Optics: measuring and testing inventions 02/09

20090051896 - Optical air data systems and methods: Systems and methods for sensing air outside a moving aircraft are presented. In one embodiment, a system includes a laser for generating laser energy. The system also includes one or more transceivers for projecting the laser energy as laser radiation to the air. Subsequently, each transceiver receives laser energy as... Agent: Lathrop & Gage Lc

20090051897 - Method and apparatus for identifying and characterizing objects based on fluorescence: A method and apparatus for characterizing objects. The method includes the steps of illuminating the object with incident red light having at least some wavelengths between 620 nms and 650 nms and detecting red light fluorescence from said object having a wavelength greater than visible wavelengths greater than that of... Agent: Vidas, Arrett & Steinkraus, P.A.

20090051899 - Doppler asymmetric spatial heterodyne spectroscopy: A Doppler Asymmetric Spatial Heterodyne (DASH) spectrometer includes an input aperture for receiving an input light; a collimating lens for collimating the input light into a collimated light; offset establishing means, including at least one grating, for i) receiving and splitting the collimated light into a first light wavefront in... Agent: Naval Research Laboratory Associate Counsel (patents)

20090051898 - Non-invasive probe for measuring body components and a non-invasive body component measurement system including the non-invasive probe: A non-invasive probe for measuring body components, and a non-invasive body component measurement system including the non-invasive probe is provided. The non-invasive probe includes an input light transferring unit for transferring an input light emitted from a light source; a light splitting unit for splitting the input light into a... Agent: Sughrue Mion, PLLC

20090051900 - Apparatus and method for detecting particulates in water: Provided is an apparatus and method for determining a concentration of particulates in water, comprising irradiating a laser beam to a sample for a water quality analysis, and measuring a sound generated upon decomposition of particulates in the sample by the irradiated laser beam to thereby determine a concentration of... Agent: Hyun Jong Park Tuchman & Park LLC

20090051901 - Integrated microfluidic optical device for sub-micro liter liquid sample microspectroscopy: The present disclosure relates to the fields of microchips with microfluidic optical chambers for multiplexed optical spectroscopy. Embodiments of the present invention allow for ultra small sample volume, as well as high detection speed and throughput, as compared to conventional optical sample cuvettes used in optical spectroscopy. Particular embodiments relate... Agent: Bozicevic, Field & Francis LLP

20090051903 - Lens replacing method and manufacturing method for alternative lens: A method for replacing a lens having refractive power in a first projection optical system includes measuring a wavefront of measuring light passing through the first projection optical system in a state in which the lens having refractive power or a master lens is mounted in the first projection optical... Agent: Canon U.s.a. Inc. Intellectual Property Division

20090051902 - Systems and methods for characterizing laser beam quality: A measure of the quality of a laser beam is obtained by comparing the power of a theoretical Gaussian beam through a (certain sized area) pinhole to the power of a test beam through a same sized (area) pinhole. The theoretical surrogate Gaussian beam with the same second moment of... Agent: Macpherson Kwok Chen & Heid, LLP

20090051904 - Apparatus for measuring decenter error of a lens: A lens decenter error measuring apparatus including a testing device, a lens supporter, and a lens carrier is disclosed. The testing device is configured for measuring a decenter error of a lens. The lens supporter is configured for receiving the lens. The lens carrier is installed within the lens supporter... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20090051906 - Optical tracking device employing a three-axis gimbal: An optical tracking device, includes an azimuth sub-assembly providing a 360-degree range of motion and a transducer sensing the azimuth position within this range of motion; and an elevation sub-assembly coupled to the azimuth sub-assembly and providing at least a −30-degree to +100-degree range of motion and a transducer sensing... Agent: Renner Kenner Greive Bobak Taylor & Weber

20090051905 - Optical inclination sensor: An optical inclination sensor is provided having at least one reflective surface and at least two separate optical fibers having ends spaced from a reflective surface. As the reflective surface tilts with respect to a pre-determined reference position the gap lengths between the fiber ends and the reflective surface change... Agent: The H.t. Than Law Group

20090051907 - Method for measuring brightness uniformity of a panel: A method for measuring brightness uniformity of a panel is disclosed. The method includes steps of: dividing the panel into a plurality of areas, measuring brightness of each area, calculating each area of an average value K the brightness differences between the area and the other adjacent areas, and comparing... Agent: Kirton And Mcconkie

20090051908 - Surface particle counter: A surface particle-counting device where the scanner element and the particle counting element have been combined so to reduce the number of lost particles and increase the overall efficiency of the particle-counting device. By removing the conventional tube that connects the scanner element and the particle counting element accuracy is... Agent: Greenberg & Lieberman, LLC

20090051909 - Method of detecting porous material defect: A method of detecting a defect in a porous body (1) includes applying a light beam (13) to fine particles (12) discharged from the porous body (1), and detecting the light and shade of scattered light caused by the fine particles (12) to detect the position of a defect, wherein... Agent: Oliff & Berridge, PLC

20090051910 - Calibration reference light source and calibration system using the same: In a calibration reference light source and a sensitivity calibration system using the same, a plurality of single-wavelength light sources for emitting reference lights having mutually different single-wavelengths are used instead of a black body radiation source for radiating a white light, and not only the intensities of the single-wavelength... Agent: Brinks Hofer Gilson & Lione

20090051911 - Sample traveling stage with flexure mechanism module to absorb the deformation of the slide: A sample traveling stage is used for inspection equipment or precision processing equipment for semiconductors or FPDs, (Flat Panel Displays). The sample traveling stage includes a moving part in which a first slide, which is mounted on a base frame and moves along a first guide block, and a second... Agent: Kenyon & Kenyon LLP

20090051912 - Modular microfluidic flow cytometer and method applications: An embodiment of the invention is directed to a portable, modular, microscope mounted, microfluidic flow cytometry system. The system includes a microscope platform having an optical input/output port, imaging optics, and a sample stage; a sample illumination source module that is removably integrated with the optical input/output port; an optics... Agent: Bond, Schoeneck & King, PLLC

20090051913 - Sensor device: A sensor device for detecting a substance contained in a fluid comprises first and second photonic crystal regions, first and second flow channels, an optical waveguide connected to the first and second photonic crystal regions and an optical detector for detecting the lights transmitted through the first photonic crystal region... Agent: Fitzpatrick Cella Harper & Scinto

20090051914 - Method and system for inspecting indirect bandgap semiconductor structure: Methods (600) and systems (100) for inspecting an indirect bandgap semiconductor structure (140) are described. A light source (110) generates light (612) suitable for inducing photoluminescence in the indirect bandgap semiconductor structure (140). A short-pass filter unit (114) reduces long-wavelength light of the generated light above a specified emission peak.... Agent: Fish & Richardson P.C.

