Optics: measuring and testing inventions 10/08

20080259310 - Optical position detection device and electronic equipment: An optical position detection device capable of detecting a position of a light source with high accuracy and being low priced is provided. A transmission system 1 detects a position of the transmission system 1 relative to a reception system 2 based on a fixed distance L between a second... Agent: Birch Stewart Kolasch & Birch

20080259311 - Measurement method and measurement apparatus using tracking type laser interferometer: A tracking type laser interferometer including: a retro-reflector 20 for reflecting incident measurement light and returning the same in the incident direction and a main body 10 having means for emitting measurement light, means 30 for receiving return light reflected by the recursive reflector and returned therefrom, and means 40... Agent: Rankin, Hill & Clark LLP

20080259312 - Range and velocity sensing system: The present invention relates to a method and apparatus used to calculate at least one velocity component for a target within the region. The invention employs an energy source which is activated using an activation system in a cyclic pattern with a selected source frequency. A receiver is also employed... Agent: Sheridan Ross PC

20080259313 - Apparatus for performing optical measurements on blood culture bottles: An apparatus and method for rapidly distinguishing positive blood cultures from negative blood cultures in sealable containers, and for determining the combination of blood volume and hematocrit in a sealable container. The apparatus comprises an optical source for illuminating the culture with a light beam under an oblique angle to... Agent: David W. Highet, Vp & ChiefIPCounsel Becton, Dickinson And Company

20080259315 - Composition and method for indicating a certain uv radiation dose: A method for indicating a certain UV radiation dose, using a mixture of substances, containing a substance of defined UV photoactivity, a redox dye and a substance acting as a sacrificial electron donor, exposing the mixture to UV radiation and detecting a defined color change when a certain UV radiation... Agent: Locke Lord Bissell & Liddell LLP Attn: Michael Ritchie, Docketing

20080259314 - Inspection device: An inspection device includes a light source emitting ultraviolet light onto a banknote conveyed on a conveyance path, a light source emitting infrared light onto the banknote, a photosensor for detecting light from the banknote, a light source control processing portion for controlling the light sources while individually switching the... Agent: Leydig Voit & Mayer, Ltd

20080259316 - Method and device for testing valuable documents: In an apparatus for testing value documents, such as for example bank notes, an area of the bank note is captured from different directions with the help of two optical sensors aligned symmetrically to each other. The measured values supplied by the sensors on the one hand are added up... Agent: Bacon & Thomas, PLLC

20080259317 - Angle calibration of long baseline antennas: A method for calibrating a sensor mounted on an aircraft includes the steps of: using an optical device to create reference points which define a reference line that is parallel to both horizontal and vertical planes of the sensor, and using the reference line to calibrate the sensor with respect... Agent: Pietragallo Gordon Alfano Bosick & Raspanti, LLP

20080259319 - Foreign substance inspection apparatus: A foreign substance inspection apparatus includes an irradiating unit and first and second detecting units. The irradiating unit is configured to emit irradiating light to be obliquely incident on a surface to be inspected to form a linear irradiation region on the surface to be inspected. The first and second... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080259318 - Multi-channel array spectrometer and method for using the same: A multi-channel array spectrometer combines a spectral measurement system and a reference detector which measures photometric or radiometric qualities. High accuracy photometric or radiometric measurement of a wide dynamic range can be achieved by correcting measurement results of the reference detector with a spectral correction factor. The multi-channel array spectrometer... Agent: Hamre, Schumann, Mueller & Larson, P.C.

20080259320 - Apparatus and method for detecting optical systems in a terrain: A method and an apparatus are used for detecting optical systems, for example a sniper within a terrain. The terrain is optically scanned by means of a movable mirror and the position of the optical system is determined from a measurement made by a laser unit and is optically displayed.... Agent: Harness, Dickey & Pierce, P.L.C

20080259321 - System and method for rapid reading of macro and micro matrices: An analyte reading system which includes a reader unit for rapidly detecting and evaluating the outcome of an assay to measure the presence of analytes in a sample. Quantitative and qualitative measurements of analyte concentration in a sample may be rapidly obtained using the reader device with algorithms which ascertain... Agent: Trask Britt

20080259322 - Method for determining hair conditions: The inventive method allows increasing the intensity of the emission from the hair influenced by the electromagnetic field, thus increasing the values of the signal/noise ratio within the measuring channel, as well as leveling the values of the excited light emission radiated by different hair samples of the same individual;... Agent: Patent, Copyright & Trademark Law Group

20080259324 - Process of using an inspection dye for detecting cracks and flaws in metallic surfaces: The present invention relates to the process of using a unique inspection dye to detect cracks and flaws in metallic surfaces to which the inspection dye has been applied.... Agent: Douglas E. Warren Attorney At Law

20080259323 - Reticle defect inspection apparatus and reticle defect inspection method: A reticle defect inspection apparatus that controls damage of a reticle by irradiation with an inspection light when the reticle is caused to be at rest is provided. The reticle defect inspection apparatus is a reticle defect inspection apparatus for inspecting for defects on a reticle using a pattern image... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080259325 - Vision inspection system device and method: A course material that is applied to a substrate during fabrication of a composite item is inspected by a system that includes a vision assembly. The vision assembly includes an area light, a line generator, a sensor, and an image processor. The area light illuminates an area of the course... Agent: Baker & Hostetler, LLP For Boeing Company

20080259327 - Device for inspecting a microscopic component: A device 1 is disclosed for inspecting, measuring defined structures, simulating structures and structural defects, repair of and to structures, and post-inspecting defined object sites on a microscopic component 2 with an immersion objective 8a. The device 1 comprises a stage that is movable in the x-coordinate direction and in... Agent: Houston Eliseeva

20080259326 - Die column registration: A method for inspecting a plurality of dies, that are typically disposed on a surface of a semiconducting wafer. Each of the dies includes respective functional features within the die. The method consists of identifying within a first die a first multiplicity of the functional features having respective characteristics, and... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20080259328 - Reticle defect inspection apparatus and inspection method using thereof: A reticle defect inspection apparatus that suppresses deterioration of optical components resulting from luminescent spots generated by an integrator and can sustain a defect inspection with high precision for a long time is provided. The reticle defect inspection apparatus is a reticle defect inspection apparatus for inspecting for defects on... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080259329 - Inspection device for inspecting container closures: An inspection device (1) for inspecting container closures (10), having an illumination device (4) which is situated above the container closures (10) to be inspected and illuminates the container closures, an image recording device (2) which is situated above the container closures (10) to be inspected and which records the... Agent: Marshall, Gerstein & Borun LLP

20080259330 - Laser-triggered plasma apparatus for atomic emission spectroscopy: Multiple energy sources, such as a laser and electrical current, are employed, in close coordination, spatially and temporally, to clean a sample, vaporize its material and excite vapor atoms for the purpose of atomic emission spectroscopy. These methods permit better monitoring and control of the individual processes in real time,... Agent: Thermo Finnigan LLC

20080259331 - Photodetector and spectrometer using the same: A photodiode array, having a plurality of photodiodes 12 (n-type channel regions 121), and a light entrance portion 13, formed of an opening that is used to make light to be detected by photodiodes 12 enter, are provided in a substrate 10 of a photodetector 1A having an n-type substrate... Agent: Drinker Biddle & Reath (dc)

20080259332 - Optical spectrum analyzer: An optical spectrum analyzer detects a light output that is dependent on the frequency of light in a wavelength range of light to be measured. The optical spectrum analyzer includes a waveguide acousto-optic tunable filter including a piezoelectric substrate, optical waveguides, and an IDT, a light source for providing, to... Agent: Murata Manufacturing Company, Ltd. C/o Keating & Bennett, LLP

20080259333 - Method and apparatus for improved ellipsometric measurement of ultrathin films: A method for implementing ellipsometry for an ultrathin film includes directing a polarized light beam incident upon a sample surface, receiving an initial reflected beam from the sample surface and redirecting the initial reflected beam back upon said sample surface one or more times so as to produce a final... Agent: Cantor Colburn LLP - IBM Fishkill

20080259334 - Multi layer alignment and overlay target and measurement method: A target system for determining positioning error between lithographically produced integrated circuit fields on at least one lithographic level. The target system includes a first target pattern on a lithographic field containing an integrated circuit pattern, with the first target pattern comprising a plurality of sub-patterns symmetric about a first... Agent: Law Office Of Delio & Peterson, LLC.

