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Optics: measuring and testing September archived by title and patent number 09/08

20080231828 - Distance measuring equipment, and method of mounting an electrooptical unit on a lead frame unit: The invention is based on a piece of distance measuring equipment, particularly a laser rangefinder (10) in the form of a hand-held appliance, having a lead frame unit (18) and an electrooptical unit (20, 26) which comprises a transmission or reception unit (22, 28) and a lens support unit (24,... Agent: Michael J. Striker

20080231829 - User-worn rangefinder system and methods: Embodiments of an arm-worn rangefinder device includes a rangefinder body and a switch. The rangefinder body is shaped for coupling to a user's arm and has an electronic rangefinder circuit operable to emit an energy beam directed at a selected target, to receive a reflected beam from the target, and... Agent: Klarquist Sparkman, LLP

20080231830 - Electric optical distance meter: An electric optical distance meter is provided that makes an input power level of a reference light entering a light receiving device via an internal optical path comparable between low and high reflectivity targets. The electric optical distance meter has a shutter 50 for switching between an external optical path... Agent: Roberts Mlotkowski Safran & Cole, P.C.

20080231831 - Ranging apparatus and ranging method: A first ranging apparatus includes a synchronizing signal generator for generating a synchronizing signal at a constant interval, a light-emitting unit for emitting an intensity-modulated light in response to the synchronizing signal input thereto, a light-detecting unit for detecting a reflected light from an object irradiated with the modulated light,... Agent: Sughrue Mion, PLLC

20080231832 - Ranging apparatus and ranging method: A first ranging apparatus includes a light emitter for emitting a modulated light which is intensity-modulated, a light detector for detecting a reflected light from an object that is irradiated with the modulated light, a distance calculator for calculating the distance up to the object based on the phase difference... Agent: Sughrue Mion, PLLC

20080231833 - Method for evaluation of a gemstone: f

20080231834 - Surface plasmon assisted microscope: The present invention includes a microscope and a method for using the microscope for single molecule with reduced photobleaching of a fluorophore (20) that includes a light translucent material (16); a metal layer (18) disposed on the light translucent material (16); a medium (15) disposed on the metal layer (18),... Agent: Chalker Flores, LLP

20080231838 - Detection sensor to detect receiving position of laser light and level device employing the detection sensor to detect receiving position of laser light: A detection sensor to detect a receiving position of laser light according to the present invention includes a pair of light receiving element arrays (11X and 11Y), wherein adjacent light receiving elements (PDXi) are positioned as spaced equidistantly from one another and are mutually connected via a resistor (RXj), and... Agent: Dickstein Shapiro LLP

20080231835 - Divergence ratio distance mapping camera: The present invention relates to a method and system for detecting and mapping three-dimensional information pertaining to one or more target objects. More particularly, the invention consists of selecting one or more target objects, illuminating the one or more target objects using a first light source and capturing an image... Agent: Miller Thompson, LLP

20080231836 - Fuel cell with fuel monitoring system and method of use: A fuel cell (9) includes a removable and replaceable fuel supply (12) having fuel disposed therein. A system for monitoring various parameters of the fuel such as temperature, pressure, and the levels of dissolved oxygen is provided. A plurality of sensors (30) is disposed on the fuel supply side that... Agent: The H.t. Than Law Group

20080231839 - Power-saving control method in laser measuring system and laser measuring system: A power-saving control method in a laser measuring system, which comprises a laser rotary irradiation device for forming a laser reference plane by projecting a laser beam in rotary irradiation and a photodetection device for carrying out position measurement by receiving the laser beam, comprising a step of detecting using... Agent: Nields & Lemack

20080231837 - Quantum bit reading device and method: An apparatus includes a material in a resonator and containing systems, each of the systems having five energy states, a unit generating first and second pulse that resonate in a second transition and a third transition, respectively, a unit controlling the first and second pulse to make the first and... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080231841 - Method and apparatus for gas concentration quantitative analysis:

20080231840 - Methods and apparatus for measuring wavefronts and for determining scattered light, and related devices and manufacturing methods: Methods and apparatus for measuring wavefronts and for determining scattered light, and related devices and manufacturing methods. 2.1. The invention relates to a method and apparatus for spatially resolved wavefront measurement on a test specimen, a method and apparatus for spatially resolved scattered light determination, a diffraction structure support and... Agent: Sughrue Mion, PLLC

20080231842 - High dynamic range photon-counting otdr: An optical time domain reflectometer (OTDR) operates in a gated mode, enabling a predetermined width of an optical fiber to be analyzed. The OTDR may test only a desired position on the fiber. Data obtained along different lengths of the fiber may be combined together, providing a thorough representation of... Agent: Moetteli & Associates Sarl

20080231843 - Optical passive device product identification apparatus and connectivity determination apparatus: An identification apparatus for identifying an optical passive device product. The apparatus includes an optical input output monitor section for monitoring an optical input and an optical output of the optical passive device product respectively; a loss calculation section for calculating a loss in the optical passive device product based... Agent: Staas & Halsey LLP

20080231827 - Hand-held surveying device and surveying method for such a surveying device: The invention relates to a hand-held measuring device (1a), comprising at least one rangefinder, embodied with integration of a positional detection component such that the positional detection component records the position (GP1,GPn) of the measuring device (1a) and the orientation of the rangefinder for each rangefinder measurement, whereby an automatically-controlled... Agent: Workman Nydegger

20080231844 - Method and apparatus for checking stator core alignment: In one embodiment the present invention provides for a method for checking the alignment of a stator core that comprises placing a laser source 14 and a target 18 a given distance apart on a stator core 10 and activating the laser such that the laser strikes the target. Then... Agent: Siemens Corporation Intellectual Property Department

20080231845 - High resolution wafer inspection system: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20080231846 - Level detection apparatus: A level detection apparatus includes an illumination slit in which a rectangular first opening which causes illumination light to pass is formed, an optical system configured to illuminate a target object surface by illumination light passing through the illumination slit and focuses reflected light from the target object surface, first... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080231847 - Optoelectronic sensor device: An optoelectronic sensor device is described for recording of soiling on a transparent cover, with at least one light source that emits at least two light beams, a test surface arranged in the cover, having a concave surface exposed to environmental effects, through which the light beams emerge and reenter,... Agent: Reising, Ethington, Barnes, Kisselle, P.C.

20080231848 - Frictional pivots for gravitational alignment: A frictional pivot 100 for use in a device measuring gravitational alignment is provided. The frictional pivot 100 comprises a gravity-responsive directional means 200 for indicating a datum direction of alignment with gravity; frictional pivoting means 300, 400 for allowing the gravity-responsive means coarsely to align with gravity; vibration means... Agent: Dykema Gossett PLLC

20080231850 - Measuring device, method, program, and recording medium: A frequency resolution for measuring transmission characteristics of a device under test is increased. With a measuring device including a first terahertz light generator that generates incident light, a second terahertz light generator that generates reference light having an optical frequency f1−f2−fIF different from an optical frequency f1−f2 of the... Agent: Greenblum & Bernstein, P.L.C

20080231849 - Thin-layer porous optical sensors for gases and other fluids: A gas sensor uses optical interferents in a porous thin film cell to measure the refractive index of the pore medium. As the medium within the pores changes, spectral variations can be detected. For example, as the pores are filled with a solution, the characteristic peaks exhibit a spectral shift... Agent: Dority & Manning, P.A.

