Optics: measuring and testing inventions 11/08

20080291423 - Optical fringe generation member control apparatus and method therefor: An optical fringe generation member control apparatus includes a detection unit configured to detect an optical fringe, and a control unit configured to control operation of a member on which the optical fringe is generated, based on a detection result by the detection unit.... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080291424 - Hydrogel-actuated micromirrors for optical sensing: A thin, deformable member may be fixed at one end, while another portion of the member rests on a hydrogel substance whose thickness changes depending on a characteristic of a liquid that permeates the hydrogel. When the hydrogel changes thickness and causes part of the member to tilt, a reflective... Agent: Intel Corporation C/o Intellevate, LLC

20080291425 - Removable sorting cuvette and nozzle: A flow cell and flow cytometer in which a nozzle at the end of a flow channel is disposed on a removable substrate held at a registered location on a flow cell. Other elements including illumination optics, light collection optics, and the flow cell may then be positioned at fixed... Agent: David W. Highet, Vp & ChiefIPCounsel Becton, Dickinson And Company

20080291426 - Optical measurement of samples: We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the... Agent: Fish & Richardson PC

20080291427 - Optical imaging device suitable for forming images of fingerprints: An optical imaging device for forming optical images of fingerprints of a finger, the device comprising: an optical plate having a portion at one end of a main face that is provided for illuminating the finger through the plate, the reflected light beam propagating with multiple reflections inside the plate... Agent: Miller, Matthias & Hull

20080291429 - Automated process control using parameters determined from a photomask covered by a pellicle: Provided is a method of controlling a photolithography cluster or a subsequent fabrication cluster using optical metrology to determine profile parameters of a photomask structure covered with a pellicle. An optical metrology model of the pellicle is developed and integrated with the optical metrology model of the photomask structure. The... Agent: Tokyo Electron U.s. Holdings, Inc.

20080291428 - Full spectrum adaptive filtering (fsaf) for low open area endpoint detection: A method for precise endpoint detection during etch processing of a substrate based on adaptive filtering of the optical emission spectrum (OES) data, even in low open area etching, is provided. Endpoint detection performed in this manner offers the benefits of increased signal-to-noise ratio and decreased computation costs and delay... Agent: Patterson & Sheridan, LLP - - Appm/tx

20080291430 - Display device and detection method: A display device includes display pixels that display an image on a display screen. First and second optical sensors correspond to one or more of the display pixels and detect the amount of incident light. An optical member allows light coming from a first direction to enter the first optical... Agent: Workman Nydegger

20080291431 - Apparatus for monitoring optical obstructions in an optical split network and method thereof: An apparatus and method for monitoring optical fiber obstructions in an optical split network is described. The monitoring apparatus comprises a broadband-monitoring light source module, an optical circulator, an optical spectral analyzer, a high-density multi-wavelength ODTR, a controlling computer, a wavelength division multiplexer, a specific wavelength optical filter, a monitoring-waveband... Agent: Sinorica, LLC

20080291432 - System and method for monitoring the coupling efficiency of a fiber-optic surgical system: Embodiments of the present invention provide a system and method for allowing a user to monitor the coupling efficiency of a fiber-optic surgical system. An embodiment of the present invention can include: an energy source to produce a beam of light, a fiber in optical communication with the energy source... Agent: Alcon

20080291433 - Lens meter: The present invention has an object to provides a lens meter which readily enables alignment of a progressive lens even by an inexperienced examiner. A lens meter of the present invention comprises a lens meter for measuring optical characteristics of a target lens to be measured, comprising: a measurement optical... Agent: Oliff & Berridge, PLC

20080291434 - Optoelectric angle-measuring device: An optoelectric angle-measuring device according to the invention has a code carrier having a position code (C1) which can be detected optically as well as a scanning device in the form of a light-sensitive row or area for detecting the position code (C1) and generating a position-dependent scanning signal. The... Agent: Workman Nydegger

20080291435 - Position detector, position detecting method and analyzer: A position detector is for detecting a position of liquid held in a vessel. The position detector includes a sound wave generator disposed in contact with the vessel and having a plurality of sound generating elements for generating a sound wave by electrical energy; and a measuring unit that measures... Agent: Scully Scott Murphy & Presser, PC

20080291436 - Defect inspection system: A defect inspection system can suppress an effect of light from a sample rough surface or a regular circuit pattern and increasing a gain of light from a defect such as a foreign material to detect the defect on the sample surface with high sensitivity. When a lens with a... Agent: Mcdermott Will & Emery LLP

20080291437 - method of inspecting a semiconductor device and an apparatus thereof: A method and apparatus of inspecting a sample, in which the sample is inspected under a plurality of inspection conditions, and inspection data obtained by inspecting the sample under each of the plurality of inspection conditions and position information on the sample of the inspection date in correspondence with the... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080291438 - Apparatus and method for checking of containers: A method for detecting one or more foreign substances in one or more containers filled with liquid, comprising of: transporting the containers filled with liquid in a substantially straight line at relatively high speed in a production environment; —illuminating each container with content with one or more fixedly disposed light... Agent: The Webb Law Firm, P.C.

20080291439 - Apparatus and methods for container inspection: Apparatus, systems, and methods to recognize features on bottom surfaces of metal containers on a metal container production line, detect defects in the metal containers, and correlate the defects to specific production equipment of the metal container production line, based in part on the recognized features. The system includes imaging... Agent: Hahn Loeser & Parks, LLP

20080291440 - Apparatus and methods for container inspection: Apparatus, systems, and methods to recognize features on bottom surfaces of containers on a container production line, detect defects in the containers, and correlate the defects to specific production equipment of the container production line, based in part on the recognized features. The system includes imaging apparatus, programmable processing devices,... Agent: Hahn Loeser & Parks, LLP

20080291441 - Spectroscopic support: A porous sample support provides a matrix into the pores or interstitial spaces of which a sample to be subjected to a spectroscopic analysis can be introduced. 2 D infrared spectroscopy can then be carried out on the sample at higher concentrations with minimized background.... Agent: Warner Norcross & Judd LLP

20080291443 - Cars microscopy and spectroscopy using ultrafast chirped pulses: Linear chirped pulses in a Raman excitation scheme provide selective excitation of only one target transition (single mode) in a molecule without disturbing any other transitions or molecules. Selectivity is guaranteed by the adiabaticity of the pulse excitation, which allows manipulation by only a resonant mode while leaving all of... Agent: OpticusIPLaw, PLLC