20080259335 - Spectroscopic ph measurement at high-temperature and/or high-pressure: Methods and apparatuses for high-temperature and high-pressure measurement of pH and/or alkalinity of a fluid is described.... Agent: Schlumberger-doll Research Attn: Intellectual Property Law Department

20080259336 - Image processing system and camera: An image processing system which performs photography of the teeth of a patient while causing a plurality of illumination light LEDs of different wavelengths to emit light by means of a photography device when producing a crown repair or denture of the patient, whereby image data are acquired. The image... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080259337 - Biological optical measuring apparatus and light detection module: A cerebral function measuring apparatus houses a light detector in a package that can be set on the head of the subject examinee with light detection elements, amplifiers, and high voltage power supplies sealed in the package. Each amplifier and each high voltage power supply are united into one and... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080259338 - Carbonate scale detector: An apparatus and method for detecting carbonate scale. An energy emitting device transmits energy through one optical window, through a fluid stream, and out through a second optical window where the energy is detected by an energy receiving device. As scale, such as that due to carbonate present in the... Agent: Peacock Myers, P.C.

20080259339 - System and method for acquiring and evaluating optical signals: A system and method for measuring and evaluating optical signals for detecting an analyte in an analysis liquid.... Agent: Baker & Daniels LLP / Roche

20080259340 - Airborne tunable mid-ir laser gas-correlation sensor: A method and apparatus for measuring target gas concentrations in an atmosphere. The method and apparatus emit in the atmosphere a laser beam tuned to a molecular absorption line of a target gas, receive a reflected signal affected by gas absorption of the target gas in the atmosphere, divide and... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080259341 - Method and apparatus for optically reading gas sampling test cards: A method and apparatus for measuring a gas concentration detected by a passive sampler are provided. The apparatus includes a light source which illuminates a passive sampler, a detector which detects light from the light source reflected from the passive sampler and provides an output signal, and a microprocessor which... Agent: Sughrue Mion, PLLC

20080259342 - Compositions and methods for drop boundary detection and radiation beam alignment: The invention provides an apparatus and method for determining the position of a radiation beam. The apparatus includes (a) a first reflective surface and a second reflective surface, the reflective surfaces being placed to form the reflective exterior of a wedge; (b) a first detector placed to detect radiation reflected... Agent: Mcdermott, Will & Emery

20080259343 - Angularly resolved scatterometer and inspection method: In an angularly resolved scatterometer, an aperture plate including at least one obscuration extending into the image of the pupil plane is provided. Defocus values of a target pattern are determined from the radial distance between the innermost point of the images of the obscurations and the nominal center if... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080259344 - Interferometry system chamber viewing window: A stroboscopic imaging interferometer system includes an environmental chamber having a novel viewing window equipped with a rigidly integrated beam splitter and piezo actuated reference mirror for illuminating a device providing an object beam and reference mirror for providing a reference beam, upon the reflection of both beams, produces interference... Agent: Carole A. Mulchinski, M1/040 The Aerospace Corporation

20080259345 - Three-dimensional microscope and method for obtaining three-dimensional image: A microscope which has a high three-dimensional resolution, does not require specimens to be stained and is easy to operate, is presented. The three-dimensional microscope includes a first optical system for illuminating an object with lights in a plurality of illuminating directions, one direction after another; an imaging section; a... Agent: Morgan Lewis & Bockius LLP

20080259346 - Optical measuring device for measuring a plurality of surfaces of an object to be measured: An optical measuring device for measuring a plurality of surfaces of an object to be measured using a system of optical elements. For example, the first surface to be measured can be the inner wall of a narrow guide bore, while the second surface to be measured is formed by... Agent: Kenyon & Kenyon LLP

20080259347 - Exposure apparatus, method of controlling the same, and manufacturing method: An exposure apparatus comprises an optical system support supporting a projection optical system, a stage surface plate, first stage and second stages, a first interferometer configured to measure stage position in a first area, a second interferometer configured to measure stage position in a second area, a third interferometer which... Agent: Morgan & Finnegan, L.L.P.

20080259348 - Multiple channel interferometric surface contour measurement system: Described are a multiple channel interferometric surface contour measurement system and methods of determining surface contour data for the same. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. Fringe patterns generated by spatially separate channels in the projector are projected onto an object... Agent: Guerin & Rodriguez, LLP

20080259349 - Exposure apparatus and device manufacturing method: An exposure apparatus, which equipped with a projection optical system that is configured to project a pattern of an original onto a substrate, includes an interferometer configured to measure a wavefront in a first direction and a wavefront in a second direction of light passed through the projection optical system;... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080259350 - Measurement apparatus, exposure apparatus, and device fabrication method: A measurement apparatus which measures a wavefront aberration of an optical system to be measured, the apparatus comprises a detection unit configured to detect an interference pattern formed by light having passed through a mask inserted on an object plane of the optical system to be measured, and a mask... Agent: Fitzpatrick Cella Harper & Scinto

20080259351 - Device and method for recognizing particles in milk: A device for recognizing particles in milk comprising a measuring surface and a housing. The measuring surface is structured so as to cause the milk to spread on the measuring surface in that the measuring surface has a specific surface roughness.... Agent: Jeffry W. Smith Smith Law Office

20080259352 - Apparatus for detecting press-bonded ball at bonding portion in bonding apparatus and method for detecting press-bonded ball at bonding portion: A detecting apparatus used in a bonding apparatus including a capillary and a detection camera disposed with a certain amount of offset from the capillary and capable of detecting a press-bonded ball at a bonding portion after bonding. For a pad in which two edges of a press-bonded ball corresponding... Agent: Quinn Emanuel Urquhart Oliver & Hedges, LLP Koda/androlia

20080259353 - Measurement method, exposure method and device manufacturing method: An image (a latent image) of an aperture pattern that includes an L/S pattern having a linewidth (a space width A) that exceeds the measurement resolution of a measurement device is generated in each of divided areas on a wafer via an optical system (step 410). Next, a part of... Agent: Oliff & Berridge, PLC

20080259354 - Single-lens, single-aperture, single-sensor 3-d imaging device: A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens having a substantially oblong aperture, a sensor operable for capturing light transmitted from an object through the lens and the substantially oblong aperture, and a processor communicatively connected with the sensor... Agent: Tope-mckay & Associates

20080259355 - Method of recognizing and tracking multiple spatial points: The present invention relates to a method of recognizing and tracking multiple spatial points, and more particularly to a method of measuring coordinates of a plurality of point light sources by an optical system comprised of a plurality of 1D optical lens modules and a logical analysis method to achieve... Agent: Wpat, PC

20080259356 - System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers: The invention relates to a system and method for detecting the displacement, such as the deflection, of a plurality of elements (1), such as microcantilevers, forming part of an array (2), by emitting a light beam (4) towards the array (2) and by receiving a reflected light beam on an... Agent: Knobbe Martens Olson & Bear LLP

20080259357 - Optical metrology of single features: The profile of a single feature formed on a wafer can be determined by obtaining an optical signature of the single feature using a beam of light focused on the single feature. The obtained optical signature can then be compared to a set of simulated optical signatures, where each simulated... Agent: Morrison & Foerster LLP

20080259310 - Optical position detection device and electronic equipment: An optical position detection device capable of detecting a position of a light source with high accuracy and being low priced is provided. A transmission system 1 detects a position of the transmission system 1 relative to a reception system 2 based on a fixed distance L between a second... Agent: Birch Stewart Kolasch & Birch

20080259311 - Measurement method and measurement apparatus using tracking type laser interferometer: A tracking type laser interferometer including: a retro-reflector 20 for reflecting incident measurement light and returning the same in the incident direction and a main body 10 having means for emitting measurement light, means 30 for receiving return light reflected by the recursive reflector and returned therefrom, and means 40... Agent: Rankin, Hill & Clark LLP

20080259312 - Range and velocity sensing system: The present invention relates to a method and apparatus used to calculate at least one velocity component for a target within the region. The invention employs an energy source which is activated using an activation system in a cyclic pattern with a selected source frequency. A receiver is also employed... Agent: Sheridan Ross PC

20080259313 - Apparatus for performing optical measurements on blood culture bottles: An apparatus and method for rapidly distinguishing positive blood cultures from negative blood cultures in sealable containers, and for determining the combination of blood volume and hematocrit in a sealable container. The apparatus comprises an optical source for illuminating the culture with a light beam under an oblique angle to... Agent: David W. Highet, Vp & ChiefIPCounsel Becton, Dickinson And Company

20080259315 - Composition and method for indicating a certain uv radiation dose: A method for indicating a certain UV radiation dose, using a mixture of substances, containing a substance of defined UV photoactivity, a redox dye and a substance acting as a sacrificial electron donor, exposing the mixture to UV radiation and detecting a defined color change when a certain UV radiation... Agent: Locke Lord Bissell & Liddell LLP Attn: Michael Ritchie, Docketing

20080259314 - Inspection device: An inspection device includes a light source emitting ultraviolet light onto a banknote conveyed on a conveyance path, a light source emitting infrared light onto the banknote, a photosensor for detecting light from the banknote, a light source control processing portion for controlling the light sources while individually switching the... Agent: Leydig Voit & Mayer, Ltd

20080259316 - Method and device for testing valuable documents: In an apparatus for testing value documents, such as for example bank notes, an area of the bank note is captured from different directions with the help of two optical sensors aligned symmetrically to each other. The measured values supplied by the sensors on the one hand are added up... Agent: Bacon & Thomas, PLLC

20080259317 - Angle calibration of long baseline antennas: A method for calibrating a sensor mounted on an aircraft includes the steps of: using an optical device to create reference points which define a reference line that is parallel to both horizontal and vertical planes of the sensor, and using the reference line to calibrate the sensor with respect... Agent: Pietragallo Gordon Alfano Bosick & Raspanti, LLP

20080259319 - Foreign substance inspection apparatus: A foreign substance inspection apparatus includes an irradiating unit and first and second detecting units. The irradiating unit is configured to emit irradiating light to be obliquely incident on a surface to be inspected to form a linear irradiation region on the surface to be inspected. The first and second... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080259318 - Multi-channel array spectrometer and method for using the same: A multi-channel array spectrometer combines a spectral measurement system and a reference detector which measures photometric or radiometric qualities. High accuracy photometric or radiometric measurement of a wide dynamic range can be achieved by correcting measurement results of the reference detector with a spectral correction factor. The multi-channel array spectrometer... Agent: Hamre, Schumann, Mueller & Larson, P.C.

