Radiant energy inventions 05/06

20060108499 - Low irradiance sensor with iterative angular resolution: A laser warning receiver (LWR) to detect a very low power laser beam for a laser beam rider and provide a high angular resolution in determining the angle-of-arrival of that beam. An aperture having a fixed field-of-view (FOV) is located in a detection channel followed by a narrow-band filter and...

20060108500 - Laser power control with automatic compensation: A method and apparatus is disclosed for optic signal power control to maintain a desired or optimum optic signal power level. During start-up, a default or target value from memory may be utilized to bias or otherwise control operation of an optic signal generator or driver. During operation, pre-stored values...

20060108501 - Laser power control with automatic compensation: A method and apparatus is disclosed for optic signal power control to maintain a desired or optimum optic signal power level. During start-up, a target value from memory may be utilized to control one or more power levels of an optic signal. There may comprise 2 or more different power...

20060108502 - Microscope light regulator: A control system has been designed that maintains the overall intensity of a microscope's viewed image at a constant level. The system is further enhanced to match the color character of the microscope illuminator to a user-established color reference for replication and comparison purposes. A comparison bridge utilizing this system...

20060108503 - Method and system for shaping a spatial response of a spatial filter: A spatial filter includes a number of photodetectors that generate individual signals in the time domain. The individual signals are subsequently divided and grouped to create the I and Q channels output from the spatial filter. Prior to the formation of the I and Q channels, a window function is...

20060108507 - Active pixel sensor and image sensing module: An active pixel sensor includes a photosensitive element, and first and second transistors. The photosensitive element generates an electrical signal in response to detected light, and updates the electrical signal in response to a reset signal. The first transistor is coupled electrically to the photosensitive element, and amplifies the electrical...

20060108506 - Column averaging/row binning circuit for image sensor resolution adjustment in lower intensity light environment: A photo-sensor image resolution adjustment apparatus is in communication with an array of image photo-sensors that are organized in columns and rows and have multiple sensor types arranged in a pattern such as a Bayer pattern to detect light. The photo-sensor image resolution adjustment apparatus has a photo-sensor array decimation...

20060108505 - Imaging systems and methods: Imaging systems and methods are provided. One exemplary system incorporates multiple lenses that are individually configured to receive multi-wavelength light from an object to be imaged. Each lens provides an optimal modulation transfer function (MTF) for an individual wavelength contained in the multi-wavelength light when this individual wavelength of light...

20060108508 - Method and apparatus for high speed imaging: A novel method and apparatus is described for imaging at high speed from digital data. This method is an improvement on the present art in two significant manners. The means for generating the light and the use of large number of independent light sources in an internal drum imaging geometry,...

20060108504 - Solid state imager: A charge division arrangement for a CCD device for producing a divided charge output from an input charge, comprising an input for receiving an input charge, an array of elements and an output. The array of elements being arranged in rows and columns and having clock connections to allow charge...

20060108509 - Systems and methods for multi-modal imaging: The invention relates to imaging systems that include a coded aperture detection system and an optical detection system. The coded aperture detection system is configured to detect radiation emitted by a radionuclide present within an object and to provide a first detector signal from the detected radiation. The optical detection...

20060108512 - Intensity detector circuitry: An analog to digital converter and related systems....

20060108511 - Light detection circuit: A circuit for detecting light comprising: a) a light-integrating photosensor circuit responsive to light for producing a variable voltage signal representing the accumulation of the light over time; and b) a measurement circuit for receiving a time measuremrfent signal and the variable voltage signal to produce an output value representing...

20060108510 - Multiple parameter laser power control with automatic compensation: A method and apparatus is disclosed for optic signal power control to maintain a desired or optimum optic signal power level. During start-up, a default or target value from memory may be utilized to bias or otherwise control operation of an optic signal generator or driver. During operation, one or...

20060108513 - Controller for material dispensing nozzle control signal and methods: A material dispensing system for dispensing material onto a moving substrate (110), including a material dispensing nozzle (102), a material dispensing control signal controller (130) coupled to the material dispensing nozzle, a material dispensing control signal generator (120) coupled to the material dispenser control signal controller, the material dispensing control...

20060108514 - Pulse modulation light detection device, electronic apparatus, and pulse modulation light detection method: A light emitting device for emitting pulse lights synchronized with a pulse signal is provided. A light receiving device for receiving the pulse lights reflected by or penetrating an object to be detected is provided. A signal processing circuit for detecting whether the object exists or not, based on a...

20060108515 - Optical scale and optical encoder using same: When a convex lens 13 comes close to 0-th order transmitted light T0 with rotation of an optical scale 11, the 0-th order transmitted light T0 derived from a light beam L emitted from a light source 15 and transmitted through a diffraction grating 12 around is converged and incident...

20060108516 - Optical encoder: An optical encoder assembly and a method for measuring a rotation angle in which optical beams are spread over the circumference of a rotating optical disk by means of optical guides (OG). In the preferred embodiment the rotating optical disk has a pair of concentrically arranged circular patterns with alternating...

20060108517 - Laser power control with automatic compensation: A method and apparatus is disclosed for optic signal power control to maintain a desired or optimum optic signal power level. During start-up, a default or target value from memory may be utilized to bias or otherwise control operation of an optic signal generator or driver. During operation, pre-stored values...

20060108519 - Enhanced flat-panel display photosensing apparatus and method thereof: A display photosensing apparatus and/or system for precision sensing of emitted light including a reflector unit configured to have at least one first hole, and a first photosensitive element disposed behind the reflector unit for receiving a light passing through the at least one first hole, can increase the sensitivity...

20060108518 - Structure for calibrating packaging of electric micro-optic modules: The present invention relates to a structure for calibrating the alignment between a lens set and an image sensor in the process of packaging such as an electric micro-optic module (EMOM) or compact camera module (CCM) by using a matching structure like sawteeth or V-grooves at contact surfaces or edges....

20060108521 - Daughter ion spectra with time-of-flight mass spectrometers: The invention relates to methods and devices for measuring daughter ion spectra (also called fragment ion spectra or MS/MS spectra) in time-of-flight mass spectrometers with orthogonal injection of the ions. The invention filters the parent ions selected to be fragmented by a mass filter before they are injected into the...

20060108520 - Ion guide for mass spectrometers: Disclosed is an improved method and apparatus for transporting ions from a first pressure region in a mass spectrometer to a second pressure region therein. More specifically, the present invention provides a segmented ion funnel for more efficient use in mass spectrometry (particularly with ionization sources) to transport ions from...

20060108522 - Apparatus for detecting chemical substances and method therefor: An organic acid or an organic acid salt is used to generate an organic acid gas from an organic acid gas generator 3 to be mixed with a sample gas for introduction into an ion source 4 for ionization, thereby obtaining a mass spectrum by a mass analysis region 5....

20060108523 - Scanning mechanism for scanning probe microscope and scanning probe microscope: A scanning probe microscope scanning mechanism has a Z stage for moving an object to be moved along the Z-axis. The Z stage includes an insulating board, a Z-direction moving actuator fixed to the insulating board, wires for the application of a voltage to the Z-direction moving actuator, and electrical...

20060108524 - dimension measuring sem system, method of evaluating shape of circuit pattern and a system for carrying out the method: The present invention relates to a dimension measuring SEM system and a circuit pattern evaluating system capable of achieving accurate, minute OPC evaluation, the importance of which increase with the progressive miniaturization of design pattern of a circuit pattern for a semiconductor device, and a circuit pattern evaluating method. Design...

20060108526 - Apparatus for measuring a three-dimensional shape: Conventionally, there is no method for quantitatively evaluating the three-dimensional shape of an etched pattern in a non-destructive manner and it takes much time and costs to determine etching conditions. With the conventional length measuring method only, it has been impossible to detect an abnormality in the three-dimensional shape and...

20060108527 - Scanning electron microscope: In a scanning electron microscope, slimming is reduced by reducing a frame count. As the frame count is reduced, the amount of detected secondary electrons decreases, so that a probe current amount is increased to emit an increased amount of detected secondary electrons. A primary electron beam is scanned on...

