Optics: measuring and testing inventions 02/08

20080049210 - Range-finding sensor, and electronic device equipped with range-finding sensor: In one embodiment of the range-finding sensor of the invention, a light-emitting element that projects light to a range-finding subject, and a light-receiving element that receives reflected light reflected by the range-finding subject, are disposed on a reference face, and the light-emitting element and the light-receiving element are each individually... Agent: Birch Stewart Kolasch & Birch

20080049211 - Optical-axis deflection type laser interferometer, calibration method thereof, correcting method thereof, and measuring method thereof: An optical-axis deflection type laser interferometer includes a reference ball serving as a measurement reference, a retroreflecting means disposed at an object to be measured, a laser interferometer length measuring apparatus that outputs a measurement value according to an increase or a decrease in distance between the apparatus and the... Agent: Rankin, Hill, Porter & Clark LLP

20080049212 - Apparatus for gravitation-compensated mounting of a measurement object: An apparatus is provided for gravitation-compensated mounting of a measurement object (2) having a plurality of supporting elements (1) which each act at at least one point on the measurement object (2), with the supporting elements (1) being designed such that they exert a constant force when small changes occur... Agent: Gray Robinson, P.A.

20080049213 - Particle diameters measuring method and device: The invention provides particle diameters measuring method and device capable of preventing noise from occurring due to an error in the formation of electrodes, capable of obtaining a high S/N ratio and the diffusion coefficients of the particles to be measured, and capable of exactly measuring the particle diameters of... Agent: Rader Fishman & Grauer PLLC

20080049214 - Measuring diffractive structures by parameterizing spectral features: Structures are characterized by exposing a sample to optical radiation, measuring a spectrum associated with the exposure, detecting at least one characteristic parameter in the measured spectrum, and computing at least one structural parameter based on the at least one characteristic parameter.... Agent: Goodwin Procter LLP Patent Administrator

20080049215 - Examination apparatus and focusing method of examination apparatus: A focusing method for an examination apparatus that can quickly and easily perform focusing for fluoroscopy is provided. The focusing method, for an examination apparatus that can observe fluorescence emitted from a specimen, includes a first step of irradiating the specimen with light via an objective lens to generate reflected... Agent: Kenyon & Kenyon

20080049216 - Method and apparatus for examining end faces of light guides: In order to provide light guides, in particular in the form of glass rod portions, with improved end faces, the invention provides a method for examining glass rods, in particular light guides, in which the glass rods are arranged in front of two cameras, the cameras recording the end faces... Agent: Demont & Breyer, LLC

20080049217 - Local positioning navigation system: A local positioning navigation system and method for controlling navigation are provided. The local positioning navigation includes a stationary unit having a pointing device configured to emit a light signal and a roving unit having a detector including a plurality of light detecting elements configured to detect the emitted light... Agent: Evan R. Sotiriou The Small Patent Law Group LLP

20080049218 - Substrate inspection device and lamp unit used therein: In this invention, having as an object the facilitation of replacement of a lamp light source in a substrate inspection apparatus with heightened cleanliness within the apparatus, a substrate inspection apparatus is configured to enable visual inspections of substrates performed directly by an inspector using a macro illumination device. The... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080049219 - Wafer inspecting method: A wafer inspecting method including the steps of: multi-scanning a pattern image of a unit inspection region in a normal state and a pattern image of a unit inspection region to be inspected, respectively, using different inspection conditions; comparing the multi-scanned pattern images in the normal state with the multi-scanned... Agent: F. Chau & Associates, LLC

20080049220 - Spectroscopic microscopy with image-driven analysis: In a spectroscopic microscope, a video image of a specimen is analyzed to identify regions having different appearances, and thus presumptively different properties. The sizes and locations of the identified regions are then used to position the specimen to align each region with an aperture, and to set the aperture... Agent: Thermo Finnigan LLC

20080049221 - Method and arrangement for changing the spectral composition and/or intensity of illumination light and/or specimen light in an adjustable manner: Method and arrangement for changing the spectral composition and/or intensity of illumination light and/or specimen light in an adjustable manner, wherein a spatial separation into radiation components of different polarization is carried out with a first polarizing device, a spectral, spatial splitting of at least one radiation component is carried... Agent: Reed Smith, LLP Attn: Patent Records Department

20080049222 - Measuring method and apparatus for measuring depth of trench pattern: In a trench shape measuring apparatus, a substrate having a trench pattern extending in a predetermined trench direction on a measurement area is held by a holding part. A light emission part applies illumination light to the measurement area and reflected light of the illumination light from the measurement area... Agent: Mcdermott Will & Emery LLP

20080049223 - Optical displacement-detecting mechanism and probe microscope using the same: The optical displacement-detecting mechanism has: a light source for irradiating a target for measurement with light; a light source-driving circuit for driving the light source; an optical detector made from a semiconductor for receiving light after the irradiation of the target for measurement by the light source and converting the... Agent: Brinks Hofer Gilson & Lione

20080049224 - Polarization modulation imaging ellipsometer: The present invention aims to provide a polarization modulation imaging ellipsometer capable of measuring ellipsometric parameters of the surface of a sample for each of the measured points with high precision and at high speed. The present invention provides a polarization modulation imaging ellipsometer having a light source unit that... Agent: Kratz, Quintos & Hanson, LLP

20080049226 - Apparatus and methods for detecting overlay errors using scatterometry: Disclose is a combined scatterometry mark comprising a scatterometry critical dimension (CD) or profile target capable of being measured to determine CD or profile information and a scatterometry overlay target disposed over the scatterometry CD or profile target, the scatterometry overlay target cooperating with the scatterometry CD or profile target... Agent: Beyer Weaver LLP - Kla Tencor

20080049225 - Photomask evaluation method and manufacturing method of semiconductor device: A photomask evaluation method includes applying energy waves to a photomask having a to-be-measured pattern, detecting a response wave from the photomask, acquiring an edge profile of the to-be-measured pattern based on the response wave, acquiring dimension of that portion of the to-be-measured pattern which lies in a preset area,... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080049227 - Test tape unit for blood tests: The present invention provides a test tape unit suitable for testing blood sugar. The test tape unit comprises an analytical test tape, a feed spool for unwinding unused test tape, a take-up spool for winding used test tape, and a tape guide to expose a section of test tape at... Agent: Bose Mckinney & Evans LLP

