Radiant energy inventions 12/06

20060289721 - Device for detecting optical parameters of a laser beam: The present invention describes a device for the detection of optical parameters of a laser beam; the device comprises a sensitive element for intercepting the incident laser beam and thermosensitive elements which are capable of converting a temperature variation into an electric signal. The device comprises a first plurality of... Agent: Jacobson Holman PLLC

20060289723 - Layered microlens structures and devices: A microlens structure includes lower lens layers on a substrate. A sputtered layer of glass, such as silicon oxide, is applied over the lower lens layers at an angle away from normal to form upper lens layers that increase the effective focal length of the microlens structure. The upper lens... Agent: Dickstein Shapiro LLP

20060289722 - Probe for data storage apparatus: A probe for a data storage apparatus. The probe includes a coating layer formed on a tip of the probe, wherein a peak of the tip is exposed and the coating layer and the peak form a predetermined contact area with respect to a recording medium. In addition, the probe... Agent: Sughrue Mion, PLLC

20060289727 - Ball-based device for controlling the movement of a cursor, and optical unit for such a device: The invention proposes a device (20) comprising an actuation ball (30, FIG. 13), a casing (22) that surrounds the ball, elements (56) for guiding the ball in rotation, a first detection light source (LS1) for emitting at least one detection beam (EL1), and a detection sensor (126) to capture at... Agent: Leon D. Rosen Freilich, Hornbaker & Rosen

20060289726 - Circuit arrangement: A circuit arrangement is disclosed. The circuit arrangement includes a substrate, at least one sensor array arranged on and/or in the substrate, and at least one operating circuit integrated on and/or in the substrate and serving for driving the at least one sensor array. The operating circuit and the sensor... Agent: Harness, Dickey & Pierce, P.L.C

20060289724 - Fiber optic sensor capable of using optical power to sense a parameter: A sensor includes an optical-to-electrical conversion device that is operable to convert at least a portion of an optical power of an optical signal received by the sensor to electrical power. The sensor also includes a sensing device that is operable to detect one or more state properties of an... Agent: Brian J. Gaffney Baker Botts L.L.P.

20060289725 - Optical image acquisition method adapted to laser optical mouse: An optical image acquisition method adapted to a laser optical mouse, which makes optical input devices work on transparent media, in which the method generates a laser light and projects it in a vertical direction. The laser light is directed to an optical device and transmitted to an image-contacting surface... Agent: Rosenberg, Klein & Lee

20060289728 - Electromagnetic wave detector with an optical coupling surface comprising lamellar patterns: The invention relates to a detector comprising a multiple quantum well structure operating on interband or intersubband transitions by absorption of radiation having a wavelength λ having a polarization comprising a component perpendicular to the plane of the multiple quantum well structure, and comprising optical coupling means for coupling said... Agent: Lowe Hauptman Gilman & Berner, LLP

20060289729 - Light intensity detector: A polarization separating element such as a beam splitter receives a first light of a first polarization plane. The polarization separating element derives out of the first light a second light of a second polarization plane set perpendicular to the first polarization plane. A photoelectric element converts the second light... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20060289730 - Multimode optical transmission apparatus and multimode optical transmission system: Provided is a multimode optical transmission system for reducing a deterioration of a noise characteristic and a distortion characteristic caused by an interference between modes. In an optical transmitter 11, a signal output section outputs a predetermined signal based on an inputted electrical signal. A control section 130 controls the... Agent: Wenderoth, Lind & Ponack L.L.P.

20060289731 - Optical scanning device and image forming apparatus using the same: There is provided a diffraction grid which is easily produced without reducing a grid size. There is provided an optical scanning device having effects such as a chromatic aberration correction and a temperature compensation even when a short wavelength light source having a wavelength of 500 nm or less is... Agent: Fitzpatrick Cella Harper & Scinto

20060289732 - Scanning device and device having lid: A scanning device including a main body, a lid and an extendable plate is provided. The lid is pivotally connected to the main body. The extendable plate has a first side and a second side. The first side is fixed on the lid, and the second side is pivotally connected... Agent: Rabin & Berdo, PC

20060289733 - Stack-type image sensor module: An image sensor module includes an image-sensing unit having a first surface, a second surface and a plurality of first conductive contacts arranged at the second surface, a signal processing unit mounted on the first surface of the image-sensing unit and provided with a plurality of second conductive contacts respectively... Agent: Bacon & Thomas, PLLC

20060289734 - Increased depth of field for high resolution imaging for a matrix-based ion source: The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample plate onto which samples are deposited. The method generally includes: a) positioning an... Agent: Agilent Technologies Inc.

20060289736 - Mass analysis method and mass analysis apparatus: The present invention achieves a mass analysis method that can identify protein or peptide with high speed and high sensitivity. A mass spectrum is obtained from a standard sample of healthy person, an ion is selected from the mass spectrum as a precursor ion, and a mass spectrum of the... Agent: Mcdermott Will & Emery LLP

20060289735 - Mass spectrometric analysis method and system using the method: A tandem analysis system is provided for ionizing a substance, performing mass spectrometric analysis of various ion types generated, selecting and dissociating an ion type, the ion type having a specific mass-to-charge ratio, and thereby, repeating mass spectrometric analysis measurement on the ion of the ion type over n-th stages.... Agent: Antonelli, Terry, Stout & Kraus, LLP

20060289737 - Mass spectrometric mixture analysis: The invention relates to a mass spectrometric mixture analysis to determine both simple mass spectra of the substances as well as more detailed information about structures and other characteristics of the substances. The invention consists in temporally separating the substance mixture in a separating device, splitting the eluating flow of... Agent: Law Offices Of Paul E. Kudirka

20060289738 - Measurement of light fragment ions with ion traps: The invention relates to methods for the measurement of fragment ion spectra in ion trap mass spectrometers in which fragment ions below a cut-off mass cannot normally be measured. The invention consists in measuring mass spectra including light fragment ions by briefly conducting the collisionally induced fragmentation—which is always brought... Agent: Law Offices Of Paul E. Kudirka

20060289739 - Method and its apparatus for mass spectrometry: The present invention relates to a data processing device for mass spectrometry, in which measurements are performed in a high dynamic range without causing an overrange in an A/D converter in any TOF scan. A data acquisition circuit of a mass spectrometer includes an amplitude value computing circuit which measures... Agent: Antonelli, Terry, Stout & Kraus, LLP

20060289740 - Statistical methods applied to surface chemistry in minerals flotation: The present invention provides a method of analysis which couples principle component analysis (PCA) with ToF-SIMS for obtaining surface chemical information from minerals. Statistical methods, based on the monolayer-sensitive time of flight secondary ion mass spectrometry (ToF-SIMS) technique, combined with principal component analysis (PCA) identifies combinations of factors strongly correlated... Agent: Ralph A. Dowell Of Dowell & Dowell P.C.

20060289742 - Gas monitoring apparatus: A gas monitoring apparatus includes a sample introducing portion, a measurement portion, an ionization portion, a mass analysis portion, a data processing portion and a display. The sample introducing portion introduces a sample gas including an object material to be measured. The measurement portion measures a concentration of a predetermined... Agent: Reed Smith LLP

20060289743 - Mass spectrometer: A mass spectrometer capable of realizing a high-sensitivity ion analysis and a high ion selectivity performance. The mass spectrometer includes the ion source where ions are produced, the ion trap where ions are accumulated, isolated, dissociated, and ejected, the detector to detect ions to be detected, and the controller to... Agent: Stanley P. Fisher Reed Smith LLP

20060289741 - Methods and compositions for combining ions and charged particles: The invention provides an apparatus for combining ions and charged particles. In general, the apparatus contains: a) a multipole device having an ion exit end; b) a mass analyzer; and c) a source of charged particles. The apparatus is configured so that charged particles produced by the source of charged... Agent: Agilent Technologies Inc.

20060289745 - Combined mass and differential mobility spectrometry and associated methods, systems, and devices: The invention relates generally to systems, methods and devices for analyzing samples and, more particularly, to systems using a mass analyzer in combination with a differential mobility spectrometer to enhance the analysis process of constituents of a sample.... Agent: Fish & NeaveIPGroup Ropes & Gray LLP

20060289744 - Method and apparatus for mass selective axial transport using quadrupolar dc: A mass spectrometer system and a method of operating a mass spectrometer are provided. An RF field is produced between the plurality of rods to radially confine the ions in the rod set. The RF field has a resolving DC component field. The resolving DC component field is varied along... Agent: Bereskin And Parr

20060289747 - Multi-beam ion mobility time-of-flight mass spectrometer with bipolar ion extraction and zwitterion detection: The present invention relates generally to instrumentation and methodology for the characterization of chemical samples in solutions or on a surface which is based on modified ionization methods with or without adjustable pH and controllable H-D exchange in solution, an improved ion mobility spectrometer (IMS), a multi-beam ion pre-selection of... Agent: Fulbright & Jaworski, LLP

20060289746 - Multi-beam ion mobility time-of-flight mass spectrometry with multi-channel data recording: The content of the invention comprises a concept of multi-beam ion pre-selection from a single sample, coordinated mobility (against the gas flow) separation, cooling ions in supersonic gas flow and mass separation of thus low divergent ions by single or plural compact high-resolution orthogonal time-of-flight mass spectrometers both linear or... Agent: Fulbright & Jaworski, LLP

20060289748 - Particle detector for secondary ions and direct and or indirect secondary electrons: A multi-purpose efficient charge particle detector that by switching bias voltages measures either secondary ions, or secondary electrons (SE) from a sample, or secondary electrons that originate from back scattered electrons (SE3), is described. The basic version of the detector structure and two stripped down versions enable its use for... Agent: Bacon & Thomas, PLLC

20060289750 - Macro-placement designing apparatus, program product, and method considering density: According to an embodiment of the invention, a pattern density checking program product for causing a computer including a storage unit prestoring chip data about a pattern density check target chip and mask data of the chip to execute a pattern density checking process, includes: a first step of reading... Agent: Foley And Lardner LLP Suite 500

