Radiant energy inventions 07/06

20060163446 - Method and apparatus of using optical distortion in a directed countermeasure system to provide a variable field of view: A single, hard-mounted set of optics is utilized to replace a two field-of-view system for directed countermeasures. It includes within one continuous but distorted field of view the capability to detect, acquire and characterize targets at the edge of the field while precisely tracking with high target fidelity at the...

20060163447 - Method for operating a photoelectric sensor arrangement and corresponding sensor: A method for operating a photoelectric sensor arrangement having a pulsed light emitting first module, a light receiving and converting second module and a level judging and/or processing third module. The method includes: sending periodically light pulses from the first module towards the second module, producing an analog potential signal...

20060163450 - Image sensing apparatus and control method thereof: In an image sensing apparatus adapted to apply user-settable image processing to a sensed image, display in an electronic viewfinder of an image to which a user-set image processing is applied and an image to which such image processing is not applied is switched with each passage of a predetermined...

20060163451 - Image sensor and method of fabrication: Disclosed is an image sensor and method of fabricating the same. The image sensor includes a photoelectric transformation region formed in a semiconductor substrate, and pluralities of interlayer dielectric films formed over the photoelectric transformation regions. The interlayer dielectric films contain multilevel interconnection layers. A color filter layer is disposed...

20060163448 - Optical sensing device: First integrating circuits 110 convert electric currents from one group of photosensitive portions electrically connected to each other in a plurality of pixels arranged in a first direction into voltages, and output the voltages. First S/H circuits 130 hold and output the voltages outputted from the first integrating circuits 110....

20060163449 - Planar fly's eye detector: A fly's eye detector includes a planar imaging array and an optical system that directs light with different incident directions to different sensors in the imaging array. One embodiment of the optical system includes a curved reflector above the planar imaging array to deflect and distribute light to the sensors....

20060163454 - Low-level light detector and low-level light imaging apparatus: A low-level light detector includes an avalanche photodiode (APD) to which is applied a bias voltage adjusted to produce a multiplication factor of not more than 30, and a capacitor for accumulating carriers produced by light in the APD and multiplied using the APD characteristics, the capacitor being connected to...

20060163452 - Optical fiber receiver having an increased bandwidth: The invention relates to an optical fiber receiver (11) for optoelectronic integrated circuits (OEIC's) having an improved sensitivity and improved bandwidth. The improvements are achieved by subdividing the photodiodes into partial photodiodes (D1, D2), whereby each partial photodiode is connected to a respective transimpedance amplifier (20, 21), and the output...

20060163453 - Sensor: The invention provides a sensor element formed in a first substrate and at least one optical element formed in a second substrate, the first and second substrates being configured relative to one another such that the second substrate forms a cap over the at least one sensor element, the at...

20060163455 - Proximity sensor: This invention relates to a proximity sensor. An illumination means (2) projects an array of spots (40) towards a scene. Detector (8) looks towards the scene through a mask (6). The mask (6) is arranged such that light from a target at a certain range, for instance far object (14)...

20060163457 - Apparatus and method for using a counter-propagating signal method for locating events: An apparatus and method for using a counter-propagating signal method for locating events is disclosed. The apparatus and method uses a Mach Zehnder interferometer through which counter-propagating signals can be launched. If the sensing zone of the Mach Zehnder interferometer is disturbed, modified counter-propagating signals are produced and the time...

20060163456 - Pressure sensor with temperature compensated optical fiber: The present invention relates to a temperature-compensated optical fiber pressure detector for detecting pressure variations in at least one medium in relation to a reference medium such as the atmosphere or a medium where a back pressure prevails. The detector essentially comprises a deformable element (2) such as a bellows...

20060163458 - Rain sensor: A device for detecting the wetting and/or soiling of a windscreen surface, in particular in a vehicle, comprises a camera with a sensor having a plurality of light-sensitive pixels arranged as an array and adapted to be illuminated according to an illumination cycle, and having a focussing optic for a...

20060163459 - Optical pickup apparatus which is compatible with multiple types of media: An optical pickup apparatus includes a first objective lens having a low numerical aperture (NA) suitable for a low density recording medium, a second objective lens having a high NA suitable for a high density recording medium, a first light source that emits short wavelength light which is focused onto...

20060163460 - Arrangement and method for compensation of the temperature dependency of detectors in spectrometers: The present invention is directed to an arrangement and the associated method for the compensation of the temperature dependency of detectors in spectrometers. In the solution according to the invention, the arrangement for compensation of the temperature dependency of detectors in spectrometers comprises an illumination unit, an entrance slit, an...

20060163461 - Image sensor module: An image sensor module includes: a substrate having an opening; an image sensor, attached to a lower surface of the substrate, for performing an image detection and includes a light receiving part exposed through the opening; and a transparent member including a base part and a projecting part formed to...

20060163462 - Localized hermetic sealing of a power monitor on a planar light circuit: A photodetector for power monitoring purposes may be positioned directly on a planar light circuit. The photodetector may be protected by hermetically sealing a localized region over the planar light circuit corresponding to the position of the photodetector. The remainder of the planar light circuit may remain unsealed....

20060163464 - Ion neutralizer: An ion neutralizer enhances a heat transfer rate between a reflecting plate and a frame while preventing the reflecting plate from being bent due to thermal deformation. The ion neutralizer includes a frame and a plurality of reflecting plates integrally formed with the frame to neutralize plasma ions. Each reflecting...

20060163463 - Modulated optical tweezers: A method and apparatus for selecting a specific fraction from a heterogeneous fluid-borne sample using optical gradient forces in a microfluidic or fluidic system are presented. Samples may range in size from a few nanometers to at least tens of micrometers, may be dispersed in any fluid medium, and may...

20060163465 - Quantum state transfer between matter and light: Disclosed are apparatus and methods that provide for a coherent quantum state transfer of information from a two-level atomic system (matter) to a single photon (light). Entanglement between a single photon (signal) and a two-component atomic ensemble of cold Rubidium atoms is used to project a quantum memory element (the...

20060163466 - Substrate processing apparatus using neutralized beam and method thereof: In a substrate processing apparatus using a neutralized beam and a method thereof, the substrate processing apparatus includes: an ion source for emitting an ion beam at an emitting angle; reflectors at which the ion beam emitted by the ion source is incident and subject to 2n collisions (where n...

20060163467 - Apparatus and method for analysing downhole water chemistry: The invention concerns an apparatus for analysing water chemistry. According to the invention, the apparatus is adapted to operate downhole and comprises a colouring agent supply device for supplying a colouring agent to a water sample, the colour of the water sample thus supplied being indicative of the water sample...

20060163468 - Processes for designing mass separator and ion traps, methods for producing mass separators and ion traps. mass spectrometers, ion traps, and methods for analyzing samples: In one implementation, processes for designing mass separators from a series of mass separator electric field data and processes for designing an ion trap from a range of data pairs and a mass analyzer scale are provided. Methods for producing mass separators including ion traps having Zo/ro ratios from about...

