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USPTO Class 356 | Browse by Industry: Previous - Next | All 06/2007 | Recent | 09: Oct | Sept | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | | 08: Dec | Nov | Oct | Sp | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | | 07: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | | 06: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Optics: measuring and testing inventions 06/07Recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.Listing format for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 06/28/2007 > patent applications in patent subcategories. 20070146682 - Photoelectric sensor, range image producing apparatus and method for producing range data: A method for producing a range data includes: irradiating a pulse light toward an object during a first time period; receiving a reflected pulse light during the first time period and a second time period; calculating a ratio between a first or second received light amount and a total received... Agent: Posz Law Group, PLC 20070146683 - Distance measuring method and distance measuring device: A distance measuring method for performing distance measurement by projecting a distance measuring light to an object to be measured and by receiving a reflected light, comprising: a step of projecting for scanning the distance measuring light which has at least one luminous flux with a predetermined spreading angle; a... Agent: Nields & Lemack 20070146684 - Vehicular radar system: A radar system of a vehicle has a zero-cross comparator, an integrator, and a sensor. The comparator compares a light reception signal output from each one of photoreceptive elements with a predetermined standard signal and outputs a comparison signal indicating two different states corresponding to a result of the comparison.... Agent: Harness, Dickey & Pierce, P.L.C 20070146685 - Dynamic wafer stress management system: Systems and techniques for characterizing samples using optical techniques are described. Light may be incident on a sample in the form of a pre-defined pattern which impinges on a wafer surface, and a reflection of the pattern is detected at a detector. Information indicative of changes in the pattern after... Agent: Macpherson Kwok Chen & Heid LLP 20070146686 - Non-invasive method to monitor microcirculation: This invention relates to the non-invasive determination of the degree of vasoactivity in the microcirculation in a tissue caused by a drug, disease, injury normal or pathological regulation. More specifically, the invention relates to a method of determining the influence on microcirculation in living tissue from an irritative agent, drugs,... Agent: Dinsmore & Shohl, LLP 20070146687 - Centering and blocking device for an ophthalmic spectacles lens, an automatic detection method, and associated manual centering methods: The device includes receiver elements (121, 114) for receiving the ophthalmic lens; on either side of the receiver elements, firstly lighting elements (S) for illuminating the ophthalmic lens (103) installed on the receiver elements, and secondly acquisition elements (122, 125, C) for acquiring the shadow of the ophthalmic lens illuminated... Agent: Young & Thompson 20070146688 - Measurement method and apparatus, exposure apparatus, and device manufacturing method: A measurement method measures a wavefront aberration of a target optical system using an interference pattern formed by lights from first and second image side slits. The first image side slit has a width equal to or smaller than a diffraction limit of the target optical system. The measurement method... Agent: Morgan & Finnegan, L.L.P. 20070146689 - Measuring method for optical transfer function, image restoring method, and digital imaging device: In an measuring method for optical transfer function of the invention, irradiating-light from a light source (31) scans an element to be measured within an image sensor of an imaging camera constituted by integrating an imaging optical system and the image sensor. The element to be measured converts sequentially the... Agent: Pearne & Gordon LLP 20070146690 - Apparatus and method for detecting error of transfer system: An apparatus is disclosed for detecting error in a transfer system for transferring a substrate loaded upon fabricating of a liquid crystal display device of a flat panel display device. In an apparatus for detecting error of the transfer system, a test substrate includes reflective marks arranged symmetrically on both... Agent: Brinks Hofer Gilson & Lione 20070146692 - Fiber optic specular surface flaw detection: An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source via a plurality of optical fibers onto the coated substrate, reflecting... Agent: Pepper Hamilton LLP 20070146694 - Fiber optical illumination system: A fiber optical illumination delivery system, which is effective in reducing the effects of source coherence. The system preferably utilizes either a single bundle of optical fibers, or serial bundles of optical fibers. In the single bundle embodiment, the differences in optical lengths between different fibers of the bundle is... Agent: Ladas & Parry 20070146693 - Method and apparatus for simultaneous high-speed acquisition of multiple images: A method and apparatus for simultaneous high-speed inspection and acquisition of multiple data channels is provided. The method and apparatus enables inspecting semiconductor wafers and reticles and comprises converting a single image region into two image sections, reorienting one image into a transposed configuration enabling simultaneous scanning of two inspected... Agent: Smyrski Law Group, A Professional Corporation 20070146691 - Specular surface flaw detection: An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source onto the coated substrate at an oblique angle, reflecting the visible... Agent: Pepper Hamilton LLP 20070146695 - Inspection apparatus, lithographic system provided with the inspection apparatus and a method for inspecting a sample: The invention relates to an inspection apparatus and a method for inspecting a sample, such as a lithographic patterning device or mask, for anomalies, such as contamination particles or defects. The inspection apparatus includes a support structure constructed and arranged to support the sample, and a radiation system constructed and... Agent: Pillsbury Winthrop Shaw Pittman, LLP 20070146696 - Apparatus and method for testing defects: A method for detecting defects on a specimen includes mounting a specimen on a table with which is movable, obliquely projecting a laser as a line onto a surface of the specimen, detecting with an image sensor an image of light formed by light reflected from the specimen and passed... Agent: Antonelli, Terry, Stout & Kraus, LLP 20070146697 - Apparatus and method for testing defects: A defect inspection apparatus includes an illumination optical unit for obliquely illuminating an object with a slit-like shaped laser, a first detection optical unit for detecting a first image formed by light reflected from the object by the illumination of the slit-like shaped laser and reflected in a first direction... Agent: Antonelli, Terry, Stout & Kraus, LLP 20070146698 - Floating cuvette for lens inspection: The invention relates to a cuvette for an ophthalmic lens, for testing the latter using an optical inspection system, said cuvette comprising a hollow