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Optics: measuring and testing July category listing 07/10

20100188648 - Beam irradiation device and laser radar system: A beam irradiation device includes: a laser light source for emitting laser light; an actuator which scans a targeted area with the laser light; a servo optical system which changes a propagating direction of servo light in response to driving of the actuator; a photodetector which receives the servo light... Agent: Ditthavong Mori & Steiner, P.C.

20100188649 - Distance measurement device and method of use thereof: Systems and methods of utilizing a frequency modulation technique to determine an unknown distance between at least one source and at least one detector in an light scattering medium without knowing the optical properties of the medium are described. Modulated light is emitted from a light source to an optical... Agent: Ingrid Mctaggart

20100188650 - Portable egg candling and containment transfer appratus and method: A portable egg candling and containment transfer apparatus including a movable base, a frame extending up from the base, a movable elevator deck movable between an elevated position and a lowered position, and a mechanism for raising and lowering the elevator deck. The apparatus further includes an inverting candling table... Agent: Gardner Groff Greenwald & Villanueva. PC

20100188651 - Optical property sensor: An apparatus that can measure both haze and clarity on a web moving at conventional manufacturing speeds. The apparatus uses an integrating sphere and a novel mirror arrangement. With this arrangement, the invention can utilize a calibration curve created using known samples over the range of measurement desired to convert... Agent: 3m Innovative Properties Company

20100188652 - Quantum dot-mediated optical fiber information retrieval systems and methods of use: The present disclosure relates to a non-invasive and real-time diagnostic analysis concept for an operational single mode optical fiber communication system and methods of using said system. The system comprises an optical fiber capable of being diagnosed non-invasively comprising an optical fiber for conveying a light beam that comprises an... Agent: Moore And Van Allen PLLC For Boeing

20100188653 - Optical component focus testing apparatus and method: An optical component focus testing apparatus includes a plurality of test pattern displays. One or more illuminators are configured to selectively illuminate different test pattern displays at different times. Light directors are provided to direct light from at least one of the illuminated test pattern displays towards an optical component... Agent: Gardere Wynne Sewell LLP Intellectual Property Section

20100188654 - Tilt sensor: A tilt sensor capable of detecting more diverse orientations is to be provided. The tilt sensor includes a light emitting element and a plurality of photodetectors, a rolling element, and a hollow portion that accommodates the rolling element so as to allow the rolling element to roll in all of... Agent: Hamre, Schumann, Mueller & Larson, P.C.

20100188655 - Tdi sensor modules with localized driving and signal processing circuitry for high speed inspection: An inspection system for inspecting a surface of a wafer/mask/reticle can include a modular array. The modular array can include a plurality of time delay integration (TDI) sensor modules, each TDI sensor module having a TDI sensor and a plurality of localized circuits for driving and processing the TDI sensor.... Agent: Bever, Hoffman & Harms, LLP

20100188656 - Surface inspection method and surface inspection apparatus: Light from a light source becomes two illumination beams by a beam splitter. The beams are irradiated onto a semiconductor wafer from two mutually substantially orthogonal azimuthal angles having substantially equal elevation angles to form illumination spots. When the sum of scattered, diffracted, and reflected lights due to the illumination... Agent: Crowell & Moring LLP Intellectual Property Group

20100188658 - High resolution wafer inspection system: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20100188657 - Systems and methods for detecting defects on a wafer: Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at... Agent: Entropy Matters LLC

20100188659 - In-situ devices, systems, and methods for gas species measurement: Disclosed herein are devices, systems, and methods for use in measuring the concentration component gases in a gaseous mixture. An alignment pipe can be used to maintain the alignment of a laser and a laser receiver for use in laser spectroscopy. The pipe is sufficiently rigid to mount and support... Agent: Troutman Sanders LLP 5200 Bank Of America Plaza

20100188660 - Spatial frequency optical measurement instrument and method: A spatial frequency optical measurement instrument (100) is provided according to the invention. The instrument (100) includes a spatial frequency mask (120) positioned in a light path and configured to encode light with spatial frequency information, a light receiver (140) positioned to receive the light encoded with the spatial frequency... Agent: The Ollila Law Group LLC

20100188661 - Multiple beam wide band crds cavity sensor and detector: A common multi-gas ring down detector incorporates a cavity that has a piezoelectric mirror and at least two displaced mirrors to define two different transit paths in the cavity. The two paths intersect at the piezoelectric mirror at different angles. Two different laser beams having first and second different wavelengths,... Agent: Honeywell/husch Patent Services

20100188663 - Sub-micron surface plasmon resonance sensor systems: A sensor for detecting the presence of a target analyte, ligand or molecule in a test fluid, comprising a light transmissive substrate on which an array of surface plasmon resonant (SPR) elements is mounted is described. A multi-channel sensor for detecting the presence of several targets with a single microchip... Agent: Barnes & Thornburg LLP

20100188664 - Sub-micron surface plasmon resonance sensor systems: A sensor for detecting the presence of a target analyte, ligand or molecule in a test fluid, comprising a light transmissive substrate on which an array of surface plasmon resonant (SPR) elements is mounted is described. A multi-channel sensor for detecting the presence of several targets with a single micro-chip... Agent: Barnes & Thornburg LLP

20100188662 - Surface tension measuring device and method: Low-cost interface property measuring device and method enabling high-precision and simple measurement of an interface property. The interface property measuring device comprises an optical fiber probe (1) having a first end face (2) at least part of which is inclined with respect to a direction perpendicular to a fiber axis,... Agent: Mckee, Voorhees & Sease, P.L.C

20100188665 - Methods and systems for interferometric analysis: This invention provides methods and devices for analyzing interference patterns. The methods include fitting a Gaussian distribution to a cross correlation of two patterns from interferometric analysis of a liquid at a first and second time; identifying a positional shift of the pattern by comparing a selected value of the... Agent: Quine Intellectual Property Law Group, P.C.

20100188666 - Method for beam calibration and usage of a calibration body: The invention relates to a method of calibration of the beam position of a corpuscular beam. A calibration body with structures is used, wherein the structures have a structure period Ps in the plain section and within each structure there is a position L intended for the measurement. For the... Agent: Patterson & Sheridan, L.L.P.