20060163469 - Ion optics systems: In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs such that a trajectory of an ion exiting the ion optics system can be provided that intersects a surface substantially parallel to an image focal surface of the ion optics system at...

20060163471 - Apparatus and systems for processing samples for analysis via ion mobility spectrometry: The invention provides an interface assembly for delivering an ionized analyte from an ionization apparatus into an ion mobility spectrometer. This allows analysis of biological and non-biological samples, even non-volatile solids, via differential mobility spectrometry, without fragmentation of molecules. The invention also provides portable sample analysis systems that operate at...

20060163470 - Method and apparatus for producing an ion beam from an ion guide: A method and system for producing an ion beam from an ion guide. In the method, ions are introduced into the ion guide, a radio frequency trapping field is generated in the ion guide to confine ions in a direction transverse to a longitudinal axis of the ion guide, a...

20060163472 - Correcting phases for ion polarity in ion trap mass spectrometry: In a method and apparatus for adjusting a composite electric field to be applied to an ion trap to accommodate switching the operation of the ion trap between a positive ion mode and a negative ion mode, the composite electric field includes a plurality of component fields including at least...

20060163473 - Ion optics systems: In various embodiments, provided are ion optics systems comprising two or more pairs of ion condensers arranged where the first member and second member of each pair are disposed on opposite sides of a first plane such that the first member of the pair has a position that is substantially...

20060163474 - Automatic calibration of electron multiplying ccds: A method of determining the gain of an electron multiplier, especially in an Electron Multiplying Charge Coupled Device (EMCCD). The electron multiplier multiplies, in use, signals received from a device, typically a CCD, comprising at least one photodetector. The method involves causing a test signal to be input to the...

20060163478 - Detector system for a scanning electron microscope and a scanning electron microscope incorporating said detector system: With a detector system for the specimen chamber of a scanning electron microscope, signals are simultaneously detected in transmission which signals correspond to a light field contrast and a dark field contrast. The detector system (14) includes four detectors (15 to 18) in a plane (25) between which an aperture...

20060163479 - Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method: An electron beam detector detects a peak of a spectrum, and when a peak position is deviated from a reference position on the electron beam detector, a controller for controlling an electron beam position on the electron beam detector is used to correct a deviation. An electron energy loss spectrum...

20060163480 - Inspection method and apparatus using charged particle beam: A scanning electron microscope or inspection system includes a sample stage on which a sample such as a wafer is loaded, an electro optical unit to scan an electron beam to the sample, and a charge control electrode to which voltage for controlling a charged state of the sample is...

20060163477 - Method and apparatus for inspecting patterns: When the electrode potential of a charge control electrode above a wafer is reduced, image brightness is reduced. A point of change in the image brightness is a switching point between a positively charged state of the image and a negatively charged state of the image, showing the weakly charged...

20060163476 - Method of detecting array of liquid crystal display and apparatus thereof: A detection apparatus for detecting a defect in an array of a liquid crystal display, comprises a main chamber, a stage, a detection device and a main heater. The stage is disposed in the main chamber, and the array is placed on stage. The detection device is disposed in the...

20060163475 - Tft array inspecting apparatus: A TFT array inspecting apparatus inspects a TFT array disposed at either an inclined position and a level position. The TFT array inspecting apparatus includes a vacuum chamber, a stage disposed in the vacuum chamber so that a TFT array to be inspected is disposed on the stage, an electron...

20060163481 - Camera apparatus with infrared night vision charge coupled device: An infrared night vision camera apparatus includes a casing unit delimiting a first compartment and a second compartment separated from the first compartment, a light source module mounted in the first compartment, a shooting module mounted in the first compartment, and a power supply unit mounted in the second compartment....

20060163482 - Pyroelectric sensor and method for determining a temperature of a portion of a scene utilizing the pyroelectric sensor: A pyroelectric sensor and a method for determining a scene temperature are provided. The pyroelectric sensor includes a ferroelectric layer having first and second sides. The pyroelectric sensor further includes a first metal electrode disposed on the first side of the ferroelectric layer. The pyroelectric sensor further includes a second...

20060163483 - Device and method for monitoring the oxygen concentration in an aircraft tank: The invention relates to a device for monitoring the oxygen concentration in an aircraft tank. The device includes an absorption measuring section equipped with a laser or laser diode (6), a photodiode (7), a temperature sensor (8) and a reflector (5) for carrying out laser spectroscopy on a gas volume...

20060163484 - Metal halide for radiation detection, method for production thereof and radiation detector: A metal halide for radiation detection, which is represented by the general formula ReALuBMe1-A-BXD where Re is at least one element among rare earth elements other than Lu, Me is at least one metallic element other than a rare earth element, X is a halogen, A+B<0.5, A≠0, B≠0, and 1≦D≦6....

20060163485 - Method and system for scattered coincidence estimation in a time-of-flight positron emission tomography system: A method and system for controlling a positron emission tomography (PET) system is disclosed. The method includes acquiring image data and time-of-flight information from a PET system during an imaging scan. Further, the method includes performing scatter correction on the image data using the time-of-flight information....

20060163486 - Gamma camera with dynamic threshold: A method of locating an event with a gamma camera (12) of an emission computed tomography (ECT) scanner (10) is provided. The gamma camera (12) includes a matrix of sensors (22) situated to view the event. The sensors (22) have respective outputs that are responsive to the event. The method...

20060163487 - Method and device for detecting fast neutrons: There is disclosed a method of detecting fast neutrons of energy greater than 5 MeV comprising the steps of: providing a neutron detector comprising a plate having a plurality of microchannels or like detection sites disposed thereon which produce...

20060163488 - Multi-axis lens, beam system making use of the compound lens, and method of manufacturing the compound lens: The invention provides a lens system for a plurality of charged particle beams. Therein, at least one common excitation coil for at least two lens modules is provided. The lens modules comprise an first pole piece, a second pole piece and at least one opening for a charged particle beam....

20060163489 - Source arc chamber for ion implanter having repeller electrode mounted to external insulator: An ion implanter has a source arc chamber including a conductive end wall at a repeller end of the arc chamber, the end wall having a central portion surrounding an opening. A ceramic insulator is secured to an outer surface of the end wall, such as by peripheral screw threads...

20060163490 - Ion implantation cooling system: An ion implantation cooling system at least comprises a semiconductor substrate utilized as the ion implantation substrate, a Pelier thermoelectric pump connected with the semiconductor substrate for heat irradiation during the ion implantation, and a heatsink connected to the Pelier thermoelectric pump for heat irradiation from a hot Pelier surface...

20060163491 - Fluorescent coating void detection system and method: A system for detecting voids or imperfections such as holidays in a coating having fluorescent material therein comprises a camera having a digital image output for inspecting the coating wherein said camera's digital image output may include only the image produced by light in a color spectrum corresponding to a...