20060289749 - Method for determining material interfacial and metrology information of a sample using atomic force microscopy: A method for determining interfacial information and critical dimensions of a sample using atomic force microscopy. Tip-specimen deconvolution is performed on the scan lines before the critical dimension information processing. Local maxima and minima or local slope change of each scan line are found on a plurality of scan lines.... Agent: Zilka-kotab, PC

20060289753 - Charged particle beam apparatus: The charged particle beams is provided, which can analyze contamination of the inner wall of the system without being disassembled and supply information on appropriate maintenance timing. The contamination level of the inner wall of the system is identified by measuring the spectrum of the X-rays emitted from the inner... Agent: Mcdermott Will & Emery LLP

20060289754 - Charged particle beam apparatus: The charged particle beams is provided, which can analyze contamination of the inner wall of the system without being disassembled and supply information on appropriate maintenance timing. The contamination level of the inner wall of the system is identified by measuring the spectrum of the X-rays emitted from the inner... Agent: Mcdermott Will & Emery LLP

20060289751 - Charged particle beam apparatus and automatic astigmatism adjustment method: According to the invention, techniques for automatically adjusting for astigmatism in a charged particle beam apparatus. Embodiments according to the present invention can provide a charged particle beam apparatus and an automatic astigmatism adjustment methods capable of automatically correcting astigmatism and a focal point in a relatively short period of... Agent: Townsend And Townsend And Crew, LLP

20060289757 - Electron beam system and electron beam measuring and observing methods: To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample. The electron beam system has a correction factor storing section 32 for storing a correction factor at a reference tilt angle with respect... Agent: Foley And Lardner LLP Suite 500

20060289755 - Electron microscope application apparatus and sample inspection method: A charge control electrode emitting photoelectrons is disposed just above a wafer (sample) in parallel thereto, and the electrode has a through hole so that ultraviolet light can be irradiated to the wafer through the charge control electrode. Specifically, a metal plate which is formed in mesh or includes one... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20060289752 - Observing method and its apparatus using electron microscope: The present invention relates to high-speed acquisition of both a perpendicular observation image and a tilt observation image, in observation using a scanning electron microscope. An electron-beam observation apparatus includes: a first electro-optical system which scans a converged electron beam from a substantially perpendicular direction to a defect on a... Agent: Antonelli, Terry, Stout & Kraus, LLP

20060289756 - Standard reference for metrology and calibration method of electron-beam metrology system using the same: An electron-beam metrology system includes a specimen stage to mount a specimen on which a device pattern is formed, electron optics to radiate the device pattern with an electron-beam, a secondary electron detector to detect a secondary electron generated by the radiation of the electron-beam, and an information processing system... Agent: Antonelli, Terry, Stout & Kraus, LLP

20060289758 - Engraving and marking device particularly for machine tools and the like: An engraving and marking device, usable in machine tools and the like, includes a supporting member provided with a coupling which is engaged by a spindle of a machine tool and supports a toolbit by means of an elastic support. The device is adapted to engrave and mark a piece... Agent: Coleman Sudol Sapone, P.C.

20060289759 - Apparatus and method of control of unruly persons: A method of controlling unruly persons comprising identifying an area containing unruly persons refusing to respond to rule of law, filling the area with a non-toxic, non-injurious fogging material which interferes with the visual sense of persons in the area so as to prevent the persons from orienting themselves within... Agent: Ade & Company Inc.

20060289760 - Using same optics to image, illuminate, and project: A system for directing light in an interactive display system so as to perform multiple functions. In addition to projecting images on the interactive display system, the system is used to distribute infrared (IR) light onto the display surface, and/or to receive and focus received IR light reflected from a... Agent: Ronald M. Anderson Microsoft Corporation

20060289761 - Nanowire based plasmonics: Nanoscaled, tunable detector devices for ultrasensitive detection of terahertz (THz) radiation based on the fabrication of one-dimensional (1D) plasma devices having clouds of strongly correlated and spatially confined electronic charge carriers are disclosed. These one-dimensional collective excitations (“plasmons”) are realized using coaxial semiconducting core-shell nanowires or by electrostatically confining a... Agent: Knoble, Yoshida & Dunleavy

20060289762 - Thermal direction unit: A device, and method for its use, which may be worn by a firefighter for detecting the source of a fire in a smoke-filled or noisy environment, the device having directional infrared sensors for detecting the direction of maximum or minimum intensity of infrared radiation in two or more directions... Agent: Christopher Kay Law Office Of Christopher Kay

20060289763 - Apparatuses for and methods of monitoring optical radiation parameters for substrate processing operations: One or more problems related to processing workpieces using processes that involve optical radiation are presented along with solutions to one or more of the problems. One embodiment of the invention comprises a sensor apparatus for collecting optical radiation data representing one or more process conditions used for processing a... Agent: Larry Williams

20060289764 - Infrared radiation detector: Electronic devices are disclosed that may be used for infrared radiation detection. An example electronic device includes a substrate, a transistor included in the substrate and a silicon-germanium (Si—Ge) structural layer coupled with the transistor. The structural layer has a stress in a predetermined range, where the predetermined range for... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20060289765 - Method and system for calibrating a computed tomography system: Methods and systems for calibrating a Computed Tomography (CT) system are provided. The method includes selectively activating each of a plurality of elements of a detector in the CT system. The method further includes determining for each of the selectively activated elements, a crosstalk effect on elements adjacent to the... Agent: Patrick W. Rasche (12553 - 1000)

20060289766 - Spectral filter system for infrared imaging of substrates through coatings: An improved system for visual inspection of substrates coated with paints and polymers is disclosed. Painted substrates can be inspected for environmental and physical damage such as corrosion and cracks without removing the paint. The present invention provides the ability to maximize paint thickness penetration. This is accomplished with a... Agent: Alan G. Towner Pietragallo, Bosick & Gordon LLP

20060289768 - Portable infrared camera: An infrared camera provided with a rotating lens. The exterior of the camera is also provided with a touch screen display as well as a switch device such as a 5-way switch, controlling many of the functions of the infrared camera. The rotation of the lens would allow an operator... Agent: Hoffman, Wasson & Gitler, P.C.

20060289767 - Reflective mirror structure: The invention discloses an improved reflective mirror structure used together with a sensor, and the reflective mirror includes at least one elliptic curved surface, and the elliptic curved surface has a first focus and a second focus, and the sensing area of the sensor is located at the second focus.... Agent: Birch Stewart Kolasch & Birch

20060289770 - Cassette reading processing device, cassette reading processing method and cassette: A cassette to record a radiation image of an object to be radiographed, is provided with a sheet-shaped recording medium including a layer of needle imaging plate having a thickness of 20 μm to 2 mm, wherein the needle imaging plate are formed by a deposition method; a front member... Agent: Frishauf, Holtz, Goodman & Chick, PC

20060289769 - Electromagnetic radiation detecting apparatus, radiation detecting apparatus, radiation detecting system and laser processing method: As to an electromagnetic radiation detecting apparatus, a radiation detecting apparatus, a radiation detecting system and a laser processing method, a TFT is disposed on an insulating substrate. A conversion element converting electromagnetic radiation into an electric signal is disposed over the TFT. A member for marking the position of... Agent: Fitzpatrick Cella Harper & Scinto

20060289772 - Visible light and ir combined image camera with a laser pointer: Methods and apparatuses of registering on a camera display separate fields of view of a visible light camera module and an infrared camera module by focusing the IR camera module. The fields of view can be displayed in several display modes including 1) full screen visible, infrared and/or blended, 2)... Agent: Intellectual Property Group Fredrikson & Byron, P.A.

20060289773 - Method and apparatus for reducing polarization within an imaging device: A method of reducing polarization within an image detecting device includes coupling at least one blocking contact to the image detecting device, and heating the image detecting device to facilitate reducing polarization within the image detecting device.... Agent: The Small Patent Law Group LLP

20060289774 - Radiographic imaging apparatus, control method thereof, and radiographic imaging system: A radiographic imaging apparatus includes a radiation detection circuit in which a plurality of conversion elements to convert radiation emitted from a radiation source and transmitted through an object into an electrical signal are arranged two-dimensionally, a driving mechanism which changes a positional relationship between the object and the radiation... Agent: Fitzpatrick Cella Harper & Scinto

20060289771 - Triggering system and method: Described is a triggering arrangement including a power supply, a lighting arrangement and a switch. The lighting arrangement is coupled to the power supply. The switch is coupled to the lighting arrangement and the power supply. When the switch is in a first position, the lighting arrangement generates light to... Agent: Fay Kaplun & Marcin, LLP

20060289775 - Nuclear threat detection: A detector for detecting radiation, the detector comprising: a plurality of elongate scintillator segments arranged in a side by side array; and at least one pair of light sensors optically coupled to ends of each of the elongate scintillator such that they receive light from scintillations produced in the scintillator... Agent: Wolf, Block, Schorr & Solis-cohen LLP

20060289776 - Method and apparatus for reversing performance degradation in semi-conductor detectors: A system reverses degraded energy resolution of semiconductor radiation detection elements (44) which are used in a radiation detector assembly. A means (38) identifies semiconductor elements which exhibit degraded energy resolution as compared to an initial level of energy resolution after application of the forward bias. A means (40) restores... Agent: Philips Intellectual Property & Standards

20060289777 - Detector with electrically isolated pixels: In accordance with an implementation of the present technique, a detector is disclosed. The detector includes a photodetector array and a substrate layer. The photodetector array includes a plurality of photodiodes and a structure of trenches or diffusions grids that electrically isolate each photodiode of the plurality of photodiodes. The... Agent: Patrick S. Yoder Fletcher Yoder

