Optics: measuring and testing inventions 08/07

20070201015 - System and method for transitioning from a missile warning system to a fine tracking system in a directional infrared countermeasures system: A method for transitioning a target from a missile warning system to a fine tracking system in a directional countermeasures system includes capturing at least one image within a field of view of the missile warning system. The method further includes identifying a threat from the captured image or images... Agent: Bae Systems Information And Electronic Systems Integration Inc.

20070201016 - Method and apparatus for seasoning semiconductor apparatus of sensing plasma equipment: A plasma equipment seasoning method. The seasoning method comprising the steps of measuring the ratio of optical emission intensity of silicon oxide (SiOx)-based chemical species to optical emission intensity of carbon fluoride compound (CFy)-based chemical species present in a process chamber of plasma equipment before operating the plasma equipment to... Agent: Christie, Parker & Hale, LLP

20070201019 - Foreign matter inspection method and foreign matter inspection apparatus: In a foreign matter inspection apparatus comprising: irradiating unit for irradiating inspection light to an inspection area of an article to be inspected; intensity detecting unit for detecting intensity of either reflected light or scattered light, which is generated from the inspection area by irradiating thereto the inspection light; position... Agent: Mcdermott Will & Emery LLP

20070201018 - Circuit-pattern inspecting apparatus and method: A circuit pattern inspection apparatus and inspection method facilitate the creation of a recipe and the confirmation of a defect. The apparatus and method employ a dialogue-based operation for the creation of a recipe and the confirmation of a defect. Input items (such as contrast, calibration, etc.) for the recipe... Agent: Mcdermott Will & Emery LLP

20070201020 - Fiber optic darkfield ring light: A fiber optic darkfield ring light with many angled fiber optic light lines with direct illumination in a very small package. The fiber optic darkfield ring light includes a base with multiple light heads and multiple light covers attached thereto, a main cover, an optional cord grip, and an optional... Agent: Dicke Billig & Czaja, PLLC Attn: Christopher Mclaughlin

20070201017 - High resolution monitoring of cd variations: An optical metrology method is disclosed for evaluating the uniformity of characteristics within a semiconductor region having repeating features such a memory die. The method includes obtaining measurements with a probe laser beam having a spot size on the order of micron. These measurements are compared to calibration information obtained... Agent: Stallman & Pollock LLP

20070201021 - Modular cuvettes and methods for use thereof: An apparatus for holding liquid samples.... Agent: Agilent Technologies Inc.

20070201022 - System and method for spectral unmixing in a fiber array spectral translator based polymorph screening system: The disclosure relates generally to methods and apparatus for using a fiber array spectral translator-based (“FAST”) spectroscopic system for performing spectral unmixing of a mixture containing multiple polymorphs. In an embodiment, a first spectrum of a mixture containing polymorphs of a compound is obtained using a photon detector and a... Agent: Duane Morris LLP

20070201023 - Method for determining crystalline orientation using raman spectroscopy: A method of determining the crystalline orientation of a crystal surface of a workpiece using Raman spectroscopy. A beam of substantially monochromatic light is directed to be incident on the crystal surface at a predetermined angle of incidence. The beam of light is substantially polarized. The workpiece is rotated relative... Agent: Ratnerprestia

20070201025 - Fluid verification system and method for infusions: An apparatus and method are provided to verify the composition of a medical fluid in a fluid container. The verification is performed at a centralized location, where light is transmitted through the fluid and detected by a sensor that generates signals representative of the spectral data of the actual composition... Agent: Mcdermott, Will & Emery

20070201024 - Method and apparatus for semi-permeable membrane detection on osmotic tablets incorating near-infrared spectroscopy: Disclosed are apparatus and methods relating to the manufacture of osmotic tablets, in particular to the use of near-infrared spectroscopy in the detection of the presence or absence of semi-permeable membranes in osmotic tablets.... Agent: Philip S. Johnson Johnson & Johnson

20070201026 - Optical spectrum analysis: The present invention relates to an apparatus and to a method of optical spectrum analysis of an optical spectrum of a light beam (4), comprising the steps of selecting a certain part of the optical spectrum of the light beam (4) to provide a filtered light beam (12), detecting the... Agent: Perman & Green

20070201027 - Innovative raster-mirror optical detection system for bistatic lidar: According to an exemplary embodiment of the present invention, an optical measurement apparatus includes a raster-mirror, an objective element, and a detector element. The raster-mirror includes a plurality of mirror segments that are articulated relative to adjacent mirror segments and configured to receive light from a portion of a field... Agent: Macpherson Kwok Chen & Heid LLP

20070201028 - Measuring particulate matter in a fluid: A device for measuring near forward scatter caused by particulate matter in a fluid is disclosed. The device comprises, according to various embodiments, a transceiver and a reflector. The transceiver includes a light source and a detector. The reflector is positioned opposite the transceiver so that at least a portion... Agent: Kirkpatrick & Lockhart Preston Gates Ellis LLP

20070201029 - Evaluating method and apparatus thereof: A measurement apparatus measures the spatial distributed characteristic of reflection of an object. Evaluate parameters used to evaluate the gloss character of the object are extracted based on the measurement result. An evaluate value indicating the gloss character of the object is calculated based on the extracted evaluate parameters. The... Agent: Fitzpatrick Cella Harper & Scinto

20070201030 - Navigation grade gyroscope: An apparatus for detecting rotation and a method for constructing the apparatus are provided. The apparatus comprises an optical fiber having a hollow passageway therethrough, a laser medium within the hollow passageway and interconnecting the first and second portions of the hollow passageway, and first and second electrodes contacting the... Agent: Honeywell International Inc.

20070201031 - Optical blood pressure and velocity sensor: A single point implantable optical sensor measures in vivo changes in blood pressure and velocity. An optical fiber waveguide in a catheter transmits light to M-Z interferometer. The wave propagation of fluctuating blood pressure in a living organism is measured by recording the time dependence optical signal losses as the... Agent: Edward S. Sherman, Esq.

