Optics: measuring and testing inventions 12/06

20060290917 - Chirped synthetic wave laser radar apparatus and methods: Chirped synthetic wave laser radar apparatus and methods are disclosed. In one embodiment, a system includes a laser source, a controller operatively coupled to the laser source and adapted to frequency-modulate first and second laser outputs, and an optical assembly. The optical assembly includes a plurality of reference channels adapted... Agent: Lee & Hayes, PLLC

20060290918 - Method for wavelength independent dispersion penalty measurement: The present invention provides a method for the wavelength independent measurement or testing of the dispersion penalty, or dispersion tolerance, of optical transmitters that comprises a single setup, measures or tests the components only to a specified amount of dispersion, and not beyond, improves yield, and reduces component cost. This... Agent: Dougherty Clements

20060290919 - Method for testing the generation of scattered light by photolithographic imaging devices: A method for testing the generation of scattered light by photolithographic imaging devices is disclosed. In one embodiment, measuring structures that are to be imaged in a photoresist are provided in the vicinity of deliberately structured sections that cause scattered light in the imaging device to be tested, in a... Agent: Dicke, Billig & Czaja, P.l.l.c.

20060290920 - Method for the calibration of a distance image sensor: A method for the at least partial calibration of a distance image sensor for electromagnetic radiation mounted on a vehicle is described by means of which a detection range along at least one scanned area can be scanned and a corresponding distance image can be detected in relation to an... Agent: Harness, Dickey & Pierce, P.L.C

20060290921 - Method and apparatus for remotely detecting presence: An apparatus for detecting a person's presence without requiring the person to provide auditory or tactile input. The invention may be incorporated into an electronic device, such as a desktop computer or notebook computer. The embodiment may employ a variety of radiation emissions to determine when a person enters the... Agent: Dorsey & Whitney, LLP Intellectual Property Department

20060290922 - Apparatus and method for color filter inspection: The present invention provides an apparatus and method for detecting flatness and/or unevenness of a surface of an overcoat layer on a colored pixel layer of a color filter with a high degree of accuracy. The apparatus includes: a light source 34, placed almost directly above the surface of a... Agent: International Business Machines Corporation Dept. 18g

20060290923 - Method and apparatus for detecting defects: A method and apparatus for detecting defects are provided for detecting harmful defects or foreign matter with high sensitivity on an object to be inspected with a transparent film, such as an oxide film, by reducing noise due to a circuit pattern. The apparatus for detecting defects includes a stage... Agent: Antonelli, Terry, Stout & Kraus, LLP

20060290924 - Three dimensional analyzing device: A three-dimensional analyzing device includes a first beam source for generating a first beam, a second beam source for generating a second beam, an optical system for spatially overlapping the first and second beams at least partly and irradiating the beams onto a specimen to three-dimensionally confine a photoactive region... Agent: Frishauf, Holtz, Goodman & Chick, PC

20060290925 - Gas monitor device: The monitor device according to the invention comprises an axial excroissance bounded by a gastight peripheral wall permeable to magnetic fields and connected to a chamber, such as a process chamber, where gaseous species to be monitored are present. A light radiation sensor is placed at the end of the... Agent: Sughrue Mion, PLLC

20060290927 - Directed color standard and method for using same: The present invention discloses a method for establishing a directed color standard. Color reflectance data is measured from a fabric to construct an initial color standard. Because all fabrics have inherent quality fluctuations, a second series of color reflectance measurements are taken at various locations on a fabric. The second... Agent: Ward & Olivo

20060290926 - Spectrophotometer: A spectrophotometer having an optical system for directing a beam of substantially monochromatic excitation light to a liquid sample contained in a well (3) of a well plate for interaction with the sample for absorption or emission measurements to analyse the sample. The optical system includes two apertures (46, 28)... Agent: Varian Inc. Legal Department

20060290929 - Method for calibrating spectral characteristics of a spectral analyzer and a spectral analyzer applying said method: The differences between the center wavelength and half bandwidth of the spectral sensitivity of each pixel of a sensor array in a spectral analyzer to be calibrated and the preprovided respective standard values of the center wavelength and the half bandwidth are expressed as functions of a pixel number (linear... Agent: Brinks Hofer Gilson & Lione

20060290928 - Photodiode array: A photodiode array for entering incident light a spectroscope device equipped with a wavelength dispersion element and detecting light emanating from the spectroscope device. The arrangement of each of photodiode elements constituting the photodiode array is displaced.... Agent: Sughrue Mion, PLLC

20060290930 - Method and apparatus for inspecting pattern defects: The present invention relates to a pattern defect inspection apparatus, wherein light emitted from an illumination source capable of outputting a plurality of wavelengths is linearly illuminated by an illuminating optical system. Diffracted or scattered light due to a circuit pattern or defect on a wafer is collected by an... Agent: Antonelli, Terry, Stout & Kraus, LLP

