Optics: measuring and testing inventions 05/08

20080123077 - Mosaic quantification by birefringence measurement: A crystal optical material is illuminated at a wavelength of light that does not ionize the crystal optical material. Birefringence is measured between a plurality of voxels within the crystal optical material having spatial dimensions small enough to distinguish optical propagations of the light encountering boundary regions between subgrains of... Agent: Corning Incorporated

20080123076 - Systems and methods for ray tracing: Systems and methods for evaluating an optical property of a gemstone operate to trace selected and ordered model light rays through a model of the gemstone. The rays may be selected such that, when ordered into a sequence, the points of contact of successive rays with the gemstone surface generate... Agent: Lewis, Rice & Fingersh, Lc Attn: BoxIPDept.

20080123078 - High resolution thin film tactle device to detect distribution of stimuli on by touch: A sensor to detect and map various mechanical stimuli spatially distributed over the area of contact with the surface of the sensor. The sensor is a thin film including a stack of alternating layers of nanoparticles and dielectric materials sandwiched between electrodes. By applying a bias between the electrodes, the... Agent: William L. Botjer

20080123079 - Residual stress measuring method and system: A residual stress measuring method capable of measuring residual stress of the surface of an object to be inspected rapidly in a non-destructive non-contact manner, as well as a residual stress measuring system having such characteristics and being high in portability, are provided. The residual stress measuring system comprises a... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080123080 - Method of measuring sub-micron trench structures: The present invention uses ISTS to measure trenches with near- or sub-micron width. The trenches can be etched in a thin film on in a silicon substrate. One step of the method is exciting the structure by irradiating it with a spatially periodic laser intensity pattern in order to generate... Agent: Goodwin Procter LLP Patent Administrator

20080123081 - Apparatus for examining documents: The present invention relates to an apparatus (1) for examining documents (2), in particular banknotes. Therein the apparatus (1) comprises at least one light source (3), at least one spectral device (8) and at least two detection devices (9, 10, 11, 24). By means of the light source (3) the... Agent: Bacon & Thomas, PLLC

20080123082 - Apc system and multivariate monitoring method for plasma process machine: An advance process control (APC) system for a plasma process machine is provided, which includes at least an optical emission spectroscopy (OES) system and an APC analysis apparatus. The OES system is used for monitoring a testing object in the plasma process machine. The APC analysis apparatus is used for... Agent: J C Patents, Inc.

20080123084 - Optoelectronic sensor: This invention concerns an optoelectronic sensor assembly (10) with at least one light emitter (20) and at least one light receiver (30) comprising a spatially resolving receiving element (40), with the receiving element (40) having an inner region (42) comprising at least one photosensitive element (45) for detecting the light... Agent: Nath & Associates

20080123083 - System and method for photoacoustic guided diffuse optical imaging: A system and method for photoacoustic guided diffuse optical imaging of a sample include at least one light source configured to deliver light to the sample, at least one ultrasonic transducer disposed adjacent to the sample for receiving photoacoustic signals generated due to optical absorption of the light by the... Agent: Brooks Kushman P.C.

20080123085 - Assessing a network: The present invention relates to a method of assessing a network, in particular a network having a main line and a plurality of branch lines. The method includes the steps of: (i) introducing test signals into the main line, the main line being coupled to the branch lines; (ii) imposing... Agent: Nixon & Vanderhye, PC

20080123087 - Optical lens testing device: An optical lens testing device (10) includes a light source (12), a resolution test chart (16), and a diffusion plate (14). The diffusion plate (14) is disposed between the light source (12) and the resolution test chart (16). The diffusion plate (14) includes a base (141) and a diffusion layer... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080123086 - Projection optical system, method of manufacturing projection optical system, exposure apparatus, and exposure method: (iii) an RMS value of a spatial frequency component having a number of periods fPD in partial diameter in a range from 10 periods to 150 periods inclusive out of fluctuation of a transmission wavefront relative to light having a wavelength of 633 nm is equal to or below 0.50... Agent: Oliff & Berridge, PLC

20080123088 - Microchemical system and method for calculating tlm output thereof: There are provided a microchemical system capable of acquiring a highly accurate TLM output value and a method for calculating TLM output thereof. A microchemical system 1 comprises: a microchemical chip having a channel with a depth t in which a sample flows; an exciting light source 13 adapted to... Agent: Cohen Pontani Lieberman & Pavane LLP Thomas Langer

20080123089 - Quality control method for making a biochip displaying an encoded bead array: This invention provides high unit density arrays of microparticles and methods of assembling such arrays. The microparticles in the arrays may be functionalized with chemical or biological entities specific to a given target analyte. The high unit density arrays of this invention are formed on chips which may be combined... Agent: Eric P. Mirabez

20080123091 - Cuvette: A cuvette capable of suppressing the complication of the structure of each part of an analyzer and enabling the stirring of a specimen in a short time. The cuvette comprises: a first body part positioned on a bottom part side, having inner and outer surfaces of circular shape in horizontal... Agent: Greg H. Zayia

20080123090 - Device and method to transfer objects for optical analysis: An imaging system for analysis of at least one object is provided. The imaging system includes an optical detector, and a tray device received at the system. The tray device includes an aqueous media contained in at least one well defined by the tray device. The aqueous media in a... Agent: Peter Vogel Ge Healthcare

20080123092 - Optical tomograph: An optical tomograph irradiates and scans a measuring light beam onto a measurement target at a predetermined scanning frequency, to obtain a tomographic image of the measurement target. A depolarizing unit, for varying the polarization state of light beams input thereto at a frequency equivalent to or higher than the... Agent: Sughrue Mion, PLLC

