Optics: measuring and testing inventions 07/08

20080180650 - 3-d imaging system: A 3-D imaging system is described. The 3-D imaging system comprises an illumination unit for emitting light onto a target scene, an imaging sensor for imaging the target scene by detecting scattered/reflected light, an evaluation unit for determining distance information related to the target scene on the basis of light... Agent: Cantor Colburn, LLP

20080180651 - Velocity determination utilizing two photosensor arrays: A technique for relative velocity determination between a surface and a velocity determination system involves capturing a set of outputs from a first photosensor array and then comparing subsequently captured sets of outputs from a second photosensor array to the set of outputs from the first photosensor array until a... Agent: Kathy Manke Avago Technologies Limited

20080180653 - Particle analyzer and particle analyzing method: The present invention is to present a particle analyzer that is capable of classifying and counting particles contained in a sample more accurately. The blood analyzer 1 includes: measuring unit 2 for obtaining a plurality of characteristic information of each of particles contained in a sample by measuring a measurement... Agent: Sughrue Mion, PLLC

20080180652 - Test element analysis system: Test element analysis system for the analytical investigation of a sample, in particular of a body liquid of human beings or animals, comprising test elements (2) with a carrier film (5) and a test field (7) fixed to the flat side (6) of the carrier film (5), the test field... Agent: Woodard, Emhardt, Moriarty, Mcnett & Henry LLP

20080180654 - Dynamic projected user interface: A dynamic projected user interface device is disclosed, that includes a projector, a projection controller, and an imaging sensor. The projection controller is configured to receive instructions from a computing device, and to provide display images via the projector onto display surfaces. The display images are indicative of a first... Agent: Westman Champlin (microsoft Corporation)

20080180656 - Surface characteristic analysis: In one embodiment, a system to measure defects on a surface of a wafer and an edge of the wafer using a single tool comprises a scatterometer to identify at least one defect region on the surface and a surface profile height measuring tool to measure one or more characteristics... Agent: Caven & Aghevli LLC

20080180655 - Mobile terawatt femtosecond laser system (mtfls) for long range spectral sensing and identification of bioaerosols and chemical agents in the atmosphere: The present invention relates to a system for detection and identification of airborne biological, chemical and/or nuclear threats such as toxins, spores, bacteria, and viruses in real time at distances from a few meters to several kilometers. Compact femtosecond terawatt laser technology is combined with spectroscopic and mathematical methods for... Agent: Mintz, Levin, Cohn, Ferris, Glovsky And Popeo, P.c Attn: Patent Intake Customer No. 64046

20080180657 - Determining a focal position of a laser: A method is performed for determining a suitable workpiece processing focal position of a laser beam. The method includes adjusting one or more of a laser beam and a workpiece until a periphery of the laser beam contacts a lateral edge of the workpiece, determining, from at least a focal... Agent: Fish & Richardson PC

20080180658 - Spectroscopic sample holder: Some embodiments of the invention provide one sample holder that is suitable for collection and spectroscopic measurement of a blood sample. In some very specific embodiments, the sample holder is provided with an optical chamber that is specifically designed to spread blood into a thin film, thereby reducing the average... Agent: Bereskin And Parr

20080180659 - Laser system: A laser system includes a laser diode that oscillates in a multi-mode and has characteristics in which its oscillation wavelength varies with temperature, a grating that receives a light beam emitted from the laser diode and returns a diffracted beam to the laser diode, a mechanism that changes the wavelength... Agent: Sonnenschein Nath & Rosenthal LLP

20080180660 - Spectrometric investigation of heterogeneity: In one general aspect, a spectroscopic apparatus is disclosed for investigating heterogeneity of a sample area. The apparatus includes an image acquisition system operative to acquire images of a plurality of sub-areas in the sample area and a sub-area selection interface operative to receive a selection designating one of the... Agent: Kristofer E. Elbing

20080180661 - Chemical analyzer for industrial process control: An optical apparatus for measurement of industrial chemical processes. The analyzer uses Raman scattering and performs measurement of chemical concentrations in continuous or batch processes. The analyzer operates at a standoff distance from the analyte (or analytes) and can measure concentrations through an optical port, facilitating continuous, non-destructive, and non-invasive... Agent: Gauthier & Connors, LLP

20080180663 - Raman probe configured for low-concentration measurements: Raman measurement apparatus optimized for gaseous and other low-concentration samples includes a focusing objective that uses only first-surface mirrors instead of lenses, thereby dramatically reducing background noise. In the preferred embodiment, the focusing and collimation functions performed by the objective section are performed by an off-axis parabolic mirror. A spherical... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c

20080180662 - Raman signal-enhancing structures for raman spectroscopy and methods for performing raman spectroscopy: Raman systems include a radiation source, a radiation detector configured to detect Raman scattered radiation, and a Raman signal-enhancing structure. The Raman signal-enhancing structure includes a first layer of Raman signal-enhancing material, a substantially monomolecular layer of molecules disposed on at least a portion of the first layer of Raman... Agent: Hewlett Packard Company

20080180664 - System for identifying refractive-index fluctuations of a target: Systems and methods for identifying refractive-index fluctuations of a target are described in this application. One embodiment includes identifying one or more properties of emergent light, the emergent light to be emergent from a target, and determining refractive-index fluctuations of the target based on the one or more properties of... Agent: Greenberg Traurig, LLP

20080180665 - Measuring color spectra using color filter arrays: Embodiments including color filter arrays are disclosed.... Agent: Hewlett Packard Company

20080180666 - Optical detector for a particle sorting system: An optical system for acquiring fast spectra from spatially channel arrays includes a light source for producing a light beam that passes through the microfluidic chip or the channel to be monitored, one or more lenses or optical fibers for capturing the light from the light source after interaction with... Agent: Lahive & Cockfield, LLP

20080180668 - Marker structure for optical alignment of a substrate, a substrate including such a marker structure, an alignment method for aligning to such a marker structure, and a lithographic projection apparatus: A marker structure on a substrate for optical alignment of the substrate includes a plurality of first structural elements and a plurality of second structural elements. In use, the marker structure allows the optical alignment based upon providing at least one light beam directed on the marker structure, detecting light... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080180667 - Recursive-reflective photoelectric sensor: A recursive-reflective photoelectric sensor has a sensor main body and a recursive reflecting part. The sensor main body includes a light projecting part that projects first circularly polarized light and a light receiving part. When a mixture of the first circularly polarized light and second circularly polarized light which is... Agent: Beyer Weaver LLP

20080180669 - Apparatus for checking concentricity between lens barrel and barrel holder: An apparatus for checking concentricity between a barrel holder and a lens barrel rotatably engaging with the barrel holder is provided. The lens barrel includes at least one lens coaxially received therein. The apparatus includes a barrel holder retaining member, a rotating member, a driving unit, a light source, and... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080180670 - Lighting device and method for realizing a desired color mixture: A device and method for controlling a plurality of individual light sources with varying spectra, wherein a desired resulting light spectrum with three manipulated variables representing a color standard is selected to serve as the basis along with an detected light spectrum to control the plurality of light sources with... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20080180671 - Methods and apparatus for estimating the intensity of one spectrum of light in a mixed light, in response to the sensed intensities of one or more other spectrums of light in the mixed light: In one embodiment, light having a first spectrum is filtered from a mixed light. Light having a second spectrum, different from the first spectrum, is also filtered from the mixed light. An intensity of the light having the first spectrum, and an intensity of the light having the second spectrum,... Agent: Kathy Manke Avago Technologies Limited