20070201032 - Apparatus for inspecting a ball-bumped wafer: An apparatus for inspecting a ball-bumped wafer is provided in which an wafer to be inspected, in which a plurality of chips having ball bumps are formed, is mounted on a wafer table; an inspection light is irradiated from a light projection optical system to the wafer mounted on the... Agent: Mcdermott Will & Emery LLP

20070201033 - Methods and systems for performing angle-resolved fourier-domain optical coherence tomography: Arrangements, apparatus and methods are provided according to exemplary embodiments of the present invention. In particular, at least one first electro-magnetic radiation may be received and at least one second electro-magnetic radiation within a solid angle may be forwarded to a sample. The second electro-magnetic radiation may be associated with... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070201034 - Symmetrical illumination forming system: A system and method are used to form alignment system illumination light beams having, for example, desirable phase and amplitude symmetry. This is produced using a symmetry forming device, located within the alignment system, having at least a compensator, an interferometer, and an analyzer.... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20070201036 - Coherent hybrid electromagnetic field imaging: An apparatus and corresponding method for coherent hybrid electromagnetic field imaging of a target, where an energy source is used to generate a propagating electromagnetic beam, an electromagnetic beam splitting means to split the beam into two or more coherently matched beams of about equal amplitude, and where the spatial... Agent: Los Alamos National Security, LLC

20070201035 - In situ determination of pixel mapping in interferometry: Interferometric methods and apparatus by which the map between pixel positions and corresponding part locations are determined in situ. The part under test, which is assumed to be a rigid body, is precisely moved from a base position to at least one other position in one to six degrees of... Agent: Francis J. Caufield

20070201037 - Lens measuring method and device for determining decenter and tilt of the lens: A device for measuring a lens, comprising a first interferometer having a first optical axis and carried on a first adjustment base, a lens holder for holding the lens having a first surface having a first lens optical axis and a second surface having a second lens optical axis, and... Agent: Silicon Valley Patent Group LLP

20070201038 - Electrical characterization of interferometric modulators: Disclosed herein are methods and systems for testing the electrical characteristics of reflective displays, including interferometric modulator displays. In one embodiment, a controlled voltage is applied to conductive leads in the display and the resulting current is measured. The voltage may be controlled so as to ensure that interferometric modulators... Agent: Knobbe Martens Olson & Bear LLP

20070201039 - Method for optical characterization and evaluation of optically variable devices and media: Methods for evaluating an optically variable device (“OVD”) or optically variable media (“OVM”) are disclosed. The methods include the steps of applying light of a single wavelength from a calibrated light source to the OVD or OVM; measuring the light diffracted by the OVD or OVM with an integrating sphere;... Agent: Caesar, Rivise, Bernstein, Cohen & Pokotilow, Ltd.

20070201041 - Image measuring system, image measuring method and image measuring program: An image measuring system comprises a measurement point acquire, a measurement direction calculator, a synthesized direction calculator operative to calculate a synthesized direction resulted from synthesis of movement directions before and after the measurement point, a fore/aft-running point calculator operative to calculate a forerunning point at a position spaced a... Agent: Oliff & Berridge, PLC

20070201040 - Laser-based position measuring device: A position measuring device with a rotating laser beam includes a laser transmitter that is positioned in a polar coordinate system and emits at least one rotary laser beam in an essentially horizontally lying plane. A photosensitive position sensor delivers an electrical pulse, which is identified by length in time... Agent: Roberts, Mlotkowski & Hobbes

20070201042 - System and method of determining a position of a radiation emitting element: A method and a system for determining the position of a radiation emitter, which radiation emitter may be an actively radiation emitting stylus, pen, pointer, or the like or may be a passive, radiation scattering/reflecting/diffusing element, such as a pen, pointer, or a finger of an operator. The radiation from... Agent: Harness, Dickey & Pierce, P.L.C

20070201043 - Line profile asymmetry measurement: This disclosure provides methods for measuring asymmetry of features, such as lines of a diffraction grating. On implementation provides a method of measuring asymmetries in microelectronic devices by directing light at an array of microelectronic features of a microelectronic device. The light illuminates a portion of the array that encompasses... Agent: Perkins Coie LLP Patent-sea

20070201044 - Method and apparatus for measuring dimension of photomask pattern: A method for measuring a dimension of a pattern formed on a semiconductor light-exposure mask includes performing a preparation arranged to form a first relationship between measured values of dimensions of opaque patterns and misalignments of detected edge positions, and a second relationship between measured values of dimensions of clear... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070195308 - Imaging of surgical biopsies: In order to determine, rapidly and without the delay required by conventional tissue preparation techniques for pathological examination (freezing, sectioning, staining, etc.), whether, an excision, which may be a biopsy sample, is representative of the morphology of interest of whether an excisional biopsy in which the tissue taken completely removes... Agent: Kenneth J. Lukacher

20070195309 - Photochromic probes: The present invention provides photochromic compounds and derivatives thereof as shown in claim 1 and methods of use of these compounds and derivatives. The present invention also provides photochromic optical probes capable of undergoing light directed reversible transition between a first state and a second state. The invention also teaches... Agent: Godfrey & Kahn, S.c.

20070195310 - System and process for sorting biological particles: A system which irradiates light onto a liquid flow containing a biological particle, detects the light therefrom to collect biological information thereon, and sorts the biological particle based upon the biological information, comprises an optical detector for detecting the light from the biological particle; an imaging device for imaging the... Agent: Harness, Dickey & Pierce, P.L.C

20070195311 - Device and method for non-contact scanning of contact lens and contact lens mold geometry: The invention relates to an apparatus and method for non-contact/non-destructive measurement of the geometry of molded ophthalmic lenses and the precision molds and tooling used in the manufacture of the ophthalmic lenses. In particular the present system uses micro computed tomography to measure the geometries.... Agent: Ciba Vision Corporation Patent Department

20070195312 - Refractometer: The present invention pertains to a refractometer with a refractometer prism, on the measuring surface of which a sample to be analyzed can be placed, which can be illuminated by a light source in such an angle range that the critical angle of the total reflection is also contained in... Agent: Duane Morris, LLPIPDepartment

20070195313 - Leveling method and leveling device: A leveling method in a device main unit with tilt sensors, wherein said method comprises a step of obtaining a response delay of said tilt sensors in advance, a step of tilting said device main unit in a first direction so that said tilt sensors detect a first 0 point,... Agent: Nields & Lemack

20070195314 - Apparatus and method for measuring shape: A shape measuring apparatus and a shape measuring method suited for measuring an edge profile of a thin sample such as a semiconductor wafer or the like is provided. A distribution of surface angle and an edge profile of a measurement site is calculated by emitting light at sequentially different... Agent: Reed Smith LLP

