Faraday sensor configured to intercept a quantity of ions incident on said Faraday sensor, a primary conductor and a test conductor coupled to said Faraday sensor, and a controller. The controller is configured to automatically provide a test current into the test conductor... Agent: Varian Semiconductor Equipment Assc., Inc.

20080073552 - Method and apparatus for confining, neutralizing, compressing and accelerating an ion field: An apparatus and method of use for injection, confinement, neutralization, acceleration and compression of an ion field using a solenoid having an axis of symmetry and supported within a vacuum space. A pair of magnetizable elements are positioned initially in spaced apart positions within the solenoid and after the solenoid... Agent: Patent Law & Venture Group

20080073550 - Methods and apparatus for beam density measurement in two dimensions: A beam density measurement system includes a shield, a beam sensor, and an actuator. The beam sensor is positioned downstream from the shield in a direction of travel of a beam. The beam sensor is configured to sense an intensity of the beam, and the beam sensor has a long... Agent: Varian Semiconductor Equipment Assc., Inc.

20080073553 - Ion beam profiler: In one aspect, an ion beam profiler for use in an ion implanter is disclosed that includes a Faraday cup disposed in an end-station of the ion implanter in a path of an ion beam traveling from a source to the end-station. The Faraday cup comprises an aperture that is... Agent: Nutter Mcclennen & Fish LLP

20080073554 - Spin-polarized electron source and spin-polarized scanning tunneling microscope: An exemplary spin-polarized electron source includes a cathode, and a one-dimensional nanostructure made of a compound (e.g., group III-V) semiconductor with local polarized gap states. The one-dimensional nanostructure includes a first end portion electrically connected with the cathode and a second end portion located/directed away from the cathode. The second... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080073556 - Electron beam source device: An electron beam source device is provided in which the disconnection and deterioration of a filament of the electron beam source device can be accurately predicted and determined, so as to avoid an unnecessary resource waste and increase of cost due to a premature replacement of a still-functional filament in... Agent: J C Patents, Inc.

20080073555 - Electrospray ion source: An on-axis ion source has an ionization chamber and an adjacent low-pressure region. The on-axis ion source also includes a capillary tube having an axial bore for supporting fluid communication between the ionization chamber and the adjacent low-pressure region, the axial bore of the capillary tube being substantially concentrically aligned... Agent: Thermo Finnigan LLC

20080073557 - Methods and apparatuses for directing an ion beam source: A method and apparatus for directing an ion beam toward a surface of a substrate is disclosed. Certain embodiments of the invention relate generally to ion beam sources adapted to direct ion beams toward a surface of a substrate at an oblique angle of incidence relative to the surface. Certain... Agent: Intellectual Property Group Fredrikson & Byron, P.A.

20080073558 - Heat capacitor for capillary aerosol generator: A heat capacitor for a capillary aerosol generator comprises a phase change material that changes phases at a temperature approximately equal to a temperature sufficient to volatilize liquid material in a capillary passage of the capillary aerosol generator. The phase change material stores heat, which can be used to generate... Agent: Buchanan, Ingersoll & Rooney PC

20080073559 - Controlling the flow of vapors sublimated from solids: A vapor delivery system for delivering a steady flow of sublimated vapor to a vacuum chamber comprises a vaporizer of solid material, a mechanical throttling valve, and a pressure gauge, followed by a vapor conduit to the vacuum chamber. The vapor flow rate is determined by both the temperature of... Agent: Patent Administrator Katten Muchin Rosenman LLP

20080073560 - Contamination monitoring and control techniques for use with an optical metrology instrument: A technique is provided for generating and subsequently monitoring the controlled environment(s) within an optical metrology instrument in such a manner as to minimize absorbing species within the light path of the metrology instrument and to minimize the build-up of contaminants on the surfaces of optical elements that may result... Agent: O'keefe, Egan, Peterman & Enders LLP

20080073561 - Lithographic apparatus and device manufacturing method: A stage system for a lithographic apparatus is presented and includes a movable stage, and a stationary motor coil assembly including coils to interact with a magnet of the movable stage to thereby form a moving magnet motor to drive the stage. The stage system also includes a position measurement... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080073562 - Wafer holder and sample producing apparatus using it: A wafer holder includes: a frame-shaped holder main body which has an opening at its center and carries a wafer on its upper surface; guide members which contact the outer periphery of the wafer placed on the holder main body and position the wafer on the holder main body; and... Agent: Brinks Hofer Gilson & Lione

20080073564 - Device for cleaning electrostatic chuck of ion implanter: A device for cleaning an electrostatic chuck in an ion implanter includes a power supplier for generating a hot wire voltage, an electrostatic chuck for sucking a wafer, and a hot wire installed in the interior of the electrostatic chuck and driven by the hot wire voltage supplied from the... Agent: F. Chau & Associates, LLC

20080073563 - Exposure apparatus that includes a phase change circulation system for movers: A mover combination (226) for moving and positioning a device (34) includes a mover (328) that defines a fluid passageway (370) and a circulation system (330) having a passageway inlet (374) and a passageway outlet (376). The circulation system (330) directs a circulation fluid (378) into the fluid passageway (370).... Agent: Roeder & Broder LLP

20080073565 - Oh radical air sterilization lamp quartz tube casing device: Provided is OH radical air sterilization lamp quartz tube casing device that removes germs and odor from air and decomposes harmful gases contained in the air. The OH radical air sterilization lamp quartz tube casing device can decompose organic and inorganic harmful gases contained in air and remove germs and... Agent: Keusey, Tutunjian & Bitetto, P.C.

20080073566 - Histology methods: Described are methods of visualizing biological samples using histological staining and invisible light (e.g., infrared or near-infrared) fluorescence.... Agent: Fish & Richardson PC

20080073567 - Radiological image capturing system and radiological image capturing method: There is described a radiological image capturing system, which makes it possible to obtain an accurate radiological image, irrespective of the position of the diagnosis object in the thickness direction of the subject. The system includes a radiographing apparatus that output radiological image data, based on the radial rays detected... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080073568 - Radiation image reading apparatus and method of controlling the same: A reading apparatus includes a cassette loader, which is loaded with a radiation cassette storing a radiation conversion panel therein. The radiation cassette has at least one portion thereof that is exposed outside of the reading apparatus. The cassette loader includes a shield cover disposed at least between a radiation... Agent: Sughrue Mion, PLLC

20080073569 - Mask position detection: A system includes a transfer arm defining a retaining plane, and at least three sensors are disposed on the transfer arm and configured to detect a position of a mask relative to the retaining plane. The at least three sensors may be used to determine if the mask is properly... Agent: Varian Semiconductor Equipment Assc., Inc.

20080073571 - Exposure apparatus, pressure control method for the same, and device manufacturing method: An exposure apparatus exposes a substrate in a vacuum atmosphere through an optical system. The apparatus includes a partition which separates a first space including at least part of the optical system from a second space adjacent to it, and includes an opening to pass light through it. The apparatus... Agent: Morgan & Finnegan, L.L.P.

20080073570 - Method of repeatedly using a control wafer to monitor treatments: A method of repeatedly using a control wafer to monitor treatments is described. The method includes (a) forming a patterned mask layer with at least one opening therein on a control wafer, wherein the opening is located at a position of the control wafer; (b) performing a treatment to the... Agent: J.c. Patents, Inc.

20080073573 - Laser crystallization apparatus and crystallization method: A laser crystallization apparatus and a crystallization method with a high throughput are provided. Laser light having a predetermined light intensity distribution is irradiated to a semiconductor film to melt and crystallize, wherein a irradiation position is placed very quickly and with a high positional accuracy, thereby forming the semiconductor... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080073572 - Systems and methods of measuring power in lithography systems: Systems and methods of measuring power in lithography systems are disclosed. A preferred embodiment comprises a metrology method that includes providing a lithography system and measuring an amount of power of the lithography system using the Compton effect.... Agent: Slater & Matsil LLP

20080073574 - Writing method of charged particle beam, support apparatus of charged particle beam writing apparatus, writing data generating method and program-recorded readable recording medium: A charged particle beam writing method includes inputting design pattern data, virtually dividing a writing area to be written with the design pattern data into a plurality of small areas in a mesh-like manner, calculating a pattern density in each of the plurality of small areas based on the design... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080073576 - Deposition reduction system for an ion implanter: A system for controlling the temperature of a semiconductor workpiece processing tool and surrounding structure, thereby reducing the deposition rates within an ion implanter. A faraday flag structure comprising a conductive strike plate coupled to a circuit for monitoring ions striking the strike plate to obtain an indication of the... Agent: Tarolli, Sundhelm, Covell & Tummino, LLP

20080073584 - Ion beam current uniformity monitor, ion implanter and related method: An ion beam current uniformity monitor, ion implanter and related method are disclosed. In one embodiment, the ion beam current uniformity monitor includes an ion beam current measurer including a plurality of measuring devices for measuring a current of an ion beam at a plurality of locations; and a controller... Agent: Scott Faber, Esq. Varian Semiconductor Equipment Associates, Inc

20080073579 - Ion beam measuring method and ion implanting apparatus: A change of a beam current of an ion beam which passes an outside of the side of a forestage beam restricting shutter, and which is incident on a forestage multipoints Faraday is measured while the forestage beam restricting shutter is driven in a y direction by a forestage shutter... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080073582 - Ion beam processing apparatus: The present invention provides an ion beam processing technology for improving the precision in processing a section of a sample using an ion beam without making a processing time longer than a conventionally required processing time, and for shortening the time required for separating a micro test piece without breaking... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080073580 - Method and system for identifying events in fib: A method, system and apparatus are presented for real time analysis of images in a focused beam system. In various embodiments, marker positions are displayed as graphical elements on the image of a sample being processed. Selected characteristics of all or a portion of the pixels in the image are... Agent: Sughrue Mion, PLLC

20080073575 - Scan pattern for an ion implanter: An ion implanter includes an ion beam generator configured to generate an ion beam and direct the ion beam towards a workpiece, wherein relative motion between the ion beam and the workpiece produces a scan pattern on a front surface of said workpiece. The scan pattern has an oscillating pattern... Agent: Varian Semiconductor Equipment Assc., Inc.

20080073577 - Substrate holding apparatus: This invention relates to a substrate holding apparatus for use in ion implanters. In particular, the present invention relates to a substrate holding system comprising two or more substrate holders that can adopt interchangeable positions, thereby allowing one substrate holder to scan a substrate through an ion beam while substrates... Agent: Robert W. Mulcahy Applied Materials, Inc.

20080073578 - Terminal structure of an ion implanter: An apparatus includes a conductive structure and an insulated conductor disposed proximate an exterior portion of the conductive structure to modify an electric field about the conductive structure. The insulated conductor has an insulator with a dielectric strength greater than 75 kilovolts (kV)/inch disposed about a conductor. An ion implanter... Agent: Varian Semiconductor Equipment Assc., Inc.

20080073586 - Focused ion beam apparatus and method of preparing/observing sample: Focused ion beam apparatus includes a sample base for mounting a sample, a three axis stage capable of moving the sample base in three directions: along two axes on a horizontal face and a vertical axis, and a first focused ion beam barrel and a second focused ion beam barrel... Agent: Brinks Hofer Gilson & Lione

20080073583 - Ion beam apparatus and method for aligning same: An ion beam apparatus is provided, the ion beam apparatus comprising a movable ion source, a condenser lens, an aperture, and a scanning unit disposed between the condenser lens and the aperture, said scanning unit being adapted to scan an ion beam across the aperture. Furthermore, a method for aligning... Agent: Patterson & Sheridan, L.L.P.

