Radiant energy inventions 08/07

20070200051 - Focusing device, focusing method and a pattern inspecting apparatus: A focusing device comprises a first imaging optical system, a second imaging optical system which splits the optical image in the direction of an AF sensor and further splits the optical image so that a front focus image in which the point that is in focus is in front of... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070200052 - Apparatus, microscope with an apparatus, and method for calibration of a photosensor chip: An apparatus, a microscope having an apparatus, and a method for calibration of a photosensor chip (19) are disclosed. The apparatus has a photosensor chip (19) which has a multiplicity of light-sensitive elements. A reference light source (30) is provided and directs the light at at least one part of... Agent: Foley And Lardner LLP Suite 500

20070200053 - Image pickup apparatus, camera module, electronic device, and fabrication method for image pickup apparatus: An image pickup apparatus may include a wiring board; a frame member having a framework-like shape and disposed on the wiring board, an image pickup element disposed on the inner side of the frame member on the wiring board, and a transparent cover disposed on the frame member. The wiring... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20070200055 - Via wave guide with cone-like light concentrator for image sensing devices: A CMOS image sensor (CIS) device includes an array of pixels, each pixel including a sensing element (e.g., a photodiode) and access circuitry. To facilitate the passage of light to the photodiode, each pixel includes a via wave guide (VWG) defined in the metallization layer formed over the pixel's photodiode.... Agent: Bever Hoffman & Harms, LLP Tri-valley Office

20070200054 - Via wave guide with curved light concentrator for image sensing devices: A CMOS image sensor (CIS) device includes an array of pixels, each pixel including a sensing element (e.g., a photodiode) and access circuitry. To facilitate the passage of light to the photodiode, each pixel includes a via wave guide (VWG) defined in the metallization layer formed over the pixel's photodiode.... Agent: Bever Hoffman & Harms, LLP Tri-valley Office

20070200056 - Anti-reflection coated image sensor and manufacturing method thereof: An image sensor coated with an anti-reflection material having a microlens provided on a semiconductor substrate, the microlens corresponding to a light receiving device formed in the semiconductor substrate wherein the image sensor includes a first layer coated on a surface of the microlens, and a second layer coated on... Agent: F. Chau & Associates, LLC

20070200057 - Damage detection system: A damage detection system including: a optical fiber sensor including a core portion to have a grating portion formed therein, the grating portion having gratings reflecting light, wherein a wavelength band of the reflected light changes when a distance between adjacent gratings changes; a light source to input broadband light... Agent: Smith, Gambrell & Russell

20070200058 - Fluorescent phantom device: Described herein is a phantom device that simplifies usage, testing, and development of light imaging systems. The phantom device includes a body and a fluorescent light source internal to the body. The body comprises an optical material designed to at least partially resemble the optical behavior of mammalian tissue. The... Agent: Beyer Weaver LLP

20070200059 - Interface and process for enhanced transmission of non-circular ion beams between stages at unequal pressure: The invention discloses a new interface with non-circular conductance limit aperture(s) useful for effective transmission of non-circular ion beams between stages with different gas pressure. In particular, the invention provides an improved coupling of field asymmetric waveform ion mobility spectrometry (FAIMS) analyzers of planar or side-to-side geometry to downstream stages... Agent: Battelle Memorial Institute Attn:IPServices, K1-53

20070200060 - Pulsed internal lock mass for axis calibration: A method and apparatus for calibrating a mass spectrometry system in which lock mass ions are introduced into the transport region of a mass spectrometer intermittently in a pulsed manner and analyte ions and/or lock mass ions are then detected at the mass analyzer. In one embodiment, analyte ions are... Agent: Agilent Technologies Inc.

20070200061 - Quadrupole mass filter length selection: In this invention the technology is provided for rod shaped conductor member fabrication in situ, in position, in the mass filter spatial configuration by growth through vertically repeated conduit mold formations, filling the conduit increments with to be rod material, and coalescing the growth increments as the rod length is... Agent: Riddles, Alvin

20070200062 - Energy-filtering cathode lens microscopy instrument: An energy filtering microscopy instrument is provided. An objective lens is disposed for reception of electrons in order to form an electron diffraction pattern in a backfocal plane of the objective lens. An entrance aperture disposed in the backfocal plane of the objective lens for filtering a slice of the... Agent: Ryan, Mason & Lewis, LLP

20070200063 - Wafer-level testing of light-emitting resonant structures: A device for testing a light-emitting resonant structure on a wafer includes a vacuum chamber for holding the resonant structure; a source of charged particles; a electromagnetic radiation detector; a positioning mechanism constructed and adapted control the position of the wafer within the vacuum chamber; and a controller operatively connected... Agent: Davidson Berquist Jackson & Gowdey LLP

20070200064 - Active night vision thermal control system using wavelength-temperature characteristic of light source: A thermal control system (11) for a light source (46) of a vision system (10) includes a heater (63) that is thermally coupled to the light source (46). A thermal sensor (60) is thermally coupled to the light source (46) and generates a temperature signal. A controller (50) is coupled... Agent: Dickinson Wright PLLC

20070200065 - Monitoring system comprising infrared thermopile detector: The present invention relates to a semiconductor processing system that employs infrared-based thermopile detector for process control, by analyzing a material of interest, based on absorption of infrared light at a characteristic wavelength by such material. Specifically, an infrared light beam is transmitted through a linear transmission path from an... Agent: Intellectual Property / Technology Law

20070200066 - Emission-data-based photon scatter correction in computed nuclear imaging technology: An image from a gamma camera, e.g., from a radiopharmaceutical, is corrected for scatter. The image is approximated by estimating the center of the organ and supposing a Guassian response that is scatter-corrected.... Agent: Fish & Richardson, PC

20070200067 - Optical gas-detecting device: An optical gas-detecting device for measuring a concentration of a gas to be measured includes a light source for radiating ultraviolet rays, a detecting element for detecting the radiated ultraviolet rays, and a light path, through which the radiated ultraviolet rays pass from the light source to the detecting element.... Agent: Posz Law Group, PLC

20070200070 - Aberration-correcting cathode lens microscopy instrument: An aberration-correcting microscopy instrument is provided. The instrument has a first magnetic deflector disposed for reception of a first non-dispersed electron diffraction pattern. The first magnetic deflector is also configured for projection of a first energy dispersed electron diffraction pattern in an exit plane of the first magnetic deflector. The... Agent: Ryan, Mason & Lewis, LLP

20070200069 - Double stage charged particle beam energy width reduction system for charged particle beam system: The present invention relates to e.g. a charged particle beam energy width reduction system for a charged particle beam with a z-axis along the optical axis and a first and a second plane, comprising, a first element (110) acting in a focusing and dispersive manner, a second element (112) acting... Agent: Patterson & Sheridan, L.L.P.

20070200071 - Coupling output from a micro resonator to a plasmon transmission line: A device for coupling output from a resonant structure to a plasmon transmission line includes a transmission line formed adjacent at least one element of the light-emitting resonant structure; a detector microcircuit disposed adjacent to the transmission line and wherein a beam of charged particles electrically couples the a plasmon... Agent: Davidson Berquist Jackson & Gowdey LLP

20070200072 - Toothbrush sterilizer: A portable toothbrush sterilizer is provided. The portable toothbrush sterilizer includes a lower case (100a), an upper case (200a), a protective cap (500), and a cover (300a). The lower case (100a) has a sterilizer compartment (150) and a battery compartment (140). The upper case (200a) is coupled above the lower... Agent: Rabin & Berdo, PC

20070200073 - Polarisation fluorometer: A polarisation fluorometer and a method for calibrating such a fluorometer. The fluorometer includes an excitation channel with an excitation polariser for generating light polarised in a first plane or in a second plane to be conducted as a excitation light to a sample, an emission channel for conducting emission... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070200074 - Long life self-luminous microspheres: This invention relates to a means for more efficiently and more safely providing self-luminous lighting devices for use in signs, markers, indicators and the like. The present invention provides self luminosity by means of a plurality of glass or polymer microspheres containing both a light-emitting phosphor and a radioactive gas.... Agent: Tipton L. Randall

20070200075 - Ion beam current monitoring: An ion beam monitoring system includes a charge neutralization system and a sensor. The charge neutralization system is configured to provide a compensating current to control a charge on a front surface of a wafer. The sensor is configured to sense the compensating current and provide a sensor signal in... Agent: Varian Semiconductor Equipment Assc., Inc.

20070200076 - Position detecting apparatus and image processing apparatus provided with the same: There is provided a position detecting apparatus that has a high ability of detecting a correct position even if there is mechanical play in a moving mechanical member, a position of which is detected, and an image processing apparatus provided with the position detecting apparatus. In a position detecting apparatus... Agent: SocalIPLaw Group LLP

20070194206 - Confocal laser scanning microscope: A confocal laser scanning microscope acquires confocal images of a sample. The microscope is provided with an optical-microscope optical system which acquires non-confocal images of the sample by detecting measurement light coming from the sample. The optical-microscope optical system includes optical systems corresponding to at least two observation methods, and... Agent: Scully Scott Murphy & Presser, PC

20070194207 - Method and apparatus for wavefront measurement that resolves the 2-pi ambiguity in such measurement and adaptive optics systems utilizing same: An improved wavefront sensor for characterizing phase distortions in incident light including optical elements that spatially sample the incident light and form a dispersed spot with a fringe pattern corresponding to samples of the incident light. An imaging device captures an image of the dispersed spot with said fringe pattern... Agent: Thomas J. Perkowski, Esq., P.C. Soundview Plaza

20070194208 - Moisture sensor and windshield fog detector: A control system is disclosed for automatically detecting moisture on the windshield of a vehicle. The automatic moisture detecting system includes an optical system for imaging a portion of the windshield onto an image array sensor, such as a CMOS active pixel sensor. The voltage of each of the pixels... Agent: Price, Heneveld, Cooper, Dewitt, & Litton, LLP/gentex Corporation

20070194209 - Solid-state image sensor, manufacturing method for solid-state image sensor, and camera: A solid-state image sensor includes a plurality of light-receiving elements arranged in a light-receiving area, and a plurality of micro-lenses corresponding to the light-receiving elements, and has a flattening film formed on the plurality of the micro-lenses. At a center of the light-receiving area, the micro-lenses are placed in positions... Agent: Wenderoth, Lind & Ponack L.L.P.