20080291442 - Chemical and biological sensing using metallic particles in amplifying and absorbing media: A film for surface enhanced raman scattering may be utilized for chemical and biological sensing. The film includes a polymeric layer, and a metallic nanoparticle having a cross-section, the metallic nanoparticle being embedded in the polymeric layer. The polymeric layer has a thickness less than a largest straight line through... Agent: K&l Gates LLP

20080291444 - Method of spectroscopy: A method of multidimensional spectroscopy has a controllable excitation source parameter and comprises controlling said controllable parameter to excite a vibrational mode of the sample, generating a homodyne reflected signal from the sample and obtaining a spectrum of the sample from the reflected signal.... Agent: Warner Norcross & Judd LLP

20080291445 - Spectroscopic instrument, image producing device, spectroscopic method, and image producing method: The spectroscopic instrument includes a plurality of first lenses arranged one-dimensionally or two-dimensionally; an aperture opening provided near a focal plane of each of the plurality of first lenses; a spectroscopic unit that spectrally distribute the light that has passed through the aperture opening; and a light receiving unit that... Agent: Oliff & Berridge, PLC

20080291446 - Optical sensing device: An optical sensing system and method are disclosed. The optical sensing system includes one or more bus waveguides. A first bus waveguide includes an input port that is in optical communication with a light source. The system further includes a microresonator optically coupled to the bus waveguides and an optical... Agent: 3m Innovative Properties Company

20080291447 - Optical chromatic aberration correction and calibration in digital cameras: Methods and the corresponding device are presented for the correction of lateral chromatic aberration within a digital camera or other imaging device, using calibration approaches that do not require previously acquired lens data to effect the correction. An in-camera auto-calibration procedure is performed on the attached lens, such as when... Agent: Davis Wright Tremaine LLP

20080291448 - Methods and apparatus for finding a substrate notch center: Methods and apparatus are provided for locating a notch and/or a center of the notch of a substrate. An exemplary method includes rotating a substrate; illuminating an edge of the substrate with a light beam as the substrate rotates; detecting a change in light intensity of the light beam as... Agent: Dugan & Dugan, PC

20080291449 - System for color match and digital color display: The present invention is directed to a system for digital displaying images of various colors and appearances of an article and the use thereof. The invention is particularly directed to a system for displaying images for selecting one or more matching formulas to match color and appearance of an article.... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center

20080291450 - Wavelength monitoring method and apparatus and method of making same: A wavelength of an optical source is monitored by first and second adjacent detectors on a common base. A bulk reflective component has first and second partially reflective surfaces that respectively direct first and second portions of energy from the source to the first and second detectors. A wavelength discriminator... Agent: Kathy Manke Avago Technologies Limited

20080291451 - Composite sheet material selection method for use in ultra-fast laser patterning: The present invention is a method of selecting composite sheet materials for use in ultra-fast laser patterning of layers of organic thin film material such as OLEDs. The material is selected to accomplish patterning of upper layers without damaging underlying layers by using an ultra-fast laser programmed with the appropriate... Agent: Gregory A. Stobbs

20080291452 - Optical switching device: Optical switching device comprising a substrate on which a magnesium transition metal layer such as a magnesium nickel metal layer is provided. At supplying of hydrogen the magnesium transition metal layer is, starting from the substrate, converted to a magnesium transition metal hydride layer. This has optical properties different from... Agent: Young & Thompson

20080291455 - Active light sensor: An apparatus is described for assessing plant status remotely sensed by the invention thereby allowing selective monitoring or treatment of individual plants. Additionally, the apparatus may be utilized for measuring the reflectance characteristics of soil or of objects in general. The apparatus utilizes a solid state light source to illuminate... Agent: Davis, Brown, Koehn, Shors & Roberts, P.C. The Davis Brown Tower

20080291454 - Inspection systems and methods for extending the detection range of an inspection system by forcing the photodetector into the non-linear range: An inspection system and method is provided herein for increasing the detection range of the inspection system. According to one embodiment, the inspection system may include a photodetector having a plurality of stages, which are adapted to convert light scattered from a specimen into an output signal, and a voltage... Agent: Daffer Mcdaniel LLP

20080291453 - Surface plasmon resonance phenomenon measuring equipment:

20080291457 - Optical displacement sensor: An optical displacement sensor for sensing an environmental stimulus is disclosed. The optical displacement sensor exhibits an optical design that has suppressed back reflection and improved alignment tolerance between its optical components. The sensor is based on an optically resonant cavity whose cavity length is affected by the environmental stimulus.... Agent: Demont & Breyer, LLC

20080291456 - Sensor apparatus and method using optical interferometry: A sensor apparatus and method includes a sensor head with at least two surfaces separated by a gap. One surface is mechanically fixed, a second surface is free to move and deflections of the second surface relative to the first surface are monitored by optical interferometry. In one embodiment, an... Agent: Luke P. Ghislain

20080291458 - Holographic interferometry for non-destructive testing of power sources: The present invention is connected with the holographic interferometry method and device that provides, to a very high precision, the reconstructing the original waveform of light emitted or reflected by an object. This method allows image resolution close to that of the wavelength of the light being used. The non-destructive... Agent: Elena Schembel

20080291459 - Fiber optic gyroscope with integrated light source: An integrated module for a fiber optic gyroscope system includes a fiber optic sensing coil arranged to sense rotations about a sensing axis via the Sagnac effect comprises a substrate, an optical waveguide formed on the substrate, a light source comprising a doped waveguide formed on the substrate. The light... Agent: John H. Lynn

20080291461 - Method and apparatus for suppression of crosstalk and noise in time-division multiplexed interferometric sensor systems: Unwanted signal components in time-division multiplexed (TDM) systems may lead to crosstalk and noise if these pulses overlap with signal pulses from an interrogated sensor. The crosstalk and noise are dominated by interference between the signal pulses from the interrogated sensor and the unwanted signal components and can be greatly... Agent: Patterson & Sheridan, L.L.P.