20080073581 - Ion beam irradiating apparatus and method of adjusting uniformity of a beam: An ion beam irradiating apparatus has: a beam profile monitor 14 which measures a beam current density distribution in y direction of an ion beam 4 in the vicinity of a target 8; movable shielding plate groups 18a, 18b respectively having plural movable shielding plates 16 which are arranged in... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080073585 - Ion implanting apparatus: An ion implanting apparatus is provided, which prevents a failure of the processing object caused by a scattering of the deposited particles of the ion species on an inner surface of a through hole of a member that forms a beam geometry of an ion beam. Since at least an... Agent: Mcginn Intellectual Property Law Group, PLLC

20080073588 - Lithography system and projection method: The present invention relates a probe forming lithography system for generating an pattern on to a target surface such as a wafer, using a black and white writing strategy, i.e. writing or not writing a grid cell, thereby dividing said pattern over a grid comprising grid cells, said pattern comprising... Agent: Blakely Sokoloff Taylor & Zafman

20080073587 - Sputtering coating of protective layer for charged particle beam processing: A coating is applied to a work piece in a charged particle beam system without directing the beam to work piece. The coating is applied by sputtering, either within the charged particle beam vacuum chamber or outside the charged particle beam vacuum chamber. In one embodiment, the sputtering is performed... Agent: Michael O. Scheinberg

20080073589 - Method and system for optimizing alignment performance in a fleet of exposure tools: A method for optimizing alignment performance in a fleet of exposure systems involves characterizing each exposure system in a fleet of exposure systems to generate a set of distinctive distortion profiles associated with each exposure system. The set of distinctive distortion profiles are stored in a database. A wafer having... Agent: Beyer Weaver LLP - Kla Tencor

20080073590 - Free electron oscillator: A beam of charged particles (e.g., an electron beam) from a charged particle source can be selectively applied to a pair of electrodes. For example, the charged particles can be electrons that are directed toward a first electrode when the charge difference between the electrodes is in one state and... Agent: Davidson Berquist Jackson & Gowdey LLP

20080073591 - System and method for high resolution radiation field shaping: A system and method are provided for a high resolution radiation treatment system which provide for projecting a field of radiation energy at targeted patient tissue. The system uses a multi-leaf collimator, which is positioned such that a significant clearance is provided between the multi-leaf collimator and the isocenter plane... Agent: Varian Medical Systems Technologies, Inc. C/o Foley & Lardner LLP

20080073592 - Reflective optical illumination collector: A reflective optical illumination collector is described. In one example, the collector has a ring to collect light from a light source within a range of incident angles and to reflect the light off an inner surface of the ring to a target image of the collector. A plurality of... Agent: Blakely Sokoloff Taylor & Zafman

20080073593 - Radiation protection system: A radiation protection system for protecting medical personnel from radiation being applied from a radiation source to a patient positioned on a table. The system includes a shield for positioning above the table having an inner frame sized and shaped for receiving the patient when the patient is positioned on... Agent: Sonnenschein Nath & Rosenthal LLP

20080073598 - Extreme ultra violet light source apparatus: An EUV light source apparatus capable of preventing the efficiency of generation of EUV light from decreasing due to deterioration of a window of an EUV light generation chamber. The EUV light source apparatus includes an EUV light generation chamber provided with a window, a driver laser which generates a... Agent: Wenderoth, Lind & Ponack, L.L.P.

20080073594 - Infrared ray generator: An IR generator comprises a base body, an electro-thermal body and an IR emitting body. The electro-thermal body is located on the base body and generates heat when electric power is supplied. The IR emitting body is located on the electro-thermal body and emits IR when absorbing the heat. The... Agent: Rosenberg, Klein & Lee

20080073596 - Lithographic apparatus and method: A lithographic apparatus includes an illumination system configured to provide a beam of radiation, and a projection system configured to project the beam of radiation. The lithographic apparatus also includes a cooling system that is arranged to pass gas through the interior of the projection system such that the throughput... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080073595 - Ultra-violet cleaning device: A ultra-violet cleaning and sterilization device that emits sufficient radiation to eradicate germs, bacteria, viruses and other pathogens and microorganisms with a replaceable and disposable outer fabric which cleans the surface and a ultra-violet emitting source sterilizing the surface with an on/off switch and a safety button which activates the... Agent: Devaraj Thiruppathi

20080073597 - Ultraviolet lamp: An ultraviolet lamp is comprised of a lamp that transmits the ultraviolet and an electrode that is embedded in the lamp lumen and produces the ultraviolet, or a non-electrode lamp where the substance embedded in the lamp sleeve produces the ultraviolet by microwave; in addition, an indicator is installed on... Agent: Rabin & Berdo, PC

20080073599 - Adaptive collimator for nuclear medicine and imaging: Method and apparatus for varying the hole length of a parallel hole collimator, provides a variably configurable compound collimator for use in nuclear imaging. The collimator has a plurality of substantially parallel oriented collimator cores configured for transition between a contracted configuration and an expanded configuration, wherein a gap space... Agent: Siemens Corporation Intellectual Property Department

20080073600 - Devices, methods, and systems involving castings: Certain exemplary embodiments of the present invention comprise a device comprising a cast collimator derived from a metallic foil stack lamination mold, said collimator defining a feature adapted to contain a plurality of radiation detection elements. In certain embodiments, the collimator can define a feature adapted to contain a plurality... Agent: Michael N. Haynes

20080073601 - Transportation container and assembly: Embodiments of the present disclosure relate generally to transportation containers and assemblies, such as transportation containers and assemblies for containing and transporting radioactive material. A transportation assembly for transporting radioactive material generally includes an outer container defining an inner cavity, the outer container having an inner shell, wherein at least... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080073602 - Lithographic apparatus and device manufacturing method: An immersion lithographic projection apparatus is disclosed in which a liquid removal system surrounds a liquid supply system which provides liquid to a space between a projection system and a substrate. The liquid removal system is moveable relative to the liquid supply system and is controlled to have substantially zero... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080073603 - Apparatus for analysing surface properties with indirect illumination: An apparatus (1) for analysing surface properties, comprising a first radiation device (4) which emits radiation directly onto a surface (9) to be analysed, a first illumination device (6, 7) for indirectly illuminating the surface (9) to be analysed, a first radiation detector device (8) which receives at least part... Agent: Hayes Soloway P.C.

20080073604 - Imprint apparatus and imprint method: An imprint apparatus, comprising a first holder for holding a mold having an imprint pattern; a second holder for holding a workpiece to which the imprint pattern is transferred; a first illumination system for irradiating a mark for determining a position of the mold and a mark for determining a... Agent: Fitzpatrick Cella Harper & Scinto

20080067321 - Optical information detecting method, optical head, and optical disc apparatus: In multilayer optical discs and high-speed optical discs, the amount of reproduction light per unit time greatly decreases and the reproduction signal quality (S/N) significantly drops due to the low effective reflectivity and the short read time of the medium. These problems are solved by causing reflected signal light from... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067322 - Toolessly adjustable cupola and photocontrol receptacle assembly: Certain embodiments of the present invention provide a cupola and photocontrol receptacle assembly that allows a user to adjust the direction of the cupola base and the photocontrol receptacle simultaneously without using tools. A fixture housing may have an opening for receiving a photocontrol receptacle connection member and one or... Agent: John S. Pratt, Esq Kilpatrick Stockton, LLP

20080067323 - Photonic detector device and method: A device and method are presented for use in measuring photon energy. The device comprises at least one pixel unit (10) including a Photocathode (12) that emits electrons in response to absorbed photons; an Anode (14); and a control unit (19) operable for controlling an electric current from the Photocathode... Agent: Nath & Associates

20080067324 - High fill-factor sensor with reduced coupling: A photosensor array includes data and scan lines (124, 148), circuitry of each data line/scan line pair formed in a backplane (110) on a substrate (102). On a first electrode scan line (148) a switching element (112) responds to a scan signal, connecting a first terminal (106) to a second... Agent: Carestream Health Inc,

20080067325 - Photo detecting apparatus: A plurality of pixel circuits, provided with a plurality of photo detecting elements, respectively, cause photocurrent corresponding to an incident light. The pixel circuits are placed on intersections of a plurality of data lines and scanning lines, respectively. A second capacitance charges and discharges an electric charge overflowing from a... Agent: Ditthavong Mori & Steiner, P.C.

20080067326 - Solid-state image-pickup device with column-line amplifiers and limiter: The levels of the power supply and the ground are kept constant against a parasitic resistance by keeping the constant current of an amplifier irrespective of the size of a pixel signal and the gain of the amplifier in this case in an image signal reading circuit system having the... Agent: Robert J. Depke Lewis T. Steadman

20080067327 - Solid-state image-pickup device with column-line amplifiers and limiter: The levels of the power supply and the ground are kept constant against a parasitic resistance by keeping the constant current of an amplifier irrespective of the size of a pixel signal and the gain of the amplifier in this case in an image signal reading circuit system having the... Agent: Robert J. Depke Lewis T. Steadman

20080067328 - Spectrophotometer: A spectrophotometer, in which an emission spectrum of the light source is measured. Based on the measured emission spectrum, a threshold is set to allow only an outstanding spectral intensity in a specific wavelength region to be greater than the threshold. Then, a ratio between the setup threshold and a... Agent: Sughrue Mion, PLLC

20080067329 - Systems for displaying and capturing images: A system for displaying and capturing images. The system comprises a display unit, a detection module. The display unit provides a first light according to a scan signal and a data signal. The detection module captures a second light and comprises a photo detection unit, a transformation unit, and a... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080067330 - Color sensor for vehicle and method for manufacturing the same: A color sensor includes: a substrate; first to third light receiving elements on the substrate; a red light filter for passing a red light and a first near infrared light block filter for blocking a near infrared light on the first light receiving element; a green light filter for passing... Agent: Posz Law Group, PLC

20080067331 - Method and apparatus for detecting embedded material within an interaction region of a structure: A system and method processes a structure comprising embedded material. The system includes a laser adapted to generate light and to irradiate an interaction region of the structure. The system further includes an optical system adapted to receive light from the interaction region and to generate a detection signal indicative... Agent: Knobbe Martens Olson & Bear LLP

20080067332 - Scale and readhead apparatus: Apparatus for determining angular alignment of a readhead with respect to a scale. The apparatus comprises a scale and readhead. The readhead has at least one sensor which produces an output which is dependent on the angular alignment of the readhead relative to the scale.... Agent: Oliff & Berridge, PLC

20080067333 - Position-measuring device: A position-measuring device includes a scanning unit and a measuring graduation that is displaceable thereto in at least one measuring direction. The measuring graduation includes two incremental-graduation tracks extending in parallel in the measuring direction, between which a reference-marking track having at least one reference marking at a reference position... Agent: Kenyon & Kenyon LLP

20080067334 - Image sensor package structure and method for manufacturing the same: An image sensor package structure includes a substrate, a chip, a plurality of wires, and a frame layer. The substrate has an upper surface, which is formed with first electrodes, and a lower surface, which is formed with second electrodes corresponding to electrically connect to the first electrodes. The chip... Agent: Pro-techtor International Services

20080067335 - Method of moving bubbles: A method of moving bubbles includes utilizing optical tweezers to form a bright photoresist area and a dark photoresist area in the photoresist layer. The bubbles in the photoresist layer move from the bright photoresist area to the dark photoresist area.... Agent: North America Intellectual Property Corporation

20080067336 - Apparatuses, methods and compositions for ionization of samples and mass calibrants: The present invention provides, inter alia, apparatuses and methods for ionizing samples that are in gaseous phase or can be vaporized/sublimated. The samples include samples to be analyzed and mass calibrants that serve as standards. In addition, the present invention also provides calibrant formulations that release mass calibrants in a... Agent: Agilent Technologies Inc.