20090051915 - Arrangement for monitoring thermal spray processes: An arrangement for measuring characteristic properties of a plasma beam in a thermal spray process, including a device for introducing spray materials into the plasma, a one-dimensional or two-dimensional array including first optical waveguides for receiving the light radiation emitted by the plasma, and other optical waveguides for distributing the... Agent: Davidson, Davidson & Kappel, LLC

20090051916 - Measuring apparatus, measuring method, and characteristic measurement unit: A measuring apparatus includes a light intensity information acquisition section 40 that acquires light intensity information relating to a measurement light containing a given band component, the measurement light having been modulated by optical elements included in an optical system 10 and a measurement target (or a sample 100), and... Agent: Reed Smith LLP

20090051917 - Apparatus and methods for determining overlay of structures having rotational or mirror symmetry: Disclosed are overlay targets having flexible symmetry characteristics and metrology techniques for measuring the overlay error between two or more successive layers of such targets. In one embodiment, a target includes structures for measuring overlay error (or a shift) in both the x and y direction, wherein the x structures... Agent: Weaver Austin Villeneuve Sampson LLP - Kla Tencor Kla Tencor

20090051918 - Optical sampling apparatus: Provided is an optical sampling apparatus that samples light to be measured having a pulse waveform, including a sampling light output section that outputs a first sampling light and a second sampling light, both having pulse waveforms of a spectrum different from that of the light to be measured; a... Agent: Jianq Chyun Intellectual Property Office

20090051919 - Method and apparatus for testing a test object: A method of testing a test object, comprising the steps of arranging the test object at a deformable contact element of a holding device, wherein the contact element is at least partially deformed so that at least a partial area of the test object is in gap-free contact with at... Agent: Occhiuti Rohlicek & Tsao, LLP

20090051920 - Plasmon tomography: Plasmon energy is produced by exciting a plasmon resonance at least one excitation position on a first surface of a first material, and the plasmon energy is detected at at least one measurement position on the first surface after the plasmon energy has propagated from the at least one excitation... Agent: Searete LLC Clarence T. Tegreene

20090051921 - Optical sensor: An optical sensor includes an optical detector for detecting light reflected from an object to be sensed, an optical source for producing light for illuminating the object to be sensed, and a reflection unit for reflecting the light reflected from the object to be sensed toward the optical detector, the... Agent: Cha & Reiter, LLC

20090051922 - Semiconductor ring laser gyro: A semiconductor ring laser gyro comprises: a semiconductor laser for emitting light from each of both ends thereof; a splitting means for splitting and guiding the light emitted from the semiconductor laser into two axis directions; a plurality of reflecting means for reflecting the light split and guided by the... Agent: Brinks Hofer Gilson & Lione

20090051923 - Arterial probe for oct: An apparatus and associated method for detecting vulnerable plaque within a lumen defined by an intraluminal wall is described. The apparatus includes a probe having a distal portion and a proximal portion. The apparatus includes an optical waveguide extending along the probe. The optical waveguide is configured to carry optical... Agent: Fish & Richardson PC

20090051924 - Apparatus for measuring thickness of a substrate: An apparatus for measuring thickness is provided. A light source irradiates a front surface or a rear surface of a substrate with a light. A splitter splits the light into a reference light and a measurement light. The reference light is reflected by a reference light reflecting device. An optical... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20090051925 - Determination of interferometric modulator mirror curvature and airgap variation using digital photographs: Air gap variation in an interferometric modulator over a two-dimensional spatial map of the modulator is determined by acquiring a digital photograph of the modulator. Color parameters of individual pixels in the photograph are determined and compared to a model of color parameters as a function of air gap distance.... Agent: Knobbe, Martens, Olson & Bear, LLP

20090051926 - Multiple frequency optical mixer and demultiplexer and apparatus for remote sensing: A pulsed laser system includes a modulator module configured to provide pulsed electrical signals and a plurality of solid-state seed sources coupled to the modulator module and configured to operate, responsive to the pulsed electrical signals, in a pulse mode. Each of the plurality of solid-state seed sources is tuned... Agent: Nasa Goddard Space Flight Center

20090051928 - Method for analyzing a wavefront through frequency difference multilateral interferometry: The method comprises positioning a diffraction grating with a two-dimensional meshing on the path of the beam to be analyzed and processing at least two interferograms of at least two different colors, each interferogram being obtained in a plane from two sub-beams with different diffraction orders. The invention can be... Agent: Laubscher & Laubscher, P.C.

20090051927 - Optical scattering disk, use thereof, and wavefront measuring apparatus: Optical scattering disk, use and wavefront measuring apparatus. The optical scattering disk includes a transparent substrate (1) and a light scattering layer (2) adjoining a surface of the substrate and having light-scattering-active particles (3). The light scattering layer has an embedding medium (4) which is optically denser than air and... Agent: Sughrue Mion, PLLC

20090051929 - Three-dimensional image measuring apparatus: The present invention relates to a three-dimensional image measuring apparatus comprising: an XYZ shaft transfer means mounted onto a base member; a work stage mounted to the base member, for moving a measuring object to a measuring position and thereafter supporting it and having a predetermined reference surface set at... Agent: Lahive & Cockfield, LLP Floor 30, Suite 3000

20090051930 - Method for detecting surface defects on a substrate and device using said method: A method for detecting surface defects, such as slip line type defects, on a substrate designed to be used in electronics, optoelectronics or analogue, including projection of a pattern of light fringes and dark bands onto the substrate, relative displacement of the substrate relative to the pattern, acquisition of a... Agent: Adeli & Tollen, LLP

20090051931 - Systems and methods for measuring sample surface flatness of continuously moving samples: Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non-zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating changes with the horizontal translation of the sample. A... Agent: King & Spalding LLP

20090051932 - Method for determining the position of a measurement objective in the z-coordinate direction of an optical measuring machine having maximum reproducibility of measured structure widths: A method for determining the ideal focus position on different substrates is disclosed. A focus criterion is determined with which the best reproducibility may be achieved. An offset permits the user to set the optimal operating point of the coordinate measuring machine for a reproducible measurement of dimensions of structures... Agent: Houston Eliseeva

20090051933 - Tool detection: An object detection apparatus and a method for calibrating an object detection apparatus. The apparatus comprises a housing provided with a light source and a light detector. The light source directs a beam of light towards the light detector. The housing has a base which is provided with a datum... Agent: Oliff & Berridge, PLC