20060163492 - Method for encoding items of information and a device and method for evaluating the encoded information: The invention relates to a method for encoding items of information and to a device and method for evaluating the encoded information. A prior art method for marking and providing objects with items of information and data involves the creation and use of bar code. With the inventive method, it...

20060163493 - Portable watch with radiation monitor: The invention relates to combined individual devices which combine timekeeping functions with monitoring of the radiation dosage to which the user is exposed and of radiation intensity. The aim of current invention is to use Geiger-Muller counter as a radiation detector in individual wristwatch and to ensure its functioning over...

20060163494 - Ion implantation method and method for manufacturing semiconductor device: An object of the present invention is to provide an ion implantation method for shortening a down time of an ion implantation apparatus after exposure of a chamber and for improving throughput and a method for manufacturing a semiconductor device. Specifically, the object of the invention is to provide an...

20060163497 - Ion beam device and ion beam processing method: There is provided a liquid metal ion beam irradiation device for irradiating a specific portion of a sample 6 with a prescribed liquid metal ion beam 80 as to form a cross section, and a gaseous ion beam irradiation device 7 for scanning a prescribed region (observation region) of the...

20060163498 - Semiconductor device manufacturing method and ion implanter used therein: Impurity ions are implanted into a semiconductor wafer of which a capacitor insulting film is formed on a principal face. In this impurity ion implantation step, the impurity ions are implanted into the semiconductor wafer in the form of a pulsed beam that repeats ON-OFF operation intermittently....

20060163499 - Apparatus and method for irradiating electron beam: An electron beam irradiation apparatus includes an electron beam emission section having an electron beam irradiating tube that emits an electron beam; an electron beam irradiation section for irradiating the emitted electron beam to a target; a transfer mechanism for transferring the target to the electron beam irradiation section; a...

20060163496 - Ion beam delivery equipment and an ion beam delivery method: The invention is intended to increase the number of patients treatable using one wheel having a thickness varied in the rotating direction to change energy of an ion beam passing the wheel. Ion beam delivery equipment for irradiating an ion beam to a patient for treatment comprises a beam generator...

20060163495 - Ion beam therapy system and its couch positioning method: A therapy system using an ion beam, which can shorten the time required for positioning a couch (patient). The therapy system using the ion beam comprises a rotating gantry provided with an ion beam delivery unit including an X-ray tube. An X-ray detecting device having a plurality of X-ray detectors...

20060163500 - Extreme uv radiation source device and method for eliminating debris which forms within the device: To suppress the adherence of debris as a result of a radiating fuel, such as tin or the like, within a vessel for forming high density and high temperature plasma of an extreme UV radiation source device, and to eliminate deposited tin and/or tin compounds with high efficiency, hydrogen radical...

20060163501 - Low pass x-ray scintillator system: A scintillated CCD detector system for imaging x rays uses x-rays having a photon energy in the range of 1 to 20 keV. The detector differs from existing systems in that it provides extremely high resolution of better than a micrometer, and high detection quantum efficiency of up to 95%....

20060163502 - Ultraviolet light with polymer conversion sheets: A handheld or display assembly device which allows a user to obtain UV light in varying wavelengths from a single standard short-wave (SW) ultraviolet lamp. A standard SW ultraviolet lamp that has no phosphor coating is used, and the conversion sheets with different mixtures (or compounds) of phosphor are applied...

20060163503 - Method for inspecting pattern defect and device for realizing the same: When using a CCD sensor as a photo-detector in a device for inspecting foreign matters and defects, it has a problem of causing electric noise while converting the signal charge, produced inside by photoelectric conversion, into voltage and reading it. Therefore, the weak detected signal obtained by detecting reflected and...

20060163504 - Identification sensor: A discrimination sensor includes a light emitting device individually emitting sensing light beams onto a surface of an object, such as a bill and having a sensing area that is wide in a direction perpendicular to a scanning direction; and a light detecting device assuring a light detecting area that...

20060163505 - Radiation image information reading apparatus: An apparatus housing and a controller are separate from each other, and opposite sides of a second casing of the apparatus housing have respective first and second cable ports defined therein for extending a cable connected to the controller. With the cable extended through the first cable port or the...

20060157637 - Focus detection device and fluorescent observation device using the same: A focus detection device which is applied to a fluorescent observation device for observing a fluorescent image to be emitted from an observation sample on the basis of an evanescent light, includes an image pickup unit which detects a contrast of the fluorescent image by imaging the fluorescent image, and...

20060157638 - Scanning microscope and specimen image obtaining method: A scanning microscope includes a light source unit that projects laser light, an optical system that converges and applies the laser light onto a data obtaining point on a specimen, a data obtaining order deciding unit that decides a data obtaining order in which adjacent data obtaining points are not...

20060157640 - Apparatus and method for capturing still images and video using coded aperture techniques: A system is described for capturing images comprising: a display for displaying graphical images and text; a plurality of apertures formed in the display; an image detector array configured behind the display and configured to sense light transmitted through the apertures in the display, the light reflected from a subject...

20060157643 - Method and system to enhance differential dynamic range and signal/noise in cmos range finding systems using differential sensors: Dynamic range of a differential pixel is enhanced by injecting, synchronously or asynchronously, a fixed compensating offset (ΔV) into a differential signal capacitor whenever magnitude of the differential signal across the capacitor exceeds a predetermined value. The number (N) of ΔV offsets made is counted. Effective differential signal capacitor voltage...

20060157644 - Scanning imager employing multiple chips with staggered pixels: A solid state imaging system has at least one CMOS imager with first and second series of pixels in which the pixels of one series are offset, i.e., staggered, in respect to the pixels of the other series. Multiple imagers can be arrayed end to end, with jumper wires connecting...

20060157641 - Scanning method of image scanner: An image scanner and scanning method thereof are provided. By simultaneously using two light emitting diodes of different colors as light sources and cooperatively performing simple image data computations, three color image signals are obtained so as to shorten the exposure time and improve signal-to-noise ratio of the image signal....

20060157642 - Solid state image sensor and manufacturing method therefor: According to this invention, light incident on a microlens at a large incident angle can be efficiently guided to a photo-electric converting portion in a solid state image sensor. In a solid state image sensor having a plurality of pixels, each of the plurality of pixels includes a microlens which...

20060157639 - Vehicle imaging processing system and method: An imaging system for a vehicle is provided. The system includes an image sensor generating a plurality of image frames, and a controller coupled to the image sensor. The controller is programmed to detect an obstructed image frame from the plurality of image frames. The obstruction corresponds to a windshield...

20060157646 - Optical receiver using avalanche photodiode: The invention discloses an optical receiver that prevents the instability of the bias voltage to the avalanche photodiode (APD) and facilitates the recovery of the bias voltage from the safety value. The optical receiver comprises the APD, the DC-DC converter to supply the bias voltage to the APD, the current...

20060157645 - Low voltage active cmos pixel on an n-type substrate with complete reset: A pixel sensor cell used in a CMOS image sensor is disclosed. The cell includes a pinned photodiode formed in a Pwell that is formed in an N-type semiconductor substrate. A transfer transistor is placed between the pinned photodiode and an output node. A reset transistor is coupled between a...