20060289778 - Apparatus and method for detection of vacuum ultraviolet radiation: Vacuum ultraviolet radiation detection apparatus (10) comprises a radiation detector (30) in a chamber (12). The detector (30) receives ultraviolet radiation from a radiation source (36). The chamber is evacuated using a dry vacuum pump (18) to a relatively poor vacuum of no less than 5 Pa. UV transparent gas... Agent: Haynes And Boone, LLP

20060289779 - Uv radiation detection and warning apparatus and method: An ultraviolet radiation indicator system includes a wireless telephone adapted communication with wireless communication network having a positioning system, such as an enhanced emergency services function. A plurality of radiation sensors that sense ultraviolet radiation are arranged in predetermined areas. The radiation sensors are adapted for communication with the wireless... Agent: Philips Intellectual Property & Standards

20060289780 - Afterglow detection and count rate generation in a nuclear imaging system: The afterglow and count rate/dead time of a nuclear imaging detector are calculated for use in correcting event detection and energy integration circuits. Energy value signals and event triggering signals are respectively integrated as a function of the decay setting of the detector, until they reach stable values, which are... Agent: Siemens Corporation Intellectual Property Department

20060289781 - Method and apparatus for applying charged particle beam: In a charged particle beam applying apparatus such as an electron beams lithography system, there is a technology that facilitates positional adjustment of a crossover and improves throughput of the apparatus. A front focal plane of a condenser lens is provided with a sharp end face (crossover regulation edge) for... Agent: Reed Smith LLP

20060289782 - Apparatus for producing ions from an electrospray assembly: The present invention relates to an apparatus for producing ions from an electrospray assembly. The apparatus comprises an ionization chamber, an electrospray assembly, an isolating electrode, an isolated ionization region within the ionization chamber and optionally, a vacuum interface at a vacuum interface voltage and a vacuum chamber. Sample is... Agent: Agilent Technologies Inc.

20060289783 - Microscope stage with flexural axis: A microscope stage with a flexural axis may exhibit predictable flexure characteristics and limited cross-coupling translations. Z motion of a Z plate proximate to a Z actuator may be substantially linear, while a distal side of the Z plate may be allowed to rotate about a hinge axis associated with... Agent: Pillsbury Winthrop Shaw Pittman LLP

20060289784 - Specimen holder for electron microscope: A specimen holder has two levers on which probes for current measurement are carried. The levers are in contact with a spherical body, the spherical body acting as a pivotal point. When the levers are pushed by micrometer heads, the probes move in the X-direction. When the levers are pulled,... Agent: The Webb Law Firm, P.C.

20060289785 - Method for both time and frequency domain protein measurements: The invention relates to methods and devices for luminescent (e.g., fluorometric) measurement. The disclosure includes frequency domain and single photon counting methods and utilizes low capacitance semiconductor light emitting devices.... Agent: Anthony C. Kuhlmann, Ph.d. Brown Rudnick Berlack Israels LLP

20060289787 - Optical assay system: Optical reader (33, 43, 53, 63, 73, 83) for an optical assay arrangement comprising a polymeric sample substrate (1) having a reaction site-area (5) provided with protruding microstructures (2), the optical reader comprising a light source (6, 11) for illuminating the reaction site-area (5), and a detector device (7, 12)... Agent: Morrison & Foerster LLP

20060289786 - System and method for a pulsed light source used in fluorescence detection: A system and method for a pulsed light source used in detecting fluorescence from a plurality of samples of biological material discretely, continuously or intermittently during thermal cycling of DNA to accomplish a polymerase chain reaction (PCR). An apparatus for sampling at least one sample of a biological material comprises... Agent: Palmer & Dodge, LLP Kathleen M. Williams / Str

20060289788 - Apparatus and method for enhanced critical dimension scatterometry: Scatterometers and methods of using scatterometry to determine several parameters of periodic microstructures, pseudo-periodic structures, and other very small structures having features sizes as small as 100 nm or less. Several specific embodiments of the present invention are particularly useful in the semiconductor industry to determine the width, depth, line... Agent: Perkins Coie LLP Patent-sea

20060289789 - Apparatus and method for enhanced critical dimension scatterometry: Scatterometers and methods of using scatterometry to determine several parameters of periodic microstructures, pseudo-periodic structures, and other very small structures having features sizes as small as 100 nm or less. Several specific embodiments of the present invention are particularly useful in the semiconductor industry to determine the width, depth, line... Agent: Perkins Coie LLP Patent-sea

20060289790 - Apparatus and method for enhanced critical dimension scatterometry: Scatterometers and methods of using scatterometry to determine several parameters of periodic microstructures, pseudo-periodic structures, and other very small structures having features sizes as small as 100 nm or less. Several specific embodiments of the present Invention are particularly useful in the semiconductor industry to determine the width, depth, line... Agent: Perkins Coie LLP Patent-sea

20060289792 - Cleansing member for opto-electro-mechanical scanning assemblies for photostimulable phosphor imaging plates: These and other objects of the present invention are attained by a cleansing member comprised of a flexible substrate having collection layers formed on one or both sides thereof having an adhesive capability of capturing dust, particulate material and the like, along the transport assembly of an image scanning assemblies.... Agent: Clifford G. Frayne

20060289793 - Method and apparatus for simultaneously depositing and observing materials on a target: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20060289794 - Immersion lithography with equalized pressure on at least projection optics component and wafer: An immersion lithography apparatus and method, and a lithographic optical column structure are disclosed for conducting immersion lithography with at least the projection optics of the optical system and the wafer in different fluids at the same pressure. In particular, an immersion lithography apparatus is provided in which a supercritical... Agent: Hoffman, Warnick & D'alessandro LLC

20060289795 - Vacuum reaction chamber with x-lamp heater: Methods and apparatus for electron beam treatment of a substrate are provided. An electron beam apparatus that includes a vacuum chamber, at least one thermocouple assembly in communication with the vacuum chamber; and a heating device in communication with the vacuum chamber and combinations thereof are provided. In one embodiment,... Agent: Patterson & Sheridan, LLP

20060289797 - Electron beam writing method, electron beam writing apparatus and semiconductor device manufacturing method: An electron beam writing method is disclosed, which includes preparing electron beam writing data structured from writing pattern data expressed by both data of VSB shots which are units of shaping beams at the time of carrying out writing a pattern and data of CP shots serving as bases of... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20060289796 - Uv-c sensitive composition and dosimeter: The invention is a UV sensitive composition that undergoes a color change upon exposure to a predetermined dosage of UV-C radiation. The UV-C sensitive composition comprises a halogenated polymer, such as polyvinylidene chloride, that produces an acid upon exposure to UV radiation, and a pH sensitive dye. Upon exposure to... Agent: Alston & Bird LLP

20060289803 - Apparatus and method for interlocking a power supply to ion implantation equipment, method and apparatus for generating an interlocking signal, method and apparatus for interrupting an ion implantation process, and an interlocking system: An apparatus and a method for interlocking power to ion implantation equipment. The apparatus may include a positive and a negative power supply which generates a positive voltage and a negative voltage respectively, a comparator which compares the positive voltage and the negative voltage, and a signal generating unit which... Agent: Harness, Dickey & Pierce, P.L.C

20060289801 - Focused ion beam system: A focused ion beam (FIB) system that can automatically set processing and scanning conditions under which a specimen is processed includes an arithmetic unit for selecting optical conditions for condenser lenses, multiple variable apertures, beam-deflecting electrodes, and an objective lens based on data entered into the input device. The arithmetic... Agent: The Webb Law Firm, P.C.

20060289800 - Implanting a substrate using an ion beam: This invention relates to a method of implanting a substrate comprising scanning an ion beam relative to a substrate along a series of scan lines extending in a first direction, causing relative rotation between the substrate and the ion beam, scanning the ion beam along a second series of scan... Agent: Robert W. Mulcahy Applied Materials, Inc.

20060289802 - Ion beam irradiation apparatus: Three axes that are orthogonal to each other at one point are taken as an X-axis, a Y-axis and a Z-axis. An irradiation angle setting motor holds a holder, and sets an irradiation angle θ of an ion beam by rotating this holder around a center axis that is parallel... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20060289798 - Methods & apparatus for ion beam angle measurement in two dimensions: An angle measurement system for an ion beam includes a flag defining first and second features, wherein the second feature has a variable spacing from the first feature, a mechanism to translate the flag along a translation path so that the flag intercepts at least a portion of the ion... Agent: Scott Faber Varian Semiconductor Equipment Associates, Inc

20060289799 - Profile adjustment in plasma ion implanter: A method and apparatus are directed to providing a dopant profile adjustment solution in plasma doping systems for meeting both concentration and junction depth requirements. Bias ramping and bias ramp rate adjusting may be performed to achieve a desired dopant profile so that shallow and abrupt junctions in vertical and... Agent: Varian Semiconductor Equipment Assc., Inc.

20060289804 - Particle-optical systems and arrangements and particle-optical components for such systems and arrangements: An electron-optical arrangement provides a primary beam path for a beam of primary electrons and a secondary beam path for secondary electrons. The electron-optical arrangement includes a magnet arrangement having first, second and third magnetic field regions. The first magnetic field region is traversed by the primary beam path and... Agent: Jones Day

20060289805 - Electron beam lithography apparatus, lithography method, lithography program, and manufacturing method of a semiconductor device: According to an aspect of the invention, there is provided an electron beam lithography apparatus including a first setting unit configured to set a drawing position on a semiconductor substrate based on layout information of the semiconductor substrate, a second setting unit configured to set a valid range on the... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20060289806 - Lpp euv drive laser input system: A laser produced plasma (“LPP”) extreme ultraviolet (“EUV”) light source and method of operating same is disclosed which may comprise an EUV plasma production chamber having a chamber wall; a drive laser entrance window in the chamber wall; a drive laser entrance enclosure intermediate the entrance window and a plasma... Agent: William C. Cray Cymer, Inc.