20100188667 - Optical aperture sensor: A fluid control platform that may control various fluid control components and is scalable by connecting with additional substantially identical platforms, as well as related systems, methods of manufacturing the same, and methods of fluid control are disclosed. The platform may include a programmable controller, a power supply, a data... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20100188669 - Laser beam centering and pointing system: An optical instrument aligns an optical beam without the need for physical intervention of the instrument within the apparatus or platforms from which the trajectory of the beam to be ascertained. The alignment apparatus and method enable the desired function to be realized without the placement of physical apertures or... Agent: Llns / John P. Wooldridge John H. Lee, Assistant Laboratory Counsel

20100188668 - Total internal reflection displacement scale: Methods and systems for determining the displacement of a substrate using a scale comprising TIR scale features are described. A scale that includes a number of total internal reflection (TIR) prisms as scale elements is disposed on the substrate. Light directed towards the scale is modulated by the TIR prisms.... Agent: 3m Innovative Properties Company

20100182587 - Energy efficient laser detection and ranging system: According to one embodiment, a laser detection and ranging system includes a beam forming element that is optically coupled to a light source. The light source generates a light beam that is split by the beam forming element into multiple beamlets and directed toward a target. At least one of... Agent: Baker Botts LLP

20100182588 - Method and device for determining the distance to a retroreflective object: The invention relates to a method and a device for determining a modification at one object or a modification caused by an object (1.26), wherein a measurement of the light propagation time is also possible. According to the invention, an amplitude control (1.6) regulates a transmitter light source (1.8) and... Agent: Cantor Colburn, LLP

20100182592 - Apparatus and method for checking thickness dimensions of an element while it is being machined: An apparatus for checking thickness dimensions in a semiconductor wafer (1) during grinding operations includes an optical probe (3) which transmits infrared radiations on the surface (2) being machined of the wafer (1), and detects beams that are reflected by said surface, by an opposite surface (2′) of the wafer... Agent: Dickstein Shapiro LLP

20100182591 - Cell, device comprising this cell and method for measuring the amount of insoluble particles in a fluid and applications: The disclosure relates to a cell for measuring the amount of insoluble particles in a fluid that comprises a duct that passes through the cell, a filter for the particles contained in the fluid, the filter being positioned in the duct, an emitter capable of emitting an electromagnetic beam directed... Agent: Harness, Dickey & Pierce, P.L.C

20100182590 - Measuring device and method for determining optical characteristic variables for verifying photochemical and electrochemical degradatve reactions: A measuring device for quantitative determination of optical characteristic values for detecting photo- and/or electrochemical decomposition reactions taking place on surfaces of photocatalytically active substrates.... Agent: Gibson & Dernier LLP

20100182589 - Spectral detection method and device, and defect inspection method and apparatus using the same: In spectral detection for detecting the shape of repeating pattern structures uniformly formed on a surface of a test object, it is advantageous to use light having a wide wavelength range in a short wavelength region. However, it is not easy to realize a relatively simple optical system capable of... Agent: Antonelli, Terry, Stout & Kraus, LLP

20100182594 - Apparatus for automated real-time material identification: An apparatus is described for the real-time identification of one or more selected components of a target material. In one embodiment, an infrared spectrometer and a separate Raman spectrometer are coupled to exchange respective spectral information of the target material preferably normalized and presented in a single graph. In an... Agent: Davis, Brown, Koehn, Shors & Roberts, P.C. The Davis Brown Tower

20100182593 - Surface state detecting apparatus: A surface inspection apparatus includes units illuminating repetitive patterns formed on a surface of a suspected substance and measuring a variation in an intensity of regular reflection light caused by a change in shapes of the repetitive patterns, units illuminating the repetitive patterns with linearly polarized light, setting an angle... Agent: Oliff & Berridge, PLC

20100182595 - Three dimensional light measuring apparatus: A three dimensional light measuring apparatus, and more particularly, to a light measuring apparatus that three dimensionally measures the light emitted from an optical object without moving the optical object or the light measuring apparatus using a hemispherical scattering unit having a scattering layer is provided. The three dimensional light... Agent: Knobbe Martens Olson & Bear LLP

20100182596 - Phototransistor with source layer between barrier layer and photosensitive semiconductor layer: A photo transistor has an active region spaced from a source by barrier. A drain is laterally spaced from the active region. Light incident on the active region creates electron-hole pairs. Holes accumulate at the barrier and modulate the effective barrier height to electrons. A gate reset voltage then is... Agent: Seed Intellectual Property Law Group PLLC

20100182597 - Method and device for producing a cuvette and cuvette produced using said method: A multi-part injection mold (10) for producing a cuvette (1) or a receptacle vessel for liquid or gaseous media for spectroscopic, qualitative and/or quantitative analysis or measurement using a measuring region or measuring gap (2) through which radiation is able to penetrate is provided, with the cuvette being made of... Agent: Volpe And Koenig, P.C.

20100182598 - Digital filter spectrum sensor: A spectrum sensing method includes (a) receiving an incident radiation simultaneously through a filter array composed of multiple bandpass filters, (b) digitizing spectral responses of the filter array, and (c) generating an estimate of spectral profile of the incident radiation based on digitized spectral responses of the filter array.... Agent: Foley And Lardner LLP Suite 500

20100182600 - Self-contained multivariate optical computing and analysis systems: An optical analysis system includes a light source configured to radiate a first light along a first ray path; a modulator disposed in the first ray path, the modulator configured to modulate the first light to a desired frequency; a spectral element disposed proximate the modulator, the spectral element configured... Agent: Turner Padget Graham & Laney, P.A.