20080259320 - Apparatus and method for detecting optical systems in a terrain: A method and an apparatus are used for detecting optical systems, for example a sniper within a terrain. The terrain is optically scanned by means of a movable mirror and the position of the optical system is determined from a measurement made by a laser unit and is optically displayed.... Agent: Harness, Dickey & Pierce, P.L.C

20080259321 - System and method for rapid reading of macro and micro matrices: An analyte reading system which includes a reader unit for rapidly detecting and evaluating the outcome of an assay to measure the presence of analytes in a sample. Quantitative and qualitative measurements of analyte concentration in a sample may be rapidly obtained using the reader device with algorithms which ascertain... Agent: Trask Britt

20080259322 - Method for determining hair conditions: The inventive method allows increasing the intensity of the emission from the hair influenced by the electromagnetic field, thus increasing the values of the signal/noise ratio within the measuring channel, as well as leveling the values of the excited light emission radiated by different hair samples of the same individual;... Agent: Patent, Copyright & Trademark Law Group

20080259324 - Process of using an inspection dye for detecting cracks and flaws in metallic surfaces: The present invention relates to the process of using a unique inspection dye to detect cracks and flaws in metallic surfaces to which the inspection dye has been applied.... Agent: Douglas E. Warren Attorney At Law

20080259323 - Reticle defect inspection apparatus and reticle defect inspection method: A reticle defect inspection apparatus that controls damage of a reticle by irradiation with an inspection light when the reticle is caused to be at rest is provided. The reticle defect inspection apparatus is a reticle defect inspection apparatus for inspecting for defects on a reticle using a pattern image... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080259325 - Vision inspection system device and method: A course material that is applied to a substrate during fabrication of a composite item is inspected by a system that includes a vision assembly. The vision assembly includes an area light, a line generator, a sensor, and an image processor. The area light illuminates an area of the course... Agent: Baker & Hostetler, LLP For Boeing Company

20080259327 - Device for inspecting a microscopic component: A device 1 is disclosed for inspecting, measuring defined structures, simulating structures and structural defects, repair of and to structures, and post-inspecting defined object sites on a microscopic component 2 with an immersion objective 8a. The device 1 comprises a stage that is movable in the x-coordinate direction and in... Agent: Houston Eliseeva

20080259326 - Die column registration: A method for inspecting a plurality of dies, that are typically disposed on a surface of a semiconducting wafer. Each of the dies includes respective functional features within the die. The method consists of identifying within a first die a first multiplicity of the functional features having respective characteristics, and... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20080259328 - Reticle defect inspection apparatus and inspection method using thereof: A reticle defect inspection apparatus that suppresses deterioration of optical components resulting from luminescent spots generated by an integrator and can sustain a defect inspection with high precision for a long time is provided. The reticle defect inspection apparatus is a reticle defect inspection apparatus for inspecting for defects on... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080259329 - Inspection device for inspecting container closures: An inspection device (1) for inspecting container closures (10), having an illumination device (4) which is situated above the container closures (10) to be inspected and illuminates the container closures, an image recording device (2) which is situated above the container closures (10) to be inspected and which records the... Agent: Marshall, Gerstein & Borun LLP

20080259330 - Laser-triggered plasma apparatus for atomic emission spectroscopy: Multiple energy sources, such as a laser and electrical current, are employed, in close coordination, spatially and temporally, to clean a sample, vaporize its material and excite vapor atoms for the purpose of atomic emission spectroscopy. These methods permit better monitoring and control of the individual processes in real time,... Agent: Thermo Finnigan LLC

20080259331 - Photodetector and spectrometer using the same: A photodiode array, having a plurality of photodiodes 12 (n-type channel regions 121), and a light entrance portion 13, formed of an opening that is used to make light to be detected by photodiodes 12 enter, are provided in a substrate 10 of a photodetector 1A having an n-type substrate... Agent: Drinker Biddle & Reath (dc)

20080259332 - Optical spectrum analyzer: An optical spectrum analyzer detects a light output that is dependent on the frequency of light in a wavelength range of light to be measured. The optical spectrum analyzer includes a waveguide acousto-optic tunable filter including a piezoelectric substrate, optical waveguides, and an IDT, a light source for providing, to... Agent: Murata Manufacturing Company, Ltd. C/o Keating & Bennett, LLP

20080259333 - Method and apparatus for improved ellipsometric measurement of ultrathin films: A method for implementing ellipsometry for an ultrathin film includes directing a polarized light beam incident upon a sample surface, receiving an initial reflected beam from the sample surface and redirecting the initial reflected beam back upon said sample surface one or more times so as to produce a final... Agent: Cantor Colburn LLP - IBM Fishkill

20080259334 - Multi layer alignment and overlay target and measurement method: A target system for determining positioning error between lithographically produced integrated circuit fields on at least one lithographic level. The target system includes a first target pattern on a lithographic field containing an integrated circuit pattern, with the first target pattern comprising a plurality of sub-patterns symmetric about a first... Agent: Law Office Of Delio & Peterson, LLC.

20080259335 - Spectroscopic ph measurement at high-temperature and/or high-pressure: Methods and apparatuses for high-temperature and high-pressure measurement of pH and/or alkalinity of a fluid is described.... Agent: Schlumberger-doll Research Attn: Intellectual Property Law Department

20080259336 - Image processing system and camera: An image processing system which performs photography of the teeth of a patient while causing a plurality of illumination light LEDs of different wavelengths to emit light by means of a photography device when producing a crown repair or denture of the patient, whereby image data are acquired. The image... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080259337 - Biological optical measuring apparatus and light detection module: A cerebral function measuring apparatus houses a light detector in a package that can be set on the head of the subject examinee with light detection elements, amplifiers, and high voltage power supplies sealed in the package. Each amplifier and each high voltage power supply are united into one and... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080259338 - Carbonate scale detector: An apparatus and method for detecting carbonate scale. An energy emitting device transmits energy through one optical window, through a fluid stream, and out through a second optical window where the energy is detected by an energy receiving device. As scale, such as that due to carbonate present in the... Agent: Peacock Myers, P.C.

20080259339 - System and method for acquiring and evaluating optical signals: A system and method for measuring and evaluating optical signals for detecting an analyte in an analysis liquid.... Agent: Baker & Daniels LLP / Roche

20080259340 - Airborne tunable mid-ir laser gas-correlation sensor: A method and apparatus for measuring target gas concentrations in an atmosphere. The method and apparatus emit in the atmosphere a laser beam tuned to a molecular absorption line of a target gas, receive a reflected signal affected by gas absorption of the target gas in the atmosphere, divide and... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080259341 - Method and apparatus for optically reading gas sampling test cards: A method and apparatus for measuring a gas concentration detected by a passive sampler are provided. The apparatus includes a light source which illuminates a passive sampler, a detector which detects light from the light source reflected from the passive sampler and provides an output signal, and a microprocessor which... Agent: Sughrue Mion, PLLC

20080259342 - Compositions and methods for drop boundary detection and radiation beam alignment: The invention provides an apparatus and method for determining the position of a radiation beam. The apparatus includes (a) a first reflective surface and a second reflective surface, the reflective surfaces being placed to form the reflective exterior of a wedge; (b) a first detector placed to detect radiation reflected... Agent: Mcdermott, Will & Emery

20080259343 - Angularly resolved scatterometer and inspection method: In an angularly resolved scatterometer, an aperture plate including at least one obscuration extending into the image of the pupil plane is provided. Defocus values of a target pattern are determined from the radial distance between the innermost point of the images of the obscurations and the nominal center if... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080259344 - Interferometry system chamber viewing window: A stroboscopic imaging interferometer system includes an environmental chamber having a novel viewing window equipped with a rigidly integrated beam splitter and piezo actuated reference mirror for illuminating a device providing an object beam and reference mirror for providing a reference beam, upon the reflection of both beams, produces interference... Agent: Carole A. Mulchinski, M1/040 The Aerospace Corporation

20080259345 - Three-dimensional microscope and method for obtaining three-dimensional image: A microscope which has a high three-dimensional resolution, does not require specimens to be stained and is easy to operate, is presented. The three-dimensional microscope includes a first optical system for illuminating an object with lights in a plurality of illuminating directions, one direction after another; an imaging section; a... Agent: Morgan Lewis & Bockius LLP

20080259346 - Optical measuring device for measuring a plurality of surfaces of an object to be measured: An optical measuring device for measuring a plurality of surfaces of an object to be measured using a system of optical elements. For example, the first surface to be measured can be the inner wall of a narrow guide bore, while the second surface to be measured is formed by... Agent: Kenyon & Kenyon LLP

20080259347 - Exposure apparatus, method of controlling the same, and manufacturing method: An exposure apparatus comprises an optical system support supporting a projection optical system, a stage surface plate, first stage and second stages, a first interferometer configured to measure stage position in a first area, a second interferometer configured to measure stage position in a second area, a third interferometer which... Agent: Morgan & Finnegan, L.L.P.