20080291460 - Opto-electronic system and method for detecting perturbations: A method for detecting and measuring physical perturbations sensed by a multi-mode waveguide, through which a number of modes of a coherent electromagnetic wave propagates through and exit from. The method comprises irradiating the exiting electromagnetic wave on one or more two-dimensional sensing arrays comprising a plurality of sensing elements... Agent: Pearl Cohen Zedek Latzer, LLP

20080291462 - Apparatus and method for using a counter-propagating signal method for locating events: An apparatus and method for using a counter-propagating signal method for locating events is disclosed. The apparatus and method uses a Mach Zehnder interferometer through which counter-propagating signals can be launched. If the sensing zone of the Mach Zehnder interferometer is disturbed, modified counter-propagating signals are produced, and the time... Agent: Michael Best & Friedrich LLP

20080291463 - Polarization-sensitive spectral interferometry: A polarization sensitive spectral interferometer apparatus and method for analyzing a sample. The polarization sensitive spectral interferometer apparatus and method determines polarization properties of the sample.... Agent: Rosenbaum & Associates, P.C.

20080291464 - Interferometric position-measuring devices and methods: Process tools and methods are disclosed that involve interferometric and other measurements of movements and positions relative to a process position, such as movements and positions of a stage relative to a lithographic optical system. An exemplary apparatus includes a stage that places a workpiece relative to the tool, and... Agent: Klarquist Sparkman, LLP

20080291466 - Method and device for non-contact oscillation measurements: A method and a device to measure oscillations of an object. The method includes the processing steps: Determining at least one point of the object to be measured, moving at least one laser interferometer fastened on a carrier into a measuring position for measuring the measuring point on the object,... Agent: Volpe And Koenig, P.C.

20080291465 - Non-destructive inspection using laser-ultrasound and infrared thermography: An inspection system is provided to examine internal structures of a target material. This inspection system includes a generation laser, an ultrasonic detection system, a thermal imaging system, and a processor/control module. The generation laser produces a pulsed laser beam that is operable to induce ultrasonic displacements and thermal transients... Agent: Bracewell & Giuliani LLP

20080291467 - Determining one or more profile parameters of a photomask covered by a pellicle: Provided is a method of determining one or more profile parameters of a photomask covered with a pellicle, the method comprising developing an optical metrology model of a pellicle covering a photomask, developing an optical metrology model of the photomask, the photomask separated from the pellicle by a medium and... Agent: Tokyo Electron U.s. Holdings, Inc.

20080291468 - Apparatus and method for measuring height of protuberances: The height of protuberances present on the surface of a product, typically a bump wafer, can be measured with a high accuracy irrespective of the state of the upper surfaces of the protuberances. In the signal processor of a bump height measuring apparatus, a bump height measurement area setting section... Agent: Mcdermott Will & Emery LLP

20080291469 - Optoelectronic device and resilient member therefor: The present invention relates to an optoelectronic device for determining relative movements or relative positions of two objects, comprising a first object fixed relative to a frame of the device; a second object mounted in spaced relation to the first object and adapted for movement relative thereto; and at least... Agent: Tarolli, Sundheim, Covell & Tummino L.L.P.

20080291470 - System architecture for sensing an absolute position using a target pattern: A location system and a location system on a chip (LCoS) and method are described.... Agent: Agilent Technologies Inc.

20080285007 - System and method for measurement of thickness of thin films: A measurement system that uses a laser triangulation device to measure the thickness of transparent and/or opaque layers of a multilayer film. The triangulation device has a laser device that projects a beam perpendicularly to a surface of the multilayer film and first and second detectors that image first and... Agent: Honeywell International Inc.

20080285008 - Cars/absorption dual mode electro-optic sensor: A target gas sensing system includes a single source at a first location for generating two light beams having first and second frequencies wherein the difference between the first and second frequencies is the Raman frequency of the target gas. A difference frequency generator outputs the two light beams having... Agent: Macpherson Kwok Chen & Heid, LLP

20080285009 - Laser range finder: This invention belongs to instruments for distance measurement (rangefinders). The proposed laser rangefinder contains, serially connected, pulse laser with an optical system, a pulse amplifier and a regulated pulse generator; also, serially connected, a photoreceiver based on an avalanche photodiode with an optical system (conjugate to that of the laser),... Agent: Houston Eliseeva

20080285010 - Object detector: An object detector projects laser light from a projecting part as detecting waves, moves the laser light horizontally and receives reflected waves of the laser light from an object to detect the position of the object from the elapsed time from when the laser light is projected until its reflection... Agent: Beyer Weaver LLP

20080285011 - Apparatus for measuring chemical levels using ph shift: An apparatus for use in measuring the free chlorine level in a solution of halogenated pool/spa water includes a pH adjusting device for producing a first sample of said solution having a first selected pH and a second sample of said solution having a second selected pH, as well as... Agent: Greenberg Traurig LLP (la)

20080285012 - Method for measuring chemical levels using ph shift: A method of measuring the free chlorine level in a solution of chlorinated pool/spa water comprises a first sample of said solution having a first selected pH and a second sample of said solution having a second selected pH and determining first and second ultraviolet light (UV) transmissivity values for... Agent: Greenberg Traurig LLP (la)

20080285013 - Method of checking the filling volume of blisters: A method for checking the volume of material in the form of a thin layer of a powdery substance in pockets of a blister pack including: bringing at least one blister pack to the measuring area of a measuring system, the pack including a plurality of pockets which are designed... Agent: Jansson Shupe & Munger Ltd.

20080285014 - Device and method for measuring optical parameters of liquid crystal display: A device for measuring an optical property of a liquid crystal display is provided. The device has a light source providing a light, a first polarizer pervious to the light, a second polarizer pervious to the light, a detector receiving the light, and a calculating module. The first polarizer and... Agent: Volpe And Koenig, P.C.

20080285015 - Sensing system: In a first aspect according to the invention there is provided a sensing system 100, suitable for sensing the stage of processing of a wafer 200, said sensing system 100 comprising receiving means 110 in the form of a first photosensitive device 110a and a second photosensitive device 110b, detector... Agent: Wells St. John P.s.

