Optics: measuring and testing inventions 03/07

20070070327 - Moire interferometric strain sensor: A moiré interferometric strain sensor for detecting strain on a specimen, a diffraction grating being on the specimen, the strain sensor including an array of a plurality of microlenses for receiving at least one reflected beam of at least one incident beam upon the specimen; and a detector array at... Agent: Birch Stewart Kolasch & Birch

20070070328 - Method of determining a property of a fluid and spectroscopic system: The present invention enables to determine the property of a fluid, such as for the purposes of in vivo blood analysis. First the position of a volume of interest through which the fluid flows is determined by means of an optical detection step by making use of an objective. Preferably... Agent: Philips Intellectual Property & Standards

20070070329 - Illumination beam measurement: A method of measuring the angular intensity distribution of an illumination beam produced by an illumination system of a lithographic apparatus includes measuring an angular intensity distribution, placing a first optical element above an object plane of the illumination system which causes light therefrom to be deflected in a first... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070070330 - Method and apparatus for a liquid chemical concentration analysis system: An apparatus utilizes optical reflectivity (REF) to measure concentrations in liquids. The REF optical system is packaged in a compact and cost-effective form factor. An electronic circuit drives the optical system. The miniaturized REF sensor is situated in an optical-fluidic cell or an optical-fluidic manifold with an optical window in... Agent: White & Case LLP Patent Department

20070070331 - Method and apparatus for a liquid chemical concentration analysis system: An apparatus utilizes optical reflectivity (REF) to measure concentrations in liquids. The REF optical system is packaged in a compact and cost-effective form factor. An electronic circuit drives the optical system. The miniaturized REF sensor is situated in an optical-fluidic cell or an optical-fluidic manifold with an optical window in... Agent: White & Case LLP Patent Department

20070070332 - Method for a liquid chemical concentration analysis system: An apparatus utilizes optical reflectivity (REF) to measure concentrations in liquids. The REF optical system is packaged in a compact and cost-effective form factor. An electronic circuit drives the optical system. The miniaturized REF sensor is situated in an optical-fluidic cell or an optical-fluidic manifold with an optical window in... Agent: White & Case LLP Patent Department

20070070333 - Light returning target for a photometer: A light returning target for a photometer. The light returning target comprises a ball lens, and a cradle. The cradle has a hemispherical receptacle in which the lens is intimately received. Preferably, the lens is formed of fused silica, the receptacle is polished sufficiently to reflect, more than it scatters,... Agent: Geoffrey K. Cooper Birdwell & Janke, LLP

20070070334 - Defect inspection apparatus: A defect inspection apparatus includes an illumination optical system which sets a transmission illumination region and a reflection illumination region on an inspection target surface of a mask, first and second imaging units having first and second visual fields which are set on the inspection target surface, an imaging optical... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070070336 - Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected: A method of inspecting a specimen, including: emitting a light from a lamp of a light source; illuminating a specimen on which plural patterns are formed with the light emitted from the light source and, passed through an objective lens; forming an optical image of the specimen by collecting light... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070070335 - Method and system for detecting defects: A method for defect detection includes: (i) scanning at least one wafer by a monitoring system and providing defect size information for each defect that belongs to a group of defects; (ii) scanning the at least one wafer by a wafer inspection system that includes multiple detectors and providing a... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20070070337 - Method and apparatus for detecting defects on a wafer: As circuit patterns become finer in recent years, improvement in detection sensitivity of defects is required. To answer this, sensitivity is being enhanced using a laser with a wavelength of the UV band as the laser for irradiation. A pulse oscillation laser is often used as the UV laser. However,... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070070339 - Inspection method and inspection apparatus: The present invention provides an inspection apparatus and inspection method. The inspection apparatus includes a stage mechanism for supporting an object under inspection. A spatial filter is provided in the detection optical system to inspect the object. A printer is used to print the results of the spatial filter. The... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070070338 - Method and device for examination of nonuniformity defects of patterns: It is possible to detect with high precision a plurality of types of nonuniformity defects that occur in patterns formed on the surface of an examination object. A device (10) for examination of nonuniformity defects that has a light source (12) for emitting light to a photomask 50 whose surface... Agent: Oliff & Berridge, PLC

20070070340 - Remote video inspection system integrating audio communication functionality: Remote viewing devices and methods are provided to communicate audio information to and/or from a user of the remote viewing device. The audio information can serve an entertainment purpose, and/or can be instructional in order to provide training, guidance and/or feedback to the user prior to or during the inspection... Agent: Wall Marjama & Bilinski

20070070343 - Method for correlating spectroscopic measurements with digital images of contrast enhanced tissue: A system and method of correlating Raman measurements with digital images of a treated sample and using this correlation to classify the disease state of the sample. A spectroscopic data set is obtained for the sample positioned in the field of view of a spectroscopic device. The positional information about... Agent: Daniel H. Golub

20070070341 - Nanostructures, systems, and methods including nanolasers for enhanced raman spectroscopy: Nanostructures configured to enhance the intensity of Raman scattered radiation scattered by an analyte include a substantially planar substrate, a plurality of nanoparticles disposed on a surface of the substrate, and a Raman-enhancing material disposed on at least a portion of at least one nanoparticle. Each nanoparticle is configured to... Agent: Hewlett Packard Company

20070070342 - Ultrasonic spray deposition of analytes for improved molecular chemical imaging detection: A device and method is described that uses an ultrasonic nozzle for high efficiency deposition of an analyte. Certain embodiments include a plurality of spray applications over the same spatial location to thereby increase the analyte concentration so as to localize and improve the overall molecular chemical imaging sensitivity and... Agent: Duane Morris LLP

20070070344 - Biochip, biochip reader and biochip reading method: A biochip capable of detecting the positions of sites with ease is provided. A site area is formed on a substrate of the biochip. A plurality of sites are disposed in a matrix fashion on the site area. Four markers are provided around the site area. Respective sites on the... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070070345 - Light amount measuring apparatus and light amount measuring method: A zero point adjustment is performed by generating no signal state of a CCD camera. A state in which stray light does not enter the CCD camera is ensured by a calibration shutter. An output signal of the CCD camera is transmitted to a light amount calculator, and a calibrating... Agent: Sughrue-265550