20060108525 - Scanning electron microscope and system for inspecting semiconductor device: A scanning electron microscope has an electron source for illuminating a primary electron beam on a specimen wafer, an accelerating electrode, a condenser lens, a deflector, an objective lens, a detector for acquiring a digital image by sampling a signal of emissive electrons generated from the specimen wafer, a digitizing...

20060108528 - Ifrared detector composed of group iii-v nitrides: A quantum-well infrared photodetector (QWIP) is presented. The photodetector includes a substrate, a buffer layer, a first conductive layer, a multiple quantum well, an optional blocking layer, and a second conductive layer. Substrate is composed of a monocrystal which may be removed after fabrication. Remaining layers are composed of group...

20060108529 - Sensor and image pickup device: A sensor for detecting a received electromagnetic wave comprising a first electrode, a second electrode and an amorphous oxide layer interposed between the first electrode and the second electrode....

20060108530 - Device and method for detecting a divergence of an adaptive system and use of such a device for the detection of a divergence of a digital filter: A divergence detection device for an adaptive system comprising means for calculating the energy of an input signal of the system, means for calculating the energy of an output signal of the system and means for analysing the energy of the input signal and the energy of the output signal...

20060108531 - Method and apparatus for multiple charged particle beams: A multi-charged particle beam tool for semiconductor wafer inspection or lithography includes an array of electron beam columns, each having its own electron or ion source. The objective lenses of the various electron beam columns, while each has its own pole piece, share a common single magnetic coil which generates...

20060108532 - Spect gamma camera with a fixed detector radius of orbit: The current invention presents designs of SPECT gamma cameras without the in-out mechanical motion of the detectors. The elimination of this motion is achieved by the implementation of iterative algorithms, such as Resolution Recovery and/or Wide Beam Reconstruction, which compensate for the Line Spread Function effect due to the collimator...

20060108533 - Detector array for imaging system and method of making same: A method of manufacturing a detector array for an imaging system, the method comprising providing a pixelated scintillator having a plurality of lost molded pixels comprising a scintillator material adapted to detect radiation....

20060108534 - Analytical instrument with variable apertures for radiation beam: An X-ray analysis device makes use of a variable aperture for controlling the position and cross section of the X-ray beam. The variable aperture is configured to allow changes in the cross section and/or position of the beam by movement of one aperture component in one direction. In one embodiment,...

20060108535 - Apparatus and a method of determining hydrogen by use of a neutron source: This invention relates to an apparatus for the detection of the hydrogen content of an object, wherein said apparatus comprises a neutron source that emits fast/energy-rich neutrons; a detector device for detecting thermal neutrons; a moderator that brakes and reflects neutrons upon collision; wherein said detector device comprises a light-emitting...

20060108536 - Faraday assembly of ion implantation apparatus: A Faraday assembly of an ion implantation apparatus includes a Faraday cup in a vacuum chamber, a driving shaft to which the Faraday cup is connected, a motor for inserting the driving shaft further into and drawing the driving shaft out of the vacuum chamber to cause the Faraday cup...

20060108537 - Aerosol particle charging equipment: An X-ray emitting section 22 for emitting soft X-ray is arranged facing a chamber 21. An inlet duct 23 and a outlet duct 24 are arranged on both sides of the chamber 21. An irradiating region is ionized by the soft X-ray. It is therefore possible to achieve a charging...

20060108539 - Ionization by droplet impact: The invention relates to methods and instruments for ionizing analyte molecules, preferably biomolecules, which are dissolved in liquids or firmly adsorbed on surfaces. Liquids are nebulized at atmospheric pressure by electrospraying. Highly charged microdroplets, which enter the vacuum of the mass spectrometer through the inlet capillary, strike an impact plate...

20060108538 - Method of analyzing protein using laser ablation: A method of analyzing a protein using laser ablation which comprises, in order to simultaneously atomize the atoms constituting the protein to be analyzed and ionize the same using a single laser source, irradiating the protein with laser beams and thus ablating the protein to thereby atomize the protein into...

20060108540 - Measuring instrument and fluoremetric method: A measuring instrument that comprises a light source unit 1 capable of emitting light having different wavelengths, a light receiving unit 2 that outputs an electrical signal corresponding to an intensity of transmitted light or radiated light from a sample 6 mixed with a plurality of coloring matters, and a...

20060108541 - Alignment method, alignment substrate, production method for alignment substrate, exposure method, exposure system and mask producing method: An alignment method capable of performing alignment without providing alignment marks on a mask and preventing a decline of exposure throughput and latent image contrast, an alignment substrate and the production method, an exposure methods an exposure apparatus and a production method of a mask are provided. An alignment method...

20060108542 - Electron beam exposure method and electron beam exposure system: In an electron beam exposure method in which an article subjected to exposure and an electron beam irradiation spot are moved relative to each other at a continuous speed, the article is exposed at a plurality of irradiation intensities of an electron beam by changing a transmittance of an electron...

20060108545 - Method and device for measuring quantity of wear: An object of the present invention is to provide means for accurately obtaining very small quantity of wear of the order of nanometers of a protective film on the surface of a sliding member. In a method of measuring a quantity of wear on the surface of a measurement sample...

20060108544 - Power sag detection and control in ion implanting system: In one aspect, the present invention provides a method of managing fluctuations in power supplied to a semiconductor processing apparatus that includes monitoring the power supplied to the apparatus to detect the occurrence of a power fluctuation event during a semiconductor processing session. Upon detection of a power fluctuation event,...

20060108543 - Weakening focusing effect of acceleration-deceleration column of ion implanter: A method and apparatus for weakening a strong focus effect of an acceleration-deceleration column of an ion implanter during a deceleration mode are disclosed. The apparatus includes a tube lens surrounding the ion beam adjacent to a deceleration lens of the acceleration-deceleration column. The tube lens causes a defocusing of...

20060108546 - Charged beam exposure apparatus, charged beam control method and manufacturing method of semiconductor device: A charged beam exposure apparatus includes: a first shaping aperture provided with a plurality of rectangular openings which are different from each other in at least one of area and shape thereof; a second shaping aperture provided with a pattern having a shape corresponding to that of a pattern to...

20060108547 - Method for eliminating low frequency error sources to critical dimension uniformity in shaped beam writing systems: A method and system for generating flashes on a substrate. The method includes receiving one or more figures of a pattern to be printed on the substrate and decomposing each figure into at least four substantially rectangular shapes. The four substantially rectangular shapes are separated by at least one horizontal...

20060108548 - Standoff radiation attenuation system: A radiation attenuation system suitable for use in radiological examinations includes a first portion comprising a radiation attenuation material and a second portion comprising a relatively non-radiation attenuation buffer region between the radiation attenuation material and an article undergoing the examination. The radiation attenuation system may be positioned over, under,...

20060102826 - Optical pickup device: An optical pickup device includes: a separation section for separating a light beam into (i) a first light beam, which includes an optical axis of the light beam, and (ii) a second light beam, which surrounds a curved side of the first light beam; and a second light receiving section...

20060102827 - Solid-state imaging device: Provided is a solid-state imaging device which can obtain an output characteristic without preventing linearity even in a high light-intensity range, and at the same time achieve a much wider dynamic range. The solid-state imaging device 1 includes: a photo-detecting element (a photoelectric transducer PD) for transducing incident light to...

20060102828 - Light source unit, light-receiving unit, and multichannel optical sensing apparatus: A reaction container, a light source unit including light emitting devices that are different in wavelength of an emitted light beam and output dichroic mirrors that are different in wavelength range of a reflectible light beam, and a photoreceptive unit including photoreceptors and photoreceptive dichroic mirrors that are different in...

20060102829 - Method for producing a tfa image sensor and one such tfa image sensor: The invention relates to a method for producing a TFA image sensor in which a multi-layer arrangement comprising a photo diode matrix is arranged on an ASIC switching circuit provided with electronic circuits for operating the TFA image sensor, such as pixel electronics, peripheral electronics and system electronics, for the...

20060102830 - Lateral shift measurement using an optical technique: Alignment of layers during manufacture of a multi-layer sample is controlled by applying optical measurements to a measurement site in the sample. The measurement site includes two diffractive structures located one above the other in two different layers, respectively. The optical measurements comprise at least two measurements with different polarization...