20080231851 - Systems and methods for material authentication: Systems and methods for authentication of materials used in imaging members and assemblies. Authentication of imaging materials ensure that compatible components are being used with the imaging members and assemblies. Embodiments provide a system and method for efficiently detecting whether materials being used in the imaging members and assemblies are... Agent: Pillsbury Winthrop Shaw Pittman, LLP Xerox Corporation

20080231852 - Broadband cavity spectrometer apparatus and method for determining the path length of an optical structure: A broadband light source with a sufficiently long coherence length is impinged on the optical cavity. The broadband laser light reflects from the first and second surfaces of the cavity. The two light beams, either reflected or transmitted, are phase shifted from one another by an amount proportional to the... Agent: Schwabe, Williamson & Wyatt, P.C. Pacwest Center, Suite 1900

20080231853 - Qualitative analysis system and method for agricultural products in harvesting equipment: A system for the qualitative analysis of an agricultural product comprises a scanning cell (1) for the transmittance of a sample of an agricultural product, means for the emission of a quantity of light (6) and means for the detection of a quantity of light (5,50), at least one optical... Agent: Bryan W. Bockhop, Esq. Bockhop & Associates, LLC

20080231854 - Apparatus and method for determining the particle size and/or particle shape of a particle mixture: s

20080231855 - Method for measuring the anisotropy in an element comprising at least one fissile material and a corresponding installation: This method comprises the steps of transmitting a beam of light onto a surface (17) of an element (1) comprising a fissile material, passing the beam of light reflected by the surface into a polarisation analyser (27) having a modifiable analysis direction, transmitting the beam from the polarisation analyser (27)... Agent: Connolly Bove Lodge & Hutz LLP

20080231856 - Substrate inspection apparatus, substrate inspection method and semiconductor device manufacturing method: A substrate inspection method includes forming a conductive thin film on a surface of an inspection target substrate with a pattern formed thereon, generating an electron beam and irradiating the substrate having the thin film formed thereon with the electron beam, detecting at least any of secondary electrons, reflected electrons... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080231857 - Sensor system and sampling cell assembly for use with sensor system: A sensor system for detection of a gaseous chemical substance is provided, which includes an optical sampling cell holding a sampling chamber of a volume of at most 20 mm3, a light emitter and a light receiver. The sampling cell is adapted for free-space, single monomodal propagation of the light... Agent: Morgan Lewis & Bockius LLP

20080231858 - Printing device, method of controlling printing device, and recording medium: A printing device includes a light input unit that inputs light fluxes emitted from a light source to a measurement-target surface of a print medium on which an image is printed at a predetermined incidence angle, an image pickup unit that picks up an image of the measurement-target surface by... Agent: Hogan & Hartson L.L.P.

20080231859 - Photodetection device and photodetection method: A photodetection device, a photodetection method, an image sensor and an image pickup method can increase the number of pixels, while suppressing degradation of the S/N ratio. The photodetection device includes a spectroscopic element formed by means of an optical microresonator having a plurality of resonant wavelength bands differentiated by... Agent: Fitzpatrick Cella Harper & Scinto

20080231860 - Optical device and method for sensing multiphase flow: A method for measuring the velocity of a multiphase fluid flowing in a pipe. The method comprises directing at least two collimated beams of light from an illuminator through the multiphase fluid by transparent portions of the pipe. The at least two collimated beams are spaced apart in a direction... Agent: D. Peter Hochberg D. Peter Hochberg Co.

20080231861 - Polarization maintaining optical delay circuit: The invention relates to a polarization maintaining optical delay circuit (1) for providing a time delay to an incident light (S1), comprising an optical directional element (11) adapted for directing an incident light (S1) from a first port (111) to a second port (112) and directing a returning light from... Agent: Agilent Technologies Inc.

20080231862 - Device and method for the interferometric measurement of phase masks: A device and method for the interferometric measurement of phase masks, particularly from lithography. Radiation passing through a coherence mask is brought to interference by a diffraction grating. A phase mask is arranged in or near the pupil plane of the first imaging optics which can be positioned exactly in... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20080231865 - determination of surface properties: The invention relates to a method for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analysed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analysed in order to determine those surface... Agent: Hayes Soloway P.C.

20080231863 - Automated process control using optical metrology with a photonic nanojet: A fabrication cluster can be controlled using optical metrology. A fabrication process is performed on a wafer using a fabrication cluster. A photonic nanojet, an optical intensity pattern induced at a shadow-side surface of a dielectric microsphere, is generated. An inspection area on the wafer is scanned with the photonic... Agent: Morrison & Foerster LLP

20080231864 - Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam: A method of measuring and storing a center of rotation of a nozzle in a pick and place machine is provided. The method includes coupling an artifact to the nozzle. A substantially collimated laser beam is directed at the artifact, which is rotated while the collimated laser beam is energized.... Agent: Christopher R. Christenson Westman, Champlin & Kelly, P.A.

20080231866 - Wafer center finding with charge-coupled devices: A number of wafer center finding methods and systems are disclosed herein that improve upon existing techniques used in semiconductor manufacturing.... Agent: Strategic Patents P.C..

20080231867 - Mechanism for positioning device: The present invention relates to a positioning device, and in particular to a mechanism using an image detecting module. The present invention comprises a base having an image detecting module, a control circuit, and a driving module therein. The base has a rotateable plate on the base for carrying an... Agent: Bacon & Thomas, PLLC

20080225262 - Displacement measurement system: A displacement measurement apparatus includes a light source, a splitter grating, a measurement grating, and first a second detector arrays. The splitter grating splits a light beam into first and second measurement channels that each illuminates the measurement grating. The first and second measurement channels split into 0th and 1st... Agent: Agilent Technologies Inc.

20080225263 - Sensor device: A sensor device including a source for electromagnetic radiation, a receiver and a control device, the control device being designed for emitting electromagnetic radiation by means of the source and for determining a distance that is covered by the electromagnetic radiation emitted by the source from a reflection surface of... Agent: Burr & Brown

20080225264 - Fiber optic flow sensing device and method: The invention provides an optical flow meter for measuring fluid flow through a pipe which obviates the need for the flow to be seeded with foreign particles. The meter comprises a fiber optic Sagnac interferometer with optical path crossing the flowing fluid. The interferometer measures velocity of the fluid by... Agent: Kirton And Mcconkie

20080225266 - Gemstone viewing methods and apparatus: A viewing apparatus for viewing a surface of a gemstone comprising an adjustable platform with a surface adapted to receive the gemstone is disclosed. The apparatus includes a viewing axis along which the gemstone is viewed, a light source to emit light substantially parallel to the viewing axis, and an... Agent: Knobbe Martens Olson & Bear LLP

20080225265 - Method and apparatus for finding macromolecule crystallization conditions: A system and method for determining macromolecule crystallization conditions by measuring the polarization anisotropy of a fluorescent probe attached to the macromolecule in solution as a function of a variation in crystallization conditions. In one exemplary embodiment, the concentration of the macromolecule material is varied and the polarization anisotropy as... Agent: James Richards

20080225267 - Optical measurement apparatus and method: An optical measurement apparatus and method a method for performing modulation spectroscopy measurement of a sample comprising: delivering an incident probe beam to a sample at a known spot; modulating reflectance of the probe beam with a pump beam which periodically forms a pump beam spot on the sample coincident... Agent: Caven & Aghevli LLC

20080225268 - Electric-field-enhancement structures including dielectric particles, apparatus including same, and methods of use: In one aspect of the present invention, an electric-field-enhancement structure is disclosed. The electric-field-enhancement structure includes a substrate and an ordered arrangement of dielectric particles having at least two adjacent dielectric particles spaced from each other a controlled distance. The controlled distance is selected so that when a resonance mode... Agent: Hewlett Packard Company

20080225269 - System and method for ratiometric non-linear coherent imaging: The present invention includes a system and method for coherent imaging. The system of the present invention includes a light source adapted to provide coherent light to illuminate a sample resulting in optically mixed coherent signals and a detector adapted to receive the optically mixed coherent signals and produce an... Agent: Kennedy, Ltd.