20070070346 - Semiconductor device and semiconductor device production system: A semiconductor device production system using a laser crystallization method is provided which can avoid forming grain boundaries in a channel formation region of a TFT, thereby preventing grain boundaries from lowering the mobility of the TFT greatly, from lowering ON current, and from increasing OFF current. Rectangular or stripe... Agent: Eric Robinson

20070070347 - Method and apparatus for cmos imagers and spectroscopy: A miniaturized fluidic spectrometer comprises a light source, a fluidic circuit having a plurality of flow channels through which an analyte flows, and a proximity detector array for detecting light from the light source transmitted through the fluidic circuit. Where the light source is broadband, a variable filter is disposed... Agent: Myers Dawes Andras & Sherman, LLP

20070070348 - Optical device and microscope comprising an optical device for the collinear combination of light beams of varying wavelengths: The invention relates to an optical device containing a dispersive element and a projection lens, which define a splitting plane on which a location is assigned to each wavelength. A microstructures element is located on the splitting plane, the element guiding light beams, which emanate from different directions and are... Agent: Simpson & Simpson, PLLC

20070070349 - Optical train and method for tirf single molecule detection and analysis: In one aspect the invention relates to an apparatus for analyzing the presence of a single molecule using total internal reflection. In one embodiment an apparatus for single molecule analysis includes a support having a sample located thereon; two sources of light at distinct wavelengths, a collimator for directing the... Agent: Kirkpatrick & Lockhart Preston Gates Ellis LLP

20070070350 - Biochip reading apparatus and biochip reading method: A site position can be detected using transmitted light or reflected light which does not include an excitation wavelength according to a configuration of a biochip 60. When reflected light is used, a light source 21 is actuated. Light from the light source 21 passes through a barrier filter 22... Agent: Sughrue-265550

20070070351 - Optical measuring device and image forming apparatus: An optical measuring device measures optical characteristics of an object in a non-contact state. The optical measuring device has a light source that illuminates an object surface, a light receiver that receives a light beam reflected from the object surface, and a light-regulating member that regulates an illuminating light beam... Agent: Morgan Lewis & Bockius LLP

20070070353 - Components for optical qubits in the radio frequency basis: The invention is in the filed of optical quantum information processing. This invention concerns the manipulation of single photon qubits in frequency modes, and in particular beamsplitter and a frequency half-wave plate for use in the frequency basis. The frequency beamsplitter comprises: An asymmetric two-path interferometer, reversible down to the... Agent: Morgan & Finnegan, L.L.P.

20070070352 - Device and method for the non-invasive detection and measurement of the properties of a medium: The invention relates to a device useful for non-invasive detection of the properties of a medium by means of interferometry. The device comprises an optical source which is used for illuminating a zone of the medium that is to be probed with a light beam, and an interferometer for splitting... Agent: Miller, Matthias & Hull

20070070354 - Electro-optic imaging fourier transform spectrometer: An Electro-Optic Imaging Fourier Transform Spectrometer (EOIFTS) for Hyperspectral Imaging is described. The EOIFTS includes an input polarizer, an output polarizer, and a plurality of birefringent phase elements. The relative orientations of the polarizers and birefringent phase elements can be changed mechanically or via a controller, using ferroelectric liquid crystals,... Agent: Tope-mckay & Associates

20070070355 - Method and instrument for detecting biomolecular interactions: Method and apparatus for detecting biomolecular interactions. The use of labels is not required and the methods may be performed in a high-throughput manner. An instrument system for detecting a biochemical interaction on a biosensor. The system includes an array of detection locations comprises a light source for generating collimated... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20070070356 - Fiber-optic assay apparatus based on phase-shift interferometry: Apparatus and method for detecting an analyte in a sample based on optical interference. The apparatus includes a light source, detector unit and one or more disposable detector tips. The apparatus also includes an optical coupling assembly that couples light from the source to the detector tips, and from the... Agent: Fenwick & West LLP

20070070357 - Self referencing heterodyne reflectometer and method for implementing: The present invention is directed to a self referencing heterodyne reflectometer system and method for obtaining highly accurate phase shift information from heterodyned optical signals, without the availability of a reference wafer for calibrations. The self referencing heterodyne reflectometer rapidly alternates between a heterodyne reflectometry (HR) mode, in which an... Agent: Rudolph J. Buchel Jr., Law Office Of

20070070358 - Object information sensing apparatus, pointing device, and interface system: Information of an object can be measured from remote points in order to specify a position in an arbitrary space by human control. An object information sensing apparatus (5) measures information of objects (4, 4′, and 4″), which configure at least one pointing device (1, 1′and 1″), in order to... Agent: Fitzpatrick Cella Harper & Scinto

20070070359 - Heating geometric measure equipment: A heating geometric measure equipment (10) for measuring geometric tolerance of a sample (60) under heating atmosphere. The measure equipment (10) includes a temperature controlling case (30) and an optical sensor (20). The case (30) includes a base (40) and a cover (50) having a window (500) clipped on the... Agent: Wei Te Chung Foxconn International, Inc.

20070070360 - System and method for thickness measurement: A system and a method for thickness measurement that comprises providing a first confocal microscope, emitting a first light beam from the first confocal microscope in a first direction, focusing the first beam at a first focal plane, providing a second confocal microscope, emitting a second light beam from the... Agent: Akin Gump Strauss Hauer & Feld L.L.P.

20070064216 - Vehicular radar device: A vehicular radar device detects an object within a detection area on the basis of detection data having a reception intensity exceeding a predefined threshold. The detection data is contained in reflected-wave data on waves irradiated into the detection area outward of a vehicle provided with the vehicular radar device.... Agent: Osha Liang L.L.P.