20080285017 - Fiber damage detection and protection device: A medical laser system and related methods of monitoring optical fibers to determine if an optical fiber cap on the optical fiber is in imminent danger of failure. The laser system includes a photodetector for converting returned light from the optical fiber cap to an electronic signal for comparison to... Agent: Ams Research Corporation

20080285016 - Method and device for monitoring an optical amplifier, in particular, an optical fiber amplifier: The invention relates to a method for monitoring an optical amplifier, in particular, an optical fiber amplifier, which has an optical input port (3) and an optical output port (5), between which an optical path (7) extends, in which an optical amplification means (9) is arranged, which has at least... Agent: The Culbertson Group, P.C.

20080285018 - Device and method for range-resolved determination of scattered light, and an illumination mask: An illumination mask (10a) for a device for the range-resolved determination of scattered light, having one or more scattered-light measuring structures (11a) which respectively include an inner dark-field zone which defines a minimum scattering range, to an associated image-field mask and a corresponding device is provided. Also provided is an... Agent: Sughrue Mion, PLLC

20080285019 - Interferometry testing of lenses, and systems and devices for same: Modified MZ (Mach-Zender) interferometers preferably are utilized to analyze the transmitted, aspherical wavefront of an ophthalmic lens by mounting the lens in a cuvette having a rotatable carousel that can hold multiple lenses. Fresh, temperature controlled, saline solution is circulated about the lenses, and the cuvette is positioned in a... Agent: Woodcock Washburn LLP

20080285020 - Device having a field mirror for optically testing a surface: The invention generally relates to a compact, inexpensive-to-manufacture device consisting of few components for optically testing a surface. The zone on the surface that is to be investigated is illuminated by a semitransparent mirror and an aspheric field mirror, employing a telecentric optical train, and at least part of the... Agent: Knobbe Martens Olson & Bear LLP

20080285022 - Visual inspection apparatus: A visual inspection apparatus includes: a first substrate holding portion that holds a substrate so that a top surface is observable; a second substrate holding portion that holds the substrate so that a bottom surface is observable; a first substrate holding portion moving mechanism that moves the first substrate holding... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080285021 - Wafer inspecting method and device: A wafer inspecting method including the steps of scanning the surface of a wafer along a street by using a line sensor having a plurality of elements arranged in a line, and determining a deposited condition of foreign matter on the surface of the wafer near electrodes formed on both... Agent: Greer, Burns & Crain

20080285023 - Optical inspection of a specimen using multi-channel responses from the specimen: A method and inspection system to inspect a first pattern on a specimen for defects against a second pattern that is intended to be the same where the second pattern has known responses to at least one probe. The inspection is performed by applying at least one probe to a... Agent: Peters Verny , L.L.P.

20080285024 - Highly efficient surface enhanced raman and fluorescence nanostructure substrates: An apparatus comprising a mechanically stable substrate selected from the group consisting of a semiconductor, metal, and dielectric and at least two nanowires on the substrate, the nanowires comprising a core and a metal shell, wherein the core is selected from the group consisting of a semiconductor and a dielectric,... Agent: Naval Research Laboratory Associate Counsel (patents)

20080285025 - Analyzing apparatus: A light amount is increased and an analyzing accuracy can be kept in accordance with an enlargement of a load angle, however, a scattered light tends to be loaded in an analysis accompanying the scattered light and a dynamic range of a concentration which can be measured becomes narrow. A... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080285026 - Optical characteristic measuring apparatus and measuring method using light reflected from object to be measured: A measurement-purpose light source generates a measurement light used for measuring an optical characteristic of an object to be measured, and the measurement light includes a component in a wavelength range for measurement of the optical characteristic of the object. An observation-purpose light source generates an observation light used for... Agent: Ditthavong Mori & Steiner, P.C.

20080285027 - Hyperspectral / multispectral dispersive system with scanning entry slit moving across lens focus plane: The system works as a stationary enclosure with internal moving parts. The spectrograph and camera are moved in precision by a linear stage in the vertical or horizontal plane depending on whether the slit is vertically set or horizontally set. The precision movement of the assembly is controlled via an... Agent: Emerging Technologies, LLC

20080285028 - Fluorescence spectrophotometer: The present invention compensates a fluctuation of a light-emitting intensity of a light source. First splitting portions (12, 13) in the present invention are used to split lights emitted from the light source, and an excitation light with a specific wavelength (λEx) is incident to a sample element 15. Second... Agent: J C Patents, Inc.

20080285029 - Calibration device for a spectrophotometric system: A method and apparatus for calibrating an NIRS system which includes a sensor portion (42) and for evaluating an NIRS system for proper functioning is provided that includes an enclosure (40) with at least two windows (16,18) disposed in a wall of the enclosure (40) The windows (16,18) allow the... Agent: O''shea Getz P.C.

20080285030 - Device for inspecting vegetable products by spectroscopic analysis of refracted light: Device for inspecting vegetable products in general, and fruit in particular, by spectroscopic analysis of refracted light, comprising a conveyor (1) provided with equidistant seats (21) for receiving single fruits (3), means (6) for laterally illuminating the fruits, and means (100, 200) arranged to collect the refracted light which passes... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080285031 - Use of crossed-beam spectral interferometry to characterize optical pulses: Disclosed are an apparatus and methods for determining electric field characteristics of pulses. In one example, a method is provided in which an unknown pulse is propagated through a first optical fiber. A reference pulse is propagated through a second optical fiber. The unknown pulse and the reference pulse are... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080285032 - Light scattering detector: The light scattering detector according to the present invention aims at simultaneously measuring the molecular weight and size of particles having varieties of diameters. This detector facilitates the measurement operation and knowing how particles associate or dissociate as time progresses. In this detector, the emitted light (static light scattering measurement... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080285033 - Method and device for characterizing analyte using electro-optically modulated surface plasmon resonance based on phase detection: A method and a device for detecting object properties using electro-optically modulated surface plasmon resonance (SPR) based on phase detection is disclosed. In the case of a surface plasmon resonance sensing device according to the present invention, the voltage is applied on the sensing device made of an electro-optic material... Agent: Hdsl

20080285034 - Single-lens 3-d imaging device using a polarization-coded aperture maks combined with a polarization-sensitive sensor: A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens, at least one polarization-coded aperture obstructing the lens, a polarization-sensitive sensor operable for capturing electromagnetic radiation transmitted from an object through the lens and the at least one polarization-coded aperture, and... Agent: Tope-mckay & Associates

20080285035 - Information maintenance during intensity attenuation in focused beams: Maintenance of information content in a focused beam of electromagnetic radiation when the intensity thereof is attenuated by application of an aperture-like element.... Agent: James D. Welch

20080285036 - Determination of light absorption pathlength in a vertical-beam photometer: Disclosed are photometric methods and devices for determining optical pathlength of liquid samples containing analytes dissolved or suspended in a solvent. The methods and devices rely on determining a relationship between the light absorption properties of the solvent and the optical pathlength of liquid samples containing the solvent. This relationship... Agent: Morgan, Lewis & Bockius, LLP

20080285037 - Multi-wavelength mode locked laser: A mode-locked laser employs a light-wavelength-dependent, path-length adjuster to provide different path-lengths for multiple light frequencies and dual modulation frequencies selecting multiple modes with different wavelengths. The result is a single cavity laser producing mode-locked light outputs at defined different frequencies. Tuning of each frequency may be obtained by changing... Agent: Boyle Fredrickson S.c.