20060290931 - System for measuring periodic structures: A periodic structure is illuminated by polychromatic electromagnetic radiation. Radiation from the structure is collected and divided into two rays having different polarization states. The two rays are detected from which one or more parameters of the periodic structure may be derived. In another embodiment, when the periodic structure is... Agent: Parsons Hsue & De Runtz LLP

20060290932 - Photographing device with auto focusing function: A focusing device includes a distance measurer, a focus adjuster, a focusing judge, and an area display. The focus adjuster measures area subject distances that are distances to a plurality of distance-measuring areas on a subject. The focus adjuster adjusts a focus to focus on the distance-measuring area. The focusing... Agent: Greenblum & Bernstein, P.L.C

20060290933 - System and method for monitoring plant conditions: A system and method of monitoring plant conditions is disclosed where an optical element is enabled to collect incident light reflected from a plant, an optical bandpass filter is enabled to eliminate wavelengths of the incident light outside a plurality of desired spectral bands, and a spectrum capture element is... Agent: Motorola, Inc.

20060290934 - Gas sensor: A gas sensor includes at least two light source, projection optics and a light-reflecting chamber provided with at least one light entry opening. The gas sensor further includes a detector that cooperates with the chamber, by means of which detector light from the light source can be detected. The at... Agent: Hoffmann & Baron, LLP

20060290935 - Process for corrosion control in boilers: A corrosion control process is described. The process is especially useful in the control of chloride corrosion in waste to energy boilers. Corrosion of high temperature surfaces can be assessed by the monitor and controlled introduction of treatment chemicals by targeted in furnace injection reduces corrosion while maximizing combustion efficiency.... Agent: Thaddius J. Carvis

20060290936 - Apparatus for measuring goniometric reflection property of sample: An apparatus for measuring a goniometric reflection property of a sample has: one or more illuminators; a toroidal mirror which is rotationally symmetrical around a center axis effectively contacting with a surface of the sample; a light receiver having an incident aperture on the center axis; a rotating optics which... Agent: Brinks Hofer Gilson & Lione

20060290937 - Wavelength monitor: A wavelength monitor includes the following elements. An optical divider divides a beam of measured light into first and second divided beams of meal light. An interfering element converts the first and second divided beams of measured light into first and second parallel beams of measured light to cause interference... Agent: Sughrue Mion, PLLC

20060290938 - Array and method for the spectrally resolving detection of a sample: Disclosed are an array and a method for the spectrally resolving detection of a sample (22) that is illuminated by means of an illuminating radiation (12) by detecting a sample radiation (24) emitted by the sample (22). Said array comprises an illuminating beam path via which illuminating radiation (12) can... Agent: Pendorf & Cutliff

20060290939 - Method and apparatus for full phase interferometry: An apparatus and method for differential spectral interferometry comprising providing an interferometer comprising a light source; employing an element to provide a dithered relative phase shift between target and reference arms of the interferometer, detecting output from the interferometer, demodulating signals received from the detector at different multiples of the... Agent: Peacock Myers, P.C.

20060290940 - Ring laser gyroscope combination sensor: A ring laser gyroscope is described that includes a laser block having a laser cavity, a readout mirror adjacent a portion of the laser block, and a sensor. The laser block is configured to propagate both a clockwise and a counter-clockwise laser beam within the laser cavity. The readout mirror... Agent: Honeywell International Inc.

20060290941 - Polarization control for quantum key distribution systems: A quantum key distribution system includes an optical transmitter that generates a multiplexed QKD data and polarization reference signal, wherein a relative polarization of a QKD data signal component and a polarization reference signal component of the multiplexed QKD data is known. A quantum channel propagates the multiplexed QKD data... Agent: Rauschenbach Patent Law Group, LLC

20060290942 - Free-form optical surface measuring apparatus and method: A surface measuring apparatus for measuring a surface shape of an element includes a measurement frame having a mount for mounting the element to be measured, a stage including a rotatable device, the stage being movable in at least a first direction relative to the measurement frame, and a contactless... Agent: Young & Thompson

20060290943 - High precision interferometer apparatus employing a grating beamsplitter: Measurement of a distance change between a reference surface and a target is provided. A substrate has a first surface facing the target and including a grating. The grating and target combine to form an optical interferometer responsive to changes in distance between the grating and the target. A second... Agent: Lumen Intellectual Property Services, Inc.