20060289807 - Radiopharmaceutical pig: A pharmaceutical pig is used to transport a syringe containing a liquid radiopharmaceutical from a radiopharmacy to a medical facility for administration to a patient. The pharmaceutical pig includes an elongate polymer cap that is removably attached to an elongate polymer base. The elongate polymer cap includes a cap shell... Agent: Mallinckrodt Inc.

20060289810 - Adjustment of distance between source plasma and mirrors to change partial coherence: According to an embodiment of the invention, an adjustable EUV light source may be used for photolithography. The EUV light source, such as an electrode, is mounted in an adjustable housing. The housing can be adjusted to change the distance between the light source and focusing mirrors, which in turn... Agent: Intel Corporation C/o Intellevate, LLC

20060289808 - Euv light source collector erosion mitigation: An EUV light source collector erosion mitigation system and method is disclosed which may comprise a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma; a replacement... Agent: William C. Cray Cymer, Inc., Legal Dept.

20060289809 - Ionization-based detection: Embodiments of the present invention relate to detector structures for use in a micro gas analyzer, preferably in a differential setup. The detector structures may comprise one or more detector types, such as photo-ionization (PID), electron capture (ECD), ion mobility (IMS), differential mobility (DMS), ion-trap mass spectrometer (ITMS), in which... Agent: Honeywell International Inc.

20060289811 - Lithographic apparatus and cleaning method therefor: A lithographic apparatus is disclosed. The apparatus includes a source for supplying hydrogen radicals, a guide for use in conjunction with the source, for directing hydrogen radicals to an application surface to be targeted by the hydrogen radicals. The guide is provided with a coating having a hydrogen radical recombination... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20060289812 - Optoelectronic semiconductor component with high light-emitting efficiency: An optoelectronic semiconductor component includes a housing including a light exit opening, a first semiconductor chip installed inside the housing for emitting light, and a second semiconductor chip located at a position inside the housing. A distance between the second semiconductor chip and the light exit opening is greater than... Agent: North America Intellectual Property Corporation

20060289813 - Paper detection apparatus and printing method: Provided is a paper detection apparatus for detecting the size of a sheet of paper transferred along a paper transfer path, which includes a light source and an optical sensor. A plurality of light emitting optical fibers are located at a first side of the paper transfer path and receive... Agent: Roylance, Abrams, Berdo & Goodman, L.L.P.

20060289814 - Method for erasing radiation energy remaining in radiation image storage panel: The step of erasing radiation energy remaining in a radiation image storage panel having an energy-storing phosphor layer composed of a phosphor in the form of columnar crystals and having been subjected to the step for reading a radiation image recorded in the storage panel according to a radiation image... Agent: Sughrue Mion, PLLC

20060284050 - Portable air defense ground based launch detection system: A ground based launch detection system consisting of a sensor grid of electro-optical sensors for detecting the launch of a threat missile which targets commercial aircraft in proximity to a commercial airport or airfield. The electro-optical sensors are configured in a wireless network which broadcast threat lines to neighboring sensors... Agent: Navairwd Counsel Group

20060284051 - Image sensor with anti-saturation function in pixel level: In a CMOS image sensor of the invention, a dynamic range is varied at a per-pixel level by a light amount to prevent saturation without degrading color reproduction of an overall image. A photo diode generates charges in accordance with a received light amount. A drive transistor amplifies the charges... Agent: Lowe Hauptman Berner, LLP

20060284053 - Imaging module: An imaging module is provided and includes: an imaging section that capturing an image of an object and outputs an image signal; a bus connected to the imaging means; a receiving section that receives the image signal through the bus; an image data generating section that generates an image data... Agent: Mcginn Intellectual Property Law Group, PLLC

20060284052 - Solid-state imaging device, solid-state imaging apparatus and manufacturing method thereof: The two-stage concentric circle structure of the distributed index lens is formed by SiO2 (n=2) with the film thickness 1.2 μm (“grey color”), the film thickness 0.8 μm (“dots pattern”) and the film thickness of 0 μm (“without pattern: white color”), and the medium surrounding the distributed index lens 1... Agent: Greenblum & Bernstein, P.L.C

20060284054 - Pixel circuit with low noise in image sensor: A pixel circuit of an image sensor includes a photo-converting unit such as a photo-diode for generating charge from incident light. The pixel circuit also includes a charge storing capacitor for storing the charge generated by the photo-converting unit. The pixel circuit further includes a floating diffusion node that receives... Agent: Law Office Of Monica H Choi

20060284055 - Image apparatus and tilting device: An imaging apparatus which can be reduced in size and secure a sufficient tilt angle. In the imaging apparatus, light is incident along a first optical axis on a first prism that is rotated by a tilting mechanism about a second optical axis, and is bent by the first prism... Agent: Rossi, Kimms & Mcdowell LLP.

20060284056 - Thin micropolarizing filter, and a method for making it: A polarizing filter includes a portion with a filtering layer having a plurality of openings extending therethrough, where this portion has a maximum physical thickness in a radiation travel direction which is less than approximately one wavelength of the radiation being filtered. A method of making the filter includes: forming... Agent: Baker Botts LLP

20060284057 - Color filter forming method and image sensor manufactured in the method: Provided is a method of forming a color filter of an image sensor. The method is achieved by forming a trench region in a predetermined area after forming a top metal layer of a pixel of the image sensor, and forming the color filter in the trench region. A part... Agent: Cantor Colburn, LLP

20060284058 - System and method for integrated sensing and control of industrial processes: An integrated spectral sensing engine is based on a combination of energy sources (illumination) and detectors housed within an integrated package that includes the sample interfacing optics and acquisition and processing electronics. The focus is on a miniaturized sensor system that can be optimized for specific measurements and can be... Agent: David Aker Attorney At Law

20060284059 - Optical fiber based surface sensing system that enables spectral multiplexing: A surface sensing system including at least two sensors located on the end of the same optical fiber. The sensors are configured such that they exhibit resonant frequencies or Q-factors that are distinguishable from each other, where the Q-factor is defined as the resonant frequency divided by the resonance spectrum... Agent: Agilent Technologies Inc.

20060284060 - Sheet conveyance roller and sheet processing apparatus: A sheet conveyance roller, having an axis; a rotational member that is provided at the outer peripheral part of the axis capable of rotating in accordance with rotation of the axis, and conveys the sheet abutting against the outer peripheral part upon rotation; and an IC tag having a storage... Agent: Fitzpatrick Cella Harper & Scinto

20060284062 - Illumination configuration for imaging-type optical encoders: An illumination configuration for imaging-type optical encoders is provided. The illumination configuration generates uniform brightness images of scales and two-dimensional structures when utilizing telecentric imaging optics in the encoder readhead. In one embodiment, a desirable uniform irradiance distribution is created across the field of view by illuminating with a collimated... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20060284061 - System and method for optical encoding on two opposed surfaces of a pattern medium: An optical encoder system is disclosed with a single pattern medium having a first coded pattern disposed on the first side, a second coded pattern disposed on the second side, a first optical encoder disposed toward the first side, and a second optical encoder disposed toward the second side. An... Agent: Avago Technologies, Ltd.

20060284063 - Laser scanning unit and tandem image forming apparatus having the same: A laser scanning unit includes a light source for emitting a plurality of laser beams, a rotating polygon mirror for deflecting the plurality of laser beams in a predetermined direction, an fθ lens for transmitting the deflected laser beams to be scanned onto the surfaces of a plurality of photosensitive... Agent: Roylance, Abrams, Berdo & Goodman, L.L.P.

20060284064 - Door assembly for a semi-automatic micro-hole plate single-photon counter: The present invention relates to a door assembly provided on the housing of a semi-automatic micro-hole plate single-photon counter, said door assembly being mounted on a door opening being cooperated with the door opening to open it or close it so as, said door assembly comprising a door shaft, a... Agent: Berenato, White & Stavish

20060284065 - Automated quality control mechanism for a nuclear detector: A quality control mechanism for a nuclear camera system having a field of view includes at least one source assembly for a radioactive material. The source assembly is configured to automatically remotely move the radioactive material into the field of view and automatically remotely move the radioactive material out of... Agent: Peter Kendall, Esq. Siemens Corporation

20060284066 - Pulsed-neutron formation density: A method and related system of determining formation density by compensating actual inelastic gamma rays detected from a pulsed-neutron tool for the effects of neutron transport. The method and systems may model response of the tool and use the modeled response as an indication of an amount to compensate detected... Agent: Conley Rose, P.C.

20060284070 - Control of the filling level in ion cyclotron resonance mass spectrometers: The invention relates to methods and devices for regulating the filling level in measuring cells of ion cyclotron resonance mass spectrometers so that it is optimal for mass resolution and mass accuracy. The invention consists in supplying a fraction of the samples to a second reference mass spectrometer operated in... Agent: Law Offices Of Paul E. Kudirka

20060284069 - Dynamic background signal exclusion in chromatography / mass spectrometry data-dependent data acquisition: Methods and systems for obtaining mass spectrographic data of a substance. Methods include subjecting a substance to a chromatographic process or other separating process, ionizing the output thereof, and subjecting the ionized output to recursive mass spectrometry analyses; and provide improved processing and analysis of data acquired during the repeated... Agent: Torys LLP

20060284068 - Mass spectrometric based method for sample identification: There is provided a mass spectrometric based method for sample identification, including the steps of introducing sample compounds into a vacuum chamber of a mass spectrometer in a seeded supersonic molecular beam, ionizing with electrons the sample compounds, being vibrationally cold molecules, in the supersonic molecular beam during their flight... Agent: Lackenbach Siegel, LLP

20060284067 - Methods for improved data dependent acquisition: A method of analyzing data from a mass spectrometer for a data dependent acquisition is described. In an embodiment of this method, mass spectral scans are taken of a sample eluted from a liquid chromatography column. An extracted ion chromatogram (XIC) is then created for each m/z data point of... Agent: Thermo Finnigan LLC

