Optics: measuring and testing inventions 06/08

20080151216 - Surface metering device: A method for measuring the area of polygonal planar surfaces in space, wherein a device is used having a range finder mounted on a leg support by a frame having a central point, elements for the angular tracking in space of the viewing direction of the range finder, elements for... Agent: Young & Thompson

20080151217 - Measuring device: The invention relates to measuring device, particularly a distance measuring device for contactlessly measuring distance, comprising a housing (12) made of at least one first material and with at least one electronic component (56), which is arranged inside an interior (48) of the housing (12), as well as with a... Agent: Michael J. Striker

20080151218 - Laser scanner: A laser scanner which operates pursuant to the elapsed time principle and which has a pulsed laser that directs successive light pulses into a monitored region. The laser scanner further has a light receiving arrangement for receiving light pulses reflected by an object in the monitored region and that generates... Agent: Townsend And Townsend And Crew, LLP

20080151219 - Optical method for the characterization of laterally patterned samples in integrated circuits: Disclosed is a method for characterizing a sample having a structure disposed on or within the sample, comprising the steps of applying a first pulse of light to a surface of the sample for creating a propagating strain pulse in the sample, applying a second pulse of light to the... Agent: Harrington & Smith, Pc

20080151220 - Egg counter for counting eggs which are conveyed on an egg collection conveyer: An egg counter for counting eggs transferred by an egg collection conveyor has an infrared light receiving element row, a first infrared light emitting element row placed at one side section of the infrared light receiving element row, a second infrared ray emitting element row placed at the other side... Agent: Stites & Harbison Pllc

20080151221 - Measurement of euv intensity: A monitoring system for an lithographic system is disclosed. In particular, the monitoring system can be utilized in an extreme ultraviolet lithographic system. In a monitoring system according to the present invention, a plurality of detectors are positioned to receive radiation from a pattern of positions on a mirror that... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080151222 - Machine for detecting sheet-like object, and validating machine using the same: A validating machine 30 according to the present invention is provided with a validation sensor 2 having a first-side light emitting device 8 and a first-side light receiving device 10 disposed closely to each other and a validation sensor 2′ having a second-side light emitting device 8′ and a second-side... Agent: Leydig Voit & Mayer, Ltd

20080151226 - Method for analyzing a sample and microscope for evanescently illuminating the sample: A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are... Agent: Houston Eliseeva

20080151227 - Method for determining a sizing agent concentration, particle size and a sizing agent particle size distribution in a peper pulp: Method for determining the size concentration, the particle size and the particle size distribution of natural and/or synthetic sizes in a paper stock by staining a sample of the particles (Ti) of the size with a fluorescent dye, light being radiated into the sample of fluorescent or fluorescently stained particles... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.c.

20080151229 - Multiple-degree of freedom interferometer with compensation for gas effects: The disclosure features multiple degree-of-freedom interferometers (e.g., non-dispersive interferometers) for monitoring linear and angular (e.g., pitch and/or yaw) displacements of a measurement object with compensation for variations in the optical properties of a gas in the interferometer measurement (and/or reference) beam paths. The disclosure also features interferometry systems that feature... Agent: Fish & Richardson Pc

20080151230 - Pattern inspection method: A pattern inspection apparatus comprises an illumination optics applying a first inspection light on a predetermined wavelength to a surface opposite to a pattern formed surface of the substrate, and a second inspection light whose wavelength is equal to the wavelength of the first inspection light to the pattern formed... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.c.

20080151228 - Scatterometer, a lithographic apparatus and a focus analysis method: To detect whether a substrate is in a focal plane of a scatterometer, a cross-sectional area of radiation above a certain intensity value is detected both in front of and behind a back focal plane of the optical system of the scatterometer. The detection positions in front of and behind... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080151231 - Fiber optic testing system and method incorporating geolocation information: Systems are provided for gathering location data pertaining to a fiber optic network. One system includes a sensor, a geolocation system, a processor in communication with the sensor and the geolocation system, and a user control panel. The sensor is configured to receive an operational input indicating the condition of... Agent: Verizon Patent Management Group

20080151232 - Methods and systems for controlling fiber polarization mode dispersion (pmd): A method is provided for predicting an installed performance parameter of an optical fiber cable. The method includes obtaining a measurement indicative of a value of the performance parameter at a first moment in time. A measurement indicative of a value of the performance parameter at a second moment in... Agent: Verizon Patent Management Group

20080151224 - System and method for the deposition, detection and identification of threat agents: A system and method for depositing a sample of a threat agent onto a substrate. A single illumination source illuminates the threat agent deposited on the substrate with a plurality of photons to thereby produce elastic scattered photons and Raman scattered photons. The threat agent on the substrate is identified.... Agent: Daniel H. Golub

20080151223 - System and method for the deposition, detection and identification of threat agents using a fiber array spectral translator: A system and method for depositing a sample of a threat agent is deposited onto a substrate. A first optical collection device collects at least one of the following: elastic scattered light produced by the threat agent, and Raman scattered light produced by the threat agent. A second optical collection... Agent: Daniel H. Golub

20080151225 - System and method for the deposition, detection and identification of threat agents using a phase mask: A system method for depositing a sample of a threat agent is deposited onto a substrate. The threat agent is illuminated via an illumination source along an optical path with a plurality of photons to thereby produce photons transmitted, reflected, emitted or Raman scattered by the threat agent. An optical... Agent: Daniel H. Golub

20080151233 - Method and apparatus for classification of surfaces: A method for optically determining whether a region of a surface is clean or contaminated. The method finds applicability in connection with cleaning robots, for example in pig house cleaning. It comprises the steps of—selecting a first and a second, different narrow band of wavelengths for illuminating the region, —selecting... Agent: Knobbe Martens Olson & Bear LLP

20080151234 - Foreign matter inspection apparatus: Selection with alignment marks of an optimal template, its identification and similarity judgment are conducted by a calculation function of a correlation value provided to a foreign matter inspection apparatus. In other words, the foreign matter inspection apparatus includes unit for registering feature points of alignment marks formed on a... Agent: Mcdermott Will & Emery LLP

20080151235 - Defect inspection tool for sample surface and defect detection method therefor: In a defect inspection for a semiconductor substrate, inspection objects include, in addition to a bear Si wafer, a wafer with various films formed on the surface thereof. For a sample formed with a metal film in particular, scattering light generated by surface roughness thereof is large, thus making it... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080151236 - Cuvette for ophthalmic lens: Modified MZ (Mach-Zender) interferometers are utilized to analyze the transmitted, aspherical wavefront of an ophthalmic lens by mounting the lens in a cuvette having a rotatable carousel that can hold multiple lenses. Fresh, temperature controlled, saline solution is circulated about the lenses, and the cuvette is positioned in a vertical... Agent: Woodcock Washburn LLP

20080151237 - Interferometric endpoint determination in a substrate etching process: In determining an endpoint of etching a substrate, light that is directed toward the substrate is reflected from the substrate. A wavelength of the light is selected to locally maximize the intensity of the reflected light at an initial time point of the etching process. The reflected light is detected... Agent: Janah & Associates, P.c.