20080067338 - Charged particle beam lithography system and method for evaluating the same: In the charged particle beam lithography system, a pattern area to be drawn is divided into a plurality of frames, a main deflection positions a charged particle beam to a subfield within the frame, and an auxiliary deflection draws a pattern in units of the subfield. The charged particle beam... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080067337 - Sample and method for evaluating resolution of scanning electron microscope, and electron scanning microscope: In the case of monitoring a resolution of a scanning electron microscope, it is required to prepare a sample and to use a measuring algorithm so as to reduce the pattern dependency of an index value of resolution to be measured in order to measure a variation in the size... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067339 - Method of acquiring and processing neutron log data, and related apparatuses: A method of processing neutron log data comprises the steps of: a) deriving from the near-spaced neutron count of a neutron logging tool an approximate, unfiltered, lithology-related characteristic of a formation; b) deriving a correction that is essentially independent of the lithology; c) long filtering the correction; and d) adding... Agent: Mark A Oathout

20080067346 - Mass spectrometry calibration methods: Briefly described, embodiments of this disclosure include methods of calibrating a mass spectrometry system, and the like. One exemplary method of calibrating a mass spectrometry system, among others, includes: acquiring a first mass spectrum of a sample using a first trapping potential, wherein the first mass spectrum are acquired from... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080067345 - Method for creating multiply charged ions for maldi mass spectrometry (esmaldi): A method of combining ES (ElectroSpray Ionization) and MALDI (Matrix Assisted Laser Desorption Ionization) to create enhanced MALDI mass spectrometry to be referred to as ESMALDI (ElectroSpray Matrix Assisted Laser Desorption Ionization). ESMALDI technology offers substantial advantages over conventional technology. essentially by combining the high ionization efficiency and multiple charging... Agent: Joseph J. Bango C/o Connecticut Analytical Corporation

20080067344 - Method of analyzing mass analysis data and apparatus for the method: The present invention provides a method and an apparatus for analyzing mass analysis data for easily deducing the structure of an unknown substance, based on data obtained by an MSn analysis. First, the structural formula of a precursor ion of the unknown substance is deduced based on the mass-to-charge ratio... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080067341 - Methods for analyzing ion mobility data: Disclosed herein are methods for analyzing ion mobility data. In one embodiment, a method for analyzing ion mobility spectrometry data is disclosed. The method comprises conducting a number of ion mobility scans on a sample, generating an ion map comprising a first ion line, comparing the first ion line to... Agent: General Electric Company Global Research

20080067340 - System and method for data collection in recursive mass analysis: Systems, methods, and computer programming for collecting data using a mass spectrometer comprising a particle detector or other mass analyzer. A data collection such as a tree or array structure which includes data records for storing detected data is maintained in volatile or persistent memory. Data is received from the... Agent: Torys LLP

20080067342 - Ion trap mass analyzer: An ion trap mass analyzer includes an elongated tunnel that has a wall, a longitudinal axis and an inner space. The wall includes a substrate and conductor trace patterns. There is also a variable electric potential means for providing electric potentials which is connected to the conductor trace patterns. The... Agent: Berenato, White & Stavish, LLC

20080067347 - Method and apparatus for de-convoluting a convoluted spectrum: Embodiments of the present invention relate to methods, systems, and apparatus suitable for performing a survey scan of one or more analytes or labeled fragments of analytes to obtain a convoluted spectrum and to de-convolute the convoluted spectrum using, for example, a mass spectrometer and associated processing system.... Agent: Miles & Stockbridge PC

20080067343 - Methods of preparing samples for maldi mass spectrometry and reagent compositions for the same: A simple and efficient method of preparing a sample in the measurement according to matrix-assisted laser desorption/ionization mass spectrometry (MALDI-MS) capable of inhibiting any ion suppression by impurities, such as inorganic salts and surfactants, contained in the sample. An analyte and matrix molecules are co-crystallized in the presence of porous... Agent: Birch Stewart Kolasch & Birch

20080067348 - High resolution sampling system for use with surface ionization technology: The present invention is a device to restrict the sampling of analyte ions and neutral molecules from surfaces with mass spectrometry and thereby sample from a defined area or volume. In various embodiments of the present invention, a tube is used to sample ions formed with a defined spatial resolution... Agent: Fliesler Meyer LLP

20080067350 - Multi-channel high-field asymmetric waveform ion mobility spectrometry: A multi-channel high field asymmetric waveform ion mobility spectrometer (FAIMS) is provided. The apparatus provides for substantially simultaneous FAIMS analysis of plurality of ions from a single sample. The apparatus has a analyzer region comprising a hollow electrode, a plurality of plate electrodes positioned parallel to and distanced from the... Agent: Agilent Technologies Inc.

20080067349 - Multi-channel time-of-flight mass spectrometer: A system and method for mass analysis of ions. The system includes an orthogonal acceleration time-of-flight mass analyzer having at least two channels configured to receive respective groups of ions from respective ion sources and having a field-free section configured to mass-separate ions during flight time. The groups of ions... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080067351 - Tandem mass spectrometry system: A tandem mass spectrometry system has a first mass spectrometer for creating and extracting precursor ions. The ions are introduced into a decelerating electric field at a slight angle to the direction of the electric field which is formed by first through third electrodes. An accelerating electric field perpendicular to... Agent: The Webb Law Firm, P.C.

20080067352 - Combined ambient desorption and ionization source for mass spectrometry: Combined desorption and ionization sources are provided to generate molecular ions form a sample disposed on a substrate surface. A heated gas-jet probe or heated solvent stream probe desorbs sample molecules into the gas phase. The desorbed sample molecules are ionized by reaction between the sample molecule and charged solvent... Agent: Yang Wang

20080067356 - Ionization of neutral gas-phase molecules and mass calibrants: An apparatus for ionizing an analyte sample with a mass calibrant is provided. The apparatus includes an ionization chamber defining an ionization region, a first passageway coupled to the ionization region for delivering the analyte sample to the ionization region, a second passageway leading to a mass analyzer having an... Agent: Agilent Technologies Inc.

20080067355 - Mass spectrometer interface for atmospheric ionization ion sources: A mass spectrometer sample input interface comprises a desolvation apparatus defining a desolvation pathway along which a desolvation gas flows, in a direction from upstream to downstream, the desolvation pathway having a desolvation pathway portion; and an ion pathway apparatus for defining an ion pathway for analyte solution droplets to... Agent: Agilent Technologies Inc.

20080067353 - Micro fluidic gas assisted ionization device and method: m

20080067354 - Power supply regulation using a feedback circuit comprising an ac and dc component: In various aspects, ion sources, mass spectrometer systems, and a power supply circuit coupled to a feedback circuit are provided. A power supply is provided that includes at least the power supply circuit and is operable to transfer charge to a load. The feedback circuit is responsive to a DC... Agent: Choate, Hall & Stewart LLP

20080067357 - Sample support for desorption: An apparatus and method for regenerating ion samples for a mass spectrometer are provided. Source samples are loaded on a support which is heated by a laser beam, desorbing the sample without ionization. The desorbed sample is carried by a carrier gas flow through a transfer tube, at the output... Agent: Darby & Darby P.C.

20080067358 - Apparatus for holding solids for use with surface ionization technology: The present invention is a device to restrict the sampling of analyte ions and neutral molecules from surfaces with mass spectrometry and thereby sample from a defined area or volume. In various embodiments of the present invention, a tube is used to sample ions formed with a defined spatial resolution... Agent: Fliesler Meyer LLP

20080067359 - Flexible open tube sampling system for use with surface ionization technology: The present invention is a device to restrict the sampling of analyte ions and neutral molecules from surfaces with mass spectrometry and thereby sample from a defined area or volume. In various embodiments of the present invention, a tube is used to sample ions formed with a defined spatial resolution... Agent: Fliesler Meyer LLP

20080067360 - Two-dimensional ion trap with ramped axial potentials: The invention provides a two-dimensional ion trap, comprising a plurality of elongate electrodes positioned between first and second end electrodes, the plurality of electrodes and first and second end electrodes defining a trapping volume. A controller in electrical communication with the plurality of elongate electrodes and the first and second... Agent: Thermo Finnigan LLC

20080067361 - Efficient detection for ion traps: An apparatus and method are disclosed for efficient detection of ions ejected from a quadrupolar ion trap, in which the ions are ejected as first and second groups of ions having different directions. The first and second groups of ions are received by a conversion dynode structure, which responsively emits... Agent: Thermo Finnigan LLC

20080067362 - Electrode networks for parallel ion traps: An electrode network for N parallel ion traps, wherein N is an integer larger than 1, includes at most 2N+2 electrodes, which form N trapping volumes each corresponding to a respective one of the N parallel ion traps. Also provided is a parallel mass spectrometer, comprising: a vacuum chamber and... Agent: Thermo Finnigan LLC

20080067365 - Multipole ion guide having longitudinally rounded electrodes: An ion guide having a plurality of spheroidal or similarly shaped electrodes is disclosed. The electrodes are arranged in pairs about a central ion flow axis, and an RF voltage is applied in a prescribed phase relation to create an electric field that focuses and radially confines an ion beam.... Agent: Thermo Finnigan LLC

20080067363 - System and method for implementing balanced rf fields in an ion trap device: A system and method are disclosed for effectively compensating for non-linear field components created by a field distortion feature in a quadrupolar ion trap, compensation provided by a geometric surface shaping which reduces the non-linear field components and creates a minimal centerline radio-frequency potential in the ion trap. The ion... Agent: Thermo Finnigan LLC

20080067364 - System and method for implementing balanced rf fields in an ion trap device: A system and method are disclosed for effectively compensating for an unbalanced or non-zero centerline radio-frequency potential in a quadrupolar ion trap, the unbalanced centerline potential created by a compensation feature that minimizes non-linear field components created by one or more ejection slots in the ion trap. The ion trap... Agent: Thermo Finnigan LLC

20080067366 - Faims electrodes with lateral ion focusing: A FAIMS cell including one of side-to-side cylindrical geometry electrodes and stacked-plate electrodes is adapted with a medial surface feature for focusing ions along a lateral direction within an ion separation region of the FAIMS cell. The medial surface feature is provided as one of a recessed channel within an... Agent: Thermo Finnigan LLC

20080067367 - Means and method for field asymmetric ion mobility spectrometry combined with mass spectrometry: In a system for analyzing samples by mass spectrometry, analyte ions are analyzed first by field asymmetric ion mobility spectrometry (FAIMS) before being analyzed by a mass analyzer. The analyte ions are produced in an ion source operating at near atmospheric pressure and transferred via a dielectric capillary into the... Agent: Law Offices Of Paul E. Kudirka

20080067368 - Ionizing system for vacuum process and metrology equipment: Apparatus and method for measuring and controlling static charge inside vacuum equipment. In-line gas ionizers deliver gas ions to pass-through doors, load-locks, vacuum cluster vent lines, or neutralizing chambers. Static charge measurement is accomplished while the wafer or product remains in a vacuum or near-vacuum. In one embodiment, a neutralizing... Agent: Mks Instruments Inc.

