Optics: measuring and testing inventions 12/08

20080316462 - Curved sensor array apparatus and methods: Curved sensor array configurations and methods of processing the data gathered by the sensors. A 2 dimensional embodiment comprises singular ring of sensors that can monitor sources in a 2 dimensional plane. A sensor directly facing a target produces a maximum response. As the angle of a sensor relative to... Agent: Jennifer L. Bales

20080316463 - Laser radar apparatus that measures direction and distance of an object: There is provided a laser radar including laser beam generating means, photo detecting means, a mirror, light deflecting means, and rotation driving means. The laser beam generating means emits a laser beam having an axis thereof. The photo detecting means detects a reflected laser beam that is reflected back by... Agent: Posz Law Group, PLC

20080316464 - Laser range finding device & distance measurement method thereof: A distance measurement method for use in a laser range finding device to measure a distance between the laser range finding device and a target is disclosed. The method comprises the following steps. A laser signal is sent to the target in a first time point. A reflected laser signal... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080316465 - Sample holder and sample preparation device: An apparatus for forming a solid sample from a sample solution and then analyzing the solid sample to determine the solid form of the sample is provided. The apparatus may optionally comprise a masking block with an array of openings, a film on which the solid sample can be deposited,... Agent: O''brien Jones, PLLC

20080316466 - Spectroscopic optical system: Innovative techniques that result in a better signal-to-noise ratio for spectrographic analysis of substances in a target than conventional techniques. In these techniques, light illuminates a target with at least some of the light penetrating the target. At least a portion of the light that penetrates the target is collected... Agent: Butzer & Chen Law, LLC

20080316467 - Device and method for monitoring multiple chemical samples with a fluorescent tube: A monitoring device is described for multiple chemical reactions in multiple test containers. Each container contains chemical reagents and at least one fluorescence dye indicator capable of changing its fluorescent characteristics due to the chemical reaction. A single cylindrical ultraviolet (UV) cold cathode fluorescent (CCFL) tube is utilized. Multiple test... Agent: John R. Benefiel

20080316469 - Device and method for beam adjustment in an optical beam path: A device for beam adjustment in an optical beam path, having at least two mutually independent light sources (1, 2), in particular in a beam path (8, 9) of a preferably high or extremely high resolution microscope, the beams of the light sources (1, 2) requiring to be superposed in... Agent: Foley And Lardner LLP Suite 500

20080316468 - System and method for the deposition, imaging, detection and identification of threat agents: A system and method for depositing a sample of a threat agent onto a substrate. A single illumination source illuminates the threat agent on the substrate with a plurality of photons to thereby produce elastic scattered photons. Deposition of the threat agent onto the substrate is visually observed by analyzing... Agent: Morgan, Lewis & Bockius LLP

20080316470 - System for checking centration of lens surfaces of aspheric lens: A system for checking centration of lens surfaces of an aspheric lens includes a light-emitting device, a lens holder and an image processing device. The light-emitting device emits a light. The lens holder positions the aspheric lens in a light path of the light emitted from the light-emitting device. The... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080316471 - Determining azimuth angle of incident beam to wafer: A method, system and computer program product for determining an Azimuth angle of an incident beam to a wafer are disclosed. A method comprises: using the incident beam to make a first set of measurements of calibration targets of a first set of grating angles that are different than one... Agent: Hoffman Warnick LLC

20080316472 - Optical sensing module and display device using the same: An optical sensing module is adapted to be assembled to a frame of a display device. The display device comprises a display module and the frame, and the display module has a display area and the frame surrounds the display area. The optical sensing module comprises a casing and an... Agent: Jianq Chyun Intellectual Property Office

20080316473 - Device and method for scanning pieces of solid wood: A device for scanning pieces of solid wood has a pusher movable across a length of a piece of solid wood and at least one scanning unit mounted on the pusher. At least one side of the piece of solid wood is scanned by the at least one scanning unit... Agent: Gudrun E. Huckett Draudt

20080316474 - Optical apparatus and an observation apparatus having the same for observing micro particles: Disclosed is an optical device for illuminating a chip having a sample provided thereto with a beam in an apparatus for observing the sample. The optical device comprises a light source; and a first reflector reflecting the beam of the light source to allow the reflected beam to be incident... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080316475 - Defect inspection apparatus and defect inspection method: An apparatus and a method for defect inspection enables a reduction in the amount of noise light from an underlying layer and a good defect inspection reliably. The apparatus includes an illumination device that irradiates, with illumination light, a substrate to be inspected including a resist layer having cyclic patterns... Agent: Oliff & Berridge, PLC

20080316476 - System and device for the optical inspection of glass panels: A system for the optical inspection of glass panels (2) is described, with a conveying device (3) for moving a glass panel (2), and with a first inspection module (5, 6, 7), which includes an illumination device and a camera for illuminating and photographing the glass panel (2), and with... Agent: Michael J. Striker

20080316477 - Stirrer and analyzer: A stirrer includes a vessel for holding a liquid to be stirred; and a sound wave generator that irradiates the liquid with a sound wave to stir the liquid by the sound wave. The sound wave generator includes a piezoelectric substrate, and a sound generating element provided on the piezoelectric... Agent: Scully Scott Murphy & Presser, PC

20080316478 - Method and apparatus for spectrometer noise reduction: Methods and apparatus for enhancing reference spectra are presented. Movement of a reference material relative to a spectrometer optical path is used to enhance reference spectra precision. Alternatively, changing an optically sampled area and/or volume of a reference material during collection of a reference spectrum is used to enhance reference... Agent: Glenn Patent Group

20080316479 - Optical device: According to an aspect of the embodiment, an optical device has a mirror device having a plurality of mirrors which are able to move, and a mirror interface for adjusting light axis of the each input light in accordance with each position of the mirrors.... Agent: Staas & Halsey LLP

20080316480 - Aggregates of plural transition metal nanoparticles and plural cyanine dye molecules: The present invention is directed to an aggregate composed of a plurality of nanoparticles of a transition metal and a plurality of cyanine dye molecules that are interacting non-covalently. The nanoparticles are capped with a capping molecule, while the cyanine dye molecule can be cationic, anionic, or neutral cyanine dye.... Agent: Nixon Peabody LLP - Patent Group

20080316481 - Apparatus for analyzing and sorting biological particles: The invention provides an apparatus including (a) a frame having a boundary plane; (b) a flow chamber supported by the frame, the flow chamber placed a distance from the boundary plane; (c) a radiation source, the radiation source directed away from the flow chamber and away from the exterior side... Agent: Mcdermott, Will & Emery

20080316482 - Optical scanning configurations, systems, and methods: Methods and optical systems for scanning of a target sample, including methods and systems using a low mass scan head. The present invention also relates to methods and systems for performing sample assays, and for producing and measuring optical responses and signatures.... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080316483 - Mixture indentification system: A mixture identification system for detecting foreign matter admixed in a tobacco material (T) includes a conveyor (2) for conveying the material (T), an irradiation device (6) for irradiating infrared light toward an inspection line (IL) extending across the conveyor (2), an infrared camera device (10) for receiving the infrared... Agent: Birch Stewart Kolasch & Birch

20080316484 - Spectroscope and method performing spectroscopy utilizing an adaptive optical element: A spectroscope designed to utilize an adaptive optical element such as a micro mirror array (MMA) and two distinct light channels and detectors. The devices can provide for real-time and near real-time scaling and normalization of signals.... Agent: Lewis, Rice & Fingersh, Lc Attn: BoxIPDept.

