Optics: measuring and testing inventions 01/08

20080024753 - Multi-range non-contact probe: A multi-range non-contact probe is provided which performs approximate range-finding measurement functions in addition to more precise structured light measurement functions. The probe is compatible with a probe control interface which allows advanced measuring capabilities and functions to be used with a probe head system that provides a limited number... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080024754 - Distance measurement instrument: A distance measurement device which has a lighting unit, including transmission optics with light beam forming optics. Illumination patterns are formed on objects in the measurement area which differ depending on the distances from the measurement device. A light receiving unit is arranged adjacent the lighting unit and generates an... Agent: Townsend And Townsend And Crew, LLP

20080024755 - Method for real-time calculation of receive focusing parameters for beamforming and apparatus thereof: A method and an apparatus for real-time calculation of receive focusing parameters for beamforming are provided. The apparatus is coupled to the signal input end of the receive beamforming module of an ultrasound imaging system as an independent accessory, including a first accumulator and a second accumulator for calculating a... Agent: Scully Scott Murphy & Presser, PC

20080024758 - Optical system for a particle analyzer and particle analyzer using same: A compact optical system for a particle analyzer and particle analyzer using same are provided. The optical system for a particle analyzer of the present invention comprises a light source, an irradiation optical system for irradiating particles passing through a flow cell with light from the light source, a photodetector... Agent: Brinks Hofer Gilson & Lione

20080024760 - Measuring device for ingredient detection: A measuring device has a sensor for registering at least one parameter selected from the group consisting of at least one ingredient, at least one property, and both, of a material being investigated by the sensor, the sensor including at least one illumination source which directs at least one light... Agent: Striker, Striker & Stenby

20080024761 - Method and apparatus for monitoring oil deterioration in real time: There is provided a method and apparatus for monitoring oil deterioration in real time. The method includes the steps of radiating light into an oil medium and measuring light intensities at red, green and blue wavelength ranges of the light after passing through a certain thickness of the oil. A... Agent: Jones Day

20080024765 - Appearance inspection apparatus: An appearance inspection apparatus including a sample stage 101 for supporting a sample 100, an illumination light source 103 for irradiating the sample 100 on the sample stage 101 with illumination light 111, a plurality of detectors 120a to 120d which are disposed at different positions from each other with... Agent: Crowell & Moring LLP Intellectual Property Group

20080024764 - Focus detection apparatus: A focus detection apparatus comprising a focus detection unit adapted to employ a photoelectric conversion element to detect a relative positional relationship between a pair of object images corresponding to a focus detection field; and wherein the focus detection unit are switchable between a first mode of operation in which... Agent: Cowan Liebowitz & Latman P.C. John J Torrente

20080024767 - Imaging optical coherence tomography with dynamic coherent focus: An imaging optical coherence tomography (OCT) apparatus with high transverse and high axial resolution comprises an interferometer of the Michelson, Mach-Zehnder or Kosters type. Light returning in the reference beam path (27) and the object beam path (26) interferes and is detected by an image sensor (28, 45) in the... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20080024756 - Quadrature processed lidar system: A method of generating in-quadrature signals is disclosed. The method comprises phase shifting a Doppler frequency-shifted signal; phase shifting a local oscillator signal; mixing the phase shifted Doppler frequency-shifted signal and the phase-shifted local oscillator signal generating thereby a signal which includes the phase-shifted Doppler frequency-shifted signal and a further... Agent: Clark & Brody

20080024757 - Stroboscopic led light source for blood processing apparatus: The invention relates to apparatus for controlling the processing of blood into blood components, particularly components for stroboscopic LED light sources for centrifuges. The stroboscopic apparatus comprises a first light source with reflective surfaces spaced around a central illumination axis, and light-emitting diodes spaced away from the axis radially outward... Agent: Gambro, Inc Patent Department

20080024759 - Sample analyzer and computer program product: A sample analyzer including a detection unit for irradiating a biological sample with light and obtaining optical information; a cell classification processor for classifying cells contained in the biological sample into cell groups based on the optical information; a scattered light information obtaining processor for obtaining scattered light information relating... Agent: Sughrue Mion, PLLC

20080024762 - Raman spectroscopy as integrated chemical metrology: A method for measuring the concentration of the metal solution and reducing agent solution within the electroless plating solution is disclosed. Raman spectroscopy is used to measure the concentration of each solution within the electroless plating solution after they have been mixed together. By measuring the concentration of each solution... Agent: Patterson & Sheridan, LLP

20080024766 - Apparatus and methods for detecting overlay errors using scatterometry: Disclosed is a method for determining an overlay error between at least two layers in a multiple layer sample. An imaging optical system is used to measure a plurality of measured optical signals from a plurality of periodic targets on the sample. The targets each have a first structure in... Agent: Beyer Weaver LLP - Kla Tencor

20080024768 - Method and apparatus for colour imaging a three-dimensional structure: A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the... Agent: Gary M. Nath The Nath Law Group

20080024763 - Optical interferometer and method: Disclosed are compact optical interferometer array, miniature optical interferometer array, and miniature optical interferometer. The interferometer arrays contain a spatial phase modulator array and a detector array. They are used for conducting multiple measurements. The miniature interferometer has only one component—a spatial phase modulator. Without passing through any focus lens,... Agent: Chian Chiu Li

20080024769 - Method, apparatus and system for minimally intrusive fiber identification: A method, apparatus and system for minimally intrusive fiber identification includes imparting a time-varying modulation onto an optical signal propagating in an optical fiber and subsequently detecting the presence of the time-varying modulation in the optical signal transmitting through the fiber to identify the fiber. In a specific embodiment of... Agent: Mr. S.h. Dworetsky At&t Corp.

20080024770 - Differential refractive index detector: Provided is a differential refractive index detector having a light receiving element, a zero glass, a zero glass driving unit and a storing portion, and is capable of performing purging operation thoroughly based on a unified standard. The light receiving element receives a measuring light passing through cells (S, R)... Agent: J C Patents, Inc.

20080024771 - Method for identifying articles and process for maintaining security: o

20080024772 - Particle removal tool with integrated defect detection/analysis capability: An integrated unit comprising a particle detection tool and a particle removal tool combined as one merged tool comprising a disc mounting mechanism having a mount for mounting the disc for both particle detection and particle removal, wherein the particle detection tool is adapted to distinguish between a fixed defect... Agent: Seagate Technology C/o Darby & Darby P.C.