20080067370 - Electron microscope and scanning probe microscope calibration device: An electron microscope or scanning probe microscope calibration device can provide accurate length calibrations in the ranges from sub-nanometer to several micrometers. The device material consists of a series of periodic structures grown on a single crystal semiconductor substrate. The device material is prepared as a cross-sectional sample for viewing... Agent: John Mccaffrey

20080067369 - High-resolution optical channel for non-destructive navigation and processing of integrated circuits: An optical-fiber based light channel system is included in an ion/electron beam tool for imaging and/or processing integrated circuits. The optical channel system includes an image collection portion, an optical fiber image transmission portion and a detector portion. The image collection portion includes micro-optical components and has submillimeter dimensions, so... Agent: International Business Machines Corporation Dept. 18g

20080067371 - Sem-type reviewing apparatus and a method for reviewing defects using the same: In order to achieve high throughput in a SEM-type defect-reviewing apparatus and method for automatically acquiring images of review defects present on samples, including: a cell comparison step subdivided into the steps of (a) providing a defect detection success ratio or defect detection success map due to at least a... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067372 - Defect imaging device and method: The present invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair... Agent: Law Office Of Dale B. Halling, LLC

20080067376 - Charged particle beam apparatus: This invention provides a charged particle beam apparatus that can makes reduction in off axis aberration and separate detection of secondary beams to be compatible. The charged particle beam apparatus has: an electron optics that forms a plurality of primary charged particle beams, projects them on a specimen, and makes... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067378 - Charged particle beam apparatus: The present invention provides a stable charged particle beam apparatus to enable high-resolution observation by reducing the influence of the noise of a large number of power supplies used in an aberration corrector. The charged particle beam apparatus that has: an SEM column for irradiating an electron beam onto a... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067375 - Electron beam holography observation apparatus: In electron holography observation using a transmission electron microscope, searching of conditions of an electron optical condition which are necessary for realizing a requested spatial resolution is sophisticated and for persons unaccustomed to operation of the electron microscope, the observation is time consuming work. In addition to the fundamental electron... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067382 - Full spectrum lapidary 3d image scanner and method: The subject invention pertains to an apparatus and method for collecting 2-D data slices of a specimen. Embodiments can incorporate a lapidary platen and an image recording system to image a specimen. The lapidary wheel platen can provide an imaging plane such that an image can be taken as the... Agent: Saliwanchik Lloyd & Saliwanchik A Professional Association

20080067373 - Measurement of critical dimension and quantification of electron beam size at real time using electron beam induced current: A method for accurately measuring feature sizes and quantifying the beam spot size in a CDSEM at real time is provided. The inventive method is based on a scanning microscope and it works on both conductive and non-conductive features. The measurement of conductive feature includes first providing a conductive feature... Agent: Scully, Scott, Murphy & Presser, P.C.

20080067381 - Semiconductor wafer inspection tool and semiconductor wafer inspection method: A semiconductor wafer inspection tool and a semiconductor wafer inspection method capable of conducting an inspection under appropriate conditions in any one of an NVC (Negative Voltage Contrast) mode and a PVC (Positive Voltage Contrast) mode is provided. Primary electrons 2 are irradiated onto a wafer to be inspected 6... Agent: Crowell & Moring LLP Intellectual Property Group

20080067374 - Specimen analyzing apparatus and specimen holder: In a specimen analyzing apparatus such as a transmission electron microscope for analyzing the structure, composition and electron state of an observing specimen in operation by applying external voltage to the specimen to be observed, a specimen support (mesh) including a mesh electrode connectable to external voltage applying portions of... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067379 - X-ray analyzer using electron beam: An electron probe X-ray analyzer capable of automatically setting appropriate analytical conditions if there are unknown compounds by performing analysis under the analytical conditions adapted for analysis points having different compositions in a case where the numerous analysis points having the plural compositions are analyzed by WDS (wavelength-dispersive X-ray spectrometer).... Agent: The Webb Law Firm, P.C.

20080067380 - Charged particle beam equipment: Charged particle beam equipment enables the simultaneous measurement and correction of magnification errors in both X and Y directions in one measurement without requiring the elimination of displacement, if any, in rotation direction between the direction of a periodic structure pattern of a sample having a known periodic structure and... Agent: Crowell & Moring LLP Intellectual Property Group

20080067377 - Electron beam apparatus and an aberration correction optical apparatus: An electron beam apparatus for providing an evaluation of a sample, such as a semiconductor wafer, that includes a micro-pattern with a minimum line width not greater than 0.1 μm with high throughput. A primary electron beam generated by an electron gun is irradiated onto a sample and secondary electrons... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080067383 - Electron-beam size measuring apparatus and size measuring method with electron beams: An electron-beam size measuring apparatus includes: electron beam irradiating means that irradiates an electron beam on a surface of a sample; detection means that detects electrons emitted from the sample; distance measurement means that measures the distance between the sample and a secondary electron control electrode of the detection means;... Agent: Muramatsu & Associates Suite 310

20080067385 - Method and apparatus for processing a micro sample: An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In... Agent: Kenyon & Kenyon LLP

20080067384 - Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample: In a method of measuring a thin film sample of irradiating an electron beam to a thin film sample, detecting a generated secondary electron and measuring a film thickness of the thin film sample by utilizing the secondary electron, it is provided that the film thickness is measured accurately, in... Agent: Brinks Hofer Gilson & Lione

20080067387 - Crosswire sensor: A sensor array is formed using sensor elements including first and second intersecting arrays of wires separated by radiation sensitive material. A common signal is input to the first array of the wires and signals from the second array of wires are summed to produce an output signal. The state... Agent: Blaise Mouttet

20080067386 - Megavoltage scatter radiation measurement using beam stop array: A system may include emission of megavoltage radiation from a megavoltage radiation source, acquisition of a first image using an imaging device while first megavoltage radiation is emitted from the megavoltage radiation source and while a plurality of elements is between the megavoltage radiation source and the imaging device, and... Agent: Siemens Corporation Intellectual Property Department

20080067389 - Electronic detection device and detector comprising such a device: This electronic detection device comprises a substrate and at least one microstructure, said microstructure comprising a membrane which extends substantially facing and at a distance from said substrate, said membrane being mechanically attached and electrically connected to at least one longilineal retention element which is mechanically and electrically connected to... Agent: Burr & Brown

20080067388 - Method and system for increasing signal-to-noise ratio in microbolometer arrays: Device for retrieving electrical charge, resulting from electromagnetic radiation energy incident on a temperature sensor array, the temperature sensor array including a plurality of temperature sensor rows, each temperature sensor row including a plurality of temperature sensors, the device including a retrieval module array and a row select circuit, the... Agent: Cantor Colburn, LLP

20080067391 - Scintillator crystal and radiation detector: v

20080067390 - Gamma ray detectors: A gamma ray detector (50) comprises a plastic scintillation body (52) arranged to receive incident gamma rays to be detected. Photons are generated in response to the gamma rays by excitation and de-excitation processes in the scintillation body. The photons are detected using at least one photodetector (56) which generates... Agent: O'melveny & Myers LLP Ip&t Calendar Department La-1118

20080067393 - Radiation detector for x-rays or gamma rays: A radiation detector for X-rays or gamma rays is disclosed. In at least one embodiment, the radiation detector includes an array of scintillation detectors and a reflector layer that separates the latter from one another and is formed essentially by a binding agent matrix and particles, incorporated therein, of a... Agent: Harness, Dickey & Pierce, P.L.C

20080067392 - Radiation imaging device and radiation imaging method: A radiation imaging device which, as a whole, can be further reduced in size and thickness with the area of an imaging area sufficiently achieved. A scintillator film 2 emitting light with a predetermined wavelength in response to an incident of radiation is accommodated in a case 5 while being... Agent: Drinker Biddle & Reath (dc)

20080067394 - Neutron detection based on coincidence signal: A method includes detecting a neutron based on a time proximity of a first signal and a second signal. The first signal indicates detection of at least one of a neutron and a gamma ray. The second signal indicates detection of a gamma ray.... Agent: Fish & Richardson PC

20080067395 - Film scanner and detection apparatus therefor: A detection apparatus for detecting perforation holes of a cinematographic film comprises at least one light source, at least one scanning sensor, which is arranged so as to receive light emitted by the light source after interaction with a perforation zone of the film, and an evaluation circuit for detecting,... Agent: Thomson Licensing LLC

20080067402 - Charged particle beam exposure apparatus: An exposure apparatus which draws a pattern on a substrate with a charged particle beam is disclosed. The exposure apparatus includes a blanker which controls, in accordance with a dose pattern including a plurality of pulses, whether to allow a charged particle beam to strike the substrate, and a controller... Agent: Cowan Liebowitz & Latman P.C. John J Torrente

20080067404 - Electrostatic beam deflection scanner and beam deflection scanning method: A beam deflection scanner performs reciprocating deflection scanning with an ion beam or a charged particle beam to thereby periodically change a beam trajectory and comprises a pair of scanning electrodes installed so as to be opposed to each other with the beam trajectory interposed therebetween and a pair of... Agent: Arent Fox LLP

20080067400 - Ion source and metals used in making components thereof and method of making same: An ion source is capable of generating and/or emitting an ion beam which may be used to deposit a layer on a substrate or to perform other functions. In certain example embodiments, techniques for reducing the costs associated with producing ion sources and/or elements thereof are provided. Such techniques may... Agent: Nixon & Vanderhye, PC

20080067403 - Charged particle beam exposure apparatus: An exposure apparatus which draws a pattern on a substrate with a charged particle beam is disclosed. The exposure apparatus includes a detector which detects a charged particle beam, a deflector which deflects the charged particle beam to scan the substrate or the detector with the charged particle beam, and... Agent: Cowan Liebowitz & Latman P.C. John J Torrente

20080067401 - Particle beam irradiation method and particle beam irradiation apparatus used for the same: In a particle beam irradiation method and a particle beam irradiation apparatus in which depth direction irradiation field spread and lateral direction irradiation field spread are performed, an irradiation dose in each of irradiation layers of an irradiation target is made substantially constant, and control is simplified. The depth direction... Agent: Buchanan, Ingersoll & Rooney PC

20080067398 - Analyzing electromagnet: In an analyzing electromagnet 40, each of magnetic poles 80 in which the plan-view shape is curved is divided along the traveling direction of an ion beam 2 into three partial magnetic poles 81 to 83. The gaps of the first and third partial magnetic pole pairs 81, 83 as... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080067399 - Distortion correcting apparatus for x-ray image tube: A magnetic field intruding into an electron lens area from outside an X-ray image tube is detected by a magnetic field sensor. A magnetic field for offsetting the magnetic field is generated by a coil arranged in an input surface area of the X-ray image tube, so that the distortion... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080067397 - Beam processing system and beam processing method: A beam processing system is for causing a particle beam extracted from a beam generating source to pass through a mass analysis magnet device, a mass analysis slit, and a deflection scanner in the order named, thereby irradiating the particle beam onto a processing object. The mass analysis slit is... Agent: Arent Fox LLP

20080067396 - Electron lens and charged particle beam apparatus: The present invention provides a compact electron lens causing little aberration, and a charged particle beam apparatus such as a scanning electron microscope that is super compact and offers a high resolution. An upper magnetic pole and a sample-side magnetic pole are magnetically coupled to the respective poles of a... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067405 - Charged particle beam irradiation system and charged particle beam extraction method: A charged particle beam irradiation system and a charged particle beam extraction method which can prevent erroneous irradiation of a charged particle beam in the direction of advance of the charged particle beam. The system and method are featured in stopping supply of an ion beam to one or more... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080067406 - Irradiating device and method for controlling the same: An irradiating device and a method for controlling it are provided. The device comprises an electron accelerator and a scanning box connected to the electron accelerator, wherein the scanning box is provided with a target, an electron beam exit window positioned at left or right side of the target and... Agent: Price Heneveld Cooper Dewitt & Litton, LLP

20080067408 - Charged particle beam device with a gas field ion source and a gas supply system: The present invention provides a charged particle beam device for irradiating a specimen with ions. The charged particle beam device comprises a gas field ion source unit for generating a beam of ions, the gas field ion source having an emitter unit having an emitter unit tip; and a gas... Agent: Patterson & Sheridan, L.L.P.