space to be filled with a liquid and has an axis coinciding, in the test position of the cuvette, with the optical axis of an inspection... Agent: Novartis Corporate Intellectual Property 20070146699 - Raman spectroscopic apparatus utilizing internal grating stabilized semiconductor laser with high spectral brightness: A Raman spectroscopic apparatus utilizing a broad stripe semiconductor laser as the excitation light source is provided. The output spectrum of the semiconductor laser is narrowed and stabilized by an internal grating to provide high spectral brightness. A high throughput optical system is also disclosed for Raman scattering signal excitation... Agent: Frank F. Tian 20070146700 - Programmable spectral imaging system: An imaging apparatus for obtaining spectral image data from an object that includes: a) a light source; b) an input optics section; c) a programmable spectral filter that conditions the multispectral image bearing light according to a predetermined spectral transmission function; d) a detector array in the path of the... Agent: Pamela R. Crocker Patent Legal Staff 20070146701 - Fluorescence reader based on anti-resonant waveguide excitation: A sample detection system including an anti-resonant waveguide, including a sample having a first index of refraction, a top layer and a substrate surrounding the sample, where the top layer has a second index of refraction, and the substrate has a third index of refraction. The second index of refraction,... Agent: Mark S. Svat Fay, Sharpe, Fagan, Minnich & Mckee, LLP 20070146702 - Method and apparatus for quantifying pigment dispersion quality by paint drawdown: An automated computer-controlled method and apparatus for measuring the quality or fineness of a pigment dispersion sample, comprising placing the pigment dispersion at the deep end of the tapered path of a Hegman gage block, placing the Hegman gage block in a holder in a motorized drawdown device that draws... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center 20070146703 - Systems and methods for detection and classification of waterborne particles using a multiple angle light scattering (mals) instrument: A particle detection system to identify and classify particles is programmed to capture digitized images of the particle generated by directing a light source through a fluid that includes the particle. The particle scatters the light and the scattered light is detected using a detector. The detector creates a digital... Agent: Baker & Mckenzie LLP Patent Department 20070146704 - Sensing photon energies emanating from channels or moving objects: Photons emanating from a channel in a fluidic structure or from moving objects are sensed using a photosensor array in an integrated circuit. The array includes subrange cells that photosense within respective subranges of a photon energy range. For example, the subrange cells can receive photons in their respective subranges... Agent: Leading Edge Law Group, PLC/xerox-parc 20070146705 - Scattered light range of view measurement apparatus: A method and apparatus for determining a range of sight which are capable of monitoring and correcting the operability of the instrument. A light emitter directs an emitted light beam to a measurement zone and a light receiver receives a received light beam from the measurement zone. The emitted light... Agent: Townsend And Townsend And Crew, LLP 20070146706 - Broadband ellipsometer / polarimeter system: According to the invention, said linear polarizer (20) and said substantially achromatic retarder (22) in the PSA (10) are identical to the linear polarizer (13) and the substantially achromatic retarder (21) of the PSG (6) but mounted in a reverse order, said rotating holders (14, 19) run in a stepper... Agent: Young & Thompson 20070146707 - Pattern inspection apparatus and method along with workpiece tested thereby and management method of workpiece under testing: A pattern inspection apparatus for inspecting deterioration of the optical image of a workpiece to be tested is disclosed. The apparatus includes an image acquisition unit operable to capture an optical image of a workpiece under testing, a first memory for storing therein the workpiece image as a fiducial or... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C. 20070146708 - Mark structure, mark measurement apparatus, pattern forming apparatus and detection apparatus, and detection method and device manufacturing method: Since a wafer mark formed on a wafer has a periodic structure that weakens the intensity of even-order diffraction light rather than the intensity of odd-order diffraction light that is the reflected light of illumination light from a light source of an alignment system, measurement error of positional information of... Agent: Oliff & Berridge, PLC 20070146709 - Compact spectral readers for precise color determination: Systems and methods for providing spectral measurements are described. In one embodiment, a spectral measuring device comprises at least one radiation source configured to provide N (N≧2) linearly independent illuxninant sources characterized by M (M≧N) wavelength channels in a predetermined wavelength range; a sensor unit including at least one sensor,... Agent: Zhihao Lin 20070146710 - Imaging system with programmable spectral switch: An imaging apparatus has input optics for obtaining a multispectral image bearing light and a programmable spectral switching section. The programmable spectral switching section has a first lens for directing light toward a dichroic separator that separates the multispectral image bearing light into a plurality of discrete spectral bands, each... Agent: Pamela R. Crocker Patent Legal Staff 20070146712 - Apparatus and method for measuring optical characteristics of an object: Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of an object are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the object being measured. Light from the perimeter fiber optics... Agent: Alan R. Loudermilk Loudermilk & Associates 20070146711 - Miniaturized system and method for measuring optical characteristics: A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second... Agent: Alan R. Loudermilk Loudermilk + Associates 20070146713 - Method for identifying effect pigments in a paint film for field color matching: The present method invention provides a portable method useful for identifying the effect pigments used in developing a color matched formula for a vehicle repair paint. The method comprises observation of effect pigment properties of the coating of a vehicle to be matched, in a field location with a portable... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center 20070146714 - Apparatus and method for transport of microscopic object(s): A system and the method for transport of microscopic objects/particles involving the use of laser source operatively connected to a microscope objective which is adapted to generate optical focal spots on said particle(s) with asymmetric intensity profile in transverse plane followed by varying the said asymmetry of the gradient optical... Agent: Volpe And Koenig, P.C. 20070146715 - Sensor systems for quantification of physical parameters, chemical and biochemical volatile and nonvolatile compounds in fluids: system and method employing a substrate for supporting a highly reproducible sensor array for producing a prerecorded standard response for quantitative analysis of physical, chemical and biochemical parameters are provided. The system includes a substrate for supporting a highly reproducible sensor array, a light source for directing light onto the... Agent: General Electric Company Global Research 20070146716 - Device and method for non-contact sensing of low-concetration and trace substances: A device for non contact detection of low concentration substances outside a laboratory environment is disclosed. A probing laser emission is split into two linear orthogonally polarized emission components and one component is delayed in time relative to the other. Both components are directed to a focal region that is... Agent: Welsh & Katz, Ltd 20070146718 - Optical inspection method and optical inspection apparatus used for the same: An inspection method using a portable optical inspection apparatus adapted to be driven by a battery and capable of producing an accurate sensing result without being adversely affected by the environmental temperature conditions is disclosed. The light is radiated on a sensor chip for a predetermined length of time and... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C. 20070146719 - Scanning apparatus for optically scanning surfaces: A scanning apparatus is provided. The scanning apparatus includes a primary radiation source. A deflection device is operative to deflect a primary beam coming from the primary beam source. A detector is operative to detect a secondary beam that is generated when the primary beam reflects from an object.... Agent: Brinks Hofer Gilson & Lione 20070146717 - Support with a surface structure for sensitive evanescent-field detection: The present invention is concerned with a support (1), in particular an optical disc, with a surface structure for the detection of at least one optically-active substance within the evanescent-field (5) at one surface of the support (1), whereby the surface structure allows the generation of an evanescent-field (5) in... Agent: Philips Intellectual Property & Standards 20070146720 - Spectrometer method and apparatus for near infrared to terahertz wavelengths: In accordance with the principles of the invention, a lamellar grating interferometer breaks the radiation down into its wavelength components. The two sets of teeth of the grating are moved relative to each other. The spectral output of the interferometer is focused on an array of detectors and data is... Agent: Honeywell International Inc. 20070146721 - System and method for measurement of optical parameters and characterization of multiport optical devices: System and method for measurement of optical parameters and characterization of multiport optical devices constituted by process control systems, one or more sources of optical test signal (11) (tunable laser source), optical circuit including optical fiber and several other optical components arranged so as to constitute an interferometric optical arrangement,... Agent: Felix L. Fischer, Attorney At Law 20070146722 - Littrow interferometer: An apparatus and method for measuring displacement includes a light beam directed to an interferometer core that splits the light beam into first and second component beams. The first component beam is directed to a diffraction grating at approximately a Littrow angle. A diffraction is received by the interferometer core... Agent: Agilent Technologies Inc. 20070146723 - Interferometric polarization control: A signal conditioning module provides a polarimeter capability in a photometric system. The module may include multiple variable delay polarization modulators. Each modulator may include an input port, and a first arm formed to include a first reflector and first rooftop mirror arranged in opposed relationship. The first reflector may... Agent: Nasa Goddard Space Flight Center 20070146724 - Vibration-resistant interferometer apparatus: A half mirror 4 divides a luminous flux emitted from a low-coherence light source 1 into two luminous fluxes, a secondary reference plate 6 is held integrally with a reference plate 16, and a secondary sample 8 is held integrally with a sample 17. A first luminous flux which is... Agent: Snider & Associates 20070146725 - Method of and device for thickness measurements of thin films: A method of measuring a thickness of thin films has the steps of irradiating a surface by an optical beam, receiving a reflected signal, analyzing a dependence of the reflected signal on a wavelength, determining a film thickness based on the analysis, and using for the irradiation three wavelengths which... Agent: United States Department Of Energy 20070146726 - Laser digitizer system for dental applications: An intra-oral laser digitizer system provides a three-dimensional visual image of a real-world object such as a dental item through a laser digitization. The laser digitizer captures an image of the object by scanning multiple portions of the object in an exposure period. The intra-oral digitizer may be inserted into... Agent: Law Office Of David H. Judson 20070146727 - System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a... Agent: Bereskin And Parr 20070146728 - Method and device for detecting, determining and documenting damage, especially deformations in lacquered surfaces caused by sudden events: A method and a device for detecting, determining and documenting damage to painted surfaces, especially parts of the bodywork of vehicles, utilizes light from at least one heavily focusing light source directed to a test surface in a grid-type or raster-type manner to produce a surface image on a screen... Agent: Jordan And Hamburg LLP 20070146729 - Displacement transducer with selectable detector area: A displacement measurement device has a detector area which is larger than the area of the beam spot reflected from the measurement surface. The detector area is made larger than the size of the beam spot on the detector area, in order to accommodate shifts in the location of the... Agent: Oliff & Berridge, PLC 20070146730 - Method for determining the position of a first moving component relative to a second component and device for applying said method: A method for determining the position of one of two components in relative motion with respect to each other, using optical means, comprises: directing at least one light beam emitted by a light source attached to one component towards a diffractive support attached to the second component, calculated and manufactured... Agent: Delphi Technologies, Inc. 06/21/2007 > patent applications in patent subcategories.20070139638 - Microscope with led illumination source: Techniques are provided for illuminating cytological specimens using light emitting diodes (LEDs). In one implementation, a pulse width modulated (PWM) LED source allows for color and intensity adjustment. A user may select the desired color and intensity of light, or the desired color and intensity may be electronically calculated. Using... Agent: VistaIPLaw Group LLP 20070139639 - Detector and screening device for ion channels: The invention provides for a detector assembly, fiber assembly and screening system for optical measurements.... Agent: Lisa A. Haile, J.d., Ph.d. Dla Piper US LLP 20070139640 - Lens inspection system using phase contrast imaging: The present invention relates to an inspection system for the automatic inspection of ophthalmic lenses, preferably in an automated lens manufacturing line. The inspection system