20100182599 - Spectrometer flip top sample head: A spectrometer sample head including a housing, at least one source of radiation in the housing, and a flip top sample cell. First and second hinged plates each include a window aligned with each other when the plate are coupled together. The housing includes a channel for receiving the plates... Agent: Iandiorio Teska & Coleman

20100182601 - Offset illumination aperture for optical navigation input device: An optical navigation input device with an offset imaging aperture. The optical navigation input device includes a light source, an illumination aperture structure, and an image sensor. The light source directs a light beam toward a substantially specular illumination surface. Scattered light reflects off of a surface reflection feature along... Agent: Kathy Manke Avago Technologies Limited

20100182602 - Defect inspection method and apparatus: A pattern inspection apparatus is provided to compare images of regions, corresponding to each other, of patterns that are formed so as to be identical and judge that non-coincident portions in the images are defects. The pattern inspection apparatus is equipped with an image comparing section which plots individual pixels... Agent: Antonelli, Terry, Stout & Kraus, LLP

20100182603 - Surface inspection device: A surface inspection device includes an illumination optical system that illuminates, with a linearly polarized light, a surface of a wafer where a repeated pattern is formed; an alignment stage that holds the wafer; a pick-up optical system that picks up an image of reflected light from the surface of... Agent: Morgan Lewis & Bockius LLP

20100182604 - Device for optoelectronic measurement of the hydration of a plant in its natural environment: An optoelectronic device for measuring the water content in a plant element and an apparatus designed to evaluate and monitor in real time the state of hydration of the plant covers. The device includes an optoelectronic probe connected to a measurement module, the probe including: i) a first light source... Agent: Young & Thompson

20100182605 - Optical fluid detector: A fluid detector and a method of detecting a fluid are described. The fluid detector includes a broadband light source (10) for providing a light beam (12) including light of at least a predetermined bandwidth, and an optical power detector (40) arranged to provide an output signal indicative of the... Agent: Conley Rose, P.C. David A. Rose

20100182606 - Apparatus and method for multi-parameter optical measurements: An apparatus and method are provided for optically measuring multiple parameters of a test sample at a regulated temperature. The test sample is held in a cuvette within a sample chamber or a fluidic channel on a fluidic chip. The temperature is sensed and modulated within a desired range. Either... Agent: Lambert Intellectual Property Law

20100182607 - Fiber-optic localized plasmon resonance sensing device and system thereof: The present invention discloses a fiber-optic localized plasmon resonance (FO-LPR) sensing device and a sensing system thereof, the FO-LPR sensing system includes a light source, a FO-LPR sensing device and a detector, and the light source provides a light beam entered into the FO-LPR sensing device, and the detector generates... Agent: Wpat, PC Intellectual Property Attorneys

20100182608 - Irregularly shaped actuator fingers for a micro-electromechanical system fabry-perot filter: According to one embodiment, a micro-electrical mechanical system apparatus includes (i) a comb drive actuator having at least one irregularly shaped finger and (ii) a movable Fabry-Perot filter cavity mirror coupled to the comb drive actuator. According to some embodiments, a relationship between a voltage applied to the comb drive... Agent: Patent Docket Department Armstrong Teasdale LLP

20100182609 - Method and apparatus for localized polarization sensitive imaging: Embodiments include apparatuses and methods for spectral domain polarization sensitive optical coherence tomography including a reference assembly for detection of the polarization sensitive spectral interferograms formed by vertically and horizontally polarized beam components. Interference signals between the reference and sample beams may be modulated at a constant frequency.... Agent: Schwabe Williamson & Wyatt Pacwest Center, Suite 1900

20100182611 - Displacement measuring apparatus and displacement measuring method: A displacement measuring apparatus 100 which measures a displacement of an object to be measured 1 comprises a ranging sensor 5 configured to detect a first origin position based on a distance to a base 2, a ranging sensor 6 configured to detect a second origin position based on a... Agent: Rossi, Kimms & Mcdowell LLP.

20100182610 - Optical tomographic imaging apparatus: In an optical tomographic imaging apparatus in which a tomographic image is acquired using an interference light between a return beam of a first measuring beam and a first reference beam traveling on a beam path having first beam path length changing unit thereon, an optical interferometer detects movement of... Agent: Fitzpatrick Cella Harper & Scinto

20100182612 - Optical tomographic imaging apparatus: Provided is an optical tomographic imaging apparatus which enables simplification and cost reduction without reducing accuracy when moving part of an object is moved in an optical axis direction of measuring beam. The apparatus using return beam of measuring beam reflected or scattered by an object and reference beam reflected... Agent: Fitzpatrick Cella Harper & Scinto

20100182613 - Doppler sensor for the derivation of torsional slip, friction and related parameters: An optical method and apparatus are described for the measurement of properties of a travel vehicle or a travel surface upon which the travel vehicle travels, which includes providing an incident light from a light source to the travel surface, collecting light reflected from the travel surface, determining a surface... Agent: Blank Rome LLP

20100182614 - Shape measurement apparatus and method: A shape measurement apparatus and method using a laser interferometer are disclosed. The shape measurement apparatus includes a plurality of laser devices, which generate beams, emit a beam of a specific frequency from among the generated beams, and output interference signals for detecting wavelengths of the generated beams, and a... Agent: Cantor Colburn, LLP

20100177298 - laser range finder for use on a golf course: An improved range finder for use on a golf course. The improved range finder includes means for identifying the closest target in a field of view during a sweep operation of the field of view and means for presenting the distance of the closest target at the conclusion of the... Agent: Callaway Golf C0mpany

20100177296 - Method and apparatus for position optimization of a field generator: An electro-magnetic tracking system (50,110) includes a system controller (58) having a sensor interface, a generator (52), and a positioning and angular orientation configuration (62,114). The generator is responsive to the system controller for generating an electro-magnetic field, the electro-magnetic field including a portion thereof characterized as a tracking volume... Agent: Philips Intellectual Property & Standards

20100177297 - Systems and methods for quantum receivers for target detection using a quantum optical radar: A quantum-illumination receiver is described comprising a phase-conjugation and mixing system for mixing and/or conjugating the idler beam from an entangled light transmitter and the return beam from the target to produce an output beam that is representative of the presence or absence of the target, a light beam collector... Agent: Ropes & Gray LLP

20100177299 - Differential focus blade clearance probe: An apparatus and a method for ascertaining a gap between a stationary member and a rotating member are disclosed. At least a reference beam and a signal beam, which have different focal lengths or which diverge/converge at different rates, are fixed to the stationary member and proximate to each other.... Agent: The H.t. Than Law Group

20100177300 - Measuring device: A measuring device includes a VCSEL of a first-order or high-order single mode emitting laser beams, a driving part configured to drive the VCSEL, a detecting part configured to detect an electric signal relating to feedback lights generated when laser beams are projected onto an object, and a calculating part... Agent: Fildes & Outland, P.C.