20080067407 - Conductive probe and method for producing the same: An amorphous carbon layer sticking on a carbon nanotube surface is remarkably reduced when a carbon nanotube is joined to a conductive substrate by bringing a single fibrous carbonaceous material in contact with the tip of the conductive substrate and covering at least a part of the contact portion with... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067409 - Method and apparatus for generating ions for mass analysis: An apparatus and method is disclosed for reducing contamination in a mass spectrometer instrument system. The system includes an ion source at a first pressure for generating ions by laser desorption/ionization and an inlet aperture to a vacuum chamber at a second, lower pressure than the first pressure of the... Agent: Applied Biosystems

20080067410 - Charged particle generator and accelerator: A charged particle generator (1) of the present invention comprises a first box-shaped insulating member (4), having an opening at its top; a second insulating members (5), which is housed inside the first box-shaped insulating member (4) and has an opening at its top, and whose side walls (13) and... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080067411 - Ion source: An ion source of the present invention includes: a cylindrical insulation tube (2) opened upward and opened at part of its lower surface; a plurality of hollow cylindrical permanent magnets (3), provided on the outer peripheral surface of the insulation tube to be arranged in a row in the axial... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080067412 - Ion source: An exemplary ion source for creating a stream of ions has an aluminum alloy arc chamber body that at least partially bounds an ionization region of the arc chamber. The arc chamber body is used with a hot filament arc chamber housing that either directly or indirectly heats a cathode... Agent: Tarolli, Sundhelm, Covell & Tummino, LLP

20080067413 - Biomarker generator system: A biomarker generator system for producing approximately one (1) unit dose of a biomarker. The biomarker generator system includes a small, low-power particle accelerator (“micro-accelerator”) and a radiochemical synthesis subsystem having at least one microreactor and/or microfluidic chip. The micro-accelerator is provided for producing approximately one (1) unit dose of... Agent: Pitts And Brittian P C

20080067414 - Uv water purification system: A point of use water purifier for use in rural and under developed areas having a supply reservoir chamber in a first container and a treatment reservoir chamber in a second container underlying the first container and into which the first container is fitted, the water purifier employing a UV... Agent: Ralph D'alessandro

20080067415 - Alignment apparatus, exposure apparatus, and device manufacturing method: At least one exemplary embodiment is directed to an alignment apparatus which includes a moving member, a structural object arranged on the moving member, and an electromagnetic actuator which moves the structural object relative to the moving member. The electromagnetic actuator includes a plurality of linear motor units, which apply... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080067419 - Portable sterilizer: A portable sterilizer is disclosed. The portable sterilizer is composed of a housing for carrying and a sterilization device such as a UV light or an ozone generator inside the housing. A chamber with certain space is disposed inside the housing, connecting with the sterilization device for being disinfected. An... Agent: Troxell Law Office PLLC

20080067417 - Self-sterilizing input device: A system and method for sterilizing a surface on an input device is disclosed. A chamber is configured to enclose an input device such as a keyboard and is configured to be switched between an open and a closed state. A drive unit may be provided to switch the chamber... Agent: Banner & Witcoff, Ltd. Attorneys For Client Nos. 003797 & 013797

20080067416 - Uv assisted thermal processing: The present invention provides methods and apparatus for performing thermal processes to a semiconductor substrate. Thermal processing chambers of the present invention comprise two different energy sources, such as an infrared radiation source and a UV radiation source. The UV radiation source and the infrared radiation source may be used... Agent: Patterson & Sheridan, LLP

20080067418 - Uv sterilization of user interface fomites: Techniques for sterilizing a fomite are disclosed. A UV sterilization apparatus includes a housing for enveloping a fomite inside the housing. The housing is composed of a material that prevents transmission of electromagnetic radiation in the ultraviolet range. Attached to the housing is a closure element, and the closure element... Agent: Fish & Richardson, PC

20080067420 - Method and device for 3d reconstruction of the distribution of fluorescent elements: The invention relates to a method for processing fluorescence signals emitted after excitation by radiation coming from a radiation source, by at least one fluorophore with a lifetime r in a surrounding medium, which signals are detected by detection means, and which method comprises the calculation, on the basis of... Agent: Thelen Reid Brown Raysman & Steiner LLP

20080067421 - Electron beam etching apparatus and method for the same: A electron beam etching apparatus uses carbon nanotube as electron emitter. The electron beam etching apparatus includes a vacuum chamber, a cathode plate, an anode plate and a driver unit. The cathode plate and the anode plate are arranged in the vacuum chamber and parallel to each other. The cathode... Agent: Hdsl

20080067422 - Information recording and reproducing apparatus and read power learning method: Since the conventional optical disk recording/reproducing apparatus cannot correctly measure a power of a main beam that is a part of the laser light outputted from an objective lens and is focused on a recording layer to contribute to recording/reproducing, it is difficult to accurately control a read power. A... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067423 - Writing error diagnosis method for charged particle beam photolithography apparatus and charged particle beam photolithography apparatus: A writing error diagnosis method for a charged beam photolithography apparatus and a charged beam photolithography apparatus which can specify an error cause within a short period of time in occurrence of a pattern writing error are provided. The writing error diagnosis method for a charged beam photolithography apparatus is... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080067424 - Lithographic apparatus, beam delivery systems, prisms and device manufacturing method: A beam directing element configured to receive a substantially collimated input beam of predetermined wavelength propagating in a first direction and to output a substantially collimated output beam in a second direction includes a prism formed of a transparent material and having input and output faces, wherein the internal angle... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080067426 - Pattern writing circuit self-diagnosis method for charged beam photolithography apparatus and charged beam photolithography apparatus: A pattern writing circuit self-diagnosis method for a charged beam photolithography apparatus and a charged beam photolithography apparatus which enable to maintain normality of the charged beam photolithography apparatus are provided. The pattern writing circuit self-diagnosis method for a charged beam photolithography apparatus is a pattern writing circuit self-diagnosis method... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080067425 - Apparatus and method for exposing a substrate to uv radiation using asymmetric reflectors: Embodiments of the invention relate generally to an ultraviolet (UV) cure chamber for curing a dielectric material disposed on a substrate and to methods of curing dielectric materials using UV radiation. A substrate processing tool according to one embodiment comprises a body defining a substrate processing region; a substrate support... Agent: Townsend And Townsend And Crew LLP / Amat

20080067429 - Static electricity deflecting device, electron beam irradiating apparatus, substrate processing apparatus, substrate processing method and method of manufacturing substrate: A substrate processing apparatus which irradiates a substrate under processing with an electron beam and processes the substrate with the electron beam is disclosed. The substrate processing apparatus includes an electron beam generation mechanism which generates the electron beam, first area having a plurality of first static electricity deflecting devices... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080067427 - Via-hole processing method: In a via-hole formation method of forming a via-hole reaching a bonding pad, in a substrate of a wafer in which a plurality of devices are formed on a surface of the substrate and the bonding pad is formed on each of the devices, a pulse laser beam whose energy... Agent: Greer, Burns & Crain

20080067443 - Apparatus for preparing cross-sectional specimen using ion beam: There is disclosed a cross-sectional specimen preparation apparatus. The milling position can be modified or corrected in a short time. Also, the internal structure of the specimen can be known. The apparatus has an optical observation device for observing a cross section of the specimen milled by the ion beam.... Agent: The Webb Law Firm, P.C.

20080067442 - Beam angle adjustment in ion implanters: A steering component is included in an ion implantation system to direct or “steer” an ion beam to a scan vertex of a scanning component downstream of the steering component. In this manner, the scan vertex of the scanning component coincides with the focal point of a parallelizing component downstream... Agent: Thomas G. Eschweiler Eschweiler & Associates, LLC

20080067435 - Beam tuning with automatic magnet pole rotation for ion implanters: An ion implantation apparatus, system, and method for controlling an ion beam, wherein a mass analyzer generally positioned between an ion source and an end station is configured to selectively control a path of a desired ion beam. The mass analyzer comprises one or more of an entrance pole mechanism... Agent: Eschweiler & Associates, LLC National City Bank Building

20080067437 - Charged beam processing apparatus: A charged beam processing apparatus including a multi charged beam optical system which converges a plurality of charged beams by a lens and deflects the plurality of charged beams by a deflector to irradiate an object to be processed in a processing chamber, and a supply unit which supplies a... Agent: Fitzpatrick Cella Harper & Scinto

20080067441 - Charged-particle beam lithography with grid matching for correction of beam shot position deviation: A charged-particle beam pattern writing apparatus includes an electric field intensity calculator unit which operates to calculate an electric field intensity of another region different from a specified region of a workpiece due to electrical charge to be electrified by irradiation of a charged particle beam to the specified region,... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080067438 - Dose uniformity correction technique: Non uniform ion implantations in a pendulum type of ion implantation are mitigated by adjusting movement of a wafer according to a corresponding non uniform function. More particularly, a non uniform ion implantation function is obtained by measuring and/or modeling ion implantations. Then, movement of a wafer along a second... Agent: Thomas G. Eschweiler Eschweiler & Associates, LLC

20080067445 - Focused ion beam apparatus: A high-voltage power supply controller lowers an extraction voltage applied to an extraction electrode or lowers a control voltage applied to a control electrode to set an emission to 0 μA when a column valve is closed. The high-voltage power supply controller returns the extraction voltage applied to the extraction... Agent: Crowell & Moring LLP Intellectual Property Group

20080067432 - High-temperature ion implantation apparatus and methods of fabricating semiconductor devices using high-temperature ion implantation: A semiconductor device fabrication apparatus includes a load lock chamber, a loading assembly in the load lock chamber, and an ion implantation target chamber that is hermetically connected to the load lock chamber. The load lock chamber is configured to store a plurality of wafer plates. Each wafer plate respectively... Agent: Myers Bigel Sibley & Sajovec

20080067444 - Ion beam scanning control methods and systems for ion implantation uniformity: One embodiment of the invention relates to a method for adjusting the ribbon beam flux of a scanned ion beam. In this method, an ion beam is scanned at a scan rate, and a plurality of dynamic beam profiles are measured as the ion beam is scanned. A corrected scan... Agent: Eschweiler & Associates, LLC National City Bank Building

20080067434 - Non-uniform ion implantation: A method includes receiving an input signal representative of a desired two-dimensional non-uniform dose pattern for a front surface of a workpiece, driving the workpiece relative to an ion beam to distribute the ion beam across the front surface of the workpiece, and controlling at least one parameter of an... Agent: Varian Semiconductor Equipment Assc., Inc.