20080123093 - Analyzer for nanostructured substrate for surface enhanced raman scattering: A Raman scattering spectrographic analyzer wherein a microscope objective is adapted to view single bio-specimens on a substrate having monodispersed-sized metal particles. A defined wavelength of radiation is applied through the microscope and returning radiation resulting from Raman scattering by bio-specimens is applied to a spectrometer operative to provide a... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20080123094 - Spectrophotometer: A spectrophotometer (2) comprising a source of radiation (6), preferably optical radiation, disposed to emit radiation at a plurality of wavelengths towards a sample in a sample holder (4) and a detection arrangement 8 for detecting the radiation after its interaction with the sample. The sample holder (4) is adapted... Agent: Harness, Dickey & Pierce, P.L.C

20080123095 - On-chip spectroscopy: The present invention relates to a micro total analysis system comprising a spectroscope and a method of manufacturing such a system comprising a spectroscope in a one step process. More over the invention relates to a method of analyzing a sample in the system. The micro total analysis system comprising... Agent: Foley And Lardner LLP Suite 500

20080123096 - Optical system for alignment assembly of field emission display panel: An optical system for alignment assembly of a field emission display panel comprises an optical lens tube, a lens unit, an image conversion unit and an image processing and display unit. The lens unit has at least two optical lenses corresponding to a first outlet end and a second outlet... Agent: Rosenberg, Klein & Lee

20080123097 - System for multi- and hyperspectral imaging: The present invention relates to the production of instantaneous or non-instantaneous multi-band images, to be transformed into multi- or hyperspectral images, comprising light collecting means (11), an image sensor (12) with at least one two dimensional sensor array (121), and an instantaneous colour separating means (123), positioned before the image... Agent: Greenberg Traurig, LLP

20080123098 - Method and system for device identification: A method and system for performing device identification is disclosed. A source signal may be directed from an energy source towards the surface of a device for reflection therefrom. An interference pattern may be detected from the surface of the device, such as by a sensor. A determination as to... Agent: Pepper Hamilton LLP One Mellon Center

20080123099 - Photothermal conversion measuring instrument: There is provided a photothermal conversion measuring instrument which can measure change in property caused by thermal effect in a sample with high sensitivity and high accuracy by a simple structure. The instrument includes a current control circuit for sequentially switching output light of a plurality of excitation light sources... Agent: Reed Smith LLP

20080123100 - Optical multilayer mirror and fabry-perot interferometer having the same: An optical multilayer mirror of a Fabry-Perot interferometer includes a reinforcing section provided as a side wall of each of second and fourth high refractive-index layers. The reinforcing section is configured to support a portion of each of the second and fourth high refractive-index layers covering a top surface of... Agent: Posz Law Group, PLC

20080123101 - Method for forming images, method for testing electronic devices; and test apparatus, test chamber and test system: The test system includes an electronic device comprising a camera for forming an image on a detector. A holographic element of the test system and the camera under test of the electronic device are arranged during testing to be placed at a predetermined distance from one another where the holographic... Agent: Hoffmann & Baron, LLP

20080123102 - Apparatus and method for measuring spacing: An apparatus is provided for measuring a spacing between an object to be measured T and a transparent object 4. The transparent object 4 is disposed, facing a surface of the object to be measured T, light is emitted to impinge through the transparent object 4 onto the object to... Agent: Birch Stewart Kolasch & Birch

20080123103 - Three-dimensional shape measurement method and three-dimensional shape measurement apparatus: The present invention provides a three-dimensional shape measurement method and a three-dimensional shape measurement apparatus. Color luminance data I (x, y) is separated by an arithmetic processing unit into R, G and B which are color components of a color image. Then, maximum amplitude values are calculated, and the maximum... Agent: Scully, Scott, Murphy & Presser

20080123104 - High selectivity band-pass interferometer with tuning capabilities: A tunable optical band-pass device for spectrally filtering an input light beam is provided. The device includes an interferometer having two inner reflective planar surfaces that face each other and are tilted at an angle α with respect to each other, and a translation device for adjusting a relative spacing... Agent: Darby & Darby P.C.

20080123105 - Segmented grating alignment device: A grating alignment device performs alignment of two or more plane gratings so as to eliminate an angular misalignment and a phase misalignment which are caused between respective diffracted light beams generated when incident light is diffracted by the plane gratings. Specifically, alignment is performed by appropriately adjusting an angle... Agent: Birch Stewart Kolasch & Birch

20080123106 - Surface roughness measurement methods and apparatus: Surface roughness measurements are made by illuminating a surface with coherent light to generate a speckle pattern and studying characteristics of the speckle pattern. The disclosed techniques may be applied to measuring the surface roughness of skin or other biological surfaces. Skin roughness information may be used in the diagnosis... Agent: Oyen, Wiggs, Green & Mutala LLP 480 - The Station

20080123107 - Method of and apparatus for determining geometrical dimensions of a wheel rim, in particular when fitting and/or removing a motor vehicle tyre: An apparatus for and a method of fitting or removing a motor vehicle tyre 4 comprising a rotatably supported wheel receiving device 2 to which the rim 3 is to be fixed, at least one fitting or removal tool 5, a rotary drive device 10 for the wheel receiving device... Agent: Mcdermott Will & Emery LLP

20080123108 - Method for measuring critical dimensions of a pattern using an overlay measuring apparatus: A method for measuring critical dimensions of a pattern using an overlay measuring apparatus is provided. The method includes setting a first scan range, inputting a step pitch for the overlay measuring apparatus, inputting X and Y coordinates of a point on a reticle, and inputting a size of the... Agent: Volentine & Whitt PLLC

20080123109 - Projector and three-dimensional input apparatus using the same: An apparatus is disclosed for projecting patterned electromagnetic waves onto an object. This apparatus includes: an electromagnetic-wave source; a modulating element allowing at least part of an electromagnetic wave incoming from the source to be modulated; and a selector for allowing a selected one of angular components of an electromagnetic... Agent: Baker Botts LLP C/o Intellectual Property Department

20080123111 - Moving body system and method of detecting position of moving body: Linear sensors are provided in two rows along a moving route of a moving body. A relative position of a magnet provided in the moving body relative to the linear sensor is determined, and an origin coordinate of the linear sensor is added to the determined relative position to determine... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080123110 - Multifaceted digitizer adapter: A method of scanning an object includes the steps of: providing a digitizer adapter having at least three markers disposed along a target surface thereof, wherein the digitizer adapter includes a spherical member disposed a predetermined distance at its center point to each of the at least three markers; securing... Agent: Gifford, Krass, Sprinkle, Anderson & Citkowski, P.C.