20060284071 - Beam stop and beam tuning methods: A system, method, and apparatus for mitigating contamination associated with ion implantation are provided. An ion source, end station, and mass analyzer positioned between the ion source and the end station are provided, wherein an ion beam is formed from the ion source and selectively travels through the mass analyzer... Agent: Eschweiler & Associates, LLC National City Bank Building

20060284072 - Mass spectrometer: A mass spectrometer capable of analyzing a wide mass range with high sensitivity and high mass accuracy. A mass spectrometer has an ionization source generating ions; an ion transfer optics transferring the ions; a first linear trap accumulating the ions and ejecting the ions in the specific mass range; a... Agent: Stanley P. Fisher Reed Smith LLP

20060284078 - Apparatus and method for maldi source control with external image capture: A method of MALDI sample plate processing includes capturing an image of a plate positioned outside a mass spectrometer. The image is processed to identify one or more attributes of an individual sample on the plate, where the attributes are selected from a position attribute, a geometry attribute and an... Agent: Agilent Technologies, Inc. Legal Department, Dl429

20060284079 - Apparatus and method for maldi source control with external image capture: A method of MALDI sample plate processing includes capturing an image of a plate positioned outside a mass spectrometer. The image is processed to identify one or more attributes of an individual sample on the plate, where the attributes are selected from a position attribute, a geometry attribute and an... Agent: Agilent Technologies, Inc. Legal Department, Dl429

20060284074 - Biological whole cell mass spectrometer: A method for identifying a biological organism that includes providing a biological sample corresponding to the biological organism, ionizing the biological sample to produce an ionized sample of the biological sample, performing a mass spectrometry analysis of the ionized sample, and identifying the biological organism in accordance with the mass... Agent: Fish & Richardson PC

20060284076 - Icp mass spectrometer: An ICP mass spectrometer comprising an ICP ion source, a mass analyzer having a magnetic sector field, a detector, an extraction element in the form of an ion funnel for transferring the generated ions into the mass analyzer and arranged between the ICP ion source and the mass analyzer, and... Agent: Robert W. Becker & Associates

20060284077 - Instruments for measuring nanoparticle exposure: An instrument for non-invasively measuring nanoparticle exposure includes a corona discharge element generating ions to effect unipolar diffusion charging of an aerosol, followed by an ion trap for removing excess ions and a portion of the charged particles with electrical mobilities above a threshold. Downstream, an electrically conductive HEPA filter... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20060284073 - Method and apparatus for analysing combustion products: A method of analysing a sample, such as a fuel, comprises feeding the sample to a combustion chamber 2, the at least partial combustion of the sample in the combustion chamber 2 to form combustion products, the removal of the combustion products from the combustion chamber 2, the feeding of... Agent: Haynes And Boone, LLP

20060284075 - No-fragmentation micro mass spectrometer system: A system for effecting a soft or gentle ionization technique to avoid fragmentation of analyte molecules provided to a micro mass spectrometer for analysis. To ionize the analyte molecules, the system may be based on proton transfer reaction (PTR) for ionization, UV light to generate either positive or negative ions,... Agent: Honeywell International Inc.

20060284080 - Obtaining tandem mass spectrometry data for multiple parent ions in an ion population: This invention relates to tandem mass spectrometry and, in particular, to tandem mass spectrometry using a linear ion trap and a time of flight detector to collect mass spectra to form a MS/MS experiment. The accepted standard is to store and mass analyze precursor ions in the ion trap before... Agent: Thermo Finnigan LLC

20060284081 - Method and apparatus for arranging recipe of scanning electron microscope and apparatus for evaluating shape of semiconductor device pattern: In order to provide an imaging-recipe arranging or creating apparatus and method adapted so that selection rules for automatic arrangement of an imaging recipe can be optimized by teaching in a SEM apparatus or the like, the imaging-recipe arranging or creating apparatus in this invention that arranges an imaging recipe... Agent: Antonelli, Terry, Stout & Kraus, LLP

20060284082 - Method for extracting the distribution of charge stored in a semiconductor device: A method is described for extracting the spatial distribution of charge stored in a charge-trapping layer of a semiconductor device. The method comprises the steps of performing a first charge-pumping measurement on a device under test using a variation of the upper level of the pulse and performing a second... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20060284087 - Defect inspection and changed particle beam apparatus: In a defect inspection apparatus which combines a plurality of probes for measuring electric properties of a specimen including a fine circuit line pattern with a charged particle beam apparatus, the charged particle beam apparatus reduces a degradation in resolution even with an image-shift of ±75 μm or more. The... Agent: Mcdermott Will & Emery LLP

20060284085 - Electrochemical nano-patterning using ionic conductors: The present invention provides nano-patterning based on flow of an ion current within an ionic conductor to bring ions in proximity to a microscope probe tip touching a surface of the conductor. These ions are then electrochemically reduced to form one or more features on the surface. Ion current flow... Agent: Lumen Intellectual Property Services, Inc.

20060284084 - Probe manufacturing method, probe, and scanning probe microsope: The method of producing a probe is a method of producing a probe comprised of a carbon nanotube 12, a mounting base ends 13 holding this carbon nanotube, and a coating film 17 bonding the carbon nanotube to a mounting base, comprising performing the mounting work of the carbon nanotube... Agent: Mattingly, Stanger, Malur & Brundidge

20060284083 - Scanning type probe microscope and probe moving control method therefor: The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is measured when the probe tip scans the... Agent: Mattingly, Stanger, Malur &brundidge

20060284086 - Ultrasonic probe: The invention relates to an oscillating ultrasonic probe that comprises a group of piezoelectric elements consisting of a plurality of narrow card-shaped piezoelectric elements arrayed in a long-axis direction and connecting wires such as a flexible substrate which are connected electrically to those piezoelectric elements and which extends outward from... Agent: Edwards & Angell, LLP

20060284089 - Calibration standard: The invention relates to a calibration standard, especially for the calibration of devices for the non-destructive measurement of the thickness of thin layers, with a carrier layer (12) consisting of a basic material and a standard (17) applied on the carrier layer (12), said standard having the thickness of the... Agent: Kriegsman & Kriegsman

20060284088 - Focus correction method for inspection of circuit patterns: A charged particle application circuit pattern inspection apparatus and method are disclosed, in which the reduction in the rejection rate attributable to an out-of-focus state due to the change in the charge condition on the sample surface is prevented and the false information is reduced to improve the apparatus reliability.... Agent: Mcdermott Will & Emery LLP

20060284090 - Material processing system and method: A material processing system for processing a work piece is provided. The material processing is effected by supplying a reactive gas and energetic radiation for activation of the reactive gas to a surrounding of a location of the work piece to be processed. The radiation is preferably provided by an... Agent: Jones Day

20060284093 - Electron beam device: Disclosed here is a high resolution scanning electron microscope having an in-lens type objective lens. The microscope is structured so as to detect transmission electrons scattering at wide angles to observe high contrast STEM images according to each sample and purpose. A dark-field detector is disposed closely to the objective... Agent: Dickstein Shapiro LLP

20060284092 - Scanning transmission ion microscope: Scanning Transmission Ion Microscope. The microscope includes a bright helium ion source to generate an ion beam and a focusing electrostatic optical column to focus the ion beam. A translation stage supports a sample to receive the focused ion beam and a detector responds to ions transmitted through the sample... Agent: Fish & NeaveIPGroup Ropes & Gray LLP

20060284091 - Transmission ion microscope: Transmission ion microscope. A bright light ion source generates an ion beam that is focused on a sample by an electrostatic condenser lens means. An objective lens focuses the ion beam transmitted through the sample to form an image. A projector lens enlarges the image and a phosphor screen receives... Agent: Fish & NeaveIPGroup Ropes & Gray LLP

20060284094 - Detection of nuclear materials: A method for detecting Special Nuclear Materials (SNM) or Radiological dispersion Devices (RDD), comprising: conveying an object along a predetermined path; imaging a distribution of radioactive sources associated with the object as it passes along said path; determining the presence and location of one or both of an RDD or... Agent: Wolf, Block, Schorr & Solis-cohen LLP

20060284095 - Real-time list mode reconstruction: In positron emission tomography, a nuclear medicine scanner is utilized to detect γ-ray events resulting from positron annihilation events. Molecules with known behaviors are tagged with radioactive isotopes which decay into γ-ray pairs which are detected coincidentally, i.e. in a near-simultaneous fashion, by radiation detectors. A temporal recorder and a... Agent: Philips Intellectual Property & Standards

20060284096 - Method for combining pet with mr perfusion and diffusion: A method for determining positron emission measurement information in the context of positron emission tomography is disclosed. The method includes using a marker substance to carry out a positron emission measurement, in a body area of a subject to be examined, to determine positron emission measurement information, and at the... Agent: Harness, Dickey & Pierce, P.L.C

20060284098 - Acquisition window compensation for nuclear medical image reconstruction attenuation coefficient maps: Generation of attenuation maps for nuclear medicine image reconstructions based on the use of anatomical image data, such as CT data, take into account variations caused by variations in acquisition energy width and emission energy of the radioisotope used in the clinical imaging procedure, as coefficient correction factors that are... Agent: Siemens Corporation Intellectual Property Department

20060284099 - Device and method for computer tomography: A device and a method for computer tomography are described, in which an uncorrected volume image and a correction volume image are overlaid by the user after selection of a weighting function. This enables manual correction to be undertaken even after the correction of interference effects, such as x-ray scattering... Agent: Siemens Corporation Intellectual Property Department

20060284097 - Simultaneous scanning by computed tomography (ct) and single photon emission computed tomography (spect) with automatic patient motion correction: A method for simultaneous CT and SPECT imaging in which CT data is acquired during each SPECT data acquisition window. SPECT scanning requires several seconds or minutes of gamma detection at each of several angular positions. CT scanning requires short duration X-ray pulses at each of several angular positions. In... Agent: Siemens Corporation Intellectual Property Department