20080225270 - Ultraviolet irradiation system, curing reaction detector used for the same and curing method of ultraviolet curing resin using the curing reaction detector: A measured fluorescence amount and a previously set threshold value α1 are compared and when the measured fluorescence amount exceeds the threshold value α1, a message such as “curing reaction completion” is issued. Note that when this “curing reaction completion” is issued, an irradiation end instruction is given to a... Agent: Foley And Lardner LLP Suite 500

20080225271 - Vehicle operation support method and system: The present invention relates to a vehicle operation support system and an associated method of improving a driver's visibility. The vehicle may be equipped with at least one UV light which irradiates the ambient environment with UV radiation. In some examples, the direction or the intensity of UV radiation may... Agent: Alleman Hall Mccoy Russell & Tuttle LLP

20080225275 - Detection system for nanometer scale topographic measurements of reflective surfaces: A linear position array detector system is provided which imparts light energy to a surface of a specimen, such as a semiconductor wafer, receives light energy from the specimen surface and monitors deviation of the retro or reflected beam from that expected to map the contours on the specimen surface.... Agent: Smyrski Law Group, A Professional Corporation

20080225272 - Fluorescence spectroscopy apparatus: A fluorescence spectroscopy apparatus includes an excitation optical system, a fluorescence detector, a signal processor, and a computer. The excitation optical system alternately applies light beams with different wavelengths or different intensities to a specific region of a sample at shifted times. The fluorescence detector detects fluorescence generated from the... Agent: Scully Scott Murphy & Presser, PC

20080225273 - Mobile remote detection of fluids by a laser: Apparatus for remote laser-based detection of a analyte in a remote target region; comprising a reference container for housing a reference substance identical with the analyte; a laser unit which constituted to emit a laser beam of a tuneable wavelength towards the target region to be analysed and along a... Agent: Buchanan, Ingersoll & Rooney PC

20080225274 - Vibration detection device: A vibration detection device includes: a light source emitting a laser beam; an interferometer including a vibrating body and a reflecting body both capable of reflecting the laser beam, a polarizing beam splitter splitting a laser beam emitted from the light source into beams traveling along first and second optical... Agent: Rader Fishman & Grauer PLLC

20080225277 - Method and apparatus for testing and monitoring data communications in the presence of a coupler in an optical communications network: Some optical communications networks include one ingress fiber, an n-way signal coupler, and n egress fibers, where each fiber may carry signals in one or both directions. A method and apparatus for testing and monitoring data communications immediately before and after the coupler is provided. Benefits include improved ability to... Agent: Davis Bujold & Daniels, P.l.l.c.

20080225276 - System for measuring the wavelength dispersion and nonlinear coefficient of an optical fiber: A method of simultaneously specifying the wavelength dispersion and nonlinear coefficient of an optical fiber. Pulsed probe light and pulsed pump light are first caused to enter an optical fiber to be measured. Then, the power oscillation of the back-scattered light of the probe light or idler light generated within... Agent: Cantor Colburn, LLP

20080225278 - Focal position determining method, focal position determining apparatus, feeble light detecting apparatus and feeble light detecting method: A focal position determining method determines a focal position of an objective lens focused on an observed target region in a specimen. The focal position determining method includes measuring any one of the focal position of the objective lens at a near point and the focal position of the objective... Agent: Scully Scott Murphy & Presser, PC

20080225279 - Luminescence measuring apparatus: To increase the direct light received by the detector and decrease reflections from the detection component support structures, the luminescent substance is placed as close to the detector as possible. More specifically, the apparatus is configured so as to slide out a structure shielding the detector from light and at... Agent: Mattingly, John Mattingly Stanger And Malur PC

20080225280 - Surface flatness testing device and method thereof: An exemplary surface flatness testing device (10) includes a light emitting unit (11), a light receiving unit (12), a platform (13), an adjusting unit (14) and a processing unit (15). The light receiving unit faces the light emitting unit. The platform is located between the light emitting unit and the... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080225281 - Visual inspection apparatus: The present invention is related to a visual inspection apparatus which can inspect a peripheral edge of a wafer with high efficiency. The visual inspection apparatus can make an inspection of any area on the peripheral edge of the wafer by displaying an inspection area specifying screen on a monitor.... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080225282 - Beam delivery system for laser dark-field illumination in a catadioptric optical system: A method and apparatus for inspecting a specimen are provided. The apparatus comprises a primary illumination source, a catadioptric objective exhibiting central obscuration that directs light energy received from the primary illumination source at a substantially normal angle toward the specimen, and an optical device, such as a prism or... Agent: Smyrski Law Group, A Professional Corporation

20080225283 - Imaging system with high-spectrum resolution and imaging method for the same: An imaging system comprises a light source module configured to generate a combination beam, a controller configured to control the light source module, an image-capturing module configured to capture the reflected beam by a sample. The light source module comprises a plurality of light-emitting devices configured to emit lights of... Agent: Wpat, PC Intellectual Property Attorneys

20080225284 - Method, apparatus, and computer program product for optimizing inspection recipes using programmed defects: A method and computer program product for implementing inspection recipe services are provided. The method includes defining a modified reticle pitch for use in inspecting programmed defects on a test structure, the modified reticle pitch extending the distance of one reticle field plus a portion of an adjacent reticle field... Agent: Cantor Colburn LLP - IBM Fishkill

20080225285 - Device for and method of measurement of chemical agents quantity in gas medium: Measurement device for chemical agents quantity contained in a gas medium having a source of monochromatic radiation with a wavelength which changes in accordance with time law that is supplied through an optical brancher to an optical modulator, and then into a gas medium to be measured and further into... Agent: United States Department Of Energy

20080225286 - Method and apparatus for detecting defects: A defect inspection method and apparatus that can easily and quickly determine, from among a plurality of inspection conditions, a condition that allows for an inspection with high sensitivity. The inspection apparatus has a variety of optical functions to cover a variety of kinds of defects to be inspected (shape,... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080225287 - Analyte detection using nanowires produced by on-wire lithography: The present invention relates to methods of detecting analytes using nanowires having nanodisk arrays. In particular, the present invention discloses methods of detecting analytes via surface enhanced Raman scattering (SERS) and employing nanowires prepared using on-wire lithography (OWL).... Agent: Marshall, Gerstein & Borun LLP

20080225288 - Imaging systems and methods: Imaging systems and methods are provided. In one embodiment, an image system is disclosed that comprises a Raman gain medium configured to receive an image from a target area and a tunable laser configured to pump light into the Raman gain medium over a plurality of first wavelengths to induce... Agent: Tarolli, Sundheim, Covell & Tummino L.L.P.