20080151240 - Methods and systems for dynamic range expansion: Methods and systems for expanding the dynamic range of a system are provided. One method includes splitting fluorescent light emitted by a particle into multiple light paths having different intensities, detecting the fluorescent light in the multiple light paths with different channels to generate multiple signals, and determining which of... Agent: Daffer Mcdaniel LLP

20080151239 - Microscopy method and microscope: The present invention provides a microscopy method and a microscope, which enable microscopic observation of desired information of a specimen with an extremely high S/N ratio in a short period of time without increasing intensity of a light sources. The method of the invention is characterized in that it comprises:... Agent: Frishauf, Holtz, Goodman & Chick, Pc

20080151238 - Simultaneous spatial and temporal focusing of femtosecond pulses: A technique for simultaneous spatial and temporal focusing of femtosecond pulses improves the signal-to-back-ground ratio (SBR) in multiphoton imaging. This is achieved by spatially separating spectral components of pulses into a “rainbow beam” and recombining these components at the spatial focus of an imaging system. The temporal pulse width becomes... Agent: Nixon Peabody LLP - Patent Group

20080151241 - Practical laser induced breakdown spectroscopy unit: An apparatus for performing laser-induced breakdown spectroscopy comprises a handheld unit with a pump laser and a controller. A combination of a solid laser medium and a Q-switch receive a laser beam from said pump laser. Focusing optics focus laser pulses from said combination to a focal spot at a... Agent: Wood, Phillips, Katz, Clark & Mortimer

20080151242 - Method for operating a color measurement system: A color measurement system includes a hand held color measurement instrument, which may be provided with a wireless interface to a computer. The color measurement system includes a scanning guide for holding the hand held color measurement instrument in proper alignment with a color target. The scanning guide includes a... Agent: Mccarter & English , LLP Stamford Office

20080151243 - Confocal microscope and method for detecting by means of a confocal microscope: The invention relates to a confocal microscope which illuminates a sample (15) by means of at least one light source. A detection light beam (17) is emitted from the sample (15). The detection light beam (17) is spectrally split up in a spatial manner by the dispersive element (20) and... Agent: Houston Eliseeva

20080151244 - Optical switching method and optical switch: In a method and an optical switch by which a signal light is accurately switched even if a polarization state of a signal light inputted has a fluctuation, power of an output light of a polarizer which receives a signal light extracted from an output light of a nonlinear optical... Agent: Staas & Halsey LLP

20080151245 - method and a device for processing birefringent and/or optically active materials and phase plate: A method and a device for processing birefringent and/or optically active materials, wherein a light source (3) for polarized light and an analyzer assembly (8) and a light sensor (9) connected therewith are provided, so that between said components a processing of the birefringent and/or optically active material can be... Agent: Sughrue Mion, Pllc

20080151246 - Alignment routine for optically based tools: A method is provided for using a point of interest as a starting point where an alignment is automatically selected by recognition software for a patterned substrate. The method includes disposing the patterned substrate on a stage of an exposure system, the exposure system having an alignment routine including; locating... Agent: Cantor Colburn LLP - Ibm Fishkill

20080151247 - Methods for depth profiling in semiconductors using modulated optical reflectance technology: Methods of obtaining dopant and damage depth profile information are disclosed using modulated optical reflectivity (MOR) measurements. In one aspect, the depth profile is constructed using information obtained from various measurements such as the junction depth, junction abruptness and dopant concentration. In another aspect, a full theoretical model is developed.... Agent: Stallman & Pollock LLP

20080151248 - Spectroscopy method and apparatus for detecting low concentration gases: The invention is a method and apparatus capable of detecting constituents of a gas at extremely low concentrations comprising providing a medium that is absorbent of at least a first particular gas under a first environmental condition and desorbent of the particular gas under a second environmental condition, exposing the... Agent: Honeywell International Inc.

20080151251 - Exposure apparatus and device fabrication method: An exposure apparatus comprising a projection optical system configured to project a pattern image of an original onto a substrate, and a sensor configured to detect light emerging from the projection optical system, the sensor including a light receiving element having a light receiving surface, and an optical member having... Agent: Morgan & Finnegan, L.l.p.

20080151249 - High efficiency coupling optics for pumping and detection of fluorescence: The invention provides a high efficiency coupling structure for extracting illumination such as fluorescent radiation from a chemical reaction vessel such as a cuvette. The cuvette is provided with a mirrored surface. An end cap for the cuvette includes a probe portion that exhibits total internal reflection. Lenses are provided... Agent: Hiscock & Barclay, LLP

20080151250 - Lighting device and optical apparatus: A lighting device includes a light source unit which emits laser beam, an optical element which receives the laser beam and releases at least a part of the entering laser beam in a direction different from the entering direction of the laser beam as illumination light, and an illumination optical... Agent: Oliff & Berridge, Plc

20080151252 - Seal gum thickness measurement: A method and apparatus for measuring the thickness of flap seal gum on an envelope including establishing parameters for a desired thickness of seal gum and programming such parameters into a programmable logic controller (PLC). Sensing the reflectivity intensity of radiation from the gum thickness on envelopes in a production... Agent: Foley & Lardner

20080151253 - Method and assembly for confocal, chromatic, interferometric and spectroscopic scanning of optical, multi-layer data memories: An interferometric confocal method and assembly for terabyte volume optical data memories couples two-beam spectral interferometry to chromatic confocal technology and permits a longitudinal splitting of foci in the memory volume, with the foci having limited diffraction. A spectrometer is located downstream of the interferometer with confocal discrimination in the... Agent: Casella & Hespos

20080151254 - Pure silica core, high birefringence, single polarization optical waveguide: Methods and apparatus provide for birefringent waveguides suitable for optical systems exhibiting polarization dependence such as interferometer sensors including Sagnac interferometric fiber optic gyroscopes (IFOG). The waveguides, for some embodiments, may offer single polarization performance over lengths of about a kilometer or more due to polarization dependent attenuation. According to... Agent: Patterson & Sheridan, L.l.p.

20080151255 - Method and apparatus for testing fibres: The present invention also relates to an apparatus for carrying out the method. The apparatus including an optical light path for exposing the sample of fibre to polarized light, an image capturing means, and a computer for conducting image analysis to determine fibre maturity or the degree of cell wall... Agent: Merchant & Gould Pc

20080151256 - Optical image measurement device: An optical image measurement device comprises: a light source configured to emit a low-coherence light; an interference-light generator configured to generate an interference light, by splitting the low-coherence light into a signal light and a reference light, and superimposing the signal light passed through a measurement object and the reference... Agent: Frost Brown Todd, Llc

20080151257 - Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method: A part of a plate of a predetermined shape detachably mounted on a moving body is detected by an alignment system while the position of the moving body is measured by a measurement unit that sets a movement coordinate system of the movement body, and based on the detection results... Agent: Oliff & Berridge, Plc

20080151258 - Shape measuring apparatus, shape measuring method, and exposure apparatus: A shape measuring method for measuring a surface shape of a measurement target includes dividing light from a light source into measurement light and reference light, the measurement light being obliquely incident upon a surface of the measurement target, the reference light being incident upon a reference mirror, introducing the... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080151260 - Optical image measurement device: A fundus oculi observation device acts as an optical image measurement device capable of measuring an OCT image such as a tomographic image of a fundus oculi, or the like, and is configured so as to calculate the signal level of the formed OCT image, determine whether the signal level... Agent: Frost Brown Todd, Llc

20080151259 - Synchronized wafer mapping: A system and method for mapping a wafer includes scanning the wafer with a laser beam using a continuous spiraling pattern on the wafer surface, where the spiraling can be inward or outward. A microprocessor analyzes characteristics of the reflected, diffracted, and/or scattered beams and synchronizes each beam with a... Agent: Macpherson Kwok Chen & Heid LLP

20080151261 - Process and apparatus for online detection of surface irregularity in threadlines: The invention concerns a process and apparatus for monitoring the level of surface irregularity in a moving threadline, comprising: (a) illuminating the threadline via a light source positioned incident to the thread line at an entrance angle of greater than 0 degrees and less than 90 degrees to the threadline... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center

20080151262 - Light exposure apparatus and manufacturing method of semiconductor device using the same: When annealing of a semiconductor film is conducted using a plurality of lasers, each of the distances between laser irradiation regions is different. When a lithography step is conducted in accordance with a marker which is formed over a substrate in advance after the step, light-exposure is not correctly conducted... Agent: Eric Robinson

20080151264 - Profiling device: The present invention provides a profiling device 10 comprising an emitter arranged to emit a pulse of electromagnetic radiation towards a remote surface; a detection means arranged to receive the pulse of electromagnetic radiation once reflected from said remote surface; means 16 for altering a direction from which successive pulses... Agent: Townsend And Townsend And Crew, LLP

20080151263 - Systems and methods for focusing optics: Systems and methods for focusing optics are disclosed herein. In some embodiments, methods are disclosed for focusing an optical device, wherein the methods can include: collecting light from a region of an object to be imaged with an objective lens, said region having a feature with a known geometric characteristic;... Agent: Sonnenschein Nath & Rosenthal LLP

20080151265 - Method for positioning a target portion of a substrate with respect to a focal plane of a projection system: A method is provided for positioning at least one target portion of a substrate with respect to a focal plane of a projection system. The method comprises performing height measurements of at least part of the substrate to generate height data, using predetermined correction heights to compute corrected height data... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080151266 - Evaluation method for evaluating optical characteristics of optical system, evaluation method for evaluating projector, evaluation device for evaluating optical characteristics, and screen: An evaluation method for evaluating optical characteristics of an optical system, the evaluation method includes: providing an optical system that is an evaluation object and that has a light incidence section and a light emission section; disposing a first pattern having a fist predetermined pitch, in an optical path of... Agent: Oliff & Berridge, Plc