20070064217 - Theodolite with a laser indicator: A theodolite has a body, a telescope, a laser indicator, pushbuttons and a display. The laser indicator is mounted on the telescope and has a casing, a transmission device, a prism, a laser generator and a base. The transmission device is mounted in the casing. The prism is mounted on... Agent: Birch Stewart Kolasch & Birch

20070064219 - Laser doppler velocimeter: A laser Doppler velocimeter is formed using erbium-doped fiber as the lasing medium. The fiber is diode-pumped. By properly modulating the lasing in the fiber, pulses of radiation may be generated. A telescope acts as the transmission device to focus the radiation at a specified point, and may also act... Agent: Clark & Brody

20070064218 - Optical flow meter for measuring gases and liquids in pipelines: An optical system design for measuring the velocity of fluids flowing through pipes or other conduits is disclosed. The optical system is comprised of a means for delivering two beams through a window in the wall of the pipe, focused to two points aligned along an axis of the pipe... Agent: Oyen, Wiggs, Green & Mutala LLP 480 - The Station

20070064220 - Readhead for optical inspection apparatus: A readhead for illuminating a sample carrier and receiving light from the sample carrier, including a housing for receiving a sample carrier, an array of light sources mounted within the housing in a fixed position relative to the sample carrier, and including first and second light-emitting diodes for emitting substantially... Agent: Toby H Kusmer Mcdermott Will & Emery

20070064221 - Optical characteristic measuring instrument and method, program, and record medium on which, the prgram is recorded: The adverse effect of the deviation of a polarized component on measurement of an optical characteristic is prevented. A second measuring section (25) determines group delay times (τpg, τsg) of the incident light entering an optical fiber (18) from the exit light emerging from the optical fiber (18). If there... Agent: Greenblum & Bernstein, P.L.C

20070064222 - Systems and methods for testing and inspecting optical instruments: Systems and methods for testing and inspecting optical instruments are presented. In one embodiment, an optical instrument comprises a tubular housing having an aperture end and an observing end, wherein the aperture end is adapted to allow light to enter and exit the tubular housing. The optical instrument further comprises... Agent: Honeywell International Inc.

20070064223 - Pattern inspection apparatus: A pattern inspection apparatus is disclosed, which includes a first laser light source for emission of first laser light having a first wavelength, a second laser light source for emission of second laser light having a second wavelength, and a deep ultraviolet (DUV) light source for emission of DUV light... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070064225 - Method and apparatus for detecting defects: A method and apparatus for detecting a defect in which image signals of a same area of a sample are obtained by imaging the sample under different optical conditions, and the obtained image signals are analyzed and optical conditions are selected which modify a contrast in the image signal. Image... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070064224 - Method and device for inspecting a wafer: The present invention relates to a method and a device for the inspection of a wafer. The method comprises the following steps: illuminating at least one section of a surface of the wafer; acquiring an image of the illuminated section of the surface of the wafer using an image acquisition... Agent: Simpson & Simpson, PLLC

20070064226 - Optical flow cell capable of use in high temperature and high pressure environment: An optical flow cell is disclosed that includes a flow cell body having an inlet and an outlet with a flow opening therebetween to allow a fluid to pass therethrough. A light entry fixture and a light imaging fixture are transversely carried by the flow cell body to allow viewing... Agent: Renner, Kenner, Greive, Bobak, Taylor & Weber

20070064227 - Method and apparatus for chemical monitoring: The present invention relates to monitoring chemicals in a process chamber using a spectrometer having a plasma generator, based on patterns over time of chemical consumption. The relevant patterns may include a change in consumption, reaching a consumption plateau, absence of consumption, or presence of consumption. In some embodiments, advancing... Agent: Haynes Beffel & Wolfeld LLP

20070064228 - Multi-wavelength fluorometric system and probe for monitoring of bioprocesses: A fluorometric system for on-line monitoring of biological processes uses a plurality of light sources, each with a different spectral width, to illuminate a sample, the light sources selected to produce emission of fluorescent light, and usually also dispersed light, from the illuminated sample. One of the light sources has... Agent: National Research Council Of Canada 1200 Montreal Road

20070064229 - Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer therefor: A small-spot imaging, spectrometry instrument for measuring properties of a sample has a polarization-scrambling element, such as a birefringent plate depolarizer, incorporated between the polarization-introducing components of the system, such as the beamsplitter, and the microscope objective of the system. The plate depolarizer varies polarization with wavelength, and may be... Agent: Stallman & Pollock LLP

20070064230 - Broadband laser spectroscopy: Apparatus and processes for chemical sensing are disclosed. Embodiments of the present invention comprise a laser device producing a broadband spectral output that can interact with a sample, a wavelength dispersive element, and a detector. The width of the broadband spectral output is greater than or approximately equal to the... Agent: Battelle Memorial Institute Attn:IPServices, K1-53

20070064231 - Tuner module: A turner module including a first carrier, a turner, a second carrier, a turner connector, a digital modulator, a digital decoder, an analog decoder and a display unit is provided. The turner is disposed on the first carrier for tuning the frequency to receive a source signal to generate a... Agent: Rabin & Berdo, PC

20070064232 - Method and system for measuring overlay of semiconductor device: Described is a method and system for measuring overlay of a semiconductor device. The method may include obtaining reference sample data and misaligned sample data from scattering data of a reference sample and misaligned samples, assigning reference fitting values based on the reference sample data and the misaligned sample data,... Agent: Harness, Dickey & Pierce, P.L.C

20070064233 - Method of adjusting optical imaging system, positional deviation detecting mark, method of detecting positional deviation, method of detecting position, position detecting device and mark identifying device: A method of adjusting optical imaging system is provided to finely adjust arrangement of optical elements with sensitivity. Illumination light with a predetermined wavelength band is irradiated to an adjustment mark including first marks disposed at a first pitch and second marks disposed at a second pitch different from the... Agent: Arent Fox PLLC

20070064234 - Color density measuring device: A color density measuring device (10) for determining the color density of an ink layer applied to a printing material (22), having a light source (24) for illuminating the printing material (22) and a sensor for receiving the light remitted from the printing material (22), is characterized according to the... Agent: Casella & Hespos

20070064235 - Surface-plasmon-resonance sensing technique using electro-optic modulation: The present invention provides a sensing method and device based on sensing surface plasmon resonance which can be controlled by the electro-optical modulation. In the case of an integrated-optic device according to the present invention, a voltage is applied on an electro-optical crystal substrate surface with waveguides to modulate the... Agent: Dykema Gossett, PLLC Suite 300 West

20070064236 - Method and circuit for statistical estimation: A method for determining a quality indication, such as a bit error rate or a signal to noise ratio, of a photonic signal is described. The photonic signal is sampled, and then an estimated quality indication, such as the bit error rate, is calculated utilizing statisical analysis of the sampled... Agent: Dunlap, Codding & Rogers P.C.