20080285038 - Ionizing radiations: A method of determining the radiation doses to which specific locations are subjected is provided. The method comprises providing an assembly comprising a plurality of layers, each of which includes a number of regularly spaced individual compartments that contain a liquid that changes in colour when exposed to radiation, radiating... Agent: Melvin I. Stoltz

20080285039 - Dynamic plasmonics-enabled signal enhancement, a device comprising the same, and a method using the same: Disclosed herein is a plasmonics platform comprising a substrate; a plurality of periodically spaced nanoholes and/or nanoparticles disposed upon the substrate; wherein the average first order of periodicity between the nanoholes and/or the nanoparticles is about 5 to about 1,000 nm; and a microelectromechanical and/or a nanoelectromechanical system in operative... Agent: General Electric Company Global Research

20080285040 - Electrical detection of plasmon resonances: A method includes detecting a plasmon resonance in a material based on a change in at least one electrical property of the material. For example, the material can be a sensor portion of an electrical circuit, wherein the method can further include: exposing the sensor portion to a test material;... Agent: Fish & Richardson PC

20080285041 - Optical device for measuring modulated signal light: An optical device for determining at least one signal light component being characteristic for an optical near-field interaction of a probe with an object to be investigated, wherein the near-field interaction is subjected to a fundamental modulation at a fundamental frequency Ω, comprises an interferometer device with an illumination light... Agent: Ip Group Of Dla Piper US LLP

20080285042 - System for finding integer solutions: A system and a method for finding integer solutions of equations whose graphs are conic sections. The system provides a physical implementation of a geometric formulation of integer solutions of conic sections. The system includes a first source of waves and an arrangement of a plurality of reflectors to provide... Agent: Lieberman & Brandsdorfer, LLC

20080285043 - Interferometric sample measurement: A device for the interferometric measurement of a sample, in particular the eye, including an interferometer arrangement with a first measurement beam path, through which a measurement beam falls onto the sample, and a first reference beam path, through which a reference beam runs, which is applied to the measuring... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20080285044 - devices in miniature for interferometric use and fabrication thereof: A device in miniature and fabrication of such a device for interferometric use is described, the device including a substrate with at least one deep reactive ion etching structure on at least one surface of the substrate forming an optical bench. The optical bench preferably comprises a moving stage, an... Agent: Gardere Wynne Sewell LLP Intellectual Property Section

20080285045 - Determining electric field characteristics of laser pulses: Various systems and methods for analysis of optical pulses are provided. In one embodiment, an optical system is provided having an optical axis. The optical system includes a two-dimensional diffraction grating positioned along the optical axis, and a spectral filter positioned along the optical axis after the two-dimensional diffraction grating.... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080285046 - System and method for improving the resolution of an optical fiber gyroscope and a ring laser gyroscope: A system and method for improving the resolution of an optical fiber gyroscope and a ring laser gyroscope is provided. Entangled photons are introduced into an interferometer of a gyroscope. One or more detectors detect an interference pattern used to determine the angular velocity of a platform. The interference pattern... Agent: Larry W. Fullerton

20080285047 - Optical fiber probe: An optical fiber probe for an optical measuring device having a mechanical receptacle into which an optical fiber is inserted, having a fiber end piece which projects over the mechanical receptacle and is designed for guiding a measuring beam onto a measuring object. In the area of the fiber end... Agent: Kenyon & Kenyon LLP

20080285048 - Method and apparatus for simultaneously acquiring interferograms and method for solving the phase information: A method and apparatus for simultaneously acquiring interferograms created with a plurality of different interference conditions are provided in the present invention. In the present invention, an object beam and a reference beam are used to interfere with each other and there are a plurality of sub-fields of interference simultaneously... Agent: Wpat, PC

20080285049 - Device for optically measuring an object: A device for the optic measuring of an object (1), including a signal processing unit (2) as well as an interferometer with a light source (3) and with at least one detector (4a, 4d). The interferometer is embodied such that a light beam (12) created by the light source (3)... Agent: Volpe And Koenig, P.C.

20080285050 - Position-measuring device: A position-measuring device includes a light source, a first grating, a second grating and photodetectors, light from the light source, which is split into partial beams of different directions at the first and second grating, being directed via a deflecting element to the detector. The deflecting element for incident partial... Agent: Kenyon & Kenyon LLP

20080285051 - Multiple-degree of freedom interferometer with compensation for gas effects: The disclosure features multiple degree-of-freedom interferometers (e.g., non-dispersive interferometers) for monitoring linear and angular (e.g., pitch and/or yaw) displacements of a measurement object with compensation for variations in the optical properties of a gas in the interferometer measurement (and/or reference) beam paths. The disclosure also features interferometry systems that feature... Agent: Fish & Richardson PC

20080285053 - Measuring the shape, thickness variation, and material inhomogeneity of a wafer: In one embodiment, an interferometer system comprises an unequal path interferometer assemble comprising; a first reference flat having a first length L1 in a first dimension, a second reference flat having a second length L2 in the first dimension, a cavity D1 defined by a distance between the first reference... Agent: Caven & Aghevli LLC

20080285052 - Shape measuring apparatus, exposure apparatus, and computer: A shape measuring apparatus for measuring the shape of a measurement target surface includes an interferometer and computer. The interferometer senses interference light formed by measurement light from the measurement target surface and reference light by a photoelectric converter, while changing the light path length of the measurement light or... Agent: Morgan & Finnegan, L.L.P.