20080316485 - Resonant waveguide-grating devices and methods for using same: Waveguide gratings, biosensors, and methods of using a waveguide grating, including as a biosensor.... Agent: Fulbright & Jaworski L.L.P.

20080316486 - Target substance-detecting apparatus and target substance-detecting method: A target substance-detecting apparatus comprises a target substance-detecting element comprising metal structures, a light irradiation section for irradiating the target substance-detecting element with a light, a light-polarizing section which polarizes the irradiating light and separates an output light emitted from the target substance-detecting element into a first polarized light and... Agent: Fitzpatrick Cella Harper & Scinto

20080316487 - Method of timing headlamps or lighting projectors: Comprises the following phases: in first phase a vehicle (1) is facing an obstacle (4), screen or wall defining a distance, in second phase is determined the type of headlamp or lighting projector and its space position in relation to the obstacle, screen or wall, automated or hand operated, in... Agent: Egbert Law Offices

20080316488 - Measuring cerebral oxygen saturation: A device includes source and detector sensors. In a specific implementation, the device has two near detectors, two far detectors, and two sources. The two near detectors are arranged closer to the two sources than the two far detectors. A light-diffusing layer covers the two near detectors. The device may... Agent: Aka Chan LLP

20080316489 - Gas sensor: A gas sensor for measuring at least one gas concentration, in particular for a vehicle climate control system, having a substrate, an IR radiation source fastened on the substrate, an IR detector fastened on the substrate, a measurement chamber for receiving a gas having the gas concentration that is to... Agent: Kenyon & Kenyon LLP

20080316492 - Optical motion identification device utilizing partial total internal reflection light source and/or partial non-total internal reflection light source: An optical motion identification device utilizing partial total internal reflection light source and/or partial non-total internal reflection light source includes a light-emitting member, a code member and a light-sensing unit. The light-emitting member generates projecting light beams. The code member receives the projecting light beams generated by the light-emitting member... Agent: Rosenberg, Klein & Lee

20080316490 - Planar surface plasmon resonance detector: The present invention discloses a planar surface plasmon resonance detector, wherein a periodic metallic grating structure is arranged on a common glass substrate to replace prisms and generate surface plasmon resonance. The shift of the wavelength or incident angle for surface plasmon resonance is used to detect biochemical molecules. Further,... Agent: Joe Mckinney Muncy

20080316491 - Sensor and method of detecting the condition of a turf grass: A method of detecting the condition of a turf grass is described. According to one aspect of the invention, the method comprises steps of attaching an active sensor to a mower; traversing a section of turf grass; and processing the output of the sensor. A device for detecting the condition... Agent: Townsend And Townsend And Crew, LLP

20080316493 - Surface reflection encoder scale and surface reflection encoder using the same: A surface reflection encoder scale is used with a surface reflection encoder for detecting a relative movement amount of a member for making a relative move. The surface reflection encoder scale includes a substrate of the member or a substrate provided on the member and a reflection phase grating provided... Agent: Rankin, Hill & Clark LLP

20080316494 - Controlling a dynamic signal range in an optical time domain reflectometry: A technique includes providing an optical source signal to an optical fiber to produce a backscatter signal. A receiver is provided to detect the backscatter signal. During an acquisition period in which the backscatter signal is present, a sensitivity of the receiver is varied with respect to time to regulate... Agent: Schlumberger Reservoir Completions

20080316495 - Optical characteristic measuring apparatus: An optical characteristic measuring apparatus includes: a light source section which sweeps wavelengths of a first input light and a second input light respectively, frequencies of the first and second input lights being different from each other and polarized states of the first and second input lights being perpendicular to... Agent: Sughrue-265550

20080316496 - Method and apparatus for studying surface vibrations by moving speckle interferometer: A method of studying a surface using an interferometer, in which there is relative motion between the surface and the interferometer, the motion having a total velocity Vtot which includes a transversal or traversing component Vt and a longitudinal component Vl. The method comprises: directing an object beam of coherent... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20080316497 - Tracking type laser interferometer and method for resetting the same: A tracking type laser interferometer that detects displacement of a retroreflector 300 being an object to be measured by utilizing interference of a laser beam 102 irradiated onto the retroreflector 300 and reflected by the retroreflector 300 in the returning direction, and carries out tracking by means of a two-axis... Agent: Rankin, Hill & Clark LLP

20080316498 - Apparatus and method for two wave mixing (twm) based ultrasonic laser testing: A system and method for detecting ultrasonic surface displacements at a remote target are disclosed, one embodiment of the system comprising: a first laser to generate a first laser beam. The first laser beam produces ultrasonic surface displacements on a surface of the remote target. A second laser generates a... Agent: Bracewell & Giuliani LLP

20080316499 - Tear film measurement: The invention comprises an apparatus for measuring the relative thickness of the lipid layer component of the precorneal tear film on the surface of an eye after distribution of the lipid layer subsequent to blinking is disclosed. An illuminator directs light to the lipid layer of a patient's eye. The... Agent: Withrow & Terranova, P.l.l.c.

20080316500 - Methods of testing and manufacturing optical elements: A method of manufacturing an optical element having an optical surface of a non-rotationally symmetric shape is described. Measuring light is generated using an interferometer optics, wherein the interferometer optics has at least one diffractive component having a grating. The optical surface is positioned at a first position relative to... Agent: Jones Day

20080316501 - Shape inspection method and apparatus: There is provided a shape inspection method comprising a first step of placing an object to be measured on an inspection stand for actual measurement, a second step of obtaining information of the surface shape of the object, a third step of calculating shape data of the object in a... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080316502 - Apparatus and method for measuring displacement, surface profile and inner radius: An apparatus and a method are proposed for measuring displacement, surface profile and roughness of a moving object or an inner radius of a hollow cylinder. The apparatus includes a light emitting unit, a light dispersing unit for receiving light from the light emitting unit and focusing rays with different... Agent: Rabin & Berdo, PC

20080316503 - Automated inspection comparator/shadowgraph system: Automated inspection comparator/shadowgraph system to compare and contrast a working operation for a workpiece and a resulting workpiece compared to the operating system. Computer software controls the inspection machine to determine irregularity between a resulting workpiece and originally programmed computer software, such that the irregularities are made known to the... Agent: Cargill & Associates, P.l.l.c.

20080316505 - Determining the position of a semiconductor substrate on a rotation device: A device for determining the position of a semiconductor substrate on a rotation device having a rotational axis, including a direction of rotation detecting unit for determining the rotational state of the rotation device, and also including at least one light source and at least one receiver which is photo-sensitive... Agent: Dority & Manning, P.A.

20080316504 - Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system: A precision laser based method of marking semiconductor wafers, packages, substrates or similar workpieces is provided. The workpieces have articles which may include die, chip scale packages, circuit patterns and the like. The marking occurs in a workpiece marking system and within a designated region relative to an article position.... Agent: Brooks Kushman P.C.