20070064238 - Confocal microscope apparatus: A confocal microscope apparatus capable of rapidly obtaining a tomographic image using OCT measuring. The confocal microscope apparatus for obtaining a tomographic image of a measuring object includes a light modulating section that modulates the frequency of the reference light. The light modulating section includes: a diffraction grating element for... Agent: Birch Stewart Kolasch & Birch

20070064237 - Optical device for studying an object: The developed device for studying an object ensures straightforward ultimate matching between the arms of an optical interferometer and therefore, high in-depth resolution when being used in clinical and industrial applications. According to the invention at least one arm of the optical interferometer of the device comprises at least one... Agent: Tucker, Ellis & West LLP

20070064239 - Optical tomographic imaging apparatus: OCT measuring that uses an optical fiber and is capable of preventing degradation in the resolution due to the wavelength dispersion of the optical fiber. For controlling the optical path length of the reference light in the OCT measuring, the following are provided: a diffraction grating element for dispersing the... Agent: Birch Stewart Kolasch & Birch

20070064240 - Angle interferometers: Methods and systems for determining information about the incident angle of a beam are disclosed, the method including directing a beam having an s-polarized component and a p-polarized component to reflect from an interface at a non-normal angle, where the non-normal reflection introduces for each component a phase change upon... Agent: Fish & Richardson PC

20070064241 - Tracking algorithm for linear array signal processor for fabry-perot cross-correlation pattern and method of using same: An algorithm and method for calculating an interferometric gap is disclosed that comprises providing an interferometric sensor having a first gap and an interferometric correlation element having a second gap placed in series with the first gap. A correlation burst waveform is generated having a plurality of features wherein the... Agent: Mcdonald Hopkins Co., Lpa

20070064242 - Method and system for obtaining high resolution 3-d images of moving objects by use of sensor fusion: A system to scan 3D images applies sensor fusion of a passive triangulation sensor in combination with an active triangulation sensor to obtain high resolution 3D surface models from objects undergoing arbitrary motion during the data acquisition time.... Agent: Duane Durbin

20070064243 - Method of characterizing substrate warpage: A method of characterizing warpage of a ball grid array (BGA) substrate having solder balls attached to its surface includes scanning each corner and a central portion of the substrate to obtain scanned data and measuring respective coplanarities of the solder balls in the central portion and each corner of... Agent: Freescale Semiconductor, Inc. Law Department

20070064244 - Optical wheel evaluation: A solution for optically evaluating a wheel along at least one circumference of the wheel is provided. Image data is obtained while the wheel moves along a path having a length of at least one circumference of the wheel. The path and/or wheel can be illuminated to enhance the resulting... Agent: Hoffman Warnick & D'alessandro, LLC

20070064245 - Pattern light irradiation device, three-dimensional shape measuring device, and method pattern light irradiation: A light irradiation device for irradiating light having a pattern onto a physical object, includes a pattern forming plate provided with a plurality of opening portions; a light irradiation unit for irradiating light towards the pattern forming plate; and a projection lens irradiated by the light irradiation unit, for integrally... Agent: Osha Liang L.L.P.

20070064246 - Method and system for determining the spatial position of a hand-held measuring appliance: The aim of the invention is to determine the actual position and/or actual orientation of a measuring appliance (4b). To this end, at least two reference points (2b′) lying in a spatial segment (5′) scanned by a laser beam are detected and measured in terms of the distance thereinbetween and... Agent: Workman Nydegger

20070064247 - Use of optical fourier transform for dimensional control in microelectronics: A device for measuring the dimensional or structural characteristics of an object. A detector forms an optical Fourier transform image of an elemental surface of the object in an image focal plane. A processor produces data relating to at least one dimensional and/or structural characteristic of the object from the... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070058154 - System for recording an object space: A system for recording an object space has a opto-electronic distance sensor which uses a signal propagation time method, and a transmitter for transmitting optical, signals, as well as a receiver (E) for receiving optical signals, reflected by objects located in the target space. The system comprises a scanner for... Agent: Buchanan, Ingersoll & Rooney PC

20070058155 - Non-contact measurement device: A handheld device is adapted to perform non-contact measurements to determine distances, angles, arc lengths and radii between select points on physical structures. The device is assembled and contained within a handheld, portable housing and includes various control and input keys, a visual display and three laser components. Each laser... Agent: Robert M. Downey, P.A.

20070058156 - Light wave radar apparatus: A light wave radar apparatus includes a frequency deviation detecting unit 12 for detecting a frequency deviation fchirp of a light signal, and a weighted average processing unit 13 for determining a systematic error ΔVoffset from the frequency deviation fchirp detected by the frequency deviation detecting unit 12, and subtracts... Agent: Birch Stewart Kolasch & Birch

20070058157 - System and method for measuring velocity using frequency modulation of laser output: A system for measuring velocity of a target is disclosed. In one embodiment, the system includes a laser device, a detector and a signal processor. The laser device produces a frequency-modulated laser beam, wherein the frequency-modulated beam is split into at least two laser beams, wherein a reflected beam comprising... Agent: Knobbe Martens Olson & Bear LLP

20070058158 - Measurement and characterization of nonlinear phase shifts: Temporal phase shifts induced by cross-phase modulation in an optical fiber are directly characterized with a spectral equivalent of the Foucault technique used to spatially resolve wavefronts. The temporal phase induced by a high power pulsed pump on a monochromatic probe via cross-phase modulation is converted in a temporal intensity... Agent: Brosemer, Kolefas & Associates, LLC

20070058159 - Method of and apparatus for determining focus of an imaging system: The focus of an optical system (20) can be determined in a reliable and accurate way by arranging a first and second test object (62,64) having a periodic structure at different sides of the focal plane (66) of the optical system and determining the difference in modulation depth of the... Agent: Philips Intellectual Property & Standards

20070058160 - Image inspection method by polarized compensation for deformation of lens: A lens inspection device and method are provided. The lens inspection method includes the steps of providing a collimating light beam, polarizing the collimating light beam by a polarizer to produce a polarized light beam, deflecting the polarized light beam by a lens to be measured to produce a deflected... Agent: The Webb Law Firm, P.C.