20080285054 - Optical metrology optimization for repetitive structures: An optical metrology model for a structure to be formed on a wafer is developed by characterizing a top-view profile and a cross-sectional view profile of the structure using profile parameters. The profile parameters of the top-view profile and the cross-sectional view profile are integrated together into the optical metrology... Agent: Morrison & Foerster LLP

20080285055 - Method and system for determining the properties of a surface of revolution: The invention relates to a method and system for determining the direction and location of the symmetry axis of a revolution-shaped article. Furthermore, the invention enables one to determine the radius of the article as well as the pitch of a possible thread. In the arrangement of the invention, the... Agent: Frommer Lawrence & Haug

20080285056 - Compact 3d scanner with fixed pattern projector and dual band image sensor: A structured light 3D scanner consisting of a specially designed fixed pattern projector and a camera with a specially designed image sensor is disclosed. A fixed pattern projector has a single fixed pattern mask of sine-like modulated transparency and three infrared LEDs behind the pattern mask; switching between the LEDs... Agent: Ilya Blayvas

20080285057 - High precision wide-angle electro-optical positioning system and method: A positioning system for determining an angular position of a vehicle (10) with respect to a predetermined position. The system comprises at least one beacon (12) whose position relative to the predetermined position is known, for generating at least one beam of known optical characteristic that allows deriving of the... Agent: Pearl Cohen Zedek Latzer, LLP

20080285058 - Optical position-measuring device: An optical position-measuring device is arranged for recording the relative position of a scanning unit and a scale movable to it in at least one measuring direction. The scale is configured as a combined unit which includes at least one reflector element as well as a measuring graduation. A light... Agent: Kenyon & Kenyon LLP

20080285059 - Apparatus and method for in-situ monitoring of wafer bonding time: An apparatus and a method for semiconductor wafer bonding provide in-situ and real time monitoring of semiconductor wafer bonding time. Deflection of the wafer edges during the last phase of the direct bonding process indicates the end of the bonding process. The apparatus utilizes a distance sensor to measure the... Agent: Akc Patents

20080285060 - Measuring system for optical monitoring of coating processes: The invention concerns a measuring system for optical monitoring of coating processes in a vacuum chamber, in which the light source is arranged inside the vacuum chamber between the substrate carrier and a shutter is arranged beneath the substrate carrier and the light-receiving unit is arranged outside the vacuum chamber... Agent: Cantor Colburn, LLP

20080278706 - Method for pre-treating specimen and method for analyzing specimen: A pre-treatment method for analyzing a specified portion in a specimen composed of a biological tissue includes the steps of preparing a specimen to be analyzed, determining a specified portion in the specimen; and applying an analysis inhibitor to a portion except the specified portion of the specimen using a... Agent: Fitzpatrick Cella Harper & Scinto

20080278707 - Cytological imaging system and method: The present invention relates to the analysis of cytological material. Specifically, the invention relates to stains and methods of producing the stains, methods of staining cells for cytological or histological analysis to contrast the nuclear portion of the cell from the cytoplasmic portion, and systems and methods for illuminating a... Agent: VistaIPLaw Group LLP

20080278708 - Nanocomposite material for direct spectroscopic detection of chemical vapors: Method and material for spectroscopic detection of organic chemicals. The material is a substantially optically transparent solid, such as ZnS, having a high surface area for adsorption of an analyte, such as organic chemical vapors. The solid material preferably has metal nanoparticles, such as gold, silver or copper nanoparticles, deposited... Agent: Streets & Steele

20080278709 - Optical power measuring apparatus capable of monitoring status of optical fiber contact end: The present invention provides an optical power measuring apparatus capable of monitoring the status, such as cleanness, of an optical fiber contact end face. The disclosed optical power measuring apparatus includes a microscope camera module, an illuminating module, an optical element, an optical power detection unit, a display unit and... Agent: Birch Stewart Kolasch & Birch

20080278710 - Integrated optical vapor cell apparatus for precision spectroscopy: An optical waveguide is provided comprising a non-solid core layer surrounded by a solid-state material, wherein light can be transmitted with low loss through the non-solid core layer. A vapor reservoir is in communication with the optical waveguide. One implementation of the invention employs a monolithically integrated vapor cell, e.g.,... Agent: Woodcock Washburn LLP

20080278711 - Distributed backscattering: The present invention relates to a method for detecting or inferring a physical disturbances on a communications link, in particular by using distributed backscattering. The method includes the steps of: transmitting test signals onto a link; receiving test signals returned from a remote portion of the link; performing a function... Agent: Nixon & Vanderhye, PC

20080278712 - Confocal fiber-optic laser device and method for intraocular lens power measurements: A lens power measuring system has a light source and a fiber-optic light delivery system optically coupled to the light source to receive illumination light from the light source. The fiber-optic light delivery system has a transmit/receive end. The lens power measurement system also has a microscope objective optically coupled... Agent: Venable LLP

20080278713 - Method for identifying refractive-index fluctuations of a target: Systems and methods for identifying refractive-index fluctuations of a target are described in this application. One embodiment includes identifying one or more properties of emergent light, the emergent light to be emergent from a target, and determining refractive-index fluctuations of the target based on the one or more properties of... Agent: Greenberg Traurig, LLP

20080278714 - Rudder angle detecting device of steering gear: The inner cylindrical body is mounted on the top surface of the rudder-stock; the outer cylindrical body is put on the inner cylindrical body exteriorly; the gudgeon pin provided on the top reverse surface of the outer cylindrical body is inserted into the gudgeon provided on the top surface of... Agent: Kusner & Jaffe Highland Place Suite 310

20080278715 - Scanning ladar with adjustable operational parameters: A LADAR has adjustable operational parameters to accommodate surveillance of a particular site. The LADAR includes a controller, a laser source governed by the controller to generate a laser beam pulsed at a pulse repetition rate, an optical scanner, a first set of optics, a first drive assembly governed by... Agent: Calfee Halter & Griswold, LLP

20080278716 - In-process vision detection of flaws and fod by back field illumination: A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device... Agent: Ostrager Chong Flaherty & Broitman, P.C.