20090051934 - Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus: The invention provides a method for determining vibration-related information by projecting an aerial image at an image position in a projection plane, mapping an intensity of the aerial image into an image map, the image map arranged for comprising values of coordinates of sampling locations and of the intensity sampled... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20090051935 - Automatic geometric calibration using laser scanning reflectometry: Systems and methods for calibrating a solid-imaging system (10) are disclosed. A calibration plate (110) having a non-scattering surface (140) with a plurality (150) of light-scattering fiducial marks (156) in a periodic array is disposed in the solid-imaging system. The actinic laser beam (26) is scanned over the fiducial marks,... Agent: 3d Systems, Inc. Attn: Keith A. Roberson

20090051936 - Method for measuring positions of structures on a substrate with a coordinate measuring machine: A method for measuring structures (3) on a substrate (2) with a coordinate measuring machine (1) is disclosed. A predefined measuring method is used for measuring at least one structure (3) on the substrate (2), wherein the measuring includes the position and/or the width of the structure (3). The predefined... Agent: Houston Eliseeva

20090051937 - Device and method for measuring profiles of electron beam and laser beam: A device for measuring profiles of an electron beam and a laser beam is provided with a profile measuring device 30 for measuring cross-section profiles of the beams in the vicinity of a collision position where an electron beam 1 and a laser beam 3 are brought into frontal collision,... Agent: Griffin & Szipl, PC

20090051938 - Multi-beam optical probe and system for dimensional measurement: A multi-beam optical probe according to illustrative embodiments of the present invention generally reduce the limitations, difficulties and disadvantages of the conventional measurement devices and techniques by providing a non-contact multi-beam optical probe apparatus and system for the dimensional measurement of objects. The narrow elongated probe provides at least two... Agent: Muirhead And Saturnelli, LLC

20090051939 - Substrate film thickness measurement method, substrate film thickness measurement apparatus and substrate processing apparatus: A jet of water in a cylindrical form is supplied from a jet nozzle onto a measurement surface of a substrate to form a column of the water extending between the nozzle and the measurement surface. Light is emitted from an irradiation fiber and transmitted through the column of water... Agent: Wenderoth, Lind & Ponack, L.L.P.

20090046269 - Light beam receiver: A light beam receiver includes a plurality of light beam detector elements, a plurality of integrator circuits that receive signals from the light beam detector elements, and a signal integral limiting integration time controller that is in communication with at least two of the integrator circuits so that an analysis... Agent: Frederick H. Gribbell

20090046270 - Range measurement device: A range measurement device is disclosed. The device comprises a flash laser radar configured to produce a first laser pulse at a first time. The device receives, at a second time, reflections of the first laser pulse from at least one object within a 360 degree field of view. The... Agent: Honeywell International Inc.

20090046272 - Surveying instrument: To provide a surveying instrument for measuring difference in required time of light or distance to an object to be measured while covering a wide dynamic range without adjusting light amount. A light pulse emanating from a light emitting section 1 is divided into a reference light cast to a... Agent: Foley And Lardner LLP Suite 500

20090046271 - Fiber optically coupled, multiplexed, and chopped laser rangefinder: A CW phase-delay distance measuring device is described. The device fiber-optically couples an amplitude modulated laser and a detector though MEMS fiber optic switches to provide chopping and multiplexing capability, and to allow measurement of transmit and receive coupling. Phase continuous direct digital synthesizers are used to generate transmit and... Agent: James Remenick Novak Druce & Quigg, LLP

20090046273 - Systems and methods for monitoring and controlling the operation of extreme ultraviolet (euv) light sources used in semiconductor fabrication: Systems and methods for monitoring and controlling the operation of extreme ultraviolet (EUV) sources used in semiconductor fabrication are disclosed. A method comprises providing a semiconductor fabrication apparatus having a light source that emits in-band and out-of-band radiation, taking a first out-of-band radiation measurement, taking a second out-of-band radiation measurement,... Agent: Fulbright & Jaworski L.L.P.

20090046274 - Light scattering methods and systems using supercritical fluid solvents to measure polymer molecular weight and molecular weight distribution: Light scattering processes are employed to measure molecular weight and related characteristics of polymeric materials, including without limitation refractory fluoropolymers. The processes utilize a pressurized cell and a fluid under pressure to solubilize the polymeric materials and to enable light scattering measurements to be performed.... Agent: Whitham, Curtis & Christofferson & Cook, P.C.

20090046275 - Method and system for estimating surface plasmon resonance shift: A surface plasmon measurement instrument measures a change in a property (e.g., refractive index) of a material layer. The method includes providing a prism with a rear surface having a metal layer disposed thereon; providing the material layer on the metal layer on the rear surface of the prism; directing... Agent: Agilent Technologies Inc.

20090046276 - System and method for determination of the reflection wavelength of multiple low-reflectivity bragg gratings in a sensing optical fiber: A system and method for determining a reflection wavelength of multiple Bragg gratings in a sensing optical fiber comprise: (1) a source laser; (2) an optical detector configured to detect a reflected signal from the sensing optical fiber; (3) a plurality of frequency generators configured to generate a signal having... Agent: National Aeronautics And Space Administration Langley Research Center

20090046277 - Refractometer: Certain embodiments of the present invention provide a refractometer including: a housing having an immersion portion, the immersion portion having an opening; a light source for emitting a light; a light sensor for converting a received light into an electrical signal; a prism including faces, including: a first face proximal... Agent: Mcandrews Held & Malloy, Ltd

20090046278 - Real time telecentricity measurement: Systems and methods are provided for measuring and correcting for a given telecentricity in lithographic apparatus. A radiation beam is partitioned into a plurality of beams, each of which is modulated using an array of individually controllable elements and projected onto a portion of a substrate through a projection system.... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20090046279 - Method for the determination of the axle geometry of a vehicle: The invention relates to a method for determining the axle geometry of a vehicle, wherein light of a given structure is projected onto a vehicle wheel, and the diffusely reflected light can be analyzed in order to determine the orientation of the plane of the vehicle wheel. Several lines of... Agent: Collard & Roe, P.C.

20090046280 - Mask defect inspection data generating method, mask defect inspection method and mask production method: According to a mask defect inspection data generating method, a distance between inspection areas neighboring in a predetermined direction is calculated based on inspection area control information defined in photomask inspection data. It is determined whether or not the calculated distance between inspection areas is less than a predetermined distance.... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20090046281 - Method and system for automated inspection system characterization and monitoring: A method and system characterizing and monitoring an automated inspection system are provided. A method for automatically characterizing an automatic inspection system for photomasks may include removing portions of an optical attenuator layer disposed on a substrate in order to expose portions of the substrate and create a plurality of... Agent: Baker Botts L.L.P. Patent Department

20090046282 - Flowthrough cell of the flowing spectrophotomatic analysis: In the invention, the transparent tube is used as the fluid pathway of the flowthrough cell, which not only makes sure the fluid can retain the stable laminar state and no micro-bubble existing, but also can avoid the turbulent and the micro-bubble producing the negative peak and the interference peak.... Agent: The Webb Law Firm, P.C.