20080123112 - Photogrammetric contrasting light for hole recognition: A system for measuring a hole of a surface may include at least one light emitting member for emitting varied intensity flashes of light towards the hole of the surface. The system may further include a projector for projecting light beams onto the surface. The system may additionally include at... Agent: Wildman Harrold Allen & Dixon LLP And The Boeing Company

20080123113 - Method and apparatus of measuring a length of a band-shaped member: In order to measure the length F of the band-shaped member 15 in all the positions in a specified width-direction region with a simple construction, a two-dimensional laser displacement sensors 18, 19 emitting laser beams 22, 23 inclined at a certain angle with respect to a longitudinal direction of the... Agent: Sughrue Mion, PLLC

20080117405 - Method and apparatus for improvement of spectrometer stability, and multivariate calibration transfer: The present invention provides improved methods and apparatuses for accurate measurements using interferometers. A functional relationship between the optical path difference and time is determined from a reference signal from an interferometer. The times at which the interferometer had specific optical path differences can be determined from the functional relationship.... Agent: V. Gerald Grafe, Esq.

20080117406 - Systems and method for distance measurement: Embodiments of a distance measurement system are provided, in which a light signal generator comprises a first emission unit outputting a light beam to a target according to a first frequency-modulation signal, and a light-mixing unit generating a light mixing signal according to a second frequency-modulated signal and a reflection... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080117408 - Method and apparatus for analyzing a photoresist film: In a method for analyzing photoresist, light having a wavelength which responds to a photoresist film is selected. The photoresist film is exposed to the selected light. Changes of components and properties of the photoresist film are analyzed while the photoresist film is being exposed to the selected light.... Agent: Myers Bigel Sibley & Sajovec

20080117409 - Finger identification apparatus: An identification apparatus that keeps the conditions for imaging uniform among successive identifications and requires a user to perform only a series of simple maneuvers. An identification apparatus comprising a guide member, a light source, and an imaging unit. The guide member includes a pattern or a structure that inspires... Agent: Reed Smith LLP

20080117410 - Finger identification apparatus: An identification apparatus that keeps the conditions for imaging uniform among successive identifications and requires a user to perform only a series of simple maneuvers. An identification apparatus comprising a guide member, a light source, and an imaging unit. The guide member includes a pattern or a structure that inspires... Agent: Reed Smith LLP

20080117411 - Matching optical metrology tools using spectra enhancement: Optical metrology tools are matched by obtaining a first set of measured diffraction signals, which was measured using a first optical metrology tool, and a second set of measured diffraction signals, which was measured using a second optical metrology tool. A first spectra-shift offset is generated based on the difference... Agent: Morrison & Foerster LLP

20080117412 - Optical navigation system and method of estimating motion with optical lift detection: An optical navigation system and method of estimating motion uses a plate with an aperture, a photodetector and an optical system for optical lift detection. The optical system is configured to direct an input light to a target surface through the aperture of the plate and to direct the input... Agent: Kathy Manke Avago Technologies Limited

20080117413 - Sample orientation system and method: System and method for orienting the tilt and vertical position of samples in ellipsometer and the like systems.... Agent: James D. Welch

20080117407 - Sensor device: A sensor device including a source for electromagnetic radiation, a plurality of receivers for the electromagnetic radiation, and an electronics unit designed to transmit electromagnetic radiation by means of the source and to determine a distance which the electromagnetic radiation emitted from the source travels from the reflection surface of... Agent: Burr & Brown

20080117414 - Imaging optical encoder: A device provides precise determination of angle or position based upon linear array imaging of unique coded sequences imprinted on a reference wheel or linear scale. An optical image of coded reference marks thus obtained is digitally processed to identify the width and centroid location of lines within a sequence,... Agent: Rossi, Kimms & Mcdowell LLP.

20080117415 - Apparatus and method for inspecting defects: A defect-inspecting apparatus including an arrangement to convert detected light into a first signal corresponding to light illuminated by a high-angle illumination optical system and/or a second signal corresponding to light illuminated by a low-angle illumination optical system; and a classification unit which utilizes the first and second signal and... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080117416 - Use of coherent raman techniques for medical diagnostic and therapeutic purposes, and calibration techniques for same: System and methods are provided to perform non-invasive, real-time, continuous molecular detection and quantification of molecular species in a sample or animal subject using Raman spectroscopy. Such systems and methods may be applied to identify and quantify molecular species found in the body, which may be useful for prenatal diagnosis,... Agent: Wilmerhale/dc

20080117417 - Optical spectrum analyzer: An optical spectrum analyzer includes an optical section 130 for executing light dispersion into a spectrum and wavelength sweep for input measured light, converting the measured light into an electric signal, and outputting the electric signal, a control section 101 for controlling the wavelength sweep of the optical section and... Agent: Sughrue-265550

20080117418 - Time-resolved fluorescence spectrometer for multiple-species analysis: A time-resolved, fluorescence spectrometer makes use of a RadiaLight® optical switch and no dispersive optical elements (DOE) like gratings. The structure is unique in its compactness and simplicity of operation. In one embodiment, the spectrometer makes use of only one photo-detector and an efficient linear regression algorithm. The structure offers... Agent: Macpherson Kwok Chen & Heid LLP

20080117419 - Optical air data system: At least one second beam of light from a first beam of light generated by a laser is directed into an atmosphere. Light therefrom scattered by molecules or aerosols in the atmosphere is collected by at least one telescope as at least one light signal, which together with a reference... Agent: Raggio & Dinnin, P.c.