20070194211 - Electro-optical device and electronic apparatus: An electro-optical device includes a substrate, a plurality of scanning lines, a plurality of data lines intersecting with the corresponding plurality of scanning lines in pixel areas on the substrate, a plurality of pixels arranged in the pixel areas so as to correspond to intersections of the plurality of scanning... Agent: Oliff & Berridge, PLC

20070194210 - Light emitting apparatus and control method thereof: A light emitting apparatus and control method are provided. The light emitting apparatus includes a light emitting part; a power supply which applies a voltage to the light emitting part; a switch which is connected in series with the light emitting part; and a controller which controls the power supply... Agent: Sughrue Mion, PLLC

20070194212 - Ambient light photodetector: There is provided an ambient light photodetector, comprising a substrate, and a buffer layer formed on the substrate, an absorption layer represented by AlxGa1−xAs where 0<×<1, formed on the buffer layer used for absorbing visible light; and a filter layer made of GaAs, formed on the absorption layer used for... Agent: Birch Stewart Kolasch & Birch

20070194213 - Layouts for the monolithic integration of cmos and deposited photonic active layers: Several detailed layout designs are disclosed, for the monolithic integration of avalanche devices in large arrays, that can be operated as Avalanche Photo-Diodes (APDs) or Avalanche Light Emitting Diodes (ALEDs) depending only on the applied bias conditions, which can be software-controlled from peripheral circuitry. If the deposited films have direct... Agent: Sturm & Fix LLP

20070194214 - High-speed measuring device and method based on a confocal microscopy principle: The invention relates to a measuring device and a method based on a confocal microscopy principle. The inventive device comprises a light source (1), a diaphragm unit (3) for limiting a beam, an imagine optical system (4) for focusing the light (5) which is irradiated by said source on a... Agent: Dykema Gossett PLLC

20070194215 - Directional input device with a light directing shaft: A directional input device with a light directing shaft that avoids wear and tear caused by physical contact between a shaft and a sensor surface. A directional input device according to the present teachings includes a light emitter and a shaft having a surface that reflects light from the light... Agent: Kathy Manke Avago Technologies Limited

20070194216 - Printable controls for a window assembly: A window integrated control for a vehicle. The system includes a window and a control integrated onto the window. The control may comprise conductive inks that are printed onto the window. The window may be a plastic panel, such as a multilayer polycarbonate panel. Further, the control may be in... Agent: Brinks Hofer Gilson & Lione

20070194217 - Semiconductor photosensor: w

20070194219 - Encoder, system and method for outputting a signal: An optical encoder, a system and a method for outputting a signal are provided. The optical encoder and the system have a shaft extending from an interior of a housing. A circuit board having a light emitting element and a light detector is connected to the housing. The light emitting... Agent: Patents+tms A Professional Corporation

20070194218 - System and method for re-synchronizing an access barrier with a barrier operator: A system for re-synchronizing an access barrier with a barrier operator comprises an access barrier, and a barrier operator to profile and monitor the manual and automatic movements of the access barrier. The barrier operator comprises a controller, a memory, a motor pivot encoder, and a counting encoder. The memory... Agent: Renner, Kenner, Greive, Bobak, Taylor & Weber

20070194220 - Angled ccd image capture device: A handheld imaging device includes a CCD array or similar detector which is tilted with respect to the incoming light. The tilt permits a narrower handheld device to be manufactured, as the housing need not be as wide as the CCD or similar array.... Agent: Kaplan Gilman Gibson & Dernier L.L.P.

20070194221 - Alpha track detector with foldable semicircle ring: This invention is a radon detector for measuring the time integral concentration of radon in air and the emission rate from various kind of materials. The detector is designed with a foldable semicircle ring (4) in order to install the detector at the heigh suggested from the specialist using thread... Agent: Brooks Kushman P.C.

20070194222 - Nuclear medical apparatus: A nuclear medical apparatus for obtaining a distribution of a radioisotope in a subject by administering to a subject a radioactive medicine labeled with a radioisotope, detecting gamma rays given off from the radioisotope in a gamma-ray detecting section and counting the detected gamma rays in a count section. A... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070194223 - Method and apparatus for time-of-flight mass spectrometry: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a... Agent: The Webb Law Firm, P.C.

20070194224 - Monolithic electrospray ionization emitters and methods of making same: Electrospray ionization (ESI) apparatuses and methods of making the same are disclosed. In one embodiment, an ESI emitter comprises a capillary tube filled with a porous monolithic material, wherein the end of the emitter is tapered and the tip of the tapered end comprises a protrusion of the porous monolithic... Agent: Battelle Memorial Institute Attn:IPServices, K1-53

20070194225 - Coherent electron junction scanning probe interference microscope, nanomanipulator and spectrometer with assembler and dna sequencing applications: The present invention is directed toward the fabrication and operation of a coherent electron quantum interferometer for scanning probe microscopy. The device may also be operated in a mode where single electrons are used in the sample probe. The device may operate in modes where scanning probe behavior, Kondo effect... Agent: Miguel D. Zorn

20070194228 - Charged particle beam device: The invention provides a charged particle beam device for irradiating a specimen, comprising a particle source for providing a beam of charged particles, an optical device for directing the beam of charged particles onto the specimen and an ozone unit for reducing the charging and/or contamination of the specimen. The... Agent: Patterson & Sheridan, L.L.P.

20070194226 - Ion sources, systems and methods: Ion sources, systems and methods are disclosed.... Agent: Fish & Richardson PC

20070194227 - Method of characterizing an ion beam: In one aspect, the present invention provides a method for characterizing a (scanned) ion beam pattern. In one embodiment, the method includes providing a semiconductor calibration wafer having a buried ion implanted region with a known profile, exposing the calibration wafer to the (scanned) ion beam to implant a dose... Agent: Nutter Mcclennen & Fish LLP

20070194230 - Inspection instrument of a magnetic specimen: An inspection technique capable of observing a magnetic domain configuration which is formed on a magnetic specimen surface with a higher resolution and at a higher speed as never before. The inspection technique includes an SPLEEM observation unit including a spin polarized electron source, an irradiation optics that projects a... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070194231 - Method and apparatus for displaying detected defects: Defect image display screens are capable of accurately presenting features of defects. On a thumbnail display screen of a defect, images likely to most clearly indicating features of the defect are determined in units of the defect from, for example, inspection information and a defect type, and then are displayed.... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070194235 - Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former: A substrate inspection apparatus 1-1 (FIG. 1) of the present invention performs the following steps of: carrying a substrate “S” to be inspected into an inspection chamber 23-1; maintaining a vacuum in said inspection chamber; isolating said inspection chamber from a vibration; moving successively said substrate by means of a... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070194229 - Method and apparatus for inspecting pattern defects and mirror electron projection type or multi-beam scanning type electron beam apparatus: The present invention provides a mirror electron projection (MPJ) type (SEPJ type included) scanning electron beam apparatus that is capable of performing condition setup, and a method and apparatus for inspecting pattern defects with the scanning electron beam apparatus. A mirror electron projection type defect inspection apparatus, which comprises a... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070194233 - Pattern inspection method, pattern inspection apparatus, semiconductor device manufacturing method, and program: A pattern inspection method includes: generating a charged particle beam to irradiate the charged particle beam to a sample having a surface on which a pattern to be inspected is formed; detecting at least one of a secondary charged particle, a reflection charged particle and a back scattering charged particle... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070194234 - Scanning electron microscope: In order to provide a full-automatic scanning electron microscope which carries out investigation jobs full-automatically from fine adjustment to reviewing, the scanning electron microscope of the present invention has a function of calculating the accuracy of correction after correction of coordinates and displaying it with vectors 39, a function of... Agent: Bardmesser Law Group, P.C.

20070194236 - Semiconductor inspection system: An operator-free and fully automated semiconductor inspection system with high throughput is realized. All conditions required for capturing and inspection are generated from design information such as CAD data. In order to perform actual inspection under the conditions, a semiconductor inspection system is composed of a navigation system for generating... Agent: Dickstein Shapiro LLP

20070194232 - Substrate inspection apparatus, substrate inspection method and semiconductor device manufacturing method: A substrate inspection apparatus includes: an electron gun which generates an electron beam to irradiate the electron beam to a substrate; an electron detection unit which detects at least one of a secondary electron, a reflection electron and a back scattering electron generated from a surface of the substrate by... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070194237 - Thermo-optic system employing self reference: A thermo-optic system, which may be used for example in thermal imaging, includes an array of optical elements each having a thermally responsive optical property, the optical elements including signal elements and reference elements configured to provide (1) a common-mode response of the optical property to ambient temperature and (2)... Agent: David E. Huang, Esq. Bainwood Huang & Associates LLC

20070194238 - Method for production of a device for thermal detection of radiation comprising an active microbolometer and a passive microbolometer: The invention relates to a passive microbolometer (12), comprising a reflective screen (17) and a suspended membrane with the function of radiation absorber, thermometer and electrical connection. The membrane is supported by at least two anchor elements (15) fixed to a support substrate (16). The reflective screen (17) may be... Agent: Oliff & Berridge, PLC

20070194239 - Apparatus and method providing a hand-held spectrometer: According to one aspect, an IR spectrometer includes a light source adapted to illuminate a sample, a grating adapted to spectrally disperse a light that has illuminated the sample, a MEMS array adapted to be electrostatically actuated by a controller to control a diffraction of the light, a detector configured... Agent: Lowrie, Lando & Anastasi

20070194240 - Methods and systems for medical imaging: Methods and systems for imaging a patient using an imaging system is provided. The method includes,rotating a detector assembly about an examination axis of the imaging system, maintaining a first detector of the detector assembly at a first distance from the patient while receiving imaging data from the patient, and... Agent: Dean D. Small The Small Patent Law Group LLP

20070194241 - Multi-dimensional image reconstruction: Apparatus for radiation based imaging of a non-homogenous target area having distinguishable regions therein, comprises: an imaging unit configured to obtain radiation intensity data from a target region in the spatial dimensions and at least one other dimension, and an image four-dimension analysis unit analyzes the intensity data in the... Agent: Martin D. Moynihan Prtsi, Inc.