20070058161 - Method for augmenting radio positioning system using single fan laser: A method of augmenting a mobile radio positioning system (Mobile_RADPS) by using a stationary fan laser transmitter. A rover comprises the mobile radio positioning system (Mobile_RADPS) integrated with a mobile laser detector. The stationary fan laser transmitter is integrated with a stationary radio positioning system (Stationary_RADPS). The method comprises the... Agent: Law Offices Of Boris G. Tankhilevich

20070058162 - Method of determining a horizontal profile line defined by walls that are essentially vertical, and an apparatus for implementing said method: The invention provides a method of determining a horizontal profile line defined by walls that are essentially vertical, by using a pointer having two calibrated reference points, the method comprising the following successive steps: a) placing the pointer horizontally in contact with a point on the profile line to be... Agent: Mccormick, Paulding & Huber LLP

20070058163 - Multi-point position measuring and recording system for anthropomorphic test devices: The motion of an Anthropomorphic Test Device (ATD) member is measured. For example, the motion of ribs and other components of an ATD or Crash-Test Dummy are tracked during crash testing and dummy calibration using light angle detectors and triangulation techniques.... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20070058164 - Method and apparatus for detecting defects: This invention provides a defect inspection method and apparatus that can easily and quickly determine, from among a plurality of inspection conditions, a condition that allows for an inspection with high sensitivity. The inspection apparatus has a variety of optical functions to cover a variety of kinds of defects to... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070058165 - Raman-active lateral flow device and methods of detection and making: A lateral flow device is disclosed. The lateral flow device includes a substrate having a flow path and a detection zone disposed along the flow path. The detection zone includes an immobilized target-binding moiety directed against a target of a Raman-active complex. A portion of the detection zone has a... Agent: General Electric Company Global Research

20070058166 - Image acquisition, processing, and display: Image data is acquired, processed, and/or displayed in accordance with an embodiment of the present disclosure to display, monitor, and/or demonstrate the progress of an experiment substantially in real-time and with high sensitivity. In one embodiment, at least one time-resolved value of spatially distributed polarization change data is provided and... Agent: Macpherson Kwok Chen & Heid LLP

20070058167 - Smart thin-film coatings and smart polarization devices, smart ellipsometric memory, and smart ellipsometers: A closed-form formula is provided which is used to: 1) design thin-film coatings and transmission-polarization devices for polarization applications: determine the substrate optical constant, and the optical constant and thickness of a film-substrate system and the angle of incidence of operation to perform as a pre-specified optical polarization device at... Agent: Yasser A. Zaghloul

20070058168 - Method and apparatus for backlighting a wafer during alignment: A method and apparatus is provided for illuminating a wafer during wafer alignment using machine vision. An illumination device is fabricated using electroluminescent material, that provides diffuse illumination uniformly over the surface of the lamp to provide backlighting of the wafer. Contrast between the image of the wafer and the... Agent: Cognex Corporation Intellectual Property Department

20070058169 - Multi-layer alignment and overlay target and measurement method: A target system for determining positioning error between lithographically produced integrated circuit fields on at least one lithographic level. The target system includes a first target pattern on a lithographic field containing an integrated circuit pattern, with the first target pattern comprising a plurality of sub-patterns symmetric about a first... Agent: Delio & Peterson, LLC

20070058170 - Method and system for in situ spectroscopic evaluation of an object: A method and system for spectroscopically determining surface and product characteristics is employed for rapid detection of product characteristics and/or the presence or absence of suspected analytes, and the concentration of the analyte. The method and system uses a signal wide band detector that does not require focusing optics in... Agent: King & Schickli, PLLC

20070058171 - Reflectance sensor for measuring liquid pigment preparations or solid pigmented surfaces: The invention relates to reflectance sensors built up from an optical unit, a sample analysis unit and a system control unit, and to a method of measuring the reflectance of a sample in the form of a liquid pigment preparation, and to the use of a reflectance sensor according to... Agent: Basf Corporation

20070058172 - Position measurement unit, measurement system and lithographic apparatus comprising such position measurement unit: A measurement unit to determine a position in a first and second dimension includes a diffraction type encoder and an interferometer. The diffraction type encoder determines by means of a diffraction on a first and a second diffraction grating the position in the first dimension of the second grating with... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070058173 - Position-measuring device: A position-measuring device is for measuring the position of two objects that are movable relative to one another. The device includes a measuring graduation, which is connected to one of the two objects, as well as at least one scanning system for scanning the measuring graduation, which is connected to... Agent: Kenyon & Kenyon LLP

20070058174 - Apparatus and methods for reduction and compensation of effects of vibrations and of environmental effects in wavefront interferometry: A wavefront interferometry system including: a wavefront interferometer that during operation combines a reference beam from a reference object and a measurement beam from a measurement object to generate a combined beam; and a processor system programmed to processes the combined beam to concurrently generate therefrom a control signal and... Agent: Wilmer Cutler Pickering Hale And Dorr LLP

20070058175 - Method and apparatus for 3-dimensional measurement of the surface of an object: In a method for 3-dimensional measurement of the surface of an object, the object is imaged 2-dimensionally, at a first focal distance of at least one CCD camera (3, 30), which can be swiveled in two directions and which is provided with an optical zoom function, and at least one... Agent: Katten Muchin Rosenman LLP

20070058176 - Pixel positioning systems and methods: A manufacturing process for sheet or shaped work products includes advancing the work product in a direction along a processing path; establishing a reference line with respect to the processing path; capturing visual data related to the work product; converting the visual data into a pixel array; and setting a... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20070052947 - Three-dimensional imaging processing module incorporating stacked layers containing microelectronic circuits: A 3-D LADAR imaging system incorporating stacked microelectronic layers is provided. A light source is imaged upon a target through beam shaping optics. Photons reflected from the target are collected and imaged upon a detector array though collection optics. The detector array signals are fed into a multilayer processing module... Agent: W. Eric Boyd, Esq. Irvine Sensors Corp.

20070052948 - Test pattern, inspection method, and device manufacturing method: In a method according to one embodiment of the invention, aberrations in a lithographic apparatus are detected by printing a test pattern having at least one degree of symmetry and being sensitive to a particular aberration in the apparatus, and using a scatterometer to derive information concerning the aberration. The... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070052949 - Refractometer: A refractometer is disclosed having a light source and an optical window to be positioned in a process liquid. A beam of rays is directed from the light source to an interface (RP) between the process liquid and the optical window and leading back part of the beam of rays... Agent: Buchanan, Ingersoll & Rooney Pc

20070052950 - Navigation system using both gps and laser reference: A machine control system uses a laser system and global navigation satellite system to determine the position of the machine. The laser system has a laser detector positioned in a known and fixed relationship with the nominal phase center of a global navigation satellite antenna. The laser detector receives laser... Agent: Dinsmore & Shohl LLP

20070052951 - Method and apparatus for ground-based surveying in sites having one or more unstable zone(s): combining the positional data acquired from: i) the at least one control point (FCP1, FCP2, FCP6, FCP7; CP1-CP3) placed outside the unstable zone and ii) at least one sighting point (UP3-UP5; A-C) within the unstable zone (60; 20), to produce a positional reference for the surveying device(s). The combining step... Agent: Oliff & Berridge, Plc

20070052952 - Optical correction of a laser beam: A laser beam transmitter and a method of calibrating such a transmitter result in a beam of laser light that is projected in a desired direction with respect to a transmitter body. The transmitter and a beam target are positioned such that a properly calibrated beam will illuminate a desired... Agent: Dinsmore & Shohl LLP

20070052954 - Apparatus and method of inspecting the surface of a wafer: An apparatus for inspecting a surface of a wafer includes an illumination device for illuminating an imaging area of the wafer with at least one broad-band spectrum, and an optical imaging device with a detector for polychromatic imaging of the imaging area of the wafer based on the illumination, wherein... Agent: Darby & Darby P.c.