20080117420 - Method and apparatus for determining concentration using polarized light: An apparatus and method for determining the concentration of chiral molecules in a fluid includes a first polarizer configure to polarize light in substantially a first plane to provide initially polarized light. A second polarizer is capable of polarizing the initially polarized light in a plurality of planes, at least... Agent: Holland & Knight LLP

20080117421 - Optical measurement apparatus: An optical measurement apparatus which includes at least one each of a light source, an optical element, a photodetector, and a sample container, and which measures a physical property of a biological sample in a solution retained by the sample container according to a plurality of kinds of measurement items,... Agent: Scully Scott Murphy & Presser, Pc

20080117422 - Methods and devices for testing germicide activity: A handheld device provides for measuring the concentration of dialdehyde in a dialdehyde solution. The device comprises (a) an optically transparent first container being under vacuum whereby to draw in a first predetermined quantity of the dialdehyde solution; (b) a first light source positioned to transmit light in the range... Agent: Philip S. Johnson Johnson & Johnson

20080117423 - Detection element, detection apparatus for detecting target substance, method of detecting target substance and metal-containing member: There is provided a detection apparatus detecting target substance in a sample by utilizing plasmon resonance including a substrate and a plurality of metal-containing members arranged on the substrate, wherein the metal-containing members are shaped tubular and the metal-containing members are arranged on the substrate with a given orientation. By... Agent: Fitzpatrick Cella Harper & Scinto

20080117424 - Optical tomograph: A first light beam and a second light beam having discrete wavelength bands are emitted form a light source unit, and enter a light dividing means. The light dividing means separates each light beam into a measuring light beam and a reference light beam. The measuring light beams are irradiated... Agent: Sughrue Mion, Pllc

20080117425 - Hexagonal site line scanning method and system: A scanning technique for imaging sites in an array includes illuminating or irradiating sites in lines of the array, and collecting returned radiation from the sites for imaging. The sites are sequentially scanned by means of confocally directed radiation lines from source optics. The orientation of the radiation lines with... Agent: Patrick S. Yoder Fletcher Yoder

20080117426 - Laser gyro readout signal stabilization in high vibration environments: A method of stabilizing beam power in a ring LASER gyroscope (RKG) during high vibration is provided. The method comprises modifying an electrical signal output from an RLG photodetector to generate a direct current (DC) feedback signal, the DC levels of the feedback signal being proportional to RLG beam power.... Agent: Honeywell International Inc.

20080117427 - Optical tomograph: An optical tomograph is equipped with: a light source unit for emitting a plurality of light beams, the wavelengths of which are swept within different predetermined wavelength bands respectively with the same period; light dividing means, for dividing each light beam into a measuring light beam and a reference light... Agent: Sughrue Mion, Pllc

20080117428 - Multi-axis interferometers and methods and systems using multi-axis interferometers: In general, in one aspect, the invention features an apparatus including a multi-axis interferometer configured to produce at least three output beams each including interferometric information about a distance between the interferometer and a measurement object along a corresponding measurement axis, wherein at least three of the measurement axes are... Agent: Fish & Richardson Pc

20080117429 - Interferometer having a mirror system for measuring a measured object: An interferometric measuring device for measuring a measured object, in particular for thickness measurement of the measured object. A special-purpose objective having a mirror system is provided, which includes at least one first deflection mirror and one second deflection mirror and in which these are situated in such a way... Agent: Kenyon & Kenyon LLP

20080117430 - Method, apparatus, and program for processing tomographic images, and optical tomography system: Deterioration of the resolution of tomographic images obtained by optical tomography measurement is prevented. Interference signals, which are obtained when a light beam L is emitted, are divided into a plurality of divided interference signals each having different wavelength bands. Spectral analysis is administered for each of the plurality of... Agent: Sughrue Mion, Pllc

20080117432 - Ophthalmic surgical microscope having an oct-system: An ophthalmic surgical microscope (100) has a microscope main objective (101) and a viewing beam path (105) which passes through the microscope main objective (101) for visualizing an object region. The ophthalmic surgical microscope (100) includes an OCT-system (140) for recording images of the object region (108). The OCT-system (140)... Agent: Walter Ottesen

20080117431 - Optical tomographic imaging apparatus: An optical tomographic imaging apparatus capable of obtaining a high resolution tomographic image rapidly. In the apparatus, light beams having different wavelength ranges with portions of the ranges overlapping with each other are outputted from light source units, each of which is split into measuring and reference beams in each... Agent: Sughrue Mion, Pllc

20080117433 - Optical air data system: At least one second beam of light from a first beam of light generated by a laser is directed into an atmosphere. Light therefrom scattered by molecules or aerosols in the atmosphere is collected by at least one telescope as at least one light signal, which together with a reference... Agent: Raggio & Dinnin, P.c.

20080117435 - Coherence spectrometry devices: A spectrometry device comprising at least one wavefront-dividing interferometer comprising at least two unbalanced arms and at least one air wedge, a device for imaging interference fringes, an imaging sensor of the fringes and a processor that processes a signal derived from the sensor.... Agent: Ip Group Of Dla Piper Us LLP

20080117434 - Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method: Measurement of a profile of a scatterometry object on top of one or more product layers on a substrate is disclosed. To prevent an unknown parameters of one or more product layers having an effect on the measurement of the object profile, the thickness of the one or more product... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080117436 - Method of manufacturing an optical element: A method of manufacturing an optical element involves an interferometric test of the optical element using an interferometer system of a Fizeau type combined with principles of white-light interferometry. The optical element is disposed in a cavity between a Fizeau surface and a mirror, and an optical path difference between... Agent: Jones Day

20080117437 - Drift compensation for an optical metrology tool: Drift in an optical metrology tool is compensated for by obtaining a first measured diffraction signal and a second measured diffraction signal of a first calibration structure mounted on the optical metrology tool. The first and second measured diffraction signals were measured using the optical metrology tool. The second measured... Agent: Morrison & Foerster LLP

20080117438 - System and method for object inspection using relief determination: Phase profilometry inspection system has a pattern projection assembly, a detection assembly imaging a plurality of first light intensity patterns on the object and determining a first height of the object, and an absolute object height determination unit combining said first height with at least one second object height measurement... Agent: Bereskin And Parr