20100177301 - Characterization of non-linear optical materials using bragg coupling: Methods of characterizing non-linear optical materials and fabricating wavelength conversion devices are provided. The method of characterizing non-linear optical materials comprising a periodically poled waveguide layer and at least one waveguide region includes coupling at least one diagnostic laser beam into the waveguide region at one or more input locations... Agent: Corning Incorporated

20100177302 - Phase based sensing: A method of interrogating a phase based transducer by providing a pulsed input including two different wavelengths. The different wavelength components can be used to derive a phase change experienced by a synthetic wavelength, and by arranging for the synthetic wavelength to be significantly greater that the component wavelengths, the... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20100177303 - Mtf measuring system, mtf measuring method, mtf measuring unit and mtf measuring program: Measurement result screen data indicative of an object image and an MTF curve image are generated in accordance with the object image data obtained by photographing the object and the MTF curve image data indicative of the MTF curve generated from MTF data that become an index to evaluate lens... Agent: Smith Patent Office

20100177304 - Vehicle wheel alignment system and methodology: A hybrid wheel alignment system and methodology use passive targets for a first pair of wheels (e.g. front wheels) and active sensing heads for another pair of wheels (e.g. rear wheels). The active sensing heads combine image sensors for capturing images of the targets with at least one spatial relationship... Agent: Mcdermott Will & Emery LLP

20100177305 - Cuvette for flow-type particle analyzer: The present invention provides an optical cuvette for use in a flow-type particle analyzer, wherein the cuvette includes a removable flow tube containing a flow channel oriented coaxially.... Agent: David W. Highet, Vp & ChiefIPCounsel Becton, Dickinson And Company

20100177307 - Method and optical arrangement for generating a nonlinear optical signal on a material which is excited by an excitation field, and use of the method and of the optical arrangement: The invention concerns a method of and an optical arrangement (10) for generating a non-linear optical signal (17) on a material (16) excited by an excitation field (2), wherein with the excitation field (2) coherent fields of first and second optical pulses of differing frequency are overlapped in the material... Agent: Bachman & Lapointe, P.C.

20100177306 - Sers nanotag assays: A method of producing a surface enhanced Raman scattering spectrum which is useful for certain types of assays, in particular proximity assays. The method includes providing two SERS-active nanoparticles. The first SERS-active nanoparticle will absorb a photon at a first wavelength and emit a Raman-shifted photon at a second wavelength.... Agent: David W. Highet, Vp & ChiefIPCounsel Becton, Dickinson And Company

20100177308 - Spectrometer comprising solid body sensors and secondary electron multipliers: The invention relates to a spectrometer for analysing the optical emission of a sample by means of pulsed excitation of an optical spectral emission, having an excitation source, a gap arrangement, at least one dispersive element and having detectors for the emitted spectrum, in which two beam paths are provided... Agent: Connolly Bove Lodge & Hutz LLP

20100177309 - Modular spectroscopy laboratory: A modular spectroscopy laboratory (MSL), comprises a rigid case with a flashlamp rotatably mounted in said case. A sample holder is provided for holding a sample of solution for analysis, and a spectrometer is optically connected to the sample holder. The flashlamp is positionable at least two angles relative to... Agent: Hespos & Porco LLP

20100177310 - Evanescent wave downhole fiber optic spectrometer: An apparatus for estimating a property of a fluid downhole, is provided an includes: an optical fiber that receives light emitted from a light source and including an unclad portion adapted for contacting the fluid; a photodetector for receiving optical signals from the portion; and a spectrometer for obtaining an... Agent: Cantor Colburn LLP- Baker Hughes Incorporated

20100177311 - Apparatus for measuring nanoparticles: A dielectric sheet 3 is arranged between a pair of electrodes 2a and 2b for forming an electric field in a cell 1 that stores therein a sample having particles dispersed movably in a medium, the dielectric sheet 3 being formed to include multiple mutually parallel slits 3a to form... Agent: Cheng Law Group, PLLC

20100177312 - Surface inspection method and surface inspection device: A surface inspection method inspects a surface of a wafer having a repeated pattern formed by double patterning. The method includes: a first step (S121) which applies an inspection light to a surface of a wafer; a second step (S122) which detects a diffracted light from the surface of the... Agent: Morgan Lewis & Bockius LLP

20100177313 - Inspecting method using an electro optical detector: An inspecting method using an electro-optical detecting device is disclosed. The electro-optical detecting device includes: an upper substrate and a lower substrate; a nematic liquid crystal layer interposed between the upper substrate and the lower substrate; a transparent electrode interposed between the nematic liquid crystal layer and the upper substrate,... Agent: The Farrell Law Firm, LLP

20100177314 - Methods for on-line calibrating output power of optical pick-up: The present invention relates to methods for on-line calibrating output power of an optical pick-up. A power adjusting circuit of the optical pick-up has an optical power regulator and an optical power detector. The on-line output power calibrating method includes the steps of: performing a recording pre-process; providing a focus... Agent: Muncy, Geissler, Olds & Lowe, PLLC

20100177315 - Alignment device and method for optical system: An alignment device is provided for aligning a primary mirror with a secondary mirror in an optical system having the primary mirror and the secondary mirror arranged so as to face each other along the optical axis. The alignment device has a dichroic film formed on a surface on the... Agent: Miles & Stockbridge PC

20100177316 - Integrated embedded processor based laser spectroscopic sensor: A novel low-power and compact laser spectroscopic sensor is described herein. Embodiments of the disclosed sensor utilize state-of-the-art microprocessors and digital processing techniques to reduce power consumption and integrate functions into a small device. In particular, novel software methods are disclosed which allow the use of low-power microprocessors which draw... Agent: Conley Rose, P.C.

20100177317 - Matter-wave rate gyro integrated onto an atom chip and associated accelerometer: The general field of the invention is that of rate gyros, of the matter-wave type, allowing the measurement of a speed of rotation in a given direction of measurement. This type of rate gyro works by the Sagnac effect and uses ultracold atoms to perform the measurement. It necessarily comprises... Agent: Lariviere, Grubman & Payne, LLP

20100177318 - Laser interferometer: A laser interferometer includes: a laser source for emitting a laser beam while stabilizing a center wavelength of the laser beam by modulating the laser beam using a modulation signal of a predetermined frequency; and a reference mirror and a measurement mirror for reflecting the laser beam. The laser interferometer... Agent: Oliff & Berridge, PLC

20100177319 - Optical imaging of physical objects: A method for combining shape data from multiple views in a common co-ordinate system to define the 3-D shape and/or colour of an object, the method comprising: projecting one or more optical datum(s)/markers onto the object surface; projecting light over an area of the object surface; capturing light reflected from... Agent: Young Basile

20100177322 - Measurement method and measurement apparatus: The present invention provides a measurement apparatus that illuminates a surface to be tested having an aspheric surface using light beams that form spherical waves to measure a figure of the surface to be tested, including a detection unit configured to detect interference patterns between light beams from the surface... Agent: Rossi, Kimms & Mcdowell LLP.

