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Patent Counsel Applied Materials, Inc., patentsThe following is a sampling of recent Patent Counsel Applied Materials, Inc., patent applications (USPTO Patent Application #, Patent Title) sorted by month.
February 2009 - Patent Counsel Applied Materials, Inc., patents
20090037868 - Area based optical proximity correction in raster scan printing
April 2008 - Patent Counsel Applied Materials, Inc., patents
20080090425 - Two-step post nitridation annealing for lower eot plasma nitrided gate dielectrics
March 2008 - Patent Counsel Applied Materials, Inc., patents
20080073531 - Charged particle beam system and a method for inspecting a sample
20080059261 - Method for capturing and using design intent in an integrated circuit fabrication process
February 2008 - Patent Counsel Applied Materials, Inc., patents
20080045021 - Dual reduced agents for barrier removal in chemical mechanical polishing
20080038998 - Method for processing a substrate using multiple fluid distribtuions on a polishing surface
January 2008 - Patent Counsel Applied Materials, Inc., patents
20080023443 - Alternating asymmetrical plasma generation in a process chamber
20080017115 - Apparatus for reducing entrapment of foreign matter along a moveable shaft of a substrate support
December 2007 - Patent Counsel Applied Materials, Inc., patents
20070295455 - Method and apparatus for etching material layers with high uniformity of a lateral etch rate across a substrate
20070296980 - Integrated phase angle and optical critical dimension measurement metrology for feed forward and feedback process control
20070278382 - System and method for controlling the characteristics of multiple sensors
August 2007 - Patent Counsel Applied Materials, Inc., patents
20070199507 - Apparatus to improve wafer temperature uniformity for face-up wet processing
20070202706 - Method and apparatus for etching material layers with high uniformity of a lateral etch rate across a substrate
20070181165 - Stripping and removal of organic-containing materials from electronic device substrate surfaces
20070183869 - Docking station for a factory interface
June 2007 - Patent Counsel Applied Materials, Inc., patents
20070143980 - Attaching components of a carrier head
May 2007 - Patent Counsel Applied Materials, Inc., patents
20070117050 - Maintenance of photoresist activity on the surface of dielectric arcs for 90 nm feature sizes
20070110898 - Method and apparatus for providing precursor gas to a processing chamber
20070112465 - Vision system
20070095789 - Method for automatic determination of semiconductor plasma chamber matching and source of fault by comprehensive plasma monitoring
20070099415 - Integration process of tungsten atomic layer deposition for metallization application
April 2007 - Patent Counsel Applied Materials, Inc., patents
20070085019 - Cooling module for charged particle beam column elements
20070085524 - Method and apparatus which enable high resolution particle beam profile measurement
20070082477 - Integrated circuit fabricating techniques employing sacrificial liners
20070082479 - Chemical mechanical polishing techniques for integrated circuit fabrication
20070075275 - Beam exposure writing strategy system and method
20070076345 - Substrate placement determination using substrate backside pressure measurement
February 2007 - Patent Counsel Applied Materials, Inc., patents
20070032082 - Semiconductor substrate process using an optically writable carbon-containing mask
20070023393 - Interferometer endpoint monitoring device
January 2007 - Patent Counsel Applied Materials, Inc., patents
20070008519 - Illumination system for optical inspection
December 2006 - Patent Counsel Applied Materials, Inc., patents
20060291990 - Semiconductor substrate processing apparatus with a passive substrate gripper
20060292864 - Plasma-enhanced cyclic layer deposition process for barrier layers
20060283553 - Plasma chamber insert ring
20060286772 - Method of cross-section milling with focused ion beam (fib) device
20060286783 - Post-ion implant cleaning for silicon on insulator substrate preparation
November 2006 - Patent Counsel Applied Materials, Inc., patents
20060256499 - Dual bias frequency plasma reactor with feedback control of e.s.c. voltage using wafer voltage measurement at the bias supply output
October 2006 - Patent Counsel Applied Materials, Inc., patents
20060237043 - Method and apparatus for cleaning semiconductor substrates
20060232768 - Evaluating a multi-layered structure for voids
20060226548 - Very low dielectric constant plasma-enhanced cvd films
20060219175 - Oxide-like seasoning for dielectric low k films
September 2006 - Patent Counsel Applied Materials, Inc., patents
20060205238 - Silicon-containing structure with deep etched features, and method of manufacture
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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Patent Counsel Applied Materials, Inc., in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Patent Counsel Applied Materials, Inc., with additional patents listed. Browse our Agent directory for other possible listings.
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