20080225289 - Scanning spectrophotometer for high throughput fluorescence detection and fluorescence polarization: A fluorescence spectrophotometer system may be implemented in scanning fluorescence polarization detection applications. A wavelength and area scanning fluorescence spectrophotometer system may include a light source, an excitation double monochromator, an excitation/emission light transfer module, an emission double monochromator, a high speed timer-counter circuit board, a precision positioning apparatus for... Agent: Pillsbury Winthrop Shaw Pittman LLP

20080225290 - Miniaturized flourescence analysis system: According to embodiments of the present invention, a fluorescence analysis system includes a light emitting diode to excite a fluorophor sample for analysis. The system includes an LED driver that pulses the LEDs in the array with currents in excess of maximum rated current at low duty cycles. One embodiment... Agent: Blakely Sokoloff Taylor & Zafman LLP

20080225291 - Concave diffraction grating device, reflective dispersion device, and spectral device: A concave diffraction grating device, a reflective dispersion device, and a spectral device of the invention include a diffraction grating plane having an aspherical configuration, wherein the diffraction grating plane is symmetrical in a predetermined direction, and asymmetrical in a direction orthogonal to the predetermined direction in such a manner... Agent: Sidley Austin LLP

20080225292 - Target substance detecting element, target substance detection apparatus and target substance detection method: Magnetic particles with a metal coat holding target substance captors are made to react with a target substance contained in a specimen in a solution where the magnetic particles are dispersed in a liquid medium. Subsequently, the dispersion of the magnetic particles is applied to a surface having a periodic... Agent: Fitzpatrick Cella Harper & Scinto

20080225293 - Photonic crystal sensor: A photonic crystal sensor for outputting an output signal using a light source. The photonic crystal sensor includes a photonic crystal structure and a defect member disposed adjacent the photonic crystal structure. The defect member defines an operative surface. An input light signal from the light source is inputted to... Agent: Harness, Dickey & Pierce, P.L.C

20080225294 - Apparatus for checking concentricity and method for checking same: An exemplary apparatus for checking concentricity between a holder and a lens barrel of a lens module includes a light source, a gauge, and a detecting and analyzing device. The gauge includes an inner barrel and an outer barrel. The inner barrel is capable of rotating to a predetermined angle... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080225295 - Device for multiple tests from a single sample: A sample device and method for analyzing a sample are claimed. The sample device is a flat disc containing channels and wells for directing a sample to reagents located in the disc and for mixing the sample with the reagents. The disc is mounted on an analyzer and the sample... Agent: Bradley Arant Rose & White LLP

20080225296 - Pressure-invariant trace gas detection: A system includes a light source, a detector, at least one pressure sensor, and a control unit. The light source emits light at a wavelength substantially corresponding to an absorption line of a target gas. The detector is positioned to detect the intensity of light emitted from the light source... Agent: Mintz, Levin, Cohn, Ferris, Glovsky And Popeo, P.c Attn: Patent Intake Customer No. 64046

20080225297 - Device for measuring elevations and/or depressions in a surface: In a device for measuring elevations and/or depressions of a flexible surface which is at least partially transmissive to light, for measurement purposes, the surface is illuminated by a fibre-optical means (3) by way of a light source (7) and the brightness of the reflected light is measured by the... Agent: Rader, Fishman & Grauer PLLC

20080225298 - High throughput brightfield/darkfield water inspection system using advanced optical techniques: The broadband brightfield/darkfield wafer inspection system provided receives broadband brightfield illumination information via a defect detector, which signals for initiation of darkfield illumination. The defect detector forms a two dimensional histogram of the defect data and a dual mode defect decision algorithm and post processor assess defects. Darkfield radiation is... Agent: Smyrski Law Group, A Professional Corporation

20080225299 - Apparatus and method for appearance inspection: Rotating polygon mirrors are configured such that angles formed by a rotation axis and mirror surfaces differs from one another in the mirror surfaces in order to shift a collecting point of a scanning light flux in a sub-scanning direction in association with rotation at constant angular speed. A collecting... Agent: Wenderoth, Lind & Ponack L.L.P.

20080225300 - Method of measuring relative movement of an object and an optical input device over a range of speeds: A method and optical module for measuring relative movement of an input device and object (15) along at least one measuring axis. A laser device (3) having a laser cavity is provided for generating a measuring beam (13) in respect of each measuring axis. The measuring beam (13) is used... Agent: Philips Intellectual Property & Standards

20080225301 - Method, apparatus, and program for processing tomographic images: Image quality of tomographic images obtained by optical tomographic measurement is improved. Spatial frequency processes are administered on a tomographic image, with the frequency processing properties (high frequency gain) in the scanning direction of a measuring light beam set to be lower than the frequency processing properties (high frequency gain)... Agent: Sughrue Mion, PLLC

20080225302 - Method of inspecting a body having fine-gap grooves and method of repairing the body: A molding die has through holes composed of feed holes and slit grooves for producing honeycomb structure bodies. The slit groove is formed in at least a part of each through hole. In a method of inspecting the molding die, a light is irradiated into the feed holes side to... Agent: Nixon & Vanderhye, PC

20080225303 - Method and apparatus for the three-dimensional measurement of the shape and the local surface normal of preferably specular objects: An apparatus and a method permit the 3D detection of specular objects which are transparent to visible light. The method operates on the basis of the principle of deflectometry with specific improvements.... Agent: Lerner Greenberg Stemer LLP

20080225304 - Optical scanning unit and image forming apparatus using same: An optical scanning unit includes first and second light beam generators, a deflector, a beam detector, and an optical element. The first and second light beam generators respectively emit a first and second light beam. The deflector deflects the first and second light beams in a main scanning direction and... Agent: Harness, Dickey & Pierce, P.L.C

20080225305 - Device for the optical analysis, including two-dimensional, of a thread or yarn: A device for the optical analysis, including two-dimensional, of a thread or yarn (F) fed to a textile machine, said device comprising at least one light emitter element (3, 4) and at least one receiver element (5), said emitter element (3, 4) generating a light signal which strikes said thread... Agent: Wolf, Block, Shorr And Solis-cohen LLP

20080218727 - Method and apparatus for optical image reconstruction using contour determination: The present invention relates to a method and a system for optical imaging of an object in transmission configuration. The method and system obtain contour coordinates of the object using source/detector configurations references and acquire optical data from a region of interest (ROI) of the object. Then, the method and... Agent: Bereskin And Parr

20080218729 - Apparatus and a method for measuring distance using a laser beam: A laser distance measuring apparatus which measures a turnaround time after emitting a laser beam outputted from a laser diode to a target until receiving the laser beam reflected by the target by a light receiving module via a band-pass filter to calculate a distance to the target, includes temperature... Agent: Nec Corporation Of America

20080218730 - Methods, apparatus, and systems for evaluating gemstones: Methods for grading gemstones, apparatus for grading gemstones, and systems that utilize such methods and apparatus are disclosed.... Agent: Lewis, Rice & Fingersh, Lc Attn: Box Ip Dept.

20080218731 - Diagnostic test device: A diagnostic test device comprises means for sampling a liquid biological sample. Means is provided for reacting the sample with a reagent to provide one or more visible indicia. A photodetector for scans a detection region to produce a pulsed output indicative of the presence of the one or more... Agent: Stephen B. Shear Church & Dwight Co., Inc.