20080180673 - Indicator detection using transverse emissions: A test system includes an optical medium, a binding agent capable of capturing a target complex, and a light detector. The optical medium provides a light path, and the binding agent is positioned to hold the target complex in an evanescent field created by propagation of light along the light... Agent: Kathy Manke Avago Technologies Limited

20080180674 - Optical transmission system: An optical transmission system includes a laser, a transmitter and a receiver. The laser is capable of operating on an inhomogeneously broadened optical transition of the active region of the laser. A spectral bandwidth of an output lasing spectrum of the laser is greater than 5 nm and a spectral... Agent: Brown & Michaels, PC 400 M & T Bank Building

20080180672 - Photonic-based sensors and methods for detecting analytes: Various embodiments of the present invention are directed to analyte detection methods and to photonic-based sensors that employ photonic crystal gratings to detect analytes. In one embodiment of the present invention, a photonic-based sensor includes a source, a photonic crystal, and a photodetector. The source is configured to output electromagnetic... Agent: Hewlett Packard Company

20080180676 - Apparatus and method for energizing a computer in a vehicle: A vehicle includes a power supply and an ignition. A computer includes a mother board with a converting circuit for converting electricity. A switching circuit controls the transfer of electricity to the converting circuit from the power supply. A detecting circuit detects the state of the ignition, sends an ON... Agent: Rosenberg, Klein & Lee

20080180677 - Internally-calibrated, two-detector gas filter correlation radiometry (gfcr) system: An entrance aperture of a GFCR system receives light from a scene of interest. The light is focused to form an image at a focal plane. Light associated with a selected field-of-view of the image at the focal plane is then confined to a spectral band at which a gas... Agent: Peter J. Van Bergen

20080180675 - Photoacoustic spectroscopy system and technique for remote sensing of explosives and toxic chemicals: A user-friendly photoacoustic spectroscopy (PAS) system and process (technique) provides an open-field PAS instrument, unit and device to remotely sense explosives, chemicals and biological agents. The PAS system and process can include: a pulsed tunable laser, such as a CO2 laser, a reflector, such as a parabolic reflector, an acoustic... Agent: Thomas W. Tolpin 22nd Floor

20080180678 - Two-detector gas filter correlation radiometry (gfcr) system using two-dimensional array detection of defocused image and detected-signal summation: An entrance aperture of a GFCR system receives light from a scene of interest. The light is focused to form an image at a focal plane. Light associated with a selected field-of-view of the image is then confined to a spectral band at which a gas of interest absorbs. The... Agent: Peter J. Van Bergen

20080180680 - Electro-optical measurement of hysteresis in interferometric modulators: Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.... Agent: Knobbe, Martens, Olson & Bear, LLP

20080180679 - Sinusoidal phase shifting interferometry: Disclosed is a method that includes combining a first light beam and at least a second light beam to form a combined light beam, introducing a sinusoidal phase shift with a frequency f between a phase of the first light beam and a phase of the second light beam, recording... Agent: Fish & Richardson PC

20080180681 - Fiber optic sensor using a bragg fiber: An optical sensor includes a directional coupler comprising at least a first port, a second port, and a third port. The first port is in optical communication with the second port and with the third port such that a first optical signal received by the first port is split into... Agent: Knobbe Martens Olson & Bear LLP

20080180682 - Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry: An interferometery system for making interferometric measurements of an object, the system including: a beam generation module which during operation delivers an output beam that includes a first beam at a first frequency and a second beam at a second frequency that is different from the first frequency, the first... Agent: Wilmerhale/boston

20080180683 - Optical coherence tomography implementation: Provided herein are systems, methods, and compositions for optical coherence tomography implementations.... Agent: Rosenbaum & Associates, P.C.

20080180684 - Thin-film metrology using spectral reflectance with an intermediate in-line reference: Reflectance systems and methods are described that use information of an intermediate reference signal to continuously monitor, detect and/or compensate for drift in a metrology system. The intermediate reference signal is present regardless of whether a sample is being measured. The reflectance system comprises components including a transmission element coupled... Agent: Courtney Staniford & Gregory LLP

20080180685 - Interferometry for lateral metrology: A method is disclosed which includes: using a scanning interferons dry system, generating a sequence of phase-shifted interferometry images at different scan positions of an object comprising a buried surface, identifying a scan position corresponding to a position of best focus for the buried surface based on the sequence of... Agent: Fish & Richardson PC

20080180686 - Method of measuring topology of functional liquid droplet in pixel, topology measuring apparatus of functional liquid in pixel, liquid ejection apparatus, method of manufacturing electro-optical apparatus, electro-optical apparatus, and electronic apparat: A method of measuring topology of functional liquid in a pixel, in which thickness or volume of the functional liquid in the pixel is measured by a surface topology measuring apparatus comprising: measuring surface topologies in which surface topology of the functional liquid in the pixel and surface topology of... Agent: Harness, Dickey & Pierce, P.L.C

20080180687 - Interferometric height measurement: The invention relates to an interferometric method for measuring a height of a first region on a first surface, the first surface having first areas having first optical properties and second areas having second optical properties, the method comprising the steps of generating of first and second coherent light beams,... Agent: Dillon & Yudell, LLP

20080180688 - System for measuring the image quality of an optical imaging system: A measuring system for the optical measurement of an optical imaging system, which is provided to image a pattern arranged in an object surface of the imaging system in an image surface of the imaging system, comprises an object-side structure carrier having an object-side measuring structure, to be arranged on... Agent: Fish & Richardson PC

20080180689 - Interferometric height measurement: The invention relates to an interferometric method for measuring a height of a first region on a first surface, the first surface having first areas having first optical properties and second areas having second optical properties, the method comprising the steps of generating of first and second coherent light beams,... Agent: Dillon & Yudell, LLP

20080180690 - Optical air data system: At least one second beam of light from a first beam of light generated by a laser is directed into an atmosphere. Light therefrom scattered by molecules or aerosols in the atmosphere is collected by at least one telescope as at least one light signal, which together with a reference... Agent: Raggio & Dinnin, P.C.

20080180691 - Optical air data system: At least one second beam of light from a first beam of light generated by a laser is directed into an atmosphere. Light therefrom scattered by molecules or aerosols in the atmosphere is collected by at least one telescope as at least one light signal, which together with a reference... Agent: Raggio & Dinnin, P.C.