20060290944 - Method and apparatus for photoacoustic measurements: Photoacoustic instruments and their methods of use are disclosed. Certain disclosed photoacoustic instruments include a resonator cavity, an acoustic detector, a laser, an optical power detector, and a scattering detector. Further disclosed photoacoustic instruments include a resonator cavity, an acoustic detector, an optical power detector, a plurality of laser beams,... Agent: Klarquist Sparkman, LLP

20060290945 - Three-dimensional measuring system: A three-dimensional measuring system for measuring a three-dimensional shape of a measurement object in a noncontact manner includes a first obtaining portion for obtaining arrangement information of the measurement object, a second obtaining portion for obtaining design shape information of the measurement object, a fourth obtaining portion for obtaining specifics... Agent: Sidley Austin LLP

20060290946 - System and method for measuring roundness: A system (10) for measuring roundness of an object (30), includes a laser-emitting device for emitting a laser beam (123), a driving apparatus (16) for moving the object with respect to the laser beam, a photodetector unit (141) and a processor (143). The photodetector unit receives the laser beam crossing... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20060290947 - Optical metrology model optimization for repetitive structures: An optical metrology model for a repetitive structure is optimized by selecting one or more profile parameters using one or more selection criteria. One or more termination criteria are set, the one or more termination criteria comprising measures of stability of the optical metrology model. The profile shape features of... Agent: Morrison & Foerster LLP

20060285103 - Optical beam separation element, measuring apparatus and method of measuring: An optical beam separation element for a measuring apparatus includes a reflecting component with a reflecting surface and an aperture for forming an optical channel common to the transmission and the reception directions in the optical beam separation element. The reflecting surface of the reflecting component is positioned at an... Agent: Leon Nigohosian, Jr. Specialty Minerals Inc./minteg International Inc.

20060285102 - Distance measuring device and method thereof: A distance measuring device is provided that reduces the time required for a distance measurement without degrading accuracy of the measured value. The distance measuring device includes a reference signal oscillator (26) that generates a reference signal (K), a light source (20) that emits a distance measuring light (L) modulated... Agent: Nixon Peabody, LLP

20060285104 - Molecular imager: 13 An apparatus for testing and determining a biological function based upon blood samples comprising a specimen holder for holding a blood sample; a light on the specimen; a molecular imager for viewing the specimens; and a software program for determining a medical problem based upon an aspect of the... Agent: NationalIPRights Center, LLC Scott J. Fields, Esq.

20060285106 - Method and apparatus to generate and monitor optical signals and control power levels thereof in a planar lightwave circuit: Embodiments of an optical detection apparatus are disclosed which may include one or more of a waveguide, a trench formed in the waveguide, a reflective surface, and a photodetector. The waveguide may be formed in a semiconductor substrate to propagate an optical signal received at a first end of the... Agent: Blakely Sokoloff Taylor & Zafman

20060285105 - Polarized lightwave reflectometry method (potdr): A polarized lightwave reflectometry method including the steps of sending at least two polarized light signals into the optical fiber to be tested, the signals presenting a determined angular offset relative to each other so that the polarization mode dispersion coefficient remains independent of any rotation of polarization in the... Agent: Sughrue Mion, PLLC

20060285107 - Method for sensing and controlling radiation incident on substrate: A system is disclosed that is using a high energy point like source illuminator comprising an ultraviolet source, where the source is being energized by a variable power supply that is controlled by a UV sensor and microprocessor. The energy from the illuminator is focused in the proximal end of... Agent: Irving Keschner

20060285108 - Optical emission device with boost device: A device for optical emission spectroscopy comprising a chamber comprising an atomization source, at least one boost device configured with a radio frequency source to provide radio frequency energy to the chamber, and an optical detector configured to detect optical emission of species in the chamber is provided. In certain... Agent: Lowrie, Lando & Anastasi

20060285109 - Compact spectrometer: The present invention is directed to method and apparatus for measuring the spectral characteristics of an object from a formed object generated input signal. The method comprises the steps of directing the input signal onto a diffraction grating. Diffracted signals are directed to a resonant mirror assembly for sequentially focusing... Agent: Mueller And Smith, Lpa Mueller-smith Building

20060285110 - Apparatus and method for enhanced critical dimension scatterometry: Scatterometers and methods of using scatterometry to determine several parameters of periodic microstructures, pseudo-periodic structures, and other very small structures having features sizes as small as 100 nm or less. Several specific embodiments of the present invention are particularly useful in the semiconductor industry to determine the width, depth, line... Agent: Perkins Coie LLP Patent-sea

20060285111 - Apparatuses and methods for enhanced critical dimension scatterometry: Apparatuses and methods for evaluating microstructures on workpieces are disclosed herein. In one embodiment, a scatterometer comprises an irradiation source, an optic member, and an object lens assembly. The irradiation source can be a laser that produces a beam of radiation at a wavelength. The optic member is aligned with... Agent: Perkins Coie LLP Patent-sea

20060285112 - Methods and systems for determining drift in a position of a light beam with respect to a chuck: Methods and systems for determining drift in a position of a light beam with respect to a chuck are provided. One method includes illuminating a surface with the light beam. The surface has a predetermined position with respect to the chuck during illumination. The method also includes generating signals responsive... Agent: Daffer Mcdaniel, LLP

20060285113 - Reticle alignment technique: A method for aligning a reticle is provided. A first patterned layer with a first alignment grid is formed. Sidewall layers are formed over the first patterned layer to perform a first shrink. The first alignment grid after shrink is etched into an etch layer to form an etched first... Agent: Beyer Weaver & Thomas, LLP