20080151267 - Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method: A part of a plate of a predetermined shape detachably mounted on a moving body is detected by an alignment system while the position of the moving body is measured by a measurement unit that sets a movement coordinate system of the movement body, and based on the detection results... Agent: Oliff & Berridge, Plc

20080151268 - Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty: Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (URMS) from a net residual error. The TMU provides an... Agent: Hoffman, Warnick & D'alessandro Llc

20080151269 - Model and parameter selection for optical metrology: A profile model for use in optical metrology of structures in a wafer is selected, the profile model having a set of geometric parameters associated with the dimensions of the structure. The set of geometric parameters is selected to a set of optimization parameters. The number of optimization parameters within... Agent: Morrison & Foerster LLP

20080151270 - Drop analysis system: A drop analysis/drop check system allows a plurality of printheads to remain stationary during analysis to emulate operation of an actual piezoelectric microdeposition system. The system provides accurate tuning of individual nozzle ejectors and allows for substrate loading and alignment in parallel with drop analysis/drop check. The drop analysis/drop check... Agent: Harness, Dickey & Pierce, P.L.C

20080151271 - Method for monitoring film thickness, a system for monitoring film thickness, a method for manufacturing a semiconductor device, and a program product for controlling film thickness monitoring system: A method monitors a thickness of a subject film deposited on an underlying structure, the underlying structure contains at least one thin film formed on a substrate. The method includes determining thickness data of the underlying structure and storing the thickness data of the underlying structure in a thickness memory;... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080143997 - Cargo dimensional and weight analyzing system: A laser scanner apparatus is disclosed herein for measuring the geometry and physical dimensions of one or more objects in a specified location or platform. The specified location or platform is within a range less than a predetermined maximum object distance. The laser scanner includes a waveform generator that generates... Agent: Michael E. Klicpera

20080143998 - Method for eliminating internal reflection of range finding system and range finding system applying the same: A method for eliminating internal reflection signal in a range finding system is disclosed, including the steps of receiving a range-finding signal reflected by an object and an internal reflection signal caused by internal reflection of the range finding system, converting the range finding signal and internal reflection signal, as... Agent: Madson & Austin

20080143999 - Range finder and range finding method: A laser ranger has a rotational light source and a receiver. The rotational light source is used to provide a light beam with a pre-determined rotation speed. The receiver detects the time period for the light beam to travel from a first position to a second position of the receiver,... Agent: Raymond Sun

20080144000 - Apparatus for and method of determining distance: Apparatus for determining distance comprising a transmitting unit for emitting a light pulse, a receiver matrix having at least one photoelectric element and a control unit, wherein the receiver matrix has a first and a second integrator which are connected to the photoelectric element, which are activatable independently of each... Agent: Ware Fressola Van Der Sluys & Adolphson, LLP

20080144001 - Spectral imaging device: Systems and methods for spectral imaging are disclosed. Such spectral imaging can be used to determine properties of a subject material at different locations upon the surface and/or within the material. For example, strain and/or stress within an imaged area of the material can be determined. A system for spectral... Agent: Macpherson Kwok Chen & Heid LLP

20080144002 - Molecularly imprinted polymer sensor device: A molecularly imprinted polymer sensor device for detecting a specific inorganic target ion is disclosed. The device includes at least one or more molecularly imprinted polymer beads comprising a macroporous structure having a plurality of complexing cavities therein, wherein the complexing cavities contain cationic ligands spatially oriented to selectively receive... Agent: The Johns Hopkins Universityapplied Physics Labora Office Of Patent Counsel

20080144003 - System for measuring non-volatile residue in ultra pure water: A system for monitoring non-volatile residue concentrations in ultra pure water includes a nebulizer for generating an aerosol composed of multiple water droplets, a heating element changing the aerosol to a suspension of residue particles, and a condensation particle counter to supersaturate the dried aerosol to cause droplet growth through... Agent: Frederick W. Niebuhr Haugen Law Firm Pllp

20080144005 - Method for analyzing blood content of cytological specimens: Methods for processing a cytological specimen suspended in a liquid. Light at a wavelength less than 450 nm is directed through the liquid. The intensity of the light transmitted through the liquid is detected and compared to a threshold to determine whether the blood content of the specimen should be... Agent: Vista Ip Law Group LLP

20080144004 - Optical spectrophotometer: In one aspect, the present invention provides systems and methods for non-invasively determining the amount of an analyte in a subject's blood using a set of light sources and a set of light detectors for measuring optical density. Advantageously, in embodiments of the invention, the light sources are operated such... Agent: Rothwell, Figg, Ernst & Manbeck, P.c.

20080144006 - Method for measuring topographic structures on devices: In order to be able to measure topographies on wafers or devices in a fashion free from destruction, the invention provides a method for measuring three-dimensional topographic structures (22) on wafers (2) or devices in which with the aid of a confocal microscope (1) at least one fluorescing topographic structure... Agent: Demont & Breyer, Llc

20080144007 - Thermal lens spectroscopy for ultra-sensitive absorption measurement: A thermal lens detection apparatus comprising: i) an optical cell for containing at least one target analyte present in a carrier liquid, ii) a probe beam having a pre-determined wavelength, iii) an excitation beam having a pre-determined wavelength shorter than that of the probe beam and a Rayleigh length approximately... Agent: Herbert Burkard

20080144008 - System for positioning a product: A system for positioning a product, comprising a chuck (71) for supporting the product, an intermediate stage (79) supporting said chuck (71), and a stationary base (72) supporting said intermediate stage (79). The chuck (71) can move with respect to the intermediate stage (79) in a first direction X (80),... Agent: Philips Intellectual Property & Standards

20080144011 - Apparatus and method for detecting the orientation/position of products, in particular fish, on a transport element: The invention relates to an apparatus for detecting the orientation/position of products, in particular fish on a transport element. Said apparatus includes a transport element for transporting the products from an input area to an output area and measuring means arranged in the region of the transport element. The apparatus... Agent: Mattingly, Stanger, Malur & Brundidge, P.c.

20080144014 - Apparatus for wafer inspection: An apparatus for inspecting a wafer, comprising a first illuminator for radiating an illumination beam in a first illumination beam path onto a surface of the wafer and being configured as continuous light source; a second illuminator for radiating an illumination light beam in a second illumination beam path onto... Agent: Davidson, Davidson & Kappel, Llc

20080144012 - Apparatus, system and method for optical spectroscopic measurements: A system and method for optical spectroscopic measurements is described. One embodiment includes a measurement head for optical spectroscopic measurements, the measurement head comprising an illumination source configured to illuminate a sample, a collection optic configured to view the sample, and an internal reference, wherein the internal reference can be... Agent: Cooley Godward Kronish LLP Attn: Patent Group

20080144010 - Methods and apparatus for navigating a surfuce: In one embodiment, a surface is navigated by 1) using a first light sensor, mounted to a navigation device, to detect light reflected from a surface, and 2) using outputs of the first light sensor, over time, to determine relative movement of the navigation device with respect to the surface.... Agent: Kathy Manke Avago Technologies Limited

20080144013 - System and method for co-registered hyperspectral imaging: Systems and methods for integration of fluorescence and reflective imaging are provided. The system and method can measure reflectance and fluorescence spectrally and spatially with co-registered hyperspectral signatures, and can output a co-registered image from first and second co-registered hyperspectral image data sets.... Agent: Crowell & Moring LLP Intellectual Property Group

20080144009 - System and method for removing auto-fluorescence through the use of multiple detection channels: A system and method permits for the separation of auto-fluorescence from a signal by applying a single probe to a sample, exciting the sample with a single wavelength light source, thereby emitting a light a distance from the light source. The emitted light is split, and the split light is... Agent: Fay Sharpe / Xerox - Parc

20080144016 - Method and apparatus for acoustic sensing using multiple optical pulses: An improved technique for acoustic sensing involves, in one embodiment, launching into a medium, a plurality of groups of pulse-modulated electromagnetic-waves. The frequency of electromagnetic waves in a pulse within a group differs from the frequency of the electromagnetic waves in another pulse within the group. The energy scattered by... Agent: At&t Corp.