20090046283 - Metalized semiconductor substrates for raman spectroscopy: In one aspect, the present invention generally provides methods for fabricating substrates for use in a variety of analytical and/or diagnostic applications. Such a substrate can be generated by exposing a semiconductor surface (e.g., silicon surface) to a plurality of short laser pulses to generate micron-sized, and preferably submicron-sized, structures... Agent: Nutter Mcclennen & Fish LLP

20090046284 - Systems and methods for food safety detection: A method for detecting an ingredient in a food product includes establishing a spectral signature in a Raman spectrum obtained from a chemical substance; allowing a food sample solution obtained from a food product to come to contact with a first nano-scale surface structure in a first sensor, wherein the... Agent: Xin Wen

20090046285 - Structure for diagnosis system of reaction process: The present invention relates to a spectroscopy analyzer for real-time diagnostics of process, and more particularly, to a spectroscopy analyzer for real-time diagnostics of process, in which a beam is injected to a reaction byproduct or a reactant and then an output beam is measured, thereby performing quantitative and qualitative... Agent: Clark & Brody

20090046286 - Cancer detection by optical analysis of body fluids: The optical analysis of body fluids is a method of determining the relative concentration of certain bio-molecules in blood and urine samples by fluorescent spectroscopy. The relative concentration of these bio-molecules serves as a marker or screening test to assess the presence and stage of cancer in some organ or... Agent: Litman Law Offices, Ltd.

20090046287 - Zero angle photo spectrophotometer for monitoring of water systems: A method and apparatus for monitoring water and other fluid systems is described. The fluid is continually monitored spectrophotometrically by measuring many optical parameters in an in-line, on-line system, which compensates for normal fluid changes while detecting abnormalities.... Agent: Glenna Hendricks Hendricks And Associates

20090046288 - Scanning spectrometer with multiple photodetectors: A scanning optical spectrometer with a detector array is disclosed, in which position of focused spot of light at the input of a dispersive element such as arrayed waveguide grating (AWG) with a slab input, is scanned using a micro-electro-mechanical (MEMS) tiltable micromirror so as to make the dispersed spectrum... Agent: Allen, Dyer, Doppelt, Milbrath & Gilchrist P.A.

20090046289 - Optical air data systems and methods: Systems and methods for sensing air includes at least one, and in some embodiments three, transceivers for projecting the laser energy as laser radiation to the air. The transceivers are scanned or aligned along several different axes. Each transceiver receives laser energy as it is backscattered from the air. A... Agent: Lathrop & Gage Lc

20090046290 - Methods and devices for evaluating print quality: A method for evaluating print quality comprising providing a first paper; providing a second paper; providing a reference print sample; providing a test print sample; obtaining pre-rub densities of the first paper and the second paper or the reference print sample and the test print sample; providing a mechanical rub... Agent: Roland Tong

20090046291 - Device for imaging an interior of a turbid medium: The invention relates to a device (1) for imaging an interior of a turbid medium (55) comprising a receptacle (20) with the receptacle (20) comprising a measurement volume (15) for receiving the turbid medium (55). The device (1) is adapted such that the device (1) further comprises a further receptacle... Agent: Philips Intellectual Property & Standards

20090046292 - Distributed measurement spots and reference spots, especially for chemosensors and biosensors: Disclosed is a sensor device comprising at least one array of sensor spots (1, 2) that are disposed on or in a common substrate or are retained by a common substrate. At least one first group of several sensor spots of the array is configured as measurement spots (1) which... Agent: Morris Manning Martin LLP

20090046293 - Optical communications using spectral interferometry: Optical communications can be performed using spectral interferometry. An incident transmission pulse or beam may be mixed with a locally generated beam or pulse to create an interference pattern that may be analyzed to extract the transmitted data. The incident transmission pulse or beam may also be split and mixed... Agent: Mintz, Levin, Cohn, Ferris, Glovsky And Popeo, P.c

20090046294 - Sagnac sensor with nested waveguides: Proposed optical device is based on counter-propagating optical fields within at least one nested waveguide-cavity loop, where the part of the waveguide loop is fold into the external waveguide loop. The nesting is performed using at least one waveguide crossing section. The invention may be used in Sagnac interferometer to... Agent: Celight, Inc.

20090046295 - Apparatus and methods for uniform sample clocking: A method and a system for Uniform Frequency Sample Clocking to directly sample the OCT signal with a temporally-non-linear sampling clock derived from a k-space wavemeter on the external sample clock input port of a digitizer.... Agent: Rosenbaum & Associates, P.C.

20090046296 - Fiber-optic heterodyne imaging vibrometer: A method and system for performing two-dimensional laser Doppler vibrometry (LDV) are disclosed. A high speed fiber optic heterodyne imaging vibrometer can be used for the imaging of high speed surface deformation and/or vibration. Images provided by the high speed fiber optic heterodyne imaging vibrometer can be representative of movement,... Agent: Macpherson Kwok Chen & Heid LLP

20090046297 - Atmosphere-density-fluctuation monitors for interferometer beams, and atmosphere-supplying systems comprising same: Systems are disclosed for providing a controlled atmosphere. In an exemplary system an atmosphere-release device delivers a flow of the atmosphere to a propagation pathway. A density-fluctuation monitor includes multiple interferometer beams propagating in a direction in the pathway. The number of beams is sufficient for determining position of a... Agent: Klarquist Sparkman, LLP

20090046298 - Optical lattice microscopy: An optical system includes a substrate adapted for supporting a sample, where the substrate has a refractive index, nsub, larger than a refractive index of the sample, nsample, a source of electromagnetic radiation having wavelength, λo, and a detector having multiple individual detector elements configured for detecting a signal resulting... Agent: Brake Hughes Bellermann LLP

20090046300 - Device for examining the optical properties of surfaces: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle, at least one first detector device for capturing the radiation emitted to and reflected back from the surface wherein... Agent: Greer, Burns & Crain

20090046299 - Nanoscale imaging via absorption modulation: An imaging system is provided. The imaging system includes a sample to be scanned by the imaging system. An absorbance modulation layer (AML) is positioned in close proximity to the sample and is physically separate from the sample. One or more sub-wavelength apertures are generated within the AML, whose size... Agent: Gauthier & Connors, LLP

20090046301 - Three-dimensional color and shape measuring device: A three-dimensional color and shape measuring device is provided to measure a color and a three-dimensional shape of an object to be measured with accuracy. A three-dimensional color and shape measuring device measures a color and a three-dimensional shape of an object to be measured based on an image signal... Agent: Baker Botts LLP C/o Intellectual Property Department

20090046302 - Positioning detecting device and electronic device using the same: A position detecting device, including: a movable section which has an axial section and moves in a direction of an axial line of the axial section; and a supporting section which supports the movable section and allows the movable section to move through the axial section; wherein the movable section... Agent: Cohen, Pontani, Lieberman & Pavane LLP

20090046303 - Parameterized optical system and method: A system for segmented parametric optimization of emissions from a light source, including a light source emitting light rays at a plurality of angles and an optic for directing light rays from the light source, the optic including at least one annular segment, the at least one annular segment being... Agent: Kenyon & Kenyon LLP

20090040500 - Distance measurement method and device and vehicle equipped with said device: A method for measuring the distance of an object is provided that includes irradiating a plurality of light beams having predetermined wavelengths and then in a first round, picking up an image under irradiation of the plurality of light beams and in another round picking up the image without irradiation... Agent: Young & Basile, P.C.