20080049228 - Fabry-perot interferometer array: This disclosure describes a fabry-perot interferometer array and methods of using it for gas sensing, hyper-spectral imaging, scene projection and optical communications. Processed on a silicon, silicon-on-sapphire, or other substrates with integrated circuits, the array may be sized from one pixel to multi-mega pixels and made to cover the entire... Agent: William S. Chan

20080049229 - Common path time domain optical coherence reflectometry/tomography device: In common path time domain OCT/OCR devices optical radiation from a source is first split into two replicas, which are then delivered to an associated sample by an optical fiber probe. The tip of the optical fiber probe serves as a reference reflector and also serves as a combining element... Agent: Tucker Ellis & West LLP

20080049230 - Mems fiber optic microphone: The theory, design, fabrication, and characterization of MEMS (micro electrical mechanical system) Fabry-Perot diaphragm-fiber optic microphone are described in the present invention. By using MEMS technology in processing and packaging, a square 1.9 mm×1.9 mm, 2μ thick SiO2 diaphragm with a 350μ square embossed center of silicon is mechanically clamped... Agent: Kaplan Gilman Gibson & Dernier L.L.P.

20080049231 - Automatic set-up for instrument functions: Machine-implemented methods and apparatuses to automatically set-up a signal processing system are described. The signal processing system is set to a first bandwidth. A sampling frequency of the signal processing system is set to a first sampling frequency. Next, first samples of first signals are received at the first bandwidth... Agent: Blakely Sokoloff Taylor & Zafman

20080049232 - Apparatus and methods for enhancing optical coherence tomography imaging using volumetric filtering techniques: Apparatus and method can be provided, whereas a particular radiation which includes at least one first electro-magnetic radiation can be directed to at least one sample and at least one second electro-magnetic radiation can be directed to a reference. The first electro-magnetic radiation having a particular cross-sectional width may be... Agent: Dorsey & Whitney LLP Intellectual Property Department

20080049233 - Multiple-angle multiple-wavelength interferometer using high-na imaging and spectral analysis: A method is disclosed including: generating a scanning interferometry signal at each of multiple wavelengths for each of at least one location on a test object; obtaining the scanning interferometry signals at each of the multiple wavelengths for each of at least one location on the test object; analyzing the... Agent: Fish & Richardson PC

20080049234 - Colorimetric three-dimensional microscopy: An optically reflective or translucent object (14) can be microscopically imaged in all three dimensions and in true color for observation by a human observer. An interferometric optical setup is employed, using the low temporal coherence of a tunable broad-band light source (10, 20) to resolve the axial dimension, a... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20080049235 - Profile inspection system for threaded and axial components: A system and method are disclosed for inspecting a component having a length, a width, and an axis. The system includes a fixture for holding the component, a light source disposed on one side of the component, and an optical detector disposed on the other side of the component. In... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c

20080049236 - Optical displacement detection mechanism and surface information measurement device using the same: There is provided an optical displacement detection mechanism in which, even if a measurement object changes, a detection sensitivity and a ratio of a noise are adjustable without depending on optical characteristics such as reflectivity, or a shape and mechanical characteristics of a measurement object, an influence of a thermal... Agent: Brinks Hofer Gilson & Lione

20080043217 - Phase diversity ranging sensor: A system to determine the distance to an object includes one or more aberrating elements to introduce aberration into light from the object. Image data is obtained at two different focus conditions, and used to determine the object distance.... Agent: Macpherson Kwok Chen & Heid, LLP

20080043218 - Range image producing method and apparatus for image taking: An apparatus for image taking includes a range image sensor, in which a range image is produced in which a distance is represented with a pixel value by image taking of a principal object from an image taking position. An image pickup device receives light reflected by the principal object,... Agent: Birch Stewart Kolasch & Birch

20080043219 - Interferometric rayleigh scattering measurement system: A method and apparatus for performing simultaneous multi-point measurements of multiple velocity components in a gas flow is described. Pulses of laser light are directed to a measurement region of unseeded gas to produce Rayleigh or Mie scattered light in a plurality of directions. The Rayleigh or Mie scattered light... Agent: National Aeronautics And Space Administration Langley Research Center

20080043221 - Method of determining laser stabilities of optical materials, crystals selected according to said method, and uses of said selected crystals: m

20080043223 - Optical navigation device and method for compensating for offset in optical navigation device: Provided are an optical navigation device and a method for compensating for an offset in the optical navigation device. The optical navigation device includes: an image input unit for emitting light, receiving light reflected from a working surface to generate an analog image signal, converting the analog image signal into... Agent: Cantor Colburn, LLP

20080043224 - Scanning simultaneous phase-shifting interferometer: An optical measuring apparatus for comprising, in combination, a polarization type interferometer including a polarization type beam splitter in which a polarized beam of light is split into orthogonally polarized reference and test beams, an array of detectors arranged in a line for creating a plurality of phase shifting interferograms,... Agent: Hayes Soloway P.C.