20060285115 - Fluid analysis element and fluid analysis apparatus: A fluid analysis element includes: a semi transmissive/semi reflective first reflector; a transmissive apertured member, having a plurality of apertures, with diameters sufficiently smaller than the wavelength of measuring light, formed therein for holding a fluid sample; and a second reflector, which is fully reflective or semi transmissive/semi reflective. The... Agent: Sughrue Mion, PLLC

20060285114 - Gas detection and photonic crystal devices design using predicted spectral responses: In detecting presence of a gas, light passes through a photonic crystal cavity configured to sample a gas and receive light. The light has a wavelength that at least partially falls within a specific absorption wavelength of the gas. At least one parameter of a band gap spectrum is generated... Agent: Fitzpatrick Cella Harper & Scinto

20060285116 - Retro-reflector assembly and opacity monitor incorporating same: A retro-reflector assembly (1) for incorporating in an opacity monitor, includes several small corner-cube prisms (2) of cylindrical section. The invention also includes an opacity monitor incorporating a retro-reflector assembly as defined above.... Agent: Trexler, Bushnell, Giangiorgi, Blackstone & Marr, Ltd.

20060285117 - Apparatus and method for characterizing pulsed optical signals: The coherent interference effect between two beam is used with one light beam delayed by a controllably variable time delay with respect to another analogous beam to obtain a convolutional profile of the oscillatory component of the interference amplitude as a function of the time delay, having a peak value... Agent: Allen, Dyer, Doppelt, Milbrath & Gilchrist P.A.

20060285118 - Solid-state gyrolaser stabilised by acousto-optic devices: The field of the invention is that of solid-state laser gyros. One of the major problems inherent in this technology is that the optical cavity of this type of laser gyro is by nature highly unstable. To reduce this instability, the invention proposes to introduce, into the cavity, controlled optical... Agent: Lowe Hauptman Gilman & Berner, LLP

20060285119 - Active control and detection of two nearly orthogonal polarizations in a fiber for heterodyne interferometry: A polarization control system includes a light source that generates two light beams with different polarization states and optical frequencies. A polarization state modulator changes the polarization states of the two light beams. A first detector path generates a first beat signal from the two light beams passing through a... Agent: Agilent Technologies Inc.

20060285120 - Method for monitoring film thickness using heterodyne reflectometry and grating interferometry: A linearly polarized light comprised of two linearly polarized components, orthogonal to each other and with split optical frequencies, is directed toward a film. A detector receives the beam prior to incidence on the film layer and generates a reference signal. The reflected beam is diffracted into zeroth- and first-order... Agent: Rudolph J. Buchel Jr., Law Office Of

20060285121 - Optical stacked structure inspecting method and optical stacked structure inspecting apparatus: An inspecting method inspects an optical stacked structure having a reflection layer and at least one light transmitting thin film sequentially stacked on a substrate. The inspecting method irradiates inspection light on the optical stacked structure from a side provided with the light transmitting thin film, measures a light intensity... Agent: Dickstein Shapiro LLP

20060285123 - Method and apparatus for tilt corrected lateral shear in a lateral shear plus rotational shear absolute flat test: A Fizeau or other interferometer is used to provide high resolution, in-situ calibration of an external angle measurement system such as widely spaced high stability plane mirror interferometers (HSPMIs)). The calibrated measurement system then measures mechanical tilt during shearing. The tilt data is used to correct the sheared data, preferably... Agent: Francis J. Caufield

20060285122 - Surface profiling apparatus: A broad band surface profiling apparatus including a reference calibrator for calibrating the apparatus to compensate for surface features of the reference surface. A user is instructed to conduct calibration measurement operations using a calibration sample having a calibration surface to obtain calibration surface topography data for the calibration sample.... Agent: Ratnerprestia

20060285124 - Apparatus and method for in situ and ex situ measurements of optical system flare: Apparatus and methods for in situ and ex situ measurements of spatial profiles of the modulus of the complex amplitude and intensity of flare generated by an optical system. The in situ and ex situ measurements comprise interferometric and non-interferometric measurements that use an array of diffraction sites simultaneously located... Agent: Wilmer Cutler Pickering Hale And Dorr LLP

20060285125 - Laser apparatus: A laser apparatus is disclosed. An optical element receives at least a part of laser light emitted from a laser generation source and generates interference fringes. Each of first and second two-divided detectors has two detectors arranged in the direction of which the interference fringes appear. Each of the detectors... Agent: Sonnenschein Nath & Rosenthal LLP

20060279723 - Optical delay line to correct phase errors in coherent ladar: A ladar system with phase correction. The novel ladar system includes optics for receiving a first signal that is a reflected version of a transmitted laser signal, an optical delay line for providing a second signal that is a delayed version of the transmitted laser signal, and a mechanism for... Agent: Raytheon Company Bldg. E04, Mail Stop: N119

20060279725 - Aggregometer with near ultraviolet light source: An aggregometer has a radiation path along which radiation can pass, a sample receiving area located along the radiation path, a short-wavelength LED that transmits radiation along the radiation path through the sample receiving area, a detector positioned along the radiation path for detecting radiation transmitted from the short-wavelength LED,... Agent: Volpe And Koenig, P.C.