20080316506 - Visual inspection apparatus for a wafer: Provided is a visual inspection apparatus for a semiconductor wafer, by which a threshold value optimal for inspection can be determined and visual inspection of each chip can be performed based on the threshold value, by obtaining in advance a table indicating a relation between a film thickness of a... Agent: Brinks Hofer Gilson & Lione

20080309914 - Method for detecting objects with visible light: A method for detecting an object using visible light comprises providing a visible-light source having a function of illuminating an environment. The visible-light source is driven to emit visible light in a predetermined mode, with visible light in the predetermined mode being emitted such that the light source maintains said... Agent: Ogilvy Renault LLP

20080309913 - Systems and methods for laser radar imaging for the blind and visually impaired: A system to fuse data derived from a three dimensional imaging ladar system with information from a visible, ultraviolet, or infrared camera systems and acoustically present the information in a four or five dimensional acoustical format utilizing three dimensional acoustic position information, along with frequency, and modulation to represent color,... Agent: Kristina M. Grasso Kristina M. Grasso, Esq. PLLC

20080309915 - Method for correcting disturbances in a level sensor light path: The invention relates to a level sensor for determining a height of a substrate. The level sensor generates one or more measurement beam and directs the measurement beam to a measurement spot on the substrate and produces a reflected measurement beam. The level sensor also generates one or more reference... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080309916 - Auto aim reticle for laser range finder scope: A laser range finder scope for measuring the distance between a target and the scope based on the time-of-flight of laser impulses is disclosed as including means for transmitting laser impulses toward the target and generating a first time signal corresponding to the transmission; means for receiving laser impulses reflected... Agent: William J. Sapone Coleman Sudol Sapone P.C.

20080309917 - Optical short-range sensor: In an optical short-range sensor, a plurality of sequentially actuatable transmission elements (21 . . . 27) disposed in a line-like manner in one plane is provided. At least one additional transmission element (1) situated offset in relation to the sequentially actuatable transmission elements and in particular transmitting downward, is... Agent: Kenyon & Kenyon LLP

20080309918 - Integrated chemical separation light scattering device: An integrated chemical separation device includes a single device body, a chemical separation unit configured to separate a chemical from a fluid, a Raman sensor substrate comprising one or more surfaces configured to be adsorbed by molecules of the chemical from the fluid, and a Raman scattering spectrometer unit that... Agent: Xin Wen

20080309919 - Method and apparatus for sorting and analyzing particles in an aerosol with redundant particle analysis: A method and apparatus for sorting and performing redundant analysis of particles in an aerosol is disclosed. Redundant analysis reduces the possibility of false positive analyses, which is advantageous in the art. The apparatus may comprise an aerosol concentrator, an optical particle analyzer, an electrosprayer and a charged particle analyzer.... Agent: Bacon & Thomas, PLLC

20080309924 - Apparatus and method for measuring optical characteristics of teeth: Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass... Agent: Alan Loudermilk Loudermilk & Associates

20080309922 - Attenuated total reflection sensor: An attenuated total reflection (“ATR”) sensor (3) determines a substance dissolved in a measurement medium (2). A method is taught to verify a calibration and/or to perform an in-line calibration of the sensor. The ATR sensor includes a housing (7) and an ATR body (4). A light source (12) and... Agent: Standley Law Group LLP

20080309923 - Compact chemical sensor: A differential calorimeter device for detection of one or more predefined chemicals. An example device includes an integrating device having an absorbing layer. Optical sources send beams of differing color light at the absorbing layer. An optical detector detects intensity of light reflected off of the absorbing layer and a... Agent: Black Lowe & Graham, PLLC

20080309920 - Method and system for optoelectronic detection and location of objects: Disclosed are methods and systems for optoelectronic detection and location of moving objects. The disclosed methods and systems capture one-dimensional images of a field of view through which objects may be moving, make measurements in those images, select from among those measurements those that are likely to correspond to objects... Agent: Cognex Corporation Intellectual Property Department

20080309921 - Spectrophotometer: Embodiments of a spectrophotometer and methods of use a spectrophotometer are disclosed.... Agent: Hewlett Packard Company

20080309925 - System and method for monitoring an optical communication system: A monitoring system and method may be used to monitor an optical communication system. A monitoring system and method may be used to derive loop gain data sets from optical time domain reflectometry (OTDR) or coherent optical time domain reflectometry (COTDR) data. A monitoring system and method may also use... Agent: Grossman, Tucker, Perreault & Pfleger, PLLC

20080309926 - Systems and methods for reducing detected intensity non uniformity in a laser beam: A method of increasing the spatial uniformity of the detected intensity of a beam of light from a laser in a system including the laser and a light detector. In one embodiment the method includes the steps of generating a beam of light with the laser; and moving the beam... Agent: Cooley Godward Kronish LLP Attn: Patent Group

20080309927 - Wafer inspection system and method: A wafer inspection system and method is disclosed. On embodiment includes an edge defect detection unit, an optical inspection unit and a processor unit. The edge defect detection unit is configured to detect defects occurring in an edge area of the wafer and to record edge defect positions. The optical... Agent: Dicke, Billig & Czaja

20080309928 - Automatic optical inspection device, chip sorting apparatus and method: An automatic optical inspection device for inspecting the surface defects of integrated circuits is disclosed in this invention. The automatic optical inspection device includes a tray transporting device which transports a tray carrying at least one integrated circuit and having at least one clip area, a press mechanism for fixing... Agent: Stout, Uxa, Buyan & Mullins LLP

20080309929 - Method and system for standardizing microscope instruments: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor... Agent: Foley And Lardner LLP Suite 500

20080309930 - Calibration for spectroscopic analysis: The present invention provides an optical analysis system for determining an amplitude of a principal component of an optical signal. The principle component is indicative of the concentration of a particular compound of various compounds of a substance that is subject to spectroscopic analysis. The optical signal is subject to... Agent: Philips Intellectual Property & Standards

20080309931 - Coherently controlled nonlinear raman spectroscopy: A method and system (10) are presented for producing exciting radiation (P′) to be used in producing an output coherent anti-stokes Raman scattering (CARS) signal of a medium (12). An input spectral phase coherent optical pulse (P), carrying a pump, a Stokes and a probe photon, is optically processed by... Agent: The Nath Law Group

20080309933 - Scanning spectrophotometer for high throughput fluorescence detection: A fluorescence spectrophotometer having an excitation double monochromator, a coaxial excitation/emission light transfer module, and an emission double monochromator. Each monochromator includes a pair of holographic concave gratings mounted to precisely select a desired band of wavelengths from incoming broadband light without using other optical elements, such as mirrors. Selected... Agent: Pillsbury Winthrop Shaw Pittman LLP

20080309934 - Scanning spectrophotometer for high throughput fluorescence detection: A fluorescence spectrophotometer having an excitation double monochromator, a coaxial excitation/emission light transfer module, and an emission double monochromator. Each monochromator includes a pair of holographic concave gratings mounted to precisely select a desired band of wavelengths from incoming broadband light without using other optical elements, such as mirrors. Selected... Agent: Pillsbury Winthrop Shaw Pittman LLP

20080309935 - Method for methane spectral absorbance calculation using sunlight: A method and a system are provided for calculating the spectral absorbance using sunlight. With this method, methane (CH4) in open air can be detected using NIR spectrometers. It does not require any laser illumination of methane molecules in an outdoor environment. Instead, sunlight is used as the light source.... Agent: Migma Systems, Inc.

20080309936 - Spectrometer with multiple gratings: A spectrometric measurement apparatus comprises a collimator (401), a first diffractive grating (403), a second diffractive grating (404), and a detector arrangement (407). Incident radiation (402) from the collimator (401) is diffracted to the detector arrangement (407) either directly or through mirrors so that the first (403) and second (404)... Agent: Wood, Phillips, Katz, Clark & Mortimer

20080309938 - Apparatus and method of non-sampling-based q-factor measuring: A non-sampling-based Q-factor measuring apparatus and method use a power conversion module to transform the power variation of inputted optical signals in time domain into the variation in other domains, such as optical wavelength, optical polarization and different output ports of optical elements. Taking optical wavelength as an example, different... Agent: Lin & Associates Intellectual Property, Inc.