20080043220 - Laser marking system: A laser energy microinscribing system, comprising a semiconductor excited Q-switched solid state laser energy source; a cut gemstone mounting system, allowing optical access to a mounted workpiece; an optical system for focusing laser energy from the laser energy source onto a cut gemstone; a displaceable stage for moving said gemstone... Agent: Milde & Hoffberg, LLP

20080043222 - Method for biomolecular sensing and system thereof: A sensing system and method for biomolecular sensing. The system includes: a receptor for the at least one target, the receptor including a substrate and a transparent coating on the substrate having front and back surfaces; a light source positioned to direct at least a portion of light from the... Agent: Nixon Peabody LLP - Patent Group

20080043226 - Measuring apparatus and measuring method: A measuring apparatus is disclosed which includes an interferometer for measuring a wavefront of light transmitted through a test object by interference between light under test passed through the test object and reference light, and measures a polarization characteristic of the test object. The measuring apparatus has a measuring unit... Agent: Fitzpatrick Cella Harper & Scinto

20080043225 - Solid-state laser gyro with a mechanically activated gain medium: The field of the invention is that of solid-state ring lasers or laser gyros. The laser gyro according to the invention comprises at least one optical cavity in the form of a ring and a solid-state amplifying medium which are designed so that two counterpropagating optical modes can propagate in... Agent: Lowe Hauptman & Berner, LLP

20080043227 - Apparatus and method to detect and correct for mode hop wavelength error in optical component measurement systems: A method of and system for correcting mode hop wavelength error in data obtained measuring optical characteristics over a number of wavelengths, includes at a location where mode hop wavelength error occurs in an assemblage of data, representing optical characteristics with respect to wavelength of incident electromagnetic energy of a... Agent: Renner Otto Boisselle & Sklar, LLP

20080043228 - Particle detection system, and lithographic apparatus provided with such particle detection system: A lithographic apparatus has an illumination system that conditions a beam of radiation. A patterning support supports a patterning device, which serves to impart the beam of radiation with a pattern in its cross-section. A substrate support holds a substrate. A projection system projects the patterned beam of radiation onto... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080043229 - Monitoring apparatus and method particularly useful in photolithographically: Apparatus for processing substrates according to a predetermined photolithography process includes a loading station in which the substrates are loaded, a coating station in which the substrates are coated with a photoresist material, an exposing station in which the photoresist coating is exposed to light through a mask having a... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080043230 - Method for spatially high-resolution imaging: Method for spatially high-resolution imaging a structure of a sample marked with a substance comprising selecting the substance from substances that are capable of being repeatedly switched from a first state with first optical characteristics to a second state with second optical characteristics and which can revert from the second... Agent: Jacobson Holman PLLC

20080043231 - Analysis device: An analysis device is capable of identifying each constituent element of a measurement object. The analysis device includes a broadband light generation source configured and arranged to generate broadband light having a bandwidth of 300 nm or greater in a wavelength band of 750 nm to 2,500 nm in substantially... Agent: GlobalIPCounselors, LLP

20080043232 - Multi-angle and multi-channel inspecting device: A multi-angle and multi-channel detecting device for detecting one or more than one samples is provided. The device has a light collector and a multi-channel kernel module. The light collector has a plurality of fiber probes arranged perpendicular to and/or inclined to the sample(s) so as to collect light signals.... Agent: Jianq Chyun Intellectual Property Office

20080043233 - Method and device for the analysis of movement in a scattering medium: Method and device for detecting and analyzing movement in a scattering medium, by: projecting a coherent light towards the scattering medium; performing a spatial and temporal sampling of the electromagnetic field of scattered light, in order to obtain a plurality of images of the electromagnetic field; and analyzing the speckle... Agent: Young & Thompson

20080043234 - System for measurement of projected turbulence downwind of an aircraft: A system for anticipated measurement of turbulence upstream of an aircraft, placed on-board the aircraft. A lidar transmits an optical beam toward the front of the aircraft and receives the backscattered optical beam. A direct detection device is associated with a controller. A first processing component uses a first internal... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080043235 - Electrophoretic system with multi-notch filter and laser excitation source: Apparatus and methods for detecting analytes in a sample are provided. The apparatus can include: one or more channels having a detection zone; one or more irradiation sources disposed for irradiating the detection zone with radiation; a detector capable of collecting at least one charge corresponding to an emission beam... Agent: Kilyk & Bowersox, P.l.l.c.

20080043236 - Optical property measurement apparatus and optical property measurement method, exposure apparatus and exposure method, and device manufacturing method: An optical property measurement apparatus is equipped with an optical system unit that selectively places an opening section for passing illumination light, a microlens array for measuring wavefront aberration, and a polarization detection system for measuring a polarization state of the illumination light on an optical path of the illumination... Agent: Oliff & Berridge, PLC

20080043237 - Automatic laser alignment system: A device that automatically aligns laser beams to corresponding targets to establish a frame of reference for radiation oncology or diagnostic imaging. The device is comprised of one or more lasers and corresponding laser alignment targets, two motors for each laser to control its direction, a laser imaging device or... Agent: Jimm Grimm

20080043238 - Data exchange system: The invention relates to a device for exchanging data, such as a position or an identification, between a tool and a tool receiving structure, the device comprising; an elongated track of sensors arranged in the receiving structure; at least one sensor activating element arranged on the tool. The invention further... Agent: The Webb Law Firm, P.C.

20080043239 - Method and apparatus for angular-resolved spectroscopic lithography characterization: An inspection system is arranged to measure an overlay error by projecting a plurality of radiation beams, differing in wavelength and/or polarization, onto two targets. A first radiation beam is projected onto a first target and the reflected radiation A1+ is detected. The first target comprises two gratings having a... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080043240 - Probe for measuring light in a liquid, probe for detecting the flocculation threshold of a colloidal medium, related detection method and use for determining the flocculation of asphaltenes: The invention concerns a device for measuring light in a liquid by introducing in said medium at least one emitting probe comprising: a transmitter connected to a first waveguide; a second waveguide; and included in said second waveguide, at least one reflecting surface. The invention also concerns a method for... Agent: Dickstein Shapiro LLP

20080043241 - Systems and methods for assisting start of electrodeless rf discharge in a ring laser gyro: Systems and methods for starting and operating an electrodeless RF discharge ring laser gyro. In one example, an electrodeless RF discharge ring laser gyro system includes a ring laser gyro, a starting circuit, an RF power source, and a controller. The starting circuit is electrically connected to the ring laser... Agent: Honeywell International Inc. Patent Services Ab-2b

20080043243 - Ae/ultrasound detection system, and material monitoring apparatus and nondestructive inspection apparatus equipped the system: There is provided a system always capable of detecting AE/ultrasound received by an FBG, even when the FBG receives a change in temperature or strain and the Bragg wavelength is fluctuated. In the AE/ultrasound detection system, the reflected light from the FBG is caused to enter a Fabry-Perot filter having... Agent: Rader Fishman & Grauer PLLC