20070194242 - Scintillation layer for a pet-detector: The invention relates to a scintillation layer (20) for a PET-detector. The scintillation layer (20) consists of a plurality of scintillation elements (21) that are joined together in a practically gapless way and that are oriented towards the centre of curvature (24). Depending on the form of the scintillation layer... Agent: Philips Intellectual Property & Standards

20070194243 - Method of making segmented contacts for radiation detectors using direct photolithography: A method is provided for fabricating contacts on semiconductor substrates by direct lithography that results in durable adhesion of the electrodes, increased interpixel resistance and the electrodes which act as a blocking contact, thereby providing for improved energy resolution in a resultant radiation detector.... Agent: Foley And Lardner LLP Suite 500

20070194244 - Systems and methods for detecting normal levels of bacteria in water using a multiple angle light scattering (mals) instrument: A particle detection system to identify and classify particles is programmed to capture digitized images of the particle generated by directing a light source through a fluid that includes the particle. The particle scatters the light and the scattered light is detected using a detector. The detector creates a digital... Agent: Baker & Mckenzie LLP Patent Department

20070194245 - Ion sources and methods for generating an ion beam with a controllable ion current density distribution: Ion sources and methods for generating an ion beam with a controllable ion current density distribution. The ion source includes a discharge chamber and an electromagnet adapted to generate a magnetic field for changing a density distribution of the plasma inside the discharge chamber and, thereby, to change the ion... Agent: Wood, Herron & Evans, LLP

20070194247 - Compact optical module for fluorescence excitation and detection: A compact optical module for fluorescence excitation and detection and methods for using same are disclosed. An apparatus for detecting fluorescence includes a substrate base, a detector adjacent to the substrate base for determining the amount of fluorescence, an emission filter adjacent to the detector, a light source for emitting... Agent: Palmer & Dodge, LLP Kathleen M. Williams

20070194246 - Fluorometer with low heat-generating light source: This invention concerns a fluorometer preferably combined with a thermal cycler useful in biochemical protocols such as polymerase chain reaction (PCR) and DNA melting curve analysis. The present fluorometer features a low heat-generating light source such as a light emitting diode (LED), having a one-to-one correspondence to each of a... Agent: Patent Group C/o Dla Piper US LLP

20070194248 - Methods of using rare-earth oxide compositions and related systems: A method for communicating between a surface containing a rare-earth oxide phosphor, which emits a second wavelength photon when excited by a first wavelength photon, and an article mounted on a device, wherein the method includes exciting the phosphor with a source that emits a first wavelength photon to produce... Agent: Synnestvedt Lechner & Woodbridge LLP

20070194249 - System and method for cross-talk cancellation in a multilane fluorescence detector: The present invention is directed to a system and method for cross-talk cancellation for multi-lane fluorescence detectors. The invention may be implemented in accordance with a variety of systems, including systems for multi-capillary electrophoresis. The present invention is based on a special calibration procedure for determination of a channel cross-talk... Agent: Baker Botts L.L.P.

20070194250 - Charged particle beam writing method and apparatus: A method for writing a pattern on a workpiece by use of a charged particle beam, the method includes calculating a corrected dose including at least a proximity effect correction dose for correction of proximity effect, calculating a corrected residual difference-corrected dose for correcting a correction residual difference of the... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070194252 - Ion implantation device and a method of semiconductor manufacturing by the implantation of boron hydride cluster ions: An ion implantation device and a method of manufacturing a semiconductor device is described, wherein ionized boron hydride molecular clusters are implanted to form P-type transistor structures. The molecular cluster ions have the chemical form BnHx+and BnHx−, where 10<n<100 and 0≦x≦n+4. The use of such boron hydride clusters results in... Agent: Patent Administrator Katten Muchin Rosenman LLP

20070194251 - Ion sources, systems and methods: Ion sources, systems and methods are disclosed.... Agent: Fish & Richardson PC

20070194253 - Infrared light emitting device, infrared light detecting device, time-domain pulsed spectrometer apparatus, and infrared light emitting method: There is provided an infrared light emitting device that is capable of polarizing emission light without causing loss of the emission light and having a simple configuration. Included are a photoconductive layer 22 which generates optical carriers upon being irradiated with pulsed excitation light; a pair of first antenna electrodes... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP

20070194255 - Disinfecting device utilizing ultraviolet radiation: A disinfecting device is presented having a UV light source for radiation of a cleaning medium to eradicate the medium of infestation agents such as molds, viruses, bacteria and dust mites. The device enhances the disinfection of the medium by providing mechanisms for enhanced penetration of the UV light into... Agent: Crutsinger & Booth

20070194254 - Photon sieve for optical systems in micro-lithography: The use of photon sieves may be as a pupil defining element in an illumination system; a field of defining elements in an illumination system; a pupil lens element in a projection lens; a color correction system in the projection system; or as a transmitting diffractive element for EUV.... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070194256 - Multifunctional radiation shield for space and aerospace applications: Embodiments of the invention comprise a filler to block the radiation, and an organic resin, such as epoxy or modified cyanate ester. Fillers may comprise passivated Gadolinium and Tungsten. The Gadolinium may be passivated by atomic deposition of a nano-layer of silica or alumina. The passivation layer reduces the chemical... Agent: Space Micro Inc.

20070194257 - Media recognition using a single light detector: Media type is detected. A light beam is produced. The intensity of a specular reflectance component of the light beam is detected. The specular reflectance component results from the light beam being reflected off media. An indication of detected intensity of the specular reflectance component is compared to a mapping... Agent: Brinks Hofer Gilson & Lione/marvell

20070194258 - Web breakage monitoring device for web-fed rotary printing presses: Web breakage monitoring device for web-fed rotary printing presses; containing a detection device (26) for detecting a longitudinal web edge strip (22, 24) of a printable web (8) and a pneumatic deflection device (30) with at least one compressed-air nozzle (32, 34) for generating a pneumatic deflection force at right... Agent: Morgan & Finnegan, L.L.P.

20070187571 - Autofocus control method, autofocus control apparatus and image processing apparatus: An autofocus control method, an autofocus control apparatus and an image processing apparatus all of which can realize stable autofocus control operation by eliminating influences due to optical systems. In calculation of a focus evaluated value of each of sample images respectively acquired at a plurality of focused positions, each... Agent: William S Frommer Frommer Lawrence & Haug

20070187572 - Method and apparatus of determining the best focus position of a lens: A method and apparatus for accurately auto focusing a lens of an imaging device. An imaged scene is split into an array of zones. The minimum and maximum sharpness score for each zone is determined over a plurality of lens positions. A histogram of the lens positions of the corresponding... Agent: Dickstein Shapiro LLP

20070187573 - Object detecting system: An object detecting system, which is installed in a vehicle, uses a camera comprising an optical lens, a distance measuring image chip, and an illumination device to detect information about an object occupying a vehicle seat. The light emitting mode of a first illuminant and a second illuminant of the... Agent: Foley And Lardner LLP Suite 500

20070187574 - Electronic imaging device with photosensor arrays: An electronic imaging device is provided that includes a plurality of sensor elements, such as multiple photosensor arrays, wherein some of the sensor elements have a different numerical aperture value than the others, and wherein the sensor elements can be arranged such that their electrical signals can be combined to... Agent: Ge-gpo-marjama & Bilinski LLP General Electric / Global Patent Operation

20070187575 - Solid-state image sensor, manufacturing method for solid-state image sensor, and camera: A solid-state image sensor includes a plurality of light-receiving elements arranged in a light-receiving area, and a plurality of micro-lenses corresponding to the light-receiving elements, and has a flattening film formed on the plurality of the micro-lenses. At a center of the light-receiving area, the micro-lenses are placed in positions... Agent: Wenderoth, Lind & Ponack L.L.P.

20070187576 - Solid-state image sensor, manufacturing method for solid-state image sensor, and camera: A solid-state image sensor includes a plurality of light-receiving elements arranged in a light-receiving area, and a plurality of micro-lenses corresponding to the light-receiving elements, and has a flattening film formed on the plurality of the micro-lenses. At a center of the light-receiving area, the micro-lenses are placed in positions... Agent: Wenderoth, Lind & Ponack L.L.P.

20070187577 - Photoswitch: A photoswitch includes first and second signal sources for outputting first and second input signals that switch between high and low logic states according to intensity of ambient light, and a latch circuit having set and reset nodes coupled electrically and respectively to the first and second signal sources, and... Agent: Nixon Peabody, LLP

20070187578 - Optical assembly with adjustable sensors: A device assembly (16) for a precision apparatus (10) includes a device housing (30), a device (32), a device mover assembly (34), and a measurement system (36). The device mover assembly (34) moves the device (32) relative to the device housing (30) about a first axis and about a second... Agent: The Law Office Of Steven G Roeder

20070187579 - Apparatus for checking banknotes: The invention relates to an apparatus for checking bank notes which scans the bank notes to be checked by means of a semiconductor array. The inventive apparatus for checking bank notes has two linear semiconductor arrays formed of at least three layers which are sensitive to light of different wavelengths,... Agent: Bacon & Thomas, PLLC

20070187580 - Photoluminescent light sources, and scanned beam systems and methods of using same: A photoluminescent light source includes an excitation light source operable to emit light at a primary wavelength and a photoluminescent material optically coupled to the excitation light source. The photoluminescent material has a characteristic to emit light at a secondary wavelength in response to absorbing light at the primary wavelength.... Agent: Microvision, Inc.

20070187583 - Photoelectric encoder: In a photoelectric encoder (incremental encoder and absolute encoder) having a detector that is displaceable relative to a scale having a predetermined pattern (incremental pattern and pseudorandom pattern) formed thereon, the detection range, to be simultaneously detected, of the pattern is divided in at least the detection direction, and a... Agent: Rankin, Hill, Porter & Clark LLP

20070187582 - Absolute encoder utilizing light of different wavelengths to reduce cross-talk: An encoder having a code scale, an illumination system, and a plurality of photodetectors is disclosed. The code scale has a plurality of tracks that are illuminated by the illumination system. Each photodetector receives light from a corresponding one of the tracks and generates a signal indicative of a quantity... Agent: Kathy Manke Avago Technologies Limited

20070187581 - Optical encoder: An optical encoder includes an incoherent light source; a first grating, which is an amplitude grating having a first grating period, for spatial amplitude modulation of the incoherent light from the light source; a second grating, which is a phase grating having a second grating period, for spatial phase modulation... Agent: Leydig Voit & Mayer, Ltd

20070187584 - Linear electric field time-of-flight ion mass spectrometer: A linear electric field ion mass spectrometer having an evacuated enclosure with means for generating a linear electric field located in the evacuated enclosure and means for injecting a sample material into the linear electric field. A source of pulsed ionizing radiation injects ionizing radiation into the linear electric field... Agent: Los Alamos National Security, LLC

20070187585 - Tandem time-of-flight mass spectrometer and method of use: To provide comprehensive MS-MS analysis, a time-nested separation is employed using two time-of-flight (TOF) mass spectrometers. Parent ions are separated in a slow and long TOF1, operating at low ion energy (1 to 100 eV), and fragment ions are mass analyzed in a fast and short TOF2, operating at much... Agent: Price Heneveld Cooper Dewitt & Litton, LLP

20070187587 - Fingerprint analysis using mass spectrometry: The present invention is directed to a method for determining the presence of a residue on or within a fingerprint using matrix-assisted mass spectrometric techniques. The matrix-assisted mass spectrometric technique can be selected from Matrix-Assisted Laser Desorption/Ionization Mass Spectrometry Time-Of-Flight Mass Spectrometry (MALDI-TOF-MS) and/or Surface Assisted Laser Desorption/Ionisation Time-Of-Flight Mass... Agent: Patent Administrator Katten Muchin Rosenman LLP