20080024773 - Surface inspection apparatus and surface inspection method: A surface inspection apparatus comprises a radiation mechanism for radiating a light beam to the surface of an object having an edge of a non-flat surface (for example, a rounded edge) or an edge of an inclined surface, a scanning mechanism for moving the object relative to a radiation position... Agent: Mcdermott Will & Emery LLP

20080024774 - Optical measuring system: An optical measuring system includes a carrying tray for carrying a specimen, a first light source module, a second light source module and an optical measuring module. The first light source module is disposed at the first side of the carrying tray and the specimen is disposed on the optical... Agent: Jianq Chyun Intellectual Property Office

20080024775 - Fluid analysis apparatus: A fluid analysis apparatus includes a cell body having a chamber disposed therein for containing fluid during analysis thereof. The chamber is specifically configured to operably and statically secure a radiant energy guiding member solely through surface-to-surface interaction.... Agent: Mark J. Burns Haugen Law Firm Pllp

20080024776 - Controllable surface enhanced raman spectroscopy: An apparatus and related methods for facilitating surface-enhanced Raman spectroscopy (SERS) is described. The apparatus comprises a SERS-active structure near which a plurality of analyte molecules are disposed and an actuation device in actuable communication with the SERS-active structure to deform the SERS-active structure while the analyte molecules are disposed... Agent: Hewlett Packard Company

20080024777 - Method and apparatus for conducting raman spectroscopy: Disclosed herein are Raman probes that include: (a) a first optical fiber for receiving laser excitation light from a light source and transmitting the same; (b) a first filter for receiving light from the first optical fiber and adapted to pass the laser excitation light and to block spurious signals... Agent: Fish & Richardson PC

20080024778 - Different-kind-of-object detector employing plane spectrometer: A detector for detecting a different kind of object among objects being carried with high resolution using a plane spectrometer.... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080024779 - Method and apparatus for measuring the phase shift induced in a light signal by a sample: Apparatus for measuring a phase shift induced in a light signal has a first light source for emitting a light signal along a measurement optical path that includes a sample, for example a fluorescent sample, and a second light source for emitting a light signal along a dummy measurement optical... Agent: Nixon & Vanderhye, PC

20080024780 - Systems and methods for immersion metrology: Fluid immersion technology can be utilized to increase the resolution and angular range of existing metrology systems. An immersion fluid placed between the metrology optics and the sample can reduce the refraction at the sample interface, thereby decreasing the spot size of the beam on a feature of the sample... Agent: Stallman & Pollock LLP

20080024781 - Optical spot geometric parameter determination using calibration targets: A method, system and computer program product for determining a geometric parameter of an optical spot of a light beam are disclosed. A method comprises: providing a calibration target, the calibration target including a systematic variation in a parameter; measuring the calibration target with respect to the systematic variation using... Agent: International Business Machines Corporation Dept. 18g

20080024782 - Laser scanning microscope: Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to... Agent: Jacobson Holman PLLC

20080024783 - Method and device for carrying out surface plasmon resonance measurement: A method and a device for carrying out surface plasmon resonance measurement. A beam of electromagnetic radiation is produced by a source of electromagnetic radiation. The beam of electromagnetic radiation is directed through a prism onto a material layer in an angle of incidence, which material layer covers a planar... Agent: Buchanan, Ingersoll & Rooney PC

20080024784 - Plasmon router: A variety of structures, methods, systems, and configurations can support plasmons for routing.... Agent: Searete LLC Clarence T. Tegreene

20080024785 - High resolution interferometric optical frequency domain reflectometry (ofdr) beyond the laser coherence length: The technology described here enables the use of an inexpensive laser to measure an interferometric response of an optical device under test (DUT) at reflection lengths significantly greater than the coherence length of the laser. This is particularly beneficial in practical interferometric applications where cost is a concern. In other... Agent: Nixon & Vanderhye, PC

20080024786 - Fiber optic gyroscope having a silicon-based optical chip: According to one aspect of the present invention, a fiber optic gyroscope is provided. A substrate has a silicon layer formed over an insulating layer, a waveguide formed within the silicon layer having a main optical channel, first and second splitters coupled at opposing ends of the main optical channel,... Agent: Honeywell International Inc.

20080024787 - Balanced optical-radiofrequency phase detector: A balanced optical-RF phase detector for the extraction of low-jitter radiofrequency (RF) signals from optical pulse trains is demonstrated. The extraction of the low-jitter radiofrequency signals is based on the precise phase detection by use of a differentially biased Sagnac-loop interferometer and synchronous detection. The phase-error signal from this balanced... Agent: Modern Times Legal

20080024788 - Wavelength-tunable light generator and optical coherence tomography device: The present invention provides an OCT technique that permits tomographic observation of a biological body parts that is difficult to restrain and also provides a tomographic observation technique for the observation of a constrainable part that does not require constraint and remove the burden from biological body. A wavelength-tunable light... Agent: Volentine & Whitt PLLC

20080024789 - Fiber-optic miniature encoder for fine pitch scales: An ultra-miniature interferometric fiber-optic encoder readhead for sensing displacement of a very fine pitch scale grating is disclosed. The readhead includes a source grating that diffracts diverging source light into ±1st order beams, a pair of mirrors that reflect the ±1st order beams to converge toward the scale grating. The... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080024790 - Image rotation devices and their applications: An optical inspection device of a device-under-test is disclosed, said device comprising a light source, an image rotator, a parabolic reflector, and one or more detectors, wherein said light source provides a light beam traveling through said image rotator and reflecting off said parabolic reflector to a device-under-test and thereby... Agent: Emil Chang Law Offices Of Emil Chang

20080024791 - Optical measuring machine: An optical measuring device includes: a screen having a reference line; a movable stage; an optical system for forming on the screen an optical image of a to-be-measured object placed on the stage; and an edge detecting sensor (112) for detecting a passage of a measurement edge of the optical... Agent: Oliff & Berridge, PLC

20080024792 - Electromagnetic cloaking method: A method of constructing a concealing volume comprises constructing a plurality of concealing volume elements around a concealable volume. Each concealing volume element has a material parameter arranged to direct a propagating wave around the concealable volume.... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20080024793 - Non-contact probe control interface: A probe control interface is provided for a structured light non-contact coordinate measuring machine probe. Portions of a video control signal for controlling the grey level of selected rows of pixels of a spatial light modulator of the probe can be decoded into control signals for additional probe components or... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20080024795 - Three-dimensional shape measuring system, and three-dimensional shape measuring method: A three-dimensional shape measuring system includes: a light projecting/receiving apparatus which causes a light receiver to receive light reflected on a surface of a measurement object onto a light receiving surface thereof at a predetermined cycle multiple times, while changing a projecting direction of the light; and a measuring apparatus... Agent: Sidley Austin LLP