20080043242 - Optical sensors: An optical sensor comprises a sensing element comprising a waveguide grating with a response that varies with an effective modal index experienced by light propagating in the grating and a sample window for receiving fluid which affects the effective modal index to modify the response, the sensing element arranged to... Agent: Renner Otto Boisselle & Sklar, LLP

20080043244 - Optical tomography system: A polarization maintaining optical fiber, for guiding a measuring light beam, is provided within a probe. The probe is configured to be rotatable in the circumferential direction of the polarization maintaining optical fiber. A polarization direction rotating means, for rotating the polarization direction of the measuring light beam that enters... Agent: Sughrue Mion, PLLC

20080043245 - Methods and apparatus for measuring multiple fabry-perot gaps: Apparatus, methods, and other embodiments associated with measuring multiple Fabry-Perot gaps to determine environmental parameters are described herein. In one embodiment, a system for measuring environmental parameters includes an optical fiber, a first reflective surface, a second reflective surface, a third reflective surface, and a light source. The first reflective... Agent: Mcdonald Hopkins LLC

20080043246 - Multi-axis interferometer system using independent, single axis interferometers: Improved systems, apparatus, and methods for detecting positions of moving stages and a reference position of a beam column are provided. For some embodiments, independent discrete interferometers may be utilized for distance measurements in each axis, rather than a cumbersome monolithic multi-axis interferometer utilized in conventional systems.... Agent: Patterson & Sheridan, LLP

20080043247 - Method of manufacturing an optical element: A method of manufacturing an optical element includes testing the optical element by using an interferometer optics generating a beam of measuring light illuminating only a sub-aperture of the tested optical element. The interferometer optics comprises a hologram. Results of the sub-aperture measurement are stitched together to obtain a measuring... Agent: Jones Day

20080043248 - Photonic crystal sensors using band edge and/or defect mode modulation: A photonic crystal (PC) based structure is proposed for sensing exceptionally small refractive index changes of a medium. In a typical photonic crystal, the location of the band edges and the defect modes if present are very sensitive to the dielectric contrast of the structure. Hence, a propagating electromagnetic wave... Agent: Venable, Campillo, Logan & Meaney, P.C.

20080043249 - Apparatus for measurement of 3-d shape of subject using transformable holder with stable and repeatable positioning of the same subject: An apparatus is disclosed for use in measuring a three-dimensional shape of a subject, which includes: a turntable unit configured to include a turntable, and a support frame adapted to rotatably support the turntable; a measurement head configured to photograph the subject on the turntable and to measure the three-dimensional... Agent: Baker Botts LLP C/o Intellectual Property Department

20080043250 - Method and apparatus for measuring drawing position, and method and apparatus for drawing image: A drawing position measuring method is disclosed, in which a position of a drawing point is measured using detection slits formed in a drawing surface when the drawing surface and an exposure head that modulates incoming light and forms the drawing point on the drawing surface are moved relatively to... Agent: Mcginn Intellectual Property Law Group, PLLC

20080043251 - Proximity sensor system: A system for determining the longitudinal position of a displaceable element positioned between two substantially orthogonally laterally opposing displacement sensors measures a distance from each displacement sensor to the displaceable element. The displaceable element has a tapered thickness along its length. A change in the longitudinal position of the displaceable... Agent: Pate Pierce & Baird

20080043252 - Internal and external measuring device: A measuring device for measuring internal or external dimensions of a manufactured or machined component is provided with a laser source, a beam redirection member, and a beam receptor. The beam redirection member is adapted to be positioned within an internal bore of a subject component. The laser source directs... Agent: Cook, Alex, Mcfarron, Manzo, Cummings & Mehler Ltd

20080036993 - Laser distance measuring system with a shutter mechanism: A laser distance measuring system includes an object lens, a beam splitter, a transmitter, a receiver, and a shutter mechanism. The beam splitter is disposed at one side of the object lens. The transmitter emits a laser beam that is split by the beam splitter into a measurement beam and... Agent: Trop Pruner & Hu, PC

20080036994 - Wearable radar detection device having wireless link: A detection system is described configured for receiving radar and laser signals. The detection system includes a motorcycle mounted detector module and a motorcyclist carried indicator module. The detector module is a warning receiver configured to receive signals, identify the signals as being in frequency bands for vehicular speed measuring... Agent: The Law Office Of Randall T. Erickson, P.C.

20080036995 - Projector, method of measuring distance to the projector, and method and program for acquiring inclination angles of projection screen: A light source 165 of a projection unit 16 AM modulates an electric current supplied to a built-in LED. The projection unit 16 projects the modulated light on a projection screen. A photoreceiver 171 receives, with a time lag, a reflected portion of the modulated light from the screen, which... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080036998 - Probe beam profile modulated optical reflectance system and methods: The present invention provides a probe beam profile—modulated optical reflectivity metrology system having a modulated pump source for exciting the sample. A separate probe beam is directed to interact with the sample in a manner so that the rays within the probe beam create a spread of angles of incidence.... Agent: Stallman & Pollock LLP

20080037001 - Biometric identification apparatus: [Solution] The apparatus includes a plurality of light sources 102, 103, 106, and 107, each having a wavelength different from one another, for emitting light to a finger 200 as an object to be identified, and receivers 104 and 105 for detecting the light passing through the finger. The ratio... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080037000 - Method for determining a radiation power and an exposure apparatus: o

20080037003 - Laser processing method and device: This laser processing method comprises a displacement acquiring step (S07 to S11) of irradiating an object to be processed with a rangefinding laser beam for measuring a displacement of a main surface of the object while converging the laser beam with a lens and acquiring the displacement of the main... Agent: Drinker Biddle & Reath (dc)

20080037007 - Light detecting method and light detecting apparatus: A light detecting method and apparatus wherein non-projection imaging operation of a predetermined range is carried out once within a non-projection imaging operation time thereby to obtain background information. During a remaining time after the non-projection imaging operation, light is radiated. At least two imaging operations of a predetermined range... Agent: Young & Basile, P.C.