20070195315 - Method and system for detecting defects: System for scanning a surface, comprising a light source producing an illuminating light beam; an objective lens assembly, located between the light source and the surface; a plurality of interchangeable telescopes, a selected one of the interchangeable telescopes being located between the light source and the objective lens assembly; and... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20070195316 - Pattern defect inspection method and its apparatus: The pattern defect inspection apparatus and its method of the present invention comprises: a recipe setting unit for setting an inspection recipe and/or a review recipe; an illumination optical system including: a laser light source for emitting ultraviolet laser light; a quantity-of-light adjusting unit for adjusting a quantity of the... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070195317 - Groupwise corrected objective: An objective and method of fabricating an objective, particularly a projection objective for microlithography, comprising a plurality of optical elements. In one example, the method comprises acts of determining groups of optically similar optical elements or surfaces having at least two members, determining wavefront deformations by the optical elements or... Agent: Lowrie, Lando & Anastasi

20070195319 - Cavity enhanced optical spectroscopy with a cavity having a predetermined deviation from a mode degeneracy condition: Improved ease of mode matching to a passive optical cavity is provided by selecting a cavity design that has a predetermined deviation from a reference cavity design having high transverse mode degeneracy. This predetermined deviation tends to be small, so that the first overlap of high-order transverse modes with the... Agent: Lumen Intellectual Property Services, Inc.

20070195318 - Wavelength calibration method and wavelength calibration apparatus: In a wavelength calibration method, an observed spectrum of a light that has a wavelength band is obtained, wherein the light has at least an attenuated wavelength component that corresponds to at least a predetermined absorption wavelength that is included in the wavelength band. A corrected spectrum is then obtained... Agent: Sughrue Mion, PLLC

20070195320 - Probe for tunable laser raman spectroscopy system: A probe of a Raman spectroscopy system has a wavelength and/or amplitude referencing system for determining a wavelength of the excitation signal. Preferably, this referencing system is near an output aperture, through which the excitation signal is transmitted to the sample. In this way, any birefringence or polarization dependent loss... Agent: Houston Eliseeva

20070195321 - Chip reader for biochips and associated methods: The invention relates to a device which is used to read and analyse chips. The inventive device comprises a table (11) for receiving a chip (12) that is intended to characterise at least one sample, means of exciting the molecules or cells of the chip after reaction with other molecules... Agent: Sughrue Mion, PLLC

20070195322 - Multipulse agile laser source for real time spark spectrochemical hazard analysis: A system for analyzing a sample is disclosed. The system is comprised of a laser unit and a spectrometer unit. The laser unit is configured to emit a first laser pulse and a second laser pulse towards the sample with a pulse separation time of between about 1 microsecond to... Agent: Baker & Mckenzie LLP Patent Department

20070195323 - Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics: The invention is directed to an arrangement for detecting coatings which are arranged on surfaces of structural component parts or objects and for determining the chemical characteristics and surface properties of these coatings. It comprises a light source for illuminating the coating to be analyzed on the surface of the... Agent: Reed Smith, LLP Attn: Patent Records Department

20070195324 - Systems and methods for detecting radiation, biotoxin, chemical, and biological warfare agents using a multiple angle light scattering (mals) instrument: A particle detection system to identify and classify particles is programmed to capture digitized images of the particle generated by directing a light source through a fluid that includes the particle. The particle scatters the light and the scattered light is detected using a detector. The detector creates a digital... Agent: Baker & Mckenzie LLP Patent Department

20070195326 - Image processing alignment method and method of manufacturing semiconductor device: An alignment mark is arranged to be within an image screen and the alignment mark is formed with rectangular patterns having varied dimensions from each other. The signal waveforms from each of the rectangular patterns are measured. The number of the rectangular patterns with normal waveforms is compared to the... Agent: Mcginn Intellectual Property Law Group, PLLC

20070195325 - Method and apparatus for measuring optical overlay deviation: An apparatus and method analyze overlay deviation in alignment between a first mark and a second mark that are formed on a substrate. In particular, a relationship between changes in overlay deviation values and changes in focus position of the substrate for a plurality of sets of the first and... Agent: Oliff & Berridge, PLC

20070195327 - Reflection characteristic measuring apparatus: A reflection characteristic measuring apparatus includes: a light irradiating member for irradiating light toward a sample surface to be measured; a light detector, having a two-dimensional light receiving surface, for receiving reflection light from the sample surface illuminated with the light irradiated by the light irradiating member to output two-dimensional... Agent: Sidley Austin LLP

20070195328 - Wavelength measurement method based on combination of two signals in quadrature: In a dual etalon wavelength monitor, improved performance is obtained by identifying first and second dead zones where the first and second etalon signals respectively have significantly reduced sensitivity. When a measurement is in the first dead zone, only the second etalon signal is employed to determine wavelength. When a... Agent: Lumen Intellectual Property Services, Inc.

20070195329 - Holographically compensated, self-referenced interferometer: A holographically, self-referenced interferometer may include a detector to detect interference fringes in a reference leg optical signal. The interferometer may also include a holographic correction device to holographically compensate the reference leg optical signal in response to the detected interference fringes.... Agent: Moore And Van Allen PLLC For Boeing

20070195330 - Optical interference apparatus: A light emission section includes light generators which are operated on the basis of drive signals from a controller so as to emit near infrared interferable light beams having different specific wavelengths to a light interference section. The light interference section includes a beam splitter having a low-reflection region. The... Agent: Rossi, Kimms & Mcdowell LLP.

20070195331 - Coating thickness gauge: A coating thickness gauge for measuring the thickness of a coating on a surface of a can is described. The gauge comprises a probe head and a probe head locating mechanism. By employing the probe head locating mechanism the probe head can be easily orientated relative to the surface of... Agent: Workman Nydegger (f/k/a Workman Nydegger & Seeley)

20070195332 - System and method for coherent optical inspection: A system and method for coherent optical inspection are described. In one embodiment, an illuminating beam illuminates a sample, such as a semiconductor wafer, to generate a reflected beam. A reference beam then interferes with the reflected beam to generate an interference pattern at a detector, which records the interference... Agent: Davis Wright Tremaine LLP

20070195333 - Atomic force microscope: A surface shape of a member to be measured is measured by reflecting measuring light at a reflection surface of a probe and utilizing an atomic force exerting between the probe and utilizing an atomic force exerting between the probe and the member to be measured. In addition to a... Agent: Fitzpatrick Cella Harper & Scinto

20070195334 - Displacement detection apparatus, polarization beam splitter, and diffraction grating: A displacement detection apparatus, polarization beam splitter, and diffraction grating are provided. A displacement detection apparatus configured to detect a displacement includes a light source, a reflective diffraction grating configured to receive the two polarized beams, two polarization altering elements configured to alter the polarization states of two diffracted beams... Agent: Bell, Boyd & Lloyd, LLP

20070188734 - Anti-collision warning system for marine vehicle and anti-collision analysis method: An anti-collision warning system for marine vehicle includes, an optical sensor covering at least partially the horizon of the marine vehicle, image processing means for extracting in real time from each image position information of objects visible on the surface of the sea, and anti-collision analysis means, which periodically calculate... Agent: Akin Gump Strauss Hauer & Feld L.L.P.