20090040501 - Object-detection device for vehicle: The object-detection device for vehicle provides a transmission-and-reception device; a reflection point calculation device; a segment setting device; a median point calculation device; and a relative speed calculation device, wherein the relative speed calculation device eliminates a calculation result of the relative speed in the car width direction, with respect... Agent: Lahive & Cockfield, LLP Floor 30, Suite 3000

20090040502 - Spatial information detecting device and photodetector suitable therefor: A spatial information detecting device is provided, which is capable of reducing the possibility that a saturation phenomenon is caused by the influence of an environmental light. This device includes a photoelectric converting portion for receiving a signal light from a target space to generate electric charges, a charge separating... Agent: Cheng Law Group, PLLC

20090040503 - System and method for analyzing rolling stock wheels: An exemplary system and method for analyzing rolling stock wheels helps allow a wheel to be analyzed at speed, reducing any need for manual inspections or other related delays. An exemplary system may include one or more strobe lights and one or more high-speed cameras to capture images of the... Agent: Lathrop & Clark LLP

20090040504 - Apparatus for detecting speed of movable body and drive stage using the same: A movable-body-speed-detecting apparatus includes a movable body capable of moving linearly and/or circularly, a plate fixed to the movable body, the plate having a predetermined length in a direction in which the movable body moves, and light emission/reception means arranged such that light output from a light-emitting element enters a... Agent: Hogan & Hartson L.L.P.

20090040505 - In-stream spectroscopic elemental analysis of particles being conducted within a gaseous stream: A particle presentation apparatus for presenting particles being conducted within a gaseous stream for in-stream spectroscopic elemental analysis includes a particle blending section for homogenizing the distribution particles of significantly different sizes received within a gaseous stream of randomly distributed particles; and a particle sampling section including a window that... Agent: Edward W Callan

20090040506 - Reflectivity/emissivity measurement probe insensitive to variations in probe-to-target distance: Apparatuses and methods for accurately measuring the reflectivity of a target surface, under conditions where the distance between a measuring probe and the target surface is not fixed. At least two measurements of the target reflectivity are taken under different conditions, and then these two or more measurements are combined... Agent: Dr. Mark M. Friedman C/o Bill Polkinghorn - Discovery Dispatch

20090040507 - Surface plasmon resonance sensor apparatus having multiple dielectric layers: A surface plasmon resonance (SPR) spectrometer sensor apparatus for measuring a property of an analyte substance that can be adsorbed on a surface by directing a beam of incident radiation on the apparatus at an incident angle relative thereto, receiving a beam of reflected radiation off the apparatus, and measuring... Agent: Agilent Technologies Inc.

20090040508 - Light monitoring method and light monitoring apparatus: A light monitoring method and a light monitoring apparatus are provided, in which light propagating optical fibers can be monitored with a simple structure and a small number of components without causing a large connection loss or Fresnel reflection and without performing precise adjustment of optical components. The light monitoring... Agent: Merchant & Gould PC

20090040509 - Optical topology for multimode and singlemode otdr: A network test instrument for singlemode and multimode OTDR testing employs an optical topology providing for combined singlemode and multimode use of a detector for reduced cost and instrument size.... Agent: Patenttm.us

20090040510 - Method and apparatus as well as corrective optical system for evaluating restoration-premised lens: The evaluating apparatus evaluates a restoration-premised lens which is employed in an image forming system that converts an optical image into an electronic image and then enforces a restoration processing on the electronic image in order to obtain a sharp image, is actually manufactured based on such design as premised... Agent: Birch Stewart Kolasch & Birch

20090040511 - Systems, circuits and methods for extending the detection range of an inspection system by avoiding detector saturation: Inspection systems, circuits and methods are provided to enhance defect detection by addressing anode saturation as a limiting factor of the measurement detection range of a photomultiplier tube (PMT) detector. In accordance with one embodiment of the invention, a method for inspecting a specimen includes directing light to the specimen... Agent: Baker & Mckenzie LLP

20090040514 - Method and apparatus for scanning, stitching and damping measurements of a double sided metrology inspection tool: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or... Agent: Smyrski Law Group, A Professional Corporation

20090040513 - Pattern inspection apparatus and pattern inspection method: A pattern inspection apparatus includes a light source configured to emit a pulsed light, a stage on which an inspection target workpiece is placed, a sensor, including a plurality of light receiving elements two-dimensionally arrayed, configured to capture a pattern image in a two-dimensional region of the inspection target workpiece... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20090040512 - Semiconductor wafer inspection device and method: The surface of an epitaxial wafer is inspected using an optical scattering method. The intensities of light scattered with a narrow scattering angle and light scattered with, a wide scattering angle reflected from laser light scatterers (LLS) on the wafer surface are detected. If the intensifies of narrowly and widely... Agent: Joseph P. Farrar

20090040515 - Formats for optical analysis and methods of manufacturing the same: Formats for the optical testing of fluids are manufacturing using modular format components. The format components are constructed so that matching format components can be mated together to form a single format for optical testing. Formats may be manufactured using pin-and-hole construction so that pins on optical format components mate... Agent: Nixon Peabody LLP

20090040517 - Raman difference spectra based disease classification: A method to diagnosis a disease state of an unknown sample. A test Raman data set for an unknown sample is generated. A reference Raman database is provided where the database contains a plurality of reference Raman data sets and a plurality of reference Raman difference data sets. The reference... Agent: Morgan, Lewis & Bockius LLP

20090040516 - Spectroscopic system: A spectroscopic system having a coded aperture as a gating device. Light of a Raman scattering may enter the system and encounter a mask gate. The mask may have a matrix of micro mirrors some of which pass light on to a diffraction grating when the gate is on. Some... Agent: Honeywell International Inc.

20090040518 - Apparatus, method and computer program for spectroscopic measurements and analysis: The present invention relates to a spectroscopic method and associated apparatus and computer program for measuring and analysing intensities of fluorescent molecules excited by an energy pulse. The method includes the steps of: a) generating a transient state build-up in the fluorescent molecules by means of an excitation pulse, within... Agent: Schwegman, Lundberg & Woessner, P.A.