20080037004 - Method for particle size and concentration measurement: The present invention provides method of particle size and concentration measurement that comprises the steps of: providing a focused, synthesized, non-Gaussian laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and... Agent: Kenyon & Kenyon LLP

20080037006 - Methods and apparatus for analyzing fluid properties of emulsions using fluorescence spectroscopy: This relates to methods and apparatus for analyzing samples by fluorescence spectroscopy. In one embodiment, the methods and apparatus use a fluorescence detection unit (FDU) of a composition fluid analyzer (CFA™) module to detect variations in fluid properties (gradients) within an oil bearing column. Some embodiments enable efficient downhole fluid... Agent: Schlumberger-doll Research Attn: Intellectual Property Law Department

20080037009 - Spectrometer system with ir microscope and electronically switchable detectors: A spectrometer system (1) comprising an IR (infrared) spectrometer (2) and an IR microscope (3), wherein a sample (42) and a first detector (21; 31) are provided in the IR microscope (3), wherein the IR microscope (3) is designed such that during measurement, the sample (42) is imaged on the... Agent: Kohler Schmid Moebus

20080036996 - Method and system to correct motion blur and reduce signal transients in time-of-flight sensor systems: TOF system shutter time needed to acquire image data in a time-of-flight (TOF) system that acquires consecutive images is reduced, thus decreasing the time in which relative motion can occur. In one embodiment, pixel detectors are clocked with multi-phase signals and integration of the four signals occurs simultaneously to yield... Agent: Canesta, Inc.

20080036997 - Apparatus for measuring semiconductor physical characteristics: A reflectometry method and apparatus for gathering meaningful reflectance data indicative of one or more characteristics of a substance being grown on a horizontal substrate within a reaction chamber. The apparatus includes an external light source which shines light into the chamber through an opening having a shutter for selectively... Agent: James D. Stevens Reising, Ethington, Barnes, Kisselle, P.C.

20080036999 - Spectroscopic examination of body fluid and tissue samples to aid diagnosis of alzheimer's disease: A method is described for the spectroscopic examination of samples which are taken from human tissue or body fluids, in particular blood, comprising the following steps: measuring an infrared spectrum of a sample to be examined; analysing the measured infrared spectrum in order to determine at least one sample parameter... Agent: Roche Diagnostics Operations Inc.

20080037002 - Non-destructive single seed or several seeds nir analyzer and method: A method and apparatus for optically interrogating a particle comprising obtaining a plurality of optical interrogations from a plurality of orientations relative the particle. In one aspect, the particle is tumbled relative to optical interrogation direction and reflected or transmitted energy is collected and added into a single spectrum that... Agent: Mckee, Voorhees & Sease, P.L.C Attn: Pioneer Hi-bred

20080037008 - Active cmos biosensor chip for fluorescent-based detection: An active CMOS biosensor chip for fluorescent-based detection is provided that enables time-gated, time-resolved fluorescence spectroscopy. In one embodiment, analytes are loaded with fluorophores that are bound to probe molecules immobilized on the surface of the chip. Photodiodes and other circuitry in the chip are used to measure the fluorescent... Agent: Wilmerhale/columbia University

20080037010 - Method and apparatus for bandwidth measurement and bandwidth parameter calculation for laser light: A bandwidth meter method and apparatus for measuring the bandwidth of a spectrum of light emitted from a laser input to the bandwidth meter is disclosed, which may comprise an optical bandwidth monitor providing a first output representative of a first parameter which is indicative of the bandwidth of the... Agent: Cymer Inc Legal Department

20080037005 - System for measuring a sample with a layer containing a periodic diffracting structure: To measure the critical dimensions and other parameters of a one- or two-dimensional diffracting structure of a film, the calculation may be simplified by first performing a measurement of the thickness of the film, employing a film model that does not vary the critical dimension or parameters related to other... Agent: Davis Wright Tremaine LLP

20080037011 - Method, device and system for evaluating a lens for an electronic device: The invention relates to a system, method and device for evaluating imperfections in a lens for a display for an electronic device. For the device, it comprises: a substrate; and a pattern imposed on the substrate. For the pattern, when the pattern is viewed through the lens, the pattern is... Agent: Mccarthy Tetrault LLP

20080037012 - Apparatus for contactless 3d wheel alignment, system and method therefor: An alignment measuring apparatus for 3D contactless measuring alignment of a wheel of an automotive vehicle, a system formed by several apparatuses for a total wheel alignment of all wheels of an automotive vehicle, and a respective method for carrying out 3D contactless wheel alignment in real time. The several... Agent: Seed Intellectual Property Law Group PLLC

20080037013 - Method and system for determining condition of process performed for coating film before immersion light exposure: A method is used for determining a condition of a predetermined process for preparing a process target, which includes a coating film formed on a substrate and including a resist film. This is to prevent film peeling from occurring in the coating film when performing immersion light exposure after the... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080037014 - Method for reducing diameter of bubble existing in a glass plate: It is an object of the present invention to provide a new method for reducing the diameter of a bubble existing in a glass plate. Specifically, the present invention provides a method for reducing the diameter of a bubble existing in a glass plate, which comprises irradiating the vicinity of... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080037015 - Polarimetric scatterometry methods for critical dimension measurements of periodic structures: An optical measurement system for evaluating a sample has a motor-driven rotating mechanism coupled to an azimuthally rotatable measurement head, allowing the optics to rotate with respect to the sample. A polarimetric scatterometer, having optics directing a polarized illumination beam at non-normal incidence onto a periodic structure on a sample,... Agent: Stallman & Pollock LLP

20080037016 - Droplets detecting system: A droplets detecting system (100) includes a laser diode assembly (20), a photo diode (30), a light source (40), a charge coupled device camera (50), a signal processing and displaying device (32), and an image processing and displaying device (52). The laser diode assembly is configured for emitting a laser... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080037017 - Generic interface for an optical metrology system: An optical metrology system includes a photometric device with a source configured to generate and direct light onto a structure, and a detector configured to detect light diffracted from the structure and to convert the detected light into a measured diffraction signal. A processing module of the optical metrology system... Agent: Morrison & Foerster LLP

20080037018 - Methods and systems for determining and measuring the time of death, time, condition and liquid content of and at teeth or materials: Data are compiled by simulation before or during a process which a tooth or material can undergo or has undergone, and the data are then used for computing purposes and/or as reference data after an additional measurement data acquisition process in order to achieve one or more of the purposes... Agent: William Collard Collard & Roe, P.C.