20080309937 - Method and system for identification of changes in fluids: Method and system for identification of a changed state of a fluid with respect to a reference state of the same fluid, the fluid having an optical parameter changing with the change of the state of the fluid. The method comprises: a) providing an optical arrangement including a transparent enclosure... Agent: Pearl Cohen Zedek Latzer, LLP

20080309939 - Body fluid constituents measurement device: A body fluid constituents measurement device, which performs measurement under a setting where light intensity of the light-emitting element is suitably stabilized, is provided. The present invention is a body fluid constituents measurement device which comprises: a light-emitting element that emits light onto a test paper onto which body fluid... Agent: Buchanan, Ingersoll & Rooney PC

20080309941 - Method of, system for, and medical image acquisition system for imaging an interior of a turbid medium taking into account the geometry of the turbid medium: The invention relates to a method of imaging an interior of a turbid medium (45) comprising the following steps: accommodation of the turbid medium (45) inside a receiving volume; coupling transmission input light (65) from a transmission light source into the receiving volume, with said transmission input light (65) being... Agent: Philips Intellectual Property & Standards

20080309940 - Method of, system for, and medical image acquisition system for imaging an interior of a turbid medium taking into account the geometry of the turbid medium: The invention relates to a method of imaging an interior of a turbid medium (45) comprising the following steps: accommodation of the turbid medium (45) inside a receiving volume (20); coupling transmission input light (65) from a transmission light source into the receiving volume (12), with said transmission input light... Agent: Philips Intellectual Property & Standards

20080309942 - Method and apparatus for establishing reflection properties of a surface: A method for establishing light reflection properties of a specific surface, by measuring, for a plurality of comparison surfaces, the r-tables in accordance with CIE standard recommendations, measuring, for the same plurality of comparison surfaces, a light reflection parameter for selected angles (γ) of incident light and angles (90°—α) and... Agent: Powell Goldstein LLP

20080309943 - Modulated reflectance measurement system with multiple wavelengths: A modulated reflectance measurement system includes three monochromatic diode-based lasers. Each laser can operate as a probe beam or as a pump beam source. The laser outputs are redirected using a series of mirrors and beam splitters to reach an objective lens. The objective lens focuses the laser outputs on... Agent: Stallman & Pollock LLP

20080309944 - Quantitative phase-contrast digital holography method for the numerical reconstruction of images, and relevant apparatus: m

20080309945 - Physical quantity measuring apparatus: A physical quantity measuring system according to the present invention comprises: an optical fiber having fiber Bragg gratings; a light source connected to the optical fiber; an arrayed waveguide grating connected between the light source and the optical fiber via an optical branching filter, and having output channels of which... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080309946 - Differential-phase interferometric system: A differential-phase interferometric system includes a polarized heterodyne interferometer for generating reference and signal beam that travel along reference and signal channels, respectively. The signal beam is directed to a specimen and contains measured information of the specimen. The interferometer further generates a first electrical signal output corresponding to first... Agent: Gallagher & Lathrop, A Professional Corporation

20080309947 - Measurement method and apparatus, exposure apparatus, and device manufacturing method: A measurement method for measuring a wavefront aberration of a target optical system using an interference pattern formed by a light from a first image side slit, and a light from a second image side slit, the first and second image side slits being located at an image side of... Agent: Morgan & Finnegan, L.L.P.

20080309948 - Process and device for controlling a filling level of silos containing loose materials: The process comprises a stage of highlighting a plurality of light points of a free surface of the material contained in the silo, of detecting a position of each of the light points and obtaining electrical signals which are proportional to the detected position of each point, and processing the... Agent: Pearne & Gordon LLP

20080309949 - Laser metrology system and method: A laser metrology system for determining a location of a target utilizes a laser projector having a laser source for projecting a laser beam. A rotating head directs the laser beam in a lateral direction. A sensor associated with the laser projector is capable of sensing the laser beam. A... Agent: Howard & Howard Attorneys, P.C.

20080309950 - Calibrating a lithographic apparatus: The X, Y and Rz positions of a mask stage are measured using two optical encoder-reading heads measuring displacements of respective grid gratings mounted on the mask stage. The grid gratings are preferably provided on cut-away portions of the mask table so as to be coplanar with the pattern on... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20080304038 - High frequency electrical signal control device and sensing system: A high frequency electrical signal control device comprises a transmitter for generating a high frequency electrical signal, a receiver, a transmission line for propagating the electrical signal, and a structure for radiating the electrical signal propagated through the transmission line to the space or receiving a signal from the space.... Agent: Fitzpatrick Cella Harper & Scinto

20080304040 - Cargo dimensional and weight analyzing system: A laser scanner apparatus is disclosed herein for measuring the geometry and physical dimensions of one or more objects in a specified location or platform. The specified location or platform is within a range less than a predetermined maximum object distance. The laser scanner includes a waveform generator that generates... Agent: Mintz, Levin, Cohn, Ferris, Glovsky And Popeo, P.c Attn: Patent Intake Customer No. 64046

20080304041 - Measuring system: A measuring system, comprising a surveying instrument for projecting a laser beam by rotary irradiation and a photodetection sensor device installed at a measuring point, wherein the surveying instrument comprises a first radio communication unit, the photodetection sensor device comprises a second radio communication unit, and communication can be performed... Agent: Nields & Lemack

20080304042 - Distance/speed meter and distance/speed measuring method: In a distance/speed meter, first and second semiconductor lasers emit parallel laser light beams to a measurement target. A first laser driver drives the first semiconductor laser such that the oscillation interval in which at least the oscillation wavelength monotonically increases repeatedly exists. A second laser driver drives the second... Agent: Blakely Sokoloff Taylor & Zafman LLP

20080304039 - Sensor array and sensor device for a sensor array: The invention proposes a sensor array having a plurality of sensor devices comprising a source of electromagnetic radiation, a receiver for the electromagnetic radiation and a control device, the control device being designed to use the source to emit electromagnetic radiation and being designed to determine a distance covered by... Agent: Burr & Brown

20080304043 - Single-channel heterodyne distance-measuring method: According to the invention, high precision distance measurement may be carried out by the broadcast of pulsed electromagnetic radiation (ES) with at least two pulse repetition frequencies, whereby the pulse repetition frequencies are selected such that the corresponding pulse separations do not have a common multiple in the range of... Agent: Workman Nydegger

20080304044 - High-resolution three-dimensional imaging radar: A three-dimensional imaging radar operating at high frequency e.g., 670 GHz, is disclosed. The active target illumination inherent in radar solves the problem of low signal power and narrow-band detection by using submillimeter heterodyne mixer receivers. A submillimeter imaging radar may use low phase-noise synthesizers and a fast chirper to... Agent: Canady & Lortz LLP

20080304045 - Motion measurement and synchronication using a scanning interferometer with gratings: Indicating relative speed is disclosed. A first grating coupled to a first moving object is illuminated using a coherent light source to generate a first diffracted beam and a diffracted order beam. A second grating coupled to a second moving object is illuminated using the first diffracted beam and the... Agent: Van Pelt, Yi & James LLP

20080304046 - Imaging apparatus for infrared rays nonlinear molecular vibrational microscopy: The present invention relates to an imaging apparatus for infrared rays nonlinear molecular vibrational microscopy. The imaging apparatus comprises a pump beam source for generating an infrared pump beam; a probe beam source for generating a probe beam; a beam combiner which synchronizes temporally and overlaps spatially the pump beam... Agent: The Webb Law Firm, P.C.