20080067433 - System and method of ion beam control in response to a beam glitch: The present invention is directed to a switch circuit and method to quickly enable or disable the ion beam to a wafer within an ion implantation system. The beam control technique may be applied to wafer doping repaint and duty factor reduction. The circuit and method may be used to... Agent: Eschweiler & Associates, LLC National City Bank Building

20080067436 - System for magnetic scanning and correction of an ion beam: A magnetic scanner employs constant magnetic fields to mitigate zero field effects. The scanner includes an upper pole piece and a lower pole piece that generate an oscillatory time varying magnetic field across a path of an ion beam and deflect the ion beam in a scan direction. A set... Agent: Eschweiler & Associates, LLC National City Bank Building

20080067440 - Machining of microstructures: There are disclosed methods for machining components, such as thermocouples 280 or SQUIDs 330, using ion beam milling. Ion beam milling is performed on a material 200 to expose a sliver 240. A sharp probe 161 is then attached to the sliver 240, for example by deposition of a tungsten... Agent: Intellectual Property Dept. Dewitt Ross & Stevens Sc

20080067439 - Plasma doping method and plasma doping apparatus: A plasma doping method, even though a plasma doping treatment is repeated, can make a dose from a film to a silicon substrate uniform for each time. The method includes preparing a vacuum chamber having a film containing an impurity formed on an inner wall thereof such that, when the... Agent: Mcdermott Will & Emery LLP

20080067446 - Method for electron beam proximity effect correction: Optimized dose assignments are determined for each portion of a layout by utilizing an improved proximity function and additional dose correction functions in performing a short range proximity effect correction. The optimized dose assignments are determined to minimize critical dimension (CD) deviations and maintain CD linearity across different feature sizes.... Agent: Murabito, Hao & Barnes, LLP

20080067447 - Standard component for calibration and calibration method using it and electro beam system: The positions of diffraction gratings used for calibration can be checked easily by arranging marks near the diffraction gratings, the marks indicating the coordinate positions of the diffraction gratings. Dummy patterns including a pattern of cross marks are arranged around the array of the diffraction gratings. Consequently, a uniform diffraction... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080067430 - Non-ambipolar radio-frequency plasma electron source and systems and methods for generating electron beams: An electron generating device extracts electrons, through an electron sheath, from plasma produced using RF fields. The electron sheath is located near a grounded ring at one end of a negatively biased conducting surface, which is normally a cylinder. Extracted electrons pass through the grounded ring in the presence of... Agent: Lathrop & Clark LLP

20080067431 - Pattern writing apparatus using charged particle beam, and program-recorded readable recording medium: A charged particle beam pattern writing apparatus includes an input part for inputting a predetermined command, a check part for checking a state of a predetermined function used for pattern writing using a charged particle beam, based on the predetermined command, and an output part for outputting the state of... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080067449 - Multiple beam path particle source: An improved particle beam treatment system optionally includes exchangeable particle beam nozzles. These particle beam nozzles may be automatically moved from a storage location to a particle beam path or between particle beam paths for use in medical applications. Movement may be achieved using a conveyance, gantry, rail system, or... Agent: Carr & Ferrell LLP (varian)

20080067448 - Particle beam nozzle transport system: An improved particle beam treatment system optionally includes exchangeable particle beam nozzles. These particle beam nozzles may be automatically moved from a storage location to a particle beam path or between particle beam paths for use in medical applications. Movement may be achieved using a conveyance, gantry, rail system, or... Agent: Carr & Ferrell LLP (varian)

20080067450 - Particle beam system including exchangeable particle beam nozzle: An improved particle beam treatment system optionally includes exchangeable particle beam nozzles. These particle beam nozzles may be automatically moved from a storage location to a particle beam path or between particle beam paths for use in medical applications. Movement may be achieved using a conveyance, gantry, rail system, or... Agent: Carr & Ferrell LLP (varian)

20080067452 - Device and method for outputting charged particle beam: The present invention improves the accuracy of therapy by checking in real time whether an spread-out Bragg peak (SOBP) width agrees with a desired width during irradiation with a beam. The device for outputting a charged particle beam includes a charged particle beam generator 1 including a synchrotron 4; a... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080067451 - Particle beam nozzle: An improved particle beam treatment system optionally includes exchangeable particle beam nozzles. These particle beam nozzles may be automatically moved from a storage location to a particle beam path or between particle beam paths for use in medical applications. Movement may be achieved using a conveyance, gantry, rail system, or... Agent: Carr & Ferrell LLP (varian)

20080067456 - Arrangement for generating extreme ultraviolet radiation from a plasma generated by an energy beam with high conversion efficiency and minimum contamination: The invention is directed to an arrangement for generating extreme ultraviolet radiation from a plasma generated by an energy beam with high conversion efficiency, particularly for application in radiation sources for EUV lithography. It is the object of the invention to find a novel possibility for generating EUV radiation by... Agent: Reed Smith, LLP Attn: Patent Records Department

20080067454 - Contamination barrier and lithographic apparatus: A rotatable contamination barrier is disclosed. The barrier includes a plurality of closely packed blades for trapping contaminant material coming from an EUV radiation source. The blades are oriented radially relative to a central rotation axis of the contamination barrier. The contamination barrier is segmented in an inner segment and... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080067455 - Hand held magnetic induction thermography system: A hand-held thermography system (8). A generator (10) supplies current to a transformer (15) in a handle (16). An induction coil (20) connected to the transformer (15) extends from the handle (16). The induction coil (20) induces eddy currents in a test object (50), producing a thermal topography on a... Agent: Siemens Corporation Intellectual Property Department

20080067453 - Radiation generating device, lithographic apparatus, device manufacturing method and device manufactured thereby: An apparatus for producing radiation by an electrically operated discharge has a first electrode, a second electrode. and a capacitor bank. The electrodes are configured at a distance from each other which allows plasma ignition. The capacitor bank is electrically connected at a first terminal to the first electrode and... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080067457 - Patient bed having a docking collimator assembly: A patient bed is provided having an elevation mechanism resting on a platform and a collimator assembly, where the weight of the collimator assembly is selectively supported by one of the combination of the elevation mechanism and the platform when there is no patient laying on a mattress of the... Agent: Siemens Corporation Intellectual Property Department

20080061215 - Device for correcting output of optical pickup: The present invention aims to obtain an accurate focus error signal without offset even when a zero-dimensional light leaks in. Light receiving elements for receiving a + one-dimensional light divided into four are arranged in the vicinity of a light receiving part for receiving the zero-dimensional light. Some light receiving... Agent: Osha Liang L.L.P.

20080061216 - Solid-state imaging device: The solid-state imaging device includes: a photoelectric transducer PD which converts incident light to charges; a voltage level detection circuit 50 in which pixel units 10an1 and 10bn1, each having a voltage conversion amplifying transistor Q13a which outputs a voltage by converting the charges accumulated in the photoelectric transducer PD,... Agent: Greenblum & Bernstein, P.L.C

20080061218 - Image sensor, module and electronic device: From an amplifier circuit of a plurality of pixels each, a signal is directly output to a signal line. Even if the signal line is longer and the signal line has an increased parasitic capacitance, attenuation of the signal transmitted through the signal line can be prevented. Therefore, the dynamic... Agent: Fish & Richardson P.C.

20080061217 - Wide-range linear output photo sensor circuit: A system and method for acquisition and conditioning of a signal received from a light sensor generating an input signal in proportion to a sensed amount of light, the system utilizing an operational amplifier with first and second feedback loops to render the output signal of a control circuit, part... Agent: David A. Novais Patent Legal Staff

20080061220 - Input apparatus and methods having multiple tracking modes: Input apparatus and methods are described. An object is illuminated with output light. Diffuse reflections of the output light from the object are captured. Diffuse reflection optical data is produced from the captured diffuse reflections. Specular reflections of the output light from the object are captured. Specular reflection optical data... Agent: Kathy Manke Avago Technologies Limited

20080061219 - Lift detection adapted for navigation on a transparent structure: A pointing device such as an optical mouse is equipped with a top surface lift detection system that is able to provide lift detection whether the pointing device sits on a transparent structure or on an opaque structure. The top surface lift detection system relies on the separate detection of... Agent: Kathy Manke Avago Technologies Limited

20080061221 - Device for detecting objects in a monitored area: A device is provided for detecting an object within a monitored area of a machine or installation. The device includes at least one sensor for detecting objects within the monitored area. At least one configuration module is fixedly connected to the machine or the installation. The configuration module includes configuration... Agent: Venable LLP

20080061222 - Electromagnetic sensor incorporating quantum confinement structures: A multispectral optical sensor incorporating quantum confinement devices is composed of a solid-state tunable filter, an optional lens, and a photodetector or plurality of photodetectors. The tunable filter is multilayered composite film of semiconducting materials, which includes a quantum well or other quantum confinement structure and barrier materials to ensure... Agent: Hensley Kim & Holzer, LLC

20080061223 - Universal x-ray fluorescence calibration technique for wire surface analysis: A method for calibrating a plurality of spectrometers for analysis of non-flat surfaces. Initially, a non-flat sample is analyzed by a first spectrometer which has previously been calibrated for flat sample analysis. The standard values for use in flat sample analysis have therefore previously been generated. Values generated by the... Agent: Fay Sharpe / Lincoln

20080061224 - Method for correcting biparametric spectra: This invention relates to the field of signal processing, in particular x-ray or gamma-ray spectrometry. It relates to a method as well as a device for improved processing making it possible to correct two-parameter spectra.... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080061225 - Logging tool for determination of formation density (embodiments): An apparatus for investigating underground formations surrounding a borehole, comprises a tool body; a common gamma ray source mounted in the tool body and which, when the apparatus is positioned in a borehole, provides axi-symmetric distribution of gamma rays so as to provide substantially complete circumferential irradiation of the formation... Agent: Schlumberger Reservoir Completions

20080061226 - Method of mass analysis and mass spectrometer: Mass analysis method and mass spectrometer in which the S/N of mass spectra does not deteriorate due to accumulation if an ionization method, such as MALDI, producing spectral intensities that are not uniform in time is employed. Every given number of collected mass spectra are accumulated and stored to produce... Agent: The Webb Law Firm, P.C.

20080061227 - Branched radio frequency multipole: Systems and methods of the invention include a branched radio frequency multipole configured to act, for example, as an ion guide. The branched radio frequency multipole comprises multiple ion channels through which ions can be alternatively directed. The branched radio frequency multipole is configured to control which of the multiple... Agent: Thermo Finnigan LLC

20080061228 - Systems and methods for beam angle adjustment in ion implanters: An ion implantation system employs a mass analyzer for both mass analysis and angle correction. An ion source generates an ion beam along a beam path. A mass analyzer is located downstream of the ion source that performs mass analysis and angle correction on the ion beam. A resolving aperture... Agent: Eschweiler & Associates, LLC National City Bank Building

20080061229 - Ion composition analyzer with increased dynamic range: A system and method for separating ions in an ion mixture, such as a plasma in space. The ion mixture enters an electrostatic analyzer, whose ion path has at least two sections. A first section applies a DC voltage to the ions, and a next section applies an RF frequency... Agent: Baker Botts L.L.P. Patent Department

20080061231 - Nanowire scanning probe microscopy probe for molecular recognition imaging: A scanning probe microscopy (SPM) probe functionalized for use in molecular recognition imaging comprises a cantilever element, a nanowire, a catalyst nanoparticle, a probe molecule and an elongate, flexible linking molecule. The cantilever element has a crystalline growth surface at one end. The nanowire extends substantially orthogonally from the growth... Agent: Agilent Technologies Inc.