20070187586 - Mass spectrometer for trace gas leak detection with suppression of undesired ions: Mass spectrometers for trace gas leak detection and methods for operating mass spectrometers are provided. The mass spectrometer includes an ion source to ionize trace gases, such as helium, a magnet to deflect the ions and a detector to detect the deflected ions. The ion source includes an electron source,... Agent: Varian Inc. Legal Department

20070187589 - Method and system for desorption atmospheric pressure chemical ionization: A desorption atmospheric pressure chemical ionization (DAPCI) system delivers a primary ion beam composed of an inert, high velocity gas and solvent ions to a surface to effect desorption and ionization of both volatile and non-volatile species present on surfaces. A electrode having a tapered tip is connected to a... Agent: Indianapolis Office 27879 Brinks Hofer Gilson & Lione

20070187590 - Solid-state flow generator and related systems, applications, and methods: The invention, in various embodiments, is directed to an analyzer using a solid-state flow generator to provide effluent flow along a flow path and deliver a sample to an ion mobility based filter and detector for analysis.... Agent: Fish & NeaveIPGroup Ropes & Gray LLP

20070187588 - Tandem type mass analysis system and method: The present invention provides a tandem type mass analysis system capable of carrying out the differential analysis with high efficiency by the tandem type mass analysis. A predetermined number of m/z regions are set up for carrying out the mass analysis with the all ions included therein being dissociated collectively... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070187591 - Plasma ion mobility spectrometer: Ion mobility spectrometer. The spectrometer includes an enclosure for receiving a sample therewithin and an electron beam window admits an electron beam into the enclosure to ionize the sample in an ionization region. A shutter grid is spaced apart from the ionization region and means are provided for sample ion... Agent: Choate, Hall & Stewart LLP

20070187592 - High sensitivity slitless ion source mass spectrometer for trace gas leak detection: A mass spectrometer includes a main magnet having spaced-apart polepieces which define a gap, the main magnet producing a magnetic field in the gap, an ion source to generate ions and to accelerate the ions into the magnetic field in the gap, the ion source located outside the gap, and... Agent: Varian Inc. Legal Department

20070187593 - Scanning probe apparatus: A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the apparatus is constituted by a probe; and a scanning stage including a drive element for moving a sample holding table for... Agent: Fitzpatrick Cella Harper & Scinto

20070187594 - Scanning probe apparatus: A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the apparatus is constituted by a probe; and a scanning stage including a drive element for moving a sample holding table for... Agent: Fitzpatrick Cella Harper & Scinto

20070187595 - Method for measuring a pattern dimension using a scanning electron microscope: To provide a consistent, high-speed, high-precision measurement method based on an electron beam simulation by reflecting the apparatus characteristics of a CD-SEM in an electron beam simulation, the present invention discloses a method for measuring a measurement target pattern with a CD-SEM, the method comprising the steps of performing an... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070187596 - Large area, pico-second resolution, time of flight detectors: A detector for detecting a particle is disclosed. The detector includes a charge emitter that emits a charge in response to receipt of the particle, an anode for receiving the emitted charge, and electronics for determining whether there is received charge on the anode. The anode may include a pad... Agent: Brinks Hofer Gilson & Lione

20070187597 - Focused ion beam system and a method of sample preparation and observation: A focused ion beam system capable of acquiring surface structure information, internal structure information, and internal composition information about a sample simultaneously from the same field of view of the sample. A method of sample preparation and observation employs such focused ion beam system to accurately set a sample processing... Agent: Mcdermott Will & Emery LLP

20070187601 - Charged particle beam apparatus: An object of this invention is to provide a charged particle beam apparatus that is capable of handling samples without adhering impurities onto the samples. In a scanning electron microscope in which a lubricant was coated on a sliding portion of a movable member that moves inside a vacuum chamber,... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070187599 - Charged particle beam apparatus, charged particle beam focusing method, microstructure measuring method, microstructure inspecting method, semiconductor device manufacturing method, and program: A charged particle beam apparatus includes: a charged particle source which generates a charged particle beam and which applies the charged particle beam to a specimen having a microstructure formed on a surface thereof; an objective lens which excites at least one of an electric field and a magnetic field... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070187598 - Scanning electron microscope and apparatus for detecting defect: A scanning electron microscope, by which an image of unevennesses on the surface of a sample may be obtained in a high-resolution manner and a high contrast one, is provided according to the present invention. A sample image is obtained by use of the scanning electron microscope with a configuration... Agent: Mcdermott Will & Emery LLP

20070187600 - Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device: A substrate inspection apparatus includes: an electron beam irradiation device which emits an electron beam and causes the electron beam to irradiate a substrate to be inspected as a primary beam; an electron beam detector which detects at least one of a secondary electron, a reflected electron and a backscattered... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070187602 - Circuit and method for reading out electric signals from a high-resolution thermal sensors: The invention relates to a circuit array for the reading out of electronic signals (t1, t4) from high-resolution thermal sensors (1′, 1*) with small signals and small signal dynamics which permits an interference-free reading out of individual elements from a larger sensor array. The invention relates to a circuit array... Agent: Hunton & Williams LLP Intellectual Property Department

20070187603 - Mems radiometer: A radiometer sensor includes a target plate and a micro-mechanical spring which supports the target plate above a base support. This construction allows for displacement of the target plate in a direction perpendicular to the base support in response to radiation which is received by a top surface of the... Agent: Stmicroelectronics, Inc.

20070187604 - Polarization-sensitive quantum well infrared photodetector focal plane array: A quantum well infrared photodetector (QWIP) focal plane array having structures, each structure having stacked layers of quantum wells and a reflective grating to provide polarization sensitivity. The reflective grating is etched to provide electrical contacts for individual pixels. The reflective gratings comprise grooves, where the grooves for a particular... Agent: Seth Kalson C/o Intellevate

20070187605 - Temperature detecting system and method: A temperature detection system for detecting relative or absolute temperatures of objects in a monitored area has at least one infrared (IR) detector and at least one optical element for directing IR radiation within a detector field of view onto the infrared detector. A scanning system is configured to produce... Agent: Procopio, Cory, Hargreaves & Savitch LLP

20070187606 - Overlay metrology using the near infra-red spectral range: A method and tool for conducting NIR overlay metrology is disclosed. Such methods involve generating a filtered illumination beam including NIR radiation and directing that illumination beam onto an overlay target to produce an optical signal that is detected and used to generate overlay metrology measurements. The method is particularly... Agent: Beyer Weaver LLP/kla

20070187607 - Multipass cell for gas analysis using a coherent optical source: A multi-pass gas cell that operates with reflected radiation pass through a gas, the reflected radiation transmitted and received by first and second fiber optic ports that are subject to an alignment adjustment, and a mirrored viewing window having a inner reflective surface exposed to an interior of the elongated... Agent: Myers Dawes Andras & Sherman, LLP

20070187608 - Methods and apparatus for improved gamma spectra generation: A method of improving energy determination of a Gamma event which interacts with a segmented scintillation detector, the method comprising: identifying radiation events detected by a detector that are likely not to have deposited their full energy in the detector, based only on characteristics of said detected events; and treating... Agent: Dan Inbar

20070187610 - Imaging method and apparatus with exposure control: According to a radiation imaging apparatus, any separate AEC sensor need not be prepared. Additionally, the apparatus main body can be made compact. To accomplish this, the radiation imaging apparatus has a first optical conversion element that converts incident radiation into an electrical signal, and generates image information on the... Agent: Morgan & Finnegan, L.L.P.

20070187609 - Multi-mode digital imaging apparatus and system: The present invention provides digital imaging architectures comprising detectors coupled to readout circuitry, wherein the readout circuitry functions in particular modes, the use of which can depend on characteristics of the input signals transferred to the readout circuitry from the detectors, or can depend on the characteristics of the output... Agent: Foley And Lardner LLP Suite 500

20070187611 - Quantitative radiation detection using geiger mode avalanche photodiode binary detector cell arrays: An imaging radiation detector includes a scintillator coupled to an array of photodiodes operating in Geiger mode. The array is divided into separate detector pixels, each of which is composed of a multiplicity of photodiode cells with their outputs tied together. While each of the cells operates independently in a... Agent: Siemens Corporation Intellectual Property Department

20070187612 - Ultraviolet-irradiating device of optical disk and ultraviolet-irradiating method to optical disk: An ultraviolet-irradiating device of an optical disk which makes effective use of electric power and has a long life, and an ultraviolet-irradiating method to an optical disk are provided. An ultraviolet-irradiating device 14 of an optical disk for irradiating ultraviolet curable resin A applied to a disk substrate D with... Agent: Flynn Thiel Boutell & Tanis, P.C.

20070187613 - Method for supporting an electrode: A mechanism for supporting a charge collecting electrode in the chamber of an ion detector includes an insulator that is mounted in the chamber and is attached to the electrode. A first magnet is used to establish a magnetic field in the chamber, and a second magnet is attached to... Agent: Neil K. Nydegger Nydegger & Associates

20070187614 - Radio frequency ion guide: An ion guide with two or more ion focusing elements and a gas channeling sleeve is described. An ion transport space within the gas channeling sleeve is in fluid communication with a pumping port. A suction device is used to suction gas out of the ion transport space through the... Agent: Bereskin And Parr

20070187615 - Wafer charge monitoring: A charge monitoring system may include a platen having a surface configured to accept a wafer thereon, and a charge monitor disposed relative to the platen so that an ion beam simultaneously strikes a portion of the charge monitor and a portion of the wafer. The charge monitor is configured... Agent: Varian Semiconductor Equipment Assc., Inc.