20080304047 - Imaging apparatus for ir four-wave mixing polarization microscopy: The present invention relates to an imaging apparatus for IR four-wave mixing polarization microscopy. The imaging apparatus comprises a pump beam source for generating an infrared pump beam; a probe beam source for generating a probe beam (search beam); a polarizer for linearly polarizing the pump beam and probe beam;... Agent: The Webb Law Firm, P.C.

20080304048 - Methods and apparatus for measuring the concentration of a substance in a solution: The present invention relates to methods and apparatus for detecting and measuring the concentration of a substance in a solution, the substance having an absorption at 300 nm or less. The methods and apparatus have particular utility in detecting and measuring the concentration of proteins and nucleic acids.... Agent: Ge Healthcare Bio-sciences Corp. Patent Department

20080304049 - Goniophotometer: A goniophotometer includes two independent towers: a main support tower and an upright mirror tower. A swing arm is connected to the main support tower and can be rotated around a main horizontal axis. An elliptic flat rotation mirror, a first detector and a second detector are fixed to the... Agent: Hamre, Schumann, Mueller & Larson, P.C.

20080304050 - Stage apparatus, exposure apparatus, and device fabrication method: A stage apparatus comprising a first stage and second stage configured to be able to move between a first area and second area on a stage moving surface of a base, a first mirror and second mirror arranged on the first stage and second stage, respectively, to measure positions of... Agent: Fitzpatrick Cella Harper & Scinto

20080304051 - Inspecting end surfaces of fiber optic connectors: A system for inspecting the end faces of fiber optic connectors includes a fixture holding a plurality of fiber optic connectors. The system also includes an inspection device configured to inspect end faces of each of the fiber optic connectors, the inspection device including a movement device to which the... Agent: Merchant & Gould PC

20080304052 - Plasma shunting apparatus and method for ring laser gyroscope: A ring laser gyroscope includes a first plasma shunt arranged to prevent the plasma from contacting a first mirror in the gain region and a second plasma shunt arranged to prevent the plasma from contacting a second mirror in the gain region. The first and second plasma shunts may comprise... Agent: John H. Lynn

20080304053 - Apparatus and method for coating and inspecting objects: An apparatus and method for inspecting objects for an inspection criteria thereon includes a conveyor to receive a plurality of objects, a removal assembly located along the conveyor for removing the objects, and an inspection system located along the conveyor prior to the removal assembly for inspecting the objects against... Agent: Winston & Strawn LLP Patent Department

20080304054 - Method for analyzing an integrated circuit, apparatus and integrated circuit: A method for analyzing an integrated circuit (IC) comprising a plurality of semiconductor devices is disclosed. The method comprises the steps of forming a diffraction lens (100) comprising a plurality of concentric diffraction zones (110) in a first area of a further surface opposite to the first surface of the... Agent: Nxp, B.v. Nxp Intellectual Property Department

20080304058 - Coordinate measuring machine and method for structured illumination of substrates: A coordinate measuring machine (1) for the structured illumination of substrates is disclosed. The incident light illumination means (14) and/or the transmitted light illumination means (6) have a pupil access via which at least one optical element (35, 88) is positionable in the optical illumination path (4, 5). The size... Agent: Simpson & Simpson, PLLC

20080304056 - Methods for detecting and classifying defects on a reticle: Methods for detecting and classifying defects on a reticle are provided. One method includes acquiring images of the reticle at first and second conditions during inspection of the reticle. The first condition is different than the second condition. The method also includes detecting the defects on the reticle using one... Agent: Baker & Mckenzie LLP

20080304055 - Surface defect inspection method and apparatus: A surface defect inspection apparatus is structured to add detection signals of multi-directionally detected scattered lights to detect a tiny defect and to individually process the respective detection signals to prevent an error failing to detect an anisotropic defect.... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080304057 - System and method for controlling light scattered from a workpiece surface in a surface inspection system: In one embodiment, a surface analyzer system comprises a radiation targeting assembly to target a radiation beam onto a surface; and a scattered radiation collecting assembly that collects radiation scattered from the surface. The radiation targeting assembly generates primary and secondary beams. Data collected from the reflections of the primary... Agent: Caven & Aghevli LLC

20080304059 - High-sensitivity method for detecting differences between the physically measurable properties of a sample and a reference: A method for detecting differences between physically measurable properties of a sample and a reference sample. A two-dimensional reference field is generated and first and second two-dimensional patterns are produced respectively from the reference sample and the sample. A correction is made to sample response functions to eliminate time-dependent and... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080304060 - Microstructures, method for producing microstructures, and optical field amplifying device: A microstructure is formed on a conductor. The microstructure is equipped with a dielectric base material, in which a great number of fine holes having substantially the same shape in plan view are formed. The fine holes are open at the surface of the dielectric base material, and are substantially... Agent: Sughrue Mion, PLLC

20080304061 - Polarimetric raman system and method for analysing a sample: A Raman method and system for analysing a sample including an excitation source emitting an incident light beam, a sample holder for mounting the sample, elements for focusing the incident light beam onto the sample surface to generate a Raman scattered light having an intensity, elements for collecting the Raman... Agent: Young & Thompson

20080304062 - System and process for sorting biological particles: A system which irradiates light onto a liquid flow containing a biological particle, detects the light therefrom to collect biological information thereon, and sorts the biological particle based upon the biological information, comprises an optical detector for detecting the light from the biological particle; an imaging device for imaging the... Agent: Harness, Dickey & Pierce, P.L.C

20080304064 - Alignment apparatus, control method thereof, exposure apparatus, and method of manufacutring semiconductor device by exposure apparatus controlled by the same control method: An apparatus including a stage configured to be moved. A first laser interferometer measures a position of the stage in a first direction. A second laser interferometer measures a position of the stage in the first direction. A control unit (i) obtains a position of the stage based on an... Agent: Fitzpatrick Cella Harper & Scinto

20080304063 - Overlay mark and application thereof: An overlay mark is described, wherein the overlay mark is used for checking the alignment accuracy between a lower layer defined by two exposure steps and a lithography process for defining an upper layer, including a part of the lower layer and a photoresist patter. The part of the lower... Agent: J C Patents, Inc.

20080304065 - Rail sensing apparatus method: A rail sensing and analysis system utilizes a laser sensor 105, 107 to detect displacement of a rail 102, 104 resulting from loads imposed by a passing rail vehicle. Vertical and/or lateral displacements/loads may be sensed. Signatures in the resulting signals are indicative of useful information about the rail vehicle;... Agent: General Electric Company Ge Global Patent Operation

20080304066 - Method for measuring the concentration of a gas component in a measuring gas: There is described a method for measuring a concentration of a gas component in a measuring gas, wherein the light of a wavelength tunable light source is passed along a single optical path through a measuring volume containing the measuring gas and a reference cell containing a reference gas to... Agent: Siemens Corporation Intellectual Property Department

20080304067 - Smoke detector: The detector further comprises at least one mask disposed adjacent to the reflector, the mask being suitable for selecting those light beams that, at the inlet of said mask, have emission directions lying in a predetermined angular range.... Agent: Davidson, Davidson & Kappel, LLC

20080304068 - Biochip production method, biochip, biochip analysis apparatus, and biochip analysis method: e

20080304070 - Bi-directional reflectance distribution measuring instrument: The invention concerns a bidirectional reflectance distribution meter having a light source which illuminates a sample using pre-determinable elevation and a light receiver, which can be moved relative to the light source in order to receive light from the sample. To this end, it has been designed that the light... Agent: Baker & Daniels LLP 111 E. Wayne Street