20080259348 - Multiple channel interferometric surface contour measurement system: Described are a multiple channel interferometric surface contour measurement system and methods of determining surface contour data for the same. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. Fringe patterns generated by spatially separate channels in the projector are projected onto an object... Agent: Guerin & Rodriguez, LLP

20080259349 - Exposure apparatus and device manufacturing method: An exposure apparatus, which equipped with a projection optical system that is configured to project a pattern of an original onto a substrate, includes an interferometer configured to measure a wavefront in a first direction and a wavefront in a second direction of light passed through the projection optical system;... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080259350 - Measurement apparatus, exposure apparatus, and device fabrication method: A measurement apparatus which measures a wavefront aberration of an optical system to be measured, the apparatus comprises a detection unit configured to detect an interference pattern formed by light having passed through a mask inserted on an object plane of the optical system to be measured, and a mask... Agent: Fitzpatrick Cella Harper & Scinto

20080259351 - Device and method for recognizing particles in milk: A device for recognizing particles in milk comprising a measuring surface and a housing. The measuring surface is structured so as to cause the milk to spread on the measuring surface in that the measuring surface has a specific surface roughness.... Agent: Jeffry W. Smith Smith Law Office

20080259352 - Apparatus for detecting press-bonded ball at bonding portion in bonding apparatus and method for detecting press-bonded ball at bonding portion: A detecting apparatus used in a bonding apparatus including a capillary and a detection camera disposed with a certain amount of offset from the capillary and capable of detecting a press-bonded ball at a bonding portion after bonding. For a pad in which two edges of a press-bonded ball corresponding... Agent: Quinn Emanuel Urquhart Oliver & Hedges, LLP Koda/androlia

20080259353 - Measurement method, exposure method and device manufacturing method: An image (a latent image) of an aperture pattern that includes an L/S pattern having a linewidth (a space width A) that exceeds the measurement resolution of a measurement device is generated in each of divided areas on a wafer via an optical system (step 410). Next, a part of... Agent: Oliff & Berridge, PLC

20080259354 - Single-lens, single-aperture, single-sensor 3-d imaging device: A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens having a substantially oblong aperture, a sensor operable for capturing light transmitted from an object through the lens and the substantially oblong aperture, and a processor communicatively connected with the sensor... Agent: Tope-mckay & Associates

20080259355 - Method of recognizing and tracking multiple spatial points: The present invention relates to a method of recognizing and tracking multiple spatial points, and more particularly to a method of measuring coordinates of a plurality of point light sources by an optical system comprised of a plurality of 1D optical lens modules and a logical analysis method to achieve... Agent: Wpat, PC

20080259356 - System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers: The invention relates to a system and method for detecting the displacement, such as the deflection, of a plurality of elements (1), such as microcantilevers, forming part of an array (2), by emitting a light beam (4) towards the array (2) and by receiving a reflected light beam on an... Agent: Knobbe Martens Olson & Bear LLP

20080259357 - Optical metrology of single features: The profile of a single feature formed on a wafer can be determined by obtaining an optical signature of the single feature using a beam of light focused on the single feature. The obtained optical signature can then be compared to a set of simulated optical signatures, where each simulated... Agent: Morrison & Foerster LLP

20080252874 - Ladar stream formatting and processing method: A Lasar Stream format is provided which is a logical structure that encapsulates Ladar sensor data generated by a Ladar sensor. The data is packaged into message structures for transmission over a transport medium. The messages form a data stream and when the messages arrive at a destination the messages... Agent: Navairwd Counsel Group

20080252873 - Laser radar driving apparatus: A laser radar driving apparatus applying a laser beam to a target object and detecting the laser beam reflected and returned from the target object to measure a distance to the target object, at least comprising: an optical member that the laser beam is applied to; a main body member... Agent: Fish & Richardson P.C.

20080252875 - Laser beam projecting device: A laser beam projecting device, comprising a laser light source for emitting a laser beam, a wavelength selecting film for allowing the laser beam from the laser light source to. pass, and a birefringent optical member arranged on an optical axis closer to an exit side than the wavelength selecting... Agent: Nields & Lemack

20080252876 - System for measuring the image quality of an optical imaging system: A measuring system (100) for the optical measurement of an optical imaging system (150), which is provided to image a pattern arranged in an object surface (155) of the imaging system in an image surface (156) of the imaging system, comprises an object-side structure carrier (110) having an object-side measuring... Agent: Sughrue Mion, PLLC

20080252877 - Inspection of eggs in the presence of blood: The invention relates to a device for inspecting eggs for the presence of blood. The device comprises a light source in order to pass light at a first wavelength which is not selectively absorbed by blood and light at a second wavelength which is selectively absorbed by blood through an... Agent: Townsend And Townsend And Crew, LLP

20080252878 - Light analyzer device and method for detecting objects utilizing the light analyzer device: A light analyzer device and a method for detecting objects utilizing the light analyzer device are provided. The light analyzer device includes a focal plane array configured to receive the light that has passed through a light filter and to generate a first digital image based on the light that... Agent: Delphi Technologies, Inc.

20080252879 - Optical sample measurement device, optical cell and water quality measurement device: An optical sample measuring device such as a turbidity measurement instrument to isolate a portion of a fluid sample and isolate it from the influences of outside light. A sample cell in the instrument can include a cleaning unit that can contact transparent sections of the sample cell for an... Agent: Snell & Wilmer LLP (oc)

20080252880 - Device for inspecting hollow-body cavity: Provided is a hollow-body cavity inspection device for inspecting a hollow-body cavity filled with a limited-wavelength transparent medium. The hollow-body cavity inspection device is capable of multifunction in addition to acquisition of an image and comprises: (1) one or more light sources for emitting two or more inspection light beams... Agent: Venable LLP

20080252881 - High-pressure cross-polar microscopy cells having adjustable fluid passage and methods of use: Apparatus and methods are described for observing samples at non-ambient temperatures and pressures. One apparatus comprises a cell body having a fluid flow-through passage and a light passage intersecting the fluid flow-through passage at an adjustable light pathlength fluid analysis region; first and second light-transmissive windows in the light passage,... Agent: Schlumberger Canada Limited

20080252882 - Filter assembly and image enhancement system for a surveillance camera and method of using the same: A filter assembly adapted to be used with a camera for selectively controlling the light that reaches the camera's aperture. In one embodiment, the filter assembly comprises three filters adapted to be independently moved between a first position wherein they are not in front of the camera's aperture and a... Agent: Shuttleworth & Ingersoll, P.L.C

20080252883 - Spectroscopic determination of concentration in a rectification column: Spectroscopic determination of concentration in a rectification column The present invention relates to a method for determining the concentration in a rectification column by means of IR spectroscopy, wherein the sample is taken under hydrostatic control.... Agent: Lanxess Corporation

20080252884 - Optical detection and analysis of particles: Method and apparatus for the single particle detection of submicron structures such as biological molecules and viruses utilises an optical element (100) comprising an optically transparent substrate (1) partially coated with a thin film of metal (2) illuminated with an optical beam (4) incident on a non-metal coated region (3)... Agent: Barnes & Thornburg LLP

20080252885 - Multiplexing spectrometer: A multiplexing spectrometer measures at least one parameter, such as temperature, pressure or stress. The system multiplexes the outputs of Bragg stack sensors deposited at the distant ends of optical fibers brought in contact or in close proximity to objects. The spectrometer detects the peaks of the optical signals returned... Agent: John M. Hammond Patent Innovations LLC

20080252886 - System and method for solubility curve and metastable zone determination: A system for determining a solubility of a substance comprises a holder to hold a sample comprising an amount of the substance and an amount of the solvent system. The system further comprises a temperature conditioner to alter a temperature of the sample, an optical measurement device to measure an... Agent: Hoffmann & Baron, LLP