20100177320 - Method of measuring a deviation of an optical surface from a target shape: A method of aligning at least two wave shaping elements, a method of measuring a deviation of an optical surface from a target shape and a measuring apparatus for interferometrically measuring a deviation of an optical surface from a target shape. The method of aligning at least two wave shaping... Agent: Sughrue Mion, PLLC

20100177321 - Optical element and method of calibrating a measuring apparatus comprising a wave shaping structure: Optical element having an optical surface, which optical surface is adapted to a non-spherical target shape, such that a long wave variation of the actual shape of the optical surface with respect to the target shape is limited to a maximum value of 0.2 nm, wherein the long wave variation... Agent: Sughrue Mion, PLLC

20100177323 - Wavefront-aberration-measuring device and exposure apparatus: A wavefront-aberration-measuring device measures wavefront aberration of a to-be-tested optical system and includes a diffraction grating that splits light transmitted through the optical system, a detecting unit that detects interference fringes produced by beams of the split light, an arithmetic unit that calculates the wavefront aberration from the detected interference... Agent: Canon U.s.a. Inc. Intellectual Property Division

20100177324 - Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientation: An optical metrology apparatus for measuring periodic structures using multiple incident azimuthal (phi) and polar (theta) incident angles is described. One embodiment provides the enhanced calculation speed for the special case of phi=90 incidence for 1-D (line and space) structures, which has the incident plane parallel to the grating lines,... Agent: D. Kligler I.p. Services Ltd

20100177325 - Apparatus and method for recognizing home position of rotatable body: Provided are an apparatus and method for recognizing a home position of a rotatable body. The apparatus includes: a tray including a support surface on which the rotatable body can be seated; a rotatable body position alignment unit for controlling the position of the rotatable body so that the rotatable... Agent: Sughrue Mion, PLLC

20100177326 - Film-thickness measurement method and apparatus therefor, and thin-film device fabrication system: Objects are to reduce the burden on an operator and to improve fabrication efficiency. A transparent conductive film or a transparent optical film formed on a substrate W is irradiated with line illumination light by means of a line illumination device 3, line reflected light reflected at the transparent conductive... Agent: Kanesaka Berner And Partners LLP

20100171943 - Method for geodetic monitoring of rails: Method for geodetic monitoring of rails provided for conveying devices in that stationed at least in the area of one rail end is a tachymeter with spatial reference, placed on the rail to be checked is a rail measuring vehicle that travels the rail alone for measuring the rail when... Agent: Jordan And Hamburg LLP

20100171944 - Gas velocity sensor: A method and apparatus for determining gas velocity, which includes generating transmitted radiation having an expected transmission frequency, detecting backscattered radiation, and determining gas velocity in dependence upon any Doppler shift of the frequency of the backscattered radiation, determining a transmission frequency of the transmitted radiation; detecting any difference between... Agent: Kenyon & Kenyon LLP

20100171945 - Method of classifying a graded-index multimode optical fiber: A method of classifying a graded-index multimode optical fiber includes taking a series of individual measurements at a single wavelength, and using the measurements to characterize the departure of the multimode optical fiber's actual index profile from the corresponding nominal index profile. The measurements, coupled with intermodal dispersion or EMB... Agent: Summa, Additon & Ashe, P.A.

20100171946 - Microscope and method for total internal reflection-microscopy: A microscope for total internal reflection microscopy. The microscope includes at least one light source configured to provide an illumination light to an illumination beam path for an evanescent illumination of a specimen so as to reflect the illumination light at an interface to the specimen or a specimen cover... Agent: Leydig, Voit And Mayer

20100171947 - Pattern inspection device and method: A pattern inspection device has a light irradiator configured to irradiate a light on an inspection area set in a pattern forming location on a semiconductor wafer and an adjustment area set different from the inspection area in association with the inspection area on the semiconductor wafer, an image pickup... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20100171948 - Metalized semiconductor substrates for raman spectroscopy: In one aspect, the present invention generally provides methods for fabricating substrates for use in a variety of analytical and/or diagnostic applications. Such a substrate can be generated by exposing a semiconductor surface (e.g., silicon surface) to a plurality of short laser pulses to generate micron-sized, and preferably submicron-sized, structures... Agent: Nutter Mcclennen & Fish LLP

20100171951 - Methods and apparatus for remote raman and laser-induced breakdown spectrometry: An spectrometer including Raman and LIBS spectroscopy capabilities is disclosed. The spectrometer includes a laser source configurable to produce a lased light directable towards a target substance, the laser source having a single wavelength and having sufficient power to cause a portion of the target to emit Raman scattering and... Agent: Ladas & Parry LLP

20100171950 - Methods for uniform metal impregnation into a nanoporous material: The methods, systems 400 and apparatus disclosed herein concern metal 150 impregnated porous substrates 110, 210. Certain embodiments of the invention concern methods for producing metal-coated porous silicon substrates 110, 210 that exhibit greatly improved uniformity and depth of penetration of metal 150 deposition. The increased uniformity and depth allow... Agent: Pillsbury Winthrop Shaw Pittman LLP (intel)

20100171949 - Non-invasive optical analysis using surface enhanced raman spectroscopy: In one aspect, a system for use in product packaging is disclosed that includes a polymeric sensing substrate coupled to a package such that a front sensing surface thereof is in contact with a portion of a product, e.g., a fungible product, stored in the package and a back surface... Agent: Nutter Mcclennen & Fish LLP

20100171952 - Two-dimensional fourier transform spectrometer: The present invention relates to a system and methods for acquiring two-dimensional Fourier transform (2D FT) spectra. Overlap of a collinear pulse pair and probe induce a molecular response which is collected by spectral dispersion of the signal modulated probe beam. Simultaneous collection of the molecular response, pulse timing and... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20100171953 - Spectrometer assembly: The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement... Agent: Thorpe North & Western, LLP.