20060279724 - Micro-volumetric blood radioactivity counter: The present invention relates to a detector assembly, comprising at least one beta radiation detector, and a conduit for drawing from a subject blood in which a radiotracer has been injected, at least a portion of the conduit extending adjacent to the beta radiation detector to detect beta radiation from... Agent: Fay Kaplun & Marcin, LLP

20060279726 - Facial liveness assessment system: A system for assessing whether or not a subject's face is a real face is described. The face of the subject is illuminated under different illumination conditions, and images of the subject are obtained for each different illumination condition. The difference between the images obtained at different illumination conditions can... Agent: Stites & Harbison PLLC

20060279727 - Combination laser detector and global navigation satellite receiver system: A combination laser detector and global navigation satellite antenna has a laser detector positioned in a known and fixed relationship with the nominal phase center of an included global navigation satellite antenna. The offsets for these elements may be fixed, simplifying set up.... Agent: Dinsmore & Shohl LLP One Dayton Centre

20060279728 - Vehicle lift reference system for movable machine-vision alignment system sensors: A method for enabling a vehicle wheel alignment system to compensate an imaging sensor coordinate system for changes associated with adjustments to the pose of an imaging sensor, following movement of a vehicle lift mechanism supporting a vehicle undergoing a vehicle wheel alignment procedure.... Agent: Polster, Lieder, Woodruff & Lucchesi

20060279729 - Method of inspecting semiconductor wafers taking the saw design into account: The present invention relates to a method of inspecting a wafer, wherein the wafer has a first area of periodically arranged SAWs and at least one second area of SAWs displaced with respect to the first area. The method comprises the steps of optically imaging the first area of the... Agent: Houston Eliseeva

20060279730 - Chirp indicator of ultrashort optical pulse: There is provided a chirp indicator of ultrashort optical pulse in which a target ultrashort optical pulse is introduced into a spatial filter formed of a hologram in which is recorded information of chirp quantity of an ultrashort optical pulse used as a reference. The chirp indicator identifies the chirp... Agent: Wenderoth, Lind & Ponack, L.L.P.

20060279731 - Process and device for determining the quality of a weld seam or a thermal spray coating and application: In material depositing processes such as welding or thermal spraying the large variety of processes and material parameters necessitate a broad range of the resulting characteristics of the applied material. The task of the present invention is comprised of providing a process and a device for determining the quality of... Agent: Akerman Senterfitt

20060279732 - Spectroscopic sensor on mobile phone: This invention discloses a spectroscopic sensor that is integrated with a mobile communication device, such as a mobile phone. The spectroscopic sensor is capable of measuring the optical spectra of a physical object for purposes of detection, identification, authentication, and real time monitoring. Through the mobile communication device, the obtained... Agent: Frank F. Tian

20060279733 - Spectroscopic analyzing apparatus: The present invention relates to a spectroscopic analyzing apparatus having a structure for enabling detection of a continuous spectrum over an overall detecting region by sharing the overall detection wavelength range to a plurality of detectors. The spectroscopic analyzing apparatus has a spectroscope, a plurality of detectors, and direction changers... Agent: Drinker Biddle & Reath (dc)

20060279734 - Thermal control of optical components: A linearized thermal and optical model of an optical integrated circuit can be used to temperature-stabilize one or more optical elements of the circuit using active temperature regulation. To stabilize a single optical element, such as an arrayed waveguide grating (AWG), a temperature sensor and a heater can be provided... Agent: Amin, Turocy & Calvin, LLP

20060279735 - Application of 2-dimensional photonic crystals in alignment devices: Application of 2-Dimensional Photonic Crystals in Alignment Devices Alignment marks for use on substrates. In one example, the alignment marks consist of periodic 2-dimensional arrays of structures, the spacing of the structures being smaller than an alignment beam but larger than an exposure beam.... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20060279736 - Methods and apparatus for evaluating insulating glass units: An apparatus and method for measuring the color and gas fill concentration of insulating glass units is disclosed. One apparatus includes a color measuring device and gas fill concentration measuring device coupled to a production line for manufacturing insulating glass units. One method of the invention involves measuring the color... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20060279737 - Portable and cartridge-based surface plasmon resonance sensing systems: This specification discloses various improvements in the field of SPR sensing systems. One improvement relates to a portable SPR sensing system, e.g., a system contained within a suitcase that can be hand-carried to a monitoring site. Another improvement relates to a portable, cartridge-based SPR sensing system. In this system, selected... Agent: Woodcock Washburn LLP

20060279738 - Sensing element used in sensing device for sensing target substance in specimen by using plasmon resonance: A method for producing a sensing element used in a sensing device for sensing a target substance in a specimen with the use of plasmon resonance includes the steps of: preparing a substrate having an electroconductive layer, forming an insulating layer on the electroconductive layer, selectively removing the insulating layer... Agent: Fitzpatrick Cella Harper & Scinto

20060279739 - Position control apparatus and optical apparatus: A position control apparatus (optical apparatus) is disclosed which is capable of preventing disadvantages caused by the absence of a dead band while achieving a required accuracy of positional control. The position control apparatus comprises a controller which controls the drive of an object (optical member) so that the position... Agent: Morgan & Finnegan, L.L.P.