20060157648 - Methods, compositions and devices for performing ionization desorption on silicon derivatives: As used above, X is H or Y, where at least at least twenty five mole percent of X is Y and Y is hydroxyl, or —O—R1 or O—SiR1,R2,R3 wherein R1,R2, and R3 are selected from the group consisting C1 to C6 straight, cyclic, or branched alkyl, aryl, or alkoxy...

20060157647 - Multidimensional liquid chromatography/spectrometry: A liquid chromatography configuration providing at least three dimensions of separation coupled with spectrometry greatly improves the ability to detect ions present in samples, including complex biological samples such as blood. Liquid chromatography columns in one embodiment are connected with an in-line trapping column the alternately communicates with the second...

20060157649 - Method for non-destructive trench depth measurement using electron beam source and x-ray detection: A method (and system) for non-destructive measurement of a depth of a feature in a structure, includes using a scanning electron microscope (SEM) image to navigate to find the feature in an X-ray image, using an electron beam to produce a fluorescent emission in the feature, and using an X-ray...

20060157650 - Device and method for discrimating plastic: A plastic identifying apparatus according to the present invention identifies the kind of plastic in an object to be identified by using as an identification face at least two faces of a test piece (1) serving as the object to be identified. The plastic identifying apparatus according to the present...

20060157651 - Infrared sensor having no package can: An infrared sensor is composed of an optical filter plate, an infrared-detecting plate and a supporting member positioned between both plates. A detecting element for detecting infrared rays passing through the optical filter plate is formed on a front surface of the infrared-detecting plate facing the optical filter plate. The...

20060157652 - Near infrared chemical imaging microscope: A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted...

20060157653 - Multi-small field-of-view detector head spect system that scans over 360°: A multiheaded camera which is formed with a number of heads on one support structure and a different support structure with other heads. At least one of the heads is movable, so that the patient can obtain ingress and egress to the area....

20060157654 - Radiation detection system using solid-state detector devices: A neutron detection device (100) includes a semiconductor substrate including a gallium arsenide substrate region (102) having a back surface, and a high purity gallium arsenide active region (104) having a front surface. A back contact layer (118) is disposed on the back surface for providing a first voltage potential...

20060157655 - System and method for detecting hazardous materials: The present invention relates to mitigating the effects of distortions in pulse shape and energy of spectrum from gamma ray and/or neutron detectors. In one embodiment, the present invention uses pattern recognition techniques to identify and separate various distortions in the pulse shape and energy to obtain a better estimate...

20060157656 - Multi-radiation source-ferroelectric-based source of plurality of radiation types: The present invention provides a source of plurality of radiation types using a single source that is made of ferroelectric material in the form of a cathode. The generated radiation types consist of ion and electron beams, X-ray, visible light and ultraviolet radiation. These types allow testing the surface and...

20060157657 - Led array circuit: Provided is an LED array circuit that has reduced power consumption and can protect an LED from a reverse voltage. The LED array circuit includes an LED pair, and an AC power source for supplying an AC voltage to the LED pair. The LED pair includes a first LED and...

20060157658 - Radiation image photographing apparatus: A radiation image photographing apparatus configured to detect radiation includes a radiation detecting panel configured to convert received radiation into an electrical signal, and a support substrate configured to support the radiation detecting panel. In addition, a housing is configured to contain the radiation detecting panel and the support substrate....

20060151678 - Device having optical sensor: A functional device includes a light sensor for outputting a signal control signal relative to received light, a temperature sensor for outputting an additional control signal relative to an ambient temperature, a control means for controlling the signal control signal, and an output means for outputting a sensory signal perceivable...

20060151679 - Measuring device and adjustment method thereof: Avoiding an illumination light irregularity to the utmost under increasing degree of integration and the memory capacity by suppressing a light amount irregularity on the illumination pupil plane to the utmost, unable to be adjusted by a conventional method. When the light amount irregularity on the illumination pupil plane which...

20060151680 - Sensor and method of detecting the condition of a turf grass: A method of detecting the condition of a turf grass is described. According to one aspect of the invention, the method comprises steps of attaching an active sensor to a mower; traversing a section of turf grass; and processing the output of the sensor. A device for detecting the condition...

20060151681 - Augmented photo-detector filter: Method and systems related to obstructing a first predefined portion of at least one defined wavelength of light incident upon a first photo-detector array; and detecting the at least one defined wavelength of light with a photo-detector in a second photo-detector array....

20060151683 - Method and system for real time correction of an image: The optical aperture (21) of the optical sensor unit (10) has an acceptance angle such that at least 50%, alternatively 60%, alternatively 70%, alternatively 75% of the light received by the sensor (22) comes from light travelling within 15° of the optical axis of the light sensor (22)....

20060151682 - Scanner and calibration method used therein: A scanner and calibration method use therein. Setting first exposure duration and a second exposure duration for a transparency, wherein the first exposure duration is proportional to the second exposure duration. Scanning the transparency and a calibration area to produce a scan signal and a calibration signal, respectively, wherein the...

20060151684 - Apparatus and method for the position checking of a mechanical part: An apparatus for checking the integrity of tools includes an optoelectronic system (7) with a laser beam (21), a base (6) movable along a longitudinal direction (X) for enabling displacements between tool and optoelectronic system and a device for checking the mutual position including, for example, a transducer (9,10). A...

20060151685 - Electrical product and tilting control device thereof: An electrical product and a tilting control device thereof are provided. The tilting control device comprises a shell body, a light source, at least a transparent box, an opaque element, a plurality of photo-sensing units and a logic circuit. The light source is disposed inside the shell body for emitting...

20060151686 - Optical encoder: An optical encoder includes a code strip having a first side, a second side, a first track comprising indicia thereon, and a second track comprising indicia thereon. The code strip is moveable along a displacement path with respect to the optical encoder. A light source positioned on the first side...

20060151687 - Systems for differential ion mobility analysis: Disclosed herein are systems, methods and apparatus, for detection and identification of analytes in a volatilized or volatilizable sample, using the mobility-based signature that is produced when the volatilized sample is passed through an ion mobility based analyzer....

20060151688 - System and method for metabonomics directed processing of lc-ms or lc-ms/ms data: A method of programmatically reducing a set of collected LC-MS or LC-MS/MS data such that true chromatographic and MS peaks are identified for use in Metabonomics is disclosed. The identified peaks are used to create a list of LC/MS, GC/MS, DIOS-MS or MALDI-MS signals and responses for a batch of...

20060151689 - Mass spectrometer: A method of mass spectrometry is disclosed wherein a collision, fragmentation or reaction device is repeatedly switched between a high fragmentation or reaction mode and a low fragmentation or reaction mode. Parent ions from a first sample are passed through the device and parent ion mass spectra and fragmentation ion...

20060151690 - Means for removing unwanted ions from an ion transport system and mass spectrometer: The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artefact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located...