20080024794 - Semiconductor surface inspection apparatus and method of illumination: In a semiconductor surface inspection apparatus for inspecting the surface of a semiconductor device as a test object based on an optical image thereof, the present invention achieves illumination that enables diffracted light from the test object under dark-field illumination to be obtained efficiently from the entire area of the... Agent: Christie, Parker & Hale, LLP

20080024796 - Apparatus and method for sensing the position of a susceptor in semiconductor device manufacturing equipment: An apparatus for sensing the position of a susceptor in a semiconductor device manufacturing equipment comprises a susceptor which receives a wafer and high frequency power, a sensor unit which irradiates light to a lower face of the susceptor when the susceptor is in a lifted up state and which... Agent: Volentine & Whitt PLLC

20080024797 - Optical encoder and collimator lens: In an optical encoder which is designed to convert light generated from a light source into parallel light rays by using a collimator lens, thereby allowing the collimated light to radiate to gratings (a first grating, a second grating and a third grating), a diffusion means (a diffusion plate or... Agent: Oliff & Berridge, PLC

20080024798 - System and method for measuring thin film thickness variations and for compensating for the variations: A method for measuring thin film thickness variations of inspected wafer that includes an upper non-opaque thin film. The method including (i) scanning the wafer and obtain wafer image that includes that includes die images each of which composed of pixels, (ii) identifying regions in a first die image and... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20080018878 - Optical device and electronic device: An optical device according to an embodiment of the present invention is an optical device including a lens structure in which a lens portion is injection molded integrally with a skirt portion extending from the edge of the lens portion, and a housing that supports this lens structure. The skirt... Agent: Birch Stewart Kolasch & Birch

20080018879 - Beacon to measure distance, positioning system using the same, and method of measuring distance: A beacon to measure a distance based on a time difference between a transmitted light and a reflected light and to put the measured distance information into the lights, and a positioning system to detect a position of a moving body using the beacon, and a method thereof. Since a... Agent: Stanzione & Kim, LLP

20080018882 - Non-contact apparatus and method for measuring a property of a dielectric layer on a wafer: Non-contact apparatus and methods for evaluating at least one of the DC (or RF) dielectric constant, the hardness, and Young's Modulus of a dielectric material on a microelectronic workpiece under process and for generating a correlation factor that relates a measured IR spectrum to at least one of the dielectric... Agent: Silicon Valley Patent Group LLP

20080018880 - Surveying apparatus: A surveying apparatus is provided having a telescope, a digital camera, a display device, a measuring device, and a superimposing device. The telescope collimates the aiming point on a surveying object. The digital camera has an imaging optical system provided independently from the telescopic optical system of the telescope. The... Agent: Greenblum & Bernstein, P.L.C

20080018881 - Coherent detection scheme for fm chirped laser radar: An optical homodyne detection scheme for FM chirped lidar is described. The system performs de-chirping within a photodetector, and it does not require high-speed photo-detection or RF mixing. Embodiments are also described for dealing with phase noise.... Agent: Schwegman, Lundberg & Woessner, P.A.

20080018883 - Multiple beam inspection apparatus and method: Disclosed is an optical inspection system for inspecting the surface of a substrate. The optical inspection system includes a light source for emitting an incident light beam along an optical axis and a first set of optical elements arranged for separating the incident light beam into a plurality of light... Agent: Beyer Weaver LLP - Kla Tencor

20080018884 - Intrusion detection in optical fiber networks: A method for intrusion detection in an optical fiber communication network. The method includes at a first location on an optical fiber segment, receiving a set of multiple optical signals having wavelengths differing from each other, measuring received signal power for each of the received multiple optical signals, and repeating... Agent: Alcatel Lucent Intellectual Property & Standards

20080018885 - Method and apparatus for testing imager devices using a center turning optic: An optical test system includes a light source, a first turning optic, and a second turning optic. The second turning optic is positioned proximate the light source and is operable to direct light from the light source to the first turning optic. The first turning optic is further operable to... Agent: Williams, Morgan & Amerson

20080018886 - Optical article having a thermally responsive material as an anti-theft feature and a system and method for inhibiting theft of same: An optical article for being transformed from a pre-activated state of functionality to an activated state of functionality is provided. The optical article includes a thermally responsive optical-state change material, disposed in or proximate to the optical article and being responsive to an external stimulus. The optical-state change material alters... Agent: General Electric Company Global Research

20080018887 - Methods and systems for detecting pinholes in a film formed on a wafer or for monitoring a thermal process tool: Methods and systems for detecting pinholes in a film formed on a wafer or for monitoring a thermal process tool are provided. One method for detecting pinholes in a film formed on a wafer includes generating output responsive to light from the wafer using an inspection system. The output includes... Agent: Baker & Mckenzie LLP

20080018888 - Apparatus for capturing an image: An apparatus for capturing an image of a sample retained by a sample acquiring device, comprises an image capturing unit comprising a lens arrangement with a fixed focal plane, a sample holder comprising a first magnet unit, and a second magnet unit. The sample holder is adapted to receive the... Agent: Buchanan, Ingersoll & Rooney PC

20080018889 - Miniaturized system and method for measuring optical characteristics: A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second... Agent: Christie, Parker & Hale, LLP

20080018890 - Method and apparatus for improved signal to noise ratio in raman signal detection for mems based spectrometers: A method of Raman detection for a portable, integrated spectrometer instrument includes directing Raman scattered photons by a sample to an avalanche photodiode (APD), the APD configured to generate an output signal responsive to the intensity of the Raman scattered photons incident thereon. The output signal of the APD is... Agent: General Electric Company Global Research

20080018891 - Method of producing spatial fine structures: A method of producing spatial fine structures comprises the steps of: selecting a luminophore from the group of luminophores displaying two different states, one of the two states being an active state in which luminescence light is obtainable from the luminophore, the other of the two states being an inactive... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080018892 - Apparatus and method for inspecting a stream of matter by light scattering inside the matter: A system (10) for automatically inspecting a stream of matter (12) for varying composition, comprising an emitting device (16) serving to emit a detection medium, which comprises electromagnetic radiation of a substantially constant intensity, to an irradiated zone (I) of the stream at which the medium penetrates a surface of... Agent: Calfee Halter & Griswold, LLP