20070052955 - Method and equipment for detecting pattern defect: An Inspection apparatus and method includes utilizing an emitter which emits a light beam, an illumination optical system, a detection optical system, and a processor. The illumination optical system includes a polarization controller, a coherence reducer, and an objective lens, for illuminating a specimen with a polarization condition controlled and... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070052953 - Systems and methods for providing illumination of a specimen for inspection: Systems and methods for providing illumination of a specimen for inspection are provided. One system includes one or more first optical elements configured to illuminate a diffuser with a predetermined pattern of coherent light. The system also includes one or more second optical elements configured to image light exiting the... Agent: Baker & Mckenzie LLP

20070052956 - Flow through cell for optical spectroscopy: A flow through cell (100) for use in a spectrophotometer for analysis of dissolved chemical substances in a flowing liquid stream is made up of at least an intermediate body member (114) located between two other body members (112, 116). The body members are of regular shape, for example rectangular... Agent: Varian Inc. Legal Department

20070052957 - Image forming apparatus capable of producing a high-precision light beam with a simple structure: An image forming apparatus includes an image carrier and an optical scanning device. The optical scanning device generates an optical scanning beam and includes an enclosure. The enclosure includes a pair of arch-like-shaped supporting members. Inside the enclosure there are provided a light source for emitting a light beam, a... Agent: Harness, Dickey & Pierce, P.L.C

20070052958 - Scanning microscope with evanescent wave illumination: A scanning microscope includes a light source for evanescently illuminating a sample disposed on a slide. A point detector receives detection light emanating from a scanning point of the sample. A beam deflection device disposed in an optical path of the detection light can shift a position of the scanning... Agent: Davidson, Davidson & Kappel, Llc

20070052959 - Positioning device for positioning a user by using both eyes as position markers: A user positioning device comprising a stand (1) carrying two positioning markers (5) that are disposed so that each can be seen by a respective one of the eyes of a user, when the user is positioned correctly, and means (7) for forming a light path between each of the... Agent: Birch Stewart Kolasch & Birch

20070052960 - Reference image forming apparatus, pattern inspection apparatus, and reference image forming method, and reticle: A method and apparatus for forming an appropriate reference image in inspection of a pattern of an object to be inspected depending on characteristics of the pattern are disclosed. A reference image forming apparatus includes an optical image acquisition unit which acquires an optical image of an object to be... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.c.

20070052961 - Method for extending the color gamut for dichroic color mixing systems and colored gobos: This disclosure describes a multiple channel dichroic color mixing system or gobo that is comprised of three standard filters, one each of cyan, magenta and yellow, in combination with a fourth “multiband” optical filter with a spectral design that has multiple pass and blocking regions such that, by a suitable... Agent: Dennis L. Cook, Esq. The Law Offices Of Dennis L Cook Pllc

20070052962 - Variable exposure rotary spectrometer and method of use: The present invention relates to instruments used to analyze materials with light-absorbing properties and their methods of use. More specifically, the invention relates to the use of adjustable optical filters whereby light-absorption can be measured in more detail and with greater variables than what is currently known in the art.... Agent: Smith Hopen, Pa

20070052963 - Grouping systematic defects with feedback from electrical inspection: Methods and apparatus for categorizing defects on workpieces, such as semiconductor wafers and masks used in lithographically writing patterns into such wafers are provided. For some embodiments, by analyzing the layout in the neighborhood of the defect, and matching it to similar defected neighborhoods in different locations across the die,... Agent: Patterson & Sheridan, LLP

20070052964 - Method for marking defect and device therefor: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface... Agent: Frishauf, Holtz, Goodman & Chick, Pc

20070052965 - Method and apparatus for performing optical measurements of a material: A method of determining an optical parameter or function thereof for a liquid, the method comprising: flowing the liquid through a flow cell; transmitting a pulse of light into the liquid in the flow cell; generating a signal responsive to energy that the material emits responsive to a portion of... Agent: Wolf, Block, Schorr & Solis-cohen LLP

20070052966 - Electromagnetic energy measurement apparatus and method: An electromagnetic energy measurement apparatus and method for measuring first, second, and third wavelength components includes first and second coated optical elements having non-parallel surfaces. Proper selection of the parameters of the optical elements reduces the level of coma and astigmatism in the apparatus. Additionally, filters pass the first, second,... Agent: Mark Allison Bauman

20070052967 - Method and apparatus for optical interactance and transmittance measurements: A method, system and apparatus for improving at least one of a) optical interactance measurements, b) optical transmittance measurements and c) optical reflectance measurements. The apparatus has a probe having a body portion and an tip portion. The body portion has a central tubular element having an opening therethrough. The... Agent: Mark A. Litman & Associates, P.a. Suite 205

20070052968 - Method and apparatus for controlling the positioning of an optical dithering element: According to one embodiment, a method for controlling positioning of an optical dithering element includes repeatedly driving the optical dithering element approximately between a plurality of desired positions by a generally periodic drive waveform. During a particular period of the drive waveform, the actual position of the optical dithering element... Agent: Texas Instruments Incorporated

20070052969 - Sensor device used to detect interferometric rotational speed and comprising an optical fibre: The fiber-optic interferometric rotation sensor device of the invention comprises a laser source combined with an optical fiber and with a device for making the beam from the laser source interfere with the beam coming from the optical fiber, and, according to one feature of the invention, the laser source... Agent: Lowe Hauptman Gilman & Berner, LLP