20070188735 - Electronic distance meter featuring spectral and spatial selectivety: Disclosed is a distance meter, particularly for telescope arrays in ground-based or space-based applications for detecting surfaces. Said distance meter comprises at least one radiation source for emitting electromagnetic radiation (ES) onto a target that is to be measured, a receiver unit with a sensor (11) for receiving the radiation... Agent: Workman Nydegger

20070188736 - Obtaining measurement and baseline signals for evaluating assay test strips: Systems and methods of obtaining measurement and baseline signals for evaluating assay test strips are described. In one aspect, an assay test strip that has a detection zone with at least one measurement region is held in a respective measurement position for each measurement region in the detection zone. In... Agent: Kathy Manke Avago Technologies Limited

20070188737 - Optical detection system for flow cytometry: An optical detection system for flow cytometry that uses two or more light sources positioned laterally at different distances from a central axis of a flow stream for providing light through different parts of the flow stream. One or more lenses are used to focus the light from the two... Agent: Honeywell International Inc.

20070188738 - Apparatus and method for measuring optical characteristics of teeth: Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass... Agent: Alan R. Loudermilk Loudermilk & Associates

20070188740 - Active wavelength converter for use with an optical time-domain reflectrometer (otdr) and method for increasing otdr supervision distance range: According to another characteristic of the present invention, the “METHOD FOR INCREASING THE OTDR SUPERVISION DISTANCE RANGE” consists of placing converters 4b at the route points in which the optical signal originated in the OTDR has reached its useful attenuation limit and needs to be recovered. Each converter 4b is... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070188739 - Apparatus and method for detecting defect in optical fiber, and plastic optical fiber manufacturing apparatus: While a plastic optical fiber (POF) strand (11) is guided by guide pulleys (21-28) toward a winding machine (17), an internal defect in the POF strand (11) is detected by a defect detection apparatus (20). The defect detection apparatus (20) comprises three light illumination devices (31-33), line sensor cameras (35-37)... Agent: Sughrue Mion, PLLC

20070188741 - Method and apparatus for analysing an optical device: Described are a method and apparatus for analysing an optical device, including: a) arranging an illuminating device which generates a test beam, the optical device that the test beam passes and a position-resolving sensor device which detects the test beam, relative to each other in a reference position that establishes... Agent: Lowe Hauptman Berner, LLP

20070188742 - System for detecting deflection of a boring tool: A system for monitoring deflection of a downhole tool assembly. The system comprises a beam source directing a beam at a receptor positioned proximate the downhole tool assembly. The receptor detects the position of incidence of the beam at the receptor. A processor receives signals from the receptor and determines... Agent: Tomlinson & O'connell, P.C.

20070188743 - Method and system of defect inspection for mask blank and method of manufacturing semiconductor device using the same: Defect detection is performed with two settings, that is, setting of a focus position where a signal intensity obtained from a dot pattern is maximum and setting of a focus position where a signal intensity obtained from a hole pattern is maximum. In addition, defect detection is performed at a... Agent: Reed Smith LLP

20070188745 - Backside contamination inspection device: A system for simultaneously inspecting the frontsides and backsides of semiconductor wafers for defects is disclosed. The system rotates the semiconductor wafer while the frontside and backside surfaces are generally simultaneously optically scanned for defects. Rotation is induced by providing contact between the beveled edges of the semiconductor wafer and... Agent: Smyrski Law Group, A Professional Corporation

20070188744 - Optical scanning system for surface inspection: In an optical scanning system for detecting particles and pattern defects on a sample surface, a light beam is focused to an illuminated spot on the surface and the spot is scanned across the surface along a scan line. A detector is positioned adjacent to the surface to collect scattered... Agent: Davis Wright Tremaine LLP

20070188746 - Optical substrate for enhanced detectability of fluorescence: A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·¼ wherein dL is a physical... Agent: Pearne & Gordon LLP

20070188748 - Apparatus and method for examining spectral characteristics of an object: An apparatus for examining spectral characteristics of an object may include a chuck configured to support and releasably fix the object, wherein the chuck is larger than the object, a first light source assembly integral with the chuck and configured to illuminate a bottom surface of the object with light... Agent: Lee & Morse, P.C.

20070188747 - System and method for image reconstruction in a fiber array spectral translator system: The disclosure relates generally to methods and apparatus for spectral calibration of a spectroscopic system which includes a fiber array spectral translator. One embodiment relates to a method for obtaining a first image of a known substance using a photon detector and a fiber array spectral translator having plural fibers,... Agent: Duane Morris LLP

20070188749 - Spatially patterned substrates for chemical and biological sensing: A system and method are provided for imaging a test substrate having a test surface that is configured to enable spectroscopic detection of one or more chemical or biological species, wherein the test surface includes a testing site disposed thereon according to a predetermined spatial pattern. The test substrate is... Agent: Kasha Law PLLC

20070188750 - Methods and systems for simultaneous real-time monitoring of optical signals from multiple sources: Methods and systems for real-time monitoring of optical signals from arrays of signal sources, and particularly optical signal sources that have spectrally different signal components. Systems include signal source arrays in optical communication with optical trains that direct excitation radiation to and emitted signals from such arrays and image the... Agent: Morgan, Lewis & Bockius LLP (sf)

20070188751 - Method for leveling response characteristic of spectroscope: A method for standardizing system response of spectrophotometer which corrects the difference between spectrophotometric system responses generated due to the difference in response characteristics of a light source, wavelength selector, and sensor, and involves obtaining the difference spectrum between a master unit and a slave unit relative to a standard... Agent: Carrier Blackman And Associates

20070188753 - Spectrometric measurements during blending / mixing: A mixing bin for the blending of materials (e.g., pharmaceuticals, foodstuffs, etc.) bears a spectrometer which monitors the characteristics of the material being tumbled within the bin interior to thereby obtain an indication of the degree to which the material is mixed. An accelerometer also rides on the mixing bin... Agent: Thermo Finnigan LLC