20090040519 - Method and apparatus for reconfigurable field of view in a fast-based imaging system: A system and method to obtain a variable field of view (FOV) of a sample without requiring an increase in an imaging CCD array size. In a fiber array spectral translator (FAST) based chemical imaging system, the fibers in the fiber bundle may be organized in different 2D “zones”. Each... Agent: Chemimage Corporation

20090040520 - Spectroscopy device, spectroscopy apparatus and spectroscopy method: A spectroscopy device that separates input light into a plurality of wavelength ranges. A metal body has a hole or aperture which is open on the upper side. The hole or aperture is formed in a polygonal shape having at least a pair of opposite faces not parallel to each... Agent: Birch Stewart Kolasch & Birch

20090040521 - Even frequency spacing spectrometer and optical coherence tomography device: This application describes a spectrometer that includes a set of collimating optics to collimate received EMR to produce a collimated EMR. The spectrometer also includes a first dispersive optical element for dispersing the collimated EMR and a second dispersive optical element spaced apart from the first dispersive optical element to... Agent: Kraguljac & Kalnay

20090040522 - Measuring apparatus and measuring method: A measuring apparatus that measures the polarization state of analysis target light includes a modulation section 20 that includes a retarder 22 and an analyzer 24, a light intensity information acquisition section 30 that acquires light intensity information about modulated light obtained by modulating the analysis target light at the... Agent: Reed Smith

20090040523 - Light emitting diode illumination system: In various embodiments of the invention, a unique construction for Light Emitting Diodes (LEDs) with at least one luminescent rod and extracting optical elements used to generate a variety of high brightness light sources with different emission spectra. In an embodiment of the invention, forced air cooling is used to... Agent: Fliesler Meyer LLP

20090040524 - Multi-channel biosensor using surface plasmon resonance: Provided is a multi-channel biosensor using a biosensor using a surface plasmon resonance capable of measuring the changed resonance angle in real time without additionally scanning an incident angle according to the change of temperature or external environment by including a sensor chip with a plurality of channels arranged on... Agent: Staas & Halsey LLP

20090040525 - Systems configured to inspect a wafer: Systems configured to inspect a wafer are provided. One system includes an illumination subsystem configured to illuminate an area on the wafer by directing light to the wafer at an oblique angle of incidence. The system also includes a collection subsystem configured to simultaneously collect light scattered from different spots... Agent: Baker & Mckenzie LLP

20090040526 - Interferometric fiber optic gyroscope with off-frequency modulation signals: Interference in a rotation rate detector signal of an interferometric fiber-optic gyroscope from a bias phase modulator signal may be reduced or substantially avoided by transmitting one or more off-frequency signals having a frequency other than the eigenfrequency of the gyroscope towards a bias phase modulator, generating the bias phase... Agent: Goodwin Procter LLP Patent Administrator

20090040527 - Method and apparatus for speckle noise reduction in electromagnetic interference detection: Interference measurements obtained by comparison of a same beam (i.e. same nominal polarization, intensity, coherence length and wavelength) striking a same region on a sample at a same angle, but having a different beam wavefront upon intersection with the region are shown to provide images with independent coherent speckle noise... Agent: National Research Council Of Canada 1200 Montreal Road

20090040528 - Positioning apparatus, exposure apparatus, and device manufacturing method: A positioning apparatus comprises a first measuring device measuring a position of the stage in a first measuring range, a second measuring device measuring a position of the stage in a second measuring range having an overlapping range overlapping the first measuring range, a third measuring device measuring a position... Agent: Morgan & Finnegan, L.L.P.

20090040529 - Displacement-measuring optical scale and optical encoder using same: When a convex lens 13 comes close to 0-th order transmitted light T0 with rotation of an optical scale 11, the 0-th order transmitted light T0 derived from a light beam L emitted from a light source 15 and transmitted through a diffraction grating 12 around is converged and incident... Agent: Morgan & Finnegan, L.L.P.

20090040530 - Coordinate measuring machine and a method for correcting non-linearities of the interferometers of a coordinate measuring machine: A method and a coordinate measuring machine (1) are provided, wherein the non-linearities of an interferometer (24) can be corrected. A measuring stage (20) traversable in a plane (25a) is provided for measurement. The substrate (2) is placed in a measuring stage (20); wherein the position of the measuring stage... Agent: Houston Eliseeva

20090040531 - Optical fly height measurement: An optical fly height measurement system includes a planar waveguide, a first diffraction grating for coupling an electromagnetic wave into the planar waveguide wherein the first diffraction grating is positioned for directing the electromagnetic wave towards an air bearing surface of a slider. A second diffraction grating is provided for... Agent: Pietragallo Gordon Alfano Bosick & Raspanti, LLP

20090040532 - Three-dimensional shape measuring method and apparatus for the same: A three-dimensional shape measuring apparatus includes a line laser light source (1) and an image capturing device (2). A three-dimensional shape measuring method and apparatus is characterized by irradiating a line laser beam to an object (3) to be measured from a laser projecting device, imaging points (6) irradiated with... Agent: Oliff & Berridge, PLC

20090040533 - Tire shape measuring system: A tire shape measuring system measures a surface shape on the basis of an image of a line of light (a light section line) emitted to a surface of a relatively rotating tire using a light-section method. The shape measuring system includes a light projector for emitting a plurality of... Agent: Reed Smith LLP

20090040535 - Reflective corner cube array: The present invention relates to vibration detection devices. In one embodiment a corner reflective array is provided. The corner reflective array includes at least one corner cube. Each corner cube includes three mutually perpendicular reflective surfaces that intersect in a corner.... Agent: Honeywell International Inc.

20090040534 - Surface sensing device with optical sensor: A surface sensing device for use in position determining apparatus has an elongate stylus (74) with a tip (82) for scanning the surface of a workpiece to be measured. Lateral displacements of the stylus tip are detected by a light beam which passes along the stylus from a light source... Agent: Oliff & Berridge, PLC

20090040536 - Mark for alignment and overlay, mask having the same, and method of using the same: A mark for alignment and overlay, a mask having the same, and a method of using the same are provided. The mark includes a first mark pattern and a second mark pattern. The first mark pattern includes a first pattern and a second pattern, and the second mark pattern includes... Agent: Ingrassia Fisher & Lorenz, P.C.