20080218734 - Attenuated total reflection probe and spectrometer therewith: An attenuated total reflection probe has a prism and a supporter. The prism is made of an optical material which transmits light in far ultraviolet region, and has a contact plane to be in contact with a sample, and an incoming plane and an outgoing plane both not to be... Agent: Birch Stewart Kolasch & Birch

20080218732 - Infrared scanner for biological applications: Methods and systems for generating near-infrared (NIR) images of biological targets are discussed. In one aspect, one or more radiation sources illuminate a target, with one or more detectors receiving the transmitted radiation. Such equipment can be used to generate a plurality of NIR images of a target. The images... Agent: Nutter Mcclennen & Fish LLP

20080218733 - Method and device for determining an alcohol content of liquids: A method determines an alcohol content of liquids that contain at least water and alcohol as well as sugar or similar substances, in the liquid. The liquid is located in an analysis cell is irradiated by an IR-LED light source, which emits infrared radiation with λ=1000-1500 nm. The IR light... Agent: Lerner Greenberg Stemer LLP

20080218736 - Evanescent wave sensing apparatus and methods using plasmons: We describe sensing apparatus using evanescent-wave based optical cavity ring-down plasmon resonance techniques. An optical cavity is formed by a pair of highly reflective surfaces, said an optical path between said surfaces including a reflection from a totally internally reflecting (TIR) surface, the reflection from said TIR surface generating an... Agent: Tarolli, Sundheim, Covell & Tummino L.l.p.

20080218739 - Laser measuring system: A laser measuring system, which comprises a laser rotary irradiation device for forming a laser reference plane by projecting a laser beam in rotary irradiation, and a photodetection device for performing position measurement by receiving the laser beam, wherein the laser rotary irradiation device comprises a laser beam emitter, an... Agent: Nields & Lemack

20080218735 - Laser processing method and device: This laser processing method comprises a preparatory step of holding a lens at an initial position set such that a converging point is located at a predetermined position within the object; a first processing step (S11 and S12) of emitting a first laser beam for processing while holding the lens... Agent: Drinker Biddle & Reath (dc)

20080218738 - Methods and apparatus for determining particle characteristics by measuring scattered light: An instrument for measuring the size and characteristics of a particle contained in a sample of particles. A particle sample is introduced into a sample chamber. The sample particles are subjected to centrifugal forces so that large particles travel in the sample chamber at velocities greater than small particles. Light... Agent: William H. Eilberg

20080218740 - Nanowire-based photonic devices: Embodiments of the present invention are related to nanowire-based devices that can be configured and operated as modulators, chemical sensors, and light-detection devices. In one aspect, a nanowire-based device includes a reflective member, a resonant cavity surrounded by at least a portion of the reflective member, and at least one... Agent: Hewlett Packard Company

20080218737 - Optically isolated current monitoring for ionization systems: Current is measured in an ionization device that includes a high voltage supply, and an emitter electrically coupled to the HV supply. An opto-isolator is provided that includes a light source and a light detector. The light source has a current flowing through it. The light source is electrically coupled... Agent: Panitch Schwarze Belisario & Nadel LLP

20080218742 - Apparatus and method for detecting tire shape: A tire shape detecting apparatus includes a projector that applies a plurality line light beams in a continuously joined manner, from a direction different from the detection height direction (Z-axis direction) in one light section line, or that applies one line light beam in a condensed manner in the line... Agent: Reed Smith LLP

20080218743 - Combining tomographic images in situ with direct vision in sterile environments: A device for combining tomographic images with human vision using a half-silvered mirror to merge the visual outer surface of an object (or a robotic mock effector) with a simultaneous reflection of a tomographic image from the interior of the object. The device maybe used with various types of image... Agent: Reed Smith LLP

20080218747 - Method and apparatus for detecting surface characteristics on a mask blank: An optical system and method configured to detect surface height variations on a mask blank. The optical system comprises a Wollaston prism, optics and first and second detectors. The Wollaston prism splits an incident beam of radiation into a first beam and a second beam. The first beam has a... Agent: Davis Wright Tremaine LLP - Kla-tencor Corporation

20080218745 - Method and system to compensate for lamp intensity differences in a photolithographic inspection tool: An after develop inspection tool considers tool-to-tool variability when determining confidence score for wafers under inspection. A golden wafer is used to calculate a RGB signature as well as the slope of the individual RGB curves for different lamp intensities. These slopes are normalized in order to generate a compensation... Agent: Wood, Herron & Evans, LLP (tokyo Electron)

20080218746 - Optical detector for the presence of gas bubbles in a liquid: The invention concerns a method for detecting gas bubbles in a liquid adapted to a device comprising a light source, a light detector and a data controlling and processing unit connected to a client system comprising the following steps: emitting light from the light source, acquiring successive measurements of the... Agent: Osha Liang L.l.p.

20080218741 - Optical inspection apparatus and method: In one embodiment, a modulation spectroscopy method comprises the steps of directing a probe beam and a pump beam at a sample, modulating the pump beam, and the probe beam is reflected from the sample into a detector. The sample may include a strained semiconductor. The detector may produce as... Agent: Caven & Aghevli Llc

20080218744 - Temperature measuring apparatus and temperature measuring method: A temperature measuring apparatus includes a light source, a first splitter, a second splitter, a reference beam reflector, an optical path length adjuster, a reference beam transmitting member, a first to an nth measuring beam transmitting member and a photodetector. The temperature measuring apparatus further includes a controller that stores,... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.c.

20080218728 - Method for determining the orientation of an orientation indicator: According to the invention, a separation from at least one and an image of at least three reflective regions on the orientation indicator are recorded by a separation measurement sensor and an image sensor in a measuring device (1), for the purpose of determining the orientation of an orientation indicator.... Agent: Workman Nydegger

20080218748 - Measuring apparatus comprising a peltier-seebeck detector: A measuring apparatus comprises a detector device for detecting a variable to be measured, and a controller operative to control the detector device and generate an output signal indicative of the magnitude of the variable being measured. The detector device comprises a housing on which are mounted two Peltier-Seebeck detectors,... Agent: Klarquist Sparkman, LLP

20080218750 - Device for analyzing an integrated circuit: The invention concerns a device (10) for analyzing a circuit (14) comprising: at least one means (22) for observing light emitted by at least one localized observation zone of the circuit resulting from the electric current flowing in said zone; means (26) for exciting the circuit. The circuit exciting means... Agent: Young & Thompson

20080218749 - Metal comb structures, methods for their fabrication and failure analysis: The present disclosure relates to a metal comb structure including a first comb which includes a first set of metal fingers each of the metal fingers being connected at one end thereof by a connecting member from which the metal fingers extend. The metal comb structure also includes a second... Agent: Harness, Dickey, & Pierce, P.l.c

20080218751 - Inspection device and inspection method of an object to be inspected: An inspection device of an object, comprising: a laser beam source for oscillating a laser beam and irradiating the laser beam onto a surface of an object to be inspected, a rotary table for loading and rotating the object, a moving mechanism for moving the rotary table in a transfer... Agent: Mcdermott Will & Emery LLP

20080218752 - Chemometric analyzer with a spatial radiation modulator having a plurality of radiation filters: A chemometric analyzer for analyzing a plurality of analytes. The analyzer disperses radiation by wavelength along an encoding axis. The analyzer includes a spatial radiation modulator having a plurality of radiation filters. Each radiation filter modulates the intensity of a corresponding spectral component in the radiation.... Agent: Fenwick & West LLP

20080218753 - Microchip with expansion channel and flowcytometer using this microchip: Disclosed is a microchip for a flowcytometer. A channel is expanded around a point, on which laser beams emitted from an optical unit are focused, so that focused sample particles slow down when they pass the expanded portion. This improves the detection intensity of sample particles.... Agent: Edwards Angell Palmer & Dodge LLP