20060151692 - Method and apparatus for improved sensitivity in a mass spectrometer: In a mass spectrometer, ions from an ion source pass through an inlet aperture into a vacuum chamber for transmitting prior to mass analysis by the mass analyzer. The configuration of the inlet aperture forms a sonic orifice or sonic nozzle and with a predetermined vacuum chamber pressure, a supersonic...

20060151691 - Method and system for high-throughput quantitation of small molecules using laser desorption and multiple-reaction-monitoring: A mass spectrometry quantitation technique enables high-throughput quantitation of small molecules using a laser-desorption (e.g., MALDI) ion source coupled to a triplequadrupole mass analyzer. The ions generated from the ion source are collisionally damped/cooled, and then quantitatively analyzed using the triple-quadrupole analyzer operated in the multiple-reaction-monitoring (MRM) mode. Significantly improved...

20060151693 - Apparatus and method for adjustment of ion separation resolution in faims: An apparatus for controllably varying specificity of a FAIMS-based ion separation includes a first electrode surface portion defining an ion inlet within a portion thereof and a second electrode surface portion defining an ion outlet within a portion thereof. The second electrode surface portion is spaced-apart from the first electrode...

20060151694 - Apparatus and method for adjustment of ion separation resolution in faims: An apparatus for separating ions includes a FAIMS analyzer region having a first ion inlet for introducing ions into the FAIMS analyzer region. An ion outlet from the FAIMS analyzer region is provided for extracting a subset of the ions that is selectively transmitted along an average ion flow path...

20060151698 - Charged particle beam apparatus: A charged particle beam apparatus is provided which has high resolving power and a wide scanning region (observation field of view). The apparatus has a unit for adjusting the focus, a unit for adjusting astigmatism, a unit for controlling and detecting scanning positions and a controller operative to control the...

20060151697 - Charged particle beam equipment and charged particle microscopy: On the basis of a displacement of the field of view before and after a deflection of a charged particle beam, extracted from a first specimen image, including a displacement of the field of view recorded by causing a charged particle beam to deflect by a predetermined amount by a...

20060151696 - Electron microscope and a method of imaging objects: An electron microscope and a method of imaging objects. The method including the steps of: generating at least one electron pulse, each electron pulse including a plurality of electrons with the electrons having a kinetic energy spread; demagnifying each electron pulse using one or more lenses, each lens having a...

20060151699 - Method and an apparatus of an inspection system using an electron beam: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such...

20060151695 - Process and device for measuring ions: The invention relates to a method and a device for the measurement of ions by coupling different measurement methods/techniques, a first detector being a collector (17) and a second detector being an SEM (18), and the ions to be measured or resulting secondary particles being selectively delivered to the collector...

20060151700 - Scanning electron microscope and method for detecting an image using the same: In the present invention, in order to realize both a reduction of an image detecting time and high quality image detection in a scanning electron microscope for measurement, inspection, defect review, or the like of semiconductor wafers, a low-magnification image is taken by using a large beam current; a high-magnification...

20060151701 - Scanning transmission electron microscope and scanning transmission electron microscopy: A scanning transmission electron microscope which enhances correction accuracy of a de-scanning coil for canceling a transmitted-electron-beam position change on an electron detector. Here, this transmitted-electron-beam position change appears in accompaniment with a primary-electron-beam position change on a specimen caused by a scanning coil. First, control over the scanning coil...

20060151702 - Near infrared chemical imaging microscope: A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted...

20060151703 - Infrared defect detection via broad-band acoustics: A method of detecting defects in structures, comprising the steps of inducing mechanical energy in a structure via the emission of a broad-band acoustic signal, and capturing over a time interval a plurality of images of the structure each of the plurality of images comprised of a plurality of pixels...

20060151704 - Laser-based material processing methods, system and subsystem for use therein for precision energy control: A laser-based material processing method, system and subsystem for use therein for precision energy control are provided, wherein a bulk attenuator is switched across an RF driver output to greatly lower the overall RF output and resulting laser energy per pulse. The value of the attenuator determines the range of...

20060151705 - Method and system for scatter correction in a positron emission tomography system: Methods and systems for providing scatter correction in a positron emission tomography (PET) system are provided. The method includes determining a look-up table of scatter sinograms during a PET acquisition scan period. The method further includes scatter correcting acquired scan data obtained during the PET acquisition scan period....

20060151706 - Scintillator member and manufacturing method thereof, and radiation measuring device: When a heating process is performed in a state where a thermal transfer sheet is superimposed on a scintillator plate, a film of the thermal transfer sheet is separated from the thermal transfer sheet and adhered onto the scintillator plate. The film includes a protective layer, an aluminum layer, and...

20060151707 - Pmt signal correlation filter: A method of generating a filter (40) for a nuclear medicine system (20) where the filter selects valid detected radiation events for image processing. A dataset (60) is provided that is indicative of a plurality of emitted radiation events occurring over a predetermined period of time. Signals representative of the...

20060151708 - Multi-layer detector and method for imaging: X-ray portal imaging detectors have multiple layers, such as multiple layers of phosphor screens and/or detectors. Some x-rays that pass through one layer are detected or converted into light energies in a different layer. For example, one phosphor screen is provided in front and another behind that panel detector circuitry....

20060151709 - Device and method for determining an allowed expsure of human skin to uv radiation: The aim of the invention is to be able to produce verifiable and reproducible information regarding the maximum radiation dose and/or the maximum exposure time of a subject to a UV radiation source. Said aim is achieved by a device for determining the allowed exposure time and/or radiation dose, comprising...

20060151710 - Exposure device, exposure method, and semiconductor device manufacturing method: To provide an exposure apparatus and an exposure method able to correct an image-placement error during an exposure which is unable to decrease only by correcting electron beam description data of a mask pattern, and a semiconductor device manufacturing method used the same, wherein an image placement R2 of a...

20060151712 - Focusing apparatus and lithography system using the same: A focusing apparatus and a lithography system using the same capable of adjusting a uniformity of an electromagnetic field by moving a portion of a magnetic field generator. The focusing apparatus may control a path of an electron beam generated from an electron-beam emitter of the lithography system. In the...

20060151711 - High current density particle beam system: The present invention relates to a charged particle unit for deflecting and energy-selecting charged particles of a charged particle beam. Thereby, a double-focusing sector unit for deflecting and focusing the charged particle beam and an energy-filter forming a potential is provided, whereby charged particles of the charged particles beam are...

20060151713 - Multiple lens assembly and charged particle beam device comprising the same: The invention provides a multiple lens assembly 1 for a charged particle beam device which comprises at least two lens sub units 2, each sub unit having an optical axis 3, wherein at least two of the optical axes of the lens sub units are inclined to each other. Further,...

20060151714 - Apparatus and process for filling a medicament into a container: Apparatus for introducing a medicament into containers, especially vials, in which the containers are passed through an enclosure and exposed therein to a sterilising electron beam. The containers are then conveyed to a filling station situated outside the enclosure at which a wall part of the container is punctured with...