20080144015 - Optical characteristic inspection method, optical characteristic inspection apparatus, and optical characteristic inspection system for optical fiber device: An inspection unit, in which a laser source and a reflection measuring module containing a laser source and a light receiver are connected to an optical switch, is connected to an input optical fiber of an optical fiber device. An end of an output optical fiber is beveled and is... Agent: Nixon & Vanderhye, Pc

20080144017 - High throughput multi beam detection system and method: A system and method for inspecting an article, the system includes a spatial filter that is shaped such as to direct output beams towards predefined locations and an optical beam directing entity, for directing the multiple output beams toward multiple detector arrays. The method includes spatially filtering multiple input light... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20080144018 - High-speed readout of a wavefront sensor using position sensing device: An apparatus rapidly reads out wavefront errors of an input wavefront and includes a holographic optical element (HOE), a position readout detector and a readout device. The HOE receives the input wavefront and includes a hologram of a particular wavefront recorded with reference waves, each defining a particular aberration coefficient.... Agent: Birch Stewart Kolasch & Birch

20080144019 - Rotary encoder: A rotary encoder for determining the rotation of an object to be measured includes a shaft that is coupled to the rotation of the object to be measured, as well as at least one bearing in which the shaft is rotationally mounted. The rotary encoder also has a rotary-transducer base... Agent: Kenyon & Kenyon LLP

20080144020 - Mobile radio positioning aided by single fan laser: The method of mobile radio positioning aided by a single fan laser comprising: generating a single sloping fan beam by using a stationary fan laser transmitter positioned in a location with known coordinates; detecting the single sloping fan beam by using the mobile laser detector; receiving the averaged low-passed filtered... Agent: Law Offices Of Boris G. Tankhilevich Suite A

20080144022 - Analysis system for analyzing a sample on an analytical test element: The invention relates to an analysis system for analysing a sample on an analytical test element. The analysis system comprises a measuring module for carrying out measurements on the sample on the analytical test element and an optical module which comprises a lens and a diaphragm by which the light... Agent: Bose Mckinney & Evans LLP

20080144021 - System and method for testing a lighting diode: A system for testing a lighting diode includes one or more nozzles, a probe, and a detector, where the lighting diode is operable to emit light in response to a current. The one or more nozzles direct a cooling fluid towards the lighting diode. The probe applies a current to... Agent: Texas Instruments Incorporated

20080144023 - Apparatus for inspecting defects: This invention is a defect inspection apparatus having a reflecting objective lens free from chromatic aberration, or an achromatic catadioptric lens, and a dioptric objective lens, and thus constructed to suppress changes in brightness due to multi-wavelength illumination (i.e., illumination with the irradiation light having a plurality of wavelength bands),... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080144024 - Apparatus and method for inspecting defects: A defect inspection apparatus includes an irradiation optical system 20, a detection optical system 30, and an image processor 40. In the irradiation optical system, a mirror 2603 is disposed to reflect downward a beam flux that has been guided to a first or second optical path, and a cylindrical... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080144025 - Apparatus for wafer inspection: An apparatus for inspecting a wafer, comprising at least one illuminator each arranged in an illumination beam path, wherein the at least one illuminator radiates an illumination spot onto a surface of the wafer and being a continuous light source; a detector arranged in a detection beam path has a... Agent: Davidson, Davidson & Kappel, Llc

20080144026 - Fiber optic sers sensor systems and sers probes: Fiber optic surface-enhanced Raman spectroscopic (SERS) systems (also referred to as “SERS system”), portable SERS systems, SERS probes, and methods of using the SERS systems and SERS probes to detect an analyte, are disclosed.... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080144028 - Fluorescence meter: Disclosed is a fluorescence meter for analyzing a sample, comprising a main beam path and at least one optical module. The fluorescence meter is embodied so as to provide at least one electromagnetic beam for exciting the sample and receive at least one electromagnetic beam emitted by the sample, at... Agent: Shlesinger, Arkwright & Garvey

20080144027 - Method for spectroscopy of surface plasmons in surface plasmon resonance sensors and an element for the use of thereof: A method and system for spectroscopy of surface plasmons is presented. An electromagnetic wave is made incident on a diffraction grating. Surface plasmons are excited on a medium coincident to the diffraction grating and dispersion of a wavelength spectrum of the electromagnetic wave are simultaneously performed through diffraction. Changes in... Agent: Cascadia Intellectual Property

20080144029 - Near-field optical apparatus and method using photodetector array: An imaging-type near-field optical microscope mainly comprises a light source and a photodetector array. The array functions as imaging array where each cell or photodetector has subwavelength dimensions. A sample under test is disposed in optical near field of the photodetectors, e.g., on surface of the array. As a result... Agent: Chian Chiu Li

20080144030 - Multi-channel imaging spectrometer: A multi-channel imaging spectrometer, comprising an image acquiring unit, an optical detection element, a dispersion element and a lens module comprising a collimating lens module and a focusing lens module. The design of the lens module achieves elimination of primary aberrations such as coma and distortion through separating the collimating... Agent: Wpat, Pc

20080144031 - Overlay target and measurement method using reference and sub-grids: A method of determining alignment error in electronic substrates comprises providing on a layer of a substrate a first contrasting set of elements forming a first grid pattern having a plurality of grid segments in the x and y directions. The method also includes providing nested within at least one... Agent: Law Office Of Delio & Peterson, Llc.

20080144032 - Optical module and optical communications device: An optical module includes: a light source; a variable transmissivity member that is disposed on a light path of light emitted from the light source with a spacing from the light source, the variable transmissivity member having transmissivity that increases as temperature rises; and an optical fiber that receives light... Agent: Oliff & Berridge, Plc

20080144033 - Optical level detection probe for fluid overfill prevention system: A high-reliability, high-temperature liquid level detection probe uses a metal ring to hold a level detection prism in the probe body. The metal ring forms an interference fit with both the prism and the probe body and the metal/prism and metal/metal seals remain effective even at elevated temperatures so that... Agent: Law Offices Of Paul E. Kudirka

20080144034 - Systems and methods for blocking specular reflection and suppressing modulation from periodic features on a specimen: Systems and methods for blocking specular reflection and suppressing modulation from periodic features on a specimen are provided. One inspection system configured to block specular reflection and suppress modulation in an image of a specimen includes an illumination subsystem configured to illuminate the specimen with a predetermined pattern of spatially... Agent: Baker & Mckenzie LLP

20080144037 - Method and apparatus for sorting cells: Apparatus for sorting and orienting sperm cells has a pair or walls in confronting relationship forming a flow chamber having inlet, a downstream outlet, and intermediate detector region. The inlet receives first and second spaced apart streams of input fluid and a third stream of sample fluid containing the cells... Agent: Akerman Senterfitt

20080144036 - Method of measurement, an inspection apparatus and a lithographic apparatus: An inspection system is arranged to measure an overlay error by projecting a plurality of radiation beams, differing in wavelength and/or polarization, onto two targets. A first radiation beam is projected onto a first target and the reflected radiation A1+ is detected. The first target comprises two gratings having a... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080144035 - Optical calibration system and method: An optical system calibration system and method particularly suited for calibrating the optical slit planes in an ophthalmic diagnostic instrument. The system includes an illumination source projector, an illumination image receiver, and a calibration component all having known relative positions, orientations and physical and optical characteristics. The calibration component includes... Agent: Bausch & Lomb Incorporated

20080144038 - Performance and accuracy assessment system for refractive laser systems and associated methods: A method for assessing a performance of a laser system for use in corneal ablation is provided that includes directing a beam of laser shots onto a fluorescent indicator. The indicator is adapted to emit a first wavelength of light different from a second wavelength of light impinging thereon. The... Agent: Alcon

20080144039 - Fiber-optic assay apparatus based on phase-shift interferometry: Apparatus and method for detecting an analyte in a sample based on optical interference. The apparatus includes a light source, detector unit and one or more disposable detector tips. The apparatus also includes an optical coupling assembly that couples light from the source to the detector tips, and from the... Agent: Fenwick & West LLP

20080144040 - Optical fiber probe and method for manufacturing an optical fiber probe: An optical fiber probe for an interferometric measuring device having a mechanical receptacle into which an optical fiber is inserted, having a fiber end piece which projects over the mechanical receptacle and contains optical components for guiding a measuring beam onto a measuring object, and having a reflection zone situated... Agent: Kenyon & Kenyon LLP

20080144041 - Frequency multiplexed, multiple channel heterodyne interferometer: A novel technique using an acousto-optic modulator (AOM) as part of a heterodyne interferometer which measures optical path differences between a test signal and a reference signal is disclosed. An array of distinct frequencies are used to drive the AOM, yielding a spatially dispersed array of frequency-shifted subaperture beams of... Agent: Canady & Lortz LLP - Boeing

20080144042 - Stage apparatus, control system, exposure apparatus, and device manufacturing method: A stage apparatus includes X- and Y-axis laser interferometers each of which measures the position a stage, a wavelength compensator which compensates for the wavelength change of a laser beam from each of the X- and Y-axis laser interferometers, a fan duct which is connected to a thermoregulator for supplying... Agent: Morgan & Finnegan, L.l.p.