20080278717 - Contamination-inspecting apparatus and detection circuit: The detection part has: a subtraction module for calculating correction data from data of detection systems when a reference-voltage generation module applies a reference voltage to the detection systems; a data-holding module for holding the correction data; an addition module for making a correction of detection data; a comparison module... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080278718 - Defect inspection method and apparatus for transparent plate-like members: Included are the step of capturing an image (hereinafter called a first image) of a main surface of a transparent plate material 1 by using a first reflective bright-field optical system disposed at a main surface side of the transparent plate material 1, the first optical system including a linear... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080278719 - Wavelength dependent reflective sample substrates for raman and fluorescence spectroscopy: A material which is generally transparent in the visible region of the spectrum but reflective at laser wavelengths reduces undesirable, substrate-induced Raman and fluorescence scattering. A substrate provides a surface for supporting the sample, with the material being disposed between the surface of the substrate and the sample. The material... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c

20080278720 - Digital spectrophotometer and spectrological method: A digital spectrophotometer and a spectrologial method for determining spectrum wavelength of an unknown illuminant, and the digital spectrophotometer has a base, an operating assembly and a photographic assembly. The operating assembly is attached to the base and has an operating pedestal, a rotating frame and a spectrometer. The rotating... Agent: Hershkovitz & Associates, LLC

20080278721 - Methods and systems for monitoring state of plasma chamber: Provided are methods and systems for monitoring a state of a plasma chamber. In the method, an optical characteristic of plasma generated in a plasma chamber including a window is measured in a predetermined measurement wavelength band. A process status index (PSI) is extracted from the measured optical characteristic. A... Agent: Mills & Onello LLP

20080278722 - Fluorescence detection enhancement using photonic crystal extraction: Enhancement of fluorescence emission from fluorophores bound to a sample and present on the surface of two-dimensional photonic crystals is described. The enhancement of fluorescence is achieved by the combination of high intensity near-fields and strong coherent scattering effects, attributed to leaky photonic crystal eigenmodes (resonance modes). The photonic crystal... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20080278723 - Method, apparatus and system for measuring the transparency of film: A method is disclosed for measuring four factors contributing to transparency of a colored film, namely, Haze, Scatter, Gloss and Bronze values by utilizing a diffuse sphere spectrophotometer.... Agent: Kramer Levin Naftalis & Frankel LLP Intellectual Property Department

20080278724 - Light filter: Various embodiments of a light filter are disclosed.... Agent: Hewlett Packard Company

20080278725 - Compact, low cost particle sensor: A compact, low cost particle sensor utilizing a photodetector (31) which directly collects light scattered by particles (33) entrained in a fluid traversing a beam of light (32). The beam of light (32) is aligned such that it is in close proximity to the photo detector (31). The beam of... Agent: Roger L. Unger

20080278726 - Device having an optical part for analyzing micro particles: Disclosed is a micro particle analyzing device illuminating light to fluid including micro particles, reading the lights emitted from the micro particles at a signal processing reading section and thus analyzing the micro particles. The device comprises a light source section emitting light which will be illuminated to the fluid;... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080278727 - Device for imaging an interior of a turbid medium: The invention relates to a device for imaging an interior of a turbid medium. Said device (1) comprises a measurement volume (15) for accommodating the turbid medium. Said measurement volume (15) comprises a number of sources capable of communicating light, said sources comprising a preferred source, capable of communicating preferred... Agent: Philips Intellectual Property & Standards

20080278728 - Optical sensing based on surface plasmon resonances in nanostructures: Devices and techniques for using nanostructures such as nanohole metal films to construct SPP sensors for sensing various substances.... Agent: Fish & Richardson, PC

20080278729 - Multi-directional projection type moire interferometer and inspection method of using the same: A multi-directional projection type moire interferometer capable of multi-directionally emitting the pattern illumination toward a target object and an inspection method of using the same are provided. The multi-directional projection type moire interferometer includes: an XY stage 10 being provided to be movable by a plurality of stage actuators 11... Agent: Ked & Associates, LLP

20080278730 - Methods and systems for determining optical propertis using low coherence interference signals: Methods and related systems for determining properties of optical systems (e.g., interferometers) and/or optical elements (e.g., lenses and/or lens systems) are described. For example, information related to an optical thickness mismatch of an interferometer can be determined by providing scanning interferometry data. The data typically include obtaining one or more... Agent: Fish & Richardson PC

20080278731 - Composite sensor membrane: A sensor may include a membrane to deflect in response to a change in surface stress, where a layer on the membrane is to couple one or more probe molecules with the membrane. The membrane may deflect when a target molecule reacts with one or more probe molecules.... Agent: Buchanan, Ingersoll & Rooney PC

20080278732 - Reduced coherence symmetric grazing incidence differential interferometer: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a diffraction grating that widens and passes nth order (n>0) wave fronts to the specimen surface and a reflective surface for each channel of the light beam. Two channels and two... Agent: Smyrski Law Group, A Professional Corporation

20080278733 - Probe for measuring the thickness of frost accretion on a surface: The invention relates to a probe for measuring the thickness of frost accretion on a surface. According to the invention, the probe comprises a plurality of measuring stages (E1 to En) which are stacked at least substantially orthogonally to the base (2) of the probe and each measuring stage comprising... Agent: Stevens Davis LLP

20080273191 - Optical tracking device using micromirror array lenses: The optical tracking device of this invention comprises a lens unit, a control circuitry communicatively coupled to the lens unit, and an imaging unit optically coupled to the lens unit. The lens unit comprises at least one Micromirror Array Lens, wherein the Micromirror Array Lens comprises a plurality of micromirrors... Agent: Stereo Display Inc.