20070188752 - Spectroscopic feedback for high density data storage and micromachining: Optical breakdown by predetermined laser pulses in transparent dielectrics produces an ionized region of dense plasma confined within the bulk of the material. Such an ionized region is responsible for broadband radiation that accompanies a desired breakdown process. Spectroscopic monitoring of the accompanying light in real-time is utilized to ascertain... Agent: Michael C. Staggs Lawrence Livermore National Laboratory

20070188754 - Laser scanning microscope with spectrally resolving radiation detection: The invention is directed to a laser scanning microscope with a detector device for spectrally resolving radiation detection. The detector device has at least one dispersive element, on which a beam of the radiation to be detected impinges and which fans out this beam spectrally, and at least two detector... Agent: Reed Smith, LLP Attn: Patent Records Department

20070188755 - Device for ellipsometric two-dimensional display of a sample, display method and ellipsometric measurement method with spatial resolution: This invention concerns a device for ellipsometric two-dimensional display of a sample placed in an incident medium, observed between a convergent light cross-reflected analyser and polarizer, wherein the ellipsometric parameters of the ensemble formed by the sample and a substrate whereon it is placed, are processed. The substrate comprises a... Agent: Young & Thompson

20070188757 - Method of sealing a glass envelope: A method of sealing a glass package comprising providing a first glass substrate, the first substrate having first and second alignment marks. A second glass substrate having third and fourth alignment marks is aligned to the first substrate by translating the first substrate relative to the second substrate, and aligning... Agent: Corning Incorporated

20070188756 - Leveling algorithm for semiconductor manufacturing equipment and related apparatus: A method of reading surface levels of a field defined on a substrate using a sensing apparatus having at least one cell array composed of a plurality of cells, in which some of the cells constituting the at least one cell array are selected and designated as available cells. Light... Agent: F. Chau & Associates, LLC

20070188758 - Position detecting method: A method for calculating a position of an image of an alignment mark formed on an object to be detected includes the steps of obtaining first information indicative of a center position in the alignment mark based on a detection signal, obtaining a waveform characteristic of the detection signal as... Agent: Morgan & Finnegan, L.L.P.

20070188759 - Colorimeter operating on color matching logic: A colorimeter operating on color matching logic concerned with a process of quantitatively analyzing a known substance by finding the color signature of the colored solution of that substance and matching it or interpolating it with the color values provided in the look-up table for that substance for determining the... Agent: Rajeev Pandit

20070188760 - Fluorescence filtering system and method for molecular imaging: An optical system is disclosed that can be used for fluorescence filtering for molecular imaging. In one preferred embodiment, a source subsystem is disclosed comprising a light source and a first set of filters designed to pass wavelengths of light in an absorption band of a fluorescent material. A detector... Agent: Townsend And Townsend And Crew, LLP

20070188761 - Combined modulated optical reflectance and electrical system for ultra-shallow junctions applications: A metrology tool for semiconductor wafers is disclosed which combines modulated reflectivity measurement with junction photovoltage measurements. The tool includes an intensity modulated pump beam for periodically exciting the sample. A separate probe beam is used to monitor changes in optical reflectivity of the sample. In addition, capacitive electrodes are... Agent: Stallman & Pollock LLP

20070188762 - Modulated scatterometry: An apparatus for scatterometry measurements is disclosed. The apparatus includes a modulated pump source for exciting the sample. A separate probe beam is directed to interact with the sample and the modulated optical response is measured. The measured data is subjected to a scatterometry analysis in order to evaluate geometrical... Agent: Stallman & Pollock LLP

20070188763 - Turbidity sensor: Sensor for transmission measurement in a washing machine or dishwasher, with a carrier (2) a transmitter (4) attached to the carrier (2) to emit a transmitter beam, a receiver (6) attached to the carrier (2) to receive the beam generated by the transmitter (4), and a diaphragm system arranged on... Agent: Straub & Pokotylo

20070188764 - Optical instrument and components thereof: An optical assembly for use with a spectrophotometer. The optical assembly may comprise an illumination source, a detection sensor, a monitor sensor, and an optical piece having a first side adapted to face a sample. The optical piece may define an illumination channel extending from the illumination source toward the... Agent: Kirkpatrick & Lockhart Preston Gates Ellis LLP

20070188765 - Fourier-domain optical coherence tomography imager: A Fourier-domain optical coherence tomography (OCT) imager is presented. An OCT imager according to the present invention can have an auto-alignment process. The auto-alignment process automatically adjusts at least one optical component of a spectrometer of the imager so that the spectrometer is aligned during an imaging session. In addition... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070188766 - Interferometric apparatus: An interferometric apparatus (10) for producing an output signal characteristic of phase and/or amplitude noise of a device under test (22), an input signal being provided to the interferometric apparatus (10), comprising a signal generation means (18) arranged to produce a third signal having a carrier frequency offset from that... Agent: Clark Hill, P.C.

20070188767 - Optics system for an interferometer: An optical assembly of an interferometer that includes a beam splitter for dividing the beams emitted by a radiation source into at least one measuring and one reference beam and at least one measuring and one reference mirror, on which the measuring and the reference beams impinge, wherein at least... Agent: Brinks Hofer Gilson & Lione

20070188768 - Apparatus for and a method of determining a characteristic of a layer or layers: In respective measurement operations on a first sample surface area having a layer structure (81) and a characterised second sample surface area (82), light reflected by the region of the sample surface and the reference surface interfere and a sensing device (10) senses light intensity representing interference fringes at intervals... Agent: Ratnerprestia

20070188769 - Three-channel camera systems with collinear apertures: A three-dimensional imaging system uses a single primary optical lens along with three collinear apertures to obtain three offset optical channels each of which can be separately captured with an optical sensor.... Agent: Strategic Patents P.C..