20080061230 - Probe sensor with multi-dimensional optical grating: A displacement sensor employs an electromagnetic radiation source that generates a beam of electromagnetic radiation for measuring a feature of an object. The displacement sensor includes a displacement probe, a multi-dimensional diffraction grating and a plurality of photon detectors. A reflection surface, which is changed when the probe interacts with... Agent: Bryan W. Bockhop, Esq. Bockhop & Associates, LLC

20080061232 - Scanning probe microscope fine-movement mechanism and scanning probe microscope using same: An inching mechanism for a scanning probe microscope capable of performing measurement with high precision while enhancing the scanning speed by a probe furthermore, and a scanning probe microscope comprising it. The inching mechanism for a scanning probe microscope which is provided in a scanning probe microscope (SPM) (1) having... Agent: Brinks Hofer Gilson & Lione

20080061233 - Semiconductor inspection method and system therefor: A method for inspecting an electronic circuit of the invention uses a composite apparatus including an electron gun 2, an ion beam gun 1, and a secondary charged particle detector 4 to observe on a micro-scale contrast change on a sample surface in the case in which the surface of... Agent: Bruce L. Adams Adams & Wilks

20080061234 - Inspection apparatus and method: Provided is an apparatus for acquiring information about the interior of a sample non-destructively and with high resolution, determining pass/fail of the sample and shortening inspection time. A sample is irradiated with an electron beam or X-rays, fluorescent X-rays from the sample are converted using a zone plate and are... Agent: Young & Thompson

20080061235 - Detecting device based on a synthetic diamond: A detector that includes a sensing plate formed of a thin synthetic diamond plate is provided. The detector is characterized in that it includes means for heating the sensing plate. The heating means comprises a thin heating plate whose material is essentially constituted of carbon atoms. The invention also relates... Agent: Pauley Petersen & Erickson

20080061236 - Device for assisting in finding an article: An apparatus for assisting in finding an article such as a golf ball (2) includes a housing (3) containing a laser diode (4) for radiating an excitation beam (5) in the UV or IR bands. The apparatus has a receiving lens (9) for receiving a return beam (8) sent back... Agent: Beyer Weaver LLP

20080061237 - Microstructured infrared sensor: An infrared sensor having at least one measuring structure, which has, for example, a sensor chip having a measuring structure and a cap chip which is attached to the sensor chip and, together with the sensor chip, defines a sensor space; a screen having an internal screen area and an... Agent: Kenyon & Kenyon LLP

20080061238 - Breath analyzer: A system for the detection and analysis of at least one volatile substance in breath samples of a subject, including at least one source of infrared radiation adapted to the wavelength range of specific absorption peaks of said substances, a plurality of reflecting surfaces of said radiation adapted for collimation... Agent: Brinks Hofer Gilson & Lione

20080061239 - Non-invasive active infrared triggering device to monitor amphibian and other animal life in aqueous environments: A non-invasive active infrared device monitors amphibians and other animals in aqueous environments. An infrared emitter circuit and an infrared detector circuit are secured in a horizontal orientation with respect to each other in a u-shaped Plexiglas structure. A combination of variable resistors, a focusing lens, and a funnel allows... Agent: Marta Levesque Bryan

20080061240 - Testing the intergrity of products in containers: In order to test the integrity of products in containers, several characteristics of the products are detected with physical measuring methods and a good-bad signal is produced on the basis of the measuring results, for which purpose several of the measuring results are placed in relation to each other, which... Agent: Drinker Biddle & Reath LLP Attn: Patent Docket Dept.

20080061241 - Medical imaging unit: A medical imaging unit is provided. The medical imaging unit include a tomography device for 3D imaging and a PET system for positron emission tomography. The PET system includes a detector ring that has an angular region that is without detector elements.... Agent: Brinks Hofer Gilson & Lione

20080061242 - Multi-modality imaging systems in radical medicine and methods of using the same: A radical imaging system for use in radical medicine using a movable pallet for moving the patient during radical imaging. With the movable pallet, the patient can be moved, such as rotated to a position such that signal attenuation and scattering can be decreased. The imaging system may also incorporate... Agent: Siemens Corporation Intellectual Property Department

20080061244 - Asymmetric annular detector: An assembly for a detection unit for an optical device is described. The assembly includes a scintillator adapted to received secondary particles and, in response, generate photons, wherein the scintillator includes an opening for trespassing of a primary beam through the scintillator. The scintillator including the opening is asymmetrical with... Agent: Patterson & Sheridan, L.L.P.

20080061243 - Radiation detector having a fiber optic wedge with a plurality of parallel fibers: A radiation detector having a fiber optic wedge with a plurality of parallel optical fibers is provided for yielding a more cost-effective radiation detector by reading out more scintillator elements or crystals per photodetector surface area. The fiber optic wedge provides a cost efficient method for increasing the number of... Agent: Siemens Corporation Intellectual Property Department

20080061245 - Dosimetry device for charged particle radiation: A dosimetry device for charged particle radiation that can be exclusive of cables and connectors between substrates is provided. A plurality of first electrodes are formed on one surface of a printed circuit board, a second electrode substrate having a second electrode opposing each of the plurality of first electrodes... Agent: Buchanan, Ingersoll & Rooney PC

20080061246 - Apparatus for blanking a charged particle beam: A beam blanking unit (1) comprises first and second blanking plates (2, 3) mounted to a support plate (15). A stopper (4) is mechanically and electrically connected to the first blanking plate (2).... Agent: Ware Fressola Van Der Sluys & Adolphson, LLP

20080061247 - Lithography system: A maskless lithography system for transferring a pattern onto the surface of a target. At least one beam generator for generating a plurality of beamlets. A plurality of modulators modulate the magnitude of a beamlet, and a control unit controls of the modulators. The control unit generates and delivers pattern... Agent: Blakely Sokoloff Taylor & Zafman

20080061248 - High refractive index fluids for immersion lithography: Provided are compositions suitable for use as immersion liquids in immersion lithography, and immersion lithography processes and apparatus for using the compositions.... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center

20080061249 - High resolution low dose transmission electron microscopy real-time imaging and manipulation of nano-scale objects in the electron beam: The present invention includes a method, apparatus and system for nanofabrication in which one or more target molecules are identified for manipulation with an electron beam and the one or more target molecules are manipulated with the electron beam to produce new useful materials.... Agent: Chalker Flores, LLP

20080061250 - Ion beam monitoring in an ion implanter using an imaging device: An image monitor system monitors characteristics of an ion beam employed in ion implantation. The monitored characteristics can include particle count, particle information, beam current intensity, beam shape, and the like. The system includes one or more image sensors that capture frames or images along a beam path of an... Agent: Eschweiler & Associates, LLC National City Bank Building

20080061251 - Ion beams in an ion implanter: The present invention relates to a method of tuning an ion beam in an ion implanter such as may be used in the manufacture of semiconductor devices. There are many operational parameters associated with operation of the ion implanter that influence the ion beam that reaches the wafer. Controlling these... Agent: Applied Materials, Inc.

20080061252 - Disinfecting device utilizing ultraviolet radiation: A disinfecting device is presented having a UV light source for radiation of a cleaning medium to eradicate the medium of infestation agents such as molds, viuses, bacteria and dust mites. The device enhances the disinfection of the medium by providing mechanisms for enhanced penetration of the UV light into... Agent: Crutsinger & Booth

20080061253 - Electromagnetic radiation transformation for power transports: Electromagnetic radiation transformation for power transports is described. In embodiment(s), a power conducting system can include a power transport such as a conduit or power line that conducts power which is a source of electromagnetic radiation. The power conducting system can also include a paramagnetic material in a quantity sufficient... Agent: Sadler, Breen, Morasch & Colby, P.s.

20080061254 - Utilizing reflective substrates and patterned filters for security and authentication: In accordance with the invention, a sensor system includes an illumination source for outputting illumination. Furthermore, the sensor system also includes an imager for receiving the illumination reflected from a target utilized for authentication. It is noted that the target includes a patterned filter and a reflective substrate.... Agent: Agilent Technologies Inc.

20080061255 - Wafer aligning apparatus of a semiconductor manufacturing device: Example embodiments relate to a wafer aligning apparatus and a method thereof. The wafer aligning apparatus may include a first light sensor unit adapted to output light to an edge of a wafer, a second light sensor unit adapted to output light on a marking position of the wafer, and... Agent: Lee & Morse, P.C.

20080054155 - Lens adjustment assembly employing an electrically active polymer: A lens assembly and method of adjusting a lens assembly using an electrically active polymer element. The assembly comprises a lens; a pixel array for receiving an image through said lens via an optical path; a moveable element for changing the optical properties of said optical path; and at least... Agent: Dickstein Shapiro LLP

20080054156 - System and method for utilizing an autofocus feature in an automated microscope: The invention relates to a method for adjusting focus in an automated microscope. The method may comprise the steps of: providing an optical detector for image acquisition, wherein the optical detector comprises an array of sensor pixels; designating a region of interest in the array of sensor pixels to emulate... Agent: Ge Healthcare Bio-sciences Corp. Patent Department

20080054157 - Photodetector: A photodetector to be incorporated in an optical pickup device, comprising: a photodiode that a laser light emitted from a laser diode is applied to and that outputs a signal corresponding to light amount of the laser light; and a translucent resin member configured to cover the photodiode, including a... Agent: Fish & Richardson P.C.

20080054158 - Tracking a moving object from a camera on a moving platform: A method to dynamically stabilize a target image formed on an image plane of an imaging device located in a moving vehicle. The method includes setting an origin in the image plane of the imaging device at an intersection of a first axis, a second axis and a third axis,... Agent: Honeywell International Inc.

20080054159 - Ambient light processing system for controlling display device by sensing ambient light and method using the system: An ambient light processing system for controlling a display device by sensing ambient light and a method using the system. The ambient light processing system includes a photo-detector, an amplification unit an analog-to-digital converter and a controller. The photo-detector outputs a sensed signal corresponding to the luminous intensity of the... Agent: F. Chau & Associates, LLC

20080054160 - Compact optical delay devices: Optical devices and techniques for using optical polarization of light to transmit through an optical path four times to quadruple a total delay in the light through the optical path.... Agent: Fish & Richardson, PC

20080054161 - Image sensing system for a vehicle: An automatic exterior light control includes an image array sensor and a controller. The image array sensor includes an array of pixel sensors, and is configured and mounted such that a field of view of the image array sensor substantially passes through an associated windshield area that is wiped by... Agent: Van Dyke, Gardner, Linn & Burkhart, LLP

20080054162 - Optical semiconductor device and optical pickup device: An optical semiconductor device of the present invention includes: a light-receiving element which converts light into an electric signal; an amplifier circuit having an input terminal to which the light-receiving element is connected, and which amplifies the electric signal; a connection wire to which the signal amplified by the amplifier... Agent: Greenblum & Bernstein, P.L.C

20080054164 - Method, apparatus and system to reduce readout delay in a sensor: Methods, devices, and systems for improving (i.e., reducing) the settling time of an output signal read from a photo sensor and improving the PSRR of the supply voltage are disclosed, wherein a detected charge in a pixel is converted to a voltage and drives a source follower transistor. A bias... Agent: Trask Britt

20080054165 - Photoelectric-conversion apparatus and image-pickup system: A photoelectric-conversion apparatus includes a photoelectric-conversion area where a plurality of photoelectric-conversion elements configured to convert incident light into electrical charges, a plurality of floating-diffusion areas, a plurality of transfer-MOS transistors configured to transfer electrical charges of the photoelectric-conversion element to the floating-diffusion area, and a plurality of amplification-MOS transistors... Agent: Fitzpatrick Cella Harper & Scinto

20080054163 - Logarithmic-compression analog-digital conversion circuit and semiconductor photosensor device: A logarithmic-compression analog-digital conversion circuit, includes: a logarithmic amplifier; and a converter. The logarithmic amplifier is configured to logarithmically convert an input current to a voltage using forward characteristics of a p-n junction, and configured to output the voltage. The converter is configured to output a digital signal based on... Agent: Amin, Turocy & Calvin, LLP

20080054166 - Detachably coupled image intensifier and image sensor: A detachably coupled image intensifier and image sensor combination is disclosed along with systems and methods for using the detachably coupled image intensifier and image sensor combination. In one embodiment, there are at least two fiber optic plates aligned between the image intensifier and image sensor, and an oil or... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080054168 - Near-field scanning optical microscope probe having a light emitting diode: An improved near-field scanning optical microscope probe is disclosed. The near-field scanning optical microscope probe includes a probe body and two electrodes extending from the probe body to form a probe tip. In addition, a light-emitting diode is disposed between the two electrodes at the probe tip to act as... Agent: Dillon & Yudell LLP

20080054167 - Photoelectric encoder and electronic equipment using the same: In the photoelectric encoder of the invention, as a light passing zone PZ of a movable object 21 travels by one pitch P, an output signal OUT2 of a second logical operation unit 26b comes to be delayed in phase by 45° with respect to an output signal OUT1 of... Agent: Birch Stewart Kolasch & Birch