20080180693 - Determining positional error of an optical component using structured light patterns: Described is an interferometric surface contour measurement system for projecting structured light patterns onto an object. The measurement system includes an interferometric projector, an imager, and a processor. The imager is rigidly coupled to the projector to maintain a stable relationship to the projected, structured light pattern. The imager receives... Agent: Guerin & Rodriguez, LLP

20080180692 - Method and apparatus for assay based on light diffraction: The present invention relates to a method and apparatus for detecting analytes in a medium, and more particularly the present invention relates to an assay based on light diffraction which appears or changes upon the binding of analytes to their specific receptors laid out in patterns on a substrate, which... Agent: Ralph A. Dowell Of Dowell & Dowell P.C.

20080180694 - Scanning interferometry for thin film thickness and surface measurements: A method including: providing a low coherence scanning interferometry data for at least one spatial location of a sample having multiple interfaces, wherein the data is collected using a low coherence scanning interferometer having an illumination geometry and an illumination frequency spectrum, and wherein the data comprises a low coherence... Agent: Fish & Richardson PC

20080180695 - Unevenness elimination end-point detecting apparatus and unevenness elimination end-point detecting method for cmp apparatus: An unevenness elimination end-point detection apparatus for a CMP apparatus which polishes a film to be polished formed on a wafer surface includes: light irradiation means for irradiating a light on a polishing surface of the wafer during polishing of the wafer; photoelectric conversion means for converting a light intensity... Agent: Paul A. Fattibene Fattibene & Fattibene

20080180696 - Process window for euv lithography: A method is provided for determining a process window for a lithography process using a reflective mask. The method begins by selecting a target Critical Dimension (CD) of a feature in an image pattern to be formed on a wafer and a corresponding CD tolerance. A CD of the feature... Agent: Mayer & Williams PC

20080180697 - Measuring instrument and laser beam machine for wafer: A measuring instrument for a wafer for measuring the thickness of a wafer held on a chuck table using a laser beam includes a condenser for condensing and irradiating the laser beam on the wafer held on the chuck table, a light reception unit for receiving reflected light of the... Agent: Greer, Burns & Crain

20080180698 - Purge gas flow control for high-precision film measurements using ellipsometry and reflectometry: An optical method and system for measuring characteristics of a sample using a broadband metrology tool in a purge gas flow environment are disclosed. In the method a beam path for the metrology tool is purged with purge gas at a first flow rate. A surface of the sample is... Agent: Joshua D. Isenberg Jdi Patent

20080174760 - Laser distance finder: A compact, power-saving laser distance finder with high accuracy is disclosed having a laser generating device, a collimating lens in an emitting end direction of the laser generating device, a receiving lens, an optoelectronic detector, a reflective member rotatably mounted on an optical path of the collimating measuring beam via... Agent: Mcdermott, Will & Emery LLP

20080174761 - Laser distance finder: A laser distance finder including a laser generating device, a collimating lens positioned in an emitting end direction of the laser generating device, a receiving lens for receiving a reflected measuring beam from an object to be measured and focusing it into an image, an optoelectronic detector disposed in the... Agent: Mcdermott, Will & Emery LLP

20080174762 - Micro-mirror optical tracking and ranging system: A micro-mirror optical tracking and ranging system comprises an optical transceiver having a Micro-Electro-Optical Mechanical System (MEOMS) micro-mirror beam steering system and an electronic control and operating system for processing electronic signals. An optical transceiver and MEOMS micro-mirror beam steering system comprises two oppositely installed micro-mirrors controlled so that they... Agent: U S Army Research Laboratory Attn Amsrl Cs Cc Ip

20080174763 - Color measuring head and scanner device equipped therewith: A scanner device includes a support surface for the measured object and a drive unit for moving a color measuring head across the support surface in at least one dimension thereof and for adjusting the height of the color measuring head in the direction perpendicular to the support surface, as... Agent: Mccarter & English , LLP Stamford Office

20080174766 - Correction method and measurement device for anti-stokes photoluminescence measurement: This invention relates to a method to correct for error in an anti-Stokes photoluminescence measurement in a Foerster-type resonance energy-transfer assay. The method comprises the steps of exciting anti-Stokes photoluminescent molecules, ions, phosphors, chelates, or particles, i.e. donors of the assay, with one wavelength or multiple wavelengths of light wherein... Agent: James C. Lydon

20080174765 - Examination apparatus: An examination apparatus is provided, the examination apparatus being capable of preventing difficulty in observing a specimen because of light emitted from markers. The examination apparatus includes a first image-acquisition unit configured to detect a movement related to a first image of light generated at a first region of the... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080174767 - Optical system: An optical system is provided for achieving enhanced rejection of scattered excitation light and superior signal-to-noise performance when reading microplate wells. The optical system uses an axial configuration in which the excitation beam incident upon the sample propagates along the axis of the microplate well. Excitation light from a light... Agent: Ralph A. Dowell Of Dowell & Dowell P.c.

20080174768 - Self referencing led detection system for spectroscopy applications: A light emitting diode (LED) based detection system is employed for spectroscopy based applications. LEDs are used as monochromatic light sources for applications at specific and pre-defined wavelengths. Spectrographic information is generated using LEDs of different wavelengths ranging from 260 nm to 1400 nm. Multiple wavelength information is generated by... Agent: Alix Yale & Ristas LLP

20080174764 - Surface inspection method and surface inspection apparatus: Provided are a surface inspection method and a surface inspection apparatus that are capable of detecting scattered light from a contaminant particle and a defect at a good S/N even when the relative ratio of background scattered light to the total quantity of scattered light and the anisotropy of background... Agent: Crowell & Moring LLP Intellectual Property Group

20080174769 - Method and apparatus for testing fiber optic components: An apparatus and method for testing a fiber optic component having two ends includes a device having a sensor, an alarm, and a connector assembly having different types of connectors each being operable to connect the device to either end of a corresponding type of fiber optic component. Upon a... Agent: Brooks Kushman P.c.

20080174770 - System and method for resolving photoemission from semiconductor devices: A method for isolating the emitting devices may be applied to various emission and laser microscopy systems. A point spread function is convolved with CAD data of devices involved in the emission. The calculated signal intensity of the devices is varied until the difference between the calculated signal and the... Agent: Nixon Peabody, LLP

20080174771 - Automatic inspection system for flat panel substrate: Automatic optical inspection (AOI) systems are described comprising optical modules that include an illumination component and a lens array configured to direct illumination of the illumination component at a portion of a substrate. The lens array includes a Fresnel lens. The optical module includes a camera that receives reflected light... Agent: Courtney Staniford & Gregory LLP

20080174772 - Circuit-pattern inspection apparatus: The disclosed subject matter is related to a circuit pattern inspection apparatus for detecting a gradual changing of defect expanding over a large area of the semiconductor wafer. In order to detect a gradual changing of a defect related condition expanding over a large area of the semiconductor wafer, comparison... Agent: Mcdermott Will & Emery LLP

20080174773 - Sample holder for an optical element: The sample holder includes support having a thickness and an aperture through the thickness of the support. A tilt mechanism is connected to the support for controlled tilting of the support, and the aperture through the support is configured to have a diameter that increases in a direction through the... Agent: Hancock Hughey LLP