20080018893 - Instrument using near-field intensity correlation measurements for characterizing scattering of light by suspensions: Imaging systems may include a light source that directs light towards a scattering medium. A digital imaging system receives transmitted light that is transmitted through the scattering medium substantially without being scattered, and also receives multiple components of scattered light that are passed through the scattering medium after being scattered.... Agent: Naval Surface Warfare Center Dahlgren Division Office Of Counsel, Code Xdc1

20080018894 - Optical ball lens light scattering apparatus and method for use thereof: The inventive optical spherical lens light scattering apparatus and method for use thereof comprises an incident light source, a spherical or ball optical lens system and a photo detector. The spherical or ball lens optical system comprises at least one ball or spherical lens being in contact with a specimen... Agent: Panagiota Betty Tufariello, Esq. Intellectulaw

20080018895 - Detector configurations for optical metrology: An apparatus is disclosed for obtaining ellipsometric measurements from a sample. A probe beam is focused onto the sample to create a spread of angles of incidence. The beam is passed through a quarter waveplate retarder and a polarizer. The reflected beam is measured by a detector. In one preferred... Agent: Stallman & Pollock LLP

20080018896 - Optical fibre ah ment apparatus and method: A method of coupling a first optical beam into the first end of an optical fibre is described that comprises the steps of (i) coupling light into the second end of the optical fibre such that an optical reference beam is output from the first end of the optical fibre... Agent: Nixon & Vanderhye, PC

20080018897 - Methods and apparatuses for assessing overlay error on workpieces: Methods and apparatuses for evaluating overlay error on workpieces are disclosed herein. In one embodiment, a method includes generating a beam having a wavelength, and irradiating a first alignment structure on a first layer of a workpiece and a second alignment structure on a second layer of the workpiece by... Agent: Perkins Coie LLP Patent-sea

20080018898 - Minimizing effects of dye crosstalk: Methods and systems for processing signals to minimize the effects of dye crosstalk. Deconvolution of multiplexed dye signals can include corrections for residual error determined from experimental measurements. Residual error corrections can account for reaction or assay specific factors and modify the subsequent filtering of signals. Correction values can be... Agent: Mila Kasan, Patent Dept. Applied Biosystems

20080018899 - Method and apparatus for 3-d imaging of internal light sources: The present invention provides systems and methods for obtaining a three-dimensional (3D) representation of one or more light sources inside a sample, such as a mammal. Mammalian tissue is a turbid medium, meaning that photons are both absorbed and scattered as they propagate through tissue. In the case where scattering... Agent: Beyer Weaver LLP

20080018900 - Non-destructive derivation of weight of single seed or several seeds: A method and apparatus for optically interrogating a particle comprising obtaining a plurality of optical interrogations from a plurality of orientations relative the particle. In one aspect, the particle is tumbled relative to optical interrogation direction and reflected or transmitted energy is collected and weight of one or several seeds... Agent: Mckee, Voorhees & Sease, P.L.C Attn: Pioneer Hi-bred

20080018901 - Compensation of systematic effects in low coherence interferometry: In general, in one aspect, the invention features a method that includes transforming interferometry data acquired for a test sample using a low coherence imaging interferometry system to a frequency domain and, at a plurality of frequencies in the frequency domain, reducing contributions to the transformed interferometry data due to... Agent: Fish & Richardson PC

20080018902 - Embedded interferometric fiber optic gyroscope systems and methods: In accordance with at least one embodiment of the present invention, a system includes a gyroscope and a flight vehicle operatively connected to the gyroscope. The gyroscope includes a length of fiber optic cable arranged in loop and configured to surround an interior loop region. The gyroscope further includes a... Agent: Macpherson Kwok Chen & Heid, LLP

20080018903 - Distributed brillouin sensor system based on dfb lasers using offset locking: A distributed Brillouin sensor system is provided. The system has two distributed feedback (DFB) lasers, which are locked at the Brillouin frequency of the optical fiber through offset locking method by coupler splitting into two parts. The split parts are sent to two photodiodes, the outputs of which are sent... Agent: Jones, Tullar & Cooper, P.C.

20080018904 - Method and apparatus for suppression of crosstalk and noise in time-division multiplexed interferometric sensor systems: Unwanted signal components in time-division multiplexed (TDM) systems may lead to crosstalk and noise if these pulses overlap with signal pulses from an interrogated sensor. The crosstalk and noise are dominated by interference between the signal pulses from the interrogated sensor and the unwanted signal components and can be greatly... Agent: Patterson & Sheridan, L.L.P.

20080018905 - Method and apparatus for suppression of crosstalk and noise in time-division multiplexed interferometric sensor systems: Unwanted signal components in time-division multiplexed (TDM) systems may lead to crosstalk and noise if these pulses overlap with signal pulses from an interrogated sensor. The crosstalk and noise are dominated by interference between the signal pulses from the interrogated sensor and the unwanted signal components and can be greatly... Agent: Patterson & Sheridan, L.L.P.

20080018906 - Method and an apparatus for shape measurement, and a frequency comb light generator: This apparatus for shape measurement comprises a frequency COMB light generator and an optical interferometer for measuring the distance. The frequency COMB light generator includes a laser light source 11, an optical resonator 13, a COMB pitch regulator 14 and an output port OUT. The optical resonator 13 includes an... Agent: Kanesaka Berner And Partners LLP

20080018907 - Optical apparatus and method for distance measuring: An optical sensor for determining a distance between a target and a probe head is described. The optical sensor comprises a light source delivering a broadband spectrum; a fiber-optic Michelson interferometer (FOMI) for creating an interferogram; and an analyzer unit for receiving the interferogram from an output of the FOMI... Agent: Ogilvy Renault LLP

20080018908 - Optical system: The present invention relates to an disturbance sensing system, in particular an optical system in which a disturbance can be inferred. The system includes: a first waveguide portion and a second waveguide portion disposed in a side to side arrangement relative to one another; launch means for launching a first... Agent: Nixon & Vanderhye, PC

20080018909 - Droplet shape measuring method and apparatus: In order to accurately measure a shape feature of a minute droplet arranged on a substrate by a simple method, with respect to the droplet, the substrate is perpendicularly irradiated with laser light to cause diffracted light fluxes generated during passage of the laser light through the droplet to interfere... Agent: Fitzpatrick Cella Harper & Scinto

20080018910 - System and method of measuring and mapping three dimensional structures: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor... Agent: Volentine & Whitt PLLC