20090033909 - Device for measuring distance and method for operating said type of device: The invention relates to a device (10, 10′) for contactless distance measurement, especially a hand-held device which allows a distance (d) between a target object (18) and at least one reference point (20) of the device (10) to be determined by means of an emitted measuring signal (16), especially by... Agent: Michael J. Striker

20090033910 - System and method for stereo photography: A system and method for stereo photography is provided. The system comprises a first light source, a second light source and a photodetector. The first light source is configured to illuminate one or more first non-white colors on an object. The second light source is configured to illuminate one or... Agent: Brooks Kushman P.C./fgtl

20090033911 - Laser anemometry with improved eye safety: The invention relates to an optical measurement device intended for determining a relative velocity vector {right arrow over (v)} of a carrier, such as an aircraft, with respect to a reference medium MILREF. The device includes an optical signal system EMIREC, delivering an optical signal Sinc that follows a direction... Agent: Lowe Hauptman & Berner, LLP

20090033913 - Digital pulse processor slope correction: A method of adjusting a response of an energy measuring filter, such as an FIR filter, of a pulse processor based on a slope of a preamplifier signal having a plurality of step edges each corresponding to a respective photon is provided that includes receiving a digital version of the... Agent: Eckert Seamans Cherin & Mellott

20090033912 - Method and apparatus for reading identification mark on surface of wafer: An identification mark constituted of irregularities is formed on the surface of a wafer, which is sealed with a resin layer and a dicing tape may be adhered to the backside. Multiple infrared units irradiate infrared rays towards the surface of the wafer from the backside thereof, wherein they transmit... Agent: Dickstein Shapiro LLP

20090033914 - Structure comprising a fibrous material substrate and method for authenticating and/or identifying such a structure: The invention concerns a structure (1) comprising: a least one fibrous material substrate (2), optionally at least one surface layer deposited on one surface of the substrate, a plurality of heterogeneous elements (3) of the substrate and/or of the optional surface layer, dispersed randomly within the substrate and/or the optional... Agent: Oliff & Berridge, PLC

20090033915 - Apc system and multivariate monitoring method for plasma process machine: An advance process control (APC) system for a plasma process machine is provided, which includes at least an optical emission spectroscopy (OES) system and an APC analysis apparatus. The OES system is used for monitoring a testing object in the plasma process machine. The APC analysis apparatus is used for... Agent: J C Patents, Inc.

20090033918 - Method and apparatus for robust detection of the density of a pigmented layer: Aspects of the disclosure can provide a method of detecting a density of a pigmented layer on an object. The method can include emitting a first modulated light onto a first portion of the object having the pigmented layer, detecting a first reflected light of the first modulated light from... Agent: Oliff & Berridge, PLC.

20090033917 - Optical object detection system for non-circular orbits: Systems and methods for dynamically positioning a detector relative to an object are provided. In one respect, a light source may project a light energy forming at least one projected plane onto a light rail, and more particularly, a light guide embedded in the light rail. The light energy of... Agent: Siemens Corporation Intellectual Property Department

20090033916 - System and method for measuring interferences: A system and method for measuring interferences are disclosed. The system is based on the concept of a composite interferometer. The sample is measured while a simultaneous compensation of the phase deviation due to the relative displacement of the optical delay component between the measurements at different pixels of the... Agent: Wpat, PC

20090033919 - Estimating loss of mechanical splices interconnecting optical fibers, and connector installation tool: A method of estimating loss of a splice between first and second optical fibers spliced together by a mechanical splice or a mechanical splice-based connector having a portion through which light leaked from the splice can emerge comprises the steps of launching light into the first fiber, collecting light leaked... Agent: Adams Patent & Trademark Agency

20090033920 - Method of measuring diffractive lenses: A method for measuring the optical properties of multifocal ophthalmic lenses. Collimated light is passed through an ophthalmic lens and onto an array of lenslets. Light exiting the array of lenslets is detected by a sensor. Blurred spots and/or double spots may represent diffractive zones of the wavefront. A centroid... Agent: Alcon

20090033921 - Piping alignment tool: A piping alignment tool suitable for locating where an extension of an existing pipe must pass through obstructions such as walls. The tool has a tubular shape with oppositely disposed ends. Each end is formed to have multiple coaxial sets of different-sized pipe threads that allow the tool to be... Agent: Hartman & Hartman, P.C.

20090033922 - Testing system for testing color wheels: A testing system measures central angles of filter segments of a color wheel. The color wheel includes a color filter, which includes three sector-shaped filter segments and a motor for driving the filter segments to rotate. The testing system includes a sensor and a processor. The sensor emits light toward... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20090033923 - Apparatus for detecting wavelength and measuring optical power: The present invention relates to a light wavelength and intensity measuring device. The device automatically measures a center wavelength of the light source and an intensity of the light corresponding to the center wavelength by using a main photodetector, at least one optical filter, and at least one sub photodetector... Agent: Pearl Cohen Zedek Latzer, LLP

20090033924 - Defects inspecting apparatus and defects inspecting method: An inspecting apparatus and method including first and second illuminating units for illuminating a surface of a specimen to be inspected with different incident angles and first and second detecting optical units arranged at different elevation angle directions to the surface of the specimen for detecting images of the specimen... Agent: Antonelli, Terry, Stout & Kraus, LLP

20090033925 - Visual inspection apparatus for flexible printed circuit boards: An exemplary visual inspection apparatus for a flexible printed circuit board includes a frame, an inspection station, a control system, a roller system and a power system. The inspection station is disposed on the frame. The inspection station has an inspection surface for placing the flexible printed circuit board thereon... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20090033926 - Device for calibrating an image sensor system in a motor vehicle: A device for calibrating an image sensor system in a motor vehicle includes an onboard calibration object situated on engine hood of vehicle. The engine hood is put into a selected position to perform the calibration.... Agent: Kenyon & Kenyon LLP

20090033927 - Method for producing colors: The invention relates to a method (100) for producing color elements of a shade guide. To this end, color values of known color elements (15) of shade guides (10) with similar lightness values, hues and chromata are initially ascertained. In another method step, the color values of each new color... Agent: John C. Thompson

20090033928 - Raman spectrometry assembly: A Raman spectrometry assembly includes a Raman spectrometer having a laser light source and a Raman signal analyzer, an interface module comprising a housing which is connectable to and disconnectable from the spectrometer, and a fiber optic assembly which is connectable to and disconnectable from the interface module, the fiber... Agent: Fish & Richardson PC

20090033930 - Spectral imaging of biofilms: A spectroscopic method and system to identify a biofilm of a microorganism. A sample containing a sample microorganism is irradiated with substantially monochromatic radiation. A Raman data set is obtained based on radiation scattered from the irradiated sample. A database is searched in accordance with the Raman data set in... Agent: Morgan, Lewis & Bockius LLP

20090033929 - Substrates for raman spectroscopy having discontinuous metal coatings: In one aspect, the present invention provides methods for fabricating substrates for use in a variety of analytical and/or diagnostic applications. Such a substrate can be generated by exposing a semiconductor surface (e.g., silicon surface) to a plurality of short laser pulses to generate micron-sized, and preferably submicron-sized, structures on... Agent: Nutter Mcclennen & Fish LLP

20090033931 - Optical measurement apparatus and method: An optical modulation spectroscopy system comprises a probe beam source and components for directing the probe beam at a sample. It also may comprise a modulated pump beam source and components for directing a modulated pump beam at the sample. A dispersive system may disperse the reflected probe beam into... Agent: Lng/kla 2 Joint Customer Number C/o Luedeka, Neely & Graham, P.C.