20080174775 - Platform for chemical and biological sensing by surface-enhanced raman spectroscopy: Methods of analysis, and compositions relating to such, to determine the presence or absence of an analyte in a sample utilizing a composite substrate which facilitates surface enhanced Raman spectroscopy through the use of ‘hot spots’ of the form ‘metal/analyte/metal’ are presented. Additionally, substrates which contain ‘hot spots’ of the... Agent: Bozicevic, Field & Francis LLP

20080174774 - Surface plasmon enhanced raman spectroscopy: An apparatus and related methods for spectroscopic analysis of analyte molecules is described. The analyte molecules are disposed near a metallic film that is positioned between a first medium on a first side and a second medium on a second side, the second medium being of higher refractive index than... Agent: Hewlett Packard Company

20080174776 - Fluorescence correlation spectroscopy analyzer: A fluorescence correlation spectroscopy analyzer 1 is equipped with an excitation light illuminating optical system 21, a fluorescence imaging optical system 22, a CCD camera 15, and a data analyzer 16. The excitation light illuminating optical system 21 illuminates excitation light onto a predetermined region of a measured sample S.... Agent: Drinker Biddle & Reath (dc)

20080174777 - Spectrometers using 2-dimensional microelectromechanical digital micromirror devices: Echelle gratings and microelectromechanical system (MEMS) digital micromirror device (DMD) detectors are used to provide rapid, small, and highly sensitive spectrometers. The new spectrometers are particularly useful for laser induced breakdown and Raman spectroscopy, but could generally be used with any form of emission spectroscopy. The new spectrometers have particular... Agent: Davis, Brown, Koehn, Shors & Roberts, P.c. The Financial Center

20080174778 - Method and system for optimizing sub-nanometer critical dimension using pitch offset: A method and a system are provided for calibrating metrological tools used to measure features of a semiconductor device. A critical dimension (CD) ruler defines a known pitch plus a pitch offset. A photoresist layer is measured to determine a measured pitch whereupon the measured pitch is compared to the... Agent: Haynes And Boone, LLP

20080174779 - Wafer alignment method for dual beam system: A gradient charged particle beam apparatus capable of moving highly accurately to a specific position by eliminating influences of warp inside a wafer surface is provided. A portion 46 having a mark 47 for aligning visual field alignment positioned in advance to the same horizontal and the same height as... Agent: Mcdermott Will & Emery LLP

20080174780 - Method and apparatus for inspecting a surface: A method and an apparatus for inspecting a surface of a wafer disclosed. At least one incident-light illuminator is provided to illuminate an area of the surface of the wafer in a first and a second illumination mode, in particular a bright-field and a dark-field illumination. At least one image... Agent: Davidson, Davidson & Kappel, Llc

20080174781 - Fiber optic seismic sensor based on mems cantilever: A dual cantilevered beam structure is attached to a silicon frame. An optical fiber extends from a borosilicate wafer bonded to the bottom of the frame. A second borosilicate wafer is bonded to the top of the frame. The bottom borosilicate wafer is bonded to the optical fiber with a... Agent: Mcdonald Hopkins Llc

20080174782 - Method of speckle size and distribution control and the optical system using the same: A method of speckle size and distribution control and the optical system using the same are disclosed. The optical system is arranged inside a housing of a computer mouse that is primarily composed of a laser unit, a lens set, an image sensing unit and a digital signal processing unit.... Agent: Wpat, Pc

20080174784 - Apparatus and method for measuring characteristics of surface features: An apparatus is disclosed which includes an interferometry system configured to operate in a first mode to produce a first set of multiple interferometry signals corresponding to different illumination angles of a test object by test light and in a second mode produce a second set of multiple interferometry signals... Agent: Fish & Richardson Pc

20080174783 - System and method of interferometric imaging using a digital micromirror device: A method of interferometric imaging includes a) focusing an interference pattern of a surface of an object onto a digital micromirror device, b) reflecting interfered electromagnetic radiation from a first plurality of mirrors of the digital micromirror device onto a detector, and recording the integrated intensity of the reflected interferometric... Agent: Schox Plc

20080174785 - Apparatus for the contact-less, interferometric determination of surface height profiles and depth scattering profiles: An apparatus for the contact-less, interferometric investigation of a sample object (2), particularly for the determination of sample surface profiles and depth profiles of light scattering properties of the sample (2), comprises a light source (1), able to provide broadband, low-coherence light; a beam splitter (4), arranged to split up... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20080174786 - Phase shift amount measurement apparatus and transmittance measurement apparatus: A phase shift amount measurement apparatus able to further correctly measure a phase shift amount of a phase shifter, wherein a laterally offset interference image of a phase shift mask is formed by a shearing interferometer, the interference image is captured by a two-dimensional imaging device, an output signal output... Agent: Carrier Blackman And Associates

20080174788 - Scanner device: A scanner device for measuring the color properties of a measured object pixel by pixel has a support surface for the measured object, a color measuring head, a drive unit for moving the color measuring head above the support surface in at least one dimension thereof and for adjusting the... Agent: Mccarter & English , LLP Stamford Office

20080174787 - System and method for selectively setting optical navigation resolution: A system and method for selectively setting an optical navigation resolution utilizes a comparison of a comparison displacement value to a threshold value to set the optical navigation resolution to an effective resolution selected from a plurality of effective resolutions. The comparison displacement value is based on at least one... Agent: Kathy Manke Avago Technologies Limited

20080174789 - Method for optical chassis measurement: The invention relates to a method for optically measuring a chassis at a testing station. According to said method, radiation that is reflected by a surface structure of a vehicle, comprising at least one wheel (5) and a surrounding bodywork section, is detected by a measuring device with the aid... Agent: Michael J. Striker

20080170218 - Ultra-fast laser system: A laser system is provided which selectively excites Raman active vibrations in molecules. In another aspect of the present invention, the system includes a laser, pulse shaper and detection device. A further aspect of the present invention employs a femtosecond laser and binary pulse shaping (BPS). Still another aspect of... Agent: Harness, Dickey & Pierce, P.L.C

20080170219 - Methods, systems, and computer program products for performing real-time quadrature projection based fourier domain optical coherence tomography: Methods, systems, and computer program products for performing real-time quadrature projection based FDOCT are disclosed. According to one method, a plurality of interferogram signals is phase shifted. A Fourier transform is applied to each of the plurality of interferogram signals. Depth dependence of the plurality of transformed interferogram signals is... Agent: Jenkins, Wilson, Taylor & Hunt, P. A.