20070187616 - Correcting pyramidal error of polygon scanner in scanning beam display systems: Scanning beam display systems using fluorescent screens and various servo feedback control mechanisms to control display imaging qualities, including techniques and mechanism for measuring and correcting pyramidal errors of a polygon scanner.... Agent: Fish & Richardson, PC

20070187617 - Method and device for monitoring oil oxidation in real time by measuring fluorescence: There is provided a method and a device of monitoring oil oxidation in real time. The method of the present invention comprises the steps of: irradiating ultraviolet light into oil to be monitored; measuring fluorescence emission intensity of the oil in red, green and blue wavelength bands; determining one value... Agent: Jones Day

20070187618 - Electrostatic particle gettering in an ion implanter: Methods and apparatus are disclosed for removing particles from an ion implantation chamber by introducing at least one sacrificial wafer into the implanter and subjecting it to ion implantation. As the sacrificial wafer is exposed to the ion beam, it becomes charged. Particles present in the implantation chamber are then... Agent: Nutter Mcclennen & Fish LLP

20070187620 - Apparatus and method for partial ion implantation: Disclosed herein is an apparatus and method for partial ion implantation. The apparatus includes a wafer support, an ion beam irradiator capable of generating and irradiating an ion beam entering the wafer, and an ion beam exposure adjustor to adjust exposure of the wafer with respect to the ion beam... Agent: Marshall, Gerstein & Borun LLP

20070187622 - Charged particle beam apparatus, defect correcting method, etching method, deposition method, and charge preventing method: A charged particle beam apparatus includes a column, the column having: a charged particle beam source which generates a charged particle beam to apply a charged particle beam to the surface of a substrate, a position where the charged particle beam is irradiated to the substrate being a beam position;... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070187619 - Electromagnet with active field containment: An electromagnet and related ion implanter system including active field containment are disclosed. The electromagnet provides a dipole magnetic field within a tall, large gap with minimum distortion and degradation of strength. In one embodiment, an electromagnet for modifying an ion beam includes: a ferromagnetic box structure including six sides;... Agent: Hoffman, Warnick & D'alessandro LLC

20070187621 - Ion sources, systems and methods: Ion sources, systems and methods are disclosed.... Agent: Fish & Richardson PC

20070187623 - Method, system and device for microscopic examination employing fib-prepared sample grasping element: A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the... Agent: Haynes And Boone, LLP

20070187624 - Multiple irradiation effect-corrected dose determination technique for charged particle beam lithography: A charged-particle beam microlithographic apparatus is generally made up of a pattern writing unit and a system controller. The writer has an electron beam source and a pattern generator for forming a pattern image on a workpiece. The system controller includes a unit for correcting proximity and fogging effects occurrable... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070187626 - Ultraviolet radiation sterilization: A solution for sterilizing one or more hollow components of a device, such as a medical device, is provided. Ultraviolet radiation having one or more predominant wavelength(s) and a sufficient dose is generated and directed to an interior side of the hollow component(s). The predominant wavelength(s) is/are selected to harm... Agent: Hoffman Warnick & D'alessandro, LLC

20070187625 - Lithography system: A maskless lithography system for transferring a pattern onto the surface of a target. At least one beam generator for generating a plurality of beamlets. A plurality of modulators modulate the magnitude of a beamlet, and a control unit controls of the modulators. The control unit generates and delivers pattern... Agent: Blakely Sokoloff Taylor & Zafman

20070187628 - Lpp type extreme ultra violet light source apparatus and driver laser for the same: A driver laser for EUV light source apparatus which driver laser simultaneously achieves short-pulsing and multi-line oscillation. The driver laser includes: a short-pulse multi-line oscillated CO2 laser oscillator having a device that shortens width of pulses included in a laser beam to be output and a device that suppresses amplitude... Agent: Wenderoth, Lind & Ponack, L.L.P.

20070187627 - Systems and methods for reducing the influence of plasma-generated debris on the internal components of an euv light source: Systems and methods are disclosed for reducing the influence of plasma generated debris on internal components of an EUV light source. In one aspect, an EUV metrology monitor is provided which may have a heater to heat an internal multi-layer filtering mirror to a temperature sufficient to remove deposited debris... Agent: Matthew K. Hillman Cymer, Inc., Legal Dept.

20070187629 - Optical coupling device: An aspect of the present invention provides an optical coupling device which includes a light emitting element, a photodetector element, and a switching circuit having first and second semiconductor elements and electrodes. The photodetector element receives light from the light emitting element. In the switching circuit, the first and second... Agent: Banner & Witcoff, Ltd. Attorneys For Client No. 000449, 001701

20070187630 - Secure tag coding: A secure tag coding method and device. The method comprises: providing a first type of secure tag having a first luminescence profile to indicate a first level code; providing a second type of secure tag having a second luminescence profile different from the first luminescence profile to indicate a second... Agent: Intellectual Property Section Law Department

20070187631 - Multiple axis multipoint non-contact measurement system: Apparatus for optically measuring a remote object comprises at least one source for projecting a plurality of discrete zones of electromagnetic radiation (for example laser spots) along a projection plane. Imaging apparatus images a plurality of reflections from the remote object. By spatially offsetting the imaging apparatus from the projection... Agent: Glenn Patent Group

20070187632 - Method and apparatus for analyzing characteristic information of object with the use of mutual interaction between ultrasound wave and light: An apparatus analyzes information indicative of a characteristic of a region to be examined an object. The apparatus comprises an ultrasound generator generating an ultrasound wave toward the region within the object and a light generator generating light toward the region. The ultrasound sound generated is transmitted toward the region.... Agent: Scully Scott Murphy & Presser, PC

20070187633 - Apparatus and method for characterizing an interfacial property of a dispersion: An improvement in a PVT apparatus, which improvement includes a fluid path model having a fluid path and a sampling section, wherein the depth of the fluid path within the sampling section is substantially uniform and is less than about 100 μm. The apparatus may be configured to provide a... Agent: Rodman Rodman

20070181776 - Optical receiving device, free space optics transmission apparatus, receiving apparatus: An optical receiving device includes an optical receiving element and a light collecting portion having an output surface close to or in contact with the optical receiving surface of the optical receiving element. The dispersion plane at an arbitrary point on the line connecting an arbitrary point on an input... Agent: Ratnerprestia

20070181777 - Vehicle rearview mirror system having a variable reflectance control: A vehicle rearview mirror system includes an electro-optic reflective element, an ambient light sensor that is operable to sense ambient light, a glare light sensor that is operable to sense glare light and a circuit that is responsive to the ambient glare light sensors which establishes a reflectance level of... Agent: Van Dyke, Gardner, Linn And Burkhart, LLP

20070181778 - Optical device: The optical device 10 includes a light source 13, a mirror element 12 including a mirror 36 for reflecting light emitted from the light source 13 in a predetermined direction, and a mirror element housing body 11 that accommodates the mirror element 12 as well as seals a space D... Agent: Rankin, Hill, Porter & Clark LLP

20070181779 - Readout technique for increasing or maintaining dynamic range in image sensors: The apparatus and method provide a readout technique and circuit for increasing or maintaining dynamic range of an image sensor. The readout technique and circuit process each pixel individually based on the magnitude of the readout signal. The circuit includes a gain amplifier amplifying the readout analog signal, a level... Agent: Dickstein Shapiro LLP

20070181780 - Photo-detection device: The present invention relates to a photo-detecting apparatus having a structure which can accurately detect light by restraining noises from occurring. The photo-detecting apparatus comprises a first substrate having a surface provided with M×N photodiodes and switches; a second substrate having a surface provided with signal processing parts for processing... Agent: Drinker Biddle & Reath (dc)

20070181782 - Cmos light sensor and operation method thereof: A CMOS light sensor and the operation method thereof are disclosed. The CMOS light sensor has a plurality of light sensing lines and a plurality of capacitor lines. Each light sensing line has a plurality of light sensors such that the number of capacitors in each capacitor line is smaller... Agent: Jianq Chyun Intellectual Property Office

20070181783 - Differential color sensor without filters: A semiconductor color sensor implemented without the use of color filters. Fabricating photodiodes using different semiconductor materials provide photodiodes with different sensitivities vs. wavelengths. A first embodiment uses photodiodes with different junction depths. A shallow junction depth produces a photodiode with its sensitivity peak in shorter wavelengths, while a deeper... Agent: Avago Technologies, Ltd. C/o Klaas, Law, O'meara & Malkin, P.C.

20070181781 - Integrated optical transceiver: An optical transceiver includes at least one light source and at least one detector mounted on the same surface of the same substrate. The detector is to receive light from other than a light source on the surface. At least one of the light source and the detector is mounted... Agent: Digital Optics Corporation

20070181785 - Compact optical navigation module and microlens array therefore: An optical motion sensing module includes a microlens array comprising a plurality of lenslets, each lenslet forming a corresponding image of a surface; a light sensor comprising a plurality of pixels corresponding to the plurality of lenslets to detect the formed images of the surface; and a controller to use... Agent: Kathy Manke Avago Technologies Limited

20070181786 - Device for monitoring spatial areas: A monitoring device for spatial areas comprises a receiver, to which an anamorphotic optical system, is assigned. The monitoring device also has a transmitter which scans a field of view assigned to the receiver using radiation pulse beams. A distance image of an object in the field of view can... Agent: Lerner Greenberg Stemer LLP

20070181784 - Methods and systems for detecting proximity of an object: Methods and systems for detecting a proximity of an object are provided. The method includes receiving a first beam of radiation from a first field of view directed onto a first detector and a second beam of radiation from a second field of view directed onto a second detector wherein... Agent: Patrick W. Rasche (22697) Armstrong Teasdale LLP

20070181787 - Automatic analyzer: In an automatic analyzer which includes a reaction container which contains reaction solution therein, a light source which emit light to be transmitted through the reaction solution, a spectral detector which measures the light transmitted through the reaction solution, a memory which stores light measurement data measured by the spectral... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20070181789 - Device and system for measuring forces: Optical transducers are provided for detecting forces such as, for example rotational and transversal forces acting on them, wherein, for the purpose of detecting said forces, optical signals are transmitted through an optical path defined by optical fibers. Moreover, optical means are provided, adapted to modify the transmission of the... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20070181788 - System and method for measuring forces: Optical transducers are provided for detecting forces such as, rotation and transversal forces acting on them, wherein, for the purpose of detecting the forces, optical signals are transmitted through an optical path, for instance defined by an optical fiber. Moreover, polarization scrambling means are provided together with polarizing means, with... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20070181791 - Optical encoder: In an optical encoder, a plurality of light sources is controlled on and off so as to use light rays to irradiate an optical grating of a scale from a plurality of different directions. The light rays are received by a plurality of photoreceptor elements. Operations are performed using signals... Agent: Canon U.s.a. Inc. Intellectual Property Division

20070181790 - Reflective encoder with reduced background noise: An encoder having a code scale and an emitter detector module is disclosed. The code scale includes alternating reflective and opaque stripes. The emitter-detector module includes a light source that generates light and directs a portion of the generated light to the imaging element and a photodetector that generates a... Agent: Kathy Manke Avago Technologies Limited

20070181792 - Semiconductor device and manufacturing method of the same: A semiconductor device, includes a semiconductor substrate having a main surface where a light receiving element area is formed; a projection part provided in the periphery of the light receiving element area on the main surface of the semiconductor substrate; an adhesive material layer provided in the external periphery of... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070181794 - Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement: A reflectometer calibration technique is provided that may include the use of two calibration samples in the calibration process. Further, the technique allows for calibration even in the presence of variations between the actual and assumed properties of at least one or more of the calibration samples. In addition, the... Agent: O'keefe, Egan, Peterman & Enders LLP

20070181795 - Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement: A reflectometer calibration technique is provided that may include the use of two calibration samples in the calibration process. Further, the technique allows for calibration even in the presence of variations between the actual and assumed properties of at least one or more of the calibration samples. In addition, the... Agent: O'keefe, Egan, Peterman & Enders LLP

20070181793 - Method and apparatus for accurate calibration of vuv reflectometer: A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance variations at those wavelengths for subtle variations in the properties of the standard sample. A second sample, a reference sample may have... Agent: O'keefe, Egan, Peterman & Enders LLP

20070181796 - Method of producing molecular profiles of isoparaffins by low emitter current field ionization mass spectrometry: The present invention is devoted to an analytical method for directly determining carbon number and molecular weight distributions of isoparaffin mixtures. The analytical means uses low in-scan emitter-current field-ionization mass spectroscopy to substantially reduced or eliminated molecular ion fragmentation for isoparaffins, which allows direct measurement of isoparaffin molecular ions for... Agent: Exxonmobil Research & Engineering Company

20070181801 - Mass spectrometer and mass spectrometry: A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at... Agent: Stanley P. Fisher Reed Smith LLP

20070181800 - High sensitivity mass spectrometer interface for multiple ion sources: An interface for mass spectrometers. The interface uses non coaxial sampling pathways of the analyte ion beam prior to entering the entrance of a mass spectrometer for decreasing chemical background, and can be done in such a way as to permit multiple sprayers, increasing sample throughput and sensitivity for LC/MS... Agent: Ralph A. Dowell Of Dowell & Dowell P.C.