20060102831 - Method and device for in-line measurment of characteristics of the surface coating of a metallurgy product: To measure the characteristics of the surface coating of a moving metal strip, such as the alliation level of a coating including zinc and iron, the product is exposed to the radiation of a radiative source with a predetermined wavelength directed orthogonally to the surface of the product and the...

20060102832 - Light receiving device for optical encoder, and optical encoder: A light receiving device for an optical encoder comprises: a plurality of first photodiodes juxtaposed in a first direction and extending in a second direction that is generally vertical to the first direction; and a light shielding layer. The light shielding layer is are provided on the plurality of first...

20060102833 - Scanning device for carrying out a 3d scan of a dental model, sliding panel therefore, and method therefor: A scanning system for carrying out a 3D scan of a tooth model, includes an imaging device and a positioning system in the form of a sliding panel which can be positioned and has first locking means. On the locking panel there are provided second locking means which interact with...

20060102834 - Logging tool with response invariant to changes in borehole pressure: A logging system for measuring parameters of earth formation penetrated by a well borehole. Measurements made with the system are not adversely affected by varying pressure encountered a borehole environment. This is accomplished by the use of a main compensation element and a detector compensation element render source and detector...

20060102835 - Process for manufacturing a multipolar electrode arrangement and multipolar electrode arrangement: The invention relates to a method for the production of a multipolar electrode configuration (1) for focussing or mass filtration of a beam of charged particles, whereby the configuration comprises a number of elongated electrodes (2), which are orientated parallel to an axis, whereby the method comprises the following steps:...

20060102837 - Aerodynamic focusing of nanoparticle or cluster beams: Guidelines for designing lenses or systems for aerodynamic focusing of nanoparticle or cluster beams. The design process may involve obtaining a relationship between particle size, operating pressure and aperture size, and selecting the operating pressure to provide continuum flow of an aerosol beam through the aerodynamic lens. Particles having diameters...

20060102836 - Liquid switch, and microchip and mass-analyzing system using the same: A liquid sample (104) introduced in a main flow passage (101) is held in a dam portion (105), and a trigger liquid (106) is filled in a trigger flow passage (102). In this state, the trigger liquid (106) is further introduced at desired timing into the trigger flow passage (102)...

20060102838 - Electron beam apparatus, a pattern evaluation method and a device manufacturing method using the electron beam apparatus or pattern evaluation method: Provided is an electron beam apparatus in which an electron beam emitted from an electron gun is separated by a plurality of apertures, images of said apertures are reduced in more than two stages to form multi-beams on a sample surface and to scan said sample thereby, and secondary electrons...

20060102839 - Apparatus and methods for analyzing defects on a sample: Disclosed are methods and apparatus for facilitating procedures implemented on an analysis tool (e.g., review or metrology tool) are provided herein. In one embodiment, an apparatus for analyzing defects includes an analysis tool arranged for imaging a defect and generating a high resolution image and at least one display device...

20060102840 - Scanning electron microscope: In order to provide a full-automatic scanning electron microscope which carries out investigation jobs full-automatically from fine adjustment to reviewing, the scanning electron microscope of the present invention has a function of calculating the accuracy of correction after correction of coordinates and displaying it with vectors 39, a function of...

20060102841 - Method for data processing in a scan microscope comprising a fast scanner and scan microscope comprising a fast scanner: The process acquires data blocks in real-time with a fast scanner. The acquired data blocks are then transmitted to a computer system (23). The data blocks are then processed as a function of a frame burst ratio (N). The transmission of the acquired data blocks to the computer system is...

20060102842 - Cryogenic detector device: A cryogenic detector device includes a sensor based on a low-temperature effect and measures the temperature increase produced by the introduction of energy, such as an X-ray quantum. The smaller the thermal capacity of the sensor, the greater the temperature increase resulting from the introduction of energy and the higher...

20060102843 - Infrared and visible fusion face recognition system: A face detection and recognition system having several arrays imaging a scene in the infrared and visible spectrums. The system may use weighted subtracting and thresholding to distinguish human skin in a sensed image. A feature selector may locate a face in the image. The image may be cropped with...

20060102844 - Gas identification system: A system for identifying a gas sample includes a canister, a docking station, a thermal desorption device, and a spectrometer. The canister includes a sorbent and a valve. The docking station is configured to removably engage the canister. When the canister is engaged with the docking station, the canister is...

20060102845 - Method and apparatus for timing calibration in a pet scanner: The invention is directed to a method and apparatus for timing calibration in a PET scanner. According to one embodiment, the invention relates to a method for timing calibration in a PET scanner having a plurality of scintillator blocks. The method comprises: detecting, in a first scintillator block, a first...

20060102846 - Method and system for imaging using a filter for time-of-flight pet: Methods and systems for imaging by using a filter for Time-Of-Flight Positron Emission Tomography (TOF PET) are described. The described methods of imaging a patient by using a positron emission tomography (PET) system includes acquiring a plurality of frames of sinogram data, filtering the acquired sinogram data and back-projecting the...

20060102847 - Optical emission spectroscopy of plasma treated bonding surfaces: A method and system are provided for real-time contaminant detection and plasma treatment verification during plasma treatment of bonding surfaces. Optical emission spectroscopy (OES) is utilized to determine contamination of a bonding surface prior to the bonding process. OES is further utilized to monitor bonding sites on the bonding surface...

20060102848 - Corrector for correcting first-order chromatic aberrations of the first degree: The invention is directed to a corrector for correcting energy-dependent first-order aberrations of the first degree as well as third-order spherical aberrations of electron-optical lens systems. The corrector includes at least one quadropole septuplet (S1) having seven quadrupoles (Q1 to Q7). The quadrupoles are mounted symmetrically to a center plane...

20060102849 - Apparatus, method for supporting and/or thermally conditioning a substrate, a support table, and a chuck: An apparatus including a support table for supporting a substrate is disclosed. The support table includes a plurality of support protrusions that contact the substrate during use for supporting the substrate. The support table includes a plurality of heat transfer protrusions that extend towards the substrate during use without contacting...

20060102850 - Specimen temperature adjusting apparatus: A specimen temperature adjusting apparatus includes a specimen stage that the observation specimen is to be placed on and a temperature adjustment element that is attached to the specimen stage. The specimen stage has a groove surrounding a portion where the observation specimen is to be placed. The temperature adjustment...

20060102851 - Method and a device for making images of the quantum efficiency of the photosynthetic system with the purpose of determining the quality of plant material and a method and a device for measuring, classifying and sorting plant material: The present invention relates to a method for determining the quality of plant material by making chlorophyll fluorescence images of said material by scanning the material with a beam of electromagnetic radiation so that the chlorophyll present is excitated, and measuring the chlorophyll fluorescence with an imaging detector. From the...

20060102852 - Ion balance monitor: An ion balance monitor for simultaneous monitoring of the positive and negative ion production rates, and therefore ion concentration, by measurement of currents resulting from the presence of airborne ions as created for example by an air (gas) ionizer. Additionally it examines the ion balance by comparing the aforementioned currents....

20060102853 - Device and method for imaging a multiple particle beam on a substrate: A device and a method for imaging and positioning a multiparticle beam on a substrate is disclosed. The device comprises a particle beam source with a condenser optic that produces a particle beam that illuminates the surface of an aperture plate. A multiplicity of individual beams are produced from the...

20060102854 - Apparatus and method for polishing gemstones and the like: The invention comprises a two-step process for achieving an ultra-polish finish on materials such as gemstones and the like by first performing a chemical-mechanical polishing of the material using an intermetallic material as the grinding medium followed by a gas cluster ion beam (GCIB) treatment. The intermetallic grinding wheel is...

20060102855 - Contaminant removal device and method: A device for removing non-conducting contaminants from an organic material, the devise comprises an ion beam generator for generating, in use, an ion beam a conductive surface is moveable, in use, with respect to the ion beam. A detector generates an output based upon detected characteristics of the ion beam...

20060102856 - Particle beam irradiation system: A particle beam irradiation system capable of ensuring a more uniform dose distribution at an irradiation object even when a certain time is required from output of a beam extraction stop signal to the time when extraction of a charged particle beam from an accelerator is actually stopped. The particle...