20080018911 - Reflective sensor: A reflective sensor is disclosed which prevents divergent light from a light source from being totally reflected by an interface between the package and the outside thereof and entering a light-receiving element without using a light-shield means and which allows an improved S/N ratio and reduced variations in performance. The... Agent: Fitzpatrick Cella Harper & Scinto

20080018912 - Position finding system for locating the position of a tool: The invention provides a position finding system and a method for locating the position of a tool, in particular a hand-held screwdriver, wherein free-field position finding is performed for determining the absolute position of the tool and wherein relative position finding is performed for determining the relative position of the... Agent: St. Onge Steward Johnston & Reens, LLC

20080018913 - Lead edge sheet curl sensor: A media sheet substrate with either positive or negative curl on the lead edge of the sheet substrate interrupts light beams from first and second light emitters, as detected at first and second light detectors. The time delay between the light beam interruptions is proportional to the sheet substrate curl,... Agent: Ortiz & Lopez, PLLC

20080013070 - Method and instrument for measuring complex dielectric constant of a sample by optical spectral measurement: At this time, the light in a transmission spectrum is intensified to cause a fringe peak to appear, whereas the light in a reflection spectrum is weakened to provide a fringe valley. At around the wavelength (frequency), as the incident angle is increased, the transmittance nears... Agent: Morgan Lewis & Bockius LLP

20080013076 - Surface inspection method and surface inspection apparatus: A surface of an object to be inspected is illuminated with two illumination beams having an identical wavelength, an identical elevation angle, an identical azimuth, and an identical polarization characteristic but different in intensity by 100:1. Even if an intensity of a scattered light resulting from a contaminant particle/defect present... Agent: Crowell & Moring LLP Intellectual Property Group

20080013079 - Equivalent time sampling system: An equivalent time sampling system employs two clock frequency sources, phase locked, wherein an analog to digital converter sampling clock is derived from one source and a pulse generator clock is derived from the other. Choice of the clock frequencies determines minimum time step and the set of available time... Agent: Patenttm.us

20080013069 - Synchronization of strobed illumination with line scanning of camera: In one embodiment, an apparatus comprises a line scanning camera, a conveyor, an illumination source, and one or more controllers. The conveyor is configured and arranged to move objects past the line scanning camera so that the objects can be imaged thereby. The illumination source is configured and arranged to... Agent: Lockheed Martin Corporation C/o Wolf, Greenfield & Sacks, P.C.

20080013071 - Measuring equipment: A measuring equipment utilizing terahertz pulse light, includes: a terahertz light generator that generates terahertz pulse light; a terahertz light detector that detects terahertz pulse light; a first condensing optical system that condenses the terahertz pulse light generated by the terahertz light generator; and a second condensing optical system that... Agent: Oliff & Berridge, PLC

20080013072 - Pattern inspection apparatus: A pattern inspection apparatus is disclosed, which includes a first laser light source for emission of first laser light having a first wavelength, a second laser light source for emission of second laser light having a second wavelength, and a deep ultraviolet (DUV) light source for emission of DUV light... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080013074 - Apparatus and method for determining surface properties: The invention relates to an apparatus (1) for determining surface properties, comprising at least a first radiation device (3) which emits radiation onto a surface (8) to be analysed, at least a first radiation detector device (5) which receives at least part of the radiation emitted by the at least... Agent: Hayes Soloway P.C.

20080013075 - Determining surface properties with angle offset correction: The invention relates to an apparatus (1) for determining surface properties, comprising at least a first radiation device (3) which emits radiation onto a surface (8) to be analysed, at least a first radiation detector device (5) which receives at least part of the radiation emitted by the at least... Agent: Hayes Soloway P.C.

20080013077 - Handheld colour measurement device: A handheld colour measurement device includes a housing in which an optoelectronic measurement unit is located which receives measurement light originating from a measurement object, converts it into corresponding electrical measurement signals and processes these measurement signals into preferably digital measurement data characterizing the colour of the measurement object. It... Agent: Mccarter & English, LLP Attn.: Basam E. Nabulsi

20080013073 - Measurement method, measurement apparatus, exposure method, and exposure apparatus: To perform high-speed and highly accurate measurement by setting desired measuring conditions for each measuring object. In an alignment sensor of exposure apparatus, in the case of performing position measurement for a plurality of sample shots, measurement is performed by changing the measuring conditions, in response to a measuring axis... Agent: Staas & Halsey

20080013078 - Optical mapping apparatus with optimized oct configuration: OCT apparatus includes an interferometer, having an input beam splitter and a 50/50 output splitter. The splitting ratio of the input splitter may be optimized depending on the source power of light source and on the mismatch of the balanced receiver. The input splitter is a plate beam-splitter to minimize... Agent: Laubscher & Laubscher, P.C.

20080013080 - Target visualization system: A platform such as a car has a processor receiving information representing the location of the platform and a location of a target. An emitter assembly controlled by the processor produces a visual display outside of and beyond the platform that an occupant of the platform can see. The display... Agent: Rogitz & Associates

20080013081 - Set of sensors determining alignment angles, angle measurement system and process of vehicle wheels alignment: The present invention refers to a set of sensors and systems for determining alignment angles between plans, more particularly angles of a vehicle wheels alignment that in a fast and secure way, is able to offer an operator an accurate diagnosis of wheels alignment. More particularly, the present invention refers... Agent: Stites & Harbison PLLC

20080013082 - Inflatable spherical integrating source for spaceflight applications: A method for calibrating a sensor in a vehicle, such as a space capsule or other space borne apparatus, uses an expandable integrating sphere. A sensor in the vehicle measures the energy from an electromagnetic energy source within the integrating sphere through a calibration window. The expandable fluid impermeable integrating... Agent: Raytheon Company Patent Docket Administration

20080013083 - Methods and systems for determining a characteristic of a wafer: Methods and systems for determining a characteristic of a wafer are provided. One method includes generating output responsive to light from the wafer using an inspection system. The output includes first output corresponding to defects on the wafer and second output that does not correspond to the defects. The method... Agent: Baker & Mckenzie LLP

20080013084 - Surface inspection method and surface inspection apparatus: In order to realize a surface inspection apparatus capable of inspecting a contaminant particle and a defect with a uniform sensitivity without depending on a rotation angle in a primary scan direction even in the case where intensity of scattered light, which is generated derived from the contaminant particle and... Agent: Crowell & Moring LLP Intellectual Property Group

20080013085 - Self-calibrating optical reflectance probe system: A self-calibrating optical reflectance probe system having an illuminant light source to illuminate a sample material, optical pickup means to collect reflected light from the sample material, and an articulated white reference reflection standard for illuminant reference to provide a system capable of accurately measuring optical reflectance and automated verification... Agent: Hartman & Hartman, P.C.