20070181802 - Mass spectrometer and mass spectrometry: A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at... Agent: Stanley P. Fisher Reed Smith LLP

20070181797 - Mass spectrum analysis device, mass spectrum analysis method, and mass spectrum analysis program: The mass spectrum device analyzes a mass spectrum measured for a plurality of samples. The mass spectrum device includes peak position detection means 14 for detecting a peak position where the mass spectrum is at its peak, and coincidence degree calculation means 15 for calculating the coincidence degree of peaks... Agent: Sughrue Mion, PLLC

20070181798 - Method and system for chemical and physical characterization of complex samples: A method and system for rapid determination of a composition, such as crude oils and fractions thereof, and s obtaining the information necessary to assess the yield of commercially valuable fuel and lube oil fractions in a single process, variations of the method and system use Gas Chromatography—FID/Mass Spectrometry and... Agent: Arent Fox PLLC

20070181799 - Thermally assisted membrane introduction mass spectrometry (mims) interface and method of use thereof: A membrane introduction mass spectrometry (MIMS) sampling interface is presented that demonstrates improved online performance for the direct, real-time measurement of semi-volatile organic compounds (SVOCs) in samples such as air and water, at parts-per-billion and parts-per-trillion levels. The device is based upon a capillary hollow fiber silicone (polydimethylsiloxane) membrane in... Agent: Klarquist Sparkman, LLP

20070181803 - Mass spectrometer: In a mass spectrometer in which a high ion dissociation efficiency is possible, inserted electrodes are arranged with a form divided into two or more in the axial direction of the ion trap, an electric static harmonic potential is formed from a DC voltage applied to the inserted electrodes, and... Agent: Reed Smith LLP

20070181804 - Method of mass spectrometry and mass spectrometer: A mass spectrometry device includes an ion source for ionizing a sample, an ion trap for trapping ions ionized by the ion source. A control unit for controlling voltages applied to lenses forming part of the ion trap, and a detection unit for detecting the ions trapped by said ion... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070181807 - Charged particle apparatus, scanning electron microscope, and sample inspection method: An object of the invention is to be able to select easily and quickly inspection recipes which are appropriate to samples from any number of inspection recipes. A calculating device displays a plurality of inspection recipes on the GUI. An inspection recipe includes settings for controlling charged particle columns which... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20070181806 - Charged particle optical apparatus with aberration corrector: When an accelerating voltage and operating distance are changed, an excitation current and a pole voltage of an aberration corrector must also be changed. Moreover, different multipole voltages or currents must be added individually for each pole in order to superpose multipoles. In view of overcoming the problems explained above,... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20070181808 - Electron microscope and electron bean inspection system.: e

20070181805 - Scanning electron microscope having a monochromator: A scanning electron microscope having a monochromator that can automatically adjust an electron beam entering the monochromator and operating conditions of the monochromator. The scanning electron microscope having a monochromator is equipped with, between an electron source and the monochromator, a first focusing lens for adjusting focusing of the electron... Agent: Mcdermott Will & Emery LLP

20070181809 - Method and apparatus for inspection of semiconductor devices: A technique for providing high-contrast images of defects in semiconductor devices and arrays of such devices, by illuminating each semiconductor device under inspection with broadband infrared radiation, and then forming an image of radiation that is specularly reflected from the semiconductor device. Many semiconductor devices and arrays of such devices... Agent: Carmen B. Patti & Associates, LLC

20070181811 - Near-field terahertz imaging: A T-ray imaging system employing an optical resonator that is adapted to be (i) positioned in the near-field proximity to a surface of a sample and (ii) pumped with pump light such that the pump light traverses a relatively thin layer of an electro-optically responsive material (EORM) located in the... Agent: Mendelsohn & Associates, P.C.

20070181810 - Vertical cavity surface emitting laser (vcsel) array laser scanner: Vehicle-based lidar systems and methods are disclosed using multiple lasers to provide more compact and cost-effective lidar functionality. Each laser in an array of lasers can be sequentially activated so that a corresponding optical element mounted with respect to the array of lasers produces respective interrogation beams in substantially different... Agent: Kathy Manke Avago Technologies Limited

20070181812 - Radiation source for a sensor arrangement with making current limitation: A radiation source is disclosed for an optical sensor arrangement having an incandescent lamp being switched by a semiconductor switch. The incandescent lamp emits a broadband light spectrum. The semiconductor switch has a control terminal driven by a control signal to switch a connection of the incandescent lamp to a... Agent: Barley Snyder, LLC

20070181813 - Variable resolution x-ray ct detector with target imaging capability: Variable-Resolution X-ray (VRX) techniques boost spatial resolution of a Computed Tomographic (CT) scanner in the scan plane by two or more orders of magnitude by reducing the angle of incidence of the x-ray beam with respect to the detector surface. The invention provides a multi-arm multi-angle VRX detector for targeted... Agent: Luedeka, Neely & Graham, P.C.

20070181814 - Method and apparatus for determining depth of interactions in a detector for three-dimensional complete body screening: The present invention is directed to a system and method for efficiently and cost effectively determining an accurate depth of interaction for a crystal that may be used for correcting parallax error and repositioning LORs for more clear and accurate imaging. The present invention is directed to a detector assembly... Agent: Jones Day

20070181815 - High resolution proton beam monitor: A method and apparatus for monitoring a scanning beam of penetrating radiation, such as a scanning proton beam used to irradiate tissue. The position of the beam is tracked in real time by interposing a scintillator film between a source and an object of irradiation. An imaging detector, in optical... Agent: Bromberg & Sunstein LLP

20070181816 - Anisotropic conductive film, x-ray flat panel detector, infrared flat panel detector and display device: An anisotropic conductive film includes: an insulating material; and a plurality of conductive particles dispersed in the insulating material, the conductive particles provided in a plurality of lines in a first direction along the thickness of the insulating material, the conductive particles in the lines disposed electrically connectable to each... Agent: Amin, Turocy & Calvin, LLP

20070181817 - System and method for retrieving ionospheric parameters from disk-viewing ultraviolet airglow data: The present invention provides a system and method for retrieving ionospheric parameters from dayside disk-viewing measurements of an ultraviolet emission within the upper atmospheric airglow. The invention may provide nowcasting and forecasting information of the ionosphere, which is important for ultraviolet communications.... Agent: Naval Research Laboratory Associate Counsel (patents)

20070181818 - Method and apparatus for measuring purity of noble gases: A device for detecting impurities in a noble gas includes a detection chamber and a source of pulsed ultraviolet light. The pulse of the ultraviolet light is transferred into the detection chamber and onto a photocathode, thereby emitting a cloud of free electrons into the noble gas within the detection... Agent: Larson And Larson

20070181820 - Apparatus and method for controlling ion beam: An apparatus and/or method for controlling an ion beam may be provided, and/or a method for preparing an extraction electrode for the same may be provided. In the apparatus, a plurality of extraction electrodes may be disposed in a path of an ion beam. At least one extraction electrode may... Agent: Harness, Dickey & Pierce, P.L.C

20070181819 - Deflector for equipment of electron beam lithography and equipment of electron beam lithography: A deflector for an equipment of electron beam lithography, the deflector including a plurality of control electrodes arranged symmetrically relative to the center axis of an irradiated electron beam, the electrodes configured to control the electron beam by applying voltages respectively, a plurality of molding substrates arranged symmetrically relative to... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070181821 - Collimator fabrication: A collimator that formed from a plurality of metal layers that are shaped by use of lithographic techniques in specific shapes. The formed metal layers are stacked and aligned together and then connected together to form the collimator.... Agent: Fay, Sharpe, Fagan, Minnich & Mckee, LLP

20070181822 - Method and apparatus for fluorescent magnetic particle and fluorescent liquid penetrant testing: The invention includes a method and apparatus for viewing fluorescent indicating materials for performing fluorescent magnetic particle testing and fluorescent liquid penetrant testing. In this method of nondestructive testing, the invention replaces ultraviolet light with the combination of a source of blue light that is substantially or entirely devoid of... Agent: Clock Tower Law Group

20070181823 - Device and method for irradiating blood: A device (60) for irradiating blood is provided, the device including a chamber (62) having an elongate configuration defining a hollow interior, the chamber formed of reflective material, a tubular cassette (74) sized and shaped to be received in the interior (70) of the chamber, the tubular cassette (74) having... Agent: Seed Intellectual Property Law Group PLLC

20070181824 - Radiation image storage panel and method of preparing said panel: In a radiation image storage panel, as a layer arrangement of consecutive layers, a support, a sublayer and a stimulable phosphor layer having needle-shaped stimulable phosphor crystals is comprised, said sublayer is a binderless non-vapor deposited layer, at least comprising as a halide compound an inorganic alkali halide salt selected... Agent: Nexsen Pruet, LLC

20070181826 - Laser atom probe methods: A laser atom probe (100) situates a counter electrode between a specimen mount and a detector (106), and provides a laser (116) having its beam (122) aligned to illuminate the specimen (104) through the aperture (110) of the counter electrode (108). The detector, specimen mount (102), and/or the counter electrode... Agent: Perkins Coie LLP Patent-sea

20070181825 - Measurement method, transfer characteristic measurement method, adjustment method of exposure apparatus, and device manufacturing method: Exposure is performed with a reticle installed in an exposure apparatus, and a measurement mark on the reticle is transferred onto a wafer so as to form a first transferred image of the measurement mark (step 212). Then, the wafer is rotated (step 218), and then the measurement mark is... Agent: Oliff & Berridge, PLC