provides a phase contrast imaging unit and an inspection method using said phase contrast imaging unit designed to recognize defective lenses with an improved degree... Agent: Ciba Vision Corporation Patent Department 20070139641 - Shaft cone metrology system and method: Aspects include metrology methods and systems for determining characteristics of conical shaft portions, such as angle of taper. In an example, a metrology system includes a fixture for supporting a workpiece. The fixture provides for translation in a longitudinal dimension, and rotation about an axis of symmetry. The system may... Agent: Morrison & Foerster LLP 20070139642 - Method for determining position of semiconductor wafer, and apparatus using the same: A light source emits light toward a semiconductor wafer, and a light receiving sensor detects light passing a peripheral edge of the semiconductor wafer. Each coordinates of the peripheral edge of the semiconductor wafer is obtained from a result of the detection. Further, a center of the semiconductor wafer is... Agent: Rader Fishman & Grauer PLLC 20070139643 - Stored light intensity measurement device: A stored light intensity measurement device capable of measuring an afterglow intensity from a light storing sign in a simple way, even if the light storing sign is provided on walls or risers of stairs in facilities or underground shopping mall. The stored light intensity measurement device comprising the light... Agent: Birch Stewart Kolasch & Birch 20070139644 - Methods and apparatuses for applying different color calibrations at different locations in an imaging photometer measurement: Systems and methods for applying different color calibrations at different locations in an imaging photometer measurement are disclosed herein. In one embodiment for example, a method for measuring a source of light having a first area with a first spectral distribution and a second area having a second spectral power... Agent: Perkins Coie LLP Patent-sea 20070139645 - Pattern recognition matching for bright field imaging of low contrast semiconductor devices: Calibration of pattern recognition in bright field imaging systems is disclosed. A target pattern on a substrate on the stage is brought into focus of a bright field system. The image is scanned in a first direction while measuring an edge scattering pattern from a feature of the target pattern.... Agent: Joshua D. Isenberg Jdi Patent 20070139646 - Lithographic apparatus and method: A lithographic apparatus is provided with a measurement apparatus constructed and arranged to use surface plasmon resonance to detect contamination of a surface within the lithographic apparatus.... Agent: Pillsbury Winthrop Shaw Pittman, LLP 20070139647 - Laser-detector-grating-unit: A bar-shaped grating beam-splitter 10 is used for the generation of focus error, tracking error, forward sense and high frequency signal. The beam-splitter is made in bars (40) and is secured to wafer consisting of a plurality of detector chips (14). Securing the bar in position is preferable to securing... Agent: Philips Intellectual Property & Standards 20070139648 - Lithographic apparatus and method: A lithographic apparatus that includes at least one optical surface exposed to a radiation beam, and a surface plasmon resonance measurement apparatus configured to detect contamination of the at least one optical surface.... Agent: Pillsbury Winthrop Shaw Pittman, LLP 20070139650 - Method for measuring the degree of crosslinking of pressure sensitive adhesive: A method for measuring the degree of crosslinking of pressure sensitive adhesive. The method, having the advantages of simple steps and short measuring time, comprises immersing a transparent substrate coated with a pressure sensitive adhesive in a solvent. After a specific period, the haze of the transparent substrate is measured.... Agent: Birch Stewart Kolasch & Birch 20070139649 - Method for evaluation of a scattered light signal and scattered light detector used for carrying out said method: A method of evaluating a scattered light signal generated by a scattered light receiver when detecting especially fine particles in a carrier medium, wherein the scattered light signal runs through a filter algorithm operation to evaluate the scattered light signal subject to specific filter algorithms, the filter algorithm operation being... Agent: Stein, Mcewen & Bui, LLP 20070139651 - Miniature optical beam recombiner using polarization maintaining fibers: A miniaturized optical beam recombiner combines beams from two optical fibers while maintaining the individual polarization mode.... Agent: Agilent Technologies Inc. 20070139652 - Fiber optical assembly for fluorescence spectrometry: A system for analyzing a sample for the presence of an analyte in a sample. The system includes a sample holder for containing the sample; an excitation source, such as a laser, and at least one linear array radially disposed about the sample holder. Radiation from the excitation source is... Agent: Los Alamos National Security, LLC 20070139653 - Mems micromirror surface plasmon resonance biosensor and method: A method of generating surface plasmon resonance using excitation light directed at a thin metal film by a micromirror is described. A method that uses excitation light directed at a thin metal film by a micromirror scanner device is also described. A surface plasmon resonance imager is described comprising a... Agent: Fish & Richardson P.C. 20070139654 - Surface plasmon resonance sensor device: Provided is a surface plasmon resonance sensor device having excellent measurement accuracy. The device is equipped with an optical fiber 2,32 for introducing a light incident from one end thereof to the other end, a core exposed portion 3,33a formed to expose core 5,33 of the optical fiber 2,32, and... Agent: Rankin, Hill, Porter & Clark LLP 20070139655 - Method and apparatus for reducing back-glass deflection in an interferometric modulator display device: Methods and apparatus for reducing back-glass deflection in an interferometric modulator display device are provided. In one embodiment, an interferometric modulator display is provided that includes a including a substrate, an optical stack formed on the substrate, a moveable reflective layer formed over the optical stack, and a backplate attached... Agent: Sawyer Law Group LLP 20070139656 - Measurement of thin films using fourier amplitude: Thin-film thickness and refractive index are measured using the Fourier amplitude of a broadband interferometric spectrum. Due to the smooth nature of the Fourier amplitude as a function of wavelength, as compared to the fast varying Fourier phase conventionally used to measure thickness, increased stability and repeatability of measurement are... Agent: Quarles & Brady LLP 20070139657 - Three-dimensional geometric measurement and analysis system: The present invention intends to provide a measurement system capable of measuring a three-dimensional geometry of a target object over a relatively large area, in a small length of time and by a contact-free method. When a ray of light is cast from a light source onto the target object... Agent: Oliff & Berridge, PLC 20070139658 - Luminous projecting device for the topography of spherical and non-spherical reflective surfaces: A luminous projecting device for the topography of spherical and non-spherical reflecting surfaces, adapted to a slit lamp, and/or