20080117439 - Optical structure, optical navigation system and method of estimating motion: An optical navigation system and method of estimating motion uses an optical structure configured to collimate light propagating along a first direction and to internally reflect the light off an output reflective surface of the optical structure downward along a second direction perpendicular to the first direction toward a target... Agent: Kathy Manke Avago Technologies Limited

20080117440 - Position-measuring device: A position-measuring device for generating a reference-pulse signal at at least one reference position includes a scanning unit and also a reflection-measuring graduation displaceable relative thereto in at least one measuring direction. The scanning unit for generating the reference-pulse signal includes a plurality of optical elements, including at least one... Agent: Kenyon & Kenyon LLP

20080111985 - Camera based six degree-of-freedom target measuring and target tracking device: An embodiment may comprise a camera based target coordinate measuring system or apparatus for use in measuring the position of objects in manner that preserves a high level of accuracy. This high level of measurement accuracy is usually only associated with more expensive laser based devices. Many different arrangements are... Agent: Cantor Colburn, LLP

20080111986 - Determination of range to a coherent light source using laser speckle pattern: Apparatus for determining a range to a coherent light source emitting a coherent light beam, the apparatus including an image sensor and a processor, the processor being coupled with the image sensor, the image sensor including an imaging plane, for capturing an image of the wave front of the coherent... Agent: Edwards Angell Palmer & Dodge LLP

20080111987 - Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring method: In a stress measuring apparatus, reflected light of light emitted to a substrate through an objective lens is received by a light shielding pattern imaging part, to acquire an image of a light shielding pattern positioned at an aperture stop part of an optical system. A control part obtains gradient... Agent: Mcdermott Will & Emery LLP

20080111988 - Determination of the boundaries between fractions and extraction of selected fractions in a fractionated sample: An apparatus and method are provided for determining boundaries between fractions in a fractionated sample. The method includes the steps of providing the fractionated sample in a receptacle, the receptacle having a transparent window, positioning the receptacle in a known position relative to datum means, capturing an image of the... Agent: Amster, Rothstein & Ebenstein LLP

20080111989 - Transparent material inspection system: A system for the inspection of the optical quality of a part, object or product having a portion comprising transparent material such as ophthalmologic lenses, protective eyewear, visors, eyewear shield and the like is provided. A liquid crystal display (LCD) screen emits variable patterns of light through the transparent part... Agent: Brouillette & Partners

20080111990 - Apparatus for implementing a light-emitting diode meter: An light-emitting diode (LED) meter capable of analog presentations is disclosed. The LED meter includes an LED and a reflective object. The reflective object is capable of reflecting light emitted from the LED. The reflective object is also capable of being moved to and fro along a path. The LED... Agent: Dillon & Yudell LLP

20080111991 - Photometry apparatus and camera: This invention allows measuring the spectral state of an object more accurately even at low luminance, and implementing high-precision focus detection. A photometry apparatus includes a diffusing optical member which is inserted in the optical path of a photographing lens and has a diffusing surface, and a light unit which... Agent: Cowan Liebowitz & Latman P.c. John J Torrente

20080111992 - Defective particle measuring apparatus and defective particle measuring method: A defective particle measuring apparatus that irradiates focused laser light on a sample, images scattered light from the sample, and measures defective particles in the sample based on the image result, includes a position deviation computing portion which, based on an in-plane intensity distribution of scattered light of each defective... Agent: Nixon & Vanderhye, Pc

20080111993 - Compact near-ir and mid-ir cavity ring down spectroscopy device: This invention relates to a compact cavity ring down spectrometer for detection and measurement of trace species in a sample gas using a tunable solid-state continuous-wave mid-infrared PPLN OPO laser or a tunable low-power solid-state continuous wave near-infrared diode laser with an algorithm for reducing the periodic noise in the... Agent: Juneau Partners

20080111994 - Autofocus methods and devices for lithography: Improved autofocusing (“AF”) methods and devices for lithography are provided. Some embodiments of the invention provide an AF system that includes one or more interferometers for measuring a distance to a wafer surface or a reticle surface. The invention includes methods and devices for calibrating the interferometer(s) according to known... Agent: Beyer Weaver LLP

20080111995 - System and method for cd determination using an alignment sensor of a lithographic apparatus: A system and method for determining parameters such as critical dimension of a patterned structure and best focus condition of a lithographic apparatus, based on measurment of the intensity of a non-zero order of light diffracted from an experimental structure. The experimental structure includes a first array of lines and... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080111996 - Three-dimensional shape measuring apparatus: Three-dimensional shape measuring instrument (white interferometer) for measuring the three-dimensional shape of an object to be measured by using white interference fringes, which detects the position where the amplitude of the white interference fringes takes on a maximum value with high accuracy in a short calculation processing time. An envelope... Agent: Ndq&m Watchstone LLP

20080106726 - Currency detection & tracking system and method: A counterfeit detector is adapted for determining the authenticity of a monetary instrument having a barcode printed thereon. The counterfeit detector comprises a barcode scanner configured to scan the barcode and extract data therefrom. The counterfeit detector is configured to determine the authenticity of the monetary instrument by comparing the... Agent: Stetina Brunda Garred & Brucker

20080106725 - Security element: The invention relates to an object of value with a security element, which has at least one liquid-crystalline material, the liquid-crystalline material effecting a linear polarization of light.... Agent: Rothwell, Figg, Ernst & Manbeck, P.c.