20080218754 - System and method for active optical target detection with polarized receiver: A receiver including an analyzer and a detector coupled to the output of the analyzer. The analyzer selects a polarized component of a return beam for input to the detector. The analyzer may be linear, circular or elliptical. Coupled with a laser adapted to output a polarized beam, the receiver... Agent: Benman, Brown & Williams

20080218756 - Scanning optical microscope with long working distance objective: A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics;... Agent: Ratnerprestia

20080218755 - Semiconductor uv absorptive photometric cells: Biomolecules in solid or liquid form are targeted with a UV beam of about 260 nm that is attenuated by absorption in the biomolecules. The attenuated light passes through a UV transmissive window and partly discharges an underlying floating gate EPROM device. The incremental partial discharge of the floating gate... Agent: Schwegman, Lundberg & Woessner / Atmel

20080218758 - Method, system and module for monitoring a power generating system: A sensing module positioned about an optical fiber cable having a long axis. The optical fiber includes a core that transmits light through the optical fiber cable. The sensing module includes a first short-period fiber grating positioned about the core. A second short-period fiber grating is positioned about the core... Agent: General Electric Company Global Research

20080218757 - Sensor: A method for acquiring information includes the steps of preparing a laser having a micro-cavity, and detecting a light emitted from the laser. An oscillation state of the laser is changed according to a change of an environmental condition around the micro-cavity, and the light emitted from the laser is... Agent: Fitzpatrick Cella Harper & Scinto

20080218759 - Light emitting diode for harsh environments: A light emitting diode for harsh environments includes a substantially transparent substrate, a semiconductor layer deposited on a bottom surface of the substrate, several bonding pads, coupled to the semiconductor layer, formed on the bottom surface of the substrate, and a micro post, formed on each bonding pad, for electrically... Agent: Rothwell, Figg, Ernst & Manbeck, P.c.

20080218760 - Electrooptical distance measuring device: The invention relates to an electrooptical distance measuring device comprising a transmitter that emits optical radiation for lighting an object to be measured, an optical transmitting system which is rigidly mounted in relation to the transmitter and a light collector A support element (7) is positioned with a measurement receiver... Agent: Workman Nydegger

20080218761 - Surface plasmon resonance sensor and sensor chip: A sensor chip has a metal layer formed on a surface of a substrate, where a plurality of microscopic concave part is formed in a measurement region of the surface of the metal layer. When light of linear polarization is irradiated onto the measurement region, local resonance electric field generates... Agent: Osha Liang L.l.p.

20080218762 - System for detecting anomalies and/or features of a surface: A cylindrical mirror or lens is used to focus an input collimated beam of light onto a line on the surface to be inspected, where the line is substantially in the plane of incidence of the focused beam. An image of the beam is projected onto an array of charge-coupled... Agent: Davis Wright Tremaine LLP - Kla-tencor Corporation

20080218763 - Apparatus for optically determining the surface contour of flat workpieces in a wide belt abrading machine: An elongated bar shaped housing contains an optical sensing apparatus with at least one light source to create a sensing beam and a deflecting arrangement which moves the sensing beam back and forth between the longitudinal ends of the housing. One of the walls of the housing has an output... Agent: Mccormick, Paulding & Huber LLP

20080218764 - Methods and systems for fiber optic gyroscopes vibration error suppression: Systems and methods for performing vibration error suppression in a fiber optic gyro sensor. An example system includes a light source, a sensing loop assembly, a photo detector, and a processing component. The light source generates a light signal that is then modulated by the sensing loop assembly and applied... Agent: Honeywell International Inc. Patent Services Ab-2b

20080218765 - Signal processing for a sagnac interferometer: Disclosed is a method and apparatus for modulating the phase difference between a pair of optical waves that exit a Sagnac interferometer, and, more particularly, one that is commonly employed as a fiber gyro, and includes a detector responsive to phase difference between the pair of waves that exit the... Agent: Robert A Pajak Patent Services

20080218766 - Apparatus and method for sizing nanoparticles based on interferometric field detection: Light from a laser source is split into a reference arm and a detection arm. The light in the detection arm is focused into a channel containing particles to be detected and is backscattered by the particles. The light in the reference arm is attenuated. The attenuated and backscattered light... Agent: Blank Rome LLP

20080218767 - Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method, substrate for use in the methods: An overlay marker for use with a scatterometer includes two overlying two-dimensional gratings. The two gratings have the same pitch but the upper grating has a lower duty ratio. Cross-talk between X and Y overlay measurements can therefore be avoided. The gratings may be directly overlying or off set so... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080218768 - Measurement method and device for bead cutting shape in electric resistance welded pipes: To precisely measure bead cutting shapes of electric resistance welded pipes without being affected by difference in luminance level between cut and uncut portions in optical cutting images, an image is obtained by overlaying an optical cutting image with the optical cutting image subjected to thinning processing. A profile of... Agent: Young & Thompson

20080218771 - Image-forming device: An image-forming device includes a conveying unit and a pattern data generating unit. The conveying unit conveys a target in a conveying direction, the target having a target light reflectance. The pattern data generating unit generates pattern data indicating a pattern in which a plurality of marks is arranged in... Agent: Banner & Witcoff, Ltd. Attorneys For Client Nos. 0166889, 006760

20080218769 - Optical pointing device for mobile terminals: The present invention relates to an optical pointing device for mobile terminals, which can improve assembly efficiency and stability. An optical pointing device according to the present invention includes a holder having an accommodation opening therein. Light emitting means is installed in the accommodation opening of the holder. A condensing... Agent: Patent Law Group LLP

20080218770 - Robotic surgical instrument and methods using bragg fiber sensors: A positionable medical instrument assembly, e.g., a robotic instrument driver configured to maneuver an elongate medical instrument, includes a first member coupled to a second member by a movable joint, with a Bragg fiber sensor coupled to the first and second members, such that relative movement of the first and... Agent: Vista Ip Law Group LLP

20080218772 - Wafer holding robot end effecter vertical position determination in ion implanter system: A wafer handling robot, ion implanter system including a wafer handling robot and a related method are disclosed. An ion implanter system may include an ion implanting station including a load lock coupled thereto; a wafer handling robot located at least partially within the load lock, the wafer handling robot... Agent: Scott Faber, Esq. Varian Semiconductor Equipment Associates, Inc

20080212064 - Hand-held measuring device with measured value memory and microphone for entering spoken messages related art: The invention relates to a hand-held measuring device, in particular, a laser distance measuring device (10), comprising a memory unit (12) for the storage of at least one electronically recorded measured value (14). According to the invention, the hand-held measuring device comprises a microphone unit (16) suitable for the recording... Agent: Michael J. Striker

20080212063 - Laser beam machining system: This laser processing apparatus is one for irradiating an object to be processed with a processing laser beam while positioning a converging point within the object so as to form a modified region caused by multiphoton absorption within the object along a line along which, the object should be cut... Agent: Drinker Biddle & Reath (dc)

20080212065 - Method of determining the flatness of a foundation to which a building structure, machinery or equipment is to be mounted: A method for measuring flatness of a factory floor upon which machinery is to be mounted using a rotating laser beam that emits a rotating laser beam in an essentially horizontally plane. A photosensitive position sensor delivers an electrical pulse, which is identified by its timing and phase angle, during... Agent: Roberts Mlotkowski Safran & Cole, P.C.