20070188770 - Automatic material measurement system: A system is provided for measuring at least a thickness of a strip of material extending between two oppositely facing surfaces comprising a frame having an opening for receiving the material and a transport device coupled to the frame and movable transverse to the material. First and second distance-measuring sensors... Agent: Wood, Herron & Evans, LLP

20070188771 - Method for measuring dimensions and optical system using the same: A method of measuring dimensions for an optical system to measure the critical dimension of a sample object according to this aspect of the present invention includes the steps of preparing a plurality of standard objects, selecting a predetermined focus metric algorithm, performing an analyzing process on each standard object... Agent: Egbert Law Offices

20070182949 - Method and arrangement for measuring the distance to an object: Arrangement (10) for measuring the distance to an object, comprising: a photonic source for illuminating said object using a continuous modulated photonic wave, a solid-state image sensor, comprising an array of avalanche photodiodes and a plurality of circuits for processing signals output by said avalanche photodiodes to yield data depending... Agent: Blank Rome LLP

20070182950 - Distance measurement device: A distance measurement device including a handheld housing with a distance measurement module for transmitting a measurement signal aimed toward a distant object and receiving a measurement signal reflected therefrom for determining the distance measurement thereto, and a head-up display (HUD) for enabling a user to simultaneously view the object... Agent: Nath & Associates

20070182951 - Device for checking banknotes: The invention relates to an apparatus for checking bank notes, having a linear sensor and a linear light source wherein the bank notes are moved past between the sensor and the light source for the check, and the sensor detects light from the light source transmitted by the bank notes.... Agent: Bacon & Thomas, PLLC

20070182952 - Automatic collimation device for surveying apparatus: A surveying apparatus that is capable of automatic collimation based on an image obtained from an imaging device, which enables carrying out automatic collimation without using angle detectors, even when a telescope is rotating. An automatic collimation device for a surveying apparatus including: an imaging device that images a target... Agent: Roberts, Mlotkowski & Hobbes

20070182954 - Defective pixel correction apparatus for liquid crystal panel: A defective pixel correction apparatus has a laser output section and a measurement mechanism. The laser output section has an adjustment function of adjusting an intensity of a laser beam. The measurement mechanism measures an intensity of a laser beam reflected from a defective pixel.... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070182955 - Substrate defect inspection method, computer readable storage medium, and defect inspection apparatus: In the present invention, data on a substrate image picked up by an image pickup unit is outputted to a difference calculation unit where a difference image from a normal substrate is calculated. A synthesis calculation unit calculates a synthesized image by rotating the difference image 360 degrees by every... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070182956 - Detection device for identifying objects in a material stream: The invention relates to a detection device for identifying objects in a material stream, preferably a cullet stream. The device comprises several light sources, which emit light in a rectilinear manner, preferably diode light sources and which are combined to form at least one optical emitter, at least one receiver... Agent: William Collard Collard & Roe, P.C.

20070182953 - Inspection apparatus for conveyor system: A video monitor for a conveyor system consists of a camera assembly, a recorder assembly and a power supply. The camera assembly includes a camera tube which contains the camera. The camera tube is movable so as to avoid impeding the movement of the conveyor. The camera tube is attached... Agent: Warner Norcross & Judd LLP

20070182958 - Apparatus and method for wafer surface defect inspection: A beam emitted from a first light source is shed on the surface of a rotating wafer to form a beam spot. Scattered light arising from foreign matter and other defects on the surface of the wafer is detected in a plurality of directions and output in the form of... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070182957 - Wafer surface inspection apparatus and wafer surface inspection method: A wafer surface inspection method and apparatus of high sensitivity, and free from performance degradation in terms of cleanliness, coordinate repeatability of foreign particles and the like. Gas for cooling is sprayed onto a laser irradiation position on the wafer surface to prevent an increase in temperature of the foreign... Agent: Mcdermott Will & Emery LLP

20070182959 - Dynamic imaging of biological cells and other subjects: The invention relates to methods of dynamic chemical imaging, including methods of cellular imaging. The method comprises illuminating at least a portion of a cell with substantially monochromatic light and assessing Raman-shifted light scattered from the illuminated portion at a plurality of discrete times. The Raman-shifted light can be assessed... Agent: Daniel H Golub Morgon Lewis & Bockius

20070182960 - Compact laser spectrometer: A compact laser spectrometer according to the present invention includes a plurality of semiconductor lasers comprising a plurality of semiconductor gain medium compositions emitting a plurality of radiation components originating from an area having a maximum transverse dimension that is smaller than a minimum feature size of a sample. A... Agent: Vijaysekhar Jayaraman, Praevium Research Inc.

20070182961 - Array detector coupled spectroanalytical system and graded blaze angle grating: A spectroanalytical system for receiving radiation to be analyzed along a first path includes a grating in the first path with periodic faceted grooves for spatially separating the radiation as a function of wavelength. The blaze angles of the faceted grooves are progressively graded. A multielement detector detects radiation spatially... Agent: Iandiorio & Teska

20070182962 - Spatial image modulation to improve performance of computed tomography imaging spectrometer: Computed tomography imaging spectrometers (“CTIS”s) having patterns for imposing spatial structure are provided. The pattern may be imposed either directly on the object scene being imaged or at the field stop aperture. The use of the pattern improves the accuracy of the captured spatial and spectral information.... Agent: Christie, Parker & Hale, LLP

20070182963 - Chamber particle detection system: Broadly speaking, the embodiments of the present invention fill the need by providing an improved chamber particle source identification mechanism. The in-situ chamber particle source identification method and apparatus can greatly shorten the time it takes to identify chamber particle source, which could improve the chamber throughput for production system.... Agent: Martine Penilla & Gencarella, LLP

20070182964 - Lithographic system, sensor, and method of measuring properties of a substrate: A sensor measuring properties of a substrate in which radiation is projected onto the substrate by a radiation projector that has a first part configured such that the radiation projection can project onto the substrate linearly polarized radiation oriented in a first direction and a second part configured such that... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070182965 - Linked extendable gas observation system for infrared absorption spectroscopy: A modular system for gas analysis has a first gas cell that receives and passes at least a portion of an infrared light beam through at least a portion of the first gas cell. A second gas cell disposed proximal to the first gas cell receives and passes at least... Agent: Proskauer Rose LLP

20070182966 - Method and apparatus for conducting heterodyne frequency-comb spectroscopy: An apparatus and method are provided for conducting heterodyne frequency-comb spectroscopy. The apparatus includes a first and second frequency-comb generators for generating corresponding first and second continuous wave laser beams, respectively. The first beam defines a spectrum of light having a plurality of modes spaced by a first frequency. The... Agent: Boyle Fredrickson Newholm Stein & Gratz, S.c.