20060102857 - Measurement device: A measurement device is presented. The measurement device is pointed at a surface of an object. A message is generated that warns a user when the measurement device is substantially close to exceeding its operating range for obtaining accurate measurement data. The warning may be a verbal warning, a physical...

20060102858 - Adjusting apparatus, production processing system, and method of controlling adjusting apparatus: An adjusting apparatus includes a judging unit that receives a characteristic value of an article processed by one of processing machines from one of measuring machines and, on the basis of the characteristic value, judges whether or not the processed article meets regular quality, and an abnormality estimating unit that,...

20060102859 - Radiation image taking apparatus: A radiation image taking apparatus includes a case that contains a radiation detecting unit that has a detection surface in which a photoelectric conversion element that detects a radiation transmitted through an object is located, a grid unit which is detachably attachable to an outside of the case and removes...

20060097132 - Cmos image sensor and related method of operation: Provided is a complementary metal oxide semiconductor (CMOS) image sensor. The CMOS image sensor includes a pixel array unit having a matrix-type array of unit pixels, each unit pixel including a charge transfer element transferring charge collected in a photoelectric conversion element to a charge detection element. The charge transfer...

20060097130 - Image sensing device including image sensor with high dynamic range: An image sensor with a high dynamic range is provided. The image sensor includes a semiconductor substrate, a plurality of light-receiving elements formed on the semiconductor substrate, and light-shield films formed on upper ends of some of the light-receiving elements to partially block light incident upon each of the some...

20060097131 - Imaging unit and image reading apparatus: A first light source is adapted to illuminate a first object with first light. A first sensor includes a first light receiving element adapted to detect the first light by way of the first object. A second sensor includes a second light receiving element adapted to detect a second light...

20060097129 - Lens module structure: A lens module structure includes an image sensing chip disposed on the first side of a substrate and electrically coupled to the substrate through wires. A memory chip and a control chip are soldered onto a second surface of the substrate, and a solderable output unit terminal is provided on...

20060097136 - Light monitor: A light monitor includes a single semiconductor substrate. A light to frequency (LTF) converter is on the single semiconductor substrate, a threshold comparator is on the single semiconductor substrate and coupled to an output of the light to frequency converter, and a light intensity calculator is on the single semiconductor...

20060097134 - Image sensor and pixel having an anti-reflective coating over the photodiode: A pixel for use in CMOS or CCD image sensors is disclosed. The pixel includes a light sensitive element, such as a photodiode, formed in a semiconductor substrate. An anti-reflective coating is formed over the photodiode to reduce reflection of incident light. The reduced reflection results in greater “signal” reaching...

20060097133 - Image sensor with optical guard rings and method for forming the same: An image sensor with optical guard rings is provided. The optical guard rings are embedded in a stacked inter-metal dielectric layer between the sensor areas, that is, around each pixel. The refraction index (RI) of the optical guard rings is smaller than that of the stacked inter-metal dielectric layer. Therefore,...

20060097135 - Systems and methods for indicating an amount of use of a sensor: Aspects of the present disclosure include systems and methods for indicating an amount of use of a pulse oximetry sensor. According to one embodiment, the system includes an oximeter that monitors the amount of use for a given sensor. The oximeter and/or the sensor may advantageously include a visual alarm,...

20060097137 - True position bench: An optical package having a top and bottom orientation and comprising: (a) a platform defining a V-groove with walls of a certain pitch; (b) a first optical component having a reference surface and two sides, each side being beveled at the certain pitch outwardly from the reference surface, the first...

20060097138 - Optical pointing sensor and cursor control method thereof: A cursor control method for an electronic device. The electronic device comprises a detecting window and a cursor shown on a monitor. An object is disposed on the detecting window. A laser diode with a laser cavity is provided to generate a plurality of laser beams with different polarization in...

20060097139 - Method for generating a composite image: A method for generating a composite image includes receiving a separate image into a computer system, comparing the separate image to the composite image so as to generate a mismatch value, and modifying at least one of the composite image and the separate image to reduce the mismatch value....

20060097140 - Apparatus and method for a computerized fiber optic security system: A computerized apparatus and method for detecting unauthorized activity in a protected area in real-time using a fiber optic cable having an optical sensor line, a fiber scanning unit, and a computer. Detecting unauthorized activity is done by scanning the sensor line using the scanning unit to obtain repetitive scan...

20060097141 - Photoelectric encoder: A photoelectric encoder is provided, which emits light from a light source to a main scale and an index scale that can relatively move with respect to each other and obtains a light-receiving signal by interaction between the main scale and the index scale. The photoelectric encoder uses as the...

20060097142 - Flexure assembly for a scanner: A flexure carriage assembly (24) has a carriage (25) formed of a substantially rigid material. The carriage has four elongate columns (32A, 32B, 32C, 32D) arranged spaced apart and parallel to one another. Each of the elongate columns has first and second ends. The flexure carriage (25) has four first...

20060097144 - Automated in-process ratio mass spectrometry: In one embodiment, a method of analysis of a solution is provided including the acts of: (a) mixing a spike with a sample of the solution to allow equilibrium to occur therebetween; (b) ionizing the equilibrated diluted sample and spike in an atmospheric pressure ionizer (API) to produce ions; (c)...

20060097143 - Protein profiles with atmospheric pressure ionization: The invention relates to the acquisition of mass spectra of complex protein mixtures, often called protein profiles, for example to search for biomarkers which indicate stress situations, or to identify microbes. Up to now protein profiles have been acquired using ionization by matrix-assisted laser desorption with high detection sensitivity in...

20060097145 - Nanowire capillaries for mass spectrometry: A capillary for a mass spectrometry system is described. The capillary comprises a channel and a tip, and at least one of the channel and the tip comprises a nanowire material....

20060097146 - Nmr spectrometer with a common refrigerator for cooling an nmr probe head and cryostat: An NMR spectrometer comprising a magnet coil system disposed in the helium tank (8) of a cryostat and an NMR probe head (4) which is disposed in a room temperature bore of the cryostat and contains a cooled RF resonator (13) for receiving NMR signals from a sample to be...

20060097147 - Ion optics for mass spectrometers: Apparatus and methods are disclosed for aligning components of an ion optics system particularly as applied to mass spectroscopy apparatus. An apparatus comprises a base having a front face, a rear face and at least one side face, and at least two supports. Each of the supports has at least...

20060097148 - Device for automated coupling between a micro-chromatograph and a mass spectrometer comprising a temperature adjustment: An instrument including a chromatographic column with a final detector and a mass spectrometer. A temperature of an interface including an output tube and a capillary tube adjusting the flow to the spectrometer is adjusted using a leakage flow or pressure sensor outputting data to a control module that adjusts...

20060097151 - Electrospray devices for mass spectrometry: An electrospray device for a mass spectrometry system is described. The electrospray device comprises a body portion and a tip portion extending from the body portion. The tip portion comprises a polymeric material. The electrospray device also comprises a hydrophobic coating substantially selectively covering the tip portion. The hydrophobic coating...

20060097153 - Electrospray devices for mass spectrometry: An electrospray device for a mass spectrometry system is described. The electrospray device comprises a body portion and a tip portion extending from the body portion. The tip portion comprises a polymeric material. The electrospray device also comprises a hydrophobic coating substantially selectively covering the tip portion....

20060097150 - Functionalized target support and method: The invention provides an apparatus that produces analyte ions for detection by a detector. The apparatus includes a matrix based ion source having a target substrate including an aromatic compound and a carbon nanotube material for producing analyte ions, an ion transport system adjacent to the matrix based ion source...

20060097152 - Mass spectrometry system and method: Mass spectrometry system for analyzing components of a gas. In accordance with one embodiment, the system includes a mass spectrometer adapted to analyze components of the gas, and an inlet capillary fluidically connected to the mass spectrometer to convey a sample of the gas to the mass spectrometer. The inlet...

20060097154 - Median filter for liquid chromatography-mass spectrometry data: High-intensity, spiked noise is reduced in chromatography-mass spectrometry data by applying a nonlinear filter such as a moving median filter to the data. The filter is applied to individual mass chromatograms, plots of ion abundance versus retention time for each detected mass-to-charge ratio, and the filtered chromatograms are combined to...