20080212066 - Method for the detection of an object and optoelectronic apparatus: The present invention relates to a method for the detection of an object by means of an optoelectronic apparatus, wherein light rays generated by a light source are incident onto an object as a light bead and the light rays scattered back and/or reflected from the object are detected by... Agent: Harness, Dickey & Pierce, P.L.C

20080212067 - Inspection and strength measurement of solder and structural joints using laser generated stress waves: Methods and apparatus are disclosed for direct measurement of the tensile strength of joints with use of laser spallation. A laser pulse is directed at a surface in communication with a solder joint, generating a stress wave to separate the solder ball from its underlying structure. The solder joint may... Agent: John P. O'banion O'banion & Ritchey LLP

20080212070 - Kit and method for multi-analyte determination: wherein a liquid sample to be analyzed for said analytes is brought into contact with said measurement areas on said sensor platform either directly or after mixture with further reagents. The invention is also related to analytical systems based on a kit according to the invention and to methods for... Agent: Wenderoth, Lind & Ponack, L.L.P.

20080212069 - Method, system, and compositions for cell counting and analysis: The present invention provides a low cost imaged-based system for detecting, measuring and/or counting labeled features of biological samples, particularly blood specimens. In one aspect, the invention includes a system for imaging multiple features of a specimen that includes one or more light sources capable of successively generating illumination beams... Agent: David W. Highet, Vp & ChiefIPCounsel Becton, Dickinson And Company

20080212068 - Porous photonic crystal with light scattering domains and methods of synthesis and use thereof: The invention includes sensors and sensing methods for determining cell morphology and/or chemical composition of an analyte. A porous substrate exhibiting a first optical signal is exposed to a target analyte and subsequently monitored for changes in the optical signal. More specifically, a photonic or porous substrate having a well-defined... Agent: Greer, Burns & Crain

20080212071 - Method of determining analyte concentration in a sample using infrared transmission data: A method determines an analyte concentration in a sample. The sample includes the analyte and a substance. The method includes providing absorption data of the sample. The method further includes providing reference absorption data of the substance. The method further includes calculating a substance contribution of the absorption data. The... Agent: Knobbe Martens Olson & Bear LLP

20080212076 - Apparatus and method for testing infrared camera: An apparatus for testing infrared cameras includes: a cover plate which has a plurality of holes formed therethrough and arranged in line in a horizontal direction at a regular interval, the cover plate being adapted to emit an amount of infrared light; and an emission source which is disposed in... Agent: Carrier Blackman And Associates

20080212074 - Hand-held, self-contained optical emission spectroscopy (oes) analyzer: A hand-held, self-contained, battery-powered test instrument for analyzing composition of a sample includes an exciter for exciting at least a portion of the sample, a compact cross-dispersed spectrometer for receiving an optical signal from the excited portion of the sample and a processor for processing spectral data about the optical... Agent: Thermo Finnigan LLC

20080212072 - Photothermal test camera provided with an optical device for extending a laser beam section: The inventive photothermal test camera (16) is provided with a laser beam (4) shaping system (22) comprising a device (40) for extending the laser beam section in such a way that a heating area (2) extended in a direction (D) is formed on the surface of a testable piece (1),... Agent: Connolly Bove Lodge & Hutz LLP

20080212073 - Polymeric device suitable for ultraviolet detection: The present invention relates to a flow cell (10) comprising a fluid inlet (16) and a fluid outlet (18) separated by a sample flow-through chamber (12) comprising at least one UV-transparent window (22′), wherein the at least one UV-transparent window (22′) is made of a polymer material and has been... Agent: Ge Healthcare Bio-sciences Corp. Patent Department

20080212075 - Short-wavelength coherence tomography: The present relates generally to methods, systems and apparatuses for three dimensional and cross-sectional imaging of objects (e.g., silicon) and subjects at a nanometer-scale resolution using short wave-length (e.g., extreme ultra-violet) light.... Agent: Fulbright & Jaworski L.L.P.

20080212078 - Arrangement and method for focusing a multiplane image acquisition on a prober: The invention relates to a system and a method for capturing images in a prober. According to the invention, the surface of a test object is illuminated in succession with light of a first, second and third color; and an image capturing device records a gray scale image of the... Agent: Heslin Rothenberg Farley & Mesiti PC

20080212081 - High speed laser scanning inspection system: An optical inspection system rapidly evaluates a substrate by illumination of an area of a substrate larger than a diffraction-limited spot using a coherent laser beam by breaking temporal or spatial coherence. Picosecond or femtosecond pulses from a modelocked laser source are split into a plurality of spatially separated beamlets... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20080212080 - Measuring a process parameter of a semiconductor fabrication process using optical metrology: To measure a process parameter of a semiconductor fabrication process, the fabrication process is performed on a first area using a first value of the process parameter. The fabrication process is performed on a second area using a second value of the process parameter. A first measurement of the first... Agent: Morrison & Foerster LLP

20080212079 - Single detector based dual excitation wavelength spectra display: A single detector based spectroscopy system using FAST (fiber array spectral translator) fibers and two excitation sources in conjunction with a holographic spectrum analyzer (HSA) to obtain simultaneous and selective display of spectroscopic regions of interest. A sample can be illuminated with different laser excitation wavelengths and resulting multiple spectra... Agent: Chemimage Corporation

20080212077 - Spectroscopic lance for bulk sampling: A lance assembly for spectroscopically sampling bulk product (8) is disclosed. The assembly comprises: an elongate lance body (11) having a longitudinal axis (15), a proximal end (12) for maneuvering and a head (19) defining a cavity (18). Housed within the cavity (18) is a spectroscopic receiver (20) having a... Agent: David A. Guerra International Patent Group, LLC

20080212082 - Fiber optic position and/or shape sensing based on rayleigh scatter: A fiber optic position and/or shape sensing device includes an optical fiber with either two or more single core optical fibers or a multi-core optical fiber having two or more fiber cores. In either case, the fiber cores are spaced apart so that mode coupling between the fiber cores is... Agent: Nixon & Vanderhye, PC

20080212083 - Optical imaging arrangement: There is provided an optical imaging arrangement comprising: a mask unit comprising a pattern, a substrate unit comprising a substrate, an optical projection unit comprising a group of optical element units, the optical projection unit being adapted to transfer an image of the pattern onto the substrate, a first imaging... Agent: Fish & Richardson PC

20080212084 - Edge inspection: A semiconductor inspection tool comprises an edge top camera for obtaining images of a top edge of a wafer, an edge normal camera for obtaining images of a normal edge of the wafer, and a controller for receiving the images of the top edge of the wafer and the images... Agent: Dicke Billig & Czaja, PLLC Attn: Christopher Mclaughlin

20080212085 - Method of evaluating non-linear optical crystal and device therefor, and wavelength conversion method and device therefor: A method of evaluating a non-linear optical crystal used for non-linear wavelength conversion of laser beam which enables the non-linear optical crystal to be evaluated before the crystal is actually used as a wavelength conversion element in order for the crystal to be constantly used for an extended time with... Agent: Birch Stewart Kolasch & Birch

20080212086 - Packaging material inspection machine: A machine for optically inspecting a transparent or semi-transparent workpiece composed of a material having a known, predetermined optical absorption property, that includes a light energy transmitting module having at least one light energy transmitting element disposed therein for transmitting light energy at a frequency tuned to the known, predetermined... Agent: Bond, Schoeneck & King, PLLC