20070182967 - Method and apparatus for precision measurement of phase shifts: An interferometer (1) includes a beam displacing assembly (5, 9). The beam displacing assembly is arranged to split an input beam (4) into first and second basis beams (6, 8), that have orthogonal polarisations being respective horizontal and vertical polarizations, and to combine said basis beams to produce an output... Agent: Monique A Morneault Wallenstein Wagner & Rockey

20070182968 - Quantum cryptographic communication apparatus: Provided is a quantum cryptography communication apparatus capable of preventing a go photon pulse from being phase modulated and also capable of freely selecting any repetitive frequency of a light source. In the quantum cryptography communication apparatus, a quantum receiver apparatus includes: a light source; an optical path loop having... Agent: Birch Stewart Kolasch & Birch

20070182969 - Method for approximating an influence of an optical system on the state of polarization of optical radiation: A method for approximating an influence of an optical system on the state of polarization of optical radiation comprises the steps of providing incoming optical radiation for the optical system in several incoming states of polarization, including at least one incoming state having circularly polarized radiation components; directing the incoming... Agent: Milde & Hoffberg, LLP

20070182970 - Method and apparatus for performing highly accurate thin film measurements: A reflectometer data reduction technique is provided that utilizes a ratio of an expected reflectance spectrum of the sample being measured to the actual reflectance spectrum of the sample being measured. The technique is particularly useful in spectral regions that contain sharp spectral features, for example such as the sharp... Agent: O'keefe, Egan, Peterman & Enders LLP

20070182971 - Reference specimen for microscope and manufacturing method thereof: In a reference specimen for a microscope, for use in calibration or inspection of a microscope, having an uneven structure in which convex portions having a prescribed height or concave portions having a prescribed depth are arrayed in a prescribed cycle on a substrate surface, as a material forming the... Agent: Whitham, Curtis & Christofferson & Cook, P.C.

20070177128 - Laser control method and laser control apparatus: A laser control method for controlling a laser beam irradiated, onto a target object to be processed, during execution of a laser processing program, the method including: providing a processing condition table describing a plurality of different feed velocities, in association with a processing condition of the laser beam corresponding... Agent: Drinker Biddle & Reath (dc)

20070177129 - System and method for providing residual stress test structures: The invention comprises systems and methods determining residual stress such as that found in interferometric modulators. In one example, a test unit can be configured to indicate residual stress in a film by interferometrically modulating light indicative of an average residual stress in two orthogonal directions of the substrate. The... Agent: Knobbe, Martens, Olson & Bear, LLP

20070177130 - Modified method and apparatus for measuring analytes: A device for measuring a compound with in a sample both non-invasively and invasively is provided. The devise comprised a source of electromagnetic radiation (EMR) operatively coupled to a power source, one or more receptors and a detector. The one or more receptors shaped to receive a body part and... Agent: Hovey Williams LLP

20070177131 - Object of value comprising a moire patern: The invention concerns an object of value (15), for example a credit card, banknote or identity card. The object of value (15) has a carrier layer (1), at least one first layer (21) containing a moiré pattern and at least one second layer (31, 33) containing a moiré analyser for... Agent: Hoffmann & Baron, LLP

20070177132 - Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion: A method and apparatus for determining lens distortion in a projection imaging tool are described. The techniques include exposing at least one alignment attribute onto a substrate having a recording media. A complementary alignment attribute is also exposed onto the substrate such that the complementary alignment attribute and alignment attribute... Agent: Heller Ehrman LLP

20070177134 - Method and apparatus for measuring face angle: A method (250) and apparatus (20) for measuring the face angle of a golf club (300), golf club head (302) or face component (304) of a golf club head is disclosed herein. The method (250) and apparatus (20) use a non-contact displacement measuring assembly (24) to determine the face angle.... Agent: Michael A. Catania Callaway Golf Company

20070177133 - Position indicating and guidance system and method thereof: The present invention provides operators the ability to follow a predetermined path and achieve desired digging depth by watching steering and elevation indicators of just one system. The indicators are activated by data derived from the interception of signals generated by a single laser transmitter and a receiver array mounted... Agent: Dinsmore & Shohl LLP

20070177135 - Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering: By performing a contingency-based correlation test of measurement data, such as defect data, with respect to electrical test data after progressively filtering the measurement data, an enhanced analysis of process flow characteristics may be accomplished. Consequently, an efficient yield loss estimation may be performed.... Agent: Williams, Morgan & Amerson

20070177136 - Apparatus and method for inspecting defects: A defect inspection apparatus includes an irradiation optical system 20, a detection optical system 30, and an image processor 40. In the irradiation optical system, a mirror 2603 is disposed to reflect downward a beam flux that has been guided to a first or second optical path, and a cylindrical... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070177137 - Surface defect inspection apparatus, surface defect inspection method, and computer program product: A surface-defect inspection apparatus includes a line light source that irradiates a pattern light having brightness differentiated in a direction oblique to a sub-scanning direction of a rotating inspection target object; a line sensor that carries out a one-dimensional imaging of the inspection target object in a main scanning direction... Agent: Dickstein Shapiro LLP

20070177138 - Device for inspection of narrow spaces and objects in narrow spaces: A device for visual inspection of narrow spaces and objects located in narrow spaces such as solder joints between a component and a printed circuit board has an image prism for deflecting light from the spaces and objects to be inspected and an image sensor that can be connected to... Agent: Potomac Patent Group, PLLC

20070177140 - Chemical and biological sensing using metallic particles in amplifying and absorbing media: A film for surface enhanced raman scattering may be utilized for chemical and biological sensing. The film includes a polymeric layer, and a metallic nanoparticle having a cross-section, the metallic nanoparticle being embedded in the polymeric layer. The polymeric layer has a thickness less than a largest straight line through... Agent: Kirkpatrick & Lockhart Preston Gates Ellis LLP (formerly Kirkpatrick & Lockhart Nicholson Graham)

20070177139 - Nanowire heterostructures and methods of forming the same: A NERS-active structure is disclosed that includes at least one heterostructure nanowire. The at least one heterostructure nanowire may include alternating segments of an NERS-inactive material and a NERS-active material in an axial direction. Alternatively, the alternating segments may be of an NERS-inactive material and a material capable of attracting... Agent: Hewlett Packard Company

20070177141 - Optical spectrum analyzer: An optical spectrum analyzer includes an optical section 130 for executing light dispersion into a spectrum and wavelength sweep for input measured light, converting the measured light into an electric signal, and outputting the electric signal, a control section 101 for controlling the wavelength sweep of the optical section and... Agent: Sughrue-265550

20070177142 - Dark box apparatus for fluoroscopy, fluoroscopy system, and fluoroscopy method: Noise in a fluorescence image acquired during fluoroscopy is eliminated to present a clear fluorescence image, and the relative positional relationship between the fluoroscopy unit and the specimen can be recognized even while fluoroscopy is in progress. A dark box apparatus for fluoroscopy includes: a dark-box main body enclosing a... Agent: Kenyon & Kenyon LLP

20070177143 - Process and device for determination of cell viability: Described is a method to determine the viability of cells by measuring the absolute and relative rate of metabolic activity and/or integrity of the cell membrane through the use of vibrational spectroscopy. The use of deuterated agents facilitates detection of changes associated with a change in viability.... Agent: Karen S. Canady Canady & Lortz LLP

20070177145 - Optical spectrum analyzer: An optical spectrum analyzer has a deflection section for changing an incidence angle of measured light on a diffraction grating, a plurality of light detection sections for detecting the dispersed measured light and outputting an electric signal responsive to the light strength, and a signal processing section for finding an... Agent: Sughrue-265550

20070177144 - Weathering test apparatus with spectroradiometer and portable spectroradiometer: The present invention provides a weathering test apparatus system capable of accurately monitoring deterioration of a light source used in a weathering test apparatus. According to the present invention, there is provided a weathering test apparatus system, which comprises a weathering test apparatus with a light source and a spectroradiometer... Agent: Osha Liang L.L.P.