20080252887 - Image forming apparatus for forming image on record medium: A particle detecting device including a light source light reflector to reflect a laser light to make it intersect an observed light path of a light detector plural times at different positions, or a scattered light reflector to reflect the observed light path of the light detector to make it... Agent: Amin, Turocy & Calvin, LLP

20080252888 - Apparatus for polarization-specific examination, optical imaging system, and calibration method: A device for polarization-specific examination of an optical system having a detector part that has polarization detector means for recording the exit state of polarization of radiation emerging from the optical system. Also, an associated optical imaging system, and a calibration method for the device. The device includes a polarization... Agent: Sughrue Mion, PLLC

20080252889 - Systems and methods for measurement of a specimen with vacuum ultraviolet light: Various systems for measurement of a specimen are provided. One system includes an optical subsystem configured to perform measurements of a specimen using vacuum ultraviolet light and non-vacuum ultraviolet light. This system also includes a purging subsystem that is configured to maintain a purged environment around the optical subsystem during... Agent: Baker & Mckenzie LLP

20080252890 - Target substance sensor and method thereof using a photonic crystal: The sensor of the present invention includes an electromagnetic wave source of supplying an electromagnetic wave, a photonic sensor element, and a detector. The photonic sensor element has photonic crystalline structure and is configured to include a sensor waveguide for introducing the electromagnetic wave, and a sensing resonator electromagnetically coupled... Agent: James E. Armmstrong, Iv Edwards Angell Palmer & Dodge LLP

20080252891 - Photoacoustic gas sensor: A photoacoustic sensor includes a sensor system for photoacoustic detection, at least one noise canceling pressure sensor and a control system in operative connection with the noise canceling pressure sensor to actively cancel the effects of noise in the environment on the sensor system. Another photoacoustic sensor includes a measurement... Agent: James G. Uber, Esq. Mine Safety Appliances Company

20080252892 - Absorption spectroscopy apparatus and method: An absorption spectroscopy apparatus including an elliptical mirror centered on the midpoint between a source/detector and a mirror. The cavity between the elliptical mirror and the source/bolometer and mirror defines an interior volume of a sample cell. Electromagnetic radiation from the source/detector travels along a multi-segment path starting from the... Agent: Foley & Lardner LLP

20080252893 - Headset mounted apparatus mounting a visor with interchangeable filter sets: A portable apparatus having a source, a detector and a filtering element placed a known distance from the source and/or the detector. One embodiment of the apparatus is a headlamp having an illumination source, a camera, and two eye pieces. The headlamp has an adjustable headband for positioning the headlamp... Agent: Elizabeth R. Hall

20080252894 - Subwavelength resolution optical microscopy: Provided herein are methods for imaging subwavelength structures in three dimensions and with high resolution. The methods comprise illuminating subwavelength structures with an illuminating wavelength of light and detecting the self-image generated thereby at a distance distal to the structures. Also provided is a method for confining propagating light to... Agent: Benjamin Aaron Adler Adler & Associates

20080252895 - Test method for the testing of the functional capability of a monitoring sensor, monitoring method and monitoring sensor: The invention furthermore relates to a monitoring method for the monitoring of a protective field, in which a sensor test method in accordance with the invention is used for the testing of the functional capability, and to a monitoring sensor for the carrying out of the test method in accordance... Agent: Harness, Dickey & Pierce, P.L.C

20080252896 - Image forming apparatus for forming image on record medium: A laser beam is irradiated on a record medium, a speckle generated by surface scattering is measured by an image sensor, speckle information obtained is subjected to FFT transform, and a paper quality of the record medium is discriminated from a peculiar pattern due to roughness of the surface of... Agent: Amin, Turocy & Calvin, LLP

20080252897 - Method and a system for the assessment of samples: The present invention offers an alternative strategy for the correlation of interference information to chemical and/or physical properties of a sample. This strategy can be implemented in a method and a system, which offer substantial technical and commercial advantages over state of the art techniques based on interference spectroscopy. The... Agent: Merchant & Gould PC

20080252898 - Method for optically testing semiconductor devices: A method for optically testing semiconductor devices or wafers using a holographic optical interference system with light source providing a light beam of coherent wavelength with a wavelength to which the semiconductor material is transparent, splitting the light beam into a reference beam and an object beam, imposing the object... Agent: Davis Wright Tremaine, LLP/seattle

20080252899 - Optical coherence tomography system and optical coherence tomography method: A tunable light source 10 for varying emission wavelength periodically and an optical interferometer are used. A reflector is disposed at a measurement position, a light interference signal is A/D converted at a regular time interval, and data numbers at timing giving peak and bottom are calculated according to a... Agent: Smith Patent Office

20080252900 - Optical tomography system: In an optical tomography system, polarization maintaining optical fibers are employed to guide a light beam emitted by a light source unit to a light dividing means, to guide a measuring light beam from the light dividing means to a probe, to guide the measuring light beam and a reflected... Agent: Sughrue Mion, PLLC

20080252901 - Wavelength-tunable light source and optical coherence tomography: The present invention provides an OCT technique that permits tomographic observation of a biological body parts that is difficult to restrain and also provides a tomographic observation technique for the observation of a constrainable part that does not require constraint and remove the burden from biological body. A wavelength-tunable light... Agent: Volentine & Whitt PLLC

20080252902 - Method and device for detecting direction of member having outer periphery formed in vertically asymmetrical shape: A method and a device for identifying an upper surface and a lower surface of a component having asymmetric upper and lower outer shapes are provided. The components include, for example, disk-like, cylindrical, or annular components, more specifically engine parts having an orientation such as piston rings. In particular, a... Agent: Husch Blackwell Sanders LLP

20080252903 - Method for determining the focal position of at least two edges of structures on a substrate: A method for determining the focal position of at least two edges of structures (31) on a substrate (30) is disclosed. During the movement of a measurement objective (21) in the Z-coordinate direction, a plurality of images of the at least one structure (31) is acquired with at least one... Agent: Houston Eliseeva

20080252904 - Optical measuring machine: An optical measuring machine includes a screen having a reference line, a movable stage, a detector for detecting a displacement of the stage, the first and second image-forming units for forming optical image(s) of a target object mounted on the stage on the screen, and a storage for storing the... Agent: Oliff & Berridge, PLC

20080252906 - Absolute position length-measurement type encoder: An absolute position length-measurement type encoder includes a scale having an incremental track, an absolute track, and a reference position track. The incremental track has incremental patterns including first light and dark patterns formed at equal intervals in first periods. The absolute track has absolute patterns representing an absolute position.... Agent: Rankin, Hill & Clark LLP

20080252905 - Centrifugal force based microfluidic device, microfluidic system including the same, and method of determining home position of the microfluidic device: Provided is a centrifugal force based microfluidic system including: a microfluidic device including a rotatable platform and an optical path formed to extend horizontally in a straight line from a circumference of the platform; a motor rotating so as to control the microfluidic device; a light emitting unit emitting light... Agent: Sughrue Mion, PLLC

20080252907 - Apparatus and method for determining an elevation of working tools based on a laser system: An apparatus for determining an elevation of a working tool relative to a reference plane, includes a rotary laser system, a radio unit and a detector. The rotary laser system emits a rotating laser beam in a plane inclined relative to the reference plane. The radio unit is configured to... Agent: Glenn Patent Group

20080252908 - Controlling a fabrication tool using support vector machine: A fabrication tool can be controlled using a support vector machine. A profile model of the structure is obtained. The profile model is defined by profile parameters that characterize the geometric shape of the structure. A set of values for the profile parameters is obtained. A set of simulated diffraction... Agent: Morrison & Foerster LLP

20080246942 - Radar device: A laser radar sensor includes a photoreceptor, a dummy circuit, an amplifier, a selector, and the first and the second detection circuits. A photoreception signal outputted from the photoreceptor and an output signal of the dummy circuit are amplified by the amplifier, and inputted to the second detection circuit. A... Agent: Harness, Dickey & Pierce, P.L.C

20080246943 - Laser radar projection with object feature detection and ranging: A 3D pulsed laser projection system scans an object to produce a dense 3D point cloud and projects a laser light beam onto an object as a glowing template. A high-sensitivity optical feedback system receives and detects a feedback beam of the output beam light diffusely reflected from the object.... Agent: Edwards Angell Palmer & Dodge LLP

20080246944 - Photon counting, chirped am ladar system and related methods: Ladar systems and methods are provided. One embodiment is a ladar system comprising: a chirp generator for generating a chirped waveform; a laser for transmitting a light signal toward a target, the light signal being modulated by the chirped waveform; and a photon-counting sensor for receiving a temporally-modulated photon stream... Agent: U S Army Research Laboratory Attn Amsrl Cs Cc Ip

20080246945 - Apparatus for quantifying shear stress on a formulation comprising biomolecules: The present invention relates to an apparatus for determining the shear sensitivity of particles in solutions and methods of determining the respective shear velocities or the respective shear stress.... Agent: Michael P. Morris Boehringer Ingelheim Usa Corporation