20070052970 - Resonator sensor assembly: An improved method and assembly, wherein the method generally includes the steps of providing a coated or uncoated sensor element having an exposed sensing surface; attaching the sensor element to a platform so that the exposed sensing surface is spaced from the platform; and optionally applying a protective layer over... Agent: Senniger Powers (smx)

20070052971 - Fiber-optic sensor coil and current or magnetic-field sensor: A fiber-optic sensor head is disclosed for an optical current or magnetic-field sensor which can have an optical fiber which includes a magnetooptically active sensor fiber which is optically connected to at least one polarization-defining element. The sensor fiber can be arranged in a magnetic field to be measured or... Agent: Buchanan, Ingersoll & Rooney Pc

20070052972 - 4pi microscope: A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer... Agent: Davidson, Davidson & Kappel, Llc

20070052973 - Damage analysis-supporting system: A technique for analyzing damage to a motor vehicle, capable of accurately specifying damage on each component by a simple operation. A damage analysis-supporting system for supporting analysis of damage on a motor vehicle has an image generating-portion (301) and a damage-analyzing portion (303). The image-generating portion (301) imports individual... Agent: Burr & Brown

20070052974 - Three-dimensional modeling from arbitrary three-dimensional curves: The present invention relates to a method and a system for creating three-dimensional models of objects from sets of arbitrary three-dimensional entities obtained from target surfaces. It also provides an efficient method for individually refining the alignment of curves to improve the accuracy of the surface model with a linear... Agent: Ogilvy Renault LLP

20070052975 - Arrangement for the optical distance determination of a reflecting surface: The invention relates to an arrangement for optically determining the distance of a reflecting surface that can be used, in particular, for determining slight variations in distance such as can frequently occur in vibrating systems. Such an arrangement can also be used as optical microphone or hydrophone. The arrangement according... Agent: Novak Druce Deluca & Quigg, LLP

20070052976 - Position measurement system and lithographic apparatus: A position measurement system includes a first position measurement unit configured to measure a position of an object in a first and a second direction, the first position measurement unit including a first sensor and a first grating that extends in a first direction, a second position measurement unit configured... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070052977 - Method and apparatus for end-point detection: An apparatus for detecting the end-point of an electropolishing process of a metal layer formed on a wafer includes an end-point detector. The end-point detector is disposed adjacent the nozzle used to electropolish the wafer. In one embodiment, the end-point detector is configured to measure the optical reflectivity of the... Agent: Hui "david" Wang, President Acm Research, Inc.

20070052978 - Device and method for measuring the thickness of a transparent sample: The invention relates to device for measuring the thickness of a transparent sample (2), particularly a glass strip or a glass pane, involving the use of: a first light beam (L1), particularly a first laser beam, which strikes upon the front surface (8) of the sample (2) at a first... Agent: Striker Striker & Stenby

20070046924 - Projecting light patterns encoding correspondence information: In one aspect, a sequence of light patterns including cells having respective patterns of light symbols is projected onto a scene. The projected sequence of light patterns encodes pixels in a projection plane with respective temporal pixel codes corresponding to respective temporal sequences of light symbols coinciding with the locations... Agent: Hewlett Packard Company

20070046925 - Infrared gas analyzer: An infrared gas analyzer includes a flow sensor placed in a gas flow channel in a state in which two heating resistors are kept with a given spacing. The infrared gas analyzer further includes a substrate having a flat plane placed in parallel with the gas flow direction of the... Agent: Sughrue-265550

20070046926 - Fingerprint identification assembly using reflection to identify pattern of a fingerprint: A fingerprint identification assembly includes a laminated lens having a first lens, a second lens and a third lens formed together with the first lens and the second lens, each of the first lens, the second lens and the third lens has a dielectric film coated thereon. At least one... Agent: Hershkovitz & Associates

20070046927 - Integrated metrology tools for monitoring and controlling large area substrate processing chambers: Embodiments of an apparatus and method of monitoring and controlling a large area substrate processing chamber are provided. Multiple types of metrology tools can be installed in the substrate processing system to measure film properties after substrate processing in a processing chamber. Several number of a particular type of metrology... Agent: Patterson & Sheridan, LLP

20070046928 - Method of evaluating fiber pmd using potdr trace: A method for screening fiber polarization mode dispersion using a polarization optical time domain reflectometer is disclosed. A pulse radiation is emitted into an end of the fiber under test, and the backscattered radiation is measured by the POTDR and used to obtain an OTDR trace. A pulse radiation is... Agent: Corning Incorporated

20070046929 - Measurement method and apparatus, and exposure apparatus: A measurement method for measuring an optical characteristic of a target optical system includes the steps of introducing a light from each of plural patterns that reduce diffracted lights other than a predetermined order, to a different position on a pupil plane of the target optical system, the introducing step... Agent: Morgan & Finnegan, L.L.P.

20070046930 - Scanning apparatus and methods: A method of estimating light output of a lamp in a scanner prior to the lamp being fully warmed-up. The method includes measuring a spectral characteristic of light emitted by a lamp in a scanner at a time t0 prior to the lamp being fully warmed-up and estimating the light... Agent: Lexmark International, Inc. Intellectual Property Law Department

20070046931 - Surface defect inspection apparatus and surface defect inspection method: The present invention aims to provide a surface defect inspection apparatus and a surface defect inspection method for properly inspecting for a concave-shaped flaw (or a part thereof) substantially in parallel with a plane of incidence. The apparatus includes an illumination unit 10 illuminating a front surface (surface under inspection... Agent: Oliff & Berridge, PLC

20070046932 - Optical module: An optical module in which the light outputted from the light source is condensed before outputted, and yet capable of reducing the development of contaminants on the light condensing area. The optical module includes: a light source for outputting light in the short wavelength region; a transparent member having a... Agent: Sughrue Mion, PLLC

20070046933 - Method of instrument standardization for a spectroscopic device: In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process... Agent: St. Onge Steward Johnston & Reens, LLC

20070046934 - Multi-function laser induced breakdown spectroscopy and laser ablation material analysis system and method: A system is described that combines an optical spectrometer and a particle analysis spectrometer for simultaneous and/or sequential analysis of a sample placed in a sample chamber. A laser resonator generates a light beam on the sample in the sample chamber to produce a plasma formation and an aerosol formation.... Agent: Haynes Beffel & Wolfeld LLP

20070046935 - Optical measuring head: A measuring head (4) according to the invention comprises the combination of a zone lens (26), which is preferably a diffractive lens, with a hemispherical lens (23) or a GRIN lens (33). This represents a concept capable of miniaturization, resulting in very slender measuring heads (4) having a high numeric... Agent: Ronald S. Lombard Patents And Trademarks

20070046936 - Color measurement using compact device: Color measurement using compact devices is described herein. A color measurement device can include a diffraction grating that receives light reflected from a surface whose color is being measured. The diffraction grating is responsive to a control signal to split selected components from the reflected light and to admit the... Agent: Lee & Hayes PLLC

20070046937 - Particle size distribution analyzer: An data processing system 4 includes: an integral part 43 which integrates, by two mutually different times, light intensities indicating light intensity signals outputted from light detectors 24 respectively provided for detecting intensities of scattered light and transmitted light generated by irradiating a sample powder S with light and then... Agent: Joseph W. Price Snell & Wilmer L.L.P.