20080144043 - Apparatus for wavefront detection: An arrangement for microlithography includes a projection objective having a plurality of optical elements; an aberration control circuit controlling imaging properties of the projection objective; and at least one operating element associated with an optical element of the projection objective to control imaging properties of the projection objective in response... Agent: Sughrue Mion, Pllc

20080144044 - Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging: The present application describes and claims an opto-electronic method of quantitatively analyzing reflected optical distortion in sheets or panels of shaped glass.... Agent: Marshall & Melhorn, Llc

20080144045 - Apparatus and methods for measuring workpieces: The invention relates to systems and methods for measuring workpieces. In one embodiment of the invention, a system for measuring a workpiece includes a plurality of measurement modules, an electronic control module, and a moveable frame to which the measurement modules are attached. Each of the measurement modules comprises at... Agent: Wildman Harrold Allen & Dixon LLP And The Boeing Company

20080144046 - Hand-held survey probe: A system for providing operational feedback to a user of a detection probe may includes an optical sensor to generate data corresponding to a position of the detection probe with respect to a surface; a microprocessor to receive the data; a software medium having code to process the data with... Agent: Battelle Energy Alliance, Llc

20080144047 - Position measurement apparatus, imaging apparatus, exposure apparatus, and device manufacturing method: An exposure apparatus performs a relative alignment between a reticle and a substrate, and exposes the substrate to light via a pattern formed on the reticle. The exposure apparatus includes a movable stage that carries one of the reticle and the substrate and a position measurement apparatus that measures a... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080144048 - Semiconductor device, and testing method and device for the same: A semiconductor device includes: a circuit board; a semiconductor chip mounted over the circuit board with a predetermined gap therebetween and electrically connected to the circuit board by a protruding electrode; a first resin material filled into the gap between the circuit board and the semiconductor chip; a second resin... Agent: Sonnenschein Nath & Rosenthal LLP Wacker Drive Station

20080144049 - Method and apparatus for thermographic nondestructive evaluation of an object: A non-destructive evaluation system and method is provided for detecting flaws in an object. The system includes a lamp for impinging the object with optical pulses and a focal plane array camera configured to capture the images corresponding to evolution of heat due to an impact of the optical pulses... Agent: General Electric Company (pcpi) C/o Fletcher Yoder

20080144050 - Method for correlating the line width roughness of gratings and method for measurement: A method for correlating line width roughness of gratings first performs a step (a) generating a characteristic curve of a predetermined grating having a known line width, and a step (b) performing a comparing process to select a matching spectrum from a plurality of simulated diffraction spectrum of known line... Agent: Wpat, Pc Intellectual Property Attorneys

20080137058 - Beam separation apparatus for monostatic lidars: Monostatic LIDARs use the same telescope to send the laser beam in atmosphere and to collect the backscattered echo. An important element of monostatic LIDARs is the optical separator between the emission and reception paths of the laser beam. By using a system made by a Faraday rotator in combination... Agent: K.f. Ross P.c.

20080137060 - Measuring device: The invention relates to a measuring device, in particular to a hand-held distance meter (10) comprising a measuring signal track (28, 34), an adjustable signalling means (36, 70) used for modifying said signal and a drive unit (40) which is used for adjusting the signalling means (36, 70) and comprises... Agent: Michael J. Striker

20080137059 - Method and system for optical imaging and ranging: The distance of objects to an optical system is estimated. An optical mask such as a diffractive optical element, continuous phase mask, hologram, amplitude mask, or combination thereof is placed within the optics in front of a sensor array such as a CCD, CID or CMOS device. The optical mask... Agent: Townsend And Townsend And Crew, LLP

20080137061 - Displacement measurement sensor using the confocal principle: A displacement measurement sensor using the confocal principle for measuring small changes in distance to a specular target surface comprises a monochromatic light source such as a laser diode 12, an aperture, 31 an objective lens system 44 possessing spherical aberration that separates the monochromatic light at different focal distances... Agent: Christopher Rush

20080137062 - Doppler sensor for the derivation of torsional slip, friction and related parameters: An optical method and apparatus are described for the measurement of properties of a travel vehicle or a travel surface upon which the travel vehicle travels, which includes providing an incident light from a light source to the travel surface, collecting light reflected from the travel surface, determining a surface... Agent: Blank Rome LLP

20080137064 - Sample observation method, microscope, and solid immersion lens; optical contact liquid used in the method: Optical contact liquid containing an amphipathic molecule is dripped onto a semiconductor device which is a sample as an inspection object (S104), and a solid immersion lens is set thereon (S105). The inserted position of the solid immersion lens is then adjusted (S106). The optical contact liquid is then dried... Agent: Drinker Biddle & Reath (dc)

20080137063 - Sensor, sensing apparatus and sensing method: A sensor has a sensing surface, to which a specific substance R to be detected can bind. Further, the sensor has a metal portion, at least a portion of which is exposed at the sensing surface, and in which localized plasmons can be excited. The sensor is used in sensing,... Agent: Sughrue Mion, Pllc

20080137065 - Measuring analyte concentrations in liquids: A high performance liquid chromatography system employs a nebulizer with a flow restriction at the exit of its mixing chamber to produce finer droplets, and an adjustable impactor for increased control over droplet sizes. Downstream of the mixing chamber, the nebulizer can incorporate tubing that is permeable to the sample... Agent: Haugen Law Firm

20080137066 - Method and apparatus for determination of analyte concentration: A method and system are presented for use in determination of the concentration of an analyte in a subject's medium. The medium is irradiated with at least two radiation components to produce detectable radiation responses of the medium thereto. These at least two radiation components are selected to have different... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080137068 - Detection method using electromagnetic wave and detection apparatus: A detection apparatus includes a sample holding section, an irradiation means, a detection means, a calculation means, and an evaluation means. The irradiation means irradiates a substance held in the sample holding section with a THz wave. The detection unit detects a THz wave passed through or reflected from the... Agent: Fitzpatrick Cella Harper & Scinto

20080137067 - System for the recognition of an optical signal and materials for use in such a system: A system and method for distinguishing a first light source from other light sources utilizes an image receiver that can selectively engage and disengage a filter. The filter can be configured to either block bands of light corresponding to the light being emitted by either the first source or the... Agent: Kenyon & Kenyon LLP

20080137069 - Systems and methods for predicting the lime requirement in soils: Methods and systems related to soil testing are disclosed. One exemplary embodiment of a system of the present disclosure includes a calibrated near-infrared (NIR) spectrophotometer and a soil sample with an unknown value of at least one of pH and b disposed in proximity to the calibrated NIR spectrophotometer, the... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080137070 - Apparatus and method for measuring suspension and head assemblies: An optical measurement device for determining at least two parameters of a measurement location of a surface of a workpiece positioned in a known coordinate system by a workpiece support is described. The device comprises a first light source providing a first measurement beam at a first wavelength and a... Agent: Kagan Binder, Pllc

20080137073 - Image splitting in optical inspection systems: In an optical inspection tool, an image of an object under inspection, such as a semiconductor wafer, may be obtained using imaging optics defining a focal plane. Light comprising the image can be detected using multiple detectors which each register a portion of the image. The image of the object... Agent: Dority & Manning, P.a.