20080246946 - Method and a system for determination of particles in a liquid sample: The present invention relates to a method for the assessment of quantity and quality parameters of biological particles in a liquid analyte material. The method comprises applying a volume of a liquid sample to an exposing domain from which exposing domain electromagnetic signals from the sample in the domain can... Agent: Merchant & Gould PC

20080246948 - Automatic polarizer for cctv applications: The invention is related to a camera device (10) for CCTV applications. The camera device (10) comprises a sensor (12) comprising a lens (14) for monitoring the scene in front of the camera device (10). At least one polarizer element (16) is assigned to said sensor (12), the at least... Agent: Michael J. Striker

20080246950 - Device, method, and program for estimating light source: A light source estimating device includes a light receiving section for receiving visible light and invisible light radiated from a light source, and a light source estimating section for estimating a type of the light source on the basis of an intensity of the received visible light and an intensity... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080246951 - Method and system for using reflectometry below deep ultra-violet (duv) wavelengths for measuring properties of diffracting or scattering structures on substrate work-pieces: A method and apparatus is disclosed for using below deep ultra-violet (DUV) wavelength reflectometry for measuring properties of diffracting and/or scattering structures on semiconductor work-pieces is disclosed. The system can use polarized light in any incidence configuration, but one technique disclosed herein advantageously uses un-polarized light in a normal incidence... Agent: O'keefe, Egan, Peterman & Enders LLP

20080246947 - Optical pulse generator for distributed temperature sensing operating at a characteristic wavelength in a range between 1050 nm and 1090 nm: An improved laser source for use in a distributed temperature sensing (DTS) system (and DTS systems employing the same) includes a laser device and drive circuitry that cooperate to emit an optical pulse train at a characteristic wavelength between 1050 nm and 1090 nm. An optical amplifier, which is operably... Agent: Schlumberger Reservoir Completions

20080246949 - Optical train and method for tirf single molecule detection and analysis: In one aspect the invention relates to an apparatus for analyzing the presence of a single molecule using total internal reflection. In one embodiment an apparatus for single molecule analysis includes a support having a sample located thereon; two sources of light at distinct wavelengths, a collimator for directing the... Agent: Cooley Godward Kronish LLP Attn: Patent Group

20080246952 - Fingerprint imaging system: A fingerprint imaging system configured to capture an image of a friction ridge pattern of a subject (e.g., a fingerprint, a palm print, a hand print, a footprint, etc.). The system may include one or more components that reduce the impact of ambient light on the performance of the system.... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080246954 - Fluorescence detector and liquid chromatograph having the fluorescence detector: The fluorescence detector includes: a flow cell provided on a flow passage for flowing a sample; a sample temperature control block for keeping the flow cell and the flow passage located on the sample inlet side of the flow cell at a constant temperature; an excitation optical system; a fluorescence... Agent: Cheng Law Group, PLLC

20080246953 - Transmission concentration device capable of reducing environmental temperature effect: A transmission concentration device capable of reducing environmental temperature effect comprises mainly a concentration detector arranged in the fluid communication space of a fluid circulating apparatus in a fuel cell system where the fluid temperature in the concentration detector and the fuel cell is equal to help minimize measurement error... Agent: G. Link Co., Ltd.

20080246955 - Method of detecting alcohol concentration and alcohol concentration detecting apparatus: In a detection of an alcohol concentration, a first light and a second light are irradiated to a mixed liquid including a fossil fuel, an alcohol, and water, and the alcohol concentration is calculated based on amounts of the first light and the second light permeated through the mixed liquid.... Agent: Nixon & Vanderhye, PC

20080246956 - Method of instrument standardization for a spectroscopic device:

20080246957 - Hybrid fiber optic transceiver optical subassembly: The subassembly includes a laser for emitting signals towards fibers to be monitored, a first photodetector for monitoring reflected laser signals from the fibers, a second photodetector for monitoring laser output power, and an optical fiber. The optical fiber has an angled fiber facet. The laser emits signals toward and... Agent: Naval Air Warfare Center Aircraft Division Office Of Counsel Bldg 435

20080246958 - Multiple surface inspection system and method: A system for inspecting components is provided. The system includes a prism having a first end, a second end, a first reflecting surface, and a second reflecting surface. The first end of the prism is located in a plane that is parallel to and axially separated from a plane of... Agent: Mr. Christopher John Rourk Jackson Walker LLP

20080246959 - Method of manufacturing nitride semiconductor device including sic substrate and apparatus for manufacturing nitride semiconductor device: Excitation light is irradiated onto a GaN layer on a silicon carbide substrate constituting a layered product that is set on a stage. Then light is emitted from a defective part caused by a structural defect of the silicon carbide substrate out of the GaN layer. By using this light... Agent: Venable LLP

20080246960 - Fiber quality transducer: A fiber quality transducer includes an inlet mixing probe, a rotating valve sleeve, a camera and a sampling cell. Slurry from a pulp tube flow enters a mixing chamber in the inlet mixing probe. The amount of slurry entering the mixing chamber is controlled by the rotating valve sleeve. The... Agent: Donald J. Ersler, S.c.

20080246961 - Biosensors with porous dielectric surface for fluorescence enhancement and methods of manufacture: Biosensors are disclosed which include a surface for binding to sample molecule to the biosensor in the form of a porous, thin film of dielectric material, e.g., TiO2. In one example the porous, thin film is in the form of a multitude of sub-micron sized rod-like structures (“nanorods”) projecting therefrom.... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20080246962 - Linear fiber array mount to a spectrometer: A coupler for coupling a linear fiber array to a spectrometer is provided, the coupler having a tube, a linear fiber bundle array inserted through the tube, an alignment mechanism for aligning the linear fiber bundle array with a slit on the spectrometer, and a locking mechanism for locking the... Agent: Sills Cummis & Gross P.C.

20080246964 - Method and its apparatus for inspecting particles or defects of a semiconductor device: Conventionally, a particle/defect inspection apparatus outputs a total number of detected particles/defects as the result of detection. For taking countermeasures to failures in manufacturing processes, the particles/defects detected by the inspection apparatus are analyzed. Since the inspection apparatus outputs a large number of detected particles/defects, an immense time is required... Agent: Townsend And Townsend And Crew, LLP

20080246963 - Particle counting method: A particle counting method is provided whereby a liquid sample is radiated by a laser light, scattered light produced by causing the laser light to hit a particle in the liquid sample is detected by a photoelectric conversion element, and a sample value which is the output of the photoelectric... Agent: Sheridan Ross PC

20080246965 - Optical particle sensor with exhaust-cooled optical source: The invention relates to particle sensors that are capable of passively cooling high-powered optical sources within the sensor, thereby extending the optical source lifetime without requiring additional power. The sensor detects particles within a sample fluid by optical interaction of the optical source with flowing sample fluid in the sample... Agent: Greenlee Winner And Sullivan P C

20080246966 - Surface-inspecting apparatus and surface-inspecting method: Defect inspection of repeated pattern on a surface is executed by reducing influence of a base layer. Thus, surface-inspecting apparatus and method include unit irradiating repeated pattern on specimen's surface with illuminating light, units setting an angle formed by direction on an incidence plane's surface including irradiating direction of illuminating... Agent: Oliff & Berridge, PLC

20080246967 - Apparatus for reading a color symbol: The present invention provides an apparatus for reading a color symbol, which comprises a matrix of color filters arranged in front of a detector. Light received from the filters of some colors is used to locate the color symbol, while light received from all the filters is used to read... Agent: Kaplan Gilman Gibson & Dernier L.L.P.

20080246968 - Systems and methods to analyze multiplexed bead-based assays using backscattered light: This invention relates to a system and method related to an epifluorescence microscope based optical system equipped with a tunable filter to localize microspheres in bead-based assays based on a back-scattered light (also known as reflected light) image. A common optical path for reflected and emitted luminescence in conjunction with... Agent: Casimir Jones, S.c.

20080246969 - Apparatus and method for measuring optical property: An optical property measuring apparatus and an optical property measuring method of the invention determine a specified optical property of a sample by using a distribution function indicating a distribution of the amounts of reflected light incident on an optical sensor along a coordinate axis defined on a light-sensing surface... Agent: Brinks Hofer Gilson & Lione

20080246970 - Sensor device and testing method utilizing localized plasmon resonance: A sensor device is formed from a metal film having a plurality of openings, a sensor material positioned within each of the openings, a light source that emits light having a first wavelength, and a light detector that detects light emitted from the light source and transmitted through or reflected... Agent: Fitzpatrick Cella Harper & Scinto

20080246971 - Methods for using light reflection patterns to determine diving angle of grain: Methods are provided for using light reflection patterns to determine various properties of fibrous materials, such as wood. More specifically, the present invention relates to methods for determining a dive angle for grain. Further, the present invention relates to methods for using information in T2 plots, combined with knowledge of... Agent: Weyerhaeuser Company Intellectual Property Dept., Ch 1j27

20080246972 - Tomographic imaging by an interferometric immersion microscope: A device for the tomographic imaging of an object to be analyzed, the device comprising a light source that emits a light beam with a coherence length substantially equal to the thickness of a slice of the object to be analyzed; and an interferometric imaging system comprising at least one... Agent: Blank Rome LLP

20080246973 - Method and device for determining the lateral relative displacement between a processing head and a workpiece: The present invention relates to a method for determining a lateral relative movement between a processing head and a workpiece during processing the workpiece as well as a device to carry it out. In the method a surface of the workpiece (12) is illuminated in the region of the processing... Agent: Breiner & Breiner, L.L.C.