20070181828 - E-beam lithography system for synchronously irradiating a plurality of photomasks and method of fabricating photomasks using the same: Disclosed is an E-beam lithography system for synchronously irradiating surfaces of a plurality of substrates. The E-beam lithography system may include a loading unit loading and unloading substrates, an alignment chamber aligning the substrates, a transfer chamber transferring the substrates from the loading unit or chambers, a lithography chamber radiating... Agent: Harness, Dickey & Pierce, P.L.C

20070181827 - Lithographic apparatus, calibration method, device manufacturing method and computer program product: Calibration of spot height offsets in a level sensor is performed on a resist-coated substrate to eliminate process dependencies of substrate position measurements obtained by the level sensor.... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070181829 - Electron-beam exposure system: An electron-beam exposure system includes: an electron gun; a first mask having a first opening for shaping a beam of electrons; a second mask having a second opening for shaping the beam of electrons; a stencil mask disposed below the first mask and the second mask, the stencil mask having... Agent: Muramatsu & Associates

20070181832 - Controlling the characteristics of implanter ion-beams: A method and apparatus satisfying growing demands for improving the precision of angle of incidence of implanting ions that impact a semiconductor wafer and the precision of ribbon ion beams for uniform doping of wafers as they pass under an ion beam. The method and apparatus are directed to the... Agent: Nields & Lemack

20070181830 - Ion implantation device and a method of semiconductor manufacturing by the implantation of boron hydride cluster ions: An ion implantation device and a method of manufacturing a semiconductor device is described, wherein ionized boron hydride molecular clusters are implanted to form P-type transistor structures. The molecular cluster ions have the chemical form BnHx+ and BnHx−, where 10<n<100 and 0≦x≦n+4. The use of such boron hydride clusters results... Agent: Patent Administrator Katten Muchin Rosenman LLP

20070181831 - Method and apparatus for processing a micro sample: An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In... Agent: Kenyon & Kenyon LLP

20070181833 - Secondary emission electron gun using external primaries: An electron gun for generating an electron beam is provided, which includes a secondary emitter. The secondary emitter includes a non-contaminating negative-electron-affinity (NEA) material and emitting surface. The gun includes an accelerating region which accelerates the secondaries from the emitting surface. The secondaries are emitted in response to a primary... Agent: Brookhaven Science Associates/ Brookhaven National Laboratory

20070181834 - Arrangement and method for the generation of euv radiation of high average output: The invention is directed to an arrangement and a method for the generation of EUV radiation of high average output, preferably for the wavelength region of 13.5 nm for use in semiconductor lithography. It is the object of the invention to find a novel possibility for generating EUV radiation of... Agent: Reed Smith, LLP Attn: Patent Records Department

20070176077 - System and method for correction of turbulence effects on laser or other transmission: An incoming laser beam is relayed to a steering mirror and a phase correction device. The beam is relayed from the phase correction device to a focal plane array and to a wavefront sensor (WFS). Low order steering mirror tilt corrections can be based on data from the focal plane... Agent: Banner & Witcoff, Ltd.

20070176078 - Fast particle generating apparatus: A laser beam L1 emitted from a laser source 10 is projected onto a target 30 set in a vacuum chamber 60 while being focused by a focusing optical system 20. This results in generating fast particles P such as protons and emitting the particles from the target 30. A... Agent: Patterson & Sheridan, L.L.P.

20070176080 - Image sensing system for a vehicle: An image sensing system for a vehicle includes an imaging sensor comprising a two-dimensional array of light sensing photosensor elements, preferably formed on a semiconductor substrate, and a logic and control circuit comprising an image processor for processing image data derived from the imaging sensor. The logic and control circuit... Agent: Van Dyke, Gardner, Linn And Burkhart, LLP

20070176079 - Optoelectronic detector with multiple readout nodes and its use thereof: The present invention discloses an optoelectronic detector for light sensing. The optoelectronic detector has a photosensitive element that converts light into electrons. Efficient collection of these electrons at readout nodes, embedded in the photosensitive element, is required to make correct measurements of light characteristics such as, phase shift and intensity.... Agent: Burr & Brown

20070176082 - Microlensed focal plane array (fpa) using sub-pixel de-selection for improved operability: A cost-effective FPA includes a plurality of detectors per pixel, wherein radiation is directed by a microlens array into respective focal regions that are covered by the union of the detectors' collections regions within each pixel and any defective detectors are de-selected in the ROIC. The operability of each pixel... Agent: Koppel, Patrick & Heybl

20070176081 - Lens for ambient light sensor: A lens assembly for use with an ambient light sensor includes a housing having a top surface and including an aperture. An ambient light sensor is mounted within the housing adjacent to the housing aperture. A lens is mounted within the housing aperture for collecting ambient light impinging on the... Agent: Locke Liddell & Sapp LLP Attn: Docketing Dept.

20070176083 - Camera system for a motor vehicle: A camera system for a motor vehicle is described. Incident radiation is guided to a radiation receiving unit by means of one or more deflecting mirrors, where at least one deflecting mirror is configured to swivel. The swivelable deflecting mirror has a first mirror side, which is suitable for deflecting... Agent: Crowell & Moring LLP Intellectual Property Group

20070176084 - In-line laser scanning unit with multiple light beams: An in-line laser scanning unit (LSU) with multiple light beams is disclosed. The LSU includes a minimized in-line mirror set composed by a plurality of vertically stacked Micro Electronic Mechanical System (MEMS) oscillatory mirrors and a linear corresponding scanning lens set formed by a plurality of F-Sin θ lens stacked... Agent: Troxell Law Office PLLC

20070176085 - Microscope: The invention relates to a microscope comprising at least one first and second light sources, a first light-guiding fiber connected to the first light source and a second light-guiding fiber connected to the second light source, wherein the light emitted by corresponding light source is injectable into the connected light-guiding... Agent: Houston Eliseeva

20070176086 - Image sensing devices, image sensor modules, and associated methods: The present invention relates to image sensing devices, image sensor modules, and associated methods. One aspect of the invention is directed toward an imaging device that includes a carrier having a first surface, a second surface generally opposite the first surface, and carrier contacts. The carrier contacts are carried on... Agent: Blakely Sokoloff Taylor & Zafman LLP

20070176087 - Component method and system for pet detector efficiency normalization: A method and apparatus for calibrating a PET scanner is provided. First phantom sinogram data is acquired from a scan of a solid cylinder phantom within a PET scanner imaging FOV; second phantom sinogram data is acquired from a scan of a second solid plane or scanning line phantom within... Agent: Philips Intellectual Property & Standards

20070176088 - Feature selection in mass spectral data: The present invention provides, inter alia, methods of analyzing mass spectral data. In some embodiments, the methods can be used for differential profiling of samples, such as comparing a sample comprising a compound and a sample comprising metabolites of the same compound. The methods can also be used to identify... Agent: Agilent Technologies Inc.

20070176089 - Apparatus for detecting particles: The invention relates to an apparatus for detecting particles, comprising a support element (1) and a plurality of electrically conductive structures (2) arranged on the support element (1), wherein the structures (2) are electrically insulated from each other and wherein each of the structures (2) can be electrically connected to... Agent: Robert W. Becker & Associates

20070176090 - Multi-reflecting time-of-flight mass spectrometer with orthogonal acceleration: The disclosed apparatus includes a multi-reflecting time-of-flight mass spectrometer (MR-TOF MS) and an orthogonal accelerator. To improve the duty cycle of the ion injection at a low repetition rate dictated by a long flight in the MR-TOF MS, multiple measures may be taken. The incoming ion beam and the accelerator... Agent: Price, Heneveld, Cooper, Dewitt & Litton, LLP 695 Kenmoor, S.e.

20070176091 - Fourier transform mass spectrometer and method for generating a mass spectrum therefrom: A method of generating a mass spectrum from an FTMS is disclosed. A first quantity of ions from a source, having a first m/z range, is captured and detected in the FTMS measurement cell to produce a first output. A second quantity of ions, having a second m/z range which... Agent: Thermo Finnigan LLC

20070176093 - Mass spectrometry target assembly: A mass spectrometry target assembly for accommodating at least one analyte (1) for mass spectrometry is provided, said assembly comprising: a target substrate (10) having a substrate surface (11), at least one measuring element (2), wherein said target substrate (10) and said measuring element (2) are different components, said measuring... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070176092 - Method and apparatus for enhanced ion mobility based sample analysis using various analyzer configurations: A system for analyzing one or more ion species of a sample including a first ion mobility filter associated with a first flow path for passing first ions of the sample, a second ion mobility filter associated with a second flow path for passing second ions of the sample, a... Agent: Fish & NeaveIPGroup Ropes & Gray LLP

20070176096 - Adjusting field conditions in linear ion processing apparatus for different modes of operation: Methods for applying an RF field in a two-dimensional electrode structure include applying RF voltages to one or more main electrodes and compensation electrodes. The voltages on the one or more compensation electrodes may be adjusted to be proportional to the voltages on the main electrodes. The adjustment(s) may be... Agent: Varian Inc. Legal Department

20070176097 - Compensating for field imperfections in linear ion processing apparatus: An electrode structure for manipulating ions includes a main electrode and a compensation electrode. An outer surface of the main electrode includes a curved section that includes an apex. An aperture is generally disposed at the apex and extends along a radial center line from the outer surface through a... Agent: Varian Inc. Legal Department

20070176094 - Field conditions for ion excitation in linear ion processing apparatus: Methods for applying an RF field in a two-dimensional electrode structure include applying RF voltages to main electrodes and to compensation electrodes. The voltages on the compensation electrodes may be proportional to the voltages on the main electrodes so as to optimize the RF field for processes involving ion excitation,... Agent: Varian Inc. Legal Department

20070176098 - Rotating excitation field in linear ion processing apparatus: Methods for applying an RF field in a two-dimensional electrode structure include applying RF voltages to main electrodes and to compensation electrodes. The voltages on the compensation electrodes may be adjusted to be proportional to the voltages on the main electrodes. The adjustment(s) may be done to optimize the RF... Agent: Varian Inc. Legal Department

20070176095 - Two-dimensional electrode constructions for ion processing: An electrode for use in a device such as an ion trap has an axial length extending generally in the direction of a central axis from a first axial end to a second axial end, and an inside surface. The inside surface includes a surface profile that is uniform from... Agent: Varian Inc. Legal Department

20070176099 - Atom probe apparatus and method for working sample preliminarily for the same: Problems to be solved by the present invention are to present a technique for preliminarily working a sample, which makes a place, that is desired to be analyzed, of a device into an acicular protrusion by locally cutting out the place, and to provide, even if the sample is a... Agent: Bruce L Adams Adams & Wilks