20080212087 - Apparatus for the electromagnetic spectrum or optical analysis, in particular photometric, spectrophotometric or image analysis: An apparatus for the electromagnetic spectrum or optical analysis of a material. The apparatus comprising a measuring probe having a housing with at least one radiation or light measuring element, a measuring window and with at least one detection element for the analysis. The measuring probe is formed and guided... Agent: Harvey S. Kauget Phelps Dunbar, LLP

20080212088 - Holographic sensors and their uses: A method of analysing a holographic sensor (1) comprising a hologram, wherein interaction of the holographic sensor with a stimulant causes a change in the wavelength of diffracted light from the hologram, comprises the steps of: a) viewing light diffracted by the hologram and specular reflections in an image plane... Agent: Saliwanchik Lloyd & Saliwanchik A Professional Association

20080212089 - Multi-spectral techniques for defocus detection: A method and apparatus for improved defocus detection on wafers. The use of hyperspectral imaging provides increased sensitivity for local defocus defects, and the use of Fourier Space analysis provides increased sensitivity for extended defocus defects. A combination of the two provides improved overall sensitivity to local and extended defocus... Agent: Deborah W. Wenocur

20080212090 - Fluorometer with low heat-generating light source: This invention concerns a fluorometer preferably combined with a thermal cycler useful in biochemical protocols such as polymerase chain reaction (PCR) and DNA melting curve analysis. The present fluorometer features a low heat-generating light source such as a light emitting diode (LED), having a one-to-one correspondence to each of a... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center

20080212091 - Light source unit and spectrum analyzer: A light source unit and a spectrum analyzer are provided in which the influence of interference can be reduced under conditions where light is separated into spectral components. A spectrum analyzer 1 is equipped with a light source unit 2 for irradiating light onto sample A, a detector unit 3... Agent: Venable LLP

20080212092 - Wavelength displacement correcting system: In a wavelength displacement correcting system and method of the invention, a monochromatic beam from a light emitting diode driven by a constant current is incident through an incident slit of a spectral device. The incident beam is diffracted on a diffraction grating to form a dispersed light image, and... Agent: Sidley Austin LLP

20080212094 - Detection system and method for aerosol delivery: An apparatus comprises a detector, a pressure sensor and a processor. The detector is operable to detect light that is scattered by an aerosol that is associated with a pressure. The pressure sensor is operable to measure the pressure. The processor is coupled to the detector and to the pressure... Agent: Michelle Saquet Temple

20080212093 - Particle monitor system and substrate processing apparatus: A particle monitor system that can detect fine particles in a substrate processing apparatus. The substrate processing apparatus has a chamber in which a substrate is housed and subjected to processing, a dry pump that exhausts gas out of the chamber, and a bypass line that communicates the chamber and... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080212095 - Optical monitoring apparatus and method of monitoring optical coatings: A beam is reflected and/or transmitted by a sample with a coating. The path of the beam has a unitary path part where the beam is affected by the coating but is split into parallel sub-paths in a fixed (sample independent) part of the apparatus, components of the beam with... Agent: Leydig Voit & Mayer, Ltd

20080212096 - Property determination with light impinging at characteristic angle: A method for determining a property of a layered structure includes receiving information defining a characteristic angle for a structure. The characteristic angle is such that, after performance of a process that changes a thickness of a first layer adjacent a second layer of the structure, light reflected from a... Agent: Fish & Richardson P.C.

20080212098 - Method and apparatus for detecting feature: A method includes detecting a feature of an input pattern using a plurality of feature detectors, selecting at least one of the feature detectors based on their output values, and calculating a feature quantity of the input pattern based on an output value from at least one selected feature detector.... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080212097 - Method of inspection, a method of manufacturing, an inspection apparatus, a substrate, a mask, a lithography apparatus and a lithographic cell: Each target used in a method of measuring overlay using a scatterometer includes a first portion and a second portion, the first portion has features varying only in a first direction and the second portion has features only varying in a second direction. The first and second directions are orthogonal,... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080212099 - Method for counting people passing through a gate: Based on area and color analyses, a cost-effective bi-directional people counter dedicated to the pedestrian flow passing through a gate or a door is proposed. Firstly, the passing people are roughly counted with the area of people projected on an image captured by a zenithal video camera. The moving direction... Agent: North America Intellectual Property Corporation

20080212100 - Sono-photonic gas sensor: Sensing a gas includes introducing a gas into a chamber, forming a standing acoustic wave in the chamber, and irradiating the chamber with electromagnetic radiation. Some of the electromagnetic radiation passes into the chamber, through the standing acoustic wave in the chamber, and out of the chamber. An amount of... Agent: Fish & Richardson P.C.

20080212102 - Multispectral plasmonic crystal sensors: The present invention provides plasmonic crystals comprising three-dimensional and quasi comprising three-dimensional distributions of metallic or semiconducting films, including multi-layered crystal structures comprising nanostructured films and film arrays. Plasmonic crystals of the present invention include precisely registered and deterministically selected nonplanar crystal geometries and spatial distributions providing highly coupled, localized... Agent: Greenlee Winner And Sullivan P C

20080212101 - Optical sensor for detecting moisture on a windshield of a motor vehicle: In an optical sensor for detecting moisture on a windshield of a motor vehicle, in which the light radiation is deflectable to a detection area on the windshield situated in the light path between transmitter and receiver, the transmitter and/or the receiver have a transparent design and are integrated into... Agent: Kenyon & Kenyon LLP

20080212103 - Ultra-short optical pulse measurement using a thick nonlinear crystal: The invention provides a pulse measurement apparatus and corresponding method. The apparatus comprises: a splitter for splitting a pulse to be measured into two sub-pulses propagating along different beam paths; a non-linear medium, capable of up-conversion of radiation propagating therethrough, arranged in said beam paths; at least one element for... Agent: Brooks Kushman P.C.

20080212104 - Apparatus and method for resonant chemical and biological sensing: Apparatus and method are provided for chemical and biological agent sensing. The sensing apparatus includes a resonator having a resonance frequency. The resonator includes a coil of a photonic crystal fiber. The photonic crystal fiber has a solid region configured to guide a substantially single optical mode of light having... Agent: Honeywell International Inc.

20080212105 - Apparatuses and methods for evaluating performance of optical systems: A system for evaluation of optical quality of an optical device includes a light source configured to generate light, the generated light be received by an optical device. An interferometric lens apparatus is removably mounted to the optical device to generate interference fringes. A camera device is configured to receive... Agent: Naval Research Laboratory Associate Counsel (patents)

20080212106 - System and method for processing a profile of a solid, which profile is captured, preferably in a dynamic manner, to determine its wear: A method for the processing of a profile of a solid which has been detected, dynamically, for the purpose of determining wear which has occurred. The data from the evaluated profile are used as a control variable for controlling at least one machine for surface machining on the solid.... Agent: Brinks Hofer Gilson & Lione

20080212107 - Apparatus and method for measuring suspension and head assemblies in a stack: An optical measurement device for determining at least two parameters of a measurement location of a surface of at least one workpiece positioned in a known coordinate system is described. The device comprises a first light source providing a first measurement beam. The first measurement beam is directed at a... Agent: Kagan Binder, PLLC

20080212108 - Positioning device and positioning method: A positioning method for positioning a movable member so as to maximize a detection output of a position detecting means whose detection output varies corresponding to positions of the movable member, comprising: performing a wobbling control when the detection output is small, in which the movable member is moved forward... Agent: Brinks Hofer Gilson & Lione