20080304069 - Systems and methods for inspecting a specimen with light at varying power levels: Systems and methods for inspecting a specimen with light at varying power levels are provided. One system configured to inspect a specimen includes a light source configured to generate light. The system also includes a power attenuator subsystem configured to alter a power level of the light directed to the... Agent: Baker & Mckenzie LLP

20080304071 - Interferometric system for the use of special-purpose optical systems: An interferometric system which includes an illumination arm having a light source and an illumination optical system for forming an illumination beam path; an object arm having a special-purpose optical system for measuring an object for the purpose of forming an imaging beam path; a reference arm having an adjusting... Agent: Kenyon & Kenyon LLP

20080304073 - Method and apparatus for conjugate quadrature interferometric detection of an immunoassay: A detection system for detecting target material is provided. The system comprises a photonic structure having a reflectance-band and associated side bands; an illumination source for illuminating at a wavelength in at least one of an edge of the reflectance-band and the side bands of the photonic structure and for... Agent: Bose Mckinney & Evans LLP

20080304072 - Optical sensing devices with spr sensors based on differential phase interrogation and measuring method using the same: Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe... Agent: Darby & Darby P.C.

20080304074 - Optical catheter configurations combining raman spectroscopy with optical fiber-based low coherence reflectometry: The present invention provides apparatuses and methods for sample analysis, such as tissue analysis, that integrate high wavenumber (HW) Raman spectroscopy for chemical composition analysis and optical coherence tomography (OCT) to provide depth and morphological information. The invention also provides side-viewing optical probes that are based on a single double... Agent: Diamond Law Office LLC

20080304075 - Interferometer for optically measuring an object: An interferometer for optically measuring an object (10), including a light source (1), at least one beam splitter (2) and at least one detector (12a, 12b), with the beam splitter being arranged in the beam path of the light source such that a light beam created by the light source... Agent: Volpe And Koenig, P.C.

20080304076 - Systems and methods for packaging and mounting readout and laser intensity monitor sensors: Methods and apparatus for applying sensors to a ring laser gyro. An example apparatus includes a housing having a cavity, a laser intensity monitor (LIM) sensor mechanically and electrically connected within the cavity of the housing, and a readout sensor mechanically and electrically connected within the cavity of the housing.... Agent: Honeywell International Inc. Patent Services Ab-2b

20080304077 - Cyclic error compensation in interferometry systems: A first portion of a beam including a first frequency component is directed along a first path. A second portion of the beam is frequency shifted to generate a shifted beam that includes a second frequency component different from the first frequency component and one or more spurious frequency components... Agent: Fish & Richardson PC

20080304078 - Method and apparatus for optically analyzing a surface: In one embodiment, a system to measure defects on a surface of a wafer and an edge of the wafer using a single tool comprises a radial motor to move an optical head in a radial direction to detect defects at locations displaced from the edge of the wafer, and... Agent: Caven & Aghevli LLC

20080304079 - Displacement measurement sensor head and system having measurement sub-beams comprising zeroth order and first order diffraction components: A sensor head for use with a measurement grating is described. The sensor head comprises: a splitter grating configured to split a light beam into first and second measurement beams; a first retroreflector configured to retroreflect the first and second measurement beams toward the measurement grating; and a second retroreflector... Agent: Agilent Technologies Inc.

20080304080 - Aspheric lens surface-decenter measuring method and apparatus: A relationship between surface decenter of a lens 1 under test and surface-decenter comatic aberration and a relationship between surface tilt of the lens 1 under test and surface-tilt comatic aberration are calculated by computer simulation. The surface tilt of the lens 1 under test is calculated by measuring a... Agent: Birch Stewart Kolasch & Birch

20080304081 - Acquisition of surface normal maps from spherical gradient illumination: An apparatus for generating a surface normal map of an object may include a plurality of light sources having intensities that are controllable so as to generate one or more gradient illumination patterns. The light sources are configured and arranged to illuminate the surface of the object with the gradient... Agent: Mcdermott Will & Emery LLP

20080304083 - Method and apparatus for noncontact relative rail displacement, track modulus and stiffness measurement by a moving rail vehicle: An on-board, noncontact measurement system and method is disclosed for measuring track quality, vertical track stiffness and vertical track modulus for a portion of track underlying the rail vehicle. The system comprises first and second optical emitters mounted to the vehicle and configured to emit beams of light that are... Agent: Shook, Hardy & Bacon LLP Intellectual Property Department

20080304084 - Multi position detecting method and area detecting method in infrared rays type touch screen: A method for detecting the coordinates of multiple touching objects on an infrared touch screen without errors and a method for detecting the area of the touched spot are provided. The coordinate detection method includes measuring and storing the maximum received level of a pair of infrared emitting and receiving... Agent: Ipla P.A.

20080304082 - Optical sensor system on an apparatus for treating liquids.: An optical sensor system on an apparatus for treating liquids, with a device for projecting light to at least one illumination position in space, at least one device for imaging the at least one illumination position on at least one photo detector in order to supply a measurement signal depending... Agent: Vidas, Arrett & Steinkraus, P.A.

20080304085 - Device for inspecting countersunk holes: The invention is a non contact laser inspection self centering device to inspect the counter sink portion of a counter sunk fastener hole on a surface. In detail, the self centering and seating device includes a combination laser transmitter and receiver for transmitting a laser bean across a surface and... Agent: Louis L. Dachs

20080297759 - Device for optical distance measurement: P

20080297760 - Geodesic measuring instrument with a piezo drive: In a geodesic measuring instrument (4) with a fixing device (8) for positioning the measuring instrument (4) and with a measuring component (7) having an optical beam path for surveying a target, whereby the measuring components (7) are mounted in an aligning component (5) that can be moved relative to... Agent: Workman Nydegger

20080297761 - Measuring apparatus: A measuring apparatus (1) for contactless detection of a distance between a surface (7) of a measurement object (8) and the measuring apparatus (1), and for simultaneous contactless visual detection of the surface (7), has a measuring head (2) holding a distance measuring device (4), a camera apparatus (5) and... Agent: Cermak Kenealy & Vaidya LLP

20080297762 - System and method for determining crosswinds: A system and method for measuring crosswinds includes using a laser to send a signal on a signal path, and receiving response signals backscattered off of aerosols or other materials in the atmosphere along the signal path. Wavefronts of the received responses are perturbated by thermal cell turbulence in the... Agent: Jonathan A. Platt Renner, Otto, Boisselle & Sklar, LLP

20080297763 - Single axis scanning piv system and method: A single axis scanning PIV system, comprising a laser for generating a laser beam, optics for scanning the laser beam through particles in motion, an optical imager for capturing, images of the particles due to interaction between the laser beam and the particles, and a processor for implementing an algorithm... Agent: Lathrop & Gage Lc

20080297764 - Sensor for determining body parameters: A sensor for measuring at least one body parameter, particularly blood and/or tissue parameters, is used for carrying out the measurements of electromagnetic radiation in the transmission or reflection methods, wherein the sensor uses at least one LED as a source of electromagnetic radiation. At least one photodetector is used... Agent: Friedrich Kueffner

20080297765 - Apparatus and method for determining trench parameters: An apparatus includes an evaluating unit and a peak detection unit. The peak detection unit may be configured to determine at least one peak parameter of a peak in a Fourier transformed reflection spectrum of infrared radiation reflected off a sample that may comprise trench structures. The evaluation unit may... Agent: Edell, Shapiro & Finnan, LLC

20080297767 - Reducing exposure risk in ultraviolet light-based electro-optical systems: In an electro-optical system for reading ultraviolet (UV) light-responsive indicia illuminated by a UV light beam having a wavelength shorter than visible light, safety techniques are described for reducing exposure to the UV light beam to within safe limits.... Agent: Kirschstein, Ottinger, Israel & Schiffmiller, P.C.