20060097149 - Nanowire target support and method: The invention provides an apparatus that produces analyte ions for detection by a detector. The apparatus includes a matrix based ion source having a nanowire target substrate for producing analyte ions, an ion transport system adjacent to the matrix based ion source for transporting analyte ions from the matrix based...

20060097155 - Substrate for transporting liquid, a system for analysis and a method for analysis: Conventional liquid transport substrates having a fluid channel formed along an array of electrodes have a problem in which throughput decreases, depending on driving conditions. In order to avoid two-way passage in a fluid channel from the inlet to a measuring section and a fluid channel from the measuring section...

20060097156 - Faims apparatus and method for separting ions: A high field asymmetric waveform ion mobility spectrometer (FAIMS) for separating ions, and a method therefore. The FAIMS includes an electrode stack (24) having a length and comprising a plurality of electrodes (26, 28). Each electrode of the electrode stack is spaced apart from an adjacent electrode in a direction...

20060097157 - Multiplexed mass spectrometer: A multiplexed mass spectrometer system includes an array of mass analyzers and a data acquisition system. Each mass analyzer is associated with one or more data channels, and the data acquisition system selectively reduces the number of data channels through combinations of particular channels to define data acquisition modes for...

20060097158 - Scanning electron microscope: An object of the present invention is to provide a scanning electron microscope for reducing a process concerning inspection positioning or an input operation, thereby functioning with high precision at high speed. To accomplish the above object, the present invention provides a scanning electron microscope having a function for identifying...

20060097162 - Apparatus and method for determining surface profiles using a scanning probe microscope: A scanning probe microscope for measuring a surface profile of a sample by bringing a probe into close proximity to or contact with the surface of the sample and scanning the sample surface includes: a sample stage movable in at least one axis direction; the probe which is brought into...

20060097159 - Improved ion detector for ionbeam applications: Detection of weak ion currents scattered from a sample by an ion beam is improved by the use of a multiplier system in which a conversion electrode converts incident ions to a number of secondary electrons multiplied by a multiplication factor, the secondary electrons being attracted to an electron detector...

20060097161 - Programmable molecular manipulating devices: A system manipulates molecules using a set of proximal probes such as those used in atomic force microscopes. An electrostatic pattern is placed on a set of proximal probes such that each proximal probe may exert an electrostatic force. A molecule is captured using those electrostatic forces, after which the...

20060097160 - Programmable molecular manipulating processes: A system manipulates molecules using a set of proximal probes such as those used in atomic force microscopes. An electrostatic pattern is placed on a set of proximal probes such that each proximal probe may exert an electrostatic force. A molecule is captured using those electrostatic forces, after which the...

20060097163 - Scanning probe microscope using a surface drive actuator to position the scanning tip: A scanning probe microscope includes a scanning probe tip and an electrostatic surface actuator operatively coupled to the scanning probe tip. The electrostatic surface actuator includes a movable member that has a first surface with a first plurality of electrodes disposed on the first surface and a stationary member that...

20060097166 - Charged particle beam apparatus and sample manufacturing method: It is possible to carry out a highly accurate thin film machining by irradiation of an ion beam to a sample and a high-resolution STEM observation of the sample by irradiating an electron beam with a high throughput almost without moving the sample. The FIB irradiation system has an irradiation...

20060097165 - Electron beam apparatus and method for manufacturing semiconductor device: A sample chamber and a column are connected to each other and comprise a magnetic substance. An exhaust section controls a pressure in the sample chamber and the column. A stage controller controls a stage, above which a sample is placed, in the sample chamber. An electron beam source power...

20060097164 - Method for locally highly resolved, mass-spectroscopic characterisation of surfaces using scanning probe technology: The invention relates to a combined method in which a high-resolution image of a sample surface is recorded by means of scanning force microscopy and the locally high-resolution, chemical nature (which is correlated with this) of the sample surface is measured by means of mass spectroscopy. The surface is chemically...

20060097169 - Method and device for observing a specimen in a field of view of an electron microscope: The present invention provides a method of observing a specimen in a field of view of an electron microscope comprising the acts of illuminating the specimen with an electron beam having a first angle and forming a first transmission image of the specimen in the field of view and adjusting...

20060097167 - System and method for improving spatial resolution of electron holography: A method for enhancing spatial resolution of a transmission electron microscopy TEM) system configured for electron holography. In an exemplary embodiment, the method includes configuring a first lens to form an initial virtual source with respect to an incident parallel beam, the initial virtual source positioned at a back focal...

20060097168 - Transmission electron microscope specimen and method of manufacturing the same: A transmission electron microscope (TEM) specimen and a method of manufacturing the specimen are provided. The specimen comprises an analysis point. The specimen is formed by forming a dimple at a surface portion of the preliminary specimen, and ion milling the preliminary specimen having the dimple....

20060097170 - Device for corona treatment of electrically insulating materials, especially plastic films: A device for corona treatment of electrically insulating plastic films has a counter electrode across which a plastic film to be treated is guided and a high-voltage electrode extending transversely to a travel direction of the plastic film. The high-voltage electrode has several electrode segments extending in the travel direction...

20060097171 - Radiation detection and tracking with gps-enabled wireless communication system: A nuclear radiation detector included inside mobile personal communication devices (e.g. cellular or satellite phone, pager, PDA) allows for a network of portable radiation detectors that can not only detect radiation, but also track possible radiation sources by virtue of the ubiquitous nature of such personal communication devices. When radiation...

20060097172 - Imaging apparatus, medium, and method using infrared rays with image discrimination: An imaging apparatus, medium, and apparatus using infrared rays with image discrimination. The imaging apparatus may includes an image sensor optically together sensing a visible light component and an infrared component of an image, and an image processor to recognize an object component of the image. Accordingly, an infrared component...

20060097173 - Method and device for the quantitative analysis of solutions and dispersions by means of near infrared spectroscopy: The present invention relates to a method for quantifying the composition of a product, with the following steps: irradiating the product with a radiation source in the near infrared range; receiving radiation which is reflected by or transmitted through the product, and providing an output signal corresponding to the intensity...

20060097175 - Method and system for imaging a patient: Methods and systems for imaging a patient are provided. The method includes determining a location of a volume of interest within the patient and acquiring a plurality of frames of emission data, at least one frame including the volume of interest. The method further includes determining a time-of-flight (TOF) information...

20060097174 - Scintillator having integrated collimator and method of manufacturing same: The present invention is directed to an integrated scintillator and collimator array for a CT detector. The integrated scintillator and collimator are fabricated from a manufacturing process or technique whereupon an array of scintillator material is positioned on a tooling base such that a collimator mold housing having a collimator...

20060097176 - Infrared multi-spectral camera and process of using infrared multi-spectral camera: A process of performing a medical test includes taking multi-spectral images of an area of interest of a patient. The patient can be a human being or an animal, and can be known to be healthy or known to have health issues or problems. A multi-spectral camera includes a long-infrared...

20060097178 - Speckle reduction method and apparatus: An apparatus adapted for confocal imaging of a non-flat specimen comprising a coherent light source for producing a light beam, imaging optics adapted to focus the light beam into at least one spot on a surface of a specimen, and a detector adapted to receive and detect light reflected from...

20060097177 - X-ray imaging apparatus: An electronic cassette accommodating a sensor for converting radiation into an electric signal. A cable with a specific length is connected to a side surface of the electronic cassette. A connector that is connectable with a wireless communication unit or an external power source is provided at an end of...

20060097179 - Method and apparatus to recover a deal pixel in digital imaging systems: Gamma radiation events are received individually at elements of a detector array (18) at least one of the elements (P0) being defective. Each detector element converts incident radiation into a radiation event signal which is digitized by an analog-to-digital converter (42) into a coordinate position (x,y) on the detector array...

20060097180 - Switching/depolarizing power supply for a radiation imaging device: A high voltage switching power supply (10) for an X-ray/Gamma ray imaging camera provides high voltage switching and depolarization capabilities. The power supply includes a high voltage polarity switching and an image detector charge bleeding circuit (90) and is particularly useful with high energy radiation imaging cameras utilizing Cd—Te based...

20060097181 - Chopped radiation source: A chopped radiation source composed of a radiation source component, a chopping component and an optical fiber connector component. Each of these components is arranged within a housing in a manner such that the elements of each of these components will not move in an unintended manner during use....

20060097182 - Cod measuring method and device: A COD conversion equation holding unit in a computing unit of a COD measuring device holds a COD conversion equation that indicates a relationship between total-absorbance that is linearly combined by multiplying an absorbance value at each of a plurality of wavelengths by a weighting factor and a COD value,...

20060097183 - Magnetron anode design for short wavelength operation: An electromagnetic radiation source is disclosed. The electromagnetic radiation source includes an anode having a first conductor, a second conductor positioned relative to the first conductor, a plurality of pole pieces coupled to at least one of the first conductor and the second, and at least one mechanical phase reversal...

20060097184 - Focusing lens and charged particle beam device for tilted landing angle operation: The present invention relates to a focusing lens, a charged particle beam device, and a method for focusing a charged particle beam onto a specimen, wherein the focusing lens comprises an auxiliary electrode having an essentially planar electrode surface for focusing the charged particle beam at a tilted landing angle,...

20060097185 - Ionizer and method for gas-cluster ion-beam formation: An ionizer for forming a gas-cluster ion beam is disclosed including inlet and outlet ends partially defining an ionization region traversed by a gas-cluster jet and one or more plasma electron source(s) for providing electrons to the ionizing region for ionizing at least a portion of the gas-clusters to form...

20060097186 - Liquid metal ion gun: An emitter of a Ga liquid metal ion source is constituted to include W12 of a base material and Ga9 of an ion source element covering a surface as construction materials. By making back-sputtered particles become elements (W and Ga) of the Ga liquid metal ion sour source, if back-sputtered...

20060097187 - Specimen holder for an electron microscope and method for reducing thermal drift in a microscope: A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by clamping means present in the...

20060097188 - Method for microscopy, and microscope: A method for microscopy includes generating pulsed illuminating light including wavelengths in a spectral region. A detection spectral region within the spectral region is defined. Using a dynamically controllable mask, light components of the illuminating light that comprise wavelengths within the detection spectral region are influenced. A specimen is illuminated...

20060097189 - Disinfecting system for a toilet: The present invention provides a disinfecting system that uses ultraviolet light to disinfect a toilet seat and toilet bowl. The disinfecting system is mounted to a toilet seat cover. A control is used to activate the system when the toilet seat cover is lowered. An indicator light can be mounted...

20060097191 - Electron beam control method, electron beam drawing apparatus and method of fabricating a semiconductor device: An electron beam control method has the following steps, selecting one of a plurality of pattern openings by a character beam electrode having a plurality of electrode units to allow an electron beam to pass through any pattern opening on an aperture mask on which the plurality of pattern openings...

20060097190 - Method and apparatus for forming optical elements by inducing changes in the index of refraction by utilizing electron beam radiation: The exposure of selected optical materials to large area electron beam irradiation can raise the refractive index of the optical material to allow the fabrication of waveguides, optical fibers, gradient index lenses, interference filters, antireflection coatings, heat reflective thermal control coatings and other optical elements....

20060097195 - Apparatus and methods for two-dimensional ion beam profiling: Methods and apparatus are provided for measuring a profile of an ion beam. The apparatus includes an array of beam current sensors, each producing a sensor signal in response to incident ions of the ion beam, a translation mechanism configured to translate the array of beam current sensors along a...

20060097198 - Column simultaneously focusing a particle beam and an optical beam: The invention concerns a column for producing a focused particle beam comprising: a device (100) focusing particles including an output electrode (130) with an output hole (131) for allowing through a particle beam (A); an optical focusing device (200) for simultaneously focusing an optical beam (F) including an output aperture...

20060097196 - Dose uniformity during scanned ion implantation: The present invention is directed to implanting ions in a workpiece in a serial implantation process in a manner that produces one or more scan patterns on the workpiece that resemble the size, shape and/or other dimensional aspects of the workpiece. Further, the scan patterns are interleaved with one another...

20060097197 - Focused ion beam system: A focused ion beam (FIB) system has an ion beam from an ion source, a condenser lens, a current-limiting aperture, an electrostatic angular aperture control lens, an electrostatic objective lens, and a controller which controls the angular aperture control lens with a polarity with which charged particles are decelerated and...

20060097194 - Ion beam processing method: When scanning by an ion beam in advance an area 24 including a reference hole 23 formed at a position other than the area to be processed 25 of a light-shielding film 21 on a glass substrate 22, a secondary ion signal of the same atom as the incident ions...

20060097193 - Ion implantation device and a method of semiconductor manufacturing by the implantation of boron hydride cluster ions: An ion implantation device and a method of manufacturing a semiconductor device is described, wherein ionized boron hydride molecular clusters are implanted to form P-type transistor structures. For example, in the fabrication of Complementary Metal-Oxide Semiconductor (CMOS) devices, the clusters are implanted to provide P-type doping for Source and Drain...

20060097199 - Lithographic apparatus, device manufacturing method and device manufactured therewith: The invention relates to a lithographic apparatus and a device manufacturing method. The lithographic apparatus is of the scanning type, in which a radiation beam effectively scans across a surface of a substrate. The apparatus comprises a beam attenuator, e.g. in the form of a filter, having an attenuation value...

20060097192 - Method and appartus for removing target material from a substrate: A method for removing target material from a substrate, the method comprising directing a supply of particulate material toward a target zone of target material present on the substrate and directing radiant optical energy toward the target zone, the radiant optical energy interacting with the target material and the particulate...

20060097200 - Electron beam apparatus and a device manufacturing method by using said electron beam apparatus: An electron beam apparatus, in which an electron beam emitted from an electron gun having a cathode and an anode is focused and irradiated onto a sample, and secondary electrons emanated from the sample are directed into a detector, the apparatus further comprising means for optimizing irradiation of the electron...

20060097202 - Collector having unused region for illumination systems using a wavelength <193 nm: There is provided a collector for illumination systems for light having a wavelength ≦193 nm comprising. The collector includes (a) a first mirror shell adjacent to, and positioned inside of, a second mirror shell around a common axis of rotation, in which the first and second mirror shells are rotationally...

20060097201 - Lithographic apparatus and device manufacturing method: A lithographic apparatus is disclosed. The apparatus includes an illumination system arranged to provide a radiation beam, an article support configured to support an article to be placed in a beam path of the radiation beam, a multipolar clamp configured to provide a clamping pressure for clamping the article against...

20060097203 - Systems and methods for cleaning a chamber window of an euv light source: Systems and methods are disclosed for cleaning a chamber window of an extreme ultraviolet (EUV) light source. The window may have an inside surface facing a chamber interior and an opposed outside surface and the light source may generate debris by plasma formation. For the system, a subsystem may be...

20060097204 - Particle beam irradiation system and method of adjusting irradiation apparatus: The present invention provides an increased degree of uniformity of radiation dose distribution for the interior of a diseased part. A particle beam therapy system includes a charged particle beam generation apparatus and an irradiation apparatus. An ion beam is generated by the charged particle beam generation apparatus. The irradiation...

20060097205 - Measuring apparatus, exposure apparatus and device manufacturing method: A measuring apparatus for measuring optical performance of a target optical system to be measured includes an optical unit for splitting light from a light source into measuring light and reference light so that the measuring light can be introduced into the target optical system, a reflection unit for reflecting...

20060091283 - Beam formation unit comprising two axicon lenses, and device comprising one such beam formation unit for introducing radiation energy into a workpiece consisting of a weakly-absorbent material: The invention is directed to a beam-shaping unit for generating a beam bundle which is focused in a punctiform manner, propagates in a ring shape, and has a radiationless central area, comprising a focusing lens, a first axicon and a second axicon, and to an arrangement with a beam-shaping unit...

20060091284 - Multi-spectral pixel and focal plane array: A novel detection pixel micro-structure allowing the simultaneous and continuous detection of several discrete optical frequencies. A focal plane array comprises a plurality of multi-spectral detection pixels and a connecting platform to electrically connect the pixels. Each of the multi-spectral detection pixels form a resonant optical structure that comprises at...

20060091285 - Self-calibrating photoelectric control system: A self-calibrating photoelectric control system for use in a checkstand to control the starting and stopping of a conveyer belt utilized to move products closer to a checkout clerk. The self-calibrating photoelectric control system including a light source for emitting a light beam having an intensity, a photoelectric sensor for...

20060091286 - Active electro-optical device for detecting obstacles, in particular for autonomous navigation: An electro-optical system capable of being embarked aboard mobile ground or flying units, to determine the optical flow generated by obstacles in relative motion with respect to the mobile unit. The system comprises radiation emitter means (5), receiver means (1) for converting the radiation reflected by the objects into electrical...

20060091287 - Photomultiplier and radiation detector: A holding member or a base member, through which stem pins are passed and one surface of which is held by the holding member, is joined to the stem pins and the holding member by fusion by the melting of the base member. Upon melting, a volume of the base...

20060091289 - Imaging system: A method and apparatus are disclosed for forming an image signal by receiving a flux of photons at a convex photodetector such as a hemispherical photodetector. The convex photodetector includes a plurality of photosensors. Each photosensor has a different orientation with respect to a propagation vector of the flux of...

20060091288 - Method and system for cancellation of ambient light using light frequency: Compensation of the effects of uncontrolled light in an imaging system using a controlled light source. Light from the controlled light source reflected by an object and uncontrolled light are detected in a plurality of frequency ranges. Intensity of the uncontrolled light is determined based on the varying sensitivity of...

20060091290 - Semiconductor image sensor module, method for manufacturing the same as well as camera and method for manufacturing the same: A semiconductor image sensor module 1 at least includes a semiconductor image sensor chip 2 having a transistor forming region on a first main surface of a semiconductor substrate and having a photoelectric conversion region with a light incident surface formed on a second main surface on the side opposite...

20060091291 - Solid state detector and method of manufacturing same: Deterioration of a photoconductive layer is prevented, by suppressing the application of heat during connection of a second electrode with an external terminal. A solid state detector is constituted by: an external terminal, which is electrically connected to a voltage source for applying a recording voltage to the second electrode...

20060091292 - Solid state detector and method of manufacturing same: Deterioration of a photoconductive layer is prevented, by suppressing the application of heat during connection of a second electrode with an external terminal. A solid state detector is constituted by: an external terminal, which is electrically connected to a voltage source for applying a recording voltage to the second electrode...

20060091293 - Opto-electronic device having a light-emitting diode and a light sensor: An opto-electronic device includes a substrate, a light sensor and a light-emitting diode having a light-emitting layer of an organic material, wherein the light sensor and the light-emitting diode are monolithically integrated with the substrate....

20060091294 - Apparatus and method for interference suppression in optical or radiation sensors: An apparatus and appertaining method is provided for systems having an illumination transmitter and an illumination receiver in which the illumination receiver receives radiation emitted by the illumination transmitter but also receives ambient radiation that adds unwanted noise to the signal received by the receiver. Advantageously, the illumination transmitter transmits...

20060091295 - System to illuminate an enclosure: The system 10 of the preferred embodiment includes a sensor 12 to detect the status of an enclosure, a light source 14 to illuminate the enclosure, a power source 16, a circuit board 18, a housing element 20, and a fastener 22. The system 10 of the preferred embodiment has...

20060091296 - Detection device for an optical configuration and a confocal microscope: A detection device for an optical configuration, in particular for a confocal microscope, with a detector, a pinhole aperture 2 arranged before the detector in a beam path 1 of the detection light, and a lens 3 for focusing the detection light on the pinhole aperture 2 arranged before the...

20060091299 - Load sensor, method of detecting load and pedestrian protection system: A load sensor includes a optical fiber sensor that provides output analog signals in response to shocks of various magnitudes caused by hits by a vehicle on various objects, two or more amplifiers each of which approximates a non linear function of the analog signals and a unit that converts...

20060091297 - Method and system for obstacle detection: A method and system for detecting the presence of an object or the distance between the system and an object supports the provision of rapid and reliable obstacle detection. A transmitter emits generally linear beams of electromagnetic radiation with a transmitted radiation pattern within a defined spatial zone. A camera...

20060091298 - Tracking separation between an object and a surface using a reducing structure: Tracking separation between an object and a surface involves illuminating the surface and reducing the collection angle of light that reflects off of the surface in response to a change in separation between the object and the surface. Reducing the collection angle of light that reflects off of the surface...

20060091300 - Optical color sensor using diffractive elements: Optical color sensor using diffractive elements. Semiconductor fabrication processes are used to form diffraction gratings as part of a photosensor. In a first embodiment, photosensors such as photodiodes are formed on a substrate, and diffraction gratings of fixed spacing are formed using the metallization layers common to semiconductor fabrication techniques....

20060091301 - Two-dimensional motion sensor: An optical sensor and method of using the same is provided for sensing relative movement between the sensor and a surface by detecting changes in optical features of light reflected from the surface. In one embodiment, the sensor includes a two dimensional array of photosensitive elements, the array including at...

20060091302 - Apparatus and method of detecting probe tip contact with a surface: We disclose an apparatus and method for detecting probe-tip contact with a surface, generally inside a focused ion-beam instrument, where the probe tip is attached to a capsule, and the capsule is movably secured in a probe shaft. There is a fiber-optic cable having a first end and a second...

20060091303 - Optical sensors: An optical sensor comprises at least one bundle comprising a plurality of optical fibers and a plurality of separate fluid-tight longitudinally extending ducts; and fluid connectors for introducing fluids selectively into at least some of said ducts. Test cells are formed (a) by array members with a pattern of holes...

20060091304 - Imaging rotation angle absolute encoder: An angle absolute encoder comprises an encoded code rod that has code marks, such as pairs of fine code lines and coarse code lines. Light is reflected from or transmitted through the code marks and detected by a light detector to determine absolute angle position....

20060091305 - Optical phased array transmitter/receiver: An optical phased array transmitter/receiver includes a plurality of waveguides each including an optical fiber and a light source coupled to the fibers in the waveguides. At least one grating is coupled to the fiber of each waveguide and at least one phase shifter coupled to the fiber of at...

20060091306 - Light scanning apparatus and image forming apparatus using the same: A light scanning apparatus capable of printing with a high quality and an image forming apparatus using the same are obtained. The light scanning apparatus is provided with an incidence optical system for guiding a light beam emitted from a light source part to a deflection part; an imaging optical...

20060091307 - Method and apparatus for downhole spectroscopy processing: A method for downhole spectroscopy processing is described. The method includes: obtaining raw spectroscopy data using a downhole tool; processing the raw spectroscopy data using the downhole tool to obtain a downhole processed solution; transmitting the downhole processed solution to a surface processing system; and using the surface processing system...

20060091308 - Method and apparatus for multiplexing plural ion beams to a mass spectrometer: A method/apparatus for multiplexing plural ion beams to a mass spectrometer. At least two ion sources are provided with means of transporting the ions from the ion sources to separate two-dimensional ion traps. Each ion trap is used for storage and transmission of the ions and operates between the ion...

20060091309 - Scanning electron microscope, method for measuring a dimension of a pattern using the same, and apparatus for correcting difference between scanning electron microscopes: As measurement accuracy required for the scanning electron microscope (SEM) for measuring a pattern width becomes stringent, a technique of reducing the difference in a measured dimension between the SEM's is desired. However, the conventional technique of evaluating the difference in a measured dimension between the SEM's cannot separate the...

20060091310 - Methods for performing inspections and detecting chemical leaks using an infrared camera system: A method of visually detecting a leak of a chemical emanating from a component. The method includes: aiming a passive infrared camera system towards the component; filtering an infrared image with an optical bandpass filter, the infrared image being that of the leak; after the infrared image passes through the...

20060091311 - Near infrared chemical imaging microscope: A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted...

20060091312 - Covering of scintillation detector with a reflective coating: The present invention discloses a scintillation detector 10 comprising a scintillation crystal 12 covered by an inner coating layer 14, said inner coating layer 14 being reflective to light spectrum, and said inner coating layer 14 being stuck directly to said crystal by a chemical and/or a physical binding. According...