20080170220 - Optical sensor and image forming apparatus: An optical sensor includes at least one light emitting unit that emits a light, a first light receiving unit that receives specular reflection light from an illumination object when the light is incident on the illumination object with an incidence angle and specularly reflected with a reflection angle, and a... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080170221 - Fiber optic cable systems and methods incorporating a luminescent compound-containing layer to identify cracks: Fiber optic cable systems and methods incorporating a luminescent compound-containing layer to identify cracks. Exemplary embodiments include a fiber optic cable apparatus including a core for receiving laser light emitted from a VCSEL for the detection of faults in the fiber optic cable, a cladding disposed around the core, the... Agent: Cantor Colburn LLP - IBM Rochester Division

20080170222 - Methods and systems for determining vehicle wheel alignment: Methods and systems for determining an alignment of the wheels of a vehicle are provided. The method includes determining values of wheel alignment parameters of a first wheel using images of a first optical target associated with the first wheel wherein the images are received by a first imager having... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20080170223 - Low profile spectrometer and raman analyzer utilizing the same: A spectrometer comprising a collimating element for receiving input light and collimating the same, a dispersive optical element for receiving light from the collimating element and dispersing the same and a focusing element for receiving light from the dispersive optical element and focusing the same on a detector assembly wherein,... Agent: Fish & Richardson PC

20080170224 - Optical collection geometries for phase fluorimetry: s

20080170225 - Apparatus and method for ranging and noise reduction of low coherence interferometry lci and optical coherence tomography oct signals by parallel detection of spectral bands: Apparatus and method for increasing the sensitivity in the detection of optical coherence tomography and low coherence interferometry (“LCI”) signals by detecting a parallel set of spectral bands, each band being a unique combination of optical frequencies. The LCI broad bandwidth source is split into N spectral bands. The N... Agent: Dorsey & Whitney LLP Intellectual Property Department

20080170226 - Particle monitor system and substrate processing apparatus: A particle monitor system capable of accurately detecting the number of or the size of particles flowing through an exhaust pipe. In a bypass line through which a chamber is communicated with a dry pump, there is disposed the particle monitor system that includes a laser oscillator for irradiating laser... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080170227 - Apparatus and method for determining anisotropies using optical microscopy: The present invention relates to an apparatus and a method for determining anisotropies affecting the polarization properties of light in microscopically small objects using optical microscopy. In particular, the invention relates to an apparatus comprising an optical path extending between a light source and an optical sensor, wherein the object,... Agent: Octax Microscience Gmbh C/o Dr. Thomas Schimming

20080170228 - Method and apparatus for wafer level calibration of imaging sensors: Methods and apparatuses for wafer level calibration of imaging sensors and for imaging sensors that have been calibrated at the wafer level. The quantum efficiency spectrum measurement is calculated for calibration pixels (or other region of interest) using spatially separated monochromatic light having a spectral range. The results of the... Agent: Dickstein Shapiro LLP

20080170229 - Method of selecting crystalline quartz material for use in an optical apparatus: Methods of selecting crystalline quartz material for use in an optical apparatuses are disclosed. In some embodiments, the methods can enable a relatively fast, simple and/or reliable selection of samples with respect to their lifetime properties under laser irradiation.... Agent: Fish & Richardson PC

20080170230 - Silanization of noble metal films: The present invention provides a method of preparing a silica layer on a surface, the method comprising contacting the surface with a first alkoxysilane and a first base, such that a first siloxane layer is formed on the surface; and contacting the first siloxane layer with a combination of a... Agent: Townsend And Townsend And Crew, LLP

20080170231 - Interferometer maintaining optical relationship between elements: An interferometer for Fourier transform infrared spectroscopy includes a fixed assembly including a housing, a beam splitter, and a mirror fixedly positioned relative to each other. A movable assembly includes a housing, a mirror, and a motor coil, fixedly positioned relative to each other. A first flat spring has an... Agent: Calfee Halter & Griswold, LLP

20080170232 - Two-beam interferometer for fourier transform spectroscopy with double pivot scanning mechanism: A two-beam interferometer for Fourier Transform spectroscopy has a double pivot scanning mechanism. The interferometer has two rigid pendulums that are each rotatable to swing around an associated one of distinct axes of rotation. A linkage links the two rigid pendulums to each other and constrains their rotation relative to... Agent: Michael M. Rickin Abb Inc.

20080170233 - Apparatus for compatible glass substrate test disk for component level measurement of a head gimbal assembly: An optical test stand using a first glass substrate compatible with the glass substrate of a disk for a hard disk drive. A first method uses an optical test stand to perform both intensity-based and phase-based interferometry to create improved estimates of the flying height of a slider off of... Agent: Gregory Smith & Associates

20080170234 - Method and apparatus of optical test stand using blue to ultra-violet light source for component level measurement of head gimbal assembly for use in hard disk drive: An optical test stand using a blue light source to perform both intensity-based and phase-based interferometry creating improved estimates of the flying height of a slider off of rotating disk surface, and the flying height estimate as a product of that process. A first method using an optical test stand... Agent: Gregory Smith & Associates

20080170235 - Laser doppler velocimeter: A laser Doppler velocimeter is formed using erbium-doped fiber as the lasing medium. The fiber is diode-pumped. By properly modulating the lasing in the fiber, pulses of radiation may be generated. A telescope acts as the transmission device to focus the radiation at a specified point, and may also act... Agent: Clark & Brody

20080170236 - Method and apparatus for measuring expansion of materials: Methods for measuring expansion of a test sample. One method includes establishing a diffraction slit between two blades, with the position of at least one of the blades being dependent upon the length of a test sample of material. As the temperature of the sample changes, the width of the... Agent: Bingham Mchale LLP

20080170237 - Web planarity gauge and method: An apparatus for measuring web planarity includes a horizontal reference surface and a light source for projecting a light pattern onto the reference surface at an angle. A web is supported above the reference surface. An imaging device detects (1) positions on the reference plane of interception of discrete regions... Agent: Pamela R. Crocker, Patent Legal Staff Eastman Kodak Company

20080170238 - Three-dimensional shape measuring device, and portable measuring device: A three-dimensional shape measuring device for measuring a three-dimensional shape of a measurement object using a light section method includes: a slit beam generator for generating a slit beam of a fan-like shape; a light projecting optical system for projecting the slit beam toward the measurement object; and an imaging... Agent: Sidley Austin LLP

20080170239 - Light source unit for alignment, alignment apparatus, exposure apparatus, digital exposure apparatus, alignment method, exposure method and method for setting lighting apparatus condition: A light source unit (100A) for alignment is provided with a camera (30), a lighting apparatus (102), and furthermore, a changing section (110), an image processing section (112), an extracting section (114) and a setting section (116). The changing section (110) controls drive of a shifting mechanism (118) based on... Agent: Sughrue Mion, PLLC

20080170240 - Measurement method, exposure method, exposure apparatus, and device fabrication method: A method for measuring a synchronization error between a first stage and a second stage in a scanning exposure apparatus including the first stage which supports a reticle, the second stage which supports a substrate, and a projection optical system which projects a pattern of the reticle onto the substrate,... Agent: Morgan & Finnegan, L.L.P.