20060284100 - Pipeline processing of pulse pile-up correction in a nuclear medicine imaging system: Correction of scintillation event data from a nuclear medicine imaging system for effects of pulse pile-up is carried out by separating event data packets into total energy and individual detector energy data packets, executing pile-up correction algorithms on each of the separated packets simultaneously using a pipeline processing architecture, and... Agent: Siemens Corporation Intellectual Property Department

20060284101 - Detector assembly: The invention is related to a detector assembly for detecting vapours, smoke and flames, comprising a detector unit 1 having a UV sensitive photocathode 3, an anode 5, a voltage supply unit 9 connected to the UV sensitive photocathode 3 and to the anode 5 to create an electric field... Agent: Harness, Dickey & Pierce, P.L.C

20060284102 - Coupled ionization apparatus and methods: Apparatus for generating ions in a gaseous medium, the apparatus including two electrodes separated by a dielectric material and a means for generating radio frequency pulses. The electrodes are of dissimilar size and are attached to opposite sides of the dielectric material. The smaller electrode shape and circumference is configured... Agent: Dinsmore & Shohl, LLP

20060284103 - Glow discharge and photoionization source: A detector that may contain a glow discharge ionizer and a photo-ionizer. The existence of both ionizers may increase the accuracy and number of chemical compounds that can be simultaneously monitored for chemical screening applications. The detector is particularly useful for screening explosives, chemical agents, and other illicit chemicals.... Agent: Irell & Manella LLP

20060284104 - Ion source: A cathode holder of a tubular shape is inserted into an opening for a cathode of a plasma generating chamber with a tip of the cathode holder positioned outward from an inner wall surface of the plasma generating chamber. The cathode is held in the cathode holder so that a... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20060284106 - Atmospheric pressure ion source high pass ion filter: For generation and delivery of ions from an ionization chamber through an ion entrance orifice to a mass analyzer operating at high vacuum, high pass ion filtration is effected within the ionization chamber by application of electrical potentials to an electrode associated with the ion entrance orifice and to an... Agent: Agilent Technologies, Inc. Legal Department, Dl429

20060284105 - Ion source: An ion source in which some of positive ions produced in the ionization chamber are accelerated toward a cathode and collide against a nonmagnetic member causing sputtering. Since the sputtered particles are not magnetic in nature, the particles uniformly deposit on the anode without being affected by the magnetic field... Agent: The Webb Law Firm, P.C.

20060284107 - Device for ionization of fluids, especially of water, alcoholic and non-alcoholic drinks: Device, suitable for ionization of fluids, especially of water, alcoholic and non-alcoholic drinks, according to the solution consists in that it comprises a chamber (1) and vessel (2). Chamber (1), which has a cylindrical or conical or square or oblong or spherical shape, is provided with material (3) and an... Agent: Oppedahl & Olson LLP

20060284108 - Apparatus for evacuating a sample: v

20060284109 - Mobile germicidal system: There is disclosed a mobile germicidal system and a process of decontaminating a wall and a ceiling of a room of undesirable substances. The system comprises a frame, a displacement device and an germicidal lamp. The displacement device is selected from the group comprising a wheel, a castor, a ball,... Agent: SocalIPLaw Group LLP

20060284110 - Demagnification measurement method for charged particle beam exposure apparatus, stage phase measurement method for charged particle beam exposure apparatus, control method for charged particle beam exposure apparatus, and charged particle beam exposure a: A method for measuring a demagnification of a charged particle beam exposure apparatus includes measuring a first stage position of a mask stage in accordance with a mask stage coordinate system, irradiating a first charged particle beam to a first irradiation position on a specimen through the opening portion of... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20060284112 - Apparatus and method for specimen fabrication: A specimen fabricating apparatus comprises: a specimen stage, on which a specimen is placed; a charged particle beam optical system to irradiate a charged particle beam on the specimen; an etchant material supplying source to supply an etchant material, which contains fluorine and carbon in molecules thereof, does not contain... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20060284111 - Device and method for electron beam irradiation: The present invention refers to a device for electron beam irradiation of at least a first side of a web, the device comprising a tunnel through which the web is adapted to pass, said tunnel being provided with a web inlet portion, a web outlet portion and a central portion... Agent: Buchanan, Ingersoll & Rooney PC

20060284113 - Off-axis projection optical system and extreme ultraviolet lithography apparatus using the same: e

20060284117 - Charged beam dump and particle attractor: A system, method, and apparatus for mitigating contamination during ion implantation are provided. An ion source, end station, and mass analyzer positioned between the ion source and the end station are provided, wherein an ion beam is formed from the ion source and travels through the mass analyzer to the... Agent: Eschweiler & Associates, LLC National City Bank Building

20060284115 - Ion beam apparatus and analysis method: A technique is provided which can precisely form a deposition pile in a hole bored in the surface of a specimen. In ion beam apparatus and analysis method, the specimen surface is bored or a deposition pile is formed in the hole bored in the specimen surface. A measuring instrument... Agent: Mcdermott Will & Emery LLP

20060284116 - Particulate prevention in ion implantation: A system and method for mitigating contamination in an ion implantation system is provided. The system comprises an ion source, a power supply operable to supply power to a filament and mirror electrode of the ion source, a workpiece handling system, and a controller, wherein the ion source is selectively... Agent: Eschweiler & Associates, LLC National City Bank Building

20060284118 - Process and apparatus for modifying a surface in a work region: An apparatus and process for manufacturing changes of a substrate in a work region which is 100×100×100 microns or smaller is described. The apparatus uses a plasma source adjacent to the work region to produce radiation or matter which changes the surface. An atomic force microscope or laser can be... Agent: Ian C. Mcleod Mcleod & Moyne, P.C.

20060284114 - Technique for uniformity tuning in an ion implanter system: A technique for uniformity tuning in an ion implanter system is disclosed. In one particular exemplary embodiment, the technique may be realized as a method for ion beam uniformity tuning. The method may comprise generating an ion beam in an ion implanter system. The method may also comprise tuning one... Agent: Hunton & Williams LLP/rambus Inc. Intellectual Property Department

20060284119 - Electron-beam exposure system: An electron-beam exposure system includes: density-per-area map generating means configured to divide a certain area on which an electron beam is irradiated into meshes, to figure out a ratio of an area of patterns to be irradiated on each divided region to an area of the divided region, thus to... Agent: Muramatsu & Associates

20060284120 - Method for correcting electron beam exposure data: First, electron beam exposure data identifiable for each type of pattern of a semiconductor device is inputted (S601). Then, electron beam exposure data on a first type of pattern is not corrected, while electron beam exposure data on a second type of pattern is corrected (S603). The first type of... Agent: Staas & Halsey LLP

20060284121 - Cold electron emitter: An electron emitter provides a photocell having at least one photosensitive side, an electron accelerator, an electron collector disposed between the photosensitive side of the photocell and the electron accelerator, a non-metallic vacuum chamber having an adjustable vacuum containing the photocell, the electron accelerator and the electron collector; and a... Agent: Stephen R. Burri

20060284122 - High efficiency shield array: Embodiments of a radiation shield are disclosed. One non-limiting embodiment of the radiation shield may comprise a first layer, a second layer, and a third layer. The first layer may include a neutron moderating material. The second layer may be adjacent the first layer and may include a neutron absorbing... Agent: Allegheny Technologies

20060284123 - Radiation protection system and method for using the same: A method of using a radiation protection system including a table having a top surface for supporting a patient, a radiation-shielding screen attached to the table for covering a portion of the patient and a portion of the top surface of the table, and controls for controlling the system. The... Agent: Sonnenschein Nath & Rosenthal LLP

20060284124 - Method for manufacturing optocoupler: A multichannel monolithic chip that has a number of photo-couplers provided on a single silicon substrate is mounted on an insulating substrate, a first cut groove is formed by dicing between a light-emitting element and a light-receiving element that constitute a photo-coupler, a transparent insulating resin is filled into the... Agent: Birch Stewart Kolasch & Birch

20060284125 - Photo-stimulable image plate restoration assembly: An erasure assembly for imaging plates comprised of a cover member and a base member, the cover member in the form of an inverted rectangular tray having a plurality of light sources and reflective sources mounted therein behind a diffuser glass member, the base member, complimentary with the cover member... Agent: Clifford G. Frayne

20060278807 - Optical disk apparatus and pickup unit: An optical disk apparatus includes a light emitting unit, a light detecting unit, a tracking error signal generating unit, and a tracking control unit. The light emitting unit emits a single light beam onto an optical disk. The light detecting unit includes at least three light detecting portions, each being... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20060278808 - Closed loop daylight harvesting light control system having auto-calibration: An apparatus and method for enabling an automatic calibration sequence for a light control system having a daylight harvesting scheme is disclosed herein. An ambient light sensor connects to a detection circuit for detecting the amount of ambient light within a given zone. A microprocessor connects between the detection circuit... Agent: Paul J. Sutton, Esq., Barry G. Magidoff, Esq. Greenberg Traurig, LLP

20060278812 - Charge mode active pixel sensor read-out circuit: An apparatus such as an imager includes groups of sensors each of which includes subgroups of sensors. Subgroup select circuits are coupled to outputs from respective subgroups of sensors, and group select circuits are coupled to outputs from subgroup select circuits associated with respective ones of the groups. A bus... Agent: Dickstein Shapiro LLP

20060278810 - Image pickup unit and image pickup apparatus: An image pickup apparatus includes: an image pickup device comprising a bare chip and having an image pickup area and a mount area on the same face; an electric board having the image pickup device mounted thereon; and a support having an opening. The support is disposed on the rear... Agent: Straub & Pokotylo

20060278811 - Pixel circuit with reduced wiring: A pixel circuit of an image sensor includes a floating diffusion node and a reset transistor. The reset transistor is coupled between the floating diffusion node and a reset control signal node of another pixel circuit of the image sensor. A voltage applied on the reset control signal node of... Agent: Law Office Of Monica H Choi

20060278809 - Pixel individual anti-eclipse circuit and its operation manner: An anti-eclipse circuit of an image pixel includes a pixel coupled to a pixel output line and a circuit for receiving and storing a pixel reset voltage from the pixel on the pixel output line and for using the stored pixel reset voltage as a parameter to control a reset... Agent: Dickstein Shapiro LLP

20060278813 - Output amplifier for solid-state imaging device: An output amplifier for a solid-state imaging device is provided and includes: a floating diffusion that stores a signal charge; and at least three source follower circuits that output a signal in accordance with a change of a potential on the floating diffusion, the at least three source follower circuits... Agent: Birch Stewart Kolasch & Birch

20060278814 - Optical device package: An optical microbench configured to facilitate wafer-level testing of opto-electronic devices is provided. The optical microbench includes an optoelectronic device mounted to a wafer in which the optical microbench is provided. The optical microbench also includes a beam deflector provided in the wafer and disposed along the optical path of... Agent: Jonathan D. Baskin Rohm And Haas Electronic Material LLC

20060278815 - Regressive reflection type photoelectric switch: A concave curved surface 95 is formed on a light inputting surface 93 of a light emitting lens 43, and a convex curved surface 96 is formed on a light emitting surface 94. Only laser light close to an optic axis A is inputted to the concave curved surface 95,... Agent: Kilyk & Bowersox, P.l.l.c.