20080246974 - Portable optical measurement assembly: A portable optical measurement assembly for measuring the dimensions of an upper peripheral region of a wall structure of a swimming pool is provided. The assembly comprises an optical unit subassembly including an optical unit casing. The optical unit casing encloses a light source structured and arranged to direct a... Agent: Wolf, Block, Shorr And Solis-cohen LLP

20080239278 - Chromatic sensor lens configuration: A chromatically dispersive lens configuration may be utilized in optical pens for chromatic range sensing. The lens configuration may include a negative power doublet lens and a positive power lens portion. The Abbe numbers of lenses included in the positive power lens portion may be between the Abbe numbers of... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080239279 - Ladar-based motion estimation for navigation: A method for estimating motion with at least one laser radar is disclosed. The method involves scanning a first range image at a first time, locating a plurality of object features in the first range image, scanning a second range image at a second time, receiving motion data for a... Agent: Honeywell International Inc.

20080239281 - Absolute distance meter: An absolute distance meter for measuring a distance to a target may include a synthesizer including a first quadrature modulator and structured to receive a reference signal having a reference frequency and output a first signal having a first frequency and a second signal having a second frequency, a laser... Agent: Cantor Colburn, LLP

20080239280 - Method and device for 3d imaging: “A method for 3D imaging of an actively illuminated target region includes emitting intensity-modulated light at a variable modulation frequency into the target region, the emitted light is scattered/reflected in the target region depending on the optical properties of the objects or beings present therein, a scattered and/or reflected fraction... Agent: Cantor Colburn, LLP

20080239282 - Method and system for simultaneous measurement of strain and temperature: A method and system for simultaneously measuring strain and temperature characteristics of an object involves the attachment to the object of a pair of optical fibers having different refractive indices, the fibers being connected together at least one end thereof, and directing laser light into at least one end of... Agent: Jones, Tullar & Cooper, P.C.

20080239283 - Particle measuring method and particle measuring apparatus: The present invention relates to a particle measuring method for irradiating light to a surface of a substrate to scatter the light so as to measure a condition of particles on the substrate based on the scattered light. The particle measuring method according to the present invention comprises the steps... Agent: Smith, Gambrell & Russell

20080239284 - Application of crossed teflon diffuser to coatings on oriented surfaces: A system and method for measuring coating thickness upon a substrate containing directionally oriented elements is disclosed. A near infrared light is directed upon the coating and reflected near infrared light is collected to determine the coating thickness. A pair of stacked and crossed diffuser elements is placed between the... Agent: Terrell P. Lewis

20080239285 - Fingerprint identification system: A fingerprint ID system providing function of compressed volume of the fingerprint ID system is comprised of adding a reflection device group between fingerprint plane of the device pervious to light and imaging plane of an image sensor; and the device pervious to light and a flat reflection plane group... Agent: Troxell Law Office PLLC

20080239286 - Display panel, color filter and testing method thereof: A color filter with low color shift is defined by a light leakage spectrum in the dark state. The color filter is disposed between two polarizing plates so as to measure a first spectrum of dark state a(λ), wherein the polarizing directions of the polarizers are orthogonal to each other.... Agent: Birch Stewart Kolasch & Birch

20080239288 - 3d shape measurement apparatus and method using stereo moire technique: Disclosed herein is a 3D shape measurement method and apparatus using a stereo moiré technique. The 3D shape measurement method measures the 3D shape of an object to be measured using a digital pattern projector and first and second cameras. The method includes a first step of projecting a phase-shifted... Agent: Graybeal, Jackson, Haley LLP

20080239292 - Apparatus and method for inspecting defects: A defect inspection apparatus of this invention comprises: a stage device 50 on which to rest a wafer 1; a laser light irradiation device 30 that irradiates the wafer 1 on the stage device 50 with inspection light 31; scattered-light detectors 130-132, each of which detects a beam of light,... Agent: Mcdermott Will & Emery LLP

20080239294 - High efficiency balanced detection interferometer: An interferometer configured for use in optical coherence domain (OCT) reflectometry systems is disclosed. In the preferred embodiments, efficient routing of light and a balanced detection arrangement provide a high signal to noise ratio. In one set of embodiments, a pair of cascaded 2×2 couplers is used to split light... Agent: Stallman & Pollock LLP

20080239291 - Inspection apparatus and inspection method: An elevating drive mechanism and an advancing drive mechanism are controlled, by means of control processing of the start of photomultiplier tube idling, such that the vertical irradiation position of a laser beam falls on a reflective plate and, during idling, laser beam is irradiated via reflective plate on photodetectors,... Agent: Mcdermott Will & Emery LLP

20080239287 - Inspection of wood surface roughness: The invention relates to a method for optical inspection of the hirsuteness of a surface. The method comprises directing a light beam (B) to the surface (2) of a wooden piece (1) under study in a direction (D), which deviates from the normal to the surface. The surface is imaged... Agent: Ware Fressola Van Der Sluys & Adolphson, LLP

20080239289 - Method and apparatus for inspecting a semiconductor device: A semiconductor defect inspection apparatus using a method of comparing an inspected image with a reference image includes the following: (1) a light source and an illuminating optical system, (2) plural defect optical imaging systems and photo detectors for scattered light detection, (3) a substrate holder and a stage for... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080239293 - Portable meter to measure chlorophyll, nitrogen and water and methods: Methods for determining chlorophyll content comprise providing a sample, subjecting the sample to light at a first wavelength and detecting a first wavelength response, subjecting the sample to light at a second wavelength and detecting a second wavelength response, and calculating a chlorophyll content of the sample based on at... Agent: Klarquist Sparkman, LLP

20080239290 - Reticle defect inspection apparatus and reticle defect inspection method: A reticle defect inspection apparatus that can carry out a defect inspection with high detection sensitivity are provided. The apparatus includes an optical system of transmitted illumination for irradiating one surface of a sample with a first inspection light, an optical system of reflected illumination for irradiating another surface of... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080239296 - Optical fiber inspection tool: An optical fiber inspection device includes a housing, wherein the housing defines an opening disposed on an end portion. A lens is disposed within the housing, wherein the lens and the opening define an axis of viewing. A fiber position assembly is mounted to the housing. The fiber position assembly... Agent: Merchant & Gould PC

20080239295 - Optical power monitoring with robotically moved macro-bending: A method may include bending a first optical fiber of a plurality of optical fibers; measuring light leaked from the first optical fiber with a photo detector; robotically moving the photo detector to a second optical fiber of the plurality of optical fibers; bending the second optical fiber; and measuring... Agent: Verizon Patent Management Group

20080239298 - Adaptive light-path surface tilt sensor for machine vision inspection: An adaptive light-path surface tilt sensing configuration is provided that identifies when a ray bundle is projected along a direction normal to a workpiece surface. As a result, the tilt of the workpiece surface may be determined. The surface tilt sensor may comprise an illumination and detector portion and an... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080239297 - Multiple head laser projector and method: A multiple laser head projector includes a sensor that senses the presence or absence of a laser beam from a first of the laser heads and signals a switching device to switch to a second laser head when a laser beam is not detected by the sensor from the first... Agent: Howard & Howard Attorneys, P.C.

20080239299 - Crds mirror for normal incidence fiber optic coupling: A cavity ring-down sensor having an optical path of mirrors and an interface proximate to a mirror with a normal incidence optical fiber coupling. The interface may be a block of transmissive materials having different indices of refraction for receiving a light beam of normal incidence from an optical fiber... Agent: Honeywell International Inc.

20080239300 - Laser energy measuring unit and laser machining apparatus: There is provided a laser energy measuring unit whose laser energy measuring range is widened. The laser energy measuring unit has a filter provided within an optical path of laser to attenuate energy of the laser, a calculating section for measuring the energy of the laser passing through the filter... Agent: Wenderoth, Lind & Ponack, L.L.P.