20080297766 - System and method for measuring fluid aeration: An aeration measurement system for a fluid actuation system is disclosed. The aeration measurement system has a container configured to receive fluid, and a light source configured to emit light into the container. The aeration measurement system also has a light receiver that is configured to receive light from the... Agent: Caterpillar/finnegan, Henderson, L.L.P.

20080297770 - Method for determining physical properties of a multilayered periodic structure: There is provided a method of calculating physical properties of a periodic structure. At least one physical property related to reflectivity or transmittance of a periodic structure is measured, and then, at least one physical property related to reflectivity or transmittance of a virtual periodic structure is calculated to obtain... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20080297771 - Optical measuring system with a high-speed optical sensing device abling to sense luminous intensity and chromaticity: A high-speed optical sensing device is provided in the present invention. The high-speed optical sensing device has an optical detector, a lens set, and a beam splitter. The optical detector is utilized for detecting luminous intensity. The lens set is utilized for concentrating light beams toward a color analyzer. The... Agent: Birch Stewart Kolasch & Birch

20080297768 - Polarization mode dispersion analyzer: A polarization mode dispersion analyzer having a light source, a sensor, an output phase signal analyzer, and a controller. The light source generates a probe light signal that is intensity modulated and also polarization modulated, the light source being adapted to apply the light signal to a device under test.... Agent: Agilent Technologies Inc.

20080297769 - Through-container optical evaluation system: An apparatus, and method of its use, to determine a characteristic of a fluid sample contained inside a closed container. The ratio of intensity for detected radiation (e.g., light), subsequent to its transmission through the container's walls and fluid in the container, at each of a reference wavelength and a... Agent: Holme Roberts & Owen, LLP

20080297772 - Detecting a disturbance in the propagation of light in an optical waveguide: An optical time domain reflectometry apparatus has a laser and light modulator for producing coherent light pulses, each having two sections of higher intensity separated by a gap of lower or substantially zero intensity. As the light pulses propagate along the optical fibre, light is continuously Rayleigh backscattered by inhomogeneities... Agent: Ballard Spahr Andrews & Ingersoll, LLP

20080297773 - Using sets of otdr receive fibers with different lengths of marker events to verify optical fiber connectivity: A test receiver for use with an Optical Time Domain Reflectometer (OTDR), including a first receive fiber having a first attribute, and a second receive fiber having a second attribute different from the first attribute. The attributes may be lengths, marker events, or both. This configuration reduces the number of... Agent: Sughrue Mion, PLLC

20080297774 - Methods and apparatus for optical analysis of samples in biological sample containers: An apparatus and method for optically analyzing samples in a biological sample container containing samples arranged at different locations on the base of the container. An optical acquisition device is provided comprising a detector and an objective. The position of the upper and lower surfaces of the base at each... Agent: Foley And Lardner LLP Suite 500

20080297775 - Method and device for analysing the imaging behavior of an optical imaging element: The invention relates to a method for analyzing the imaging behavior of a first optical imaging element, whereby an object is imaged into an image plane by a second optical imaging element and light in the image plane is detected in a spatially resolved manner, the two optical imaging elements... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20080297776 - Cup attaching apparatus: A cup attaching apparatus for attaching a cup as a processing jig to an eyeglass lens, comprises: an illumination optical system comprising an illumination light source and arranged to illuminate the lens from a side of a front surface of the lens by illumination light from the light source; an... Agent: Oliff & Berridge, PLC

20080297777 - Method of and apparatus for determining geometrical dimensions of a vehicle wheel: A method and an apparatus of determining geometrical dimensions of a motor vehicle wheel (rim/tyre assembly) 1 by contact-less sensing, wherein the wheel is fixed on wheel receiving means 2 of a tyre changer, that at least one light beam 21 is emitted on to the wheel or at least... Agent: Mcdermott Will & Emery LLP

20080297778 - Optical axis adjusting device and optical axis adjusting method using the same: An optical axis adjusting device for adjusting an optical axis in an optical head device may include a rotatable part which is turnably mounted on a main base so that the optical head device is capable of being turned with an axis X which is set to be at a... Agent: Cantor Colburn, LLP

20080297779 - Inspection device and inspection method: An inspection device for inspecting defects of an inspection object including a light source for irradiating a luminous flux to the inspection object; an optical system for guiding reflected light from the inspection object; a photoelectric image sensor having a plurality of photoelectric cells arranged, for converting the light guided... Agent: Mcdermott Will & Emery LLP

20080297780 - Method and configuration for detecting material defects in workpieces: A method and a configuration for automatically or visually detecting material defects, in particular cracks, in a workpiece, includes applying a test agent to the workpiece. The test agent contains color pigments which can be excited by using shortwave light. The workpiece is then irradiated with shortwave light from a... Agent: Lerner Greenberg Stemer LLP

20080297781 - Wafer surface inspection apparatus and wafer surface inspection method: A wafer surface inspection method and apparatus of high sensitivity, and free from performance degradation in terms of cleanliness, coordinate repeatability of foreign particles and the like. Gas for cooling is sprayed onto a laser irradiation position on the wafer surface to prevent an increase in temperature of the foreign... Agent: Mcdermott Will & Emery LLP

20080297782 - Wafer surface inspection apparatus and wafer surface inspection method: A wafer surface inspection method and apparatus of high sensitivity, and free from performance degradation in terms of cleanliness, coordinate repeatability of foreign particles and the like. Gas for cooling is sprayed onto a laser irradiation position on the wafer surface to prevent an increase in temperature of the foreign... Agent: Mcdermott Will & Emery LLP

20080297783 - Defect inspection system and method of the same: In an inspection subject substrate, there is a problem that a defect signal is overlooked due to scattered light from a pattern and sensitivity decreases in an irregular circuit pattern part. The inventors propose a defect inspection method, characterized by comprising: an illumination step of guiding light emitted from a... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080297784 - Inspection technique for transparent substrates: A method for inspecting a transparent substrate provides an index-matching fluid between an index-matched optical coupler and a surface of the transparent substrate. The method repeats, at two or more positions along the surface of the transparent substrate, steps of illuminating an inspection volume within the transparent substrate by directing... Agent: Corning Incorporated

20080297785 - Apparatus for searching for and detecting defects in parts by endoscopy: Apparatus for searching for and detecting defects on parts that are substantially inaccessible, being located behind a wall, the apparatus comprising a first endoscope for illumination in visible light and for observation, the first endoscope and pipes for feeding and spraying penetration test substances being housed together in a rod... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080297786 - Inspecting device and inspecting method: An object of the invention is to provide an inspecting method and an inspecting device which can detect a foreign material and a pattern defect at a high speed and a high precision, and can suppress a cost increase, by correcting a photographed image of an inspected subject and regulating... Agent: Mcdermott Will & Emery LLP

20080297788 - Apparatus and method of biometric determination using specialized optical spectroscopy systems: Methods and apparatuses for performing biometric determinations using optical spectroscopy of tissue. The biometric determinations that are disclosed include determination or verifications of identity, estimation of age, estimation of sex, determination of sample liveness and sample authenticity. The apparatuses disclosed are based upon discrete light sources such as light emitting... Agent: Townsend And Townsend And Crew, LLP