20080137074 - Image splitting in optical inspection systems: In an optical inspection tool, an image of an object under inspection, such as a semiconductor wafer, may be obtained using imaging optics defining a focal plane. Light comprising the image can be split into portions that are detected using multiple detectors which each register a portion of the image.... Agent: Dority & Manning, P.a.

20080137075 - Inspection method of magnetic head slider and inspection device thereof: The present invention relates to a method for inspecting a slider, wherein the state of the slider is one in which a row bar is not yet diced into sliders, the row bar including a plurality of rectangular sliders which are aligned in a longitudinal direction of the row bar.... Agent: Nixon & Vanderhye, Pc

20080137071 - Optical displacement sensor and distance measuring apparatus: An optical displacement sensor for measuring distance or surface displacement of an object by surface profile scanning includes an optical source, a first optical detector and a second optical detector. The optical source is located intermediate the first and second optical detectors. The first and second optical detectors are arranged... Agent: Buchanan, Ingersoll & Rooney Pc

20080137072 - Sheet recognizing device and method: A sheet recognizing device and method for precisely checking the authentication of a sheet by performing recognition of color and watermark of a sheet and detecting the subtle characteristic of a hue ink printed on one side of the sheet. The predetermined angles to a sheet, a second light source... Agent: Fish & Richardson P.c.

20080137076 - Contact lens blister packages and methods for automated inspection of hydrated contact lenses: A contact lens package includes a base member including a cavity dimensioned to accommodate contact lens and a liquid therein. The combination of the cavity, the contact lens, and the liquid cooperate to collimate partially collimated light directed toward a bottom surface of the cavity. The cavity can be sealed... Agent: Christie Parker & Hale, LLP

20080137077 - Defect correction based on \"virtual\" lenslets: A system constructs an image using virtual lenslets.... Agent: Searete Llc Clarence T. Tegreene

20080137078 - Measuring a damaged structure formed on a wafer using optical metrology: A method of measuring a damaged structure formed on a semiconductor wafer using optical metrology, the method includes obtaining a measured diffraction signal from a damaged periodic structure. A hypothetical profile of the damaged periodic structure is defined. The hypothetical profile having an undamaged portion, which corresponds to an undamaged... Agent: Morrison & Foerster LLP

20080137079 - Automated inspection system and method: An automated system for illuminating and inspecting the inner surface areas of tubular samples, especially stents, is disclosed. The system comprises rotatable means for receiving the sample to be inspected; at least one fluorescent surface area arranged in the immediate vicinity of the sample to be inspected; an UV-light source... Agent: Ibm Corporation Rochester Ip Law Dept. 917

20080137080 - Method and apparatus for normalization and deconvolution of assay data: The present invention is directed to deconvolution and normalization of assay data. The present invention includes a control and analysis system, used in conjunction with a signal generation and detection apparatus, for capturing, processing and analyzing images of samples having resonance light scattering (RLS) particle labels. The control and analysis... Agent: Invitrogen C/o Intellevates Sughrue Mion Pllc

20080137081 - Method and system for raman spectroscopy with arbitrary sample cell: In a Raman spectroscopic system: a sample cell in which a sample is filled or through which the sample flows down, where the sample has fluidity and contains one or more materials being to be measured, and having an electrophoretic feature or being conditioned in advance so as to have... Agent: Sughrue Mion, Pllc

20080137082 - Method and apparatus for identifying a substance using a spectral library database: A spectroscopic detector for identifying the presence of a substance includes a laser for illuminating the substance with electromagnetic radiation at a plurality of wavelengths to induce the emission of radiation characteristic of the substance; a spectrometer or photometer for measuring the emitted radiation at a plurality of emission wavelengths... Agent: Naval Research Laboratory Associate Counsel (patents)

20080137083 - Process monitoring system, process monitoring method, and method for manufacturing semiconductor device: A process monitoring system has a process chamber configured to hold an object to be processed, an illumination source configured to emit a light to the object, a polarizer configured to polarize the light, a monitor window having a birefringent material and provided on the process chamber to propagate the... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080137084 - Method and apparatus for reducing fringe interference of light: A method for reducing fringe interference of light created in a passive cavity defined by partially reflecting optical surfaces, wherein the optical path length of the cavity is varied with a Gaussian distribution, where the standard deviation is at least one-quarter of the light's wavelength.... Agent: Siemens Corporation Intellectual Property Department

20080137085 - Method for determining optimal resonant length to maximize wave intensity in resonant structure: Provided is a method for determining the optimal resonant length, among a large number of local resonant lengths which satisfy a resonant condition, that maximizes wave intensity in a resonant structure. In the second harmonic generation or the cascaded difference frequency generation device using the resonant structure by which the... Agent: Ladas & Parry LLP

20080137086 - Optical property measuring method and optical property measuring apparatus: In an optical property measuring method and an optical property measuring apparatus, a spectral transmittance characteristic of a reference colored layer prepared as a reference is corrected based on a measured spectral reflection characteristic of a colored layer, and the spectral reflection characteristic of the reference colored layer. With this... Agent: Sidley Austin LLP

20080137087 - System and method for measuring a harvest quality parameter on a harvesting device: A system and method for measuring a quality parameter of a harvested crop are provided. Specifically, the system is adapted to be carried by a harvesting device such that a sensor is enclosed in a controlled environment and such that the sensor is capable of precisely and reliably measuring the... Agent: Alston & Bird LLP Pioneer Hi-bred International, Inc.

20080137088 - Device for optically measuring the shapes of objects and surfaces: A device is provided for optically measuring shapes and/or examining objects, comprising at least one camera, at least one lens, a scattering body and at least two light sources. The device is characterized in that the scattering body is opaque and that at least two light sources are disposed on... Agent: Harness, Dickey & Pierce, P.L.C

20080137089 - Calibration of frequency monitors having dual etalon signals in quadrature: Improved calibration of a dual-etalon frequency monitor having x-y outputs is provided. An ellipse is fit to the (x,y) points from a set of calibration data. For each (x,y) point, an angle θ is determined. A linear fit of frequency to θ is provided. Differences between this linear fit and... Agent: Lumen Patent Firm, Inc.

20080137090 - Hologram and method of manufacturing an optical element using a hologram: A method of manufacturing an optical element (5) comprises testing an optical surface (3) of the optical element, using an interferometer 1a directing measuring light (23a) onto the optical surface wherein the measuring light traverses two successive holograms (44, 48) disposed in the beam path of the measuring light upstream... Agent: Jones Day

20080137091 - Hollow core fiber optical gyro: Apparatus is provided for a fiber optic gyro. The fiber optic gyro includes a ring resonator having first and second counter-propagating directions. The ring resonator includes a coil having an axis and an optical fiber having a hollow core. The ring resonator is configured to produce a first resonance frequency... Agent: Honeywell International Inc.

20080137092 - System and method for integrated measurement using optical sensors: An integrated measurement system for measuring a plurality of parameters is disclosed. The integrated system includes a fiber Bragg grating (FBG) sensor configured for modulating a wavelength of an FBG input signal to provide an FBG output signal corresponding to an FBG parameter, a fiber Faraday rotator (FFR) sensor module... Agent: General Electric Company Global Research

20080137093 - Apparatus and method for generating thz wave by heterodyning optical and electrical waves: An apparatus and method for generating a terahertz (THz) wave are provided. The apparatus comprises: an fiber optic probe injecting an optical wave transmitted through an optical fiber into a device under test (DUT); a driving oscillator generating and injecting an electrical wave into the DUT; and the device under... Agent: Rabin & Berdo, Pc

20080137094 - Optical tomographic imaging apparatus: An optical tomographic imaging apparatus capable of obtaining a high resolution tomographic image rapidly. Light beams swept in wavelength intermittently and repeatedly within first and second wavelength ranges respectively are outputted simultaneously from a light source unit. If the wavelength of either one of the light beams is within a... Agent: Sughrue Mion, Pllc

20080137095 - Method and apparatus for resonant frequency identification through out-of-plane displacement detection: A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for... Agent: Birch Stewart Kolasch & Birch

20080137096 - Exposure apparatus and device-manufacturing method: An exposure apparatus includes a stage configured to hold an original thereon and to move in a horizontal direction, a first interferometer configured to emit first measurement light used for measuring a position of the stage in a vertical direction thereof, a first mirror provided on a bottom surface of... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080137097 - Position measuring method, position measuring system, and exposure apparatus: A position measuring system includes a laser interferometer, and a wavelength detection unit detecting the wavelength change of a laser beam. A phase compensation unit compensates for the wavelength change detected by the wavelength detection unit based on the phase difference of aerial vibration between the wavelength detection unit and... Agent: Morgan & Finnegan, L.l.p.