any other focused and projected light source illumination system, which uses the illumination system of this equipment as its own lighting source, and evaluates the reflected images of the continuous, concentric... Agent: Kile Goekjian Reed & Mcmanus 20070139659 - Device and method for capturing speckles: A method and device for capturing speckles are described. A highly coherent light emitted from a light source is used to illuminate a surface and produces scattered lights. The scattered lights pass through a light restrictive element and the diffracted lights produced by this restrictive element interfere with one another... Agent: Rabin & Berdo, PC 20070139660 - Laser irradiation apparatus and laser irradiation method and method for manufacturing semiconductor device: The present invention provides a laser irradiation apparatus and a laser irradiation method which can conduct irradiation of a laser beam accurately by correcting misalignment of an irradiation position of the laser beam from the predetermined position due to temperature change. A laser irradiation apparatus includes a laser oscillator emitting... Agent: Nixon Peabody, LLP 06/14/2007 > patent applications in patent subcategories.20070132982 - Method, device, and computer program for determining range to a target: A method, device, and computer program for determining range to a target is disclosed. Specifically, the invention provides a method, device and computer program for determining a second range to a target based on a first range to the target and an angle to the target such that the parabolic... Agent: Hovey Williams LLP 20070132983 - Apparatus for generating date for determining a property of a gemstone: An apparatus configured to generate image data for use in determining a property of a gemstone is disclosed. The apparatus includes a support structure configured to support the gemstone at an observation position such that an axis of symmetry of the gemstone is substantially parallel to an axis of rotation... Agent: Knobbe Martens Olson & Bear LLP 20070132984 - Secure tag: A secure tag comprising: a carrier doped with one or more rare earth ions, and a barrier material associated with the carrier and substantially blocking low-wavelength radiation to shield the rare earth ions from low-wavelength radiation. This enables a secure tag to be fabricated that does not photoluminesce strongly in... Agent: Christopher P. Ricci Intellectual Property Section 20070132985 - Method for determining spin characteristic parameters in spun optical fibers: A method of determining characteristic spin parameters of a spun optical fiber by performing optical time-domain reflectometry measurements on the fiber, so as to obtain a state of polarization spatial function from a backscattered electromagnetic field, the state of polarization spatial function being defined by a plurality of components; and... Agent: Finnegan Henderson Farabow Garrett & Dunner 20070132986 - Liquid crystal module brightness measurement apparatus and brightness measurement apparatus: A brightness measurement apparatus which includes a placement unit on which an object to be measured is placed, a measurement unit for measuring brightness or chromaticity from an upper surface of the object placed on the placement unit, a placement unit moving mechanism for moving the placement unit in an... Agent: Crowell & Moring LLP Intellectual Property Group 20070132987 - Systems and methods for inspecting a wafer with increased sensitivity: Systems and methods for inspecting a wafer with increased sensitivity are provided. One system includes an inspection subsystem configured to direct light to a spot on the wafer and to generate output signals responsive to light scattered from the spot on the wafer. The system also includes a gas flow... Agent: Baker & Mckenzie LLP 20070132988 - Collimated light method and system for detecting defects in honeycombs: A system and method for detecting defective cells in honeycomb bodies which includes a light source which launches and couples light into cells at a first end face of the honeycomb body, and a projection medium which receives the light at a second end face of the honeycomb body. The... Agent: Corning Incorporated 20070132989 - Devices and methods for inspecting optical elements with a view to contamination: Described is an examination system (1) for locating contamination (2) on an optical element (4) installed in an optical system (5), which examination system (1) comprises: a spatially resolving detector (6); imaging optics (7) that magnify in particular at a magnification of between 2 times and 100 times, for magnified... Agent: Walter A. Hackler, Ph.d. Patent Law Office 20070132990 - Surface inspection apparatus: In a surface inspection apparatus that receives, through receiving optical fibers, reflected light from light from a light source projected onto the surface of an article being inspected through a projection optical fiber and generates a two-dimensional image corresponding to the surface of that article being inspected based on the... Agent: Darby & Darby P.C. 20070132992 - Liquid measurement cell having a transparent partition therein: A flow cell for measuring the color properties of a liquid flowing through the flow cell using interrogating radiation at a predetermined wavelength has a thin partition mounted in spaced relationship between both a window and a base of the cell. The partition has a predetermined index of refraction and... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center 20070132991 - System for measuring a color property of a liquid: A system utilizing the flow cell of the present invention includes a reflectance mode spectrophotometer positioned with respect to the flow cell or a probe. Either the flow cell or the probe has a thin partition mounted in spaced relationship with respect to a transparent window. The partition has a... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center 20070132993 - Multiple-wavelength spectroscopic apparatus: In a multi-wavelength spectroscopic apparatus using diffraction gratings, a first diffraction grating is a diffraction grating with diffraction efficiencies of p-polarized light and s-polarized light being equal on a short wavelength side of an operating wavelength range, and a second diffraction grating is a diffraction grating with diffraction efficiencies of... Agent: Staas & Halsey LLP 20070132994 - Optical microscope and spectrum measuring method: An optical microscope according to a first embodiment of the present invention includes: a laser light source; a Y-directional scanning unit moving the light beam in a Y direction; an objective lens; a X-directional scanning unit moving the light beam in a X direction; a beam splitter provided in an... Agent: Edwards Angell Palmer & Dodge LLP 20070132995 - Guidance system: The invention teaches using a directional light source to direct light at a target having directional indicia thereon. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the... Agent: Steven Thrasher 20070132996 - Alignment devices and methods for providing phase depth control: Alignment marks for use on substrates. An exemplary implementation provides phase depth control. A grating mark, for example, can be etched on a silicon wafer with sub-wavelength segmentation in the spacing portion of the alignment grating's period. The sub-wavelength segmentation can be applied to the spaces or to the lines,... Agent: Pillsbury Winthrop Shaw Pittman, LLP 20070132997 - Device and method for examining and calibrating color temperature: A device and method for examining and calibrating color temperature are provided for a color temperature examination/calibration station in a display product line. The color temperature examination/calibration station has a signal generator and a collection device. The signal generator is used to provide signals to the display, such that to... Agent: Reed Smith LLP 20070132998 - Spatial light modulator apparatus and method: A device for discriminately illuminating a sample (22) to be viewed with excitation light (70). For example, an image taken with a CCD (10) provides feedback which is used to modulate the output of an excitation light source (40), thereby allowing a sample (22) to be viewed within the optimal... Agent: Edwards Angell Palmer & Dodge LLP 20070133000 - Method for measuring a color property of a liquid: A method for measuring a color property of a pressurized flowing liquid under test in a way that mitigates the disruption of light is characterized by contacting the liquid under test is against a transparent partition that is spaced a predetermined distance from a transparent window. The partition has a... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center 20070132999 - Probe apparatus for measuring a color property of a liquid: A probe for measuring a property of a liquid under test using interrogating radiation at a predetermined wavelength includes a housing member having a window transparent to interrogating radiation mounted at a first end thereof. A partition transparent to interrogating radiation is mounted in spaced relationship to the window. The... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center 20070133001 - Laser sensor having a block ring activity: A sensitive fluid sensor for detecting fluids and particularly trace fluids. The sensor may be adjustable for detecting fluids of various absorption lines. To effect such adjustment, a tunable laser may be used. The laser may non-tunable with a cavity having moveable mirror(s) for tuning. The laser may be an... Agent: Honeywell International Inc. 20070133002 - Systems and methods for endoscopic angle-resolved low coherence interferometry: Fourier domain a/LCI (faLCI) system and method which enables in vivo data acquisition at rapid rates using a single scan. Angle-resolved and depth-resolved spectra information is obtained with one scan. The reference arm can remain fixed with respect to the sample due to only one scan required. A reference signal... Agent: Withrow & Terranova, P.l.l.c. 20070133003 - System and method for stabilizing light sources in resonator gyro: Methods and apparatus are provided for stabilizing laser light sources of a resonator gyro. A resonator gyro comprises a first light source configured to produce a first input light, a second light source configured to produce a second input light, a resonator coupled to the first and second light sources,... Agent: Honeywell International Inc. 20070133004 - Birefringent optical temperature sensor and method: The invention concerns a tandem interferometer for temperature sensing. The low coherence interferometry (LCI) system comprises a polarization-based sensing interferometer comprising a birefringent crystal having a sensor temperature sensitivity and a birefringence dispersion, and a readout interferometer being either a Fizeau interferometer using an optical wedge or a polarization interferometer... Agent: Ogilvy Renault LLP 20070133005 - Optical analyzers of polarization properties: A passive optical system substantially simultaneously separates light received at an optical input into three or more output light beams on optical outputs. The output light beams may have intensities that are proportional to intensities of optical projections of the received light onto three or more basis vectors of a... Agent: Lucent Technologies Inc. Docket Administrator 20070133006 - Position measurement system: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values The parameter determination... Agent: Oliff & Berridge, PLC 20070133007 - Lithographic apparatus and device manufacturing method using laser trimming of a multiple mirror contrast device: A lithographic apparatus comprises a topography measurement device, a patterning device, and a corrective device. The topography measurement device measures a topography of at least one mechanical element of a patterning device. The patterning device comprises an array of individually controllable mechanical elements that are arranged to impart a pattern... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c. 20070133010 - Off-axis paraboloid interferometric mirror with off focus illumination: An off axis paraboloid mirror is used to provide object illumination in an interferometric imaging system. The light from an object illumination light source diverges from a point apart from the focus point of the paraboloid, proceeds to the parabolic mirror surface, and is reflected as a nearly parallel beam... Agent: Schox PLC 20070133008 - Optical fiber delivered reference beam for interferometric imaging: An optical fiber is used to deliver a reference beam in an interferometric imaging system having an off-axis paraboloid collimating and imaging mirror. A controllable fiber optic beam splitter controls the ratio of light from an optical fiber delivered to an object illumination beam and to the reference beam.... Agent: Schox PLC 20070133009 - Phase shifting imaging module and method of imaging: A phase shifting imaging module in a handheld imager is provided. The phase shifting imaging module includes a first beam splitter configured to split an image radiation beam into first and second image radiation beams. It also includes a first prism configured to align the first and second image radiation... Agent: Patrick S. Yoder Fletcher Yoder 20070133011 - 3d image measuring apparatus and method thereof: A three dimensional (3D) image measuring apparatus and method, which can emit a light towards one surface and another surface of a measurement object by using a plurality of lights and filters, and thereby can remove a shadow area which may incur when measuring a 3D image, is provided. The... Agent: Rosenberg, Klein & Lee 20070133013 - Guidance system: The invention teaches using a directional light source to direct light at a target having directional indicia thereon. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the... Agent: Steven Thrasher 20070133012 - Method and device for determining the actual position of a geodetic instrument: In order to determine the actual position (A) of a geodetic measuring instrument (1) inside a dead range (T) wherein signals originating from a positioning system are shadowed, two reference structures (5) are detected from at least two known positions and the distances associated with the reference structures (5) are... Agent: Workman Nydegger 06/07/2007 > patent applications in patent subcategories.20070127008 - Passive-optical locator: A system comprising a passive-optical locator to generate information indicative of an absolute location associated with a target and a remotely controlled actuator. The passive-optical locator comprises a passive-optical range-finder to generate information indicative of a distance to the target and at least one sensor to generate information indicative of... Agent: Honeywell International Inc. 20070127009 - Multi-modulation frequency laser range finder and method for the same: A multi-modulation frequency laser range finder and a method for the same make use of a crystal oscillator to send out a modulation signal and a sampling signal. After the modulation signal is coupled with a light signal emitted by a laser diode, a laser light beam is generated and... Agent: Rosenberg, Klein & Lee 20070127010 - Lens meter: A lens meter for measuring optical characteristics of a lens to be examined, comprises: a measurement optical system including a measurement optical axis, a light source, and a photo-receiving element; an arithmetic part which determines a deviation of an optical axis of the lens from the measurement optical axis based... Agent: Oliff & Berridge, PLC 20070127011 - Method and apparatus for measuring the angular orientation between two surfaces: A device and method are disclosed that measure the relative angular orientation between two surfaces. Two frames are mounted on the two surfaces to be measured. A collimated light is reflected between the frames and its position is read on a scale. The frame with the collimated light is flipped... Agent: Mark V. Loen 20070127012 - Rate-based range and geolocation: A rate based method for passively determining the range and geolocation of a target from a moving platform. The method includes the steps of determining a speed of the platform in a direction of travel thereof; acquiring the target along a line from the platform; determining an angle between the... Agent: Adams Evans P.A. 20070127013 - Surveying instrument and surveying method: A surveying instrument and method determine a duration of a measuring period for obtaining readings of angle values of an angle measuring system in dependence of readings of an error signal produced by a tracking system. It is thus possible to determine a value of the angle represented by the... Agent: Dinsmore & Shohl LLP 20070127014 - Device and method for performing measurements of the chemical composition of the anterior eye: The present invention relates to a device for determining the chemical composition of a living eye comprising light emitting means, light guidance means comprising at least one first focussing lense (2) having an entry surface (2a) and an exit surface (2b) to be brought in optical contact with the eye... Agent: Birch Stewart Kolasch & Birch 20070127015 - System for projecting flaws and inspection locations and associated method: A system and method for projecting an image onto a workpiece are provided. The system includes a data system capable of providing information indicative of a flaw within the workpiece, wherein the information is based on data acquired by at least one sensor. The system also includes an image-projecting device... Agent: Alston & Bird LLP 20070127016 - Wafer edge inspection: In one embodiment, a system to measure defects on a surface of a wafer and an edge of the wafer using a single tool comprises a radial motor to move an optical head in a radial direction to detect defects at locations displaced from the edge of the wafer, and... Agent: Caven & Aghevli LLC 20070127017 - Qualification of a mask: A method for qualifying printability of a mask, including performing a first inspection of the mask with an optical assembly at a first numerical aperture of collection (NAC) of radiation from the mask, and determining, in response to the first inspection, a first possible defect in the mask and a... Agent: Applied Materials, Inc. 20070127018 - Inspection machine: An inspection machine (M) for checking particularly bottles (F) comprises a conveyor (T) for transporting the bottles along an arched path (2) and past at least one inspection device (A1-A4) associated with the arched path, and at least one illumination device (3) which is arranged below the arched path and... Agent: Marshall, Gerstein & Borun LLP 20070127019 - Collection probe for use in a raman spectrometer system and methods of making and using the same: A photonic crystal based collection probe is provided. The probe includes a photonic crystal configured to guide and condition a beam of Raman scattered photons. Further, the device includes a spectrograph in optical communication with the photonic crystal and configured to receive Raman scattering from the photonic crystal. The device... Agent: General Electric Company Global Research 20070127020 - Optical coupling system of light measuring device and sample: A light measuring device is designed, so that excitation light, emitted by a light source, is guided through an excitation light optical fiber to irradiate a sample, and that fluorescence discharged by the sample is guided to an optical detection system through a receiving light optical fiber. A coupling lens... Agent: Whitham, Curtis & Christofferson & Cook, P.C. 20070127021 - Detection of particles: A device (10) is provided for measuring at least one characteristic (12) related to presence of particles. The device (10) includes a light source unit (16) for emitting light into a region (18) containing particles (20), with the light source being configured to emit light from a plurality of locations... Agent: Kusner & Jaffe Highland Place Suite 310 20070127022 - Method for correlating spectroscopic measurements with digital images of contrast enhanced tissue: A system and method of correlating Raman measurements with digital images of a treated sample and using this correlation to classify the disease state of the sample. A spectroscopic data set is obtained for the sample positioned in the field of view of a spectroscopic device. The positional information about... Agent: Mark C. Comtois Duane Morris LLP 20070127023 - Optical system and method for optically analyzing light from a sample: An optical system for analyzing light from a plurality of samples is provided. The optical system includes a plurality of holders adapted to have samples located therein, a collection lens, a transmission grating, and a reimaging lens. The collection lens is configured to receive and substantially collimate light from the... Agent: Mila Kasan, Patent Dept. Applied Biosystems 20070127024 - Polarization evaluation mask, polarization evaluation method, and polarization determination device: A polarization evaluation mask for evaluating the state of polarization of an illumination light in exposure equipment comprises a transparent substrate; a light interceptor formed in said transparent substrate and having a plurality of fine apertures; a plurality of polarizers formed to cover said plurality of fine apertures and having... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP 20070127025 - Periodic patterns and technique to control misalignment between two layers: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal.... Agent: Parsons Hsue & De Runtz LLP 20070127026 - Substrate alignment apparatus and method, and exposure apparatus: A substrate alignment apparatus which aligns and fixes a substrate on a substrate stage includes a chucking pad fixed on the substrate stage to chuck and fix the substrate, a moving unit which moves the substrate with respect to the substrate stage such that a mark on the substrate stage... Agent: Fitzpatrick Cella Harper & Scinto 20070127027 - Photometer having multiple light paths: A photometer for analyzing a plurality of samples. The photometer comprises a light source and a detector. An optical assembly defines two or more light paths, each light path arranged to carry light from the light source, through a separate sample location, and to the detector.... Agent: Agilent Technologies Inc. 20070127028 - Optical measuring device: The present invention realizes a compact optical measuring device in which a sample solution sampling mechanism and a cleaning fluid producing mechanism are integrated with each other. Provided is an optical measuring device which applies light from a light emitting element to a sample solution in a measuring chamber provided... Agent: Birch Stewart Kolasch & Birch 20070127029 - Laser treatment apparatus: A laser treatment apparatus, configured for treating a workpiece, includes: a first laser generation device, a first optical assembly, a second laser generation device, a second optical assembly, a third laser generation device, and an optical detection device. The first optical assembly is configured for directing a first laser beam... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp 20070127030 - High sensitivity coherent photothermal interferometric system and method for chemical detection: A photo-thermal interferometric spectroscopy system is disclosed that provides information about a chemical at a remote location. A first light source assembly is included that emits a first beam. The first beam has one or more wavelengths that interact with the chemical and change a refractive index of the chemical.... Agent: Celight, Inc. 20070127031 - Backlight unit, driving method of the same and liquid crystal display device having the same: A backlight unit includes a light source including a light emitting diode, a temperature sensor to measure a temperature of the light source, a light source driver to supply power to the light source, and a controller to control the light source driver based on the temperature measured by the... Agent: Stanzione & Kim, LLP 20070127032 - Sampling spectrophotometer comprising an interferometer: A sampling spectrophotometer comprising an interferometer is used for performing a spectral analysis of light produced by a source. The sampling is adapted for eliminating uncertainty in the frequencies that are associated with spectral components deduced from an interferogram. Preferably, the interferometer is of Michelson type, and is equipped with... Agent: Miller, Matthias & Hull 20070127033 - Apparatus using optical coherence tomography based on spectral interference, and an ophthalmic apparatus: An apparatus using optical coherence tomography based on spectral interference and an ophthalmic apparatus, which can accurately obtain information on an object in a depth direction by correcting misalignment between an optical member of a spectral optical system and a photodetector, includes an interference optical system for irradiating measurement light... Agent: Oliff & Berridge, PLC 20070127035 - Data age compensation with avalanche photodiode: A method is disclosed including conditioning a measurement signal from an interferometer, said conditioning characterized by one or more conditioning parameters; measuring a plurality of values for the conditioned measurement signal; providing one or more values indicative of the conditioning parameters; determining an adjustment value at each measured value of... Agent: Fish & Richardson PC 20070127034 - Method for measuring physical quantity of measurement object in substrate processing apparatus and storage medium storing program for implementing the method: A method capable of accurately measuring a physical quantity of a measurement object in a substrate processing apparatus. In a temperature measurement apparatus for implementing the method, two interference positions are measured at different timings when a reference mirror is caused to move in the direction away from a collimator... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C. 20070127036 - Interference measurement system self-alignment method: An interference measurement system self-alignment method, which can be realized through an optical image interference measurement system. The method comprises the following steps of: utilizing the imaging device to get the optical information of the object to be measured and store the optical information thus obtained; performing the inclination adjustment... Agent: Birch Stewart Kolasch & Birch 20070127037 - Position sensor, method for detecting horizontal and vertical position, alignment apparatus including position sensor, and method for horizontal and vertical alignment: A position sensor has an interface structure between negative dielectrics and a dielectric, and is provided with a configuration in which the plasmon intensity with respect to a microstructure in a surface including the interface structure or in the vicinity thereof is detected by the interface structure, and the positional... Agent: Fitzpatrick Cella Harper & Scinto 20070127038 - Optical measuring device: An optical measuring device (20) for measuring a micro displacement or a micro vibration of an object (28) includes a laser emitter (21), an amplifying lens module (23), and a photoelectric sensor (25). The laser emitter is configured for emitting a laser beam at the object so that the object... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp 20070127039 - Proximity detector: Apparatus for detecting proximity between a first object (target object) and a second object (reference object), comprising a light source and a light detector adapted to receive resulting back-scattered light from the reference object when illuminated from the light source, whereby the intensity of back-scattered light to the light detector... Agent: Rothwell, Figg, Ernst & Manbeck, P.C. 20070127040 - System and method for a high performance color filter mosaic array: A method of implementing high-performance color filter mosaic arrays (CFA) using luminance pixels. The introduction of luminance pixels greatly improves the accuracy of the image acquisition process for a given pixel and image sensor size.... Agent: Mcguinness & Manaras LLP 20070127041 - Mechanically-adjustable optical phase filters for modifying depth of field, aberration-tolerance, anti-aliasing in optical systems: An optical imaging system includes optics for imaging a wavefront of electromagnetic radiation to form an image at a detector. The system also includes a plurality of optical phase filters. Each of the phase filters alters phase of the wavefront. The phase filters cooperate to make the system less sensitive... Agent: Lathrop & Gage Lc Previous industry: PhotocopyingNext industry: Facsimile and static presentation processing ###### RSS FEED for 20091112: Integrate FreshPatents.com into your RSS reader/aggregator or website to track weekly updates. For more info, read this article. ###### Thank you for viewing Optics: measuring and testing patents on the FreshPatents.com website. These are patent applications which have been filed in the United States. There are a variety ways to browse Optics: measuring and testing patent applications on our website including browsing by date, agent, inventor, and industry. If you are interested in receiving occasional emails regarding Optics: measuring and testing patents we recommend signing up for free keyword monitoring by email. ### FreshPatents.com Support Results in 1.35584 seconds |
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