20080013086 - Confocal spectrometer with astigmatic aperturing: A confocal spectrometer provides astigmatic optics which supply a monochromator or spectrograph with the image of a sample, with the astigmatic optics thereby providing separate first and second (tangential and sagittal) focal planes for the image. The monochromator/spectrograph has an entrance slit oriented along one of the focal planes, and... Agent: Thermo Finnigan LLC

20080013087 - Alignment form: A chassis having an alignment form is disclosed. The alignment form has dimples that permit a carrier to be aligned with the chassis sidewall. When a component is inserted in the computer system, the component contacts the dimples and aligns in the chassis sidewall.... Agent: Roger Fulghum Baker Botts L.L.P.

20080013088 - Device and method for representing the direction of action of a working means: A device for representing the direction of action (9) of a working means (3), in particular a tool or a radiation source and/or a radiation emitter, for example, of X-rays is provided. The device includes a first light source (4) which is used to produce a first beam (5). In... Agent: Davidson, Davidson & Kappel, LLC

20080013090 - Measurement method, measurement unit, processing unit, pattern forming method , and device manufacturing method: A coherence factor σ of an alignment system is set to 1 or more, and positional information of a mark is detected from a photodetection signal that corresponds to the mark intensity image of the mark due to a zero order light and light of an odd order diffraction from... Agent: Oliff & Berridge, PLC

20080013091 - Position detecting method and apparatus: A position detecting method includes the steps of forming an image of a mark on a sensor, performing a first process that processes a raw signal obtained from the sensor with plural parameters, performing a second process that determines an edge of a signal processed by the first process for... Agent: Morgan & Finnegan, L.L.P.

20080013089 - Positioning method, processing system, measurement method of substrate loading repeatability, position measurement method, exposure method, substrate processing apparatus, measurement method, and measurement apparatus: An edge of a surface to be measured of wafer and each of search alignment marks on the wafer are detected by an inline measurement instrument or the like that operates independently of an exposure apparatus, and position coordinates of the search marks in an X′Y′ coordinate system, which is... Agent: Oliff & Berridge, PLC

20080013092 - Fluorescence detector, filter device and related methods: Microfluidic assay detectors and microfluidic assay detection methods are disclosed. A microfluidic chip is coupled to a light emitting device, emission filters and excitation filters. Excited fluorescent light is detected by a camera and a lens. The correspondent reading allows parallel detection of features such as antigens and biomarkers. A... Agent: Enrica Bruno Patent Law

20080013093 - Methods, systems and computer program products for removing undesired artifacts in fourier domain optical coherence tomography (fdoct) systems using continuous phase modulation and related phase modulators: Methods, fourier domain optical coherence tomography (FDOCT) interferometers and computer program products are provided for removing undesired artifacts in FDOCT systems using continuous phase modulation. A variable phase delay is introduced between a reference arm and a sample arm of an FDOCT interferometer using continuous phase modulation. Two or more... Agent: Myers Bigel Sibley & Sajovec

20080013094 - Semiconductor substrate for interferometer fiber optic gyroscopes: A method for forming an interferometer is disclosed. The method involves forming a ring interferometer and a fiber optic gyroscope on a single semiconductor substrate.... Agent: Honeywell International Inc.

20080013095 - Fiber optic interferometric position sensor and measurement method thereof: A fiber optic interferometric position sensor and measurement method thereof suitable for determining the moving direction of a measurement object in an environment of high electric or magnetic field strengths are disclosed. The fiber optic interferometric position sensor comprises at least one light source, a plurality of fiber optic couplers,... Agent: Bacon & Thomas, PLLC

20080013096 - Method for measuring the brillouin shift distribution along an optical fiber based on the optical demodulation of the signals, and relevant apparatus: f

20080013097 - Resonant scanning mirror: A system and method allow for a more effective synchronous scanning mirror (SSM). A lithography apparatus comprises an illumination system, a patterning device, a substrate table, and a projection system. The illumination system conditions a beam of radiation received from a radiation source operating at a first frequency. The patterning... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20080013098 - Displacement interferometer system and exposer using the same: There are provided a displacement interferometer system which increases or maximizes productivity, and an exposer using the same. The displacement interferometer system comprises: a light source for generating a laser beam of a predetermined wavelength; an incidence unit for allowing the laser beam, which is generated in the light source... Agent: Mills & Onello LLP

20080013099 - Exposure apparatus: In an exposure apparatus having a plurality of substrate stages moving between a plurality of stations, errors due to the combination of the stage and a position measuring unit, such as Abbe error and errors due to the surface configuration of a reflection mirror, are precisely corrected to reduce the... Agent: Canon U.s.a. Inc. Intellectual Property Division

20080013101 - Repairing method for dark areas on a surface profile and a surface profile measuring method: A repairing method for a surface profile is provided. The intensity on the waveform of the interference diagrams or the existence of envelope on the waveform of the interference diagram are used to decide whether the respected pixel is located in a dark area on the surface profile or not.... Agent: Bruce H. Troxell

20080013100 - Surface profile measuring method and an apparatus thereof: A surface profile measuring method using a broad bandwidth light source illuminating a sample surface and a reference surface through a splitter is provided. By changing a distance between the sample surface and the reference surface with a constant step, an interference diagram with a waveform composed of interference data... Agent: Bruce H. Troxell

20080013102 - Micro-electromechanical sensor device: A sensor device (100) comprises a holding body (10), at least one deflectable sensor element (20) fixed to the holding body (10), and a sensor array (30) with a plurality of sensitive layers (31) arranged on a surface (21) of the at least one sensor element (20), wherein each of... Agent: Ip Group Of Dla Piper US LLP

20080013103 - Displacement sensor: An image taken by an imaging device is displayed on a display unit. When a confirmation instruction is inputted through an input unit, image teaching is performed while the image displayed on the display unit is set to a setting object image. A measurement item which is of a candidate... Agent: Foley And Lardner LLP Suite 500

20080013104 - Pick and place machine with improved component placement inspection: Embodiments of the present invention improve upon component level inspection performed by pick and place machines. Such improvements include using a position sensitive device that measures the position of the placement head relative to the workpiece as the placement head travels towards and away from the workpiece during a placement... Agent: Westman Champlin & Kelly, P.A.