20080037019 - Color measuring head: A photoelectric color measuring head for measuring color properties of a measurement object includes an illumination device for exposing the measurement object to illuminating light and a wavelength-range-selective photoelectric receiver device (40) which intercepts measurement light remitted by the illuminated measurement object and converts it into corresponding electrical measurement signals.... Agent: Mccarter & English , LLP Stamford Office

20080037020 - Front-loading type washing machine: A front-loading type clothes washing machine comprises a washing tub, a drum which is rotatable within said washing tub about a horizontal or inclined center of rotation and capable of containing the items to be washed, a door assembly for closing the tub and an annular bellow-type gasket interposed between... Agent: Mcgarry Bair PC

20080037021 - Biological property check device using light: A biological property check device includes a plurality of probes (20) each having a light emitting element (26) for applying light to a biological tissue and a light reception element (28) for detecting the reflected light. Each probe (20) is successively selected by a switch circuit (60) under control of... Agent: Oliff & Berridge, PLC

20080037022 - Surface plasmon resonance sensor: In a surface plasmon resonance sensor including a chip with a substrate 102 and a metal layer 103, a prism 104, an optical system 105 serving as a light source, and a light detector 106, the metal layer 103 is configured by a flat part 109 formed into a thin... Agent: Osha Liang L.L.P.

20080037023 - Method for measuring dissociation constant by surface plasmon resonance analysis: An object to be solved by the present invention is to determine the dissociation constant of an analyte molecule immobilized on a metal surface and a molecule that interacts therewith in surface plasmon resonance (SPR) analysis via an analytical method that produces a low noise level (i.e., a noise width... Agent: Sughrue Mion, PLLC

20080037024 - Systems, methods, and apparatuses of low-coherence enhanced backscattering spectroscopy: Systems, methods, and apparatuses of low-coherence enhanced backscattering spectroscopy are described within this application. One embodiment includes providing incident light comprising at least one spectral component having low coherence, wherein the incident light is to be illuminated on a target object in vivo. An intensity of one or more of... Agent: Greenberg Traurig, LLP

20080037025 - Methods and apparatus for bandwidth measurement and bandwidth parameter calculation for laser light: A bandwidth meter method and apparatus for measuring the bandwidth of a spectrum of light emitted from a laser input to the bandwidth meter is disclosed, which may comprise an optical bandwidth monitor providing a first output representative of a first parameter which is indicative of the bandwidth of the... Agent: Cymer Inc Legal Department

20080037026 - Scale-factor stabilized solid-state laser gyroscope: The field of the invention is that of solid-state laser gyros used for measuring rotational velocities or angular positions. This type of equipment is used in particular for aeronautical applications. The performance of a laser gyro depends on the temperature stability of its scale factor S which equals 4A/λ·L, L... Agent: Lowe Hauptman & Berner, LLP

20080037027 - Gyro employing semiconductor laser: A semiconductor laser gyro including a photodetector and a semiconductor laser 10 that emits first and second laser lights. The photodetector is disposed in a position where interference fringes are formed by the first and second laser lights. The semiconductor laser 10 includes an active layer as well as first... Agent: Mcdermott Will & Emery LLP

20080037028 - Pulsed coherent fiber array and method: A pulsed coherent fiber array laser system that includes a beam generating sub-system that provides a signal pulse beam having pulses of the desired duration that is split into several fiber channels. Optical leakage between the pulses in each split beam is measured and locked to a reference beam by... Agent: John A. Miller Warn, Hoffmann, Miller & Lalone, P.C.

20080037029 - Optical apparatus, exposure apparatus, and device manufacturing method: An optical apparatus according to this invention includes a first element, a second element, a support which supports the first element, a first measuring device which measures the position of the first element relative to the support, a second measuring device which measures the position of the second element relative... Agent: Fitzpatrick Cella Harper & Scinto

20080037030 - Image amplifying, servo-loop controlled, point diffraction interometer: An apparatus in one example has: first and second Fourier transform lenses, the first Fourier transform lens receiving an incident plane wavefront and focusing the plane wavefront down to a focal point in a focal plane, and the second Fourier transform lens reimaging the focused down plane wavefront to an... Agent: Patti, Hewitt & Arezina LLC

20080037031 - Terahertz time domain sensing to derive physical characteristics of an object by evaluating the contribution of surface waves to the reflected/scattered time domain waveform: The present invention provides a method of analysing an object (29) (for example a wive or a steut), comprising the steps of: (a) irradiating the object with a Terahertz pulse of electromagnetic radiation, such that a portion of the irradiating radiation couples to the object as a surface wave; (b)... Agent: Dickstein Shapiro LLP

20080037032 - Method and apparatus for contact free measurement of periodically moving objects: A method and apparatus is described for contact-free 3 dimensional-measuring of a moving object with periodic motion. The method and apparatus makes use of the projection of a defined intensity pattern onto the moving object and the recording and analysis of a reflected pattern from the object wherein the intensity... Agent: Michael A. Ervin M.a. Ervin & Associates

20080037033 - Sensor for measuring the surface of an object: The invention relates to a sensor for measuring the surface of an object, having a contrasting unit (3) for projecting a pattern onto the surface of the object, and having a camera (4) for recording of the pattern projected onto the surface of the object, in which the contrasting unit... Agent: Michael J. Striker

20080030709 - Compact laser altimeter system: A laser-based altimeter for use on-board an aircraft comprises: a first housing including a hollow cavity and an exit aperture, and a second housing including a hollow cavity and an entrance aperture. A laser source and a plurality of first optical elements are fixedly supported in a compact configuration within... Agent: Calfee Halter & Griswold, LLP