20080054169 - Optical encoder: An optical encoder has subtracters serving as signal processing circuits, adders serving as an arithmetic processing section, comparators serving as an A/D converting section, exclusive-or circuits, and output circuits as a digital signal section. Two signals, A1+ and A1−, different in phase by 180 degrees from each other are input... Agent: Birch Stewart Kolasch & Birch

20080054170 - Optical encoder and electronic equipment using the same: An optical encoder is comprised of three component parts, which are an emission-side light-pervious resin 6 by which a light emitting chip 1 is sealed, a reception-side light-pervious resin 8 by which a light receiving chip 2 is sealed, and an outer casing 4 to which a lens 3 is... Agent: Birch Stewart Kolasch & Birch

20080054172 - Gas monitoring apparatus and gas monitoring method: A gas monitoring apparatus capable of real-time detection of a kind of chemical warfare agent, namely diphenylcyanoarsine (DC) and/or diphenylchloroarsine (DA). Atmospheric pressure chemical ionization mass spectrometry is carried out in the positive ionization mode, the total amount of DC and DA is determined from the intensity of an ion... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080054171 - Target for laser desorption/ionisation mass spectrometry: The invention relates to a target for a laser desorption/ionisation mass spectrometer, comprising a substrate that is at least partially coated with a carbon-containing layer comprising a material selected from the group consisting of diamond, amorphous carbon, DLC (diamond-like carbon), graphite, nanotubes, nanowires, fullerenes and mixtures thereof.... Agent: Lerner Greenberg Stemer LLP

20080054173 - Ion trap mass spectrometry method: According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the... Agent: Mcdermott Will & Emery LLP

20080054174 - Ion mobility spectrometer: An ion mobility spectrometer is described having an ion filter in the form of multiple parallel ion channels defined by conductive layers separated by non-conductive layers. A time-varying electric potential applied to the conductive layers allows the filter to selectively admit ion species. The device may be used without a... Agent: Fish & Richardson PC

20080054175 - Systems and methods for correcting for unequal ion distribution across a multi-channel tof detector: Systems and methods for calculating ion flux. In one embodiment, a mass spectrometer includes an ion source for emitting a beam of ions from a sample and at least one detector positioned downstream of said ion source. The at least one detector comprises a plurality of detector channels. The mass... Agent: Bereskin And Parr

20080054176 - Ionization method and apparatus for mass analysis: A laser spray method exhibiting a high detection sensitivity when applied to mass analysis has its sensitivity raised further. In a laser spray method of ionizing a liquid sample by irradiating, with a laser beam, the end of a capillary into which the sample has been introduced, use is made... Agent: Dickstein Shapiro LLP

20080054177 - Direct flow injection analysis nebulization electrospray and apci mass spectrometry: A method and apparatus for Flow Injection Analysis (FIA) into Atmospheric Pressure Ion sources (API) including Electrospray (ES) and Atmospheric Pressure Chemical Ionization (APCI) sources whereby the sampling and spray needles are one and the same. The sampling and spray needle configured with an autoinjector apparatus or used in manual... Agent: Levisohn, Berger , LLP

20080054178 - Ion funnel with extended mass range and reduced conductance limit aperture: An improved ion funnel design is disclosed that decreases the axial RF (parasite) fields at the ion funnel exit. This is achieved by addition of one or more compensation electrodes after the conductance limit electrode. Various RF voltage profiles may be applied to the various electrodes minimizing the parasite axial... Agent: Battelle Memorial Institute Attn:IPServices, K1-53

20080054179 - Method of fabricating sample membranes for transmission electron microscopy analysis: A method of fabricating sample lamella for transmission electron microscopy (TEM) analysis is provided. A waiting-examination sample having an analysis target on the top surface of that is offered, and at least a mark around the analysis target is defined. A covering layer is covered on the top surface of... Agent: Jianq Chyun Intellectual Property Office

20080054180 - Apparatus and method of detecting secondary electrons: A charged particle beam column package includes an assembly (e.g., comprising a plurality of layers, which can have a component coupled to one of the layers), and a solid state detector coupled to the assembly. Further, at least one of the layers has interconnects thereon.... Agent: Thelen Reid Brown Raysman & Steiner LLP

20080054181 - Scintillator plate, manufacturing method of the same and radiation image sensor: A scintillator plate comprising: (i) a radiation transmissive substrate; (ii) a light absorbing layer formed on the substrate, the light absorbing layer absorbing light of a prescribed wavelength range; and (iii) a scintillator layer formed on the light absorbing layer, the scintillator layer converting radiation to the light having a... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080054182 - Electronic cassette type of radiation detection apparatus: An electronic cassette type of radiation detection apparatus having a sensor array including a plurality of sensors for detecting incident radiation has a connecting portion to which detachable additional function modules are connected. A selection unit is provided for changing a radiographing mode from a still image radiographing mode and... Agent: Fitzpatrick Cella Harper & Scinto

20080054183 - Scintillator panel: An objective is to provide a scintillator panel by which a converted light signal can be efficiently transmitted to suitably realize an FPD exhibiting a high radiation-to-light conversion efficiency. Also provided is a scintillator panel possessing a substrate and provided thereon, a phosphor layer possessing columnar crystals made of cesium... Agent: Lucas & Mercanti, LLP

20080054187 - Charged particle beam scanning method and charged particle beam apparatus: A method and an apparatus for calculating a scan signal so that the scan region becomes a scan region which is based on magnification ratio between desired magnification in a scan-line interval direction and desired magnification in a scan-line direction, and performing a calculation for rotating the scan direction with... Agent: Mcdermott Will & Emery LLP

20080054186 - Method of aberration correction and electron beam system: There is disclosed an electron beam system in which the third-order aberration S3 with two-fold symmetry is corrected. If a Cs corrector is operated, parasitic aberration S3 (third-order aberration S3 with two-fold symmetry) is produced. A corrective third-order aberration S3′ with two-fold symmetry that cancels out the parasitic aberration S3... Agent: The Webb Law Firm, P.C.

20080054185 - D/a conversion device and method and charged particle beam exposure apparatus and method: The present invention is related to a D/A conversion device, it is provided with a first D/A conversion circuit which receives input of digital data composed of plural bits and outputs a corresponding electric output signal, and a second D/A conversion circuit which receives input of a correction code for... Agent: Muramatsu & Associates

20080054184 - Particle-optical systems and arrangements and particle-optical components for such systems and arrangements: An electron-optical arrangement provides a primary beam path for a beam of primary electrons and a secondary beam path for secondary electrons. The electron-optical arrangement includes a magnet arrangement having first, second and third magnetic field regions. The first magnetic field region is traversed by the primary beam path and... Agent: Jones Day

20080054188 - Electron beam lithography apparatus and method for compensating for electron beam misalignment: Linear movement direction of the stage and the actual deflection direction of the electron beam deflected by the first command signal for deflecting the electron beam in the linear movement direction of the stage do not necessarily align with each other for reasons such as the disposition precision of the... Agent: Sughrue Mion, PLLC

20080054189 - Lithographic apparatus and device manufacturing method: A lithographic apparatus includes a radiation source configured to emit radiation to form a radiation beam, the radiation being of a type which can create plasma in a low pressure environment in the apparatus, and an optical component configured to condition the radiation beam, impart the conditioned radiation beam with... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080054190 - Radiation pulse energy control system, lithographic apparatus and device manufacturing method: A system for controlling the energy of radiation pulses. A detector monitors energy of the pulses and an optical shutter trims the radiation pulses after a suitable optical delay line. The accuracy of the control of the energy of the radiation pulses can be improved by matching a rate of... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20080054191 - Novel wafer repair method using direct-writing: A method of wafer repairing comprises identifying locations and patterns of defective regions in a semiconductor wafer; communicating the locations and patterns of defective regions to a direct-writing tool; forming a photoresist layer on the semiconductor wafer; locally exposing the photoresist layer within the defective regions using an energy beam;... Agent: Haynes And Boone, LLP

20080054194 - Ion implanter with etch prevention member(s): An apparatus and method of doping ions into a substrate are disclosed and include a process chamber having an inner space in which an ion implantation process is performed, a support unit positioned in the process chamber, supporting a substrate and being electrically connected to a first power source for... Agent: Volentine & Whitt PLLC

20080054193 - Ion beam guide tube: The present invention relates to a guide tube for an ion beam in an ion implanter located adjacent a semiconductor wafer. Such guide tubes are provided to confine charged particles used for wafer neutralisation during implantation. According to the invention, a guide tube comprises an axis, open ends to receive... Agent: Applied Materials, Inc.

20080054192 - Ion implantation device: An ion implantation device that suppresses diffusion of an ion beam, can finely control a scanning waveform, and can obtain a large scanning angle of about 10°. In the ion implantation device, first, second, and third chambers are arranged in predetermined places on a beam line, first and second gaps... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080054195 - Substrate cover, and charged particle beam writing apparatus and method: A substrate cover includes a frame-like member configured to be placed on a substrate which is to be written using a charged particle beam, and to have an outer perimeter dimension larger than a perimeter end of the substrate and an inner perimeter dimension, being a border between the frame-like... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080054196 - Variable shaped electron beam lithography system and method for manufacturing substrate: This VSB lithography system includes a first, second and third aperture for forming a single electron beam in each of the rectangular opening portion that are provided, and draws a figure pattern using the single electron beam formed by passing the beam through the first, second and third aperture in... Agent: Scully Scott Murphy & Presser, PC

20080054197 - Substrate holding apparatus, and inspection or processing apparatus: In order to enable high accuracy positioning and strong pressing of a substrate, the present invention provides a substrate holding apparatus including: a rotating bed having an inclined surface supporting a lower side of an outer circumferential side surface of the substrate, which bed rotates on a normal line of... Agent: Mcdermott Will & Emery LLP

20080054199 - Apparatus and method for reading out storage phosphor plates: An apparatus for reading out storage phosphor plates (2) for storing X-ray information with one or more rotating conveyance rolls (11 to 14) for conveying the storage phosphor plate (2), an alignment edge (19, 22) to which the storage phosphor plate (2) can be aligned, and a read-out device for... Agent: Houston Eliseeva

20080054198 - Method and apparatus for processing and reading-out storage phosphor plates: A method and to a corresponding apparatus for processing information carriers, in particular for reading out storage phosphor plates (2) for storing X-ray information, an information carrier (2) and/or a container (1) in which the information carrier (2) is located being processed, in particular being moved and/or fixed, by at... Agent: Houston Eliseeva

20080054200 - Storage phosphor layer and system and method for erasing same: An apparatus (1) for erasing a storage phosphor layer (2) includes a drive (5) for producing a relative movement between the storage phosphor layer (2) and the radiation source (8), the storage phosphor layer (2) lying or being moved in a holding plane (7), and a reflector (11) for reflecting... Agent: Houston Eliseeva

20080054201 - Storage phosphor layer and system and method for erasing same: An apparatus (1) for erasing a storage phosphor layer (2) includes a radiation source (8) for producing and emitting erasing radiation, a drive (5) for producing a relative movement between the storage phosphor layer (2) and the radiation source (8), the storage phosphor layer (2) lying or being moved in... Agent: Houston Eliseeva

20080054202 - Storage phosphor layer and system and method for erasing same: An apparatus (1) for erasing a storage phosphor layer (2) with a holding plane (7) in which the storage phosphor layer (2) lies or can be moved, a radiation source (8, 9, 10) for irradiating the storage phosphor layer (2) with erasing radiation which is suitable for erasing the storage... Agent: Houston Eliseeva