20080013105 - Scale reading apparatus: Apparatus for measuring displacement between two members. A scale is provided on one member and has an incremental pattern with at least one reference mark embedded in it. A read head is provided on the other member and comprises a periodic diffraction means for interacting with a light pattern modulated... Agent: Oliff & Berridge, PLC

20080013106 - Optical position transducer systems and methods employing reflected illumination for limited rotation motor systems: A position transducer system is disclosed for a limited rotation motor that includes an illumination source that directs illumination toward an illumination reflector that rotates with a rotor of the limited rotation motor, and a plurality of detector areas adjacent the illumination source for receiving modulated reflected illumination from the... Agent: Gauthier & Connors, LLP

20080013107 - Generating a profile model to characterize a structure to be examined using optical metrology: In generating a profile model to characterize a structure to be examined using optical metrology, a view canvas is displayed, with the profile model being generated displayed in the view canvas. A profile shape palette is displayed adjacent to the view canvas. A plurality of different profile shape primitives is... Agent: Morrison & Foerster LLP

20080013108 - Parallel profile determination in optical metrology: In processing requests for wafer structure profile determination from optical metrology measurements, a plurality of measured diffraction signal of a plurality of structures formed on one or more wafers is obtained. The plurality of measured diffraction signals is distributed to a plurality of instances of a profile search module. The... Agent: Morrison & Foerster LLP

20080007707 - Laser radar for vehicle using reflector and method for controlling the same: The present invention is related to a laser radar for a vehicle using a cylindrical reflector and a method for controlling the same, and more particularly, to a laser radar for a vehicle that comprises a reflector comprising a plurality of reflection mirrors preferably with reflection accuracy of 0.5° unit.... Agent: Edwards Angell Palmer & Dodge LLP

20080007709 - Method and system for fast calibration of three-dimensional (3d) sensors: Rapid calibration of a TOF system uses a stationary target object and electrically introduces phase shift into the TOF system to emulate target object relocation. Relatively few parameters suffice to model a parameterized mathematical representation of the transfer function between measured phase and Z distance. The phase-vs-distance model is directly... Agent: Canesta, Inc.

20080007716 - Raman scattering light observation apparatus and endoscope apparatus: A Raman scattering observation apparatus is provided with a light source device for radiating incoherent first and second band-pass light each with the first and the second wavelengths as center wavelengths respectively, and a filter unit set to selectively extract a Raman scattering light component as a third wavelength, which... Agent: Scully Scott Murphy & Presser, PC

20080007715 - Seismic exploration: An instrument for studying an object (12) comprising a movable interferometer having a laser source and a plurality of detectors (24) arranged in an array. The laser source is expanded and arranged to direct a converging object beam (21) towards a point (22) or line beyond the object (12) whereby... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20080007717 - Noise reduction of laser ultrasound detection system: A method of detecting a property of an object comprising directing a detection laser beam to the object to produce a scattered laser beam modulated corresponding to a motion of said object; receiving the scattered laser beam with an optical interferometer to produce an interferometric transmission signal and an interferometric... Agent: Day Pitney LLP

20080007708 - Method of detecting suspended filamentary objects by telemetry: A method of detecting the presence of a suspended filamentary object in view of a telemeter on an aircraft includes: i) calculating terrestrial coordinates of points corresponding to telemeter echoes, and selecting candidates; ii) searching a horizontal plane for straight line segments close to vertical projections of candidate points; and... Agent: Young & Thompson

20080007710 - Door sensor system for detecting a target object: A door sensor system (90) for detecting a target object (56) in and/or near a door comprising a door opening (96), and at least one movable door element (76, 76-1, 76-2, 76-3, 76-4), the system comprising at least one light scanner device (10) which is capable of measuring optically the... Agent: Woodling, Krost And Rust

20080007711 - Range finder: The present invention is generally directed to a range finder for measuring short and long distances via a simple, compact and stable structure without increasing the cost and the size of the device. The range finder according to the present invention comprises a light source for generating a measuring beam,... Agent: Mcdermott Will & Emery LLP

20080007712 - Trace delay error compensation: A method of trace delay error compensation for measurements that are taken remotely from the signal source or receiver of a circuit uses data available from a computer aided design (CAD) tool to characterize electrical connections to an instrument measurement point, such as a connectorless probe, which is remote from... Agent: Thomas F. Lenihan Tektronix, Inc.

20080007713 - Optical input device and method of measuring relative movement of an object and an optical input device: An optical input device for measuring the movement of an object (15), e.g. a finger, is accommodated in a housing provided with a transparent window (12) for transmitting a measurement beam (13) from a diode laser (3) to the object (15) and radiation reflected by the object (15) to a... Agent: Philips Intellectual Property & Standards

20080007714 - Personal identification system: A personal identification system, which uses a vein pattern of a finger, optimizes the amount of light of a light source based on a captured finger image and emphasizes the vein pattern during image processing for identification.... Agent: Stanley P. Fisher Reed Smith Hazel & Thomas LLP

20080007719 - Method for increasing accuracy of measurement of mean polarization mode dispersion: The present invention provides a method for increasing the accuracy of measurement of mean differential group delay (DGD) from the polarization mode dispersion (PMD) in optical fiber. The method includes a systematic correction to mean-square DGD measured with any conventional mean to minimize systematic error caused by finite source bandwidth.... Agent: At&t Corp.

20080007718 - Polarization diversity detection without a polarizing beam splitter: A fiber optic measurement device including an optical frequency domain reflectometer (10) performs polarization diversity detection without using a polarizing beam splitter.... Agent: Nixon & Vanderhye, PC

20080007721 - Analysis disc with analysis object: An analysis apparatus capable of normally creating image data and an analysis disc used for this. Instead of using a signal which has been read in time series by pickup following a track so as to create an image by utilizing address information engraved on an optical disc, a mark... Agent: Steptoe & Johnson LLP

20080007720 - Generalized multi-sensor planning and systems: A method is disclosed for the analysis of scenarios where there are dynamically occurring objects capable of occluding each others. Application of the method in vision systems is also disclosed. Methods for incorporating visibility constraints for occluding scenarios are provided in a multi-camera setting. Other static constraints such as image... Agent: Siemens Corporation Intellectual Property Department

20080007722 - Vehicle wheel alignment system scanned beam imaging sensor: A vehicle wheel alignment sensor for a machine-vision vehicle wheel alignment system comprising a scanned beam camera incorporating an illumination source, a means for deflecting light emitted by the illumination source along a path within a field of view, and a detector array for receiving illumination reflected from objects within... Agent: Polster, Lieder, Woodruff & Lucchesi

20080007723 - Surveying apparatus: The surveying apparatus of the present invention includes a horizontal rotation mechanism for rotating in a horizontal direction a base stand that constitutes a part of a body of the surveying apparatus, a vertical rotational mechanism for tilting a telescope provided with the base stand in a horizontal direction, and... Agent: Knobbe Martens Olson & Bear LLP

20080007724 - Rail vehicle mounted rail measurement system: A rail measurement system (10) for mounting on a rail vehicle (e.g., 12) for travel over a railway (16) having two spaced apart rails (18, 19) includes a first collimated light source (20) mounted on the rail vehicle for providing a first reference marker (22) relative to a first rail... Agent: Beusse Wolter Sanks Mora & Maire, P.A.