20080170241 - Automated process control using optical metrology and a correlation between profile models and key profile shape variables: A process step in fabricating a structure on a wafer in a wafer application having one or more process steps and one or more process parameters is controlled by determining a correlation between a set of profile models and one or more key profile shape variables. Each profile model is... Agent: Morrison & Foerster LLP

20080170242 - Determining one or more profile parameters of a structure using optical metrology and a correlation between profile models and key profile shape variables: One or more profile parameters of a structure fabricated on a wafer in a wafer application are determined by developing a correlation between a set of profile models and one or more key profile shape variables. The wafer application has one or more process steps and one or more process... Agent: Morrison & Foerster LLP

20080170243 - Measuring apparatus for work held by chuck table, and laser beam machining apparatus: An apparatus for measuring the height of a work held by a chuck table provided in a machining apparatus, including: a white light source for emitting a white beam of light; a chromatic aberration lens for condensing the white beam emitted from the white light source; a beam splitter which... Agent: Greer, Burns & Crain

20080165341 - Multiple channel interferometric surface contour measurement system: Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each... Agent: Guerin & Rodriguez, LLP

20080165343 - Optical system for detecting anomalies and/or features of surfaces: A surface inspection of the system applies a first oblique illumination beam and may also apply a second illumination beam to illuminate a surface either sequentially or simultaneously. Radiation reflected or scattered is collected by preferably three collection channels and detected by three corresponding detector arrays, although a different number... Agent: Davis Wright Tremaine LLP - Kla-tencor Corporation

20080165342 - Position detection system: Positions of a plurality of objects in a space are detected. A position of reflected light of an object passing through an infrared screen is specified by analyzing an image obtained by selectively imaging the infrared rays. When the infrared screen is formed in front the display, reflected light is... Agent: GlobalIPCounselors, LLP

20080165345 - Distance measuring interferometer and encoder metrology systems for use in lithography tools: In general, in one aspect, the invention features a system that includes a moveable stage, an interferometer configured to provide information about a first degree of freedom of the stage, an encoder configured to provide information about a second degree of freedom of the stage, and an electronic processor configured... Agent: Fish & Richardson PC

20080165344 - System and system for robot mounted sensor: An apparatus and method for the remote analysis and identification of unknown compounds. A robotic arm positions a sensor on a surface. The sensor unit has a monitoring mechanism to monitor separation between the sensor unit and the surface when placed in contact with the surface to maintain the separation... Agent: Chemimage Corporation

20080165347 - Interferometer system for monitoring an object: In general, in one aspect, the invention features a system including a light source, a plurality of interferometers configured to receive light from the light source and to form output light, each interferometer including a first optic and a second optic, the first and second optics configured to be mounted... Agent: Fish & Richardson P.C.

20080165346 - Methods and systems for simultaneous real-time monitoring of optical signals from multiple sources: Methods and systems for real-time monitoring of optical signals from arrays of signal sources, and particularly optical signal sources that have spectrally different signal components. Systems include signal source arrays in optical communication with optical trains that direct excitation radiation to and emitted signals from such arrays and image the... Agent: Quine Intellectual Property Law Group, P.C.

20080165348 - Apparatus for monitoring optical fiber link: An apparatus and method for monitoring an optical fiber that links a first node and a second node. An apparatus includes: a first transmitting part for outputting a first check light, which is modulated by the first pattern signal, to the optical fiber link. A first receiving part demodulates the... Agent: Cha & Reiter, LLC

20080165350 - Apparatus for testing light transmission through lens: An apparatus for testing transmission of a lens includes a light source, a focusing device, an integrating sphere, a moveable carrier, a detector, and a processor. Light, in a specific wavelength range, is emitted from the light source. The focusing device is configured for collimating and focusing the light to... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080165349 - Apparatus for testing reflectivity of lens: An apparatus for testing reflectivity of a lens includes an integrating sphere, a light source, a moveable carrier, a detector, and a processor. The integrating sphere has a sampling port for permitting light transfer with a lens to be tested and an exit port configured for transmitting light beams reflected... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080165351 - Detection circuit: According to the invention, at the end of the last pass between a winder/unwinder placed upstream of the cage in the rolling direction and acting as an uncoiler, and a downstream winder/unwinder acting as a coiler, the upstream service length is unwound completely from the uncoiler, then subjected to a... Agent: Arent Fox LLP

20080165352 - Method, system and apparatus of inspection: A method of inspecting defects on an object includes irradiating predetermined particles with a laser beam to measure first scattered light intensities, irradiating plural types of defects with the laser beam to measure second scattered light intensities, determining types of some defects selected out of the plural types of defects... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080165353 - Masking member, light measuring method, light measuring kit and light measuring container: The present invention relates to a masking member or the like by which effects of fluorescence originated from fluorescent dye or test compound in a buffer accommodated in a container together with a measurement object are removed surely and which eliminates removal of excessive fluorescent dye or test compound included... Agent: Drinker Biddle & Reath (dc)

20080165354 - Method and apparatus for dissolving solid matter in liquid: The invention concerns a method and apparatus for monitoring physical and chemical properties of a solid sample during a dissolution process, the sample comprising at least one soluble component. In the method, the solid sample is brought into contact with dissolution medium for producing a solution and a solid residue... Agent: Mccormick, Paulding & Huber LLP

20080165355 - High-resolution high-speed terahertz spectrometer: A high-resolution high-speed terahertz spectrometry for measuring a terahertz frequency spectrum at high speed with a laser mode-locking frequency which is the theoretical limitation frequency resolution of the terahertz time-domain spectroscopy. The mode-locking frequencies of two femtosecond laser light sources are controlled so that they are stabilized at high degree... Agent: Posz Law Group, PLC

20080165356 - Laser diode array downhole spectrometer: Apparatus and method for downhole formation testing using a spectrometer includes a carrier conveyable into a well borehole that traverses a subterranean formation of interest, a plurality of semiconductor light sources disposed on the carrier, a fluid sample cell that receives light emitted from the plurality of semiconductor light sources,... Agent: Todd A. Bynum Edmonds PC

20080165357 - Method and system for providing a high definition triangulation system: A triangulation system including a laser beam, optics focusing the laser beam on an object, a light detection unit detecting light reflected from the object due to impingement of the beam on the object, and an arrangement for determining, based on the detected light, object feature dimensions. The wavelength of... Agent: Kenyon & Kenyon LLP

20080165358 - Optical scanning device and method of deriving same: The present invention relates to an optical scanning device that comprises a light source to emit a beam of light, and a beam splitter to split that beam into several beamlets, and further a first objective lens to direct said beamlets onto a focal plane wherein each of said beamlets... Agent: Howrey LLP

20080165359 - Method for enhancing polarimeter systems that use micro-polarizers: This invention solves a problem of registration and improves signal-to-noise ratio (SNR) when using division-by-focal-plane array to produce multiple polarization images. This is achieved by processing a sequence of angular-position-dithered frames to generate a high-definition, Nyquist-sampled, integrated image for each of the polarizations. The integration method transforms individually under-sampled, high-resolution... Agent: Birch Stewart Kolasch & Birch

20080165360 - Scanning beam device calibration: Scanning beam device calibration using a calibration pattern is disclosed. In one aspect, a method may include acquiring an image of a calibration pattern using a scanning beam device. The acquired image may be compared with a representation of the calibration pattern. The scanning beam device may be calibrated based... Agent: Blakely Sokoloff Taylor & Zafman

20080165361 - Method of analyzing sulfur content in fuels: A method of detecting the amount of sulfur compounds in fuels such as ultra low sulfur diesel (ULSD) fuels is provided in which a fuel sample is reacted with a solvent and an oxidizing agent to produce a reaction product which may be analyzed by visual observation and/or in combination... Agent: Dinsmore & Shohl LLP