20080106728 - Consecutive measurement of structures formed on a semiconductor wafer using a polarized reflectometer: Structures formed on a semiconductor wafer are consecutively measured by obtaining first and second measured diffraction signals of a first structure and a second structure formed abutting the first structure. The first and second measured diffraction signals were consecutively measured using a polarized reflectometer. The first measured diffraction signal is... Agent: Morrison & Foerster LLP

20080106729 - Consecutive measurement of structures formed on a semiconductor wafer using an angle-resolved spectroscopic scatterometer: Structures formed on a semiconductor wafer are consecutively measured by obtaining first and second measured diffraction signals of a first structure and a second structure formed abutting the first structure. The first and second measured diffraction signals were consecutively measured using an angle-resolved spectroscopic scatterometer. The first measured diffraction signal... Agent: Morrison & Foerster LLP

20080106727 - Multiband camera system: A multiband camera system includes: a first sensor for generating a first object image and a first alignment image in a first frequency band; a second sensor for generating a second object image and a second alignment image in a second frequency band; and an internal alignment assembly. A splitter... Agent: Kurt Luther Honeywell International Inc.

20080106724 - Optoelectronic monitor including dynamic testing unit: An optoelectronic monitoring device (1) with at least one light source (2) and at least one receiving element (4) which receives light from light source (2) that was reflected by an object. The receiving element determines the distance of the object. A testing unit (5-7) of the monitoring device checks... Agent: Townsend And Townsend And Crew, LLP

20080106730 - Method for analyzing a sample on a test element and analysis system for same: The invention relates to embodiments of a method and a system for monitoring the correct positioning of a test element in a test element receptacle of an analysis unit, the test element carrying a sample to be analyzed by the analysis unit. Using a delimiting element, responsive signals resulting from... Agent: Roche Diagnostics Operations Inc.

20080106731 - Optical time domain reflectometer: To avoid the occurrence of noise in an A/D converter at the time an excessive input is applied even if an inexpensive pipeline A/D converter is used, without deteriorating the S/N ratio or wasting the resources, such as the hardware, software, etc. that follow the A/D converter. An optical time... Agent: Greer, Burns & Crain

20080106732 - Static two-dimensional aperture coding for multimodal multiplex spectroscopy: A class of aperture coded spectrometer is optimized for the spectral characterization of diffuse sources. The instrument achieves high throughput and high spatial resolution by replacing the slit of conventional dispersive spectrometers with a spatial filter or mask. A number of masks can be used including Harmonic masks, Legendre masks,... Agent: Kasha Law PLLC

20080106733 - Methods for visualizing crystals and distinguishing crystals from other matter within a biological sample: The present invention relates to optical methods of observing, distinguishing and/or visualizing grown or nascent crystals of biological material within a biological sample.... Agent: Paul D. Yasger Abbott Laboratories

20080106734 - Method for determining mixture composition of fluorescent materials and method for manufacturing light-emitting device: A method for determining a mixture composition of a plurality of fluorescent materials includes steps of calculating a first function, calculating a second function and determining a secondary mixture composition of the plurality of fluorescent materials. The first function is calculated by comparing an objective spectrum of an objective light... Agent: Procopio, Cory, Hargreaves & Savitch LLP

20080106735 - Method for determining background and correction of broadband background: A method to determine and correct broadband background in complex spectra in a simple and automatized manner includes carrying out a background correction with respect to broadband background before a calibration step. The background correction may involve recording a spectral graph and smoothing the recorded spectral graph, determining all values... Agent: James C. Wray

20080106736 - System and method for measuring particles in a sample stream of a flow cytometer or the like: A system and method for analyzing a particle in a sample stream of a flow cytometer or the like. The system has a light source, such as a laser pointer module, for generating a low powered light beam and a fluidics apparatus which is configured to transport particles in the... Agent: Ortiz & Lopez, PLLC

20080106737 - Detecting and counting bacteria suspended in biological fluids: System and method for detecting and counting bacteria suspended in a biological fluid by means of light scattering measurements is provided. In accordance with the method of the invention the level of signal to noise of the measured intensities of light scattered by a sample of the biological fluid is... Agent: Avia Kafri

20080106738 - Alignment mark: An alignment mark on a substrate includes a first pattern and a second pattern. The first pattern has a substantially planar upper surface by which parallel light is specularly reflected. The second pattern forms an interface with the first pattern and has a plurality of fine patterns. Parallel light is... Agent: Marger Johnson & Mccollom, P.c.

20080106739 - Encoder: The present invention relates to an encoder capable of detecting an absolute value of an angle of rotation or the like of a target to be measured by a simple configuration with high accuracy. In the encoder, a photodetecting region of a photodetecting device and regions to be detected arranged... Agent: Drinker Biddle & Reath (dc)

20080106740 - Dual stage defect region identification and defect detection method and apparatus: A method and apparatus for inspecting patterned substrates, such as photomasks, for unwanted particles and features occurring on the transmissive as well as pattern defects. A transmissive substrate is illuminated by a laser through an optical system comprised of a laser scanning system, individual transmitted and reflected light collection optics... Agent: Smyrski Law Group, A Professional Corporation

20080106741 - Measuring device: A measuring device for determining the concentrations of gases by radiation absorption. The device includes at least one radiation source for generating radiation, a measuring cell, which is arranged downstream of the radiation source and in which the medium to be measured is located and at least one radiation detector,... Agent: Mcglew & Tuttle, PC

20080106742 - Device for the analysis or absorption measurement of a small quantity of a liquid medium by means of light: A device (1) having integrated beam switching systems is provided which uses corresponding devices (7 and 9) and fiber optic light guides (10 and 11) for guiding the light (3) used for analysis of a liquid medium (2), for example in a spectrophotometer, a spectrofluorimeter or a similar measuring device,... Agent: Volpe And Koenig, P.c.