20080297787 - Optical array for the spectrally selective identification of light of a light beam: Disclosed is an optical array (2) for the spectrally selective identification of light of a light beam, particularly for identifying light of a detecting light beam (3) in a preferably confocal scanning microscope (1). Said optical array comprises a means (18) for the spatial spectral decomposition of the light beam,... Agent: Foley And Lardner LLP Suite 500

20080297789 - Raman spectral analysis of pathogens: A method of ablating a viable biological pathogen in a sample. A viable biological pathogen in a portion of the sample is identified by irradiating the sample; assessing radiation scattered from the sample for radiation that exhibits a Raman shift characteristic of the viable biological pathogen, and delivering an ablating... Agent: Morgan, Lewis & Bockius LLP

20080297790 - Work handling: m

20080297791 - Reflection characteristic measuring apparatus, and method for calibrating reflection characteristic measuring apparatus: In a reflection characteristic measuring apparatus 10 and a method for calibrating the reflection characteristic measuring apparatus, multiple standard spectral characteristics, or multiple calibration data based on the multiple standard spectral characteristics are obtained in advance with corresponding reference values relating to an emission characteristic of a light source 21.... Agent: Brinks Hofer Gilson & Lione

20080297792 - Fluorescence detecting module for microreaction and fluorescence detecting system having the same: A fluorescence detecting module for detecting fluorescence in a microchamber and a fluorescence detecting system. The fluorescence detecting module includes a light source irradiating excitation light a collimating lens condensing excitation light irradiated, a dichroic mirror selectively transmitting or reflecting the light according to a wavelength thereof, an objective lens... Agent: Cantor Colburn, LLP

20080297793 - Small object identifying device and its identifying method: A small object identifying device and its identifying method according to which a large number of small objects can be identified. In one embodiment, the device includes a dispersion region section which disperses a large quantity of several kinds of small objects which are labeled by a combination of the... Agent: Haynes And Boone, LLP

20080297794 - Apparatus for optical inspection of wafers during polishing: A measurement system installable within a processing equipment and more specifically within the exit station of a polishing machine. The optical scheme of this system includes a spectrophotometric channel, an imaging channel and also means for holding the wafer under measurement.... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080297796 - Method for the wavelength calibration of a spectrometer: The invention concerns methods for the wavelength calibration of spectrometers and in particular secondary spectrometers which achieve considerably better calibration accuracies than the conventional peak search methods especially for spectrometers with a relatively large bandwidth. The methods according to the invention are based on the principle of a stepwise relative... Agent: Roche Diagnostics Operations Inc.

20080297795 - Methods and apparatus for optical analysis of samples in biological sample containers: An apparatus and method for optically analyzing samples in a biological sample container containing samples arranged at different locations on the base of the container. An optical acquisition device is provided comprising a detector and an objective. The position of the upper and lower surfaces of the base at each... Agent: Foley And Lardner LLP Suite 500

20080297797 - Chamber particle detection system: Embodiments of the present invention provide an apparatus and a method for chamber particle source identification. The chamber particle source identification method and apparatus can greatly shorten the time it takes to identify chamber particle source(s). In one embodiment, a chamber particle monitor assembly for a processing chamber is provided.... Agent: Martine Penilla & Gencarella, LLP

20080297798 - Apparatus and method to monitor particulates: An apparatus, method and system for detecting and quantizing levels of specific airborne particle contamination in areas to be monitored for a plurality of users 201. Sealed particulate samplers 100 are distributed to a plurality of users 201. Samplers 100 are opened during a test period so that airborne particulate... Agent: Wyssen Hans

20080297799 - Evanescent wave multimode optical waveguide and sensor with high mode coupling: There is provided an evanescent wave multimode optical waveguide sensitive to a chemical species or to a physical parameter. The optical waveguide comprises a core and a cladding having a cladding refractive index lower than that of the core for guiding light to be propagated in the optical waveguide. The... Agent: Ogilvy Renault LLP

20080297800 - Optical element, sensor device, manufacturing method of optical element, detection element, target substance measuring device and detection method: An optical element 4 of the present invention includes a conductive microstructure 6 having a conductive property, and detects an optical spectrum signal varied by the binding of measured molecules on the surface of the conductive microstructure 6. The optical element 4 has a distribution in the direction to the... Agent: Fitzpatrick Cella Harper & Scinto

20080297802 - Detecting element, detecting device, and method of producing the detecting element: A detecting element and a detecting device having high sensitivity, and a production method thereof are provided. The detecting element for detecting a target substance in a sample includes a substrate and a metal structure. The substrate has a pore in which the thickness direction of the substrate corresponds to... Agent: Fitzpatrick Cella Harper & Scinto

20080297801 - Method for calculating optical constants and substrate processing system: An optical constant calculation method capable of calculating an accurate optical constant of an underlayer film to accurately identify a substrate surface structure. After each of films is layered on a wafer, there are measured the reflectivity of an oxide film under which an organic insulation film is formed and... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080297803 - Optical sensor device for detecting wetting: An optical sensor device (10) is able to be coupled to a window (14), in particular to a windscreen of a motor vehicle. The optical sensor device (10) comprises a sensor unit (12), which includes a emitter (26), a receiver (28) and a light conductor unit (30). By the light... Agent: Tarolli, Sundheim, Covell & Tummino L.L.P.

20080297804 - Imaging system with low coherence light source: An imaging system uses a low coherence light source to image objects at a relatively far distance (at least 10 cm) and/or of a relatively large size (having a dimension of at least 10 cm). An imaging plane is located such that its image path is substantially equal to a... Agent: Jonathan A. Platt Renner, Otto, Boisselle & Sklar, LLP

20080297805 - Spectral balancing system and method for reducing noise in fiber optic gyroscopes: Methods and apparatus are provided for reducing output noise of optical gyros. The apparatus includes a sensing system for circulating counter-propagating light beams and producing an output light beam, a coupler having multiple ports and supplying an input light beam to the sensing system, a first detector coupled to the... Agent: Honeywell International Inc.

20080297806 - Apparatus and method for controlling ranging depth in optical frequency domain imaging: Exemplary embodiments of an apparatus are provided. For example, the exemplary apparatus can include at least one first arrangement providing at least one first electro-magnetic radiation to a sample, at least one second electro-magnetic radiation to a first reference and at least one third electro-magnetic radiation to a second reference.... Agent: Dorsey & Whitney LLP Intellectual Property Department

20080297807 - High precision code plates and geophones: An apparatus and method are disclosed for imaging a diffraction grating with a very high depth of focus, using a highly accurate code plate position measurement system. Positions may be measured to an accuracy of 1 nm or even smaller. The system may be used in fields such as manufacturing... Agent: Patent Department Taylor, Porter, Brooks & Phillips, L.l.p

20080297808 - Optical sensor for extreme environments: An optical sensing probe includes a tube having a tip portion configured for placement in an environment in which conditions are to be sensed and an etalon having a known characteristic disposed proximate the tip portion. The tube also includes a head portion remote from the tip portion containing a... Agent: Beusse Wolter Sanks Mora & Maire, P. A.

20080297809 - Optical position measuring arrangement: An optical position measuring arrangement including a source of illumination that generates one or several bundles of illuminating beams, a measuring graduation that is illuminated by the source of illumination so as to generate a periodic fringe pattern of a defined fringe pattern period and a fiber-optical scanning head, wherein... Agent: Brinks Hofer Gilson & Lione