20080030714 - High power acoustic resonator with integrated optical interfacial elements: Embodiments of the present invention provide methods and systems for integrating optical interfacial elements with a high power acoustic resonator. More specifically, but not by way of limitation, in certain embodiments of the present invention, one or more optical interfacial elements may be integrated with a high power acoustic resonator... Agent: Schlumberger-doll Research Attn: Intellectual Property Law Department

20080030717 - Color measuring apparatus having differently operating measuring devices: An apparatus performs colorimetric measurements of printing materials. The apparatus for the colorimetric measurement of printing materials has two measuring devices operating with different resolutions for registering the surface of the printing material. The two measuring devices permit faster registration of color measured values on a printing material and thus... Agent: Lerner Greenberg Stemer LLP

20080030710 - Displacement measuring method, displacement measuring instrument, displacement measuring target and civil structure: A target having a reflective part for a laser beam is located at the measuring object position of a bridge girder in such a way that the reflective part includes with respect to the displacement measuring direction and a laser rangefinder is located at the pier. A laser beam projected... Agent: Darby & Darby P.C.

20080030711 - Method for measuring distance to object: A method for calculating a distance to an object is provided. In this method, whether luminances received by at least one light receiving elements of a plurality of light receiving elements are equal to or higher than a predetermined value is determined. When luminances received by at least one light... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080030713 - Uncaging devices: Uncaging devices that can be used to uncage photoactivatable caged components are provided. Consistent, uniform and/or high throughput processing of reactions and assays that include caged components is provided. Masked multiwell plates that can be used for uncaging photoactivatable caged components are provided. Methods and apparatus for initiating assays involving... Agent: Quine Intellectual Property Law Group, P.C.

20080030712 - Uv fluorometric sensor and method for using the same: An ultraviolet (UV) fluorometric sensor measures a chemical concentration in a sample based on the measured fluorescence of the sample. The sensor includes a controller, at least one UV light source, and at least one UV detector. The sensor emits UV light in a wavelength range of 245-265 nm from... Agent: Shumaker & Sieffert, P. A.

20080030715 - Best focus detection method, exposure method, and exposure apparatus: An aerial image of a measurement mark (PM) arranged on a measurement mask (Rm) is conformed to a center in an X-axis direction of a slit (122) arranged on a Z tilt stage (38). While illuminating the measurement mark with an illumination light (IL), a slit plate (190) on which... Agent: Oliff & Berridge, PLC

20080030718 - Detection method, microchemical system using the detection method, signal detection method, thermal lens spectroscopic system, fluorescence detection system, signal detection apparatus, signal detection system, signal detection program, and storage medium: A detection method that can measure a plurality of measured substances in a fluid test sample at the same time, easily perform qualitative analysis and quantitative analysis, and reduce measurement errors between excitation energies of the measured substances, and a microchemical system using the detection method. A probe light with... Agent: Cohen Pontani Lieberman & Pavane LLP

20080030719 - Inspection apparatus having two sensors, method for inspecting an object, and a method for manufacturing a photolithography mask: A photolithography mask inspection apparatus has at least two sensors. One sensor is configured to sense light transmitted through an object to be inspected, and the other sensor senses light reflected off the object. A first optical system is arranged to expose a first portion of the object with a... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080030716 - Method and apparatus for measuring a position of a particle in a flow: Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20080030720 - Optical fiber birefringence measurement method and measurement device, and optical fiber polarization mode dispersion measurement method and optical fiber: (where φ represents the phase difference between linear polarization components due to birefringence, Δn represents birefringence, and λ represents wavelength), the birefringence in the infinitesimal interval Δz from the position z to the position z+Δz is obtained.... Agent: Sughrue Mion, PLLC

20080030721 - Optical apparatus and methods for chemical analysis: In one aspect, the invention relates to an optical apparatus for producing light of a predetermined intensity from light sources of less than the predetermined intensity. In one embodiment the apparatus includes a first light source; a second light source; a double dove anti-Gaussian generator in optical communication with the... Agent: Cooley Godward Kronish LLP Attn: Patent Group

20080030722 - Enclosure for a laser scanner for use in a sawmill: The laser enclosure includes an enclosure body which is adapted to accommodate a laser scanner therein. The enclosure with the laser assembly is used in a sawmill environment. The enclosure body includes an assembly for moving the mounted enclosure body to obtain and maintain a desired orientation and aiming for... Agent: Jensen + Puntigam, P.s.

20080030723 - Process and device for monitoring the illumination of lamp bulbs: A device for measuring the illumination of a light bulb wherein it has a sensor for measuring the illumination of the bulb and a device for measurement and comparison of the value of illumination of the bulb to at least one threshold.... Agent: Perman & Green

20080030724 - Image sensor and method of manufacturing the same: An image sensor which may maximize the optical integrity by maximizing the amount of incident light through a microlens layer and a method for manufacturing an image sensor. An image sensor may include a pixel region, a microlens layer, and at least one microlens. The microlens layer may include a... Agent: Sherr & Nourse, PLLC

20080030725 - Display panel inspection apparatus and method: The present invention relates to a display panel inspection apparatus for inspecting a display panel composed of a plurality of pixels. The display panel inspection apparatus comprises a detecting unit detecting whether or not each of the pixels is a defective pixel and a holding unit holding a result of... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080030726 - Low pixel count tunable laser raman spectroscopy system and method: A Raman system uses a semiconductor tunable laser subsystem to generate a tunable signal that is tuned over a scan band of greater than 50 nanometers. A probe system transmits the tunable signal to a sample. Finally a detector system comprises a bandpass filter for filtering a Raman signal from... Agent: Houston Eliseeva

20080030727 - Method for remote sensing of targets in a transparent medium using ultra-short intense lasers: There is described a method for identifying at least one target in a substantially transparent medium. High-power, ultra-short laser pulses are transmitted into the medium. A diameter of the laser pulses is enlarged and the laser pulses having an enlarged beam diameter are focused using a focusing element so as... Agent: Ogilvy Renault LLP

20080030728 - Compact and rugged imaging raman spectrograph: A compact and robust imaging Raman spectrograph has a collimating input lens assembly, a spectral filter assembly, a transmission diffraction grating, a focusing lens assembly, and a light detector. The spectral filter assembly is located between the two lenses and comprises a notch or long-pass filter optical interference filter, a... Agent: Hudak, Shunk & Farine, Co., L.p.a.