20070177146 - Sheath liquid for particle analyzer: e

20070177147 - Microfluidic devices for electrophoretic analysis of materials: The present invention provides a microfluidic system for electrophoretic analysis of materials in the fields of chemistry, biochemistry, biotechnology, molecular biology and numerous other fields. Light absorbance signals are received by a photodetector from periodically spaced regions along a channel in the microfluidic system. The signals received by the photodetector... Agent: Caliper Life Sciences, Inc.

20070177148 - Lens blank alignment and blocking device and method: A lens blocking device is disclosed that includes a frame, a light source mounted on the frame, a carriage having a first end and a second end mounted on the frame for sliding movement between first and second positions, a first mirror mounted on the carriage first end and a... Agent: Berenato, White & Stavish, LLC

20070177149 - Instrumentation and method for optical measurement of samples: The present invention relates generally to the field of biochemical laboratory instrumentation for different applications of measuring properties of samples on e.g. microtitration plates and corresponding sample supports. The object of the invention is achieved by providing an optical measurement instrumentation which comprises a point detector (531) for the measurement... Agent: Young & Thompson

20070177150 - Surface plasmon resonance biosensor using coupled surface plasmons to decrease width of reflectivity dip: A surface plasmon resonance biosensor uses coupled surface plasmons to decrease the width of a reflectivity dip and thereby increase the sensitivity of the surface plasmon resonance biosensor.... Agent: Agilent Technologies Inc.

20070177151 - Interferometer for demodulating differential m-phase shift keying signal: An interferometer for demodulating a differential M-phase shift keying signal includes a PLC type interferometer main body, a heating portion that heats the PLC type interferometer main body, and an intermediate member having a higher stiffness than that of the PLC type interferometer main body, for bonding the PLC type... Agent: Bingham Mccutchen LLP

20070177152 - Methods and systems for monitoring and obtaining information of at least one portion of a sample using conformal laser therapy procedures, and providing electromagnetic radiation thereto: In one exemplary embodiment of the present invention, method and system can be provided for obtaining information associated with at least one portion of a sample. For example, a temperature change can be caused in the portion of the sample. At least one first electro-magnetic radiation can be forwarded to... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070177153 - Measuring endoscope apparatus: A measuring endoscope apparatus is disclosed having a light source unit that emits low coherence light, a probe that illuminates the observation object with the low coherence light and that collects light reflected by the observation object, and a single optical fiber that optically connects the light source unit and... Agent: Arnold International

20070177154 - Measuring device and method to optically measure an object: A measuring device for the optic measuring of an object 13a is provided, in particular for measuring a motion of the object. The device includes an interferometer 20 with a measuring beam exit 12, a reflection beam entry 14, an interfering beam exit 15, and a light source 1 for... Agent: Volpe And Koenig, P.C.

20070177155 - Electronic distance measuring apparatus: A portable and convenient electronic distance measuring apparatus using a laser beam and a supersonic wave is provided. A predetermined height is measured using a supersonic sensor and a laser pointer is rotated at the predetermined height to radiate a laser beam at a target object so that a distance... Agent: Ipla P.A.

20070177156 - Surface profiling method and apparatus: A surface profiling apparatus for providing surface profile information for a sample surface. This apparatus includes: support means for supporting a sample having a non-planar surface; light directing means for directing broadband light to an interference zone along first and second light paths; moving means for causing relative movement between... Agent: Ratnerprestia

20070177158 - Method and apparatus for the two-dimensional mapping of the electro-optical coefficient: s

20070177157 - Optical readhead: Interferometry apparatus which comprises a measurement light beam (2a, 2b) and a reference light beam (2c, 2d) which interact with each other to cause a spatial fringe pattern (24). An optical device (12) is provided which interacts with the spatial fringe pattern (24), such that light is spatially separated into... Agent: Oliff & Berridge, PLC

20070177159 - Method for measuring three-dimension shape: A method of measuring a 3D shape, which can measure a 3D shape of target objects on a board by searching a database for bare board information when a measuring object is not set to a normal inspection mode or by performing bare board teaching when the board is supplied... Agent: Rosenberg, Klein & Lee

20070177160 - Three-dimensional object information acquisition using patterned light projection with optimized image-thresholding: Techniques are disclosed of obtaining three-dimensional information pertaining to an object of interest, based on a light-pattern image acquired by digitally photographing the object with patterned light being projected onto the object, By an exemplary technique, a local adaptive spatial-filter is configured for the light-pattern image, based on a spatial... Agent: Baker Botts LLP C/o Intellectual Property Department

20070177161 - Positioning system, positioning method, and program thereof: A positioning system includes an illumination device, a terminal, and a positioning server. The illumination device transmits identification information. The terminal transmits the identification information received from the illumination device, to the positioning server. The positioning server uses the identification information received from the terminal, thereby searching an illumination installation... Agent: Ostrolenk Faber Gerb & Soffen

20070177162 - Device for measuring changes in the position of the edge of a body: The invention relates to a measuring device for measuring changes in the position of the edge of a body of a component. Said measuring device contains a sensor which reacts to the changes, a light source, a measuring edge fixed in relation to the edge of the body, and a... Agent: Lucas & Mercanti, LLP

20070177163 - Method of and device for thickness measurement of thick petrochemical films on water surface: where n2 (λ1) and n2(λ2) are refraction coefficients of petrochemical product at the wavelengths: λ1 and λ2, λ3 is equal to a wavelength of absorption maximum of petrochemical product, and using for the determination of the film thickness results of the analysis of intensity of the reflected signal at the... Agent: United States Department Of Energy