20100171954 - Method and apparatus for analysis and sorting of polynucleotides based on size: The invention relates to a microfabricated device and methods of using the device for analyzing and sorting polynucleotide molecules by size.... Agent: Townsend And Townsend And Crew, LLP

20100171955 - Displacement sensor: This invention provides a displacement measurement device, a displacement measurement method, and a thickness measurement device capable of easily ensuring a conjugate relationship between the light source and the diaphragm and capable of accurately measuring the change in distance with the testing target. In the displacement measurement device, the light... Agent: Foley And Lardner LLP Suite 500

20100171956 - Alignment free single-ended optical probe and methods for spectroscopic measurements in a gas turbine engine: A method of measuring the combustion property in a measurement volume within a casing defined in part by a casing wall. The method includes providing a port in the chamber wall. Also provided is a fiber assembly comprising a single mode transmit core surrounded by a multimode receive core means.... Agent: Swanson & Bratschun, L.L.C.

20100171957 - Light reflector: The invention provides a light reflector comprising a light reflecting surface, which reflector comprises a layer of a porous inorganic material having a thickness in the range of from 0.1 to 100 mm, which inorganic material has a pore volume in the range of 2 to 80% and an average... Agent: Lucas & Mercanti, LLP

20100171958 - Localized plasmon resonance sensing device and system thereof: The present invention discloses a LPR sensing device and a LPR sensing system comprising a LPR sensing device, a light source, a detecting unit and a processing unit. The LPR sensing device comprises a sensing substrate and a noble metal nanoparticle layer, and the noble metal nanoparticle layer is disposed... Agent: Hudak, Shunk & Farine, Co., L.p.a.

20100171959 - Method and apparatus for using multiple relative reflectance measurements to determine properties of a sample using vacuum ultra violet wavelengths: A method and apparatus is disclosed for measuring properties of an unknown sample. A reflectometer and one or more reference pieces is provided. A set of data is collected from the unknown sample and a combination of the reference pieces. A combination of the sample and reference piece data independent... Agent: D. Kligler I.p. Services Ltd

20100171960 - For path imbalance measurement of the two arms fiber optic interferometer: Path imbalance measurement of the two arms fiber optic interferometer includes employing a current carrier signal to modulate the semiconductor laser light source of the interferometer to let it output interference signals to generate a carrier phase signal through path imbalance of the interferometer. Then, the interference signals are expanded... Agent: J C Patents

20100171961 - Method for the contactless measurement of three-dimensional objects with two layers by single-view backlit shadowgraphy: To measure a hollow three-dimensional object without contact, this object being translucent or transparent vis-á-vis a visible light, an image of the object is acquired by single-view backlit shadowgraphy, along a viewing axis, by observing this object with visible light, this image comprising at least one luminous line, an equation... Agent: Nixon Peabody LLP

20100171962 - System and method for probe mark analysis: A method for analyzing probe mark, the method includes: scanning the probe mark by multiple spots; evaluating a probe mark characteristic in response to detection signals generated by multiple sensors of the chromatic confocal system that is characterized by a sub-micron axial resolution.... Agent: Reches Patents

20100171963 - Apparatus for measurement of three-dimensional shape: A 3D shape measuring apparatus is disclosed, which is capable of simultaneously obtaining interference fringes of the lowest point and the highest point, by comprising a reflection path controller that generates a reference plane reflection path equal to a reflection path from a lowest point, and a reference plane reflection... Agent: Jae Y. Park

20100171964 - Method and apparatus to provide corrections for a radiation-therapy beam: Information is provided regarding a block's sectional contour in a particular plane as corresponds to a radiation-therapy beam. For a point at which block effects are to be assessed, a point is projected onto a plane of the block and a plurality of straight lines is then formed. Each line... Agent: Fitch Even Tabin And Flannery Varian Medical Systems

20100171965 - Method for measuring the thickness or curvature of thin films: A method and means for determining the thickness, or curvature, of a thin film or stack of thin films disposed on the surface of a substrate having a curvature comprising generating a beam of radiation, focusing the beam through the one or more films onto a surface of the substrate,... Agent: Goodwin Procter LLP Patent Administrator

20100171966 - Alignment apparatus for semiconductor wafer: An alignment apparatus of this invention includes a holding stage that is larger in size than a semiconductor wafer, and an optical sensor that optically detects a position of a peripheral edge of the semiconductor wafer placed on and suction-held by the holding stage. The holding stage has a slits... Agent: Cheng Law Group, PLLC

20100165320 - Method for mounting and adjusting an electro-optical device and measuring device mounted and adjusted by means of such a method: The invention relates to a method for mounting and alignment of an electro-optical apparatus, in which an optic (42) is oriented in three axes (X;Y;Z) relative to a further component (26, 46), in particular a method for alignment of a receiving optic (42) relative to an optical receiver (46). The... Agent: Michael J. Striker

20100165321 - Position measuring device and position measuring method in semiconductor single crystal manufacturing device: While position measurement of an edge position of a thermal shield takes place in a short time with high working efficiency, the edge position can be measured accurately without variation. First determination takes place while a distance is measured with a first scanning interval. When a change in a measured... Agent: Kratz, Quintos & Hanson, LLP

20100165322 - Camera-style lidar setup: i

20100165323 - Adaptive angle and power adaptation in 3d-micro-mirror lidar: A device for recording a geometry of an environment of a device in a detection field with the aid of laser scanning may include a laser beam controlled by an oscillating micromechanical mirror. The detection field is specifiable in the vertical and horizontal directions by adapting an amplitude of oscillation... Agent: Kenyon & Kenyon LLP

20100165325 - Optical system for a particle analyzer and particle analyzer using same: A compact optical system for a particle analyzer and particle analyzer using same are provided. The optical system for a particle analyzer of the present invention comprises a light source, an irradiation optical system for irradiating particles passing through a flow cell with light from the light source, a photodetector... Agent: Brinks Hofer Gilson & Lione