20080165362 - Method and apparatus for inspection of containers: A method of inspecting a container during transfer of the container includes connecting a crane to the container by way of a spreader bar, causing a probe to engage an inspection port on the container, and probing the container. The probe may be an imaging probe, a camera, or another... Agent: Saul Ewing LLP (baltimore) Attn: Patent Docket Clerk

20080165363 - Flash photolysis system: A spectrometer capable of flash photolysis useful in the study of chemistry is disclosed, the spectrometer comprises a compartment for receiving a chemical sample; a first light source; a collective objective lens for directing light radiation emitted from the first light source through the chemical sample in the compartment; a... Agent: Fraser Clemens Martin & Miller LLC

20080165364 - Method and apparatus for assessing purity of vegetable oils by means of terahertz time-domain spectroscopy: The present invention relates to a method for assessing the purity of vegetable oils by means of THz time-domain spectroscopy, comprising the steps of: measuring the THz time-domain spectra of standard vegetable oils to establish a spectral database; measuring the THz time-domain spectrum of vegetable oil to be detected; analyzing... Agent: Westman Champlin & Kelly, P.A.

20080165365 - Optical-phase monitoring appratus and optical-phase monitoring method: An optical-phase monitoring apparatus includes an optical switch, an optical-phase detecting circuit, and a display circuit. The optical switch multiplexes signal light and a control optical pulse, and outputs a portion of the signal light that overlaps with the control optical pulse in time as output light. The optical-phase detecting... Agent: Staas & Halsey LLP

20080165366 - Methods and apparatus for swept-source optical coherence tomography: In one embodiment of the invention, a semiconductor optical amplifier (SOA) in a laser ring is chosen to provide low polarization-dependent gain (PDG) and a booster semiconductor optical amplifier, outside of the ring, is chosen to provide high polarization-dependent gain. The use of a semiconductor optical amplifier with low polarization-dependent... Agent: Kirkpatrick & Lockhart Preston Gates Ellis LLP (formerly Kirkpatrick & Lockhart Nicholson Graham)

20080165367 - Roughness evaluation method and system: A roughness evaluation method for evaluating a roughness of lines formed on a substrate includes a measuring step of irradiating light onto a plurality of locations of the substrate and measuring a state of reflected light by a scatterometry; and an analyzing step of evaluating the roughness of the lines... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080165368 - Position detection apparatus and exposure apparatus: The position detection apparatus includes a light projecting optical system which has an optical axis, and which cause two light beams symmetrical about the optical axis to enter a substrate, a light receiving optical system which receives the two light beams which have emerged from the light projecting optical system... Agent: Morgan & Finnegan, L.L.P.

20080158540 - Optical navigation device adapted for navigation on a transparent structure: A technique for adapting an optical navigation device for navigation on a transparent structure such as a glass plate involves establishing a navigation window for navigation tracking, detecting reflected light within the navigation window, generating an output signal in response to the detected light, and adjusting a characteristic of the... Agent: Kathy Manke Avago Technologies Limited

20080158541 - Inline stress evaluation in microstructure devices: By performing optical measurements and evaluating the optical response of an appropriately prepared measurement site, stress-related characteristics, such as intrinsic stress of dielectric layers, may be evaluated due to the dependency of the optical response on stress-induced modifications of the charge carrier mobility of a conductive layer provided below the... Agent: Williams, Morgan & Amerson

20080158542 - Micro-optical wall shear stress sensor: Stresses and strains on a solid surface subject to a fluid flow are dynamically measured based on a shift of optical resonances of a micro-resonator. The elastic deformation and refractive index change of a micro-resonator due to mechanical stress is exploited. With this approach, mechanical deformations in the order of... Agent: Straub & Pokotylo

20080158543 - System and methods for sample analysis: The invention encompasses analyzers and analyzer systems that include a single particle analyzer, methods of using the analyzers and analyzers systems to analyze samples, either for single particles or for multiple particles (multiplexing), methods of doing business based on the use of the analyzers or analyzer systems of the system,... Agent: Wilson Sonsini Goodrich & Rosati

20080158544 - Raman spectroscopic monitoring of hemodialysis: Spectroscopic systems and methods are disclosed for determining levels of at least one analyte in blood undergoing hemodialysis. In one aspect, the invention employs Raman spectroscopy to monitor and/or control hemodialysis. In one embodiment, the system uses a laser light directed to circulating blood from a patient undergoing dialysis to... Agent: Patton Boggs LLP

20080158545 - Method and device for the detection of counterfeit documents and banknotes: A method and device for the identification of documents and banknotes marked with Optical Variable Inks providing: generating a white light ray between 5,000° and 7,000° K; polarizing that white light ray through a first polarizing filter (3), and sending the polarized ray (4) onto an area (5) to be... Agent: Young & Thompson

20080158546 - Personal identification system: A personal identification system, which uses a vein pattern of a finger, optimizes the amount of light of a light source based on a captured finger image and emphasizes the vein pattern during image processing for identification.... Agent: Stanley P. Fisher Reed Smith Hazel & Thomas LLP

20080158547 - Motion detecting device for sensing rotation and inclination variation information and method of using the same: A motion detecting device for sensing rotation and inclination variation information, includes a light-emitting unit, a sensor control unit, an image sensing unit, a rotation-sensing unit, an inclination-sensing unit, a data storing unit, and an operation unit. The image sensing unit is used to receive a light-reflecting signal. The rotation-sensing... Agent: Rosenberg, Klein & Lee

20080158552 - Analyzer: An analyzer is provided with a light irradiation device. The light irradiation device includes a light source, and a rotatable filter section, which has a plurality of optical filters having different light transmission characteristics, and irradiates an analyzing object with light that passed through the optical filters arranged in a... Agent: Brinks Hofer Gilson & Lione

20080158549 - Apparatus and method for detecting surface plasmon resonance: An apparatus for detecting surface plasmon resonance (SPR) comprises a light source, a light-coupling unit, a phase-resolving module, and a data-processing unit. The light source provides a light beam emitting into a surface of a metal film to generate surface plasmon resonance. The phase-resolving module is configured to split the... Agent: Wpat, Pc Intellectual Property Attorneys

20080158548 - Integrated sensor for correlated color temperature and illuminance sensing: A sensor for measuring the properties of light from a light source is disclosed. The sensor includes first and second photodetectors that are illuminated by the light. The first and second photodetectors generate first and second photodetector signals indicative of the first and second weighted averages of the intensity of... Agent: Kathy Manke Avago Technologies Limited

20080158553 - Optical measurements of patterned articles: A method and system are presented for use in measuring/inspecting a patterned article. Optical measurements are applied to a measurement site on the article by illuminating the measurement site with a plurality of wavelengths at substantially normal incidence of the illuminating light, detecting light returned from the illuminated site, and... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080158550 - Spectral imaging camera and applications: There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby... Agent: Connolly Bove Lodge & Hutz, LLP