20060279740 - Optically balanced instrument for high accuracy measurement of dimensional change: An instrument for measuring dimensional changes in materials, such as ultra-low thermal expansion materials, contains an optically balanced measuring loop. Both an object beam and a loop beam propagate around the measuring loop. The object beam encounters both opposite side surfaces of the test object and the loop beam encounters... Agent: Corning Incorporated

20060279741 - Optical characteristic measuring apparatus: An optical characteristic measuring apparatus includes: a light source section which sweeps wavelengths of a first input light and a second input light respectively, frequencies of the first and second input lights being different from each other and polarized states of the first and second input lights being perpendicular to... Agent: Sughrue Mion, PLLC

20060279742 - Apparatus, method and system for performing phase-resolved optical frequency domain imaging: Apparatus, system and method are provided which utilize signals received from a reference and a sample. In particular, a radiation is provided which includes at least one first electromagnetic radiation directed to the sample and at least one second electromagnetic radiation directed to the reference. A frequency of the radiation... Agent: Dorsey & Whitney LLP Intellectual Property Department

20060279743 - Measuring device and method for determining relative positions of a positioning stage configured to be moveable in at least one direction: A measuring apparatus for determining relative positions of a positioning stage arranged in a moveable fashion in at least one direction by a predeterminable maximum traversing path. The measuring device comprises at least one interferometric measuring means and at least one interferometric correction means. An interferometric measuring means is operable... Agent: Simpson & Simpson, PLLC

20060279744 - Method for measuring thickness of thin film, method for forming polycrystal semiconductor thin film, method for manufacturing semiconductor device, apparatus for manufacturing the same, and method for manufacturing image display device: A laser light is projected to a thin film deposited on a transparent substrate, and measurement is performed on the entire measurement area of the substrate, and transmission intensity is measured by a transmission light intensity monitor and reflection light intensity is measured by a reflection light intensity monitor at... Agent: Antonelli, Terry, Stout & Kraus, LLP

20060279745 - Color imaging system for locating retroreflectors: An imaging system includes an image sensor, a first light source on-axis with the image sensor, and a controller. The image sensor is configured to generate an image of a field of view including a retroreflector. The first light source is configured to illuminate the retroreflector, and the controller is... Agent: Agilent Technologies Inc.

20060279746 - Method and system for device-independent determination of coordinates of a point displayed by means of a microscope: The invention relates to a method and a system for device-independent determination of coordinates of a point (P), displayed by means of a microscope, whereby, firstly, the device coordinates (x1, y1, z1), for the displayed reference point (E1), in a device-dependent coordinate system corresponding to the given object-related reference coordinates... Agent: Davidson, Davidson & Kappel, LLC

20060279747 - Displacement detection apparatus, displacement measurement apparatus and fixed point detection apparatus: A displacement detection apparatus includes a light source emitting a light; extinction ratio conversion means raising an extinction ratio of the light to 20 dB or more; a condenser lens condensing the light having the extinction ratio of 20 dB or more; a polarization maintaining type optical fiber transmitting the... Agent: Robert J. Depke Lewis T. Steadman

20060274299 - Distance measuring device for a vehicle: A distance measuring device for a vehicle emits electromagnetic waves forward for a scan both in horizontal and vertical directions. It is judged from received light whether or not the distance to a detected object is within a specified preset range. If the distance is found to be within this... Agent: Beyer Weaver & Thomas, LLP

20060274300 - User-worn rangefinder system and methods: Embodiments of an arm-worn rangefinder device includes a rangefinder body and a switch. The rangefinder body is shaped for coupling to a user's arm and has an electronic rangefinder circuit operable to emit an energy beam directed at a selected target, to receive a reflected beam from the target, and... Agent: Klarquist Sparkman, LLP

20060274301 - Apparatus and method for chemical imaging of a biological sample: In one embodiment, the disclosure relates to a method for determining illumination parameters for a stained sample, the method may include providing a stained sample and obtaining an absorption band of the sample; obtaining an emission band of the sample and determining the illumination parameters for the sample as a... Agent: Duane Morris LLP

20060274302 - Machine vision vehicle wheel alignment image processing methods: A method of the present invention provides methods for processing images of vehicle wheel assemblies acquired during vehicle service procedures to determine vehicle wheel assembly pose components, from which vehicle wheel alignment angles may be calculated.... Agent: Polster, Lieder, Woodruff & Lucchesi