20100165324 - Raman spectroscopic monitoring of hemodialysis: Spectroscopic systems and methods are disclosed for determining levels of at least one analyte in blood undergoing hemodialysis. In one aspect, the invention employs Raman spectroscopy to monitor and/or control hemodialysis. In one embodiment, the system uses a laser light directed to circulating blood from a patient undergoing dialysis to... Agent: Patton Boggs LLP

20100165326 - Method and apparatus for detecting microscope slide coverslips: A method and apparatus of the present invention determines whether zero, one, or a plurality of microscope slide coverslips are about to be applied to a microscope slide. Light, such as ultraviolet light, may be directed toward a coverslip testing region, in which a number of coverslips reside. The amount... Agent: Abbott Molecular Inc. William E. Murray

20100165328 - Apparatus and method for measuring chromatic dispersion: Highly accurate measurement of chromatic dispersions of a device under test that is an optical component is enabled with a simple structure comprising: propagating pump light having a wavelength λpump and probe light having a wavelength λprobe through the device; calculating the generation efficiency of the idler light with respect... Agent: Mcdermott Will & Emery LLP

20100165327 - Measuring brillouin backscatter from an optical fibre using channelisation: A method for measuring Brillouin backscattering comprises obtaining a signal representative of backscattered Brillouin light received from a deployed optical fibre, and dividing the signal into a plurality of signal components each having a different frequency hand. Each signal component is delivered to one of a plurality of parallel detection... Agent: Schlumberger Reservoir Completions

20100165329 - Lens-testing apparatus and lens-testing method having a plurality of combinations of object distances: One embodiment of the invention provides a lens-testing apparatus being used for testing a lens device. The lens-testing apparatus comprises a light module, at least one first and second image sensors, and at least one image sensor module. The light module generates a patterned light beam passing the lens device.... Agent: Muncy, Geissler, Olds & Lowe, PLLC

20100165330 - Method for machining and estimating an optical lens designed as a smei-finished product: The invention relates to a method for machining and estimating an optical lens which is designed as a semi-finished product, with a pre-finished form of a first side and a second side to be machined, in which a pre-specified form of a surface of the second side to be machined... Agent: Hudak, Shunk & Farine, Co., L.p.a.

20100165331 - Method for obtaining incident angle: A method for obtaining an incident angle θi is provided. The method is used in a panel having at least one icon, wherein the at least one icon has a plurality of protrusions, and a light-emitting source is disposed under the at least one icon. The method includes steps of... Agent: Alston & Bird LLP

20100165332 - Method and apparatus for vehicle service system optical target assembly: A method and apparatus for determining the alignment of a vehicle wheel using an optical target attached to the vehicle wheel, the optical target having a dimensionally stable shape and a plurality of target elements arranged in a known geometric and spatial configuration relative to each other. A two-dimensional image... Agent: Polster, Lieder, Woodruff & Lucchesi, L.c.

20100165333 - Laminated film defect inspection method and laminated film defect inspection device: A first inspection process of inspecting presence of a defect on a front surface of a film body with a protective film separated therefrom; a separator removing process of separating a separator from the inspected laminated film; a second inspection process of inspecting presence of the defect in the film... Agent: Cheng Law Group, PLLC

20100165336 - Applications of laser-processed substrate for molecular diagnostics: Surface enhanced Raman Scattering (SERS) and related modalities offer greatly enhanced sensitivity and selectivity for detection of molecular species through the excitation of plasmon modes and their coupling to molecular vibrational modes. One of the chief obstacles to widespread application is the availability of suitable nanostructured materials that exhibit strong... Agent: Pandiscio & Pandiscio, P.C.

20100165334 - Spectroscopic device and raman spectroscopic system: A Raman spectroscopic device includes an optical resonator, in which a first reflecting body that exhibits semi transmissivity/semi reflectivity and has a surface which is a light scattering surface that generates Raman scattering, a transparent body, and a second reflecting body that exhibits reflectivity, are laminated in sequence one on... Agent: Sughrue Mion, PLLC

20100165335 - Systems and methods for receiving and/or analyzing information associated with electro-magnetic radiation: According to an exemplary embodiment, a system can be provided which can have at least one fiber arrangement and at least one receiving arrangement. The fiber arrangement may have optical transmitting characteristics, and may be configured to transmit there through at least one electromagnetic radiation and forward the at least... Agent: Dorsey & Whitney LLP Intellectual Property Department

20100165337 - Customizable spectral profiles for filtering: Computer program products comprising tangible computer-readable media having instructions that are executable by a computer to generate a customized spectral profile, which can be used to generate a corresponding filter. The instructions can comprise: generating a trial source spectrum; determining an uncorrected lamp source spectrum; calculating one or more optical... Agent: Fulbright & Jaworski L.L.P.

20100165338 - Time-resolved spectroscopy system and methods for multiple-species analysis in fluorescence and cavity-ringdown applications: A time-resolved spectroscopy system employing a time-division multiplexing optical device with no dispersive optical elements to perform lifetime and concentration measurements in multi-species samples, is disclosed. Some examples include fluorescence and cavity ring-down spectroscopy. The system is unique in its compactness and simplicity of operation. In one embodiment, the system... Agent: Ricardo Claps

20100165339 - Spatially selective fixed-optics multicolor fluorescence detection system for a multichannel microfluidic device, and method for detection: A fixed-optics system for detecting fluorescence light emitted from one or more spatially selected volumes (S), e.g., in one or more microfluidic channels, comprises a detection optical fiber (60) corresponding to each selected volume and a ball lens (110) adjacent to one end of each optical fiber, wherein the ball... Agent: Birch, Stewart, Kolasch & Birch, LLP

20100165340 - Spectroscopic scatterometer system: Before the diffraction from a diffracting structure on a semiconductor wafer is measured, where necessary, the film thickness and index of refraction of the films underneath the structure are first measured using spectroscopic reflectometry or spectroscopic ellipsometry. A rigorous model is then used to calculate intensity or ellipsometric signatures of... Agent: Davis Wright Tremaine LLP - San Francisco

20100165341 - Compact detector for simultaneous particle size and fluorescence detection: A particle detection and classification system is disclosed. The system determines the size of measured particles by measuring light scattered by the particles. The system simultaneously determines whether measured particles are biological or non-biological by measuring fluorescent light from the particles. The system uses a parabolic reflector, and optionally, a... Agent: Quarles & Brady LLP