20060151715 - Treated water dispensing system: A water treatment tank for use with water purification apparatus including an ultra-violet lamp within an encapsulating sleeve onto which incoming water is directed to provide a thin laminar flow about the bulb. The lower compartment has cooling coils about the walls for cooling the water therein relative to the...

20060151716 - Micro-column electron beam apparatus: Provided is a micro-column electron beam apparatus including: a base; an electron lens bracket on which an electron lens modulate can be fixed, mounted in a central portion of the base; an electron beam source tip module vertically disposed on the electron lens module; a pan spring plate stage module...

20060151717 - Apparatus including a radiation source, a filter system for filtering particles out of radiation emitted by the source, and a processing system for processing the radiation, a lithographic apparatus including such an apparatus, and a method of filtering p: Particles emitted by a radiation source, and moving from the radiation source towards a processing system for processing the radiation from the radiation source, are filtered out of radiation propagating through a predetermined cross section of the radiation as emitted by the radiation source by a filter system. The filter...

20060151718 - Exposure apparatus and exposure method: The present invention pertains to an exposure apparatus and exposure method that produces plasma from the target material, generates pulsed light and carries out exposure with the pulsed light; and has as its object to obtain good uniformity of exposure dose even in the case that a pulsed light generated...

20060151720 - Electromagnetic focusing method for electron-beam lithography system: A method for projecting a predetermined pattern of an electron beam from an emitter to a wafer in a vacuum chamber of an electron-beam lithography system is provided. An initial condition for performing an electromagnetic focusing is first set and outspread phenomenon of the electron beam, which is caused by...

20060151721 - Electron beam drawing apparatus, deflection amplifier, deflection control device, electron beam drawing method, method of manufacturing semiconductor device, and electron beam drawing program: According to an aspect of the invention, there is provided an electron beam drawing apparatus comprising at least one stage of a deflection amplifier and a deflection unit, a first storage section which stores shot information at a drawing time, a second storage section which stores a correction table indicating...

20060151719 - Electron beam duplication lithography method: An electron beam duplication lithography apparatus and method for focusing electrons emitted from a mask plate as a result of an application of an electric field between a mask plate and a duplication plate. Irradiation of electrons from the mask plate is assisted through an electric field lens or magnetic...

20060151722 - Coherent thz emitter with dc power reducing resistor: An emitter for emitting radiation in a first range of frequencies comprising: a photoconductive material (11); and first and second contact elements (12, 13, 14) separated by a photoconducting gap provided by said photoconducting material (11), for applying a bias across said photoconducting gap, wherein at least one of said...

20060151723 - Infra-red source and gas sensor: An infrared source and a gas sensor, a first layer and a second layer effecting bandpass filter characteristics for an operating frequency range....

20060151724 - Temperature adjustment apparatus, exposure apparatus having the same, and device fabricating method: A temperature adjustment apparatus for adjusting the temperature of an optical member includes a first radiation mechanism, with a first radiation member, that transfers the radiation heat between a predetermined area of the optical member and for adjusting the temperature of the optical member by the first radiation member; and...

20060151725 - Light device of arranging thin film inspection sensor array, and method and apparatus for arranging sensor array using the same: There is disclosed a light device for arranging a thin film pattern sensor array where a sensor array used for inspecting a thin film pattern is made to be arranged without a separate correction pattern film in accordance with an inspection subject. In the light device for arranging the thin...

20060151726 - Method and apparatus for reducing or eliminating stray light in an optical test head: An optical test head comprises one or more optical input paths by which a beam of light is communicated from a light source to a workpiece and one or more optical output paths by which light reflected off of the workpiece is communicated to a detector. The input optical path...

20060151727 - System and method for detecting dropping amount of liquid crystal: A system for determining the amount of LC that is dropped on a display panel is presented. The system can adjust the amount of the LC to be dropped based on a real-time feedback on the amount of LC that is currently being dropped. The amount of LC that is...

20060151728 - Radiation image signal acquiring method: A stimulable phosphor sheet, on which a radiation image of an object has been stored, is scanned with stimulating rays, which cause the stimulable phosphor sheet to emit light in proportion to the amount of energy stored on the stimulable phosphor sheet during exposure of the stimulable phosphor sheet to...

20060145051 - Optical module and its wavelength monitor control method: The measurement portion (1) measures temperature by a thermistor (5) in the measurement portion, and measures a bias current by using an LD drive current detecting circuit (6). The LD temperature, optical output and bias current are measured by the measurement portion. The relationship between the LD temperature and wavelengths...

20060145052 - Optical module and its wavelength monitor control method: Methods and apparatus for assigning weighting coefficients to measurements of a succession of stars acquired by a star sensor connected to a client device in order to determine a spatial orientation, characterized in that higher or lower preference is given to refreshment of the positions of measurements with the highest...

20060145053 - Electronic devices including dual-function electronic components, radiation-emitting components, radiation-sensing components, or any combination thereof: An electronic device can include circuitry that compensates for the emission intensity of a display, including a radiation-emitting component, in response to ambient radiation. In one embodiment, the circuitry includes a low-pass filter that can help to reduce the effect of quick changes in intensity of ambient radiation. In another...

20060145054 - Electron multiplier: A venetian blind dynode 5A of the first stage collects incident electrons efficiently, multiplies these electrons, and emits the multiplied secondary electrons to a metal channel dynode 5B of the second stage. By metal channel dynodes 5B of the second stage onward successively multiplying the incident secondary electrons efficiently, the...

20060145057 - Image sensor: A image sensor has a plurality of microlens disposed across an image area in which centrally disposed red pixels are provided with smaller microlenses and peripherally disposed red pixels are provided with larger microlenses. The size differential, which amounts to a small percentage to compensate for a refractivity differential per...

20060145055 - Image sensor and method for fabricationg the same: An image sensor having self-aligned microlenses and a method for fabricating the same. The image sensor includes a photodiode formed in a predetermined surface of a silicon substrate, a planarization layer formed above the silicon substrate, the planarization layer having a recess in correspondence to the photodiode, and a color...

20060145056 - Image sensor having diffractive lens and method for fabricating the same: An image sensor including a diffractive lens simplifies a fabrication process and minimizes loss. The image sensor includes a diffractive lens as an inner lens between a color filter portion and a photodiode for compensating sensitivity to a light received. A method for fabricating the image sensor includes forming a...

20060145058 - Interior rear view mirror for vehicles, preferably motor vehicles: The invention relates to interior rear view mirrors, in the mirror housing (1) of which sensors are disposed that sit on an electronic board (13). Said rear view mirrors require substantial assembly space such that the assembly position of the sensor is limited. In order not to restrict the assembly...

20060145059 - Isolation of short-circuited sensor cells for high-reliability operation of sensor array: A device comprising an array of sensors and a multiplicity of bus lines, each sensor being electrically connected to a respective bus line and comprising a respective multiplicity of groups of micromachined sensor cells, the sensor cell groups of a particular sensor being electrically coupled to each other via the...