20060278817 - Light grid for measuring an object: A light grid for measuring an object and securing a dangerous zone of a machine has an emitting unit with individual light emitters for directing a plurality of light beams in the form of emitted light cones approximately along a lit plane. A receiving unit is spaced apart from the... Agent: Townsend And Townsend And Crew, LLP

20060278816 - Portable mountable indoor lamp having a positionable lamp head and motion and light sensors which can be aimed: The lamp includes a base having a battery compartment, a selector switch, an aimable light and motion sensor assembly, and a removable suction cup. A gooseneck extends from the base and terminates in a lamp head containing one or more LEDs. The LEDs are electrically coupled to a circuit in... Agent: Galgano & Burke, LLP

20060278818 - Strobe light and laser beam detection for laser receiver: A device and method detect a moving, relatively thin beam of laser light, and distinguishing between illumination of photodetectors by the beam, and illumination of the photodetectors by an omnidirectional pulse of light. A plurality of photodetector arrays are arranged in a generally vertical row, with each array having a... Agent: Dinsmore & Shohl LLP

20060278819 - Optical-path compensating device and optical pickup using the device: A optical-path compensating device 14 comprises a first wavelength plate 15, a birefringent plate 16, a second wavelength plate 17, a birefringent plate 18 and a third wavelength plate 19, and is placed in front of a three-wavelength laser device 20. The optical-path compensating device of the invention uses two... Agent: Oliff & Berridge, PLC

20060278821 - Optoelectronic component: Provided are optoelectronic components which include an optoelectronic device mounted on a silicon substrate and a flexible circuit electrically connected to the optoelectronic device.... Agent: Jonathan D. Baskin Rohm And Haas Electronic Materials LLC

20060278820 - Semiconductor module: An image sensor module is composed of a base, a CCD image sensor, a glass plate, and a gasket. The base has a chip chamber with an opening, in which the CCD image sensor is contained. The glass plate is bonded by an adhesive layer to a top surface of... Agent: Sughrue Mion, PLLC

20060278822 - System for studying power of laser beam: A laser beam power studying system for studying laser power in a reproducing mode and a recording mode of an optical recording apparatus. A laser beam having different powers in the recording mode and the reproduction mode is emitted and a first part of the laser beam is measured. A... Agent: Stein, Mcewen & Bui, LLP

20060278823 - Apparatus, method, and computer program product for deconvolution analysis: A deconvolution analysis apparatus includes a sputtering rate calibrating unit that calibrates a depth profile resulting from a depth analysis on a sample to be estimated by using a sputtering surface analysis, according to a depth change of a sputtering rate in an initial sputtering; and a deconvolution analysis unit... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20060278824 - Ion source sample plate illumination system: The invention provides a mass spectrometry system ion source containing a sample plate and an illumination device that is configured to produce a light beam that contacts the sample plate surface to define a grazing angle between the light beam and the sample plate surface. The ion source may also... Agent: Agilent Technologies Inc.

20060278825 - High aspect ratio micromechanical probe tips and methods of fabrication: A method of fabricating high aspect ratio micromechanical tips is provided. The method includes, but is not limited to, forming an etchant protective island on a surface of a silicon substrate with the silicon substrate exposed around the island; isotropically etching the silicon substrate by reactive ion etching around the... Agent: Foley & Lardner LLP

20060278826 - Method and apparatus for automated beam optimization in a scanning electron microscope: A method and apparatus according to the present invention define optimal conditions for a scanning electron microscope (SEM), preferably a critical dimension scanning electron microscope (CDSEM). The present invention provides an image quality monitor that utilizes image processing and optimization to maintain image quality at a desired level. Images from... Agent: Edell, Shapiro & Finnan, LLC

20060278827 - Process field device with infrared sensors: Infrared radiation from a plurality of locations associated with a process is measured by a field device, which includes a plurality of input channels, a plurality of IR sensors, and a data processor. The infrared radiation from the locations associated with the process is received by the input channels and... Agent: Kinney & Lange, P.A.

20060278828 - Radioactive gas measurement apparatus and failed fuel detection system: To provide a radioactive gas measurement apparatus that is simply constructed and can efficiently measure Xe-133 in a radioactive gas on-line under the condition that the radioactive gas is mixed with interference N-13, an apparatus is provided for measuring a radiation emitted from Xe-133, including an anticoincidence counter circuit 13... Agent: Crowell & Moring LLP Intellectual Property Group

20060278829 - Method and apparatus for detecting the type of anesthetic gas: Disclosed is a method and apparatus for detecting the type of anesthetic gas. The method comprises the steps of: generating a light with a plurality of wavelengths, the light being able to be separated to a plurality of light beams whose central frequencies correspond to the plurality of wavelengths; passing... Agent: Sughrue Mion, PLLC

20060278831 - Infrared inspection apparatus, infrared inspecting method and manufacturing method of semiconductor wafer: An infrared inspection apparatus includes: an infrared light source operable to irradiate an inspection object with infrared rays; an infrared lens operable to collect infrared rays which have passed through the inspection object; an infrared camera operable to receive the infrared rays collected by the infrared lens and to convert... Agent: Leydig Voit & Mayer, Ltd

20060278830 - Optical path difference compensation mechanism for acquiring wave form signal of time-domain pulsed spectrometer: It is an object to provide a time-domain pulsed spectroscopy apparatus in which time-domain pulsed spectroscopy of multiple samples, states thereof, and so on can be carried out easily and in a short period of time. A time-domain pulsed spectroscopy apparatus of the present invention comprises a pulsed laser light... Agent: Birch Stewart Kolasch & Birch

20060278832 - Photoconductor imagers with sandwich structure: An image acquisition device 30 is provided. The image acquisition device 30 comprises a photoconductor 48 adapted to convert an electromagnetic radiation into electrical signals, a first layer 36 or 37 coupled to the photoconductor 48. The interconnecting layer 36 or 37 comprises an insulator 54 and a plurality of... Agent: Varian Medical Systems Technologies, Inc. C/o Foley & Lardner LLP

20060278833 - Lithographic apparatus and cleaning method therefor: A lithographic apparatus is disclosed. The apparatus includes a source for supplying hydrogen radicals, a guide for use in conjunction with the source, for directing hydrogen radicals to an application surface to be targeted by the hydrogen radicals. The guide is provided with a coating having a hydrogen radical recombination... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20060278834 - Apparatus and method for enhanced critical dimension scatterometry: Scatterometers and methods of using scatterometry to determine several parameters of periodic microstructures, pseudo-periodic structures, and other very small structures having features sizes as small as 100 nm or less. Several specific embodiments of the present invention are particularly useful in the semiconductor industry to determine the width, depth, line... Agent: Perkins Coie LLP Patent-sea

20060273236 - Circuit arrangement for controlling illuminating means: A circuit arrangement is disclosed for controlling an illuminating device, particularly light-emitting diodes, in a control device of a motor vehicle, comprised of at least one illuminating device, which is integrated in a switching circuit having a semiconductor component, and of a microprocessor, in particular having an integrated non-volatile memory,... Agent: Mcgrath, Geissler, Olds & Richardson, PLLC

20060273237 - Video presentation of photomultiplier anode signal: An apparatus and method for video imaging the spatial response of radiation-responsive devices, such as photomultiplier tubes. The apparatus probes the device under-test with an array of radiation emitting elements, such as light-emitting diodes, programmed with a scanning sequence such that the device under-test output response, e.g., the anode current... Agent: Dann, Dorfman, Herrell & Skillman

20060273239 - Asymmetrical microlenses on pixel arrays: An image sensor includes a plurality of photosensitive sites; a plurality of asymmetrical-shaped microlenses positioned spanning the photosensitive sites; wherein incoming light is directed in a predetermined direction by an asymmetrical surface of the asymmetrical-shaped microlenses onto the photosensitive sites for capturing the light in a substantially uniform manner.... Agent: Pamela R. Crocker Patent Legal Staff

20060273241 - Cmos aps shared amplifier pixel with symmetrical field effect transistor placement: An image sensor includes a plurality of photodetectors arranged in an array; and a plurality of transistors that are functionally shared by the photodetectors, wherein a distance of each photodetector to an adjacent transistor is substantially the same.... Agent: Pamela R. Crocker Patent Legal Staff

20060273238 - Optical sensor: A signal processing circuit 20 has switches 21, a shift register 22, and an integrating circuit 23, and outputs voltages Vout indicating luminance profiles in a second direction and in a first direction of light incident to a photosensitive region 10. The switches 21 are provided corresponding to groups of... Agent: Drinker Biddle & Reath (dc)