20080273190 - Polyspectral rangefinder for close-in target ranging and identification of incoming threats: A computationless system 10 is provided for determining the direction of and distance to a target 42, involving bathing an area surrounding an area to be protected with a polyspectral series of narrow fan beams (xi,)ioo) of different colors from at least two spaced-apart projectors 30, 32. The differently colored... Agent: Bae Systems

20080273193 - Pattern defect inspection apparatus and method: A pattern defect inspection apparatus capable of detecting minute defects on a sample with high sensitivity without generating speckle noise in signals is realized. Substantially the same region on a surface of a wafer is detected by using two detectors at mutually different timings. Output signals from the two detectors... Agent: Miles & Stockbridge PC

20080273192 - Vibration detection device: A vibration detection device capable of improving detection sensitivity when optically performing vibration detection is provided. A vibration detection device includes: a light source emitting a laser beam; an interferometer including a vibrating body and a first reflection body both capable of reflecting the laser beam, and a second reflection... Agent: Rader Fishman & Grauer PLLC

20080273194 - Non contact wheel alignment sensor and method: A sensor and method of determining the orientation of an object, such as the alignment characteristics of a tire and wheel assembly mounted on a vehicle, includes projecting a plurality of light planes from a first light projector onto a tire and wheel assembly to form a plurality of generally... Agent: Van Dyke, Gardner, Linn & Burkhart, LLP

20080273195 - System, method and apparatus for in-situ substrate inspection: A system for inspecting a substrate includes a camera and a light source. The camera is oriented toward a field of view. The field of view encompasses at least a first portion of a first surface of the substrate. The light source is oriented toward the field of view at... Agent: Martine Penilla & Gencarella, LLP

20080273196 - Confocal wafer inspection system and method: A semiconductor wafer inspection system and method is provided which uses a multiple element arrangement, such as an offset fly lens array. The preferred embodiment uses a laser to transmit light energy toward a beam expander, which expands the light energy to create an illumination field. An offset fly lens... Agent: Smyrski Law Group, A Professional Corporation

20080273197 - Machine for inspecting glass containers: A machine for distinguishing blisters from checks on the finish of a glass container. The center of each captured object in an array is determined by a controller which determines the object centers in a plurality of adjacent bands. The band having the most object centers is determined and the... Agent: Emhart Glass Research, Inc.

20080273198 - Enclosure for a linear inspection system: An apparatus for an enclosure of a linear inspection system for the inspection of products that uses at least one camera and at least one laser. The enclosure is placed in a production line environment as to allow the passage of the products to pass through an aperture of the... Agent: Bereskin And Parr

20080273199 - Spectroscopic system and method for predicting outcome of disease: A system and method to predict the progression of disease of a test sample. A group of known biological samples is provided. Each known biological sample has an associated known outcome including a non-diseased sample or a diseased sample. A Raman data set is obtained for each known biological sample.... Agent: Morgan, Lewis & Bockius LLP

20080273200 - Measurement method, measurement apparatus, exposure apparatus, and device fabrication method: A measurement method of measuring a wavefront aberration of an optical system to be measured, comprising a first measurement step of measuring wavefronts of the optical system to be measured with respect to linearly polarized light beams along at least three different azimuths, a first calculation step of calculating a... Agent: Morgan & Finnegan, L.L.P.

20080273201 - Signal module with reduced reflections: Signal modules and methods for electrically interfacing with an electronic device are provided. The signal module includes a dielectric and a conductor extending through a surface of the dielectric. The surface of the dielectric is located away from perpendicular relative to an axis of the conductor and is located based... Agent: Ratnerprestia

20080273202 - Method and system for approximating the spectrum of a plurality of color samples: Method for approximating the spectrum of a plurality of color samples, the method including the procedures of measuring the color of a reference color sample in a color space, determining a reference sample estimated spectrum from the measured color, measuring the actual spectrum of the reference color sample, determining a... Agent: Merchant & Gould PC

20080273203 - Method of evaluating performance of optical sensor and ink jet printing apparatus: Provided are a method of precisely evaluating the performance of an optical sensor including light-emitting elements corresponding to light-emitting wavelengths respectively representing multiple colors as well as a light-receiving element even under a condition in which mists of color inks adhere to the sensor, and a printing apparatus for carrying... Agent: Fitzpatrick Cella Harper & Scinto

20080273204 - Apparatus and method for measuring the spectral properties of a fluid: An apparatus and method for measuring the spectral properties of a paint, dye, enamel or other opaque fluid, both in transmission and reflection, wherein a lock-in amplifier (5) is used to increase substantially the signal-to-noise ratio of transmitted components of electromagnetic radiation passing through the fluid, thereby enabling transmittance measurements... Agent: Harness, Dickey & Pierce, P.L.C

20080273205 - Optical detection apparatus and method using phase sensitive detection method for disk-type microfluidic device: An optical detection apparatus and method using a phase sensitive detection method for a disk-type microfluidic device are provided. The optical detection apparatus includes: a rotation driving unit stopping rotation of the microfluidic device when a detection area of the disk-type microfluidic device reaches a predetermined position; at least one... Agent: Sughrue Mion, PLLC

20080273206 - Biomimetic mineralization method and system: Disclosed are methods and systems that can be quickly and efficiently utilized to examine the kinetics of a growth and development protocol in a controlled environment, for instance in vivo. Disclosed systems can include a synthetic mineralization complex that can nucleate calcium phosphate mineral deposition in a controlled environment, for... Agent: Dority & Manning, P.A.

20080273207 - Sensor device: It has been requested to enhance sensitivity of a surface plasmon resonance sensor in a frequency region from a millimeter wave band to a terahertz band, from 30 GHz to 30 THz. Then, the present invention provides a sensor whose sensitivity is further improved by an analyte holding portion being... Agent: Fitzpatrick Cella Harper & Scinto

20080273208 - Interference filter: This invention relates to an interference filter, especially for use in gas detection with infrared light within a chosen range, comprising at least two essentially parallel and partially reflective surfaces with a chosen distance between them thus defining a cavity delimited by the reflecting surfaces between which the light may... Agent: Rothwell, Figg, Ernst & Manbeck, P.C.

20080273209 - Systems and methods for high-precision length measurement: Provided are systems and methods for performing high-precision length measurement. One such system includes: an optical receiver, configure to receive a reflected optical pulse from a target; an optical combiner, configured to generate a combined optical pulse using the reflected optical pulse and a reference optical pulse; and a signal... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080273210 - Three dimensional shape correlator: A three dimensional shape correlation computer software program which uses laser radar data for target identification. The correlation program obtains a scan of laser radar data of a target from a Ladar sensor. The data includes a plurality of X,Y,Z coordinate detection points for the target. The software simulates the... Agent: Navairwd Counsel Group

20080273211 - Apparatus and method for measuring the surface of a body: In a light-slit method, a first and a second measurement light projection on a surface of an object to be measured may be unambiguously identified as a first or a second measurement light projection by a camera when there is a support apparatus operating the camera and/or the measurement light... Agent: Schoppe, Zimmerman , Stockeller & Zinkler C/o Keating & Bennett , LLP