20060274303 - Wheel aligner measurement module attachment system: In a vehicle alignment system an optical sensing mechanism is structurally coupled to a vehicle supporting lift for movement in unison with the lift so that the field of view of the sensing mechanism encompasses a wheel of a vehicle positioned on the lift during lift movement. Sensing modules may... Agent: Mcdermott Will & Emery LLP

20060274304 - Systems and methods for inspecting an edge of a specimen: Systems and methods for inspecting an edge of a specimen are provided. One system includes an illumination subsystem configured to direct light to the edge of the specimen at an oblique angle of incidence. The plane of incidence of the light is substantially perpendicular to a plane substantially tangent to... Agent: Daffer Mcdaniel, LLP

20060274306 - Measurement system cluster: Systems and methods are disclosed for measuring semiconductor wafers in a fabrication process using one or more of a plurality of measurement systems. A measurement system cluster is provided having a plurality of such measurement systems, along with a system for transferring wafers to one or more of the measurement... Agent: Stallman & Pollock LLP

20060274305 - Serrated fourier filters and inspection systems: Serrated Fourier filters and inspection systems are provided. One Fourier filter includes one or more blocking elements configured to block a portion of light from a wafer. The Fourier filter also includes periodic serrations formed on edges of the one or more blocking elements. The periodic serrations define a transition... Agent: Daffer Mcdaniel, LLP

20060274307 - Method and device for checking the integrity of a glass protecting tube for the spiral-wound filament of an infrared radiator heat source: In order to be able to check reliably glass protecting tubes for spiral-wound filaments of an infrared radiator heat source with respect to damages due to breaking, a device and method are provided for checking the integrity of a glass protecting tube, in particular made of quartz glass, is proposed... Agent: Kelly Lowry & Kelley, LLP

20060274308 - Optical spectroscopy with overlapping images: An optical spectrometer distinguishes ambiguity between different wavelength constituent components present in incident light. A spatial filter in the spectrometer spatially filters the incident light. A dispersion system receives the spatially filtered light and disperses images of the spatial filter in a wavelength dependent fashion such that two or more... Agent: Coats & Bennett, PLLC

20060274309 - Particle counter with improved image sensor array: A particle counter for optically detecting an unconstrained particle of less than one micron in size suspended in a flowing liquid includes a sample chamber having a fluid inlet and a fluid outlet; a laser module producing a laser beam; a beam shaping optical system providing a multiple laser beam... Agent: Patton Boggs

20060274310 - Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals: Systems and methods are disclosed for using ellipsometer configurations to measure the partial Mueller matrix and the complete Jones matrix of a system that may be isotropic or anisotropic. In one embodiment two or more signals, which do not necessarily satisfy any symmetry assumptions individually, are combined into a composite... Agent: Beyer Weaver & Thonas LLP

20060274311 - Device and method for alignment: The present invention refers to a system and a device (10) for alignment of at least one alignable plane with reference to at least one reference plane. The device includes a main part (11), a light source (18) and a number of contact points (21a, 21b, 21c), and the light... Agent: Marina Larson & Associates, LLC

20060274312 - Overlay measurement apparatus: An overlay measurement apparatus can judge whether an overlay displacement found from an image is accurate. It has a first measuring unit that captures images of first and second marks formed in different layers of a substrate and finds an overlay displacement between the two marks based on the images... Agent: Oliff & Berridge, PLC

20060274313 - Optical detector for a particle sorting system: An optical system for acquiring fast spectra from spatially channel arrays includes a light source for producing a light beam that passes through the microfluidic chip or the channel to be monitored, one or more lenses or optical fibers for capturing the light from the light source after interaction with... Agent: Lahive & Cockfield

20060274314 - Examination system for examination of a specimen; sub-units and units therefore, a sensor and a microscope: An evanescent field microscopy sub-unit for an examination system for examination of a specimen, the evanescent field microscopy sub-unit includes a first dielectric cladding layer having an absolute refractive index n1, and a core layer having a thickness tm, a width wm and a length Im coated onto at least... Agent: Buchanan, Ingersoll & Rooney PC

20060274315 - Plasmon resonance structure body and method for producing the same: The electric-field enhancement effect by plasmon resonance is improved by favorably controlling the plasmon resonances in the thickness direction and in the direction orthogonal thereto. The plasmon resonance structure body comprises alternately stacked layers of metal nanoparticle layers and dielectric particle layers. The metal nanoparticle layers have a structure as... Agent: Knobbe Martens Olson & Bear LLP

20060274316 - Measuring system for the optical characterization of materials and method for the implementation thereof by said system: The invention relates to a measuring system for the characterization of materials i.e. determination of the optical properties thereof such as brightness, surface aspect, transparency, color (pigments and colorants) and color effects (pearly or metallic). According to the invention, said system comprises an optical sample illumination device (110, 103, 108),... Agent: Young & Thompson

20060274317 - Method and apparatus for determining surface properties: The present invention relates to a method of determining surface properties, in which radiation is irradiated onto a first region of a surface (5) to be examined, then at least some of the radiation irradiated onto the first region and returned by the latter is detected, and a measured value... Agent: Attention Of Norman P. Soloway Hayes Soloway P.C.