20060145060 - Photo-sensing device: A photo-sensing device includes a light emitting part, a light receiving part, and a housing. The light emitting part emitting a beam of light to the light receiving part, and the housing contains the light emitting part and the light receiving part. The housing includes at least an opening, and...

20060145061 - Lens system and image-taking apparatus having the same: A lens system disclosed in the present application comprises: in order from the front to the rear, a first lens element having a meniscus shape whose concave surface is directed rearward and having a negative optical power; an aperture stop; a second lens element whose both lens surfaces have a...

20060145062 - Optoelectronic detection device: The invention relates to an optoelectronic detection device, especially a laser scanner, comprising a transmitting device for transmitting preferably pulsed electromagnetic radiation, also comprising at least one receiving device which is associated with the transmitting device and at least one deflection device which is used to guide radiation which is...

20060145063 - Optical device and method for rotation sensing: A method and device are presented for use in determining a rate of rotation of an object. The device comprises a light guide comprising an arrangement of a plurality of coupled optical resonators arranged along a curvilinear optical path. This allows for determining a change in at least one of...

20060145064 - Projection system: A projection system for image display with at least one lamp (1), with at least one sensor (5) for detecting changes in the luminous flux delivered by said at least one lamp (1) and for compensating these changes through a suitable control of the image display and/or the lamp is...

20060145066 - Displacement detection apparatus, displacement gauging apparatus and fixed point detection apparatus: A displacement detecting apparatus, a displacement gauging apparatus and a fixed point detection apparatus can highly accurately detect a fixed point or gauge a displacement by reducing the disturbances of polarization due to the stress and the buckling of the optical fiber for transmitting a light beam emitted from a...

20060145065 - Position-to-number electro-optical converter: An optoelectronic code-to-position encoder intended for measuring linear and angular travels of an object contains a coordinate scale with raster and code tracks, a readout unit, which includes a lighter, a raster analyzing mask, light detectors of the raster track and a multi-element light detector of the code track. The...

20060145068 - Metal oxide-assisted laser desorption/ionization mass spectrometry: The invention provides a simple, rapid and cost-effective metal oxide-assisted laser desorption/ionization mass spectrometry (MOALDI MS) without the addition of light-absorbing organic-matrix, comprising the use of (a) an inorganic metal oxide with light absorbing capability as an assisting material to render desorption/ionization of samples in laser desorption/ionization mass spectrometry and...

20060145067 - Method for analysing physical and/or chemical properties of the surface layer of a solid body (variants): According to the method for analyzing physical and/or chemical properties of the surface layer of a solid as per claim 1, the surface layer is activated by a unit irradiation pulse and, when the irradiation is over, is deactivated by keeping the solid at a constant temperature and subsequently heating...

20060145071 - Apparatus for delivering ions from a grounded electrospray assembly to a vacuum chamber: The present invention relates to an apparatus for delivering ions to a vacuum chamber. The apparatus comprises an ionization chamber, an ionization region within the ionization chamber, a vacuum interface at a vacuum interface voltage and a vacuum chamber, wherein the ionization chamber communicates with the vacuum chamber through the...

20060145069 - Direct flow injection analysis nebulization electrospray and apci mass spectrometry: A method and apparatus for Flow Injection Analysis (FIA) into Atmospheric Pressure Ion sources (API) including Electrospray (ES) and Atmospheric Pressure Chemical Ionization (APCI) sources whereby the sampling and spray needles are one and the same. The sampling and spray needle configured with an autoinjector apparatus or used in manual...

20060145070 - Method and apparatus for mass spectrometry: A method of mass spectrometry. The method starts with gaining a total ion chromatogram by a mass spectrometer. An accumulation mass spectrum indicating vicinities of a desired peak top of the total ion chromatogram is displayed. The operator selects a desired mass peak from the displayed accumulation mass spectrum. Another...

20060145072 - On-axis electron impact ion source: An electron impact ion source includes an ionization chamber in which a first rf multipole field can be generated and an ion guide positioned downstream from the ionization chamber in which a second rf multipole field can be generated wherein electrons are injected into the ionization chamber along the axis...

20060145073 - Chemical etch solution and technique for imaging a device's shallow junction profile: The present invention provides, in one aspect, a method of imaging a microelectronics device 100. The method comprises cleaning, when contaminants are preset, a sample of a microelectronics device 100 to be imaged with a first solution comprising hydrofluoric acid, an inorganic acid and water, exposing the sample to a...

20060145074 - Delineation of wafers: A method of junction delineation of non-epitaxial wafers comprises the steps of preparing a sample of the wafer, staining the sample using a mixture of between one and three parts hydrofluoric acid to fifty parts nitric acid to twenty parts water, and scanning the sample with a scanning electron microscope....

20060145076 - High-accuracy pattern shape evaluating method and apparatus: A quantity (or dispersion value) of a distribution of edge position due to random noise is expected to be reduced statistically to 1/N when N edge position data items are averaged. Using this property, the single page image is averaged in a vertical direction with various values of parameter S,...

20060145075 - Method and apparatus for evaluating thin films: A method for evaluating thin films comprises the steps of inputting measurement conditions, generating electron beams from an electron source to condense the electron beams to a specimen by a condenser lens, enlarging the electron beams transmitted by the specimen with imaging lenses to image an enlarged image of the...

20060145077 - Image sensor using optical fiber: An image sensor using an optical fiber is provided, in which less pixel straying is generated, so that clearer images can be obtained. The image sensor includes an image sensing portion for sensing an optical signal per pixel, the optical signal traveling along an input path; and an image aligner...

20060145078 - Gas measurement system: A gas measurement system of this invention includes a housing adapted to be mounted on an airway adapter, and a luminescence quenching gas measurement assembly disposed in the housing. The luminescence quenching gas measurement assembly includes a source disposed in a first plane, and at least one detector also disposed...

20060145079 - Density detection using real time discrete photon counting for fast moving targets: A system for detecting and graphically displaying a contents of a fast-moving target object comprises: a radiation source, having a position such that at least a portion of radiation emitted from the radiation source passes through the fast-moving target object, the fast-moving target object having a variable velocity and acceleration...

20060145080 - Density detection using real time discrete photon counting for fast moving targets: A system for detecting and graphically displaying a contents of a fast-moving target object comprises: a radiation source, having a position such that at least a portion of radiation emitted from the radiation source passes through the fast-moving target object, the fast-moving target object having a variable velocity and acceleration...

20060145082 - Method and system for positron emission tomography image reconstruction: Methods and systems for controlling a positron emission tomography (PET) system are provided. The method includes receiving timing information from a PET system during an imaging scan using the PET system. The method further includes processing the received timing information and timing bias information relating to the PET system to...