20090033933 - Novel multivariate optical elements for optical analysis system: A method of developing a multivariate optical element for an optical analysis system includes forming an optically absorptive spectral element having an optically absorptive material, the optically absorptive material being absorbing in a predetermined spectral region; and utilizing the optically absorptive spectral element in the optical analysis system.... Agent: Dority & Manning, P.A.

20090033932 - Tagging systems using energy exchange: A tagging system contains first taggants and second taggants. The taggants differ from each other so that the first taggants have a first emission spectrum and a first absorption edge and the second taggants have a second emission spectrum and a second absorption edge. In the tagging system, the first... Agent: Hewlett Packard Company

20090033934 - Droplet formation apparatus and methods for forming droplet and calibrating particle size measurement apparatus: A droplet formation apparatus is provided for calibrating a particle size measurement apparatus. A vessel stores sample liquid. A pressure unit applies predetermined pressure to the sample liquid in the vessel. An oscillator is provided to one surface of the vessel for applying oscillation, which has a predetermined frequency, to... Agent: Nixon & Vanderhye, PC

20090033935 - Magneto-optic biosensor using bio-functionalized magnetized nanoparticles: A biosensor utilizing bio-functionalized magnetic nanoparticles is provided. An external magnetic field is applied to a suspension of magnetic nanoparticles. A linearly polarized incident light is applied to the suspension of magnetic nanoparticles. A photocurrent from polarized light scattering by bio-functionalized magnetic nanoparticles in liquid is detected. The magneto-optic sensing... Agent: Joan Pennington

20090033936 - Optical characteristic measuring apparatus and optical characteristic measuring method: An optical characteristic measuring apparatus including a carrier retarder of which the retardation is known and a quarter-wave plate without wavelength dependence, wherein light emitted from a light source (light-emitting device) is incident on a measurement target through a first polarizer (polarizer), the carrier retarder, and the quarter-wave plate, and... Agent: Reed Smith 3110 Fairview Park Drive

20090033937 - Sensor for measuring living body information and keypad assembly using the same: A sensor for measuring living body information and a keypad assembly including the sensor includes a light guide panel for guiding a first light. A light extracting pattern is provided on the light guide panel for outputting the first light guided by the light guide panel to an exterior of... Agent: Cha & Reiter, LLC

20090033938 - Process and apparatus for measurements of mueller matrix parameters of polarized light scattering: A method and apparatus for measuring Mueller matrix parameters from scattered light. The apparatus is advantageous for use in countering bioterrorism by detecting information concerning airborne pathogens, particularly microorganism in aerosol form. The system provided is portable, more efficient, and less sensitive to wavelength changes. The method uses variation in... Agent: Department Of The Air Force

20090033939 - Testing method for testing color wheels: A testing method is configured for testing parameters of a color wheel. The color wheel includes a color filter, which includes three sector-shaped filter segments and a motor for driving the filter segments of the color filter to rotate. The color filter is driven to rotate. Light is emitted toward... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20090033940 - Multi-level light curtain with structure light sources and imaging sensors: Systems and methods for detecting an obstruction in a detector surface fields are provided. In one respect, a set of lines may be projected over substantially a half of the detection area and may subsequently imaged and evaluated. Other embodiments may include a second set of lines that may be... Agent: Siemens Corporation Intellectual Property Department

20090033941 - Methods and apparatus for identifying thin films on a substrate: The present invention provides systems, apparatus and methods for detecting a film in an electronic device disposed in an electronic device processing tool. The invention includes a mounting member adapted to couple the apparatus to a view port of the electronic device processing tool, an optical energy source disposed within... Agent: Dugan & Dugan, PC

20090033942 - Determining physical property of substrate: A method of determining a physical property of a substrate includes recording a first spectrum obtained from a substrate, the first spectrum being obtained during a polishing process that alters a physical property of the substrate. The method includes identifying, in a database, at least one of several previously recorded... Agent: Fish & Richardson P.C.

20090033943 - Interferometric measuring device: A device for an interferometric measuring device having a first interferometer and a second interferometer, short coherent radiation being supplied to the first interferometer via a radiation source which is split into to beam components by a first beam splitter; and the optical path length in a beam component being... Agent: Kenyon & Kenyon LLP

20090033944 - Coded polarization-dependent interferometry: An apparatus and a method of polarization dependent analyzation of an optical signal transmitted through a DUT includes splitting the optical signal into a first signal part having an initial first polarization and a second signal part having an initial second polarization, coding the first signal part using a first... Agent: Agilent Technologies Inc.

20090033945 - Method and measuring device for measuring an absolute distance: In a method and a measuring device (10) for measuring an absolute distance value corresponding with a range (9) between a measuring device (10) and a target (8), wherein for measuring the absolute distance value a number of individual measuring steps are performed with an absolute distance meter (1), a... Agent: Rankin, Hill & Clark LLP

20090033946 - Displacement measuring apparatus: Disclosed is a displacement measuring apparatus that includes a composite scale having a magnetic pattern and a diffraction grating each aligned in a direction of measuring axis, and a detector head moving in a direction of measuring axis relative to the composite scale. The detector head has a magnetic detection... Agent: Sonnenschein Nath & Rosenthal LLP

20090033947 - Method for repeatable optical determination of object geometry dimensions and deviations: A method for inspecting geometrical shapes of objects to determine selected dimensions thereof based on data characterizing such objects obtained through stereoscopic photographs taken by a pair of cameras with fields of view intersecting to thereby provide a photographic event measurement volume that includes at least a portion of each... Agent: Kinney & Lange, P.A.

20090033948 - Method of measuring shot shape and mask: A method of measuring shot shape includes sequentially exposing a substrate with main scale marks (32) in compliance with a predetermined map, and forming a reference grid including a plurality of the main scale marks (32) arranged in the predetermined map in at least one shot region, exposing a shot... Agent: Oliff & Berridge, PLC

20090033949 - Method and apparatus for determining geometrical dimensions of a vehicle wheel: A method and an apparatus of determining geometrical dimensions of a motor vehicle wheel (rim/tyre assembly) 1 by contact-less sensing, wherein the wheel is fixed on wheel receiving means 8 of a tyre changer, that at least one planar light beam 3 is emitted on to the wheel or at... Agent: Mcdermott Will & Emery LLP