20080158551 - Systems and methods for 3-dimensional interferometric microscopy: In one embodiment, an apparatus comprises an optical system with multiple detectors and a processor. The optical system is configured to produce images of an optical source in a first dimension and a second dimension substantially orthogonal to the first dimension at each detector at a given time. Each image... Agent: Cooley Godward Kronish LLP Attn: Patent Group

20080158554 - Device and process for inspecting the bottoms of containers: A system for inspecting container bottoms with an observation device, which observe the container bottoms, with a plurality of viewing windows, which are arranged underneath the container bottoms and which have viewing sections, through which the observation device observes the container bottoms, where the viewing windows are mounted in a... Agent: Marshall, Gerstein & Borun LLP

20080158555 - Optical window contamination detecting device for optical apparatus: There is provided an optical window contamination detecting device capable of detecting even microscopic contamination attached onto an optical window with a limited number of contamination detecting sensors. An optical window contamination detecting device for a scanning type distance measuring apparatus includes a casing 101 formed with an optical window... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080158556 - Method for measuring missing corner dimensions: A method for obtaining the area of a missing portion of an object under inspection with a borescope includes aligning the borescope with the object under inspection, extrapolating the missing edges of the missing portion and calculating the missing portion area using the extrapolated missing edges and a defined remaining... Agent: General Electric Co. Global Patent Operation

20080158557 - Methods for plasma diagnostics and the measurement of thin films: Methods for obtaining and analyzing data from a spectral source is provided. The method includes identifying an environment that is capable of generating spectral information, and obtaining the generated spectral information from the environment. The method further includes splitting the generated spectral information into a plurality of spectral data units.... Agent: Martine Penilla & Gencarella, LLP

20080158558 - Phosphopeptide detection and surface enhanced raman spectroscopy: Raman-active molecules having specific affinity for phosphorylated peptides and proteins are provided. The Raman-active affinity molecules contain a Raman active group capable of providing a detectable spectrum. The affinity molecules act as tags or reporter molecules and are useful, for example in detecting the presence of a phosphorylated residue in... Agent: Intel/blakely

20080158559 - Fluorescence detection device: This invention relates to a fluorescence detection device comprising a support means (101) for supporting a sample (111), a sample excitation means so that a fluorescence is emitted by the sample (111) and a detection means for detecting said fluorescence, said support means (101) comprising a layer having a rough... Agent: Womble Carlyle Sandridge & Rice, Pllc Attn: Patent Docketing 32nd Floor

20080158560 - Defect inspection apparatus and method: The defect inspection apparatus and method for determining an acceptable condition of a reticle/mask member with a pattern area to be developed on a semiconductor device includes determining a non-pattern area and designating an inspection target area within a non-pattern area. Light is scanned across the inspection target area and... Agent: Snell & Wilmer LLP (oc)

20080158561 - Method and apparatus for rapidly counting and identifying biological particles in a flow stream: A method for increasing the throughput, or the precision, or both the precision and the throughput, of a flow cytometer, or of a hematology analyzer employing a flow cytometer, by utilizing the technique of laser rastering. Laser rastering involves sweeping a laser beam across a flowing sample stream in a... Agent: Paul D. Yasger Abbott Laboratories

20080158562 - Process and device for dynamic measurement of the axial deformation of a rotting hollow shaft: A process and device for dynamic measurement of the axial deformation of a rotating hollow shaft (10), a glass fiber segment (16) of a fiber optic sensor (18) being attached securely to a section of the inside wall of the hollow shaft (10) extending in axial alignment with the shaft.... Agent: Roberts Mlotkowski Safran & Cole, P.c.

20080158563 - Sensors: A gas sensor for hydrogen or other gases, especially flammable or explosive gases, has a plasmon-polariton waveguide comprising a metal strip on a membrane supported by a substrate in an environment in which the gas is to be introduced, and coupling means for coupling optical radiation into and out of... Agent: Adams Patent & Trademark Agency

20080158565 - Modulated reflectance measurement system using uv probe: A modulated reflectance measurement system includes lasers for generating an intensity modulated pump beam and a UV probe beam. The pump and probe beams are focused on a measurement site within a sample. The pump beam periodically excites the measurement site and the modulation is imparted to the probe beam.... Agent: Stallman & Pollock LLP

20080158564 - Monitoring a photolithographic process using a scatterometry target: A method is provided for monitoring a photolithographic process in which a substrate is patterned to form (i) a scatterometry target having a plurality of parallel elongated features, and desirably, (ii) other features each having at least one of a microelectronic function or a micro-electromechanical function. Desirably, each elongated feature... Agent: International Business Machines Corporation Dept. 18g

20080158566 - Low-light specimen image pickup unit and low-light specimen image pickup apparatus: In order to be able to take an image of a specimen emitting low light in a short exposure time by a cooled CCD at about 0° C., a low-light specimen image pickup unit has an imaging optical system forming a specimen image of a specimen having a point light... Agent: Scully Scott Murphy & Presser, Pc

20080158567 - Quantum messaging device: Through systematically varying whether the path of a photon emitted into an interferometer is or is not specified, one can create a binary message and send it from one location to another where this message cannot be known in the intervening space between where the message is constructed and where... Agent: Douglas M. Snyder

20080158568 - Interferometer and method for fabricating same: An interferometer includes a resonant cavity having a movable mirror and at least one fiber optic component acting as a fixed mirror. A surface of the fiber optic component is coated with a reflective film. An actuator is coupled to the movable mirror, such that when a scattered optical beam... Agent: General Electric Company Global Research

20080158569 - Device for testing a test object, in particular a tire, by means of a non-destructive measuring method: A device for testing a test object in particular a tire (10) by means of a non-destructive measuring method is provided with at least one measuring head (20) by which the test object (10) can be scanned to produce a measurement result. The device is also provided with a positioning... Agent: Stephen B. Salai, Esq. Harter, Secrest & Emery LLP

20080158570 - Double resonance interrogation of grating-coupled waveguides: A method for using a double resonance effect within a grating-coupled waveguide (GCW) sensor, as generated from a light beam with a given span of wavelengths or angles, is provided. The method can be used for label-independent detection of biological and chemical agents, to interrogate biological-binding events or chemical reactions... Agent: Corning Incorporated

20080158571 - Photodetector and optical pickup apparatus: Disclosed is a light detecting apparatus using a differential astigmatic method to focus 0th order light on any information surfaces of a multilayer optical disc medium, the 0th order light being among 0th order light, positive higher-order diffracted light of 1st or higher order, and negative higher-order diffracted light of... Agent: Socal Ip Law Group LLP

20080158572 - System and method for measurement of thickness of thin films: A measurement system that uses a laser triangulation device to measure the thickness of transparent and/or opaque layers of a multilayer film. The triangulation device has a laser device that projects a beam perpendicularly to a surface of the multilayer film and first and second detectors that image first and... Agent: Honeywell International Inc.

20080158573 - Means for measuring a diameter: A diameter measuring instrument that comprises a straight-edge and two legs or jaws, wherewith the distance between the legs can be read-off. The invention is characterized in that the straightedge (2) is provided with a leg (3) which is fixed in relation to the straightedge and a leg (4) which... Agent: Young & Thompson