20060274318 - Interferometric transfer function determination: The present invention relates to an apparatus and to a method of interferometric determination of a transfer function of a DUT (A, B), comprising the steps of detecting at least one interferogram of the DUT (A, B) and using a Hilbert transformation to evaluate transfer functions hij of the DUT... Agent: Perman & Green

20060274319 - All-fiber linear design depolizer for all-states of polarization: An all-fiber, all-states of polarization linear design depolarizer is provided. It is made of two polarization combiners (PC1,PC2) with a 2×2 directional coupler (DC) between them. The connections between the coupler (DC) and the two polarization combiners (PC1,PC2) have optical phase delays (L1,L2) and half wave polarization rotators (PR1,PR2,PR3) to... Agent: George J. Primak

20060274320 - Reconfigurable polarization independent interferometers and methods of stabilization: A polarization independent (PI) interferometer design that can be built from standard optical components is described. Based upon a Michelson interferometer, the PI interferometer uses a 50/50 splitter and Faraday Rotator Mirrors (FM's). The interferometer achieves good optical characteristics, such as high extinction ratio (ER) and low insertion loss (IL).... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20060274321 - Common-path point-diffraction phase-shifting interferometer: A common-path, point-diffraction, phase-shifting interferometer uses a half wave plate having a diffractive element, such as pin hole. A coherent, polarized light source simultaneously generates a reference beam from the diffractive element and an object beam from remaining portions of the light going through the half wave plate. The reference... Agent: Thomas G. Ference Interphase Technologies, Inc.

20060274322 - System and method for interferometer non-linearity compensation: A method for non-linearity compensating interferometer position data generated from a measurement signal includes generating a first set of non-linearity parameters based on received digital position values. The method includes sensing whether a low velocity condition exists. A first one of the non-linearity parameters is updated based on an estimated... Agent: Agilent Technologies Inc.

20060274323 - High intensity fabry-perot sensor: In a Fabry-Perot interferometer based sensor if insufficient light reflected from the sensor re-enters the fiber, the results from the Fabry-Perot interferometer-based sensor are compromised. Accordingly, a sensor assembly is provided that comprises an optical fiber having an optical axis, a lens in optical communication with the optical fiber, the... Agent: Mcdonald Hopkins Co., Lpa

20060274324 - Method for correcting disturbances in a level sensor light path: The invention relates to a level sensor for determining a height of a substrate. The level sensor generates one or more measurement beam and directs the measurement beam to a measurement spot on the substrate and produces a reflected measurement beam. The level sensor also generates one or more reference... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20060274325 - Method of qualifying a diffraction grating and method of manufacturing an optical element: A method of qualifying a diffraction grating comprises performing plural measurements by illuminating a region of the grating with a beam of measuring light and detecting an intensity of measuring light diffracted by the grating into a 0th diffraction order. A wavelength of the measuring light or a polarization of... Agent: Jones Day

20060274326 - Method and apparatus for measuring a polishing condition: A polished state monitoring apparatus capable of easily grasping the progress of polish is provided. The polished state monitoring apparatus monitors the progress of polish of a surface to be polished by obtaining a characteristic value indicating a state of the polished surface of an object 12 at each sampling... Agent: Wenderoth, Lind & Ponack, L.L.P.

20060274328 - Image measuring method, image measuring system and image measuring program: An image measuring method comprises making no stop of an imaging means relative to a measurement stage at measurement positions (MP1-MP3). and capturing instantaneous images to acquire information required for measurement. A first direction to a measurement position (MP1) to be measured next and a second direction from the measurement... Agent: Oliff & Berridge, PLC

20060274327 - System and method of guiding real-time inspection using 3d scanners: A system and a method of guiding a real-time inspection using a 3D scanner are provided. The system and the method of guiding a real-time inspection using a 3D scanner allow an operator to perform an accurate and swift inspection of an object to be measured so as to meet... Agent: Harness, Dickey & Pierce, P.L.C

20060274329 - Three-dimensional position measurement method and apparatus used for three-dimensional position measurement: In three-dimensional measurement where circular polarized light or elliptical polarized light is projected as measurement light, correct measurement results can be obtained irrespective of the difference in intensity between primary reflected light and secondary reflected light. A three-dimensional position measurement method includes projecting, as the measurement light, circular polarized light... Agent: Sidley Austin LLP

20060274330 - Image measuring system, image measuring method and image measuring program: Within a prioritized mode selection dialog, either a measurement accuracy prioritized mode or a measurement speed prioritized mode is selected. If the measurement accuracy prioritized mode is selected, then processing for entering a tolerable amount of movement is executed. Then, a relative movement speed of a CCD camera to a... Agent: Oliff & Berridge, PLC