20070176101 - Variable density scanning: Systems and techniques for varying a scan rate in a measurement instrument. The techniques may be used in scanning probe instruments, including atomic force microscopes (AFMs) and other scanning probe microscopes, as well as profilometers and confocal optical microscopes. This allows the selective imaging of particular regions of a sample... Agent: Linda G. Gunderson Macpherson Kwok Chen & Heid LLP

20070176100 - Automated nanoassembly: An automated nanomanipulation system is provided for manufacturing a nanoscale structure. The system includes: a design model for the nanoscale structure; image data of a sample surface upon which the nanoscale structure is to be manufactured; a movable member configured to perform a nanomanipulation operation on the sample surface; and... Agent: Harness, Dickey & Pierce, P.L.C

20070176102 - Particle optical apparatus with a predetermined final vacuum pressure: The invention relates to a particle-optical apparatus with a predetermined final vacuum pressure. To that end a vacuum chamber of said apparatus is via a first restriction connected to a volume where vapour or gas is present at a known pressure and via a second restriction to a vacuum pump.... Agent: Michael O. Scheinberg

20070176103 - Method and device for observing a specimen in a field of view of an electron microscope: The present invention provides a method of observing a specimen in a field of view of an electron microscope comprising the acts of illuminating the specimen with an electron beam having a first angle and forming a first transmission image of the specimen in the field of view and adjusting... Agent: Dickstein Shapiro LLP

20070176104 - Multi-spectral uncooled microbolometer detectors: A process and system for a medium wave infrared (MWIR) uncooled microbolometer focal plane array (FPA). One embodiment is for a single MWIR band uncooled IR detector, wherein the design and fabrication utilizes standard silicon processing techniques reducing manufacturing costs and preserving existing manufacturing capabilities. Another embodiment is a two... Agent: Bae Systems Information And Electronic Systems Integration Inc.

20070176105 - Photosensitive diagnostic device: The present invention relates to a photosensitive diagnostic device configured to project an optical signal, capture reflected portions of the optical signal, and convert the captured portions of the optical signal into an electrical signal indicative of characteristics of a sample analyzed by the device. In accordance with one embodiment,... Agent: Dinsmore & Shohl LLP

20070176106 - Methods and systems for automatic body-contouring imaging: Methods and systems for imaging a patient using an imaging system is provided. The method includes rotating a detector about a patient, detecting a predetermined distance of the detector from the patient, and automatically moving the detector to within a predetermined range of distance from the patient based on the... Agent: The Small Patent Law Group LLP

20070176107 - Optical engine with a replaceable light tunnel: An optical engine for use in a projection apparatus is disclosed, wherein the optical engine carries an illumination system and an imaging system for co-defining an optical axis, while a light beam emitted from the illumination system is transmitted to the imaging system along the optical axis. The optical engine... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20070176110 - Radiation detection apparatus and radiological imaging apparatus: A radiological imaging apparatus comprising a semiconductor detector unit in which a plurality of semiconductor radiation detection elements are installed on a detector mounted substrate in a matrix to constitute a detector unit. A plurality of detector units are releasably mounted on a fixing substrate. This mounting is carried out... Agent: Dickstein Shapiro LLP

20070176108 - Semiconductor-based image sensor: A detector arrangement and/or a semiconductor-based image sensor with a plurality of detector elements or image pixels is described, which each have an integrated SD-(Sigma Delta) Modulator (20 to 29) or an integrated SD-A/D-(Sigma Delta Analog/Digital) converter (20 to 30), as well as particularly such a detector arrangement and/or such... Agent: Philips Intellectual Property & Standards

20070176109 - Sensor with trigger pixels for imaging of pulsed radiation: A radiation sensor 10 includes an array of imaging pixels 13 electrically connectable to a readout port. At least one first peripheral row of trigger pixels 11 is located at a first edge of the array, the trigger pixels also being electrically connectable to the readout port but responding faster... Agent: Venable LLP

20070176111 - Detector for an x-ray imaging system: A detector is provided for an x-ray imaging system. The detector includes a photosensitive region with an area less than half of an area of a scintillator cell, from which the photosensitive region receives light.... Agent: The Small Patent Law Group LLP

20070176113 - Electrospray-assisted laser desorption ionization device, mass spectrometer, and method for mass spectrometry: An electrospray-assisted laser desorption ionization device includes: an electrospray unit including a nozzle; a voltage supplying member disposed to establish between the nozzle and a receiving unit a potential difference such that liquid drops of the electrospray medium formed at the nozzle are laden with charges, and such that the... Agent: Foley And Lardner LLP Suite 500

20070176114 - Ion implantation system and control method: An ion implantation is disclosed that includes an ionization chamber having a restricted outlet aperture and configured so that the gas or vapor in the ionization chamber is at a pressure substantially higher than the pressure within an extraction region into which the ions are to be extracted external to... Agent: Patent Administrator Katten Muchin Rosenman LLP

20070176115 - Ion implantation system and control method: An ion implantation is disclosed that includes an ionization chamber having a restricted outlet aperture and configured so that the gas or vapor in the ionization chamber is at a pressure substantially higher than the pressure within an extraction region into which the ions are to be extracted external to... Agent: Katten Muchin Zavis Rosenman Attn: Patent Administrator

20070176116 - Self-shielded sterilization apparatus using electron beam irradiation: A self-shielded sterilization apparatus using an electron beam, comprising: an electron beam irradiator for irradiating an electron beam; a shielding for shielding the electron beam irradiated from the electron beam irradiator and a bremsstrahlung of the electron beam; a tray disposed within the shielding for placing thereon an object to... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20070176118 - Apparatus and method for sterilizing a spout assembly of a container: A system for subjecting articles and containers to microbiocidal radiation and for attaching the articles to the containers comprises a source (6) of microbiocidal radiation, a first conveying device (26) for advancing pour spout fitments (21) along a first path, a second conveying device (2) for advancing containers (4) along... Agent: Calfee Halter & Griswold, LLP

20070176117 - Method and apparatus for sterilizing intraluminal and percutaneous access sites: A method and apparatus for sterilizing access sites such as attachment points for various therapeutic and diagnostic medical devices. More particularly, the invention concerns a sterilization apparatus which includes a substantially UV-C transparent closure cap for closing the access site and a compact, easy to use irradiating apparatus for controllably... Agent: James E. Brunton, Esq.

20070176119 - Apparatuses and methods for analyzing semiconductor workpieces: Apparatuses and methods for analyzing semiconductor workpieces are disclosed herein. In one embodiment, for example, an apparatus for analyzing a semiconductor workpiece includes a first metrology unit configured to measure photoluminescence from the workpiece and a second metrology unit configured to determine a topographical profile of the workpiece. The apparatus... Agent: Perkins Coie LLP Patent-sea

20070176120 - Method for the selective sterilization of diagnostic test elements: The invention concerns a method for producing integrated, diagnostic test elements (1) which have a lancing area (2) and a detection area (3). The lancing area is used to generate an opening in the skin and the detection area is used to detect an analyte in a body fluid. The... Agent: Woodard, Emhardt, Moriarty, Mcnett & Henry LLP

20070176121 - Pressure sensor: A vacuum-driven gas gauge proximity sensor for sensing a difference between a reference surface standoff and a measurement surface standoff is disclosed. Unlike existing proximity sensors, the vacuum-driven gas gauge proximity sensor uses a vacuum to reverse the traditional flow of gas through a proximity sensor, such that gas flows... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20070176122 - Architecture for ribbon ion beam ion implanter system: An architecture for a ribbon ion beam ion implanter system is disclosed. In one embodiment, the architecture includes an acceleration/deceleration parallelizing lens system for receiving a fanned ribbon ion beam and for at least parallelizing (and perhaps also accelerate or decelerate) the fanned ribbon ion beam into a substantially parallel... Agent: Hoffman, Warnick & D'alessandro LLC

20070176123 - Ion implanter having a superconducting magnet: An ion beam implanter includes an ion beam source for generating an ion beam moving along a beam line and a vacuum or implantation chamber wherein a workpiece, such as a silicon wafer is positioned to intersect the ion beam for ion implantation of a surface of the workpiece by... Agent: Tarolli, Sundhelm, Covell & Tummino, LLP

20070176124 - Plasma doping method and plasma doping apparatus: Disclosed is a plasma doping method that, even though a plasma doping treatment is repeated, can make a dose from a film to a silicon substrate uniform for each time. According to an embodiment of the invention, there is provided a plasma doping method that places a sample on a... Agent: Mcdermott Will & Emery LLP

20070176125 - Particle beam therapy system and control system for particle beam therapy: A particle beam therapy system comprises a charged particle beam generator for generating a charged particle beam, two or more treatment rooms provided with respective irradiation devices for irradiating the charged particle beam, a beam line for transporting the charged particle beam extracted from the charged particle beam generator to... Agent: Dickstein Shapiro LLP

20070176126 - Multi-leaf collimator and a radiotherapy unit provided with the same: A multi-leaf collimator that narrows a radiation field to a predetermined shape is provided with leaf blocks movable in the direction of the radiation field and having pattern images drawn along the direction of movement on a predetermined surface, and detection part acquiring an image of fixed-point via fixed-point observation... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070176127 - Optical coating equipment and ultraviolet irradiative device: An optical coating equipment, which includes a delivery device, a coater head, and an ultraviolet irradiative device. The delivery device delivers a film. A liquid coating is coated on the film by the coater head. The ultraviolet irradiative-device includes a board assembly. When the coated film is delivered through the... Agent: Quintero Law Office, PC

20070176128 - Alignment systems and methods for lithographic systems: An alignment system for a lithographic apparatus has a source of alignment radiation; a detection system that has a first detector channel and a second detector channel; and a position determining unit in communication with the detection system. The position determining unit is constructed to process information from said first... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070176129 - Calibratable microwave circuit with illuminable gaas-fet, calibrating device and process: An electronic microwave circuit with GaAs field-effect transistors, which are integrated onto a semiconductor substrate, for switching high frequency electrical input signals has at least one light source for illuminating the GaAs field-effect transistors. The intensity of the light source and/or the color of the light source are changeable during... Agent: Marshall, Gerstein & Borun LLP

20070176130 - Measuring arrangement comprising a plurality of distance sensors, calibrating device therefor, and method for determining the topography of a surface: The invention relates to a measuring arrangement comprising a sensor head (13) that can be displaced over a surface (11) at a distance therefrom in a scanning direction (R), a plurality of distance sensors which are suitable for distance measurement and are interspaced in the scanning direction in a fixed... Agent: Whitham, Curtis & Christofferson & Cook, P.C.

20070176131 - Radiation image information detecting panel and radiation image information read-out system: A radiation absorbing phosphor layer including phosphors which absorb radiation and emit light according to the amount of the radiation, a stimulable photoconductive layer which generates electron-positive hole charges in an amount according to the amount of light and stores and records a radiation image information by trapping the charges... Agent: Sughrue Mion, PLLC