20100165342 - Optical measurement apparatus and electrode pair thereof: p

20100165343 - Register mark dtection apparatus: A register mark detecting apparatus detects a transparent register mark printed on a conveyed transparent web. The register mark detecting apparatus includes a light source, a parallel light flux irradiation optical system, a collective optical system, a knife-edge, and a light receiving element. The parallel light flux irradiation optical system... Agent: Ladas & Parry

20100165344 - Web measurement: One measuring part of a traversing measuring unit measures at least one characteristic of a web with a first radiation type from a plurality of measuring locations during a traversing movement at successive moments in time. At least two measuring parts of an array measuring unit measure at least one... Agent: Oliff & Berridge, PLC

20100165345 - Microelectronic sensor device with a modulated light source: The invention relates to a microelectronic sensor device and a method for making optical examinations at a carrier (11), e.g. for the detection of magnetic particles (1) at a contact surface (12) of the carrier (11) by frustrated total internal reflection (FTIR). A light source (21), particularly a laser light... Agent: Philips Intellectual Property & Standards

20100165346 - Apparatus for detecting a sample: An apparatus for effectively detecting and calibrating a sample of examination system. The apparatus has an optics-electricity assembly for detecting the sample by a light and an elastically supporting assembly for providing motion freedoms to adjust the relative geometric conditions between the optics-electricity assembly and the sample. The elastically supporting... Agent: Rosenberg, Klein & Lee

20100165347 - Method and apparatus for detecting colored foreign particles in quartz powder material: Colored foreign particles contained in quartz powder material are detected in a high precision with the specified detection apparatus even when the colored foreign particles are pale colored foreign particles such as iron-based refuse, organic refuse and carbon-based refuse.... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20100165348 - Reconstruction of nonlinear wave propagation: Disclosed are systems and methods for characterizing a nonlinear propagation environment by numerically propagating a measured output waveform resulting from a known input waveform. The numerical propagation reconstructs the input waveform, and in the process, the nonlinear environment is characterized. In certain embodiments, knowledge of the characterized nonlinear environment facilitates... Agent: Knobbe Martens Olson & Bear LLP

20100165349 - Systems and methods for monitoring angle random walk: A gyroscope for determining an angular rate output. The gyroscope includes a first demodulator configured to demodulate an angular rate measurement at a first bias modulation frequency to determine the angular rate signal and a second demodulator configured to demodulate the angular rate measurement at a second bias modulation frequency... Agent: Honeywell/fogg Patent Services

20100165350 - Differential birefringent fiber frequency-modulated continuous-wave sagnac gyroscope: Disclosed is a differential birefringent fiber frequency-modulated continuous-wave (FMCW) Sagnac gyroscope for measuring rotation velocity. The gyroscope uses a 90°-twisted single-mode birefringent fiber coil as a double unbalanced fiber-optic FMCW Sagnac interferometer, and uses the phase difference between the two beat signals from the fiber coil to determine the rotation... Agent: Jesse Zheng

20100165352 - Adiabatic tapered composite waveguide for athermalization: A planar waveguide circuit includes a silica-based planar optical waveguide circuit having a lower cladding, a core and an upper cladding. At least one input waveguide and one output waveguide are each coupled to the optical waveguide circuit. At least one tapered waveguide section is located in the waveguide circuit,... Agent: Mayer & Williams PC

20100165351 - Silicon photonic waveguide biosensor configurations: Methods and devices relating to sensors and sensor blocks for use in detecting and monitoring molecular interactions. A silicon waveguide sensing element is provided along with a layer of silicon. A silicon oxide layer is also provided between the waveguide element and the layer of silicon. The sensing element is... Agent: Brion Raffoul

20100165353 - Arterial probe for oct: An apparatus for detecting vulnerable plaque within a lumen defined by an intraluminal wall is described. The apparatus includes a probe having a distal portion and a proximal portion. The apparatus includes an optical waveguide extending along the probe. The optical waveguide is configured to carry optical radiation between the... Agent: Rothwell, Figg, Ernst & Manbeck, P.C.

20100165354 - Method of measuring topology of functional liquid droplet in pixel, topology measuring apparatus of functional liquid in pixel, liquid ejection apparatus, method of manufacturing electro-optical apparatus, electro-optical apparatus, and electronic apparat: A method of measuring topology of functional liquid in a pixel, in which thickness or volume of the functional liquid in the pixel is measured by a surface topology measuring apparatus comprising: measuring surface topologies in which surface topology of the functional liquid in the pixel and surface topology of... Agent: Harness, Dickey & Pierce, P.L.C

20100165355 - Refractive index distribution measurement method and refractive index distribution measurement apparatus: A refractive index distribution measurement method includes the steps of measuring a first transmission wavefront of a test object by introducing reference light to the test object immersed in a first medium having a first refractive index lower than that of the test object by 0.01 or more, measuring a... Agent: Rossi, Kimms & Mcdowell LLP.

20100165356 - Semiconductor optical element: A semiconductor optical element has an active layer including quantum dots. The density of quantum dots in the resonator direction in a portion of the active layer in which the density of photons is relatively high is increased relative to the density of quantum dots in a portion of the... Agent: Leydig Voit & Mayer, Ltd

20100165357 - Method and apparatus for imaging three-dimensional structure: An apparatus for determining surface topology of a portion of a three-dimensional structure is provided, that includes a probing member, an illumination unit, a light focusing optics, a translation mechanism, a detector and a processor.... Agent: The Nath Law Group

20100165358 - Method and apparatus for imaging three-dimensional structure: An apparatus for determining surface topology of a portion of a three-dimensional structure is provided, that includes a probing member, an illumination unit, a light focusing optics, a translation mechanism, a detector and a processor.... Agent: The Nath Law Group

20100165359 - Optical encoder: An optical encoder includes a scale, and a detecting head which is disposed facing the scale. The scale is provided with a grating which has a predetermined optical pattern with respect to a direction of relative movement, and the detecting head is provided with a light emitting section which irradiates... Agent: Scully Scott Murphy & Presser, PC

20100165360 - System for testing distortion of liquid crystal display device: A system for testing a distortion of a liquid crystal display (LCD) device can test the LCD device within a chamber in a state of being assembled perpendicular to the ground, whereby whether any distortion occurs in an internal component can be fast detected even in severe conditions of high... Agent: Brinks Hofer Gilson & Lione