20080239301 - Visual inspection apparatus: A visual inspection apparatus includes an upper illuminator, a lower illuminator, a side illuminator, and a pair of inclined illuminators, which illuminate the peripheral edge of a wafer, and illuminates the peripheral edge of the wafer brightly. A gap is formed in the upper illuminator and illumination light of an... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080239302 - Inspecting apparatus for glass substrate: An inspecting apparatus for a glass substrate detects blurs of a green color filter layer, a blue color filter layer, a column spacer layer, a pixel layer of a thin film transistor, or the like, which are generally hardly inspected. The inspecting apparatus for a glass substrate includes: a first... Agent: Holland & Knight LLP

20080239303 - Coolant passage inspection device and method of vehicle cylinder head coolant passage blockage detection: A vehicle cylinder head coolant passage inspection device and a method for inspecting vehicle cylinder head coolant passages therewith. A device and method of the present invention can be used to detect blockages present within such coolant passages. A device and method of the present invention uses one or more... Agent: Standley Law Group LLP

20080239304 - Apparatus and methods for analyzing samples: The present invention relates to apparatus, systems, and methods for analyzing biological samples. The apparatus, systems, and methods can involve using a vacuum source to pull microfluidic volumes through analytical equipment, such as flow cells and the like. Additionally, the invention involves using optical equipment in conjunction with the analytical... Agent: Cooley Godward Kronish LLP Attn: Patent Group

20080239305 - Reticle assembly of aiming device: A reticle assembly of an aiming device is provided. The reticle assembly includes an illumination source, a first optical mask and a second optical mask. The first optical mask has a plurality of optical openings which define a reticle pattern. The first optical mask is mounted in a fixed position.... Agent: Byip, Ltd.

20080239307 - Sequencing single molecules using surface-enhanced raman scattering: A surface-enhanced Raman scattering method and apparatus to sequence polymeric biomolecules such as DNA, RNA, or proteins is introduced. The method uses metallic nanostructures such as, for example, spherical or cylindrical Au or Ag nanoparticles having characteristic lengths of 10-100 nm which when illuminated with light of the appropriate wavelength... Agent: Lawrence Livermore National Security, LLC

20080239306 - System and method for optical power management: A system and method for managing optical power for controlling thermal alteration of a sample undergoing spectroscopic analysis is provided. The system includes a moveable laser beam generator for irradiating the sample and a beam shaping device for moving and shaping the laser beam to prevent thermal overload or build... Agent: General Electric Company Global Research

20080239308 - High throughput measurement system: A substrate processing system includes a processing module to process a substrate, a factory interface module configured to accommodate at least one cassette for holding the substrate, a spectrographic monitoring system positioned in or adjoining the factory interface module, and a substrate handler to transfer the substrate between the at... Agent: Fish & Richardson P.C.

20080239309 - System and method for measuring air quality using a micro-optical mechanical gas sensor: A system and method for measuring air quality using a micro-optical mechanical gas sensor is disclosed. According to one embodiment of the present invention, the system includes an emission source that includes a conduit gap for receiving a gas; a plurality of electrodes for applying an electric field to at... Agent: Hunton & Williams, LLP/ Sony Ericsson Mobile Communications (usa), Inc.

20080239310 - Fiber optical sensor with optical resonator: A fiber optical sensor includes a light source, a detector and an optical resonator having a multimode optical fiber and two reflective layers respectively provided adjacent to or on ends of the optical fiber. Excitation light from the light source is coupled into the optical resonator through a transparent hole... Agent: Birch Stewart Kolasch & Birch

20080239311 - Fluorescence detection apparatus and method, and prism used therein: In order to provide a fluorescence detection apparatus having a high sensitivity, a high processing capacity and a competitive edge in cost, the fluorescence detection apparatus according to this invention irradiate the sample with light so that the aspect ratio of the form of the irradiated region by light on... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080239312 - Atomic analyzer: [Solving Means] An atomic analyzer includes a plasma generator 10 in which a discharge gas is fed in a micro gap between a pair of electrodes to generate nonequilibrium atmospheric pressure plasma; a bias voltage controller that includes a plasma-leading electrode 21 for leading the nonequilibrium atmospheric pressure plasma generated... Agent: Mcginn Intellectual Property Law Group, PLLC

20080239313 - Arrangement for an optical system for polarization-dependent, time-resolved optical spectroscopy, optical measurement systems and method for the polarization-dependent spectroscopic analysis of measurement light: The invention is directed to an arrangement for an optical system for polarizalion-dependent, time-resolved optical spectroscopy, in particular a spectrometer that includes a polarization device which has a crystal polarizer and includes a light entry area which is arranged upstream of the polarization device and which is formed in such... Agent: Sutherland Asbill & Brennan LLP

20080239314 - Substrate-like particle sensor: A substrate-like particle sensor includes a substrate-like base portion and an electronics enclosure disposed on the substrate-like base portion. A power source is located within the electronics enclosure. A controller is operably coupled to the power source. A particle sensor is operably coupled to the controller and provides an indication... Agent: Christopher R. Christenson Westman, Champlin & Kelly, P.A.

20080239315 - Apparatus and method for determining stress in solar cells: A method and system as described herein provides for detecting certain anomalies in a wafer. According to one aspect, these anomalies relate to defects or stress that can lead to wafer breakage before, during or after further wafer processing. According to other aspects, the method includes passing polarized light through... Agent: Applied Materials C/o Pillsbury Winthrop Shaw Pittman LLP

20080239316 - Method and apparatus for quantitative 3-d imaging: Described is a method and apparatus for obtaining additional information from an object and a method for surface imaging and three-dimensional imaging. Single lens, single aperture, single sensor system and stereo optic systems are enhanced via selective filtering, use of defocusing information, use of an addressable pattern, image matching, and... Agent: Tope-mckay & Associates

20080239317 - Systems, methods, and devices for handling terahertz radiation: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing... Agent: Heslin Rothenberg Farley & Mesiti PC

20080239318 - Method of measuring asymmetry in a scatterometer, a method of measuring an overlay error in a substrate and a metrology apparatus: In a method of measuring asymmetry in a scatterometer, a target portion is illuminated twice, first with 0° of substrate rotation and secondly with 180° of substrate rotation. One of those images is rotated and then that rotated image is subtracted from the other image. In this way, asymmetry of... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080239319 - Inspection apparatus and inspection method: An inspection apparatus includes a wafer stage for carrying a wafer, an illumination module which irradiates an inspection beam on the wafer carried on the wafer stage, a detection module which detects scattering rays or reflection rays from the wafer on the wafer stage and outputs an image signal, a... Agent: Miles & Stockbridge PC

20080239320 - Light-emitting module and methods for optically aligning and assembling the same: An optical alignment method is for a light-emitting module that includes a housing unit, a light-emitting unit disposed in the housing unit, and a lens unit. The optical alignment method includes: (a) through image-capturing techniques, finding a light-emitting point of the light-emitting unit and a predetermined reference point, and determining... Agent: Ostrolenk Faber Gerb & Soffen

20080239321 - Photodectector having dark current correction: A photodetector and method for making the same is disclosed. The photodetector includes a substrate having first, second, and third photodiodes and first and second pigment filter layers. The first, second, and third photodiodes generate first, second, and third photodiode output signals, respectively, each photodiode output signal being indicative of... Agent: Kathy Manke Avago Technologies Limited

20080239322 - Optical absorption gas sensor: An optical absorption gas sensor comprising a body having an internal wall which defines a chamber, at least one aperture in the body through which a gas sample can enter the chamber, a light source, at least one reflector, a detector assembly which extends into the chamber and has a... Agent: Nixon & Vanderhye, PC

20080239323 - Chromatic confocal sensor fiber interface: A fiber interface configuration for a chromatic point sensor optical pen is provided wherein a detector aperture element provides an aperture that is smaller than the light-transmitting core diameter of an optical fiber that is connected to the optical pen. The detector aperture element is fixed relative to the chromatically... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080239325 - Optical sensing methods and apparatus: A method of sensing movement or proximity of objects by optical reflection is provided. The method includes the steps of transmitting a train of optical pulses towards a destination, sensing optical pulses reflected from the destination, and sensing and evaluating movement or proximity characteristics of objects at the destination with... Agent: Buchanan, Ingersoll & Rooney PC

20080239324 - Optical tilt monitoring apparatus: An optical arrangement includes a position sensitive optical detector, a collimated optical source, and a processor configured to monitor the inclination of an object. The collimated optical source is configured to transmit a collimated beam towards the object. The position sensitive optical detector is configured to detect the specific location... Agent: Buchanan, Ingersoll & Rooney PC

20080239326 - Workpiece machining apparatus: There is provided a laser machining apparatus capable of improving workpiece machining precision. The laser machining apparatus having a movable table for supporting a workpiece to be machined and a camera for detecting position of the workpiece by reflection light from an alignment mark formed through the workpiece further includes... Agent: Wenderoth, Lind & Ponack, L.L.P.

20080239327 - Global calibration for stereo vision probe: A method for global calibration of a multi-view vision-based touch probe measurement system is provided which encompasses calibrating camera frame distortion errors as well as probe form errors. The only required features in the calibration images are the markers on the touch probe. The camera frame distortion calibration comprises a... Agent: Christensen, O'connor, Johnson, Kindness, PLLC