20080030729 - Method and apparatus for estimating a property of a fluid downhole: A method for estimating a property of a fluid downhole is disclosed, the method including but not limited to exposing the fluid to light downhole; directing different wavelengths of light that have interacted with the fluid light toward a first optical grating; measuring light at different wavelengths reflected from the... Agent: Gilbreth Roebuck Bynum Derrington Schmidt Walker & Tran LLP

20080030730 - Water contamination measurement apparatus: An apparatus for measuring the impurity content of drinking water processes has a monochromatic light source projecting a beam of visible light toward a light trap. A water sample generator passes a water sample transverse to and intersecting the beam of light. A photo sensor array with an angular resolution... Agent: Bacon & Thomas, PLLC

20080030731 - Automatic wafer edge inspection and review system: A substrate illumination and inspection system provides for illuminating and inspecting a substrate particularly the substrate edge. The system uses a light diffuser with a plurality of lights disposed at its exterior or interior for providing uniform diffuse illumination of a substrate. An optic and imaging system exterior of the... Agent: Harness, Dickey & Pierce, P.L.C

20080030732 - Fluorescence polarization imaging devices and methods: The present invention is directed to a novel multi-spectral exogenous fluorescence polarization imaging technique that enables rapid imaging of large tissue fields. The imaging device includes a tunable monochromatic light source and a CCD camera. Linear polarizers are placed into both the incident and collected light pathways in order to... Agent: Edwards Angell Palmer & Dodge LLP

20080030733 - Mark position measuring method and apparatus: The present invention provides a method and apparatus for detecting the position of a first mark disposed inside a variable-pressure chamber using a detector disposed outside the chamber and detecting a second mark on an object disposed inside the chamber using the detector. The position of the second mark relative... Agent: Fitzpatrick Cella Harper & Scinto

20080030734 - Detecting device and laminated body manufacturing apparatus employing such detecting device: A laser beam (LB) emitted from a laser diobe of each of detectors is applied to a partly cut region of a photosensitive sheet film which is spread toward the detectors by a film bending roller. Part of the laser beam (LB) which is reflected from the partly cut region... Agent: Sughrue Mion, PLLC

20080030735 - Desktop thermal lens microscope apparatus: A desktop thermal lens microscope apparatus can detect a chemical reaction in a micro spatial region within a glass chip, or the like, more conveniently and at any given place. The desktop thermal lens microscope apparatus has small laser light sources such as semiconductor lasers as an excitation light source... Agent: Wenderoth, Lind & Ponack, L.L.P.

20080030736 - Optical sources for spr applications: The use of a high power and an incoherent light source to reduce noise associated when investigating unknown molecules in Surface Plasmon Resonance (SPR) systems. High power and incoherent light sources can improve resolution and accuracy of SPR system measurements.... Agent: Agilent Technologies Inc.

20080030738 - Analytical method and apparatus: A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially... Agent: Ge Healthcare Bio-sciences Corp. Patent Department

20080030737 - Multiple pass surface plasmon resonance detector: A fiber optic multiple-pass surface plasmon resonance technique provides an increase in the number of passes to any arbitrary number is described. Multiple reflections off a reflective sample surface are achieved in one embodiment using a fiber optic collimator, a reflector, and a second reflector, such as a corner cube... Agent: Schwegman, Lundberg & Woessner, P.A.

20080030739 - Optical time domain reflectometry: An optical time domain reflectometry apparatus for sensing a parameter in a region of interest is characterized in that the optical fiber includes a first section into which optical radiation at the probe wavelength is launched and a second section deployed in the region of interest. The first section has... Agent: Schlumberger Reservoir Completions

20080030740 - Optical measurements of properties in substances using propagation modes of light: This application describes designs, implementations, and techniques for controlling propagation mode or modes of light in a common optical path, which may include one or more waveguides, to sense a sample.... Agent: Fish & Richardson, PC

20080030741 - Optical sensor utilizing hollow-core photonic bandgap fiber with low phase thermal constant: An optical sensor includes a directional coupler comprising at least a first port, a second port, and a third port. The first port is in optical communication with the second port and with the third port such that a first optical signal received by the first port is split into... Agent: Knobbe Martens Olson & Bear LLP

20080030742 - Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase-shiftin point-diffraction interferometry: A test object including: an arrangement of optical elements defining a first partially reflecting surface and a second partially reflecting surface, at least one of the first and second partially reflecting surfaces being curved, wherein the first partially reflecting surface is arranged to receive a substantially collimated input beam and... Agent: Wilmerhale/boston

20080030743 - Measuring device having an optical probe tip: A measuring device (1) for measuring the shape, contour and/or roughness of a workpiece is based on a contact-less optical probe having a large numeric aperture. The probe has at least two different focal points with which at least two photo receptors are associated. The latter generate a differential signal... Agent: Venable LLP

20080030744 - Method and system for sensing 3d shapes of objects with specular and hybrid specular-diffuse surfaces: Surface normals and other 3D shape descriptors are determined for a specular or hybrid specular-diffuse object. A camera records an image of a smoothly spatially-varying pattern being reflected in the surface of the object, with the pattern placed at an initial position. The camera then records multiple images of the... Agent: Mitsubishi Electric Research Laboratories, Inc.

20080030745 - Quality-control method for laminated-foil packaging system: In a sealing machine a pair of juxtaposed foils are sealed together at web regions having oppositely directed outer surfaces between a pair of dies, at least one of which is formed with an array of bumps that taper outwardly toward a respective one of the outer surfaces. The bumps... Agent: K.f. Ross P.C.