20060145081 - Collimator with variable focusing and direction of view for nuclear medicine imaging: According to the present invention, a novel slat collimator for use in nuclear medicine imaging is provided. The slat collimator comprises a first layer comprising a plurality of spaced apart elongated slats and a second layer comprising a plurality of spaced apart elongated slats. The slats of the second layer...

20060145083 - Imaging device and imaging system: An imaging device comprising a scintillator and a first and second imaging elements. The scintillator emits scintillation light in response to an incident of an energy beam. The imaging elements take an image of the scintillation light. These imaging elements have imaging faces opposing to each other, and the scintillator...

20060145085 - Ceramic scintillator, and radiation detector and radiographic examination apparatus using same: A ceramic scintillator comprises a sintered body of a lutetium oxysulfide phosphor containing at least one element selected from Pr, Tb and Eu as an activator. The sintered body of a lutetium oxysulfide phosphor contains 5 to 15 ppm of an alkali metal element and 5 to 40 ppm of...

20060145084 - Solid-state imaging device and radiotion imaging system: N+-type semiconductor regions 12d are formed on a front surface side of a p31 -type layer 12c of a semiconductor substrate 12, and these n+-type semiconductor and p−-type semiconductor constitute photodiodes. A metal wire 14 electrically connected to an isolation region 12e is formed on a first insulating layer 13....

20060145086 - Dose rate simulation: Behaviors of a transistor during a dose rate event can be modeled using a circuit simulation software package. A subcircuit model replaces a transistor in a circuit design to be simulated. The subcircuit model can be in the form of a schematic-based representation or a netlist. The subcircuit model provides...

20060145087 - Apparatus and method for inspection and testing of flat panel display substrates: A charged particle optical system for testing, imaging or inspecting substrates comprises: a charged particle optical assembly configured to produce a line of charged particle beams equally spaced along a main scan axis, each beam being deflectable through a large angle along the main scan axis; and linear detector optics...

20060145088 - High energy polyenergetic ion selection systems, ion beam therapy systems, and ion beam treatment centers: Devices and methods are provided for generating laser-accelerated high energy polyenergetic positive ion beams that are spatially separated and modulated based on energy level. The spatially separated and modulated high energy polyenergetic positive ion beams are used for radiation therapy. In addition, methods are provided for treating patients in radiation...

20060145089 - Ionization source for mass spectrometry analysis: A new ionization source named Surface Activated Chemical Ionization (SACI) has been discovered and used to improve the sensitivity of the mass spectrometer. According to this invention the ionization chamber of a mass spectrometer is heated and contains a physical new surface to improve the ionization process. The analyte neutral...

20060145090 - Metal ion emission device and process for producing the same, ion beam irradiation device, processing apparatus and analyzing apparatus provided with emission device: A metal ion emission device for emitting a metal ion by applying voltage to a molten liquid metal, characterized inthat the device for emitting a metal ion comprises a needle-like part having holes in which the liquid metal can be moved, and the needle-like part has a first opening for...

20060145092 - Radiation monitor: The present invention provides a method for monitoring temporal variation in irradiating radiation received by a material, comprising the steps of: providing a flow of an actinometric fluid (4) through a monitoring portion (22) of a passage (10), such that said actinometric fluid therein intercepts a flux of said irradiating...

20060145091 - Self indicating radiation alert dosimeter: Described as a self-indicating instant radiation dosimeter (1001) for monitoring high energy radiations, such as X-ray. The dosimeter contains a radiation sensitive, color changing, indicating composition (10), e.g., a diacetylene (R—C═C—C═C—R′, where R and R′ are substituents groups) or a radiochromic dye, a polymeric binder (20) and optionally a shelf...

20060145093 - Method and device for electron beam irradiation: The invention refers to a method and device for ventilating a device for electron beam irradiation of a web (W), the method comprising the steps of: providing a first chamber (107) comprising a web inlet opening (115) and a web outlet opening (121), providing a second chamber (111) extending inside...

20060145094 - Optical element, lithographic apparatus including such an optical element, device manufacturing method, and device manufactured thereby: An optical element including an anti-reflection (AR) coating is configured to reflect Extreme-Ultra-Violet (EUV) radiation only....

20060145096 - Ion beam scanning control methods and systems for ion implantation uniformity: Methods are provided for calibrating an ion beam scanner in an ion implantation system, comprising measuring a plurality of initial current density values at a plurality of locations along a scan direction, where the values individually correspond to one of a plurality of initial voltage scan intervals and one of...

20060145095 - Methods and apparatus for ion implantation with control of incidence angle by beam deflection: A method for implanting ions into a workpiece, such as a semiconductor wafer, includes generating an ion beam, providing a workpiece support surface to support a workpiece during ion implantation, deflecting the ion beam to provide a desired incidence angle of the deflected ion beam relative to the workpiece support...

20060145097 - Optics for generation of high current density patterned charged particle beams: A direct-write electron beam lithography system employing a patterned beam-defining aperture to enable the generation of high current-density shaped beams without the need for multiple beam-shaping apertures, lenses and deflectors is disclosed. Beam blanking is accomplished without the need for an intermediate crossover between the electron source and the wafer...

20060145098 - Real-time monitoring apparatus for biochemical reaction: The present invention relates to an apparatus for real-time monitoring chemical reaction between various biomaterials. More particularly, the present invention directed to a real-time monitoring apparatus for biochemical reaction, which comprises parabolic mirror and/or an optical waveguide tube for effective irradiation of light over the whole plate with uniform intensity....

20060145099 - Mask overlay for infrared target assembly: An infrared target for use with indoor industrial G.P.S. has at least one mask or overlay applied to the lens of the target. The mask increases the precision of setting the location of any instrument, assembly, machinery, or component to be machined, during industrial applications. The mask improves position tolerances...

20060145100 - System and method for detecting an object on a moving web: The system includes a light source that emits light onto a web and objects that are on the web. The system further includes a lens that has a radial index of refraction gradient. The lens is positioned such that the lens only captures light above a nominal level when light...

20060145101 - Method for the contactless measurement of an object: The invention relates to a method for the contactless measurement of an object in at least one dimension. An object is scanned in a spatially restricted effective zone of a scanning beam field and the size of the object in terms of the measured dimension is deduced by the detection...

20060145102 - Process and apparatus to control the integrity of a planar substrate: The process comprises the following steps: detection of the passage of an edge of the substrate by a first trigger, detection of the passage of said edge of the substrate at least at a first selected checkpoint on the substrate; control of the presence of the detection of the edge...

20060145103 - Vacuum evaporator: A vacuum evaporator including a vacuum chamber and a source arranged in the vacuum chamber to supply a deposition material to a substrate on which a layer is formed. A crystal sensor measures a deposition speed of the deposition material. The crystal sensor includes an insert having a hole, and...

20060145104 - Storage phosphor erase: A storage phosphor erase apparatus for selectively erasing storage phosphors having different lateral dimensions transported along a first direction. The apparatus includes an array of point sources of erasing radiation spanning at least the greatest lateral dimension of a storage phosphor to be erased; and a control for actuating all...