20080137098 - Method of multiple wavelength interferometry: A method for creating an image of an object includes setting an illumination source at an initial nominal wavelength, illuminating an object with an illumination source to create interference patterns, changing the wavelength of the illumination source to drift from the nominal wavelength to a drift wavelength over a time... Agent: Schox Plc

20080137099 - Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method: In a scatterometer, an aperture plate comprising an array of transmissive apertures is inserted into a plane in the illumination optical system that is conjugate with the pupil plane of the projection optical system. Aberrations in the optical systems can be measured by measuring the relative positions of bright spots... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080137100 - Optical probe and device and method making use thereof: The probe comprises a light source (20), means for shaping (24, 25, 21) the beam emitted by said light source and the beam coming from a surface arranged close to a target distance, an optical detector unit (22), comprising a pinhole diaphragm (26) and a photoelectric detector (28), providing a... Agent: Young & Thompson

20080137101 - Apparatus and method for obtaining surface texture information: An apparatus and method for obtaining surface texture information using photometric stereo. The material for which surface height and reflectance function information is desired (“the material”) is illuminated with an illumination source emitting electromagnetic waves, preferably in the form of white light, which is consequently reflected by the material to... Agent: Goodwin Procter LLP Patent Administrator

20080137102 - Device for positioning markings: According to the invention, it is proposed that the device has a second equipment unit (12, 13), which is positionable relative to the first equipment unit (10) and which has means (20, 22, 28, 50, 54, 60, 62, 64, 66), which make it possible to ascertain the spacing of the... Agent: Striker, Striker & Stenby

20080137103 - Optical displacement sensor and optical displacement measurement device: It is an object to provide an optical displacement sensor and an optical displacement measurement device capable of improving the detection accuracy in detecting the presence or absence of a target object. An optical displacement sensor is constituted by a light projection unit for directing projected light to a target... Agent: Kilyk & Bowersox, P.l.l.c.

20080137104 - Method and device for recording and determining the weight of fish: A method for recording and estimation of the weight of fish. A number of cameras, especially CCD-cameras, record pictures of fish moving by the cameras in a transfer conduit. The fish is illuminated from different sides in the transfer conduit and pictures of different parts of the fish are recorded... Agent: Husch Blackwell Sanders LLP

20080137105 - Laser-ultrasound inspection using infrared thermography: An inspection system is provided to examine internal structures of a target material. This inspection system combines an ultrasonic inspection system and a thermographic inspection system. The thermographic inspection system is attached to ultrasonic inspection and modified to enable thermographic inspection of target materials at distances compatible with laser ultrasonic... Agent: Bracewell & Giuliani LLP

20080137106 - Method for determining the thickness of phosphor layer and method for manufacturing light emitting apparatus: A method for determining a thickness of a phosphor layer of a device having the phosphor layer formed by dispersing phosphor particles in a transparent resin, comprising the steps of: applying laser light to the phosphor layer to determine the thickness of the phosphor layer based upon an area of... Agent: Morrison & Foerster LLP

20080129979 - Multitarget: An electro optic distance measurement apparatus using time of flight measurements and a method therefore are provided for determining a distance to a target of two or more targets located along a common line of sight from the distance measurement apparatus. Approximate distances to the two or more targets are... Agent: Harness, Dickey & Pierce, P.L.C

20080129980 - In-line fiber optic sensor devices and methods of fabricating same: In-line fiber optic structure devices for use as environmental sensors and methods of fabricating in-line fiber optic structures as environmental sensors are disclosed and provided. According to some embodiments, fiber optic sensor devices can utilize the interaction of surface plasmons or evanescent waves with a surrounding environment. Fiber optic sensors... Agent: Troutman Sanders LLP

20080129981 - Molecular interferometric imaging process and apparatus: A molecular interferometric imaging system for detecting an analyte in a sample, that includes an illumination source providing a beam of radiation; a pixel array for detecting radiation in an image plane; a biolayer designed to react to the analyte when it comes in contact with the sample; a substrate... Agent: Bose Mckinney & Evans LLP James Coles

20080129982 - Impact detection system: Disclosed an impact detection system including: three or more optical fiber sensors disposed respectively in different positions, the sensors not being in alignment with one another, in which the sensors each includes a core portion to have a grating portion formed therein, the grating portion has a plurality of gratings;... Agent: Mcginn Intellectual Property Law Group, Pllc

20080129983 - Optical reflectometry using integrated vcsel photodiode chip: Optical time domain and frequency domain reflectometry using a VCSEL-photodiode combination. Optical time domain reflectometry can be accomplished using an integrated VCSEL-Photodiode. A pulse is emitted by the VCSEL and a reflection caused by an occurrence of interest along an optical waveguide is detected by the photodiode. The time between... Agent: Workman Nydegger

20080129984 - Inspection of optical elements: In one embodiment, a method is provided that determines an image captured from a capture device. For example, a digital camera may be used to take an image of a pattern that is reflected off a solar optical element. The captured image is then compared to a master image. The... Agent: Trellis Intellectual Property Law Group, Pc

20080129985 - Slanted bragg grating refractometer, using the optical power diffracted to the radiation-mode continuum: This refractometer includes at least one optical waveguide (2) comprising at least one slanted Bragg grating (4), formed in a part of the waveguide, which is placed in contact with the medium (7) of which the refraction index is to be determined, a light source (10) coupled to the waveguide... Agent: Thelen Reid Brown Raysman & Steiner LLP

20080129986 - Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientations: An optical metrology apparatus for measuring periodic structures using multiple incident azimuthal (phi) and polar (theta) incident angles is described. One embodiment provides the enhanced calculation speed for the special case of phi=90 incidence for 1-D (line and space) structures, which has the incident plane parallel to the grating lines,... Agent: O'keefe, Egan, Peterman & Enders LLP

20080129987 - Printed matter inspection device, printing press and printed matter inspection method: A printed matter inspection device includes a light source that irradiates a color printed matter as an inspection object with illuminating light, a detector that detects the quantity of reflected light of each of a plurality of different color light beams from among reflected light reflected by the inspection object,... Agent: Kanesaka Berner And Partners LLP

20080129988 - Methods and systems for identifying defect types on a wafer: Various methods and systems for identifying defect types on a wafer are provided. One computer-implemented method for identifying defect types on a wafer includes acquiring output of an inspection system for defects detected on a wafer. The output is acquired by different combinations of illumination and collection channels of the... Agent: Baker & Mckenzie LLP

20080129989 - Apparatus at a spinning preparatory plant for detecting foreign objects in fibre material: In an apparatus at a spinning preparatory plant for detecting foreign objects, for example, pieces of cloth, tapes, string, pieces of sheeting and the like, in fibre material, the fibre material is transportable in an air flow through a fibre transport duct or a feed chute and an optical sensor... Agent: Venable LLP

20080129990 - Hybrid random bead/chip based microarray: A method and apparatus for performing an assay process, featuring providing microbeads in a solution, each microbead having a particle substrate with a grating with a superposition of different predetermined regular periodic variations of the index of refraction disposed in the particle along a grating axis and indicative of a... Agent: The Small Patent Law Group LLP

20080129991 - Alignment system for spectroscopic analysis: The present invention provides a spectroscopic system as well as a method of autonomous tuning of a spectroscopic system and a corresponding computer program product. By detecting the position of return radiation in a transverse plane of an aperture of a spectroscopic analysis unit, a control signal can be generated... Agent: Philips Intellectual Property & Standards

20080129992 - Apparatus for depth-selective raman spectroscopy: Apparatus and methods for detecting Raman spectral features non destructively from sub-surface regions of a diffusely scattering sample are disclosed. Incident radiation is supplied at one or more sample surface entry regions, and light is collected from one or more collection regions spaced from the entry regions. Raman features are... Agent: Birch Stewart Kolasch & Birch

20080129993 - Windowless fiber optic raman spectroscopy probes: The invention provides windowless fiber optic Raman probes that are directly or indirectly enclosed by one or more materials having a very low Raman signal in a desired wavenumber range that is used to evaluate a sample. In one embodiment, the very low Raman signal material is a polymer, such... Agent: Diamond Law Office Llc