20080106743 - System and method for increasing the contrast of an image produced by an epifluorescence microscope: The contrast of an image produced by epifluorescence microscopy may be increased by placing a dichroic reflector behind the sample. The dichroic reflector reflects the emission light emitted by the fluorescent tags in the sample back through the objective lens while allowing the shorter wavelength excitation light to pass through... Agent: Kelley Drye & Warren LLP

20080106744 - Beam-directed structure of input device: A beam-directed structure of an input device comprises a light source, a first lens, and a vision-detecting element. The light source provides a projecting beam. The bottom of the first lens has an arch, which is on the path of the projecting beam. The arch adjusts the beam's slope, and... Agent: Rosenberg, Klein & Lee

20080106745 - Method and apparatus for high frequency optical sensor interrogation: Optical sensor measurement methods that convert a wavelength change in an optical sensor to a measurable optical intensity change, which can be calibrated and used to measure optical wavelength change and environmental changes such as temperature or strain which affect sensor wavelength. The current invention makes use of tunable fiber... Agent: Greenlee Winner And Sullivan P C

20080106746 - Depth-varying light fields for three dimensional sensing: A method for mapping includes projecting onto an object a pattern of multiple spots having respective positions and shapes, such that the positions of the spots in the pattern are uncorrelated, while the shapes share a common characteristic. An image of the spots on the object is captured and processed... Agent: Abelman, Frayne & Schwab

20080106747 - Relative position detection device and detector for rotary body and image forming apparatus including the relative position detection device: This patent specification describes a relative position detection device and a detector for a rotary body and an image forming apparatus including the relative position detection device. The relative position detection device includes a scale comprising a pattern continuously formed by changing reflectance or transmittance and moving in a direction,... Agent: Harness, Dickey & Pierce, P.L.C

20080100822 - Apparatus for high accuracy distance and velocity measurement and methods thereof: A system and method for measuring a parameter of a target in accordance with embodiments of the present invention includes transmitting at least one signal towards a target and receiving at least a portion of the transmitted signal back from the target. The measured parameter is one of distance velocity,... Agent: Nixon Peabody LLP - Patent Group

20080100821 - Electro-optical distance measuring method, distance measuring program and distance measuring system: An electro-optical distance measuring method for measuring a distance to an object to be measured by receiving a reflected light from the object to be measured, comprising a step of projecting a pulsed laser beam with a predetermined spreading angle from each of two or more known positions so that... Agent: Nields & Lemack

20080100820 - Range sensor using structured light intensity: A range sensor using structured light intensity for determining displacement measurements. A micro-lens array or diffractive optical element inputs light from a light source and outputs a flattop intensity pattern in a diverging light stripe. By using a diverging light stripe, the response of the system to a change in... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080100823 - Systems and methods for long-range, high-resolution laser radar range detection: Provided are systems and methods for long-range, high-resolution, laser radar range detection. In one embodiment such a system includes an optical pulse modifier configured generated a stretched optical pulse and an optical amplifier configured to increase an optical power of the stretched optical pulse The system can further include an... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080100825 - Mapping movements of a hand-held controller to the two-dimensional image plane of a display screen: A method for use in controlling a system includes tracking three-dimensional movements of a hand-held controller for the system, mapping the tracked three-dimensional movements of the handheld controller onto a two-dimensional image plane of a screen of a display for the system, and displaying one or more images on the... Agent: Fitch Even Tabin And Flannery

20080100826 - Devices for monitoring particulate accumulation on a filter and related methods: A device and process monitors particulate accumulation proximate a surface of a filter. A radiation source generates a signal that optically couples to a detector that detects the signal. An optical window is disposed before the detector and accumulates particulate matter. A controller processes the detected signal to monitor changes... Agent: Lathrop & Gage Lc

20080100828 - Polarization-sensitive optical time domain reflectometer and method for determining pmd: In a method of measuring cumulative polarization mode dispersion (PMD) along the length of a fiber-under-test (FUT), a polarization-sensitive optical time domain reflectometer (POTDR) is used to inject into the FUT plural series of light pulses arranged in several groups. Each group comprises at least two series of light pulses... Agent: Adams Patent & Trademark Agency

20080100824 - Self-compensating laser tracker: An apparatus and method for compensating a coordinate measurement machine is provided, which may be a laser-based coordinate measurement machine, laser tracker, or other coordinate measurement device. In one exemplary method, such compensation comprises self-compensation of payload parameters by means of embedded tracker targets. In another exemplary embodiment, such compensation... Agent: Cantor Colburn, LLP

20080100827 - Full-band optical spectrum analyzer and method: A method for optical spectrum analysis provides a tunable optical filter and scans a wavelength range of an optical signal that is larger than the free spectrum range of the tunable optical filter. The optical signal is filtered through the tunable optical filter. Separate multiple optical orders of the wavelengths... Agent: Law Offices Of Mikio Ishimaru

20080100829 - Surface height and focus sensor: A surface height and focus sensing system is provided. In one embodiment, an illumination focus sensor is used in combination with a collimation adjustment element which drives the system such that an illumination focus height matches the workpiece surface height, which produces a null output from the illumination focus sensor.... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080100830 - System and method for inspecting an object using an acousto-optic device: A system and method for inspecting an object. The system includes: a traveling lens acousto-optic device adapted to generate a traveling lens that propagates through an active region of the traveling lens acousto-optic device; a first scanner, adapted to direct a beam of light towards the traveling lens while the... Agent: Applied Materials, Inc.

20080100831 - Method, apparatus, and computer program product for optimizing inspection recipes using programmed defects: A method, apparatus, and computer program product for implementing inspection recipe services are provided. The apparatus includes a test structure including a semiconductor substrate and a number of arrays disposed on the semiconductor substrate. The arrays are linearly arranged and spaced equidistant. Each of the arrays corresponds to a reticle... Agent: Cantor Colburn LLP - IBM Fishkill

20080100832 - Charged particle beam apparatus and dimension measuring method: There is provided a charged particle beam apparatus which allows implementation of a high-reliability and high-accuracy dimension measurement even if height differences exist on the surface of a sample. The charged particle beam apparatus includes the following configuration components: An acquisition unit for acquiring a plurality of SEM images whose... Agent: Mcdermott Will & Emery LLP

20080100833 - Laser calibration: Various methods and systems for laser calibration are disclosed.... Agent: Hewlett Packard Company

20080100834 - Controlling pulses in optical microscopy: A method for imaging a sample is described. The sample is characterized by a limit on incident optical energy absorbed over a given time period. The method includes providing at least one input optical wave that includes pulses that each have a full-width half-maximum time duration of more than 100... Agent: Fish & Richardson PC