20060273240 - Shared amplifier pixel with matched coupling capacitances: A method of making an image sensor, the method includes the steps of providing a plurality of pixels each with a photodetector; providing an amplifier that is shared between the plurality of photodetectors; providing a transfer gate associated with each photodetector; providing a charge-to-voltage conversion region that is shared between... Agent: Pamela R. Crocker Patent Legal Staff

20060273242 - System and method for characterizing aerial image quality in a lithography system: While a high-resolution 2-dimensional image reconstruction is expected to give the maximum possible amount of information on the aerial image in a projection system, relevant information regarding image quality can be derived from a statistical evaluation of image values. Relevant statistical image data can be derived by sampling at a... Agent: White & Case LLP Patent Department

20060273243 - Optical signal receiving circuit: An optical signal receiving circuit, may include a first transimpedance amplifier configured to convert a first current signal into a first voltage signal, wherein the first current signal generated in a first photodiode, to which an optical signal is inputted; a second transimpedance amplifier configured to convert a second current... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20060273244 - Pulse detector which employs a self-resetting pulse amplifier: A circuit including: an optical detector for detecting an optical pulse and generating therefrom a current pulse on an output; a pulse detector circuit having an input electrically connected to the optical detector and having an output for outputting a detection pulse in response to detecting the current pulse on... Agent: (bos) Wilmerhale/applied Materials

20060273245 - Surface plasmon-enhanced nano-optic devices and methods of making same: A nanostructured optical device includes a metal film or a plurality of metal islands having an array of a plurality of openings having a width that is less than at least one first predetermined wavelength of incident radiation to be provided onto the film or the islands. The metal film... Agent: Foley And Lardner LLP Suite 500

20060273246 - Fiber optic security system for sensing the intrusion of secured locations: A sensor for a security system is disclosed to detect intrusions at one or more predetermined locations wherein each location includes a moveable member which must be moved in order to intrude the location. The system includes a fiber network routed in close proximity to one or more locations. The... Agent: Mcnair Law Firm, P.A.

20060273247 - Electric power steering apparatus, and method for detecting abnormality of angle detector thereof: An electric power steering apparatus which comprises: an angle detector for outputting a sine wave signal and a cosine wave signal corresponding to a rotor position of a brushless DC motor; and a torque detector for detecting a steering torque applied to a steering member, and which drives the brushless... Agent: Darby & Darby P.C.

20060273248 - Laser projector with brightness control and method: A laser projector includes a laser, scanning mirrors projecting a laser line image on a surface, a computer including an algorithm controlling a speed of the laser line image, and a computer screen having a user interface. The user interface includes a throttle control which modifies the speed control algorithm... Agent: Howard & Howard Attorneys, P.C.

20060273249 - Image sensor chip package and method of manufacturing the same: An image sensor chip package (200) includes a base (20), an image sensor chip (23), a plurality of wires (24), an adhesive means (26) and a cover (28). The base has a top surface (201) and a plurality of top pads (204) arranged on the top surface. The image sensor... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20060273250 - Radiological imaging apparatus and timing correction method therefor: A processing circuit, which carries out coincidence counting, acquires calibration data so that time delays of γ-ray detection signals from radiation detectors coincide with one another. A technique for acquiring calibration data faster and easily is provided to attain high time precision and respond to multi-channeling of detectors. A signal... Agent: Dickstein Shapiro LLP

20060273251 - Controlled kinetic energy ion source for miniature ion trap and related spectroscopy system and method: An ion trap mass spectrometry system adapted for portability and related method includes an ion source for generating ions from a sample to be analyzed, and a resistive drift tube coupled to an output of the ion source for receiving the ions injected therein. The resistive drift tube decelerates the... Agent: Akerman Senterfitt

20060273252 - Methods of operating ion optics for mass spectrometry: In various embodiments, provided are methods for focusing ions for an ion fragmentor, and methods for operating an ion optics assembly. In various embodiments, the present teachings provide methods that substantially maintain the position of the focal point of the an incoming ion beam over a wide range of collision... Agent: Lahive & Cockfield

20060273253 - Pseudo-random binary sequence gate-switching for spectrometers: An IMS or other detection system has an entry gate (3) controlled by a pseudo-random binary sequence that is bit-flipped to reduce noise. Matrix algebra is used to carry out deconvolution and analysis of the cell output.... Agent: Foley And Lardner LLP Suite 500

20060273254 - Method and apparatus for ionization via interaction with metastable species: An apparatus for analyzing a sample material includes a desorption mechanism configured to desorb molecules from the sample material, a metastable generator separate from the desorption mechanism and configured to generate a metastable species, and an interaction region configured for metastable species ionization of the desorbed molecules so as to... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20060273255 - Method for forming the image in millimetre and sub-millimetre wave band (variants), system for forming the image in millimetre and sub-millimeter wave band (variants), diffuser light (variants) and transceiver (variants): The invention relates to the field of computer diagnostics. The method consists in the steps of forming radiation forming in this wave range, consisting of separate partial radiations, which are different from each other by values of their physical features, directing of the formed radiations into a side of the... Agent: Jacobson Holman PLLC

20060273256 - Thermal electromagnetic radiation detector with alveolate structure: An absorbent membrane (1) is fixed in suspension onto a front face of a substrate (2), in a direction substantially parallel to the substrate (2), by at least one alveolate structure thermally insulating the membrane from the substrate (2) and arranged in a plane substantially perpendicular to the substrate (2).... Agent: Oliff & Berridge, PLC

20060273257 - Computer assisted bag screening system: A method and apparatus are disclosed for screening articles utilizing a computerized touch sensitive screen or other computerized pointing device for operator identification and electronic marking of objects within the article to be further examined. An operator positioned at a computerized touch sensitive screen views electronic images of the articles... Agent: H. Roy Berkenstock Wyatt, Tarrant & Combs, LLP

20060273258 - Semiconductor scintillation high-energy radiation detector: A high-energy radiation detector is disclosed which uses a semiconductor material to absorb high-energy radiation and emit secondary light in response. The semiconductor is designed to be largely transparent for the interband light it emits so that the generated seciondary photons can reach the semiconductor surface, to be detected by... Agent: Alexander Kastalsky

20060273259 - Dual-array detector module: The present invention discloses a dual array detector module adapted to radiation-imaging, comprising: a first detector array consisting of a plurality of first detectors and arranged on a first surface of a heavy metal plate; a second detector array consisting of a plurality of second detectors and arranged on a... Agent: Westman Champlin & Kelly, P.A.

20060273260 - Flow cytometer acquisition and detection system: A flow cytometer has a flow cell through which a sample flows and at least one laser emitting an excitation beam for illuminating a corresponding interrogation region in the flow cell. Scattered and fluorescence light from each interrogation region is collected by one or more input fibers for that region,... Agent: Hodgson Russ LLP

20060273261 - Laser scanning microscope: A Laser Scanning Microscope with an illumination radiation distribution, which is guided over a sample for scanning and in which an image of the sample is taken from the sample radiation generated and detected during the scanning, wherein the sample is sampled with an imaging rate of x images per... Agent: Jacobson Holman PLLC

20060273262 - Light stimulating and collecting methods and apparatus for storage-phosphor image plates: Methods and apparatus are described for retrieving information from a storage medium. A first portion of the surface of the storage medium is exposed to stimulating light which diffuses in the storage medium under a second portion of the surface adjacent the first portion. The second portion of the surface... Agent: Beyer Weaver & Thomas, LLP

20060273263 - Apparatus and method for enhanced critical dimension scatterometry: Scatterometers and methods of using scatterometry to determine several parameters of periodic microstructures, pseudo-periodic structures, and other very small structures having features sizes as small as 100 nm or less. Several specific embodiments of the present invention are particularly useful in the semiconductor industry to determine the width, depth, line... Agent: Perkins Coie LLP Patent-sea

20060273264 - Charged particle beam extraction system and method: A charged particle beam extraction system and method capable of ensuring higher safety when extraction of an ion beam is on/off-controlled during irradiation of the ion beam for treatment. The charged particle beam extraction system comprises a charged particle beam generator including a synchrotron, a range modulation wheel (RMW) for... Agent: Dickstein Shapiro LLP

20060273265 - Uv curing system with remote controller: An ultraviolet curing system separates the source of ultraviolet radiation and the controller, allowing an operator to stand at a relatively great distance away from the ultraviolet radiation when applied. The apparatus includes a base unit and a source of intense ultraviolet (UV) radiation coupled to the base unit by... Agent: John G. Posa Gifford, Krass, Groh, Sprinkle,

20060273267 - Exposure method and apparatus: An exposure method for exposing a pattern of a reticle onto a plate, via a projection optical system, while synchronously scanning the reticle and the plate, said exposure method comprising the steps of obtaining surface form data that shows a surface form of the reticle, and controlling synchronous scanning of... Agent: Fitzpatrick Cella Harper & Scinto

20060273266 - Method for detecting, sampling, analyzing, and correcting marginal patterns in integrated circuit manufacturing: One embodiment of a method for detecting, sampling, analyzing, and correcting hot spots in an integrated circuit design allows the identification of the weakest patterns within each design layer, the accurate determination of the impact of process drifts upon the patterning performance of the real mask in a real scanner,... Agent: White & Case LLP Patent Department

20060273268 - Method for detecting 3d measurement data using allowable error zone: A method of detecting 3D measurement data using an allowable error zone is provided. The method detects 3D measurement data that corresponds to a preset measurement allowable error zone for each basic diagram when detecting 3D measurement data. For that purpose, a control unit generates auxiliary geometry data from a... Agent: Harness, Dickey & Pierce, P.L.C

20060273269 - Inspection system and method: An inspection system and a method for measuring physical characteristics of a component using the inspection system is provided, wherein the inspection system includes a light source, a sensing device, a reflecting device, and a retention mount, at least one of which is movably associated with the inspection system. The... Agent: The Law Offices Of Steven Mchugh, LLC