20070046938 - Systems and methods for a multiple angle light scattering (mals) instrument having two-dimensional detector array: A particle detection system uses a reflective optic comprising a curved surface to detect high angle scattered light generated by a particle in a liquid medium, when a laser beam is incident on the particle. When the particles transit the laser beam, light is scattered in all directions and is... Agent: Baker & Mckenzie LLP Patent Department

20070046939 - Methods and systems for positioning sample containing assemblies in an optical device: Method and system for positioning an assembly in an optical device.... Agent: Agilent Technologies Inc.

20070046940 - Positioning system and method using displacements: A method comprising capturing a first image that includes a target on a substrate, adjusting a first relative position between the substrate and a fabrication unit, capturing a second image that includes the target subsequent to adjusting the first relative position, and determining whether a first displacement of the target... Agent: Hewlett Packard Company

20070046941 - Spectrophotometer target distance variation compensation: Spectrophotometer color measurement with a target illumination system and a reflected illumination sensing system where the target surface is variably spaced from said spectrophotometer. Color correction calibration information corresponding to color measurements for known different spacings of a test target surface from the spectrophotometer are obtained and stored. In use,... Agent: Patent Documentation Center

20070046942 - Meter for measuring the turbidity of fluids using reflected light: A meter for measuring the turbidity of a fluid includes a light source for directing a light beam through a fluid under test towards a reflective surface and a sensor for detecting light reflected from the reflective surface and passing back through the fluid under test. The meter outputs a... Agent: Avago Technologies, Ltd.

20070046943 - System and method for self-referenced spr measurements: A system and method of using a refractive index sensor to determine a characteristic of a sample. The operation of the system and method allow for determining a change in a bulk index of the sample, and an amount of sample adsorption, using a reflected beam from an interface of... Agent: Agilent Technologies Inc.

20070046944 - Method of measuring haze and apparatus thereof: The present invention relates to a method of measuring haze including transmitting light, generated by a light source, through a sample; converting the light, transmitted through the sample, into parallel light through a null lens; and separating the light, transmitted through the null lens, into parallel light and diffused light... Agent: Staas & Halsey LLP

20070046945 - Method and apparatus for measuring small shifts in optical wavelengths: A method and apparatus for detecting small shifts in optical wavelength is provided. Light having a known wavelength is directed towards a target volume in the atmosphere. Light reflected from the target volume is received and mixed with differentially delayed copies of itself to produce three interference signals. The interference... Agent: Sheridan Ross PC

20070046946 - Microscope apparatus: An apparatus capable of observing an extremely small region and at the same time observing physical phenomena that occur in extremely short time spans on the order of, for example, several tens of picoseconds to femtoseconds, is provided. The apparatus includes a microscope, and a time-resolved spectroscopy unit, a first... Agent: Kenyon & Kenyon LLP

20070046947 - Laser probing system for integrated circuits: A system for probing a DUT is disclosed, the system having a pulsed laser source, a CW laser source, beam optics designed to point a reference beam and a probing beam at the same location on the DUT, optical detectors for detecting the reflected reference and probing beams, and a... Agent: Sughrue Mion, PLLC

20070046948 - Optical mapping apparatus: Optical mapping apparatus for imaging an object, comprising an optical coherence tomography (OCT) system including an OCT source, an OCT reference path leading from the OCT source to an OCT receiver, an OCT object path leading from the object to the OCT coupler, an OCT depth scanner adapted to alter... Agent: Nixon Peabody, LLP

20070046949 - Coordinate measuring device: The present invention relates to a reference-beam interferometer for determining the position of a traversable stage, wherein an evacuated tube is inserted into the longer of the two interferometer legs. The tube is closed off by windows, which have a negative coefficient of thermal expansion and which can have a... Agent: Houston Eliseeva

20070046950 - Capacitance gap calibration: A method for calibrating a display device comprises controlling an applied voltage to at least one fabry-perot interferometer pixel through a plurality of switches. The at least one fabry-perot interferometer pixel has a top and a bottom plate defining a gap therebetween wherein the at least one fabry-perot interferometer pixel... Agent: Hewlett Packard Company

20070046951 - Apparatus and method for measurement and compensation of atmospheric turbulence effects in wavefront interferometry: A method of operating a wavefront interferometry system that generates an array of interference signals that contains information about relative wavefronts of measurement and reference beams, the method involving: from the array of interference signals, computing a first array of phase measurements for a first time and a second array... Agent: Wilmer Cutler Pickering Hale And Dorr LLP

20070046952 - Apparatus for measuring waveform of optical electric filed, optical transmission apparatus connected thereto and a method for producing the optical transmission apparatus: An electric field waveform of an optical signal is precisely measured with high time resolution. Particularly, determination of inter-symbol interference has been difficult. Output light from the laser source is divided into first and second portions. The first portion is modulated by an optical modulator. The second portion is delayed... Agent: Stanley P. Fisher Reed Smith Hazel & Thomas LLP

20070046953 - Interferometer and method for measuring characteristics of optically unresolved surface features: Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parameterized by a series of characteristics that relate to one or... Agent: Fish & Richardson PC

20070046954 - Method of verifying consistent measurement between a plurality of cd metrology tools: A method of matching CD-SEM's to ensure consistent measurements over an installed base of SEM's is disclosed by measuring with each of a plurality of scanning electron microscopes the feature size of resist features in at least two positions on the substrate such that field-to-field variations, and reticle and exposure... Agent: Pillsbury Winthrop Shaw Pittman, LLP