20080129994 - Analytical methods and apparatus: A gaseous analyte including a small amount of a multiatomic moiety incorporating a particular isotope, such as 14CO2 is subjected to a standing optical wave at a resonant wavelength of the moiety while maintaining the moiety in an excited condition, such as in a gas discharge. The standing optical wave... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20080129996 - Equipment and method for led's total luminous flux measurement with a narrow beam standard light source: This invention belongs to the luminous flux measurement field, and especially relates to the equipment and method for LED's total luminous flux measurement with a narrow beam standard light source. The system for LED's total luminous flux measurement with a narrow beam standard light source in this invention comprises an... Agent: Ladas & Parry

20080129995 - Near infrared light diffuser: A system and method for measuring coating thickness upon a substrate is disclosed. A near infrared light is directed upon the coating and reflected near infrated light is collected to determine the coating thickness. A diffuser is placed between the coating and the reflected near infrared light collector to improve... Agent: Mcnees Wallace & Nurick Llc

20080129997 - Optical sensing methods: An optical sensing system and method is disclosed. In one embodiment, a method of detecting a scattering center includes the step of providing an optical sensing system including a light source, one or more bus waveguides where a first bus waveguide has an input port that is in optical communication... Agent: 3m Innovative Properties Company

20080129998 - Apparatus and method for measuring the fluorescence of large multi-cellular organisms: Apparatus and methods for measuring the fluorescence of large multi-cellular organisms in a sample of liquid includes a pumping mechanism, a fluorescence measuring device, a method of analyzing the measurements, and optionally, a sorting mechanism. The pumping mechanism transfers large multi-cellular organisms from a reservoir through a fluorescence-measuring device causing... Agent: Jennifer L. Bales

20080129999 - Method and a device for measuring axial polarizing angle of polarizer: The present invention relates to a device and a method for measuring an axial polarizing angle of a polarizer. The apparatus can have a to-be-measured polarizer disposed therein, and comprises a light generating device, a light polarizing device and a measurement comparison device. The light generating device provides a light... Agent: Troxell Law Office Pllc

20080130000 - Determining copper concentration in spectra: Methods of subtracting the copper contribution to spectra obtained from a substrate during chemical mechanical polishing are described.... Agent: Fish & Richardson P.c.

20080130001 - Hybrid-imaging spectrometer: An imaging optical instrument for acquiring images of a sample area is disclosed. The instrument includes a spatial detector with aligned detector elements and a variable filter having filter characteristics that vary in at least one direction and are located in an optical path between the sample area and the... Agent: Kristofer E. Elbing

20080130002 - Equipment and method for measuring transmittance of photomask under off axis illumination: Provided are equipment and a method for measuring a transmittance of a photomask. The system includes an acoustic optical deflector (AOD) substrate interposed between a light source and the photomask. The AOD is adapted to deflect a laser beam to an oblique incidence angle with respect to a surface of... Agent: Marger Johnson & Mccollom, P.c.

20080130003 - Chemical sensing apparatus and chemical sensing method: In a chemical sensing apparatus utilizing a surface plasmon resonance in a small aperture formed in a metal thin film or on a surface of a metal fine particle, a capturing substance is disposed in the small aperture or on the surface of the metal fine particle for capturing a... Agent: Fitzpatrick Cella Harper & Scinto

20080130004 - Surface plasmon resonance sensor capable of performing absolute calibration: There is provided a surface plasmon resonance imaging sensor capable of performing absolute calibration comprising: a transparent substrate; a first prism and a second prism formed at one surface of the substrate and symmetrically positioned with reference to the center axis of the substrate; an optical system for providing light... Agent: Rabin & Berdo, Pc

20080130005 - Optoelectronic apparatus and a method for its operation: An apparatus detects an object using an optoelectronic apparatus. Light beams generated by a light source are scattered back and/or reflected by an object and are detected by a receiver arrangement in accordance with the triangulation principle. An object detection signal is output by an evaluation unit and the light... Agent: Harness, Dickey & Pierce, P.L.C

20080130006 - Printing medium detecting device, image forming apparatus having the same, and method to detect printing medium: A printing medium detecting device capable of accurately detecting an amount of printing media in a paper cassette, an image forming apparatus including the printing medium detecting device, and a method to detect a printing medium. The printing medium detecting device of the image forming apparatus includes a light source... Agent: Stein, Mcewen & Bui, LLP

20080130007 - External beam expander: The invention encompasses beam expanders and methods of using such beam expanders. A beam expander according to the present invention may advantageously be used with an interferometer. Beam expanders according to the present disclosure contain at least an input and an output lens, with the output lens having a plano-convex... Agent: Morgan Lewis & Bockius LLP

20080130008 - Interferential spectroscopy detector and camera: An interferential spectroscopy detector including a waveguide having an input side and a mirror on an opposite side, and means for detecting electromagnetic rays delivering an electric signal as a function of local intensity of an electromagnetic wave, detection being produced between an input side and the mirror.... Agent: Ip Group Of Dla Piper Us LLP

20080130009 - Multiple tile calibration method for color sensors: A new calibration method for a spectrophotometer or a color sensor is provided using multiple color tiles with known reflectances. This procedure uses multiple reference standard tiles, in addition to, the standard white tile and substitutes a wavelength dependent adjustment constant instead of the dark noise reading. The constant is... Agent: Pillsbury Winthrop Shaw Pittman, LLP Xerox Corporation

20080130010 - Crossover-free fiber optic coil sensor and winding method: A method for winding a crossover-free fiber optic coil sensor comprising: attaching a fiber optic cable to an outer edge of a coil form, wherein the coil form comprises a first side and a second side; forming a first outside-in coil layer on the first side of the coil form... Agent: Greenberg Traurig, LLP

20080130011 - Transmissive disk, manufacturing method thereof, and levitation measurement apparatus using transmissive disk: m

20080130012 - Device and method for the determination of imaging errors and microlithography projection exposure system: A device, a microlithography projection exposure system, and a method for the determination of imaging errors of an optical imaging system using a radiation-superposition measuring technique which operates with lateral phase offset, having an optical element arranged on the object side of the imaging system, having a first periodic structure... Agent: Sughrue Mion, Pllc

20080130013 - Device and method for measurement of surfaces: The invention relates to a device for measuring surfaces and to a method, which uses, preferably, the device. The device comprises a light source which is used to produce a multi-colored light beam. The light beam can be focused by an imaging optical system on a plurality of points which... Agent: Alston & Bird LLP

20080130014 - Displacement measurement sensor using the confocal principle with an optical fiber: A displacement measurement sensor using the confocal principle with an optical fiber for measuring small changes in distance to a specular target surface comprises a monochromatic light source such as a laser diode 12 coupled to a multimode optical fiber. The fiber 32 functions as both a transmitter, receiver of... Agent: Christopher Rush

20080130016 - Method and an apparatus for the determination of the 3d coordinates of an object: A method serves for the determination of the 3D coordinates of an object (2). A fringe pattern is projected onto the object (2) in the method. The light reflected by the object (2) is recorded and evaluated. To improve such a method, the fringe pattern is projected onto the object... Agent: Dilworth & Barrese, LLP

20080130015 - Three-dimensional measuring apparatus, three-dimensional measuring method, and three-dimensional measuring program: A three-dimensional measuring apparatus, method, and program for acquiring many pieces of information on a pattern of light by a single projection and highly accurate three-dimensional information at high speed. The three-dimensional measuring apparatus comprises a pattern projector (1) serving as projecting means for projecting a pattern of light onto... Agent: Wenderoth, Lind & Ponack, L.l.p.

20080130017 - Exposure apparatus and device manufacturing method: An exposure apparatus for exposing shot areas on a substrate comprises a measuring device configured to measure a position of an alignment mark in each of the shot areas on the substrate, and a controller configured to generate sample shot sets from the shot areas on the substrate, to cause... Agent: Morgan & Finnegan, L.l.p.

20080130018 - Microstructured taggant particles, applications and methods of making the same: Microstructured taggant particles, their applications and methods of making the same are described. Precisely formed taggant particles can be formed, in the range of 500μ and smaller, from either inert polymers or biodegradable materials bearing information indicia, such as through specific shape, size, color, reflectivity, refractive index, surface geometry, imprinting,... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP