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Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

The following is a sampling of recent Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patent applications (USPTO Patent Application #, Patent Title) sorted by month.

January 2007 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20070008863 - Memory comprising a memory device and a write unit configured as a probe
20070011363 - Dual frequency first-in-first-out structure
20070002606 - Multi-context memory cell
20070002618 - Memory element, memory read-out element and memory cell
20070002619 - Bistable multivibrator with non-volatile state storage

December 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060290005 - Multi-chip device and method for producing a multi-chip device
20060294443 - On-chip address generation
20060286822 - Multi-chip device and method for producing a multi-chip device
20060278871 - Detecting and improving bond pad connectivity with pad check
20060282714 - Controllable delay device
20060282720 - Method for the automatic provision of repair position data of fuse elements in integrated memory circuit
20060274594 - Implementation of a fusing scheme to allow internal voltage trimming

November 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060268616 - Fuse memory cell with improved protection against unauthorized access
20060262613 - Semiconductor memory and method for adapting the phase relationship between a clock signal and strobe signal during the acceptance of write data to be transmitted
20060262614 - Integrated circuit, test system and method for reading out an error datum from the integrated circuit
20060265548 - Method for operating a pmc memory cell and cbram memory circuit
20060259711 - Technique to read special mode register
20060250868 - Electronic component with improved precharging
20060250881 - Memory arrangement having a plurality of ram chips
20060246726 - Making contact with the emitter contact of a semiconductor

October 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060242492 - Method and apparatus for masking known fails during memory tests readouts
20060233005 - Device in a memory circuit for definition of waiting times
20060233031 - Synchronous ram memory circuit
20060233037 - Method and apparatus for operating electronic semiconductor chips via signal lines
20060227627 - Buffer component for a memory module, and a memory module and a memory system having such buffer component
20060221555 - Solid electrolyte memory element and method for fabricating such a memory element
20060221663 - Electronic device with a memory cell
20060221690 - Test mode for detecting a floating word line

September 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060208357 - Integrated device and electronic system
20060202317 - Method for mcp packaging for balanced performance
20060203559 - Memory device with customizable configuration
20060203567 - Integrated memory circuit and method for repairing a single bit error
20060205111 - Method for producing chip stacks and chip stacks formed by integrated devices
20060197566 - Dll circuit for providing an output signal with a desired phase shift
20060197567 - Dll circuit for providing an adjustable phase relationship with respect to a periodic input signal
20060198211 - Test system for testing integrated circuits and a method for configuring a test system
20060198231 - Pulse controlled word line driver

August 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060193184 - Hub module for connecting one or more memory chips
20060193194 - Data strobe synchronization for dram devices
20060190674 - Hub chip for connecting one or more memory chips
20060181916 - Non-volatile memory cell for storage of a data item in an integrated circuit
20060181956 - Memory device having components for transmitting and receiving signals synchronously
20060176725 - Pmc memory circuit and method for storing a datum in a pmc memory circuit
20060170456 - Driver circuit for binary signals
20060170485 - Integrated charge pump
20060171220 - Test data topology write to memory using latched sense amplifier data and row address scrambling
20060171233 - Near pad ordering logic
20060171234 - Ddr ii dram data path

July 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060162957 - Printed circuit board, printed circuit module and method for producing a printed circuit board
20060164116 - Internal reference voltage generation for integrated circuit testing
20060157866 - Signal redistribution using bridge layer for multichip module
20060161743 - Intelligent memory array switching logic
20060152957 - Circuit arrangement and method for setting operating parameters in a ram module
20060152984 - Memory component and addressing of memory cells
20060152988 - Memory component having a novel arrangement of the bit lines
20060146593 - Method and circuit for reading a dynamic memory circuit
20060150039 - Input circuit for an integrated circuit

June 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060140025 - Method for operating a semiconductor memory apparatus, and semiconductor memory system
20060140039 - Voltage supply circuit, in particular for a dram memory circuit, as well as a method for controlling a supply source
20060133159 - Method for transmission and reception of a data signal on a line pair, as well as a transmission and reception circuit for this purpose
20060133172 - Apparatus and method for writing to and/or reading from a memory cell in a semiconductor memory
20060133186 - Memory access using multiple activated memory cell rows
20060125520 - Method to improve current and slew rate ratio of off-chip drivers
20060126407 - Methods for repairing and for operating a memory component
20060126413 - Memory circuit and method for reading out a memory datum from such a memory circuit
20060129740 - Memory device, memory controller and method for operating the same
20060118851 - Memory cell and integrated memory circuit
20060119406 - Flip-flop with additional state storage in the event of turn-off
20060120200 - Integrated dram memory device
20060121257 - Method for producing a rewiring printed circuit board

May 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060109731 - Twin-cell bit line sensing configuration
20060109869 - Method and circuit arrangements for adjusting signal propagation times in a memory system
20060112230 - Integrated memory device and memory module
20060112239 - Memory device for use in a memory module
20060107026 - Memory access using multiple sets of address/data lines
20060095652 - Memory device and method for receiving instruction data

April 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060087895 - Memory circuit with flexible bitline-related and/or wordline-related defect memory cell substitution
20060085705 - Memory circuit comprising an initialization unit, and method for optimizing data reception parameters in a memory controller
20060076996 - Delay circuit with accurate time to frequency conversion
20060077730 - Memory control module and method for operating a memory control module
20060071257 - Gate layer diode method and apparatus
20060071689 - Circuit and method for generating an output signal

March 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060067156 - Memory device, memory controller and memory system having bidirectional clock lines
20060067157 - Memory system with two clock lines and a memory device
20060069880 - Apparatus for controlling access, by processing devices, to memories in an embedded system
20060064620 - Self test for the phase angle of the data read clock signal dqs
20060054812 - Method and apparatus for characterizing a recess located on a surface of a substrate
20060056255 - Semiconductor memory apparatus and method for operating a semiconductor memory apparatus
20060059394 - Loop-back method for measuring the interface timing of semiconductor memory devices using the normal mode memory
20060059397 - Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods
20060049511 - Integrated semiconductor circuit and method for producing an integrated semiconductor circuit
20060049515 - Memory module having memory chips protected from excessive heat
20060049967 - Code driver for a memory controller
20060050546 - Memory circuit having memory cells which have a resistance memory element
20060050572 - Memory circuit with supply voltage flexibility and supply voltage adapted performance
20060050577 - Memory module with programmable fuse element

February 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060031620 - Memory controller with a plurality of parallel transfer blocks
20060026475 - Semiconductor circuit device and a system for testing a semiconductor apparatus

January 2006 - Patterson & Sheridan, LLP Gero Mcclellan / Infineon Technologies patents

20060018165 - Digital ram memory circuit with an expanded command structure
20060006411 - Method for producing a package for an electronic circuit and a substrate for a package



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