20080007725 - Method for detecting particles and defects and inspection equipment thereof: A method and equipment which includes an illustrated-spot illumination-distribution data table for storing an illumination distribution within an illustrated spot and which calculates a coordinate position for a particle or a defect and the diameter of the particle on the basis of detection light intensity data about the particle or... Agent: Mcdermott Will & Emery LLP

20080007726 - High throughput darkfield/brightfield wafer inspection system using advanced optical techniques: The broadband brightfield/darkfield wafer inspection system provided receives broadband brightfield illumination information via a defect detector, which signals for initiation of darkfield illumination. The defect detector forms a two dimensional histogram of the defect data and a dual mode defect decision algorithm and post processor assess defects. Darkfield radiation is... Agent: Smyrski Law Group, A Professional Corporation

20080007727 - Surface inspection method and surface inspection apparatus: When measuring an edge region, a photo detector with an angle not influenced by the diffracted light, the diffracted light causing noise, is selected to thereby allow for inspection that minimizes the sensitivity reduction. This allows for the management of foreign matters in the outer peripheral portion, which conventionally could... Agent: Mcdermott Will & Emery LLP

20080007728 - Air sampler module for enhancing the detection capabilities of a chemical detection device or system: An air sampler module is provided for use with a detection device that monitors liquids and/or solids on a surface using spectroscopy techniques. The air sampler module comprises a housing, an intake port for collecting air containing airborne threats to be analyzed by the detection device, and a port to... Agent: Edell, Shapiro & Finnan, LLC

20080007729 - Method and apparatus for radiation encoding and analysis: Method and apparatus for analyzing radiation using analyzers and employing the spatial modulation of radiation dispersed by wavelength or along a line.... Agent: Fenwick & West LLP

20080007730 - Microscope with higher resolution and method for increasing same: Microscope with higher resolution with partial spatial superposition in the illumination by an excitation beam and a de-excitation beam and/or a switching beam in a fluorescing sample, whereby the light from the sample is deflected, whereby, in the excitation beam and/or in the de-excitation and/or the switching beam, at least... Agent: Law Offices Jacobson Holman

20080007731 - Imaging device: An imaging device using an array of active pixels, with a readout control for outputting from selected regions of interest is disclosed. When used to detect the positions of optically trapped objects, the fast readout rate enables fine control of the optical traps to stabilize the objects. Multiple objects can... Agent: Birch Stewart Kolasch & Birch

20080007732 - Optical fiber sensors using grating-assisted surface plasmon-coupled emission (gaspce): The present invention relates to a new fluorescence detection platform based on the integration of grating-assisted surface plasmon coupled emission (GASPCE). This innovation builds upon the traditional SPCE technique by adding a grating to the metal surface which thereby provides additional emission confinement. The original conical emission pattern associated with... Agent: Dunlap Codding & Rogers, P.C.

20080007733 - Volumetric endoscopic coherence microscopy using a coherent fiber bundle: Methods for employing coherent bundles of optical fibers, whether single- or multi-mode, for optical coherence tomography or optical coherence microscopy. Either a substantially monochromatic source or a broadband source is spatially decohered and/or spatially filtered prior to coupling into the fiber bundle for illumination of a sample. A scatter signal... Agent: Bromberg & Sunstein LLP

20080007734 - System and method for providing jones matrix-based analysis to determine non-depolarizing polarization parameters using polarization-sensitive optical coherence tomography: Arrangement, system and method for a polarization effect for a interferometric signal received from sample in an optical coherence tomography (“OCT”) system are provided. In particular, an interferometric information associated with the sample and a reference can be received. The interferometric information is then processed thereby reducing a polarization effect... Agent: Dorsey & Whitney LLP Intellectual Property Department

20080007735 - Method of microscopically examining a spatial finestructure: A method of microscopically examining a spatial fine structure comprises the steps of selecting a luminophore from the group of luminophores which have two physical states, the two states differing from each other with regard to the luminescence properties displayed by the luminophore, and which are reversibly, but essentially completely... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080007736 - Apparatus for the three-dimensional scanning of objects: The invention relates to an apparatus for three-dimensional scanning of objects that are moved past a stationary optical scanner, the apparatus including a six-legged object-carrier configured as a hexapod and serving to record the object to be scanned. In order to create an apparatus that not only is economical in... Agent: St. Onge Steward Johnston & Reens, LLC

20080007737 - Wafer laser processing method: A wafer laser processing method for forming a deteriorated layer along streets in the inside of a wafer having streets formed in a lattice pattern on the front surface, the method comprising: a wafer holding step for suction-holding the wafer on the chuck table in such a manner that the... Agent: Smith, Gambrell & Russell

20080007738 - Evaluating a profile model to characterize a structure to be examined using optical metrology: A profile model to characterize a structure to be examined using optical metrology is evaluated by displaying a set of profile parameters that characterizes the profile model. Each profile parameter has a range of values for the profile parameter. For each profile parameter having a range of values, an adjustment... Agent: Morrison & Foerster LLP

20080007740 - Optimizing selected variables of an optical metrology model: To examine a patterned structure formed on a semiconductor wafer using an optical metrology model, an optical metrology model is created for the patterned structure. The optical metrology model has profile parameters, material refraction parameters, and metrology device parameters. Ranges of values for the profile parameters, material refraction parameters, and... Agent: Morrison & Foerster LLP

20080007739 - Optimizing selected variables of an optical metrology system: A system for examining a patterned structure formed on a semiconductor wafer using an optical metrology model includes a first fabrication cluster, a metrology cluster, an optical metrology model optimizer, and a real time profile estimator. The first fabrication cluster configured to process a wafer, the wafer having a first... Agent: Morrison & Foerster LLP