20060091314 - Methods and apparatus for real-time error correction: Methods and apparatus for correcting for at least one of deadtime losses and random coincidences in a positron emission tomography (PET) medical imaging device having a plurality of detectors at successive locations circumferentially spaced about a viewing area, the method comprising, receiving signals indicative of positron-electron annihilation events occurring along...

20060091315 - Attenuation correction in nuclear medicine studies by simultaneous transmission and emission data measurement and estimation of emission-to-transmission crosstalk: Attenuation correction in SPECT studies such as cardiac function imaging is carried out using an iterative statistically-based transmission projection reconstruction algorithm that is capable of modeling overlapping transmission beams from a line source array of radiation emitters. Downscatter between emission and transmission photons is additively corrected for in the algorithm....

20060091313 - Inverse collimation for nuclear medicine imaging: An inverse collimator detector for nuclear medicine imaging applications is provided. The inverse collimator detector includes an inverse collimator wherein high density, high atomic number collimator material is placed in the location where the conventional collimator has no material, and no material is placed where the conventional collimator has high...

20060091316 - Photomultiplier and radiation detector: In a photomultiplier, a ring-like side tube is not interposed between a side tube and a stem in the radial direction, and the side tube is joined to the ring-like side tube in a state of being directly capped onto a portion of the stem that protrudes out from an...

20060091317 - Photomultiplier and radiation detector: Onto a base member, through which stem pins are passed and holding members are to be joined to the respective surfaces thereof, the stem pins and the holding members are joined by fusion by melting of the base member to arrange a stem with at least three or more layers...

20060091318 - Photomultiplier and radiation detector: The edges of portions of a base member that are joined to stem pins are arranged as bottom surfaces of recesses formed in the stem so that the stem pins are joined to the base member at gradual angles and so that even when a bending force acts on the...

20060091319 - Device for the photometric measurement of the content of a chemical substance in an analyte: A device for photometric measurement of the concentration of a chemical substance in a solution, including: a lamp, which emits electromagnetic radiation in a predetermined wavelength range; a first receiving unit in a measuring branch (MB), which receives the radiation transmitted through the solution at a first wavelength; a second...

20060091320 - Storage phosphor cassette: A storage phosphor cassette including a shell having a cavity and a storage phosphor assembly having a substantially rigid plate. The rigid plate is adapted to be removably contained within the cavity of the shell and is also comprised of a material which is optically and/or radiographically transparent. A single...

20060091321 - Wafer alignment method for dual beam system: A gradient charged particle beam apparatus capable of moving highly accurately to a specific position by eliminating influences of warp inside a wafer surface is provided. A portion 46 having a mark 47 for aligning visual field alignment positioned in advance to the same horizontal and the same height as...

20060091323 - Exposure apparatus and exposure method for performing high-speed and efficient direct exposure: An exposure apparatus, in which exposure data necessary for direct exposure is sequentially supplied to an exposure engine having a plurality of exposure devices and, based on the thus supplied exposure data, the exposure engine forms an exposure pattern on an exposure target substrate moving relative to the exposure engine,...

20060091322 - Scanning probe-based lithography method: A resist medium in which features are lithographically produced by scanning a surface of the medium with an AFM probe positioned in contact therewith. The resist medium comprises a substrate; and a polymer resist layer within which features are produced by mechanical action of the probe. The polymer contains thermally...

20060091324 - Optical component, optical system including such an optical component, lithographic apparatus, method of correcting apodization in an optical system, device manufacturing method, and device manufactured thereby: A method of correcting apodization in an optical system includes determining effects of apodization on an intensity distribution of a beam of radiation in a predetermined plane of the optical system; determining a more desirable intensity distribution of the beam of radiation in the predetermined plane such that apodization is...

20060091325 - Method and apparatus for the automated process of in-situ lift-out: An apparatus for performing automated in-situ lift-out of a sample from a specimen includes a computer having a memory with computer-readable instructions, a stage for a specimen and a nano-manipulator. The stage and the nano-manipulator are controlled by motion controllers connected to the computer. The nano-manipulator has a probe tip...

20060091326 - Fluid treatment system and radiation source module for use therein: A radiation source module comprising a support member, a radiation source assembly connected to the support member, the radiation source assembly comprising at least one elongate radiation source having a source longitudinal axis and a module-to-surface seal disposed on a first elongate surface of the module, the first elongate surface...

20060091328 - Exposure apparatus, light source apparatus and device fabrication: An exposure apparatus for exposing a pattern of a mask onto an object, said exposure apparatus includes a light source for generating a plasma, said light source including a condenser mirror that condenses a light irradiated from the plasma, an illumination optical system for illuminating the mask using the light...

20060091327 - Radiation system, lithographic apparatus, device manufacturing method, and device manufactured thereby: A radiation system for multiplexing radiation includes two radiation sub-sources. The sub-sources each provide a certain amount of radiation. The system further includes a member with reflecting surfaces. The surfaces are arranged in such a way that they receive the radiation from the sub-sources and combine this radiation. The radiation...

20060091329 - Radioactive sample holder: After a syringe containing a radioactive sample therein and housed in a radiation shield case is mounted on a radioactive sample holder and set in a radioactive sample measuring apparatus, an upwardly projecting handle of the radioactive sample holder is depressed to cause a syringe holder base supported on second...

20060091330 - Alignment systems and methods for lithographic systems: An alignment system for a lithographic apparatus has a source of alignment radiation; a detection system that has a first detector channel and a second detector channel; and a position determining unit in communication with the detection system. The position determining unit is constructed to process information from said first...

20060091333 - Patterned illumination method and apparatus for machine vision systems: This application relates to an apparatus and method for providing patterned illumination fields for use within process control and article inspection applications. More specifically, it pertains to the use of patterned illuminators to enable visual surface inspection of polished objects such as ball bearings. The use of patterned illuminators properly...

20060091331 - Imaging apparatus having media sensing system: A system for sensing imaging media along a transport path. System includes a light source positioned proximate to a selected location along transport path. A transducer in optical alignment with light source so as to receive light from light source after light crosses transport path provides an output signal having...

20060091332 - Method and its apparatus for inspecting particles or defects of a semiconductor device: Conventionally, a particle/defect inspection apparatus outputs a total number of detected particles/defects as the result of detection. For taking countermeasures to failures in manufacturing processes, the particles/defects detected by the inspection apparatus are analyzed. Since the inspection apparatus outputs a large number of detected particles/defects, an immense time is required...

20060091334 - Con-focal imaging system and method using destructive interference to enhance image contrast of light scattering objects on a sample surface: System and method for detecting defects on a sample such as a lithography mask blank or a semiconductor substrate. The con-focal imaging system uses dual beam interference to enhance signal contrast from a light scattering defect on a sample surface. An incoming light beam is split into a probe beam...

20060091335 - System and method for detecting liquid flow from a nozzle in a semiconductor processing device: A system for detecting liquid flow from a nozzle in a semiconductor processing device includes a first fiber optic sensor, a second fiber optic sensor, and an amp. The first fiber optic sensor and second fiber optic sensor are located on opposite sides of at least one nozzle. The first...

20060091336 - Device and process for reading out x-ray information stored in a phosphor plate: A device for reading out X-ray information stored in a phosphor plate for simplified and solid guiding and/or holding of phosphor plates, with at the same time a high degree of compactness, includes: a device for holding and/or conveying the phosphor plate in an orientation inclined by an inclination angle...

20060091337 - Storage phosphor plate for the storage of x-ray information and a corresponding system for reading out the x-ray information: A storage phosphor plate for the storage of X-ray information, including a storage phosphor layer which stores the X-ray information and can be stimulated by stimulation light into emitting emission light, and a support layer on which the storage phosphor layer is located, the support layer being partially transparent for...

20060091338 - Image acquisition system for improved dqe: A method of scanning a sample responsive to stimulating radiation by providing stimulated radiation to the sample along a scanning path that includes more than one pass over at least a portion of the sample. The method includes the steps of performing two read-outs at a particular intensity stimulating radiation....