20080100835 - Compact, low cost raman monitor for single substances: Apparatus for performing Raman analysis may include a laser source module, a beam delivery and signal collection module, a spectrum analysis module, and a digital signal processing module. The laser source module delivers a laser beam to the beam delivery and signal collection module. The beam delivery and signal collection... Agent: Woodcock Washburn LLP

20080100836 - Spatial radiation modulator pattern generation: A method of generating a design pattern for a spatial radiation modulator to encode two or more selected spectral components in one or more spectral ranges for the chemometric analysis of a group of analytes. The method includes obtaining a corresponding spectrum for each of the analytes, defining a set... Agent: Fenwick & West LLP

20080100837 - Apparatus and method for ranging and noise reduction of low coherence interferometry lci and optical coherence tomography oct signals by parallel detection of spectral bands: Apparatus and method for increasing the sensitivity in the detection of optical coherence tomography and low coherence interferometry (“LCI”) signals by detecting a parallel set of spectral bands, each band being a unique combination of optical frequencies. The LCI broad bandwidth source is split into N spectral bands. The N... Agent: Dorsey & Whitney LLP Intellectual Property Department

20080100838 - Evaluation apparatus and evaluation method: An evaluation apparatus which evaluates a sample. The apparatus includes a light source which irradiates the sample with light, an imaging spectrometer which spectroscopically measures light reflected by the sample and senses an image, a first calculator which obtains amplitude information on an amplitude of a spectral reflectance of the... Agent: Fitzpatrick Cella Harper & Scinto

20080100839 - Method and system for measuring light propagating at multiple wavelengths: A compact light source emits white light towards an optically-active test sample that includes one or more unknown compounds. The unknown compound or compounds absorbs at least some of the light and emits fluorescece or luminescence, or absorbs some of the light while the non-absorbed light transmits through or reflects... Agent: Kathy Manke Avago Technologies Limited

20080100840 - Method and apparatus for analyzing particles in a fluid: A method and apparatus for analyzing particles in a fluid, such as proteinaceous particles in a pharmaceutical formulation intended for parenteral delivery, are disclosed. The method comprises arranging a fluid to form a wide and shallow stream, acquiring a sequence of magnified still images of the stream, and processing said... Agent: Teitelbaum & Maclean

20080100841 - Pointer instrument for automotive meter: A character shielding-preventive pointer instrument for automotive gauges includes a polarizer film having permeability or non-permeability characteristics selectively depending on whether power is supplied thereto. The polarizer film is attached on a lower surface of a front end portion of a pointer needle positioned just above characters of a character... Agent: Morgan, Lewis & Bockius LLP (sf)

20080100842 - Deviation angle self compensating substantially achromatic retarder: A substantially achromatic multiple element compensator system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems. Multiple total internal reflections enter retardance into an entered beam of electromagnetic radiation, and the elements are oriented to minimize changes in the net retardance vs.... Agent: James D. Welch

20080100843 - Surface position measuring system, exposure method and semiconductor device manufacturing method: There is provided a surface position measuring system which includes a reflectivity computing module which computes predictive reflectivities of a plurality of circuit patterns, an inspection light source which irradiates an inspection light onto each of a plurality of inspection areas, area by area, above the plurality of circuit patterns... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080100844 - Defect detection through image comparison using relative measures: Inspection of objects such as semiconductor wafers can include comparisons of shapes between inspection and reference images. As part of the inspection process, relative values may be assigned to pixels within each image based on comparison of such pixels to neighboring pixels. For instance, the pixels may be ranked by... Agent: Dority & Manning, P.A.

20080100845 - Inline photometer device and calibration method: The invention relates to an inline photometer device having a light source (6), a photodetector (7) placed at a distance therefrom, a measurement cell (2) which is arranged in the beam path (8) between the light source (6) and the photodetector (7) and through which a fluid to be measured... Agent: Kusner & Jaffe Highland Place Suite 310

20080100846 - Systems and methods for all-optical signal regeneration based on free space optics: System and methods for all-optical signal regeneration based on free space optics are described. In one exemplary embodiment, a method for regenerating an optical signal comprises counter-propagating an input signal and a regenerating signal within an all-optical signal regenerator based on free space optics, where the all-optical signal regenerator based... Agent: Fulbright & Jaworski L.l.p

20080100847 - Heterodyne photonic dispersion and loss analyzer: A method and apparatus for determining the optical parameters of a device under test (DUT) is disclosed. A first portion of an optical signal is modulated to generate a first modulated signal. The first modulated signal is applied to the DUT to output a test signal. A second portion of... Agent: Agilent Technologies Inc.

20080100848 - Optical tomograph: A partially coherent light beam from a light source is split between a probe light beam toward an observation object and a reference light beam toward a fixed reflective surface. The frequency of the probe light beam is shifted by optical-modulation means. The probe light beam whose frequency has been... Agent: Bruce L. Adams, Esq.

20080100849 - Optical encoder with diffractive encoder member: An optical encoder uses an encoder member with a digital diffractive track to optically manipulate an incident beam of light into manipulated beams of light, which are detected as spots of light that represent a digital absolute position value of the encoder member.... Agent: Wilson & Ham Pmb: 348

20080100851 - Laser array: A system and method for the optical determination of the concentration of an analyte in a body fluid. The system comprises an analytical test element which has a support layer and a detection area arranged thereon which contains the reagents required for the detection of the analyte in a body... Agent: Bose Mckinney & Evans LLP

20080100850 - Surface height and focus sensor: A surface height and focus sensing system is provided. In one embodiment, a wavefront sensor is used in combination with a collimation adjustment element which drives the system such that an illumination focus height matches the workpiece surface height, which produces a null output from the wavefront sensor. Under the... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080100852 - Detecting apparatus and detecting method: An optical sensor for detecting the housing state such as the thickness of a substrate in the present invention is provided at supporting arms. The supporting arms are attached to a supporting shaft. The supporting arms are